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History[edit]
SPC was pioneered by Walter A.
Shewhart at Bell Laboratories in the early
1920s. Shewhart developed the control
chart in 1924 and the concept of a state of
statistical control. Statistical control is
equivalent to the concept
of exchangeability[1][2] developed by
logician William Ernest Johnson also in
1924 in his book Logic, Part III: The Logical
Foundations of Science.[3] Along with a
team at AT&T that included Harold
Dodge and Harry Romig he worked to
put sampling inspection on a rational
statistical basis as well. Shewhart consulted
with Colonel Leslie E. Simon in the
application of control charts to munitions
manufacture at the Army's Picatinny
Arsenal in 1934. That successful
application helped convince Army
Ordnance to engage AT&T's George
Edwards to consult on the use of statistical
quality control among its divisions and
contractors at the outbreak of World War II.
W. Edwards Deming invited Shewhart to
speak at the Graduate School of the U.S.
Department of Agriculture, and served as
the editor of Shewhart's book Statistical
Method from the Viewpoint of Quality
Control (1939) which was the result of that
lecture. Deming was an important architect
of the quality control short courses that
trained American industry in the new
techniques during WWII. The graduates of
these wartime courses formed a new
professional society in 1945, the American
Society for Quality Control, which elected
Edwards as its first president. Deming
traveled to Japan during the Allied
Occupation and met with the Union of
Japanese Scientists and Engineers (JUSE)
in an effort to introduce SPC methods
to Japanese industry .[4][5]
"Common" and "special" sources of
variation[edit]
Main article: Common cause and special
cause (statistics)
Shewhart read the new statistical theories
coming out of Britain, especially the work
of William Sealy Gosset, Karl Pearson,
and Ronald Fisher. However, he
understood that data from physical
processes seldom produced a "normal
distribution curve"; that is, a Gaussian
distribution or "bell curve". He discovered
that data from measurements of variation in
manufacturing did not always behave the
way as data from measurements of natural
phenomena (for example, Brownian
motion of particles). Shewhart concluded that while every process displays variation, some
processes display variation that is natural to the process ("common" sources of variation)- these
processes were described as 'in (statistical) control'. Other processes additionally display variation
that is not present in the causal system of the process at all times ("special" sources of variation),
and these were described as 'not in control'.[6]
Application to non-manufacturing processes[edit]
In 1988, the Software Engineering Institute suggested that SPC could be applied to non-
manufacturing processes, such as software engineering processes, in the Capability Maturity
Model (CMM). The Level 4 and Level 5 practices of the Capability Maturity Model Integration (CMMI)
use this concept.
The notion that SPC is a useful tool when applied to non-repetitive, knowledge-intensive processes
such as research and development or systems engineering has encountered skepticism and
remains controversial.[7][8]
Application of SPC[edit]
The application of SPC involves three main phases of activity: