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2012 International Conference on Communication Systems and Network Technologies

Performance Comparison of Mixed CNT Bundle in Global VLSI Interconnect

Nisarg D. Pandya, Manoj Kumar Majumder, B. K. Kaushik and S. K. Manhas


Microelectronics and VLSI Group, Department of Electronics and Computer Engineering
Indian Institute of Technology Roorkee, Roorkee – 247667
Roorkee, INDIA
nis12pec@iitr.ernet.in, manojbesu@gmail.com, bkk23fec@iitr.ernet.in, samanfec@iitr.ernet.in

Abstract—This paper proposes a new modeling approach for Besides of the unique atomic arrangements (comes from
mixed carbon nanotube (CNT) bundle (MCB) interconnects. their unique structure), CNTs also have interesting physical
An accurate modeling hierarchy has been proposed for MCB properties [3] like large current carrying capability [4], long
structures. Bundled single-walled CNTs (SWNTs) and multi- ballistic transport length, high thermal conductivity [5], and
walled CNTs (MWNTs) have been modeled as equivalent mechanical strength [6]. Because of these extraordinary
single conductor (ESC) transmission lines and then combined physical properties, CNTs can show their exciting prospects
to form a MCB interconnect. This MCB interconnect is for a variety of applications in the areas of
basically a multiple single conductor model. By considering microelectronics/nanoelectronics, spintronics, optics,
different arrangements of SWNT and MWNT in mixed CNT material science, mechanical and biological fields [3-7].
bundle, performance is analyzed for two different MCB
Particularly, in the area of nanoelectronics, CNTs and
structures (structure1 and structure 2) in terms of propagation
delay, crosstalk delay and power dissipation. It has been
graphene nanoribbons (GNRs) show their prospects as
observed that crosstalk delay for structure 1 is 55.5% lesser as energy storage devices (such as supercapacitors [8]), energy
compared to structure 2. Consequently, power dissipation for conversion devices (including thermoelectric [9] and
structure 1 is also lesser with respect to structure 2. photovoltaic [10] devices), field emission displays and
radiation sources, nanometer semiconductor transistor, nano-
Keywords-Carbon nanotube (CNT); single-walled CNT electromechanical systems (NEMS) [11], electrostatic
(SWNT); muti-walled CNT (MWNT); mixed CNT bundle discharge (ESD) protection [12], as well as interconnects and
(MCB); crosstalk delay; power dissipation. passives [13].
Several analyzes have already been proposed on basis of
I. INTRODUCTION modeling and characterization for different CNT structures.
Recent analysis focuses on modeling and simulation for
Carbon nanotubes (CNTs) are considered as an emerging different structures of mixed CNT bundle (MCB)
interconnect material in the field of deep-submicron and interconnects. The structure of MCB is more complicated
nano scale technology level. CNTs are popularly known as than that of SWNTs or MWNTs. So, direct analysis of these
allotropes of carbon [1], made by rolling up a sheet of bundles is not possible. Therefore, a new hierarchical model
graphene into a cylinder. The sp2 bonding in graphene is has been developed [14] by considering two CNTs, one
stronger than sp3 bonds in diamond [2] which makes SWNT and one MWNT. Equivalent single conductor (ESC)
graphene the strongest material. Structure of CNTs depends models are developed both for the structures of bundled
on chiral indices which are defined as rolling up direction of SWNT and MWNT interconnects. These different
graphene sheet. CNTs can exhibit unique armchair and interconnect models are combined to develop the MCB
zigzag structure depending on their chiral indices (n, m). For interconnect structure. This paper primarily focuses on
armchair CNTs, chiral indices are defined by n = m and for modeling approach for different MCB structures wherein
zigzag CNTs, it is n or m = 0 [2]. Depending upon their SWNTs and MWNTs are oriented in different fashion.
different structures, CNTs can exhibit both metallic and Performances in terms of propagation delay, crosstalk delay
semiconducting properties. By satisfying the condition n – m and power dissipation have been demonstrated for two
= 3i (where i is an integer), armchair CNTs are always different MCB structures at global interconnect lengths.
metallic and zigzag CNTs are either metallic or This paper is organized in five sections. Section II
semiconducting in nature depending on their chiral indices describes proposed structure and equivalent RLC model for
[2, 3]. Statistically, a natural mix of CNTs will have 1/3rd mixed CNT bundle interconnects. Details of simulation setup
metallic and 2/3rd semiconducting chirality [3]. These unique are given in section III, whereas results are analyzed in
structures of CNTs basically depend on rolling up directions section IV. Finally, section V draws a brief summary.
of graphene sheet. CNTs are also classified into single-
walled CNTs (SWNTs) and multi-walled CNTs (MWNTs). II. PROPOSED MCB STRUCTURES
SWNTs are formed by only one rolled up graphene sheet Hypothetically, bundled CNT may contain only SWNTs
whereas MWNTs are formed by two or more concentrically or only MWNTs. However, a realistic CNT bundle contains
rolled graphene sheets. Double-walled CNT (DWNT) is a mix of SWNTs and MWNTs randomly arranged across the
categorized as a type of MWNT which consists only two cross-section [15]. Depending on process controls and
concentrically rolled up graphene sheets.

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DOI 10.1109/CSNT.2012.171
conditions during CNT synthesis, diameters of CNTs inside
a bundle follow normal distributions [15]. In this section, the
proposed bundle structure and their ESC models are
discussed.
A. Proposed Structure of MCB
Several researchers have already been reported that
conductivity of SWNTs is more than that of MWNTs.
Depending on this assumptions, this paper proposes two
different structures which contains different orientations of Fig. 3 ESC of an SWCNT bundle or and MWCNT [22]
SWNTs and MWNTs in bundle. The first structure (structure
1) of MCB is proposed in such a way that all the tubes which For an SWNT and MWNT bundle, the effective p.u.l.
conduct maximum current are placed at centre of the bundle kinetic inductance L'kESC and quantum capacitance
as shown in Fig. 1 [16]. The second structure (structure 2) C' are given by equation (3) and (4) respectively, in
demonstrates that all the tubes which conduct least or no qESC
current are at middle of mixed bundle as shown in Fig. 2 which ntot is defined as the total number of SWNTs and
[16]. The primary advantage of using the structure of Fig. 1 MWNTs in bundle.
is that conduction mainly occurs through the tubes at center L'
L'kESC = k0 (3)
of the bundle, while those at the outer periphery would serve
as the shields from neighboring CNT bundles [17]. Each of 2n
tot
these tubes (central or peripheral) can either be SWNTs or '
CqESC = 2ntot Cq' 0 (4)
MWNTs, which are again, either metallic or semi-
conducting in nature. It can be roughly estimated that 1/3rd of where L' = 16.1mH/m and C' = 96.8pF/m are the p.u.l.
k0 q0
the total CNTs in the bundle would be metallic, while 2/3rd
kinetic and quantum capacitance of a spinless single
are semi-conducting [17].
conducting channel, respectively [17].
At both ends, the tube is terminated on the lumped
resistance [18],
R
RtESC = 0 + Rm (5)
2n
tot
where R0 = 12.9K [18] is the intrinsic dc resistance of
SWNT and MWNT and Rm represents tube-to-metal contact
Fig. 1. Structure 1 shows MWNTs at periphery while all the SWNTs are at resistance. Depending upon fabrication process, the value of
the middle portion of bundle [16]. contact resistance ranges from a few ohms to hundred of
kilo-ohms.
The effective p.u.l. external capacitance of the ESC,
C' is computed as electrostatic capacitance of that
eESC
circumscribes the bundle by using equation (6). On the other
hand, effective p.u.l. magnetic inductance L'eESC is
computed in most general case by using the equation (7).
2πε
'
CeESC = (6)
Fig. 2. Structure 2 shows SWNTs at periphery while all the MWNTs are at ln( h / d )
the middle portion of bundle [16]. μ h
L'eESC = ln( ) (7)
B. Equivalent RLC model for proposed MCB structures 2π d
Equivalent RLC model for MCB has been developed by where d is nanotube diameter and h is the distance of the
the combination of ESC model of bundled SWNT and bundle from ground plane. For d=1nm and h=1m,
MWNT interconnects. The ESC models for both of the '
calculated value for CeESC (p.u.l.) and L'eESC (p.u.l.) are
bundled CNT structures have been developed on basis of 30aF/m and 1.4pH/m, respectively [19].
transmission line theory. The general ESC circuit model of a On basis of the ESC transmission line model parameters,
multiconductor nanoline is sketched in Fig. 3 in which the
equivalent RLC model for proposed MCB interconnect is
effective p.u.l. inductance and capacitance are as follows
[18], shown in Fig. 4. In this equivalent model, it is assumed that
all shells of MWNT are parallel and connected at both ends.
L'ESC = L'kESC + L'eESC (1)
By considering equal potential across components of each
'
CESC = (C '−1 + C '−1 )−1 (2) shell, simplified equivalent model is derived for MWNT
qESC eESC
interconnects with different number of shells.

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Fig. 5. Two line bus architecture for two parallel MCBs.

IV. RESULTS AND DISCUSSIONS


In this paper, simulations are run for two coupled line bus
architecture (shown in Fig. 5) by considering the first line as
aggressor and the second one is as victim. Propagation delay
under the influence of dynamic crosstalk has been observed
for opposite transition at two adjacent (aggressor and victim)
lines. Crosstalk delays are evaluated for different global
Fig. 4. Equivalent RLC model for proposed MCB interconnects interconnect lengths at fixed transition time and spacing
(between aggressor and victim) of 1ns and 2nm,
In proposed RLC equivalent model of Fig. 4, coupling respectively.
capacitance has been considered between bundled SWNT Fig. 6 and Fig. 7 demonstrate a good comparison
and MWNT interconnects. The coupling capacitance between two different MCB interconnect structures
depends on two factors: (1) diameter of bundled SWNT and (structure1 and structure2) in terms of propagation delay and
MWNT, and (2) spacing between two adjacent bundles. It power dissipation. It has been observed that propagation
can be expressed by the folowing equation [20], delay for structure 1 is more as compared to structure 2 at
πε different global interconnect lengths. However, power
CCM − ESC = (8)
cosh− 1(Sp D ) dissipation for structure 2 is more than structure 1. On the
other hand, propagation delay under the influence of
where Sp denotes the spacing between two bundled structures dynamic crosstalk is demonstrated for two different MCB
and D is the average diameter of bundled SWNT and structures at a wide range of global interconnect lengths. The
MWNT. results of crosstalk induced time delay and their percentage
III. SIMULATION SETUP improvement are summarized in Table I. It has been
observed that crosstalk induced time delay improves by
Analysis of propagation delay under the influence of 55.5% for structure 1 as compared to structure 2. This
dynamic crosstalk has been observed for MCB interconnects improvement is more progressive with increasing
with incorporation of two coupled line bus architecture, as interconnect lengths.
shown in Fig. 5. Out of these two lines, one is referred as The reason behind is the structural difference of mixed
aggressor and the other one is as victim. The interconnect CNT bundles. From Fig. 1 and Fig. 2, it has been observed
line in bus architecture is replaced by equivalent RLC that MWNTs are at periphery for structure 1, whereas for
transmission line model of MCB interconnect which is structure 2 MWNTs are at centre. As the conductivity of
shown in Fig. 4. In the bus architecture of Fig. 5, a CMOS MWNTs is less as compared to SWNTs, propagation delay
inverter is used instead of a simple resistive driver for is more for structure 1 with respect to structure 2.
accurate estimation of crosstalk induced time delay and Consequently, improvement in crosstalk delay is also more
power dissipation. The reason behind is that a CMOS gate for structure 1. However, power dissipation is less for
operates partially in linear region and partially in saturation structure 1 as compared to structure 2. This fact can be
region during switching. But, a transistor can be accurately understood by the expression of average power dissipation
approximated by a resistor only in the linear region. In [22],
saturation region, transistor is more accurately modeled as a CLV 2
current source with a parallel high resistance [21]. The bus Pavg = DD (9)
architecture has the following values of load capacitance tp
(Cri) and power supply voltage (Vdd): Cri = 10aF, with i = 1, where Pavg, CL, VDD and tp denote average power dissipation
2, 3, and Vdd = 1V. Simulations are performed for two of the interconnect line, load capacitance, supply voltage and
opposite signal transitions at aggressor and victim lines propagation delay, respectively. As propagation delay is
(dynamic crosstalk). Propagation delay, crosstalk induced more for structure 1, average power dissipation becomes
time delay and power dissipation have been observed at lesser as compared to structure 2.
different global interconnect lengths ranging from 100m to
1000m or 1mm.

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