Diffraction

2017100386
PHY13L/B1
CE/2

1. DATA
For single slit diffraction, we obtained a 4.7% error to the true value of 670 nanometer from the
wavelength of light wavelength from the diode laser. When slit distance and its length from the screen is
held constant while the magnitude of integer representing the position of a dark fringe represented by m is
increased, its distance from the center line increases. For the two slit interference, we have obtained less
than 1% error for the computed wavelength to the true value of light wavelength. In addition, when
distance between two slits and its horizontal length to the screen is held constant, the computed distance
of a point of a constructive interference from the center line increases as we increase the magnitude of m.
2. RESULTS AND DISCUSSION
Diffraction occurs when light waves pass through obstacles or slits and manifests its bending capabilities.
From Huygen’s principle, every point between a wave source lies secondary wavelets that travels the
same speed of propagation as the wave source and when passing through slits, tendency is formation of
diffraction patterns. Bright fringes represent the point of constructive interference and dark fringes for
destructive interference. In finding the location of dark fringes in single slit diffraction and bright fringes
mxλ
in double slit interference is given by Y m= wherein m is the integer representing position of dark
a
fringe for single slit and bright fringe for double slit, x for length from slit to screen, lambda as
wavelength of the light wave and a as the distance between slits. This was derived from the relationship
that path difference is equal to the phase difference, as since the slits are divided into elements that serves
as starting points for diffracted waves, others travel at a longer distance at specific points than the others,
λ
and therefore has a phase difference equal to for single slit and λ for double slits. Utilizing the
2
formula aided us in getting accurate experimental values. We attribute our errors to our measurement and
recording as it was very difficult to measure diffraction patterns due to its minuscule spaces between
fringes.
3. CONCLUSION
Diffraction is the bending of light waves when passing through obstacles or slits and follows the
Huygen’s principle. Single slit diffraction pattern is due to the interference of light waves from one half of
slit length and the other half. Double slit interference is due to the interference of light waves from two
separate slits.