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Ad Hoc SPC with aspenONE

Process Explorer Analytics

28-Aug-2014

© 2014 Aspen Technology, Inc. All rights reserved


Introducing
aspenONE Process Explorer Analytics

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aspenONE Process Explorer
Overview

 Easiest, fastest, and most effective


way to visualize and analyze Aspen
InfoPlus.21 data
 Provides safe, secure access on any
browser without the need for client-
side software
 Unleashes power of desktop
visualization/analysis in a
web/mobile environment
 Easily imports/converts previous
Aspen InfoPlus.21 graphics for
almost zero migration effort

Works with IP.21 – from V7.3


forward
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aspenONE Process Explorer Analytics
Overview

 aspenONE Process Explorer


Analytics is a companion analysis
product to aspenONE Process
Explorer
 Prepackaged analytical solutions
with no coding or customization
required
 Built using the same underlying
HTML-5 technology as aspenONE
Process Explorer
 Accessed from within aspenONE
Process Explorer
 Provides industry standard
methods for benchmarking and
performance analysis

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aspenONE Process Explorer Analytics
Overall Equipment Effectiveness (OEE)

 Most widely recognized


industry KPI
 Composite metric that allows
users to see how Production,
Quality, and Equipment
Availability are affecting plant
performance
 Waterfall chart representation
of major factors affecting OEE
 Drill-down ability allows users
to quickly identify why a plant
is not achieving its goals

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aspenONE Process Explorer Analytics
Ad-hoc SPC

 Ad Hoc SPC provides an exploratory


analytical technique to evaluate the
variability of product quality and other
associated measures
 By evaluating various limits types and
outlier rules, we can better understand
and quantify the sources and degree of
variability
 By deploying ad hoc SPC on aspenONE
Process Explorer, we are providing this
type of exploratory analysis in a true
web and mobile environment
 The second major use case is to explore
various chart types, limits and outlier
methods to determine the best
configuration for on-line SPC applications

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Today’s Presenter

ERNEST UMARWADIA, PRODUCT MANAGER


 Ernest Umarwadia has been working in
AspenTech’s Manufacturing Product
Management team for about 2 years. He led
the design of the features in aspenONE
Process Explorer Analytics. He has a B.S. in
Chemical Engineering from the University of
Wisconsin-Madison.

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AspenTech’s Global User Conference:
OPTIMIZE™ 2015

 The only global conference


focused exclusively on
optimizing process
manufacturing
 OPTIMIZE 2013 featured
700+ attendees from more
than 40 countries
 Take advantage of customer
presentations, keynote
addresses, technology 4 – 6 May 2015
demos, and more! Westin Waterfront Hotel
Boston, MA USA
 Save the date…more details
to come!

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Want to see similar results?

Consider a training class from AspenTech

http://training.aspentech.com or Email apac.training@aspentech.com

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Aspen Process Explorer: Using and
Configuring

Aspen Process Explorer: Using and Configuring (PME122)


Oct 30, 2014 – Pune, India

Dec 10, 2014 – Brisbane, Australia

http://support.aspentech.com/supportpublictrain/CourseInfo.asp?course=PME122

• Be able to customize the appearance of trend plots to suit your application


• Be able to specify plots based on statistical analysis of process data (aggregates)
• Gain access to your process data in Aspen InfoPlus.21 without the need to study
detailed database functionality
• Data accessibility improves productivity
• Timely availability of appropriate process information is a key management issue

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On-Demand and Upcoming APAC Webinars

 Upcoming Webinars:
– Register at: http://www.aspentech.com/events/webseminars.cfm
– \

APAC Dates Title Category


Create, Share, and Modify Your Refinery Flowsheet—Quickly and Easily—with
2-Sep -2014 MSC
aspenONE® PIMS Platinum
22 Minute Webinar Do You Have a Congested Jetty Check Out Dock Scheduling in
4-Sep -2014 MSC
APS
Inprocess Improve Control System Design and Operator Training with Aspen
11-Sep-2014 ENG
HYSYS Dynamic
18-Sep-2014 Make More Confident Planning Decisions with Aspen PIMS-AO (Technical) MSC

 On-Demand Webinars:
– Visit: http://www.aspentech.com/events/ondemand_webinar.cfm

 For more information on today’s topic, please contact:


– Pauline.Ee@aspentech.com for SEA and SA
– Sarah.Suh@aspentech.com for Australia
– Miyuki.Fukuoka@aspentech.com for Japan

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Questions
Thank You

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