Intelligent schemes for fault classification

in mutually coupled series-compensated

parallel transmission lines

Aleena Swetapadma, Anamika Yadav &

Almoataz Y. Abdelaziz

Neural Computing and Applications

ISSN 0941-0643

Neural Comput & Applic

DOI 10.1007/s00521-019-04185-x

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ORIGINAL ARTICLE

Intelligent schemes for fault classification in mutually coupled series-

compensated parallel transmission lines
Aleena Swetapadma1 • Anamika Yadav2 • Almoataz Y. Abdelaziz3

Received: 5 April 2018 / Accepted: 29 March 2019

 Springer-Verlag London Ltd., part of Springer Nature 2019

Abstract
The protection of mutually coupled series capacitor-compensated (SCC) parallel transmission lines is a more complicated
task than uncompensated lines due to the effect of mutual coupling, inter-circuit faults, and non-linearity of effective
impedance of SCC line. A method that can overcome these issues and still work efficiently is a supervised learning-based
method which is an adaptive technique. Hence, in this work, various supervised learning-based intelligent schemes like
artificial neural network (ANN), support vector machines (SVM), and decision tree (DT) are employed to find a suit-
able method for the protection of series capacitor-compensated lines. Discrete wavelet transform has been used to process
the three-phase current signals of the parallel lines measured at one terminal only. A moving window of 20 samples is
selected, and approximate wavelet coefficient is calculated up to level 1 using DB-4 mother wavelet. The resultant is then
given as input to the intelligent schemes (ANN, SVM, and DT). The proposed intelligent schemes have been tested with
variety of fault conditions such as inter-circuit faults, cross-country faults, transforming faults, single-circuit operation, and
high resistance faults. A large number of fault simulation studies corroborate that DT-based fault classification method is
better than ANN and SVM. The accuracy of faulty phase and ground identification scheme is 100% for all the tested fault
cases. Hence, the proposed supervised learning-based intelligent method can be implemented in real power system network
effectively.

Keywords Artificial neural network  Series compensation  Mutual coupling  Fault phase identification 
Fault classification  Decision tree  Support vector machine

Abbreviations C2 Phase C of circuit 2

ANN Artificial neural network DWT Discrete wavelet transform
A1 Phase A of circuit 1 DT Decision tree
A2 Phase A of circuit 2 FPI Faulty phase identification
B1 Phase B of circuit 1 GI Ground identification
B2 Phase B of circuit 2 G1 Circuit 1 grounded
C1 Phase C of circuit 1 G2 Circuit 2 grounded
Iaw1 Wavelet-processed current of phase A of circuit 1
& Anamika Yadav Ibw1 Wavelet-processed current of phase B of circuit 1
ayadav.ele@nitrr.ac.in Icw1 Wavelet-processed current of phase C of circuit 1
Aleena Swetapadma Iaw2 Wavelet-processed current of phase A of circuit 2
aleena.swetapadma@gmail.com Ibw2 Wavelet-processed current of phase B of circuit 2
Almoataz Y. Abdelaziz Icw2 Wavelet-processed current of phase C of circuit 2
almoatazabdelaziz@hotmail.com Iz1 Zero sequence current of circuit 1
Iz2 Zero sequence current of circuit 2
1
School of Computer Engineering, KIIT University, NG Not grounded
Bhubaneswar, Odisha, India
SCC Series capacitor compensated
2
Department of Electrical Engineering, National Institute of SVM Support vector machine
Technology, Raipur, C.G., India
WT Wavelet transform
3
Faculty of Engineering and Technology, Future University in
Egypt, Cairo, Egypt

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1 Introduction
The main idea behind the series capacitor compensation is
to decrease the overall effective transmission reactance
from sending end to receiving end in order to increase the
power transferring capability and improve the transient
stability of the power system [1]. But the protection of
series-compensated double-circuit lines is very challenging
due to the effect of mutual coupling and possibility of inter-
circuit faults in case of double-circuit lines. The challenges
offered are principally owing to the non-linearity intro-
duced by the protective devices used in parallel with series
capacitor. Thus, a method which can overcome the chal-
lenges in the series-compensated lines and work effectively
and efficiently under a wide range of fault scenarios would
be a welcome step in this regard.
In the last decade, different algorithms have been
reported for the protection of uncompensated transmission
lines employing ANN [2], SVM [3], decision tree [4], finite
state automata [5], and current differential method which
uses spectral energy information provided through a new
fast discrete S-Transform [6]. The fault classification and
faulty phase identification problem in series-compensated
transmission line has been confronted by so many
researchers [7–18] in recent years. Fault detection and
classification in series-compensated transmission lines
using wavelet transform have been demonstrated in [7].
The application of DWT for fault type classification in
thyristor controlled lines has been reported in [8]. But these
methods are based on comparing with threshold which may
not be a sufficient criterion for the protection of parallel
series-compensated lines due to the mutual coupling effect.
ANN has been used for the classification of fault in series-
compensated transmission line in [9, 10]. Radial basis
neural network is used for the protection of thyristor con-
trolled series-compensated line in [11]. Support vector
machines have been also applied for fault classification in
[12, 13]. Extreme learning machine is applied for the
protection of series-compensated transmission lines in [14].
WT in combination with fuzzy logic is used for the clas-
sification of fault in series-compensated lines in [15].
Furthermore, a hybrid approach utilizing wavelet trans-
forms and adaptive neuro-fuzzy inference system [16] and
wavelet-ANN [17] have been reported for fault classifica-
tion in series-compensated transmission lines. A decision
tree is used for the classification of fault in transmission
lines in [18, 19]. Fault location of uncompensated/series-
compensated lines using two-end synchronized measure-
ment is proposed in [20]. Fault detection and classification
problem of series-compensated EHV transmission line
using a hybrid wavelet-ANN protection scheme have been
proposed in [21].
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However, all the above-mentioned schemes are designed
for single-circuit series-compensated transmission lines
and they do not consider the effect of mutual coupling
which is a severe problem in parallel SCC lines. In view of
the above, the present paper aims to provide a fault clas-
sification scheme for double-circuit series-compensated
transmission lines. Hence, in this work, supervised learning
methods like ANN, SVM, and DT have been used for fault
phase identification and the fault classification of double-
circuit SCC lines. The effect of mutual coupling between
the faulty and healthy phases can be overcome by learning-
based methods by memorizing the nature of the patterns of
both the faulty and healthy phases of the double-circuit
SCC lines. This can be possible with supervised learning
techniques or learning in the presence of known targets.
The paper has been organized as follows. Section 2 of
the paper describes the proposed supervised learning-based
fault classification scheme. Section 3 presents the simula-
tion results, Sect. 4 compares the proposed method with
other methods, and Sect. 5 presents the conclusions of the
paper.
2 Proposed supervised learning-based fault
classification scheme
In a transmission line, various types of faults occur due to
the large dimension and exposure to environment. The
faults are of two types: short-circuit faults and open-circuit
faults. Short-circuit faults are of different types such as
line(s) to ground faults (AG, BG, CG, ABG, BCG, CAG,
and ABCG) and line to line faults (AB, BC, CA, ABC).
The faults in transmission lines must be detected and
cleared to maintain the continuous power flow. Conven-
tional scheme such as distance relaying has drawbacks like
less reach setting, unable to detect the high resistance fault,
maloperates in case of power swing, etc. Hence, there is a
need of a method which can overcome all the drawbacks of
conventional schemes and still provide accurate operation.
One of such methods is supervised learning-based intelli-
gent method which is adaptive in this type of situations.
Therefore, in this work, intelligent schemes have been
applied to find a suitable method.
The design of supervised learning-based fault classifi-
cation scheme for a selected power system network com-
prising of series-compensated double-circuit line involves
different steps such as signal processing, feature selection,
dimension reduction, feature extraction and choice of
learning method, selection of network architecture, training
and testing process. In this work, different supervised
learning methods like ANN, SVM, and DT have been used
to classify the faults in SCC lines. The proposed fault
classification scheme for fixed SCC lines is described in
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BUS1 BUS2

C1
200km

C2
Source 1 Source 2
400kV 400kV
Load
Load 250MW
100MW
100MVAr
RELAY
Fault

Obtain the phase current of both circuit at the relay location

Pre-process the current signal using Obtain the zero sequence current
discrete wavelet transform with DB-4 of both circuits.

Iaw1 Iaw2 Ibw1 Ibw2 Icw1 Icw2 Iz1 Iz2

DT ANN SVM DT ANN SVM

FPI FPI FPI GI GI GI

DT-BASED FAULT ANN-BASED FAULT SVM-BASED FAULT

CLASSIFICATION CLASSIFICATION CLASSIFICATION

Fig. 1 Flow diagram of faulty phase and ground identification and classification scheme

Fig. 1. Different steps involved in design of proposed
scheme are described hereunder.
2.1 Power system network under study
The power system network under study is shown in Fig. 1
comprising of 400-kV, 50-Hz series-compensated line of
length 200 km. Two capacitors C1 and C2 are placed in the
two circuits 1 and 2, respectively, near to relaying point.
The degree of compensation is set to 40%. Consider two
fault cases: A1G fault in circuit 1 at 1 km with
R = 0.001 X and another A1G fault in circuit 1 at 190 km
with R = 100 X. Figure 2 shows the three-phase currents
of the two circuits and three-phase voltages. As it is A1G
fault, the current magnitude of faulty phase A1 after the
inception of fault should be higher than other phases. But
due to the effect of mutual coupling, current magnitude of
corresponding A2 phase of circuit 2 is also high although it
is not a faulty phase in both cases. Furthermore, if the two
cases are compared, it can be seen that in case 2 the
magnitude of current of healthy phase A2 is appreciably
large or almost equal to faulty phase A1 current magnitude.
So in case of parallel series-compensated line, most of the
protection schemes based on thresholding fail due to non-
linearity of the series-compensated transmission system.
Consequently, feature selection process should be carried
out carefully to extract all the needed information. Dif-
ferent fault cases are simulated for training and testing of
classification scheme.
2.2 Input feature selection
During fault in any one circuit of the double-circuit SCC
line, the current signals of both the circuits undergo large
changes. So the current signals of both the circuits are
chosen as input feature to the supervised learning method.

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(a) (c)

(b) (d)

Fig. 2 Case 1 During A1G fault at 1 km with R = 0.001 X: a three-phase currents of two circuits and b three-phase voltage signals. Case 2
During A1G fault at 190 km with R = 100 X: c three-phase currents of two circuits and d three-phase voltage signals

Different fault cases have been simulated in series-com-
pensated power system network with variation in different
parameters. The three-phase current signals of both the
circuits are recorded at one end of the line with sampling
frequency of 1 kHz. Different parameters varied in this
work for simulating the training and testing fault data sets
are shown in Table 1. From these fault cases, features are
extracted using discrete wavelet transform which is
described in the next subsection.
2.3 Feature extraction using WT
Wavelet transform (WT) has the ability to extract the
required information from non-stationary fault signals. WT
has been used by many researchers for different protection
tasks in power transmission network [11, 17–19, 21]. The
choice of mother wavelet is based on the studies of dif-
ferent researchers, and mostly, DB wavelet has been opted
by them. In this paper, a moving window of 20 samples is
selected and approximate wavelet coefficient up to level 1
using DB-4 is obtained. Standard deviation is then

Table 1 Training and testing data set

Parameters Training Testing

Fault location (km) 10, 55, 100, 145 and 190 km 50 different locations
Fault inception angle () 0 In between 0 and 360
Fault resistance (X) 0 and 100 0, 20, 40, 60, 80 and 100 X
Fault type LG, LLG, LL, LLLG, inter-circuit faults, LG, LLG, LL, LLLG, inter-circuit faults, multi-location
single-circuit operation faults, transforming faults, single-circuit operation
Circuit 1 and 2 1 and 2
Total cases 1040 27,500

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calculated, and then, the window is moved forward to
create a new window of 20 samples. Standard deviation of
the approximate coefficients of level 1 is calculated which
shows the deviation of signal from its mean value. Standard
deviation of current signals is calculated in time domain by
moving the window sample by sample generated and
repeating the above procedure. The signals are processed in
time domain because it will be easy to discriminate
between the faulty and healthy phases. With respect to
time, the standard deviation of each phase current signal of
both the circuits is calculated, and when a fault occurs, the
input signals will deviate from normal situation. Figure 3
shows the feature extraction process for current signal.
(a)
(b)
(c)
(d)
(e)
Fig. 3 a–j Feature extraction using discrete wavelet transforms from instantaneous current signal Ia1 at 100 km during A1B1 fault at 40 ms time
Figure 3a shows the current signal of phase A1 during
A1B1 fault in circuit 1 at 100 km in 40 ms time. Then,
approximate coefficient at level 1 is taken and standard
deviation is calculated for first 20 samples. Window is then
moved by one sample so the new window is from sample 2
to sample 21, and the same procedure is repeated with the
generation of each new sample. Figure 3b shows that
extracted feature has zero value up to 20 ms time because
it requires 20 samples to give first standard deviated sam-
ple. So at 21 ms time there is a processed signal/sample
which is obtained from window of 1–20 ms. Figure 3c
shows that at 22 ms there is another new sample which is
obtained from moving window of 2–21 ms. Figure 3d
(f)
(g)
(h)
(i)
(j)
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(a)
(b)
Fig. 4 a Phase current signals and b wavelet-processed current signals at 10 km during A1B1G fault at 60 ms time
shows that at 23 ms there is a third sample which is
obtained from moving window of 3–22 samples. Similarly,
wavelet-processed signals are generated and stored up to
40 ms time. Figure 3e shows that at 41 ms there is a new
sample which is obtained from moving window of
21–40 ms. Figure 3f–i shows that at 42 ms, 43 ms, 44 ms,
45 ms there are new samples which are obtained from
22–41-ms, 23–42-ms, 24–43-ms, 25–44-ms moving win-
dows, respectively. Figure 3j shows the extracted features
of current signals of phase A1 up to 100 ms time.
Further, Fig. 4a shows the instantaneous three-phase
current signals of both circuits during A1B1G fault at 10 km
in 60 ms time. During A1B1G fault, the current magnitudes
of A1 and B1 phases of circuit 1 are much higher than other
phases. Current magnitudes of A2 and B2 phases of circuit 2
are also greater than normal situation due to the effect of
mutual coupling between phases. Moreover, phase C1 and
C2 currents do not change because they are not involved in
fault loop. Figure 4b shows the discrete wavelet transform-
processed current signals of both circuits.
2.4 Design of different training modules
for faulty phase and ground identification
In this paper, fault phase and ground identification has been
presented using ANN, SVM, and DT as depicted in Fig. 1.
All the three methods are supervised learning methods, i.e.,
they go through training phase in the presence of known
targets. During training phase, all the three methods employ
the wavelet-processed current signals as input for faulty
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phase identification and zero sequence components for
ground identification. But, the design process of all the
methods is different from each other. Different steps
involved in designing or the application of these methods for
faulty phase and ground identification are described below.
2.4.1 Construction of decision tree
A decision tree is a flowchart-like tree structure which learns
from class-labeled training samples where each internal node
denotes a test on an attribute, each branch represents an
outcome of the test, and each leaf node holds a class label
[22]. For a given sample in which the associated class label is
unknown, the attribute values of the sample are tested against
the decision tree. Class of the test sample is decided by
tracing a path from the root to a leaf node. For construction of
decision tree, attribute selection measures have been used to
select the attribute that best partitions the samples into dis-
tinct classes. In this work, Gini index is used for splitting
criteria. Let D be the data partition of training set of class-
labeled samples. Suppose the class label attribute has m
distinct values defining m distinct classes, Ci (for
i = 1,…,m). Let Ci,D be the set of samples of class Ci in D.
Gini index measures the impurity of D given in (1)
X m
Gini(DÞ ¼ 1  p2i ð1Þ
i¼1
where pi is the probability of a sample in D belonged to
C
class Ci and is estimated by Di;D . The sum is computed over
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m classes. The Gini index considers a binary split for each
attribute. The reduction in impurity that would be incurred
by a binary split on a discrete or continuous-valued attri-
bute A is given in (2). The attribute that maximizes the
reduction in impurity is selected as the splitting attribute.
DGini(AÞ ¼ Gini(DÞ  GiniAðDÞ
In decision tree algorithm, tree pruning is used to identify
and remove noise or outliers in the training data for
improving the classification accuracy of test data. These
methods use statistical measures to remove the least reli-
able branches. The decision tree network takes wavelet-
processed current samples of different fault cases as input
and the corresponding target label. Target labels used for
different faulty phases and ground identifications are
shown in Table 2. After training the DT module, the per-
formance is investigated for unseen fault patterns and is
illustrated in Table 3. Training accuracy is checked by
determining the re-substitution errors. Optimal tree for
phase and ground identification after tree pruning is
obtained based on testing accuracy. Optimal decision tree
obtained after training for ground identification module is
shown in Fig. 5.
Figure 5 shows that leaf nodes contain classes: NG (in
numerical ‘1’), G1 (in numerical ‘2’), G2 (in numerical
‘3’), and G12 (in numerical ‘4’) which represent ground is
not involved, circuit 1 is grounded, circuit 2 is grounded,
and both circuits are grounded, respectively. Internal nodes
of tree contain variables x1 and x2 which represent zero
sequence currents of circuit 1 and circuit 2, respectively.
DT module compares these values with certain thresholds
considering all attributes and decides the class labels
accordingly.
ð2Þ
2.4.2 Construction of SVM
Support vector machine is a supervised learning method
that is used to analyze data and recognize patterns [23].
SVM constructs a hyperplane that has the largest distance
to the nearest training data point of any class. The hyper-
planes in the higher-dimensional space are defined as the
set of points whose dot product with a vector in that space
is constant. The vectors defining the hyper planes can be
chosen to be linear combinations with parameters ai of
feature vectors. The points X in the feature space that are
mapped into the hyper plane are defined by Eq. (3)
X
ai  kðXi ; X Þ ¼ Constant ð3Þ
i
SVM hyperplane is shown in Fig. 6 which can be
described by Eqs. (4) and (5). The distance between these
two hyperplanes is found to be kW2 k; therefore, kW k should
be minimized to obtain better results.
W Xþb¼1 ð4Þ
W  X þ b ¼ 1 ð5Þ

Table 2 Fault type and the target outputs/labels for DT and SVM networks
Fault type Phase identification target Ground identification target Fault type Phase identification target Ground identification target
output output output output

No fault 1 1 A2B2 12 1
A1G 2 2 B2C2 13 1
B1G 3 2 C2A2 14 1
C1G 4 2 A2B2C2G 15 2
A1B1G 5 2 A1B2G 16 4
B1C1G 6 2 A1C2G 17 4
C1A1G 7 2 B1A2G 18 4
A1B1 5 1 B1C2G 19 4
B1C1 6 1 C1A2G 20 4
C1A1 7 1 C1B2G 21 4
A1B1C1G 8 2 A1B2 16 1
A2G 9 3 A1C2 17 1
B2G 10 3 B1A2 18 1
C2G 11 3 B1C2 19 1
A2B2G 12 3 C1A2 20 1
B2C2G 13 3 C1B2 21 1
C2A2G 14 3 – – –

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Table 3 Confusion matrix and error for different techniques

Techniques Phase/ground Data Training Training error Training accuracy
time (%)
Correctly classified Misclassified
data data

ANN Phase 10,490 0 245 s Mean square error = 1.0e-4 100

Ground 10,490 0 215 s Mean square error = 1.0e-4 100
SVM Phase 10,434 56 129 min Re-substitution 99.47
error = 0.03492
Ground 10,409 81 123 s Re-substitution 99.23
error = 0.03492
DT Phase 10,473 17 2.1 s Re-substitution 99.84
error = 0.0228
Ground 10,407 83 0.0782 s Re-substitution 99.21
error = 0.0127

x2 < 90.5846 x2 >= 90.5846

x1 < 60.117 x1 >= 60.117 x1 < 92.6538 x1 >= 92.6538

x1 < 1086.55 x1 >= 1086.55

NG G1 G2

x2 < 1370.01 x2 >= 1370.01

x2 < 1192.78 x2 >= 1192.78

G12 G2 G1 G12

Fig. 5 Optimum decision tree obtained for ground identification

The application of SVM in fault diagnosis has two

phases: training and testing. SVM-based method is
designed for faulty phase and ground identification sepa-
rately as shown in Fig. 1. Multiclass SVM is used for
classifying different types of fault in the system. The pre-
processed training samples and the corresponding target
labels are given to the SVM during training. SVM is then
trained with radial basis function kernel with sigma value
(scaling factor) equal to 1. After training the module, it is
tested with fault cases that are not given in training and the
results are shown in Table 3 and also discussed in detail in
Sect. 3.

Fig. 6 Hyper-plane of SVM classifier

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2.4.3 Construction of ANN
In this paper, artificial neural network with supervised
learning method is used. It is also known as feed-forward
back-propagation neural network. Back-propagation net-
work first propagates the inputs forward through the net-
work [24]. Then, propagate the sensitivities backward
through the network starting from the last layer. And
finally, it updates the weights and biases using approximate
steepest descent rule. ANN is designed in two stages:
training and testing. The network is first trained with
samples with known target class, and therefore, it is a
supervised learning method. Faulty phase identification
ANN module has 6 outputs for six phases A1, B1, C1, A2,
B2, and C2. All the outputs will be low ‘0’ for no fault
situation, and any one or more outputs will become high
‘1’ for a particular type of faulty situation. Ground iden-
tification module has two outputs representing ground fault
in circuit 1 or circuit 2. The network is trained using
Levenberg–Marquardt algorithm with mean square error of
10-4. The activation function used is tangent sigmoid for
both the hidden layers and the output layer. The final ANN
architecture for faulty phase identification module has 6
input neurons, 2 hidden layers each with 20 neurons, and 6
neurons in output layer. The final ANN architecture for
ground identification module has 2 input neurons, 2 hidden
layers each with 20 neurons, and 2 neurons in output layer.
2.4.4 Comparison of training performance
Proposed faulty phase and ground identification scheme is
carried out using different approaches like ANN, SVM, and
DT to check which one will give better performance for the
classification of fault in a fixed SCC transmission line.
Training performance of different techniques in terms of
accuracy, training time, and training error is shown in
Table 3. The whole training data are classified accurately
using ANN with a training accuracy of 100%. But in SVM-
and DT-based methods, there are some misclassified data
with training accuracy of & 99%. Training time of ANN-
and DT-based phase and ground identification module is
few seconds. DT-based method has less training time
because it only compares the input features using if–then
rules and classifies the samples. But in ANN-based method,
the performance goal must be reached which is set in terms
of mean square error. So training time of the ANN-based
method will depend on convergence of error; in this work,
it is few minutes (& 6 min). SVM-based phase identifi-
cation module takes few hours (& 2 h) for training
because it makes support vectors for twenty-one classes
with six input vectors. SVM-based ground identification
module takes few minutes for training because it makes
support vectors for 4 classes with 2 input vectors.
Therefore, it can be concluded that the performance of DT
module is not affected by training data set size, while ANN
and SVM are affected.
3 Simulation results and discussion
The different supervised networks are tested with numer-
ous fault cases to check the performance of the methods.
Supervised learning-based methods like DT, SVM, and
ANN for fault phase identification and ground identifica-
tion scheme are tested with different fault situations like
inter-circuit faults, multi-location faults, transforming
faults, fault in case of single-circuit operation with varying
fault type, fault resistance, fault inception angle, and fault
location. Also the effect of mutual coupling between the
two circuits has been considered. Test data set used to
check the performance of methods is given in Table 1.
Results of different supervised learning methods are dis-
cussed hereunder.
3.1 Effect of mutual coupling
The mutual coupling effect that exists between the phases
of different circuits poses difficulty in the protection of
series-compensated double-circuit lines. Proposed method
is tested for different fault situations to study the effect of
mutual coupling. Figure 7 shows the fault detection outputs
of DT and SVM techniques during A1G fault at 125 km at
40 ms. Figure 7a, b shows the three-phase currents of cir-
cuit 1 and circuit 2, respectively. Due to effect of mutual
coupling between A1 phase of circuit 1 and A2 phase of
circuit 2, magnitude of current in A2 phase also increases
during fault condition although it is not a faulted phase.
Figure 7c shows the phase identification output of DT
module which is ‘1’ up to 40 ms time, depicting that the
system is healthy. At 47 ms time, the output becomes ‘2,’
confirming that the fault is in A1 phase of circuit 1. Time
taken to detect A1 phase faulty is 47–40 = 7 ms. Figure 7d
shows the ground identification output of DT module as
‘2,’ depicting that circuit 1 is grounded. Figure 7e, f shows
the phase identification and ground identification outputs of
SVM module. ANN-based fault phase and ground identi-
fication output is shown in Fig. 8. All the outputs shown in
Fig. 8 are ‘0’ up to 40 s time, demonstrating that there is no
fault in the system. After the inception of fault at 40 ms,
outputs of phase A1 and ground G1 start increasing to ‘1’
as illustrated in Fig. 8a, d; therefore, fault is in A1 phase of
circuit 1 involving ground. Some of test results of faulty
phase identification and ground identification using all the
three methods are shown in Table 4. From this table, it can
be observed that all the supervised learning techniques
work correctly in the presence of mutual coupling. Fault
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Fig. 7 During A1G fault at 125 km in 40 ms, with R = 0.001 X. identification output of DT module. e Faulty phase identification
a Three-phase currents of circuit 1. b Three-phase currents of circuit output of SVM module. f Ground identification output of SVM
2. c Faulty phase identification output of DT module. d Ground module

Fig. 8 a–h Faulty phase and ground identification outputs of ANN module during A1G fault at 125 km in 40 ms, R = 0.001 X

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Table 4 Test results of faulty

Fault type Fault location (km) DT SVM ANN
phase and ground identification
using DT, SVM, and ANN P G P G A1 B1 C1 A2 B2 C2 G1 G2

A1G 1 2 2 2 2 1 0 0 0 0 0 1 0
B2G 21 10 3 10 3 1 0 0 0 0 0 0 1
C1G 41 4 2 4 2 0 0 1 0 0 0 1 0
A2B2 61 12 1 12 1 0 0 0 1 1 0 0 0
B1C1 81 6 1 6 1 0 1 1 0 0 0 0 0
C2A2 101 14 1 14 1 0 0 0 1 0 1 0 0
A1B1G 121 5 2 5 2 1 1 0 0 0 0 1 0
B2C2G 141 13 3 13 3 0 0 0 0 1 1 0 1
C1A1G 161 7 2 7 2 1 0 1 0 0 0 1 0
A2B2C 181 15 1 15 1 0 0 0 1 1 1 0 0
A1B1C 199 8 1 8 1 1 1 1 0 0 0 0 0

phase identification time is within 10 ms time for all the
tested fault cases.
3.2 Effect of inter-circuit faults
Inter-circuit faults are those faults which involve phases of
both circuits. Inter-circuit faults are two types: earthed and
unearthed inter-circuit faults [3]. ANN-based faulty phase
and ground identification outputs are shown in Fig. 9a–h
during A1B2G inter-circuit fault at 55 km in 40 ms time.
From Fig. 9a, d, f, h it can be observed that after 40 ms
time, phases A1 and B2 and grounds G1 and G2 start
increasing to ‘1,’ proving that there is fault in A1 and B2
phases involving ground. Both G1 and G2 become ‘1’
which indicates both circuit 1 and circuit 2 are grounded.
All other phase outputs remain ‘0.’ Similarly different fault
cases are tested using DT and SVM module. Some of test
results of faulty phase and ground identification using all
the three methods during inter-circuit faults are shown in
Table 5. From test results, it can be observed that all the
three schemes are able to correctly identify the inter-circuit
faults.

Fig. 9 a–h Fault phase identification and ground identification outputs of ANN module during A1B2G inter-circuit fault at 55 km in 40 ms time

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Table 5 Performance in case of

Fault type Fault location (km) DT SVM ANN
inter-circuit faults
P G P G A1 B1 C1 A2 B2 C2 G1 G2

A1B2 5 16 1 16 1 1 0 0 0 1 0 0 0
A1C2 15 17 1 17 1 1 0 0 0 0 1 0 0
B1A2 35 18 1 18 1 0 1 0 1 0 0 0 0
B1C2 55 19 1 19 1 0 1 0 0 0 1 0 0
C1A2 75 20 1 20 1 0 0 1 1 0 0 0 0
C1B2 95 21 1 21 1 0 0 1 0 1 0 0 0
A1B2G 115 16 3 16 3 1 0 0 0 1 0 1 1
A1C2G 135 17 3 17 3 1 0 0 0 0 1 1 1
B1A2G 155 18 3 18 3 0 1 0 1 0 0 1 1
B1C2G 175 19 3 19 3 0 1 0 0 0 1 1 1
C1A2G 185 20 3 20 3 0 0 1 1 0 0 1 1
C1B2G 195 21 3 21 3 0 0 1 0 1 0 1 1

3.3 Performance during single-circuit operation
Double-circuit transmission lines are sometimes operated
as single circuit due to disconnection of one circuit when
there is fault in that circuit. In this situation, if a fault
occurs in the operated circuit, it should be detected. Dif-
ferent fault cases have been studied during single-circuit
operation using all the three supervised learning tech-
niques. Figure 10 shows the inputs and outputs of DT
module during A1B1G fault at 171 km at 40 ms time with
circuit 2 open. Figure 10a shows the three-phase currents
of circuit 1 during fault at 40 ms time. Figure 10b shows
the three-phase currents of circuit 2 which is nearly zero
because circuit 2 is open. Figure 10c shows the output of
DT-based phase identification module which becomes ‘5’
after 49 ms time, exemplifying that there is A1 and B1
phase fault. Figure 10d shows the output of DT-based
ground identification module which becomes ‘2’ after
49 ms time, confirming that there is ground fault in circuit
1. Some of the test results of single-circuit operation are
also shown in Table 6.
3.4 Performance during multi-location fault
Multi-location faults are those faults which occur at two
different locations at the same or different time. Multi-
location faults are also called as cross-country faults by
some researchers. Different multi-location fault cases are

Fig. 10 During A1B1G fault at 55 km in 40 ms time with circuit 2 open. a Three-phase currents of circuit 1. b Three-phase currents of circuit 2.
c Faulty phase identification output of DT module. d Ground identification output of DT module

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Table 6 Performance in case of

Circuit 1 Circuit 2 DT SVM ANN
single-circuit operation
P G P G A1 B1 C1 A2 B2 C2 G1 G2

A1G, 13 km Open 2 2 2 2 1 0 0 0 0 0 1 0
A1B1G, 53 km Open 5 2 5 2 1 1 0 0 0 0 1 0
A1B1, 103 km Open 5 1 5 1 1 1 0 0 0 0 0 0
A1B1C1, 153 km Open 8 1 8 1 1 1 1 0 0 0 0 0
Open A2G, 17 km 9 3 9 3 0 0 0 1 0 0 0 1
Open A2B2G, 57 km 12 3 12 3 0 0 0 1 1 0 0 1
Open A2B2, 107 km 12 1 12 1 0 0 0 1 1 0 0 0
Open A2B2C2, 157 km 15 1 15 1 0 0 0 1 1 1 0 0

Table 7 Performance in case of

Fault 1 Fault 2 DT SVM ANN
multi-location faults
P G P G A1 B1 C1 A2 B2 C2 G1 G2

A1G, 13 km B1G, 43 km 5 2 5 2 1 1 0 0 0 0 1 0
B2G, 33 km C2G, 63 km 13 3 13 3 0 0 0 0 1 1 0 1
C1G, 53 km A1G, 83 km 7 2 7 2 1 0 1 0 0 0 1 0
A2B2G, 83 km C2G, 113 km 15 3 15 3 0 0 0 1 1 1 0 1
B1C1G, 103 km A1G, 133 km 8 2 8 2 1 1 1 0 0 0 1 0
C2A2G, 123 km B2G, 163 km 15 3 15 3 0 0 0 1 1 1 0 1
A1B1, 143 km C1G, 183 km 8 2 8 2 1 1 1 0 0 0 1 0
B2C2, 163 km A2G, 193 km 15 3 15 3 0 0 0 1 1 1 0 1
C1A1, 183 km B1G, 199 km 8 2 8 2 1 1 1 0 0 0 1 0

tested using all the three methods, and some of the test
results are given in Table 7. It can be observed that all the
supervised learning techniques can detect the multi-loca-
tion faults correctly. Fault phase identification and ground
identification time for all the three methods is within 10 ms
for all the tested fault cases.
3.5 Performance during transforming fault
Transforming faults are those faults which start from one
type of fault and get transformed to another type of fault
after few cycles. Suppose A1B1 fault occurs in the net-
work, and after sometimes, A1 and B1 conductor falls on
C1 phase and all the three phases are grounded. In this
case, an A1B1 phase–phase fault gets transformed into
A1B1C1G three phases to ground fault (symmetrical);
therefore, it is called as transforming fault. Figure 11
shows the output of SVM module during B1C1G fault at
60 ms which gets transformed to A1B1C1G fault at 82 ms.
Figure 11a, b shows the current signals of both the circuits
wherein B1 and C1 phase currents increase after occur-
rence of fault at 60 ms. While after 82 ms time, the A1
phase current also starts increasing. So B1C1G fault is
transformed to A1B1C1G fault at 82 ms time. Figure 11c–j
shows the outputs of ANN-based fault phase and ground
identification modules. Different cases of transforming
faults are tested with all the three methods, and some of the
results are shown in Table 8. The results corroborate that
the different techniques correctly identify the transforming
faults as well.
3.6 Effect of fault resistance
The effect of fault resistance is more likely during ground
faults whose probability is around 90% (LG, LLG, and
LLLG) of all faults. Moreover, the effect of fault resistance
is predominant if the faulty phase is grounded through high
resistance medium. Fault cases with varying fault resis-
tance are tested with all the three methods. Figure 12
shows the inputs and outputs of DT- and SVM-based
scheme during B2G fault at 143 km in 40 ms time with
R = 100 X. Figure 12a, b shows the faulty phase and
ground identification outputs of DT module, respectively.
Figure 12c, d shows the faulty phase and ground identifi-
cation outputs of SVM module, respectively. Some of the
test results of varying resistance are shown in Table 9. It
can be observed that proposed scheme works accurately for
high resistance faults also.

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(a) (b)

(c) (d)

(e) (f)

(g) (h)

(i) (j)

Fig. 11 Fault phase identification and ground identification outputs of ANN scheme during B1C1G fault in 60 ms transformed to A1B1C1G
fault in 82 ms time at 110 km

3.7 Faults near boundaries
Faults that occur near to the relay end or far to the relay end
cannot be detected accurately by most of the methods. In
this work, near and far end fault cases are tested using all
the three methods. Faults near to the relay are simulated up
to 3 km with a step of 0.5 km. Faults near to the receiving
ends are also simulated from 190 to 200 km in step of
1 km. Far end and near end fault cases are then tested with
trained ANN, SVM, and DT modules to check the
performance. Test results of near and far end faults are
given in Table 10. It can be observed that fault near
boundaries in the series-compensated parallel transmission
lines can be detected using all the three methods. Fault
phase and ground identification time is within 10 ms time
for all the tested fault cases.

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Table 8 Performance in case of transforming faults

Fault location (km) Fault DT SVM ANN
P G P G A1 B1 C1 A2 B2 C2 G1 G2

22 A1G at 40 ms to A1B1G at 65 ms 5 2 5 2 1 1 0 0 0 0 1 0
42 A1B1G at 40 ms to A1B1C1G at 70 ms 8 2 8 2 1 1 1 0 0 0 1 0
62 A1B1 at 40 ms to A1B1C1G at 65 ms 8 2 8 2 1 1 1 0 0 0 1 0
82 B2G at 40 ms to A2B2G at 80 ms 12 3 12 3 0 0 0 1 1 0 0 1
102 B2C2G at 40 ms to A2B2C2G at 60 ms 15 3 15 3 0 0 0 1 1 1 0 1
122 B2C2 at 40 ms to A2B2C2G at 75 ms 15 3 15 3 0 0 0 1 1 1 0 1
142 C1G at 40 ms to B1C1G at 67 ms 6 2 6 2 0 1 1 0 0 0 1 0
162 C1A1G at 40 ms to A1B1C1G at 73 ms 8 2 8 2 1 1 1 0 0 0 1 0
182 C1A1 at 40 ms to A1B1C1G at 79 ms 8 2 8 2 1 1 1 0 0 0 1 0

Fig. 12 During B2G fault at 143 km in 40 ms with R = 100 X. a Faulty phase identification output of DT module. b Ground identification output
of DT module. c Faulty phase identification output of SVM module. d Ground output of SVM module

3.8 Location of series capacitor 4 Comparative analysis

The proposed method has been tested for different loca-
tions of series capacitor; for example, series capacitor is
placed in the middle or at one end or at both ends of the
transmission line. Various fault cases have been simulated
and tested with placement of capacitor. Some of the test
results are given in Table 11. From Table 11, it can be
observed that the placement of series capacitor did not
affect the performance of the scheme.
In this section, a comparative analysis of different intelli-
gent methods used for fault phase identification and clas-
sification is presented. The performance of DT-, SVM-,
and ANN-based schemes for test data set under varying
fault parameters is evaluated and compared in terms of
different parameters in Tables 12 and 13. The accuracy of
the three methods is 100% for all the tested fault cases. The
time required to detect the fault is less than 5 ms for most
cases for all three methods. Time required for detecting the
phase and ground is within 10 ms for all the tested fault
cases. In case of big data, the DT scheme performance
remains unaffected while ANN- and SVM-based
scheme performance may degrade. Moreover, the proposed

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Table 9 Performance in case of a fault with varying fault resistance

Fault resistance(X) Fault type Fault location (km) DT SVM ANN
P G P G A1 B1 C1 A2 B2 C2 G1 G2

0 A1B1 4 5 1 5 1 1 1 0 0 0 0 0 0
5 B1C1 14 6 1 6 1 0 1 1 0 0 0 0 0
10 C1A1 24 7 1 7 1 1 0 1 0 0 0 0 0
20 A2B2C2G 34 15 3 15 3 0 0 0 1 1 1 0 1
30 A2G 44 9 3 9 3 0 0 0 1 0 0 0 1
40 B2G 54 10 3 10 3 0 0 0 0 1 0 0 1
50 C2G 64 11 3 11 3 0 0 0 0 0 1 0 1
60 A1B1G 74 5 2 5 2 1 1 0 0 0 0 1 0
70 B1C1G 84 6 2 6 2 0 1 1 0 0 0 1 0
80 C1A1G 94 7 2 7 2 1 0 1 0 0 0 1 0
90 A1G 104 2 2 2 2 1 0 0 0 0 0 1 0
100 B1G 114 3 2 3 2 0 1 0 0 0 0 1 0

Table 10 Performance in case of near end and far end faults

Fault resistance (X) Fault type Fault location (km) DT SVM ANN
P G P G A1 B1 C1 A2 B2 C2 G1 G2

Near end A1B1 0.5 5 1 5 1 1 1 0 0 0 0 0 0

A1G 1 2 2 2 2 1 0 0 0 0 0 1 0
A1B1G 1.5 5 2 5 2 1 1 0 0 0 0 1 0
A1B1C1G 2.0 8 2 8 2 1 1 1 0 0 0 1 0
B2C2 2.5 13 1 13 1 0 0 0 0 1 1 0 0
B2G 3.0 10 3 10 3 0 0 0 0 1 0 0 1
Far end A2B2 194 12 1 12 1 0 0 0 1 1 0 0 0
A2G 195 9 3 9 3 0 0 0 0 1 0 0 1
A2B2G 196 12 3 12 3 0 0 0 1 1 0 0 1
A2B2C2G 197 15 3 15 3 1 1 0 1 1 1 0 1
A1B1 198 5 1 5 1 1 1 0 0 0 0 0 0
A1G 199 2 2 2 2 1 0 0 0 0 0 1 0

scheme has been compared with few existing schemes for
SCC lines and is reported in Table 14. It can be seen that
proposed scheme and ref [14] utilize wavelet decomposi-
tion up to level one only while other schemes [16, 21] use
6th and 8th level of wavelet decomposition, respectively.
Thus, the computational requirement is more in [16, 21]
than in the proposed method. Further, his proposed
scheme offers the highest accuracy among other reported
schemes [14, 16, 21].
5 Conclusion
In this work, a comparative study of intelligent computing
techniques such as ANN, SVM, and DT has been done for
faulty phase identification and classification in series-
compensated parallel transmission lines. Current signals of
both the circuits are taken as input and processed with
wavelet transform to obtain the feature. The input feature
obtained is given as input to the intelligent computing-
based method to identify the faulty phase and ground. The
merits of the proposed DT-based method can be outlined as
follows:

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Table 11 Performance in case of placement of series capacitor

Location of capacitor Fault type Fault location (km) DT SVM ANN
P G P G A1 B1 C1 A2 B2 C2 G1 G2

One end A1G 10 2 2 2 2 1 0 0 0 0 0 1 0

A1B1 50 5 1 5 1 1 1 0 0 0 0 1 0
A1B1C1G 90 8 2 8 2 1 1 1 0 0 0 1 0
Both end A1G 10 2 2 2 2 1 0 0 0 0 0 1 0
A1B1 50 5 1 5 1 1 1 0 0 0 0 1 0
A1B1C1G 90 8 2 8 2 1 1 1 0 0 0 1 0
Middle A1G 10 2 2 2 2 1 0 0 0 0 0 1 0
A1B1 50 5 1 5 1 1 1 0 0 0 0 1 0
A1B1C1G 90 8 2 8 2 1 1 1 0 0 0 1 0

Table 12 Performance of DT-, SVM-, and ANN-based schemes for test data set under varying fault parameters
Parameters used Number of fault cases tested DT SVM ANN
\ 5 ms \ 10 ms \ 5 ms \ 10 ms \ 5 ms \ 10 ms

Fault resistance 5500 5100 400 4900 600 4800 700

Fault inception angle 6300 5950 350 5700 600 5800 500
Location of capacitor 4700 4250 450 4000 700 3900 800
Faults near boundary 3500 3200 300 2950 550 2900 600
Transforming faults 1700 1600 100 1400 300 1250 450
Multi-location faults 2100 1950 150 1850 250 2000 100
Inter-circuit faults 1900 1700 200 1650 250 1700 200
Single-circuit operation 1800 1600 200 1650 150 1700 300

Table 13 Comparative analysis

Parameters DT SVM ANN
of DT-, SVM-, and ANN-based
schemes for testing data set Accuracy (%) 100 100 100
Phase identification time (ms) \ 10 \ 10 \ 10
Ground identification time (ms) \ 10 \ 10 \ 10
Mutual coupling Not affected Not affected Not affected
Larger training dataset Not affected Affected Affected
Fault type Not affected Not affected Not affected
Fault location Not affected Not affected Not affected
Fault resistance Not affected Not affected Not affected
Fault inception angle Not affected Not affected Not affected

Table 14 Comparison with existing schemes

Authored by Techniques used Total fault Wavelet decomposition Accuracy
cases level (%)

Malathi et al. Wavelet transform extreme learning machine 28,800 1st level 99.11
[14]
Eristi [16] Wavelet transform and adaptive neuro-fuzzy inference 23,436 6th level 99.301
system
Raval et al. [21] Wavelet and artificial neural networks 1650 8th level 98.3
Proposed method Wavelet and DT 27,500 1st level 100

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• The accuracy of fault phase and ground identification
scheme is 100% for all the fault cases tested.
• It is not affected by parameters like mutual coupling,
inter-circuit faults, single-circuit operation, multi-loca-
tion faults, transforming faults, high fault resistance,
fault inception angle, fault location, and fault type.
• Response time of all the three methods is within half
cycle time for all the tested fault cases.
• Intelligent computing techniques can be effectively
used for the protection of mutually coupled SCC.
Compliance with ethical standards
Conflict of interest The authors declare that they have no conflict of
interest.
References
1. Hingorani NG, Gyugyi L (2001) Understanding FACTS, First
Indian edition, IEEE Press
2. Yadav A, Swetapadma A (2014) Improved first zone reach set-
ting of artificial neural network-based directional relay for pro-
tection of double circuit transmission lines. IET Gener Transm
Distrib 8:373–388
3. Swetapadma Aleena, Yadav Anamika (2016) Directional relaying
using support vector machine for double circuit transmission lines
including cross-country and inter-circuit faults. Int J Electr Power
Energy Syst 81:254–264
4. Swetapadma Aleena, Yadav Anamika (2017) A novel decision
tree regression based fault distance estimation scheme for trans-
mission lines. IEEE Trans Power Deliv 32(1):234–245
5. Yadav A, Swetapadma A (2016) A finite-state machine based
approach for fault detection and classification in transmission
lines. Electr Power Compon Syst 44(1):43–59
6. Krishnanand KR, Dash PK, Naeem MH (2015) Detection, clas-
sification, and location of faults in power transmission lines. Int J
Electr Power Energy Syst 31(67):76–86
7. Megahed AI, Moussa AM, Bayoumy AE (2006) Usage of
wavelet transform in the protection of series compensated
transmission lines. IEEE Trans Power Deliv 21:1213–1221
8. Dash PK, Samantray SR (2004) Phase selection and fault section
identification in thyristor controlled series compensated line using
discrete wavelet transform. Int J Electr Power Energy Syst
26:725–732
9. Abdelaziz AY, Ibrahim AM, Mansour MM, Talaat HE (2005)
Modern approaches for protection of series compensated trans-
mission lines. Electr Power Syst Res 75(1):85–98
10. Song YH, Johns AT, Xuan QY (1996) Artificial neural-network-
based protection scheme for controllable series-compensated
123
Neural Computing and Applications
EHV transmission lines. IEE Proc Gener Transm Distrib
143:535–540
11. Song YH, Johns AT, Xuan QY (1997) Protection scheme for
EHV transmission systems with thyristor controlled series com-
pensation using radial basis function neural networks. Electr
Mach Power Syst 25:553–565
12. Parikh UB, Das B, Maheshwari R (2010) Fault classification
technique for series compensated transmission line using support
vector machine. Int J Electr Power Energy Syst 32:629–636
13. Dash P, Samantaray S, Panda G (2007) Fault classification and
section identification of an advanced series compensated trans-
mission line using support vector machine. IEEE Trans Power
Deliv 22:67–73
14. Malathi V, Marimuthu NS, Baskar S, Ramar K (2011) Applica-
tion of extreme learning machine for series compensated trans-
mission line protection. Eng Appl Art Int 24:880–887
15. Pradhan AK, Routray A, Pati S, Pradhan DK (2004) Wavelet
fuzzy combined approach for fault classification of a series-
compensated transmission line. IEEE Trans Power Deliv
19:1612–1618
16. Eristi H (2013) Fault diagnosis system for series compensated
transmission line based on wavelet transform and adaptive neuro-
fuzzy inference system. Measurement 46:393–401
17. Raval PD, Pandya AS (2016) Improved fault classification in
series compensated EHV transmission line using wavelet trans-
form and artificial neural network. In: 2016 IEEE 1st interna-
tional conference on power electronics, intelligent control and
energy systems (ICPEICES), Delhi, pp 1–5
18. Samantaray SR (2007) Decision tree based fault zone identifi-
cation and fault classification in flexible AC transmission based
transmission line. IET-Gen Trans Distrib 3:425–436
19. Jamehbozorg A, Shahrtash SM (2010) A decision tree based
method for fault classification in a single circuit transmission line.
IEEE Trans Power Deliv 25:2190–2196
20. Abdelaziz AY, Mekhamer SF, Ezzat M (2013) Fault location of
uncompensated/series compensated lines using two-ends syn-
chronized measurements. Electr Power Compon Syst
41(7):693–715
21. Raval PD, Pandya AS (2017) A hybrid Wavelet-ANN protection
scheme for series compensated EHV transmission line. J Intell
Fuzzy Syst 32(4):3051–3058
22. Han J, Kamber M (2006) Data mining: concepts and techniques,
2nd edn. Morgan Kaufmann Publishers, Burlington
23. Shawe-Taylor J, Cristianni N (2000) Support vector machines
and other kernel based learning methods. Cambridge University
Press, Cambridge
24. Hagan MH, Demuth HB, Beale MH (1996) Neural network
design. PWS Publishing Co. Boston, ISBN: 0-534-94332-2
Publisher’s Note Springer Nature remains neutral with regard to
jurisdictional claims in published maps and institutional affiliations.