Professional Documents
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Differential Protection
Test Person:
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Test Object - Device Settings
. . .
Substation/Bay:
Substation: substation Substation address: substation address
Bay: bay Bay address: bay address
. . .
Device:
Name/description: P642?1?A1?0060P Manufacturer: ALSTOM
Device type: Transformer differential Device address: 1
Serial/model number: 123456A
Additional info 1: information
Additional info 2: MiCOM P642
Hardware Configuration
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Test Equipment
Type Serial Number
CMC256plus ??????
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Hardware Check
Performed At Result Details
Not yet performed
Instructions
Instruction Text:
Please read the manual of the OMICRON PTT for the ALSTOM P642 first!
Follow the test procedure and safety instructions for the relay to be tested before starting!
User Input:
User Input:
Wiring Test
. .
Test Module
Name: OMICRON Diff Configuration Version: 2.30
Test Start: Test End:
User Name: Manager:
Company:
.
Test State:
No results available!
Initial Test
. .
Test Module
Name: OMICRON Diff Trip Time Version: 2.30
Characteristic
Test Start: Test End:
User Name: Manager:
Company:
Press the "Passed" button if no trip occurs after a considerable time to evaluate the configuration test.
Overcurrent and Earth Fault protection functions can interfere Diff tests. Block these functions if necessary.
User Input:
.
Test State:
No results available!
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Test State:
No results available!
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Test State:
No results available!
0 out of 1 points tested.
0 points passed. 0
points failed.
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Test State:
No results available!
Test Results
Assessment Results
Name/ Exec. Ramp Condition Sig Nom. Act. Tol.- Tol.+ Dev. Assess Tact
Assess: + .. Passed x .. Failed o .. Not assessed
Assessment Statistics
Name Ramp Condition Sig Nom. Act.Av. min max Std. Dev. Assess
Assess: + .. Passed x .. Failed o .. Not assessed
Calculation Results
Name/ Exec. Calc. X Y Nom. Act. Tol.- Tol.+ Dev. Assess
Assess: + .. Passed x .. Failed o .. Not assessed
Calculation Statistics
Name Calc. X Y Nom. Act.Av. min max Std. Dev. Assess
Assess: + .. Passed x .. Failed o .. Not assessed
Test Results
Assessment Results
Name/ Exec. Ramp Condition Sig Nom. Act. Tol.- Tol.+ Dev. Assess Tact
Assess: + .. Passed x .. Failed o .. Not assessed
Assessment Statistics
Name Ramp Condition Sig Nom. Act.Av. min max Std. Dev. Assess
Assess: + .. Passed x .. Failed o .. Not assessed
Calculation Results
Name/ Exec. Calc. X Y Nom. Act. Tol.- Tol.+ Dev. Assess
Assess: + .. Passed x .. Failed o .. Not assessed
Calculation Statistics
Name Calc. X Y Nom. Act.Av. min max Std. Dev. Assess
Assess: + .. Passed x .. Failed o .. Not assessed
.
Test State:
No results available!
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Test State:
No results available!
Test Results for Testphase A-B-C at Reference Side Side 1 for 2. Harmonic
Idiff Ixf/Idiff Ixf/Idiff Angle Dev (rel) Dev.(abs) Check Test State Result
Nominal Actual (Ixf,Idiff)
1,50 I/In 20,000 % n/a -120,0 ° n/a n/a Not tested n/a
.
State:
0 out of 1 points tested. 0 points passed. 0
points failed.
Test Results for Testphase A-B-C at Reference Side Side 1 for 5. Harmonic
Idiff Ixf/Idiff Ixf/Idiff Angle Dev (rel) Dev.(abs) Check Test State Result
Nominal Actual (Ixf,Idiff)
1,50 I/In 35,000 % n/a -120,0 ° n/a n/a Not tested n/a
.
State:
0 out of 1 points tested. 0 points passed. 0
points failed.
User Input:
.
Elements - Phase:
Active Name Tripping characteristic I Pick-up Time Reset Ratio Direction
No Overcurrent1 I>1 IEC S Inverse (TMS) 1,00 Iref 1,00 0,95 Non Directional
No Overcurrent1 I>2 DT 1,00 Iref 1,03 0,95 Non Directional
No Overcurrent1 I>3 DT 10,00 Iref 0,03 s 0,95 Non Directional
No Overcurrent1 I>4 DT 10,00 Iref 0,03 s 0,95 Non Directional
No Overcurrent2 I>1 IEC S Inverse (TMS) 1,00 Iref 1,00 0,95 Non Directional
No Overcurrent2 I>2 DT 1,00 Iref 1,03 0,95 Non Directional
No Overcurrent2 I>3 DT 10,00 Iref 0,03 s 0,95 Non Directional
No Overcurrent2 I>4 DT 10,00 Iref 0,03 s 0,95 Non Directional
.
Elements - Residual:
Active Name Tripping characteristic I Pick-up Time Reset Ratio Direction
Yes EF 1 IN>1 IEC S Inverse (TMS) 0,20 Iref 1,00 0,95 Non Directional
No EF 1 IN>2 DT 0,20 Iref 1,03 0,95 Non Directional
No EF 1 IN>3 DT 0,50 Iref 0,03 s 0,95 Non Directional
No EF 1 IN>4 DT 0,50 Iref 0,03 s 0,95 Non Directional
No EF 2 IN>1 IEC S Inverse (TMS) 0,20 Iref 1,00 0,95 Non Directional
No EF 2 IN>2 DT 0,20 Iref 1,03 0,95 Non Directional
No EF 2 IN>3 DT 0,50 Iref 0,03 s 0,95 Non Directional
No EF 2 IN>4 DT 0,50 Iref 0,03 s 0,95 Non Directional
. .
Test Module
Name: OMICRON Overcurrent Version: 3.00 SR 2
Test Start: Test End:
User Name: Manager:
Company:
Test Settings:
.
Fault Model:
Time reference: Fault inception
Load current: 0,00 A
Load angle: 0,00 °
Prefault time: 0,10 s
Abs. max time: 240,00 s
Post fault time: 0,50 s
Rel. max time: 100,00 %
Enable voltage output: No
Fault voltage LN (for all but two phase faults): 30,00 V
Fault voltage LL (for two phase faults): 51,96 V
Decaying DC active: No
Time constant: 0,05 s
CB char min time: 0,05 s
Thermal reset active: No
Thermal reset method: Manual
Thermal reset message: Please reset the Thermal Memory of the device under
test before continuing.
Binary Inputs:
Trigger Logic: And
Name Trigger State
Trip Side 1 X
Trip Side 2 X
Pickup 1
.
Pick-up / Drop-off Test:
Type Angle Resolution I Pick-up Reset Ratio
nom min max nom
A-B-C n/a 0,07 s +∞A +∞A +∞A n/a
.
Pick-up / Drop-off Test Results:
Type Angle I Pick-up I Drop-off Reset Ratio Result
nom act act nom act Error
A-B-C n/a +∞A n/a n/a n/a n/a n/a Out of range
.
State:
0 out of 1 points tested.
0 points passed.
0 points failed.
.
Elements - Phase:
Active Name Tripping characteristic I Pick-up Time Reset Ratio Direction
No Overcurrent1 I>1 IEC S Inverse (TMS) 1,00 Iref 1,00 0,95 Non Directional
No Overcurrent1 I>2 DT 1,00 Iref 1,03 0,95 Non Directional
No Overcurrent1 I>3 DT 10,00 Iref 0,03 s 0,95 Non Directional
No Overcurrent1 I>4 DT 10,00 Iref 0,03 s 0,95 Non Directional
No Overcurrent2 I>1 IEC S Inverse (TMS) 1,00 Iref 1,00 0,95 Non Directional
No Overcurrent2 I>2 DT 1,00 Iref 1,03 0,95 Non Directional
No Overcurrent2 I>3 DT 10,00 Iref 0,03 s 0,95 Non Directional
No Overcurrent2 I>4 DT 10,00 Iref 0,03 s 0,95 Non Directional
.
Elements - Residual:
Active Name Tripping characteristic I Pick-up Time Reset Ratio Direction
Yes EF 1 IN>1 IEC S Inverse (TMS) 0,20 Iref 1,00 0,95 Non Directional
No EF 1 IN>2 DT 0,20 Iref 1,03 0,95 Non Directional
No EF 1 IN>3 DT 0,50 Iref 0,03 s 0,95 Non Directional
No EF 1 IN>4 DT 0,50 Iref 0,03 s 0,95 Non Directional
No EF 2 IN>1 IEC S Inverse (TMS) 0,20 Iref 1,00 0,95 Non Directional
No EF 2 IN>2 DT 0,20 Iref 1,03 0,95 Non Directional
No EF 2 IN>3 DT 0,50 Iref 0,03 s 0,95 Non Directional
No EF 2 IN>4 DT 0,50 Iref 0,03 s 0,95 Non Directional
. .
Test Module
Name: OMICRON Overcurrent Version: 3.00 SR 2
Test Start: Test End:
User Name: Manager:
Company:
Test Settings:
.
Fault Model:
Time reference: Fault inception
Load current: 0,00 In
Load angle: same as fault angle
Prefault time: 0,10 s
Abs. max time: 240,00 s
Post fault time: 0,50 s
Rel. max time: 100,00 %
Enable voltage output: No
Fault voltage LN (for all but two phase faults): 1,00 Vn
Fault voltage LL (for two phase faults): 1,73 Vn
Decaying DC active: No
Time constant: 0,05 s
CB char min time: 1,00 CB_trip_time
Thermal reset active: No
Thermal reset method: Manual
Thermal reset message: Please reset the Thermal Memory of the device under
test before continuing.
.
Shot Test:
Type Relative To Factor Magnitude Angle tnom tmin tmax
A-B-C Overcurrent1 I>1 0,940 0,94 In n/a No trip No trip No trip
A-B-C Overcurrent1 I>1 1,060 1,06 In n/a No trip No trip No trip
A-B-C Overcurrent1 I>2 0,940 0,94 In n/a No trip No trip No trip
A-B-C Overcurrent1 I>2 1,060 1,06 In n/a No trip No trip No trip
A-B-C Overcurrent1 I>3 0,940 9,40 In n/a No trip No trip No trip
A-B-C Overcurrent1 I>3 1,060 10,60 In n/a No trip No trip No trip
A-B-C Overcurrent1 I>4 0,940 9,40 In n/a No trip No trip No trip
A-B-C Overcurrent1 I>4 1,060 10,60 In n/a No trip No trip No trip
A-B-C Overcurrent2 I>1 0,940 0,94 In n/a No trip No trip No trip
A-B-C Overcurrent2 I>1 1,060 1,06 In n/a No trip No trip No trip
A-B-C Overcurrent2 I>2 0,940 0,94 In n/a No trip No trip No trip
A-B-C Overcurrent2 I>2 1,060 1,06 In n/a No trip No trip No trip
A-B-C Overcurrent2 I>3 0,940 9,40 In n/a No trip No trip No trip
A-B-C Overcurrent2 I>3 1,060 10,60 In n/a No trip No trip No trip
A-B-C Overcurrent2 I>4 0,940 9,40 In n/a No trip No trip No trip
A-B-C Overcurrent2 I>4 1,060 10,60 In n/a No trip No trip No trip
Binary Inputs:
Trigger Logic: Or
Name Trigger State
Trip Side 1 1
Trip Side 2 X
Pickup X
.
Shot Test Results:
Type Relative To Factor Magnitude Angle tnom tact Overload Result
A-B-C Overcurrent1 I>1 0,940 0,94 In n/a No trip -1,000 s Skipped
A-B-C Overcurrent1 I>1 1,060 1,06 In n/a No trip -1,000 s Skipped
A-B-C Overcurrent1 I>2 0,940 0,94 In n/a No trip -1,000 s Skipped
A-B-C Overcurrent1 I>2 1,060 1,06 In n/a No trip -1,000 s Skipped
A-B-C Overcurrent1 I>3 0,940 9,40 In n/a No trip -1,000 s Skipped
A-B-C Overcurrent1 I>3 1,060 10,60 In n/a No trip -1,000 s Skipped
A-B-C Overcurrent1 I>4 0,940 9,40 In n/a No trip -1,000 s Skipped
A-B-C Overcurrent1 I>4 1,060 10,60 In n/a No trip -1,000 s Skipped
A-B-C Overcurrent2 I>1 0,940 0,94 In n/a No trip -1,000 s Skipped
A-B-C Overcurrent2 I>1 1,060 1,06 In n/a No trip -1,000 s Skipped
A-B-C Overcurrent2 I>2 0,940 0,94 In n/a No trip -1,000 s Skipped
A-B-C Overcurrent2 I>2 1,060 1,06 In n/a No trip -1,000 s Skipped
A-B-C Overcurrent2 I>3 0,940 9,40 In n/a No trip -1,000 s Skipped
A-B-C Overcurrent2 I>3 1,060 10,60 In n/a No trip -1,000 s Skipped
A-B-C Overcurrent2 I>4 0,940 9,40 In n/a No trip -1,000 s Skipped
A-B-C Overcurrent2 I>4 1,060 10,60 In n/a No trip -1,000 s Skipped
.
State:
0 out of 16 points tested.
0 points passed.
0 points failed.
. .
Test Module
Name: OMICRON Overcurrent Version: 3.00 SR 2
Test Start: Test End:
User Name: Manager:
Company:
Test Settings:
.
Fault Model:
Time reference: Fault inception
Load current: 0,00 A
Load angle: 0,00 °
Prefault time: 0,10 s
Abs. max time: 240,00 s
Post fault time: 0,50 s
Rel. max time: 100,00 %
Enable voltage output: No
Fault voltage LN (for all but two phase faults): 30,00 V
Fault voltage LL (for two phase faults): 51,96 V
Decaying DC active: No
Time constant: 0,05 s
CB char min time: 0,05 s
Thermal reset active: No
Thermal reset method: Manual
Thermal reset message: Please reset the Thermal Memory of the device under
test before continuing.
Binary Inputs:
Trigger Logic: And
Name Trigger State
Trip Side 1 X
Trip Side 2 X
Pickup 1
.
Pick-up / Drop-off Test:
Type Angle Resolution I Pick-up Reset Ratio
nom min max nom
A-B-C n/a 0,07 s +∞A +∞A +∞A n/a
.
Pick-up / Drop-off Test Results:
Type Angle I Pick-up I Drop-off Reset Ratio Result
nom act act nom act Error
A-B-C n/a +∞A n/a n/a n/a n/a n/a Out of range
.
State:
0 out of 1 points tested.
0 points passed.
0 points failed.
. .
Test Module
Name: OMICRON Overcurrent Version: 3.00 SR 2
Test Start: Test End:
User Name: Manager:
Company:
Test Settings:
.
Fault Model:
Time reference: Fault inception
Load current: 0,00 In
Load angle: same as fault angle
Prefault time: 0,10 s
Abs. max time: 240,00 s
Post fault time: 0,50 s
Rel. max time: 100,00 %
Enable voltage output: No
Fault voltage LN (for all but two phase faults): 1,00 Vn
Fault voltage LL (for two phase faults): 1,73 Vn
Decaying DC active: No
Time constant: 0,05 s
CB char min time: 1,00 CB_trip_time
Thermal reset active: No
Thermal reset method: Manual
Thermal reset message: Please reset the Thermal Memory of the device under
test before continuing.
.
Shot Test:
Type Relative To Factor Magnitude Angle tnom tmin tmax
A-B-C Overcurrent1 I>1 0,940 0,94 In n/a No trip No trip No trip
A-B-C Overcurrent1 I>1 1,060 1,06 In n/a No trip No trip No trip
A-B-C Overcurrent1 I>2 0,940 0,94 In n/a No trip No trip No trip
A-B-C Overcurrent1 I>2 1,060 1,06 In n/a No trip No trip No trip
A-B-C Overcurrent1 I>3 0,940 9,40 In n/a No trip No trip No trip
A-B-C Overcurrent1 I>3 1,060 10,60 In n/a No trip No trip No trip
A-B-C Overcurrent1 I>4 0,940 9,40 In n/a No trip No trip No trip
A-B-C Overcurrent1 I>4 1,060 10,60 In n/a No trip No trip No trip
A-B-C Overcurrent2 I>1 0,940 0,94 In n/a No trip No trip No trip
A-B-C Overcurrent2 I>1 1,060 1,06 In n/a No trip No trip No trip
A-B-C Overcurrent2 I>2 0,940 0,94 In n/a No trip No trip No trip
A-B-C Overcurrent2 I>2 1,060 1,06 In n/a No trip No trip No trip
A-B-C Overcurrent2 I>3 0,940 9,40 In n/a No trip No trip No trip
A-B-C Overcurrent2 I>3 1,060 10,60 In n/a No trip No trip No trip
A-B-C Overcurrent2 I>4 0,940 9,40 In n/a No trip No trip No trip
A-B-C Overcurrent2 I>4 1,060 10,60 In n/a No trip No trip No trip
Binary Inputs:
Trigger Logic: Or
Name Trigger State
Trip Side 1 X
Trip Side 2 1
Pickup X
.
Shot Test Results:
Type Relative To Factor Magnitude Angle tnom tact Overload Result
A-B-C Overcurrent1 I>1 0,940 0,94 In n/a No trip -1,000 s Skipped
A-B-C Overcurrent1 I>1 1,060 1,06 In n/a No trip -1,000 s Skipped
A-B-C Overcurrent1 I>2 0,940 0,94 In n/a No trip -1,000 s Skipped
A-B-C Overcurrent1 I>2 1,060 1,06 In n/a No trip -1,000 s Skipped
A-B-C Overcurrent1 I>3 0,940 9,40 In n/a No trip -1,000 s Skipped
A-B-C Overcurrent1 I>3 1,060 10,60 In n/a No trip -1,000 s Skipped
A-B-C Overcurrent1 I>4 0,940 9,40 In n/a No trip -1,000 s Skipped
A-B-C Overcurrent1 I>4 1,060 10,60 In n/a No trip -1,000 s Skipped
A-B-C Overcurrent2 I>1 0,940 0,94 In n/a No trip -1,000 s Skipped
A-B-C Overcurrent2 I>1 1,060 1,06 In n/a No trip -1,000 s Skipped
A-B-C Overcurrent2 I>2 0,940 0,94 In n/a No trip -1,000 s Skipped
A-B-C Overcurrent2 I>2 1,060 1,06 In n/a No trip -1,000 s Skipped
A-B-C Overcurrent2 I>3 0,940 9,40 In n/a No trip -1,000 s Skipped
A-B-C Overcurrent2 I>3 1,060 10,60 In n/a No trip -1,000 s Skipped
A-B-C Overcurrent2 I>4 0,940 9,40 In n/a No trip -1,000 s Skipped
A-B-C Overcurrent2 I>4 1,060 10,60 In n/a No trip -1,000 s Skipped
.
State:
0 out of 16 points tested.
0 points passed.
0 points failed.
.
Elements - Phase:
Active Name Tripping characteristic I Pick-up Time Reset Ratio Direction
No Overcurrent1 I>1 IEC S Inverse (TMS) 0,20 Iref 1,00 0,95 Non Directional
No Overcurrent1 I>2 DT 0,20 Iref 1,03 0,95 Non Directional
No Overcurrent1 I>3 DT 2,00 Iref 0,03 s 0,95 Non Directional
No Overcurrent1 I>4 DT 2,00 Iref 0,03 s 0,95 Non Directional
No Overcurrent2 I>1 IEC S Inverse (TMS) 0,20 Iref 1,00 0,95 Non Directional
No Overcurrent2 I>2 DT 0,20 Iref 1,03 0,95 Non Directional
No Overcurrent2 I>3 DT 2,00 Iref 0,03 s 0,95 Non Directional
No Overcurrent2 I>4 DT 2,00 Iref 0,03 s 0,95 Non Directional
.
Elements - Residual:
Active Name Tripping characteristic I Pick-up Time Reset Ratio Direction
Yes EF 1 IN>1 IEC S Inverse (TMS) 0,20 Iref 1,00 0,95 Non Directional
No EF 1 IN>2 DT 0,04 Iref 1,03 0,95 Non Directional
No EF 1 IN>3 DT 0,10 Iref 0,03 s 0,95 Non Directional
No EF 1 IN>4 DT 0,10 Iref 0,03 s 0,95 Non Directional
No EF 2 IN>1 IEC S Inverse (TMS) 0,40 Iref 1,00 0,95 Non Directional
No EF 2 IN>2 DT 0,04 Iref 1,03 0,95 Non Directional
No EF 2 IN>3 DT 0,10 Iref 0,03 s 0,95 Non Directional
No EF 2 IN>4 DT 0,10 Iref 0,03 s 0,95 Non Directional
. .
Test Module
Name: OMICRON Overcurrent Version: 3.00 SR 2
Test Start: Test End:
User Name: Manager:
Company:
Test Settings:
.
Fault Model:
Time reference: Fault inception
Load current: 0,00 A
Load angle: 0,00 °
Prefault time: 0,10 s
Abs. max time: 240,00 s
Post fault time: 0,50 s
Rel. max time: 100,00 %
Enable voltage output: No
Fault voltage LN (for all but two phase faults): 30,00 V
Fault voltage LL (for two phase faults): 51,96 V
Decaying DC active: No
Time constant: 0,05 s
CB char min time: 0,05 s
Thermal reset active: No
Thermal reset method: Manual
Thermal reset message: Please reset the Thermal Memory of the device under
test before continuing.
Binary Inputs:
Trigger Logic: And
Name Trigger State
Trip Side 1 X
Trip Side 2 X
Pickup 1
.
Pick-up / Drop-off Test:
Type Angle Resolution I Pick-up Reset Ratio
nom min max nom
A-N n/a 0,07 s 1,00 A 0,95 A 1,05 A 0,95
.
Pick-up / Drop-off Test Results:
Type Angle I Pick-up I Drop-off Reset Ratio Result
nom act act nom act Error
A-N n/a 1,00 A n/a n/a 0,95 n/a n/a Not tested
.
State:
0 out of 1 points tested.
0 points passed.
0 points failed.
.
Elements - Phase:
Active Name Tripping characteristic I Pick-up Time Reset Ratio Direction
No Overcurrent1 I>1 IEC S Inverse (TMS) 1,00 Iref 1,00 0,95 Non Directional
No Overcurrent1 I>2 DT 1,00 Iref 1,03 0,95 Non Directional
No Overcurrent1 I>3 DT 10,00 Iref 0,03 s 0,95 Non Directional
No Overcurrent1 I>4 DT 10,00 Iref 0,03 s 0,95 Non Directional
No Overcurrent2 I>1 IEC S Inverse (TMS) 1,00 Iref 1,00 0,95 Non Directional
No Overcurrent2 I>2 DT 1,00 Iref 1,03 0,95 Non Directional
No Overcurrent2 I>3 DT 10,00 Iref 0,03 s 0,95 Non Directional
No Overcurrent2 I>4 DT 10,00 Iref 0,03 s 0,95 Non Directional
.
Elements - Residual:
Active Name Tripping characteristic I Pick-up Time Reset Ratio Direction
Yes EF 1 IN>1 IEC S Inverse (TMS) 0,20 Iref 1,00 0,95 Non Directional
No EF 1 IN>2 DT 0,20 Iref 1,03 0,95 Non Directional
No EF 1 IN>3 DT 0,50 Iref 0,03 s 0,95 Non Directional
No EF 1 IN>4 DT 0,50 Iref 0,03 s 0,95 Non Directional
No EF 2 IN>1 IEC S Inverse (TMS) 0,20 Iref 1,00 0,95 Non Directional
No EF 2 IN>2 DT 0,20 Iref 1,03 0,95 Non Directional
No EF 2 IN>3 DT 0,50 Iref 0,03 s 0,95 Non Directional
No EF 2 IN>4 DT 0,50 Iref 0,03 s 0,95 Non Directional
. .
Test Module
Name: OMICRON Overcurrent Version: 3.00 SR 2
Test Start: Test End:
User Name: Manager:
Company:
Test Settings:
.
Fault Model:
Time reference: Fault inception
Load current: 0,00 A
Load angle: same as fault angle
Prefault time: 0,10 s
Abs. max time: 240,00 s
Post fault time: 0,50 s
Rel. max time: 100,00 %
Enable voltage output: No
Fault voltage LN (for all but two phase faults): 63,51 V
Fault voltage LL (for two phase faults): 110,00 V
Decaying DC active: No
Time constant: 0,05 s
CB char min time: 0,05 s
Thermal reset active: No
Thermal reset method: Manual
Thermal reset message: Please reset the Thermal Memory of the device under
test before continuing.
.
Shot Test:
Type Relative To Factor Magnitude Angle tnom tmin tmax
A-N EF 1 IN>1 0,940 0,19 A n/a No trip 169,5 s No trip
A-N EF 1 IN>1 1,060 0,21 A n/a 120,1 s 44,74 s No trip
A-N EF 1 IN>2 0,940 0,19 A n/a No trip 169,5 s No trip
A-N EF 1 IN>2 1,060 0,21 A n/a 120,1 s 44,74 s No trip
A-N EF 1 IN>3 0,940 0,47 A n/a 8,123 s 7,296 s 9,079 s
A-N EF 1 IN>3 1,060 0,53 A n/a 7,113 s 6,432 s 7,888 s
A-N EF 1 IN>4 0,940 0,47 A n/a 8,123 s 7,296 s 9,079 s
A-N EF 1 IN>4 1,060 0,53 A n/a 7,113 s 6,432 s 7,888 s
A-N EF 2 IN>1 0,940 0,19 A n/a No trip 169,5 s No trip
A-N EF 2 IN>1 1,060 0,21 A n/a 120,1 s 44,74 s No trip
A-N EF 2 IN>2 0,940 0,19 A n/a No trip 169,5 s No trip
A-N EF 2 IN>2 1,060 0,21 A n/a 120,1 s 44,74 s No trip
A-N EF 2 IN>3 0,940 0,47 A n/a 8,123 s 7,296 s 9,079 s
A-N EF 2 IN>3 1,060 0,53 A n/a 7,113 s 6,432 s 7,888 s
A-N EF 2 IN>4 0,940 0,47 A n/a 8,123 s 7,296 s 9,079 s
A-N EF 2 IN>4 1,060 0,53 A n/a 7,113 s 6,432 s 7,888 s
Binary Inputs:
Trigger Logic: Or
Name Trigger State
Trip Side 1 1
Trip Side 2 X
Pickup X
.
Shot Test Results:
Type Relative To Factor Magnitude Angle tnom tact Overload Result
A-N EF 1 IN>1 0,940 0,19 A n/a No trip Not tested
A-N EF 1 IN>1 1,060 0,21 A n/a 120,1 s Not tested
A-N EF 1 IN>2 0,940 0,19 A n/a No trip -1,000 s Skipped
A-N EF 1 IN>2 1,060 0,21 A n/a 120,1 s -1,000 s Skipped
A-N EF 1 IN>3 0,940 0,47 A n/a 8,123 s -1,000 s Skipped
A-N EF 1 IN>3 1,060 0,53 A n/a 7,113 s -1,000 s Skipped
A-N EF 1 IN>4 0,940 0,47 A n/a 8,123 s -1,000 s Skipped
A-N EF 1 IN>4 1,060 0,53 A n/a 7,113 s -1,000 s Skipped
A-N EF 2 IN>1 0,940 0,19 A n/a No trip -1,000 s Skipped
A-N EF 2 IN>1 1,060 0,21 A n/a 120,1 s -1,000 s Skipped
A-N EF 2 IN>2 0,940 0,19 A n/a No trip -1,000 s Skipped
A-N EF 2 IN>2 1,060 0,21 A n/a 120,1 s -1,000 s Skipped
A-N EF 2 IN>3 0,940 0,47 A n/a 8,123 s -1,000 s Skipped
A-N EF 2 IN>3 1,060 0,53 A n/a 7,113 s -1,000 s Skipped
A-N EF 2 IN>4 0,940 0,47 A n/a 8,123 s -1,000 s Skipped
A-N EF 2 IN>4 1,060 0,53 A n/a 7,113 s -1,000 s Skipped
.
State:
0 out of 16 points tested.
0 points passed.
0 points failed.
. .
Test Module
Name: OMICRON Overcurrent Version: 3.00 SR 2
Test Start: Test End:
User Name: Manager:
Company:
Test Settings:
.
Fault Model:
Time reference: Fault inception
Load current: 0,00 A
Load angle: 0,00 °
Prefault time: 0,10 s
Abs. max time: 240,00 s
Post fault time: 0,50 s
Rel. max time: 100,00 %
Enable voltage output: No
Fault voltage LN (for all but two phase faults): 30,00 V
Fault voltage LL (for two phase faults): 51,96 V
Decaying DC active: No
Time constant: 0,05 s
CB char min time: 0,05 s
Thermal reset active: No
Thermal reset method: Manual
Thermal reset message: Please reset the Thermal Memory of the device under
test before continuing.
Binary Inputs:
Trigger Logic: And
Name Trigger State
Trip Side 1 X
Trip Side 2 X
Pickup 1
.
Pick-up / Drop-off Test:
Type Angle Resolution I Pick-up Reset Ratio
nom min max nom
A-N n/a 0,07 s 2,00 A 1,90 A 2,11 A 0,95
.
Pick-up / Drop-off Test Results:
Type Angle I Pick-up I Drop-off Reset Ratio Result
nom act act nom act Error
A-N n/a 2,00 A n/a n/a 0,95 n/a n/a Not tested
.
State:
0 out of 1 points tested.
0 points passed.
0 points failed.
.
Elements - Phase:
Active Name Tripping characteristic I Pick-up Time Reset Ratio Direction
No Overcurrent1 I>1 IEC S Inverse (TMS) 1,00 Iref 1,00 0,95 Non Directional
No Overcurrent1 I>2 DT 1,00 Iref 1,03 0,95 Non Directional
No Overcurrent1 I>3 DT 10,00 Iref 0,03 s 0,95 Non Directional
No Overcurrent1 I>4 DT 10,00 Iref 0,03 s 0,95 Non Directional
No Overcurrent2 I>1 IEC S Inverse (TMS) 1,00 Iref 1,00 0,95 Non Directional
No Overcurrent2 I>2 DT 1,00 Iref 1,03 0,95 Non Directional
No Overcurrent2 I>3 DT 10,00 Iref 0,03 s 0,95 Non Directional
No Overcurrent2 I>4 DT 10,00 Iref 0,03 s 0,95 Non Directional
.
Elements - Residual:
Active Name Tripping characteristic I Pick-up Time Reset Ratio Direction
No EF 1 IN>1 IEC S Inverse (TMS) 0,20 Iref 1,00 0,95 Non Directional
No EF 1 IN>2 DT 0,20 Iref 1,03 0,95 Non Directional
No EF 1 IN>3 DT 0,50 Iref 0,03 s 0,95 Non Directional
No EF 1 IN>4 DT 0,50 Iref 0,03 s 0,95 Non Directional
Yes EF 2 IN>1 IEC S Inverse (TMS) 0,20 Iref 1,00 0,95 Non Directional
No EF 2 IN>2 DT 0,20 Iref 1,03 0,95 Non Directional
No EF 2 IN>3 DT 0,50 Iref 0,03 s 0,95 Non Directional
No EF 2 IN>4 DT 0,50 Iref 0,03 s 0,95 Non Directional
. .
Test Module
Name: OMICRON Overcurrent Version: 3.00 SR 2
Test Start: Test End:
User Name: Manager:
Company:
Test Settings:
.
Fault Model:
Time reference: Fault inception
Load current: 0,00 A
Load angle: same as fault angle
Prefault time: 0,10 s
Abs. max time: 240,00 s
Post fault time: 0,50 s
Rel. max time: 100,00 %
Enable voltage output: No
Fault voltage LN (for all but two phase faults): 63,51 V
Fault voltage LL (for two phase faults): 110,00 V
Decaying DC active: No
Time constant: 0,05 s
CB char min time: 0,05 s
Thermal reset active: No
Thermal reset method: Manual
Thermal reset message: Please reset the Thermal Memory of the device under
test before continuing.
.
Shot Test:
Type Relative To Factor Magnitude Angle tnom tmin tmax
A-N EF 1 IN>1 0,940 0,19 A n/a No trip 169,5 s No trip
A-N EF 1 IN>1 1,060 0,21 A n/a 120,1 s 44,74 s No trip
A-N EF 1 IN>2 0,940 0,19 A n/a No trip 169,5 s No trip
A-N EF 1 IN>2 1,060 0,21 A n/a 120,1 s 44,74 s No trip
A-N EF 1 IN>3 0,940 0,47 A n/a 8,123 s 7,296 s 9,079 s
A-N EF 1 IN>3 1,060 0,53 A n/a 7,113 s 6,432 s 7,888 s
A-N EF 1 IN>4 0,940 0,47 A n/a 8,123 s 7,296 s 9,079 s
A-N EF 1 IN>4 1,060 0,53 A n/a 7,113 s 6,432 s 7,888 s
A-N EF 2 IN>1 0,940 0,19 A n/a No trip 169,5 s No trip
A-N EF 2 IN>1 1,060 0,21 A n/a 120,1 s 44,74 s No trip
A-N EF 2 IN>2 0,940 0,19 A n/a No trip 169,5 s No trip
A-N EF 2 IN>2 1,060 0,21 A n/a 120,1 s 44,74 s No trip
A-N EF 2 IN>3 0,940 0,47 A n/a 8,123 s 7,296 s 9,079 s
A-N EF 2 IN>3 1,060 0,53 A n/a 7,113 s 6,432 s 7,888 s
A-N EF 2 IN>4 0,940 0,47 A n/a 8,123 s 7,296 s 9,079 s
A-N EF 2 IN>4 1,060 0,53 A n/a 7,113 s 6,432 s 7,888 s
Binary Inputs:
Trigger Logic: Or
Name Trigger State
Trip Side 1 X
Trip Side 2 1
Pickup X
.
Shot Test Results:
Type Relative To Factor Magnitude Angle tnom tact Overload Result
A-N EF 1 IN>1 0,940 0,19 A n/a No trip -1,000 s Skipped
A-N EF 1 IN>1 1,060 0,21 A n/a 120,1 s -1,000 s Skipped
A-N EF 1 IN>2 0,940 0,19 A n/a No trip -1,000 s Skipped
A-N EF 1 IN>2 1,060 0,21 A n/a 120,1 s -1,000 s Skipped
A-N EF 1 IN>3 0,940 0,47 A n/a 8,123 s -1,000 s Skipped
A-N EF 1 IN>3 1,060 0,53 A n/a 7,113 s -1,000 s Skipped
A-N EF 1 IN>4 0,940 0,47 A n/a 8,123 s -1,000 s Skipped
A-N EF 1 IN>4 1,060 0,53 A n/a 7,113 s -1,000 s Skipped
A-N EF 2 IN>1 0,940 0,19 A n/a No trip Not tested
A-N EF 2 IN>1 1,060 0,21 A n/a 120,1 s Not tested
A-N EF 2 IN>2 0,940 0,19 A n/a No trip -1,000 s Skipped
A-N EF 2 IN>2 1,060 0,21 A n/a 120,1 s -1,000 s Skipped
A-N EF 2 IN>3 0,940 0,47 A n/a 8,123 s -1,000 s Skipped
A-N EF 2 IN>3 1,060 0,53 A n/a 7,113 s -1,000 s Skipped
A-N EF 2 IN>4 0,940 0,47 A n/a 8,123 s -1,000 s Skipped
A-N EF 2 IN>4 1,060 0,53 A n/a 7,113 s -1,000 s Skipped
.
State:
0 out of 16 points tested.
0 points passed.
0 points failed.
User Input:
Hardware Configuration
.
Test Equipment
Type Serial Number
CMC256plus ??????
. .
Hardware Check
Performed At Result Details
Not yet performed
.
Elements - Phase:
Active Name Tripping characteristic I Pick-up Time Reset Ratio Direction
No Overcurrent1 I>1 IEC S Inverse (TMS) 0,20 Iref 1,00 0,95 Non Directional
No Overcurrent1 I>2 DT 0,20 Iref 1,03 0,95 Non Directional
No Overcurrent1 I>3 DT 2,00 Iref 0,03 s 0,95 Non Directional
No Overcurrent1 I>4 DT 2,00 Iref 0,03 s 0,95 Non Directional
No Overcurrent2 I>1 IEC S Inverse (TMS) 0,20 Iref 1,00 0,95 Non Directional
No Overcurrent2 I>2 DT 0,20 Iref 1,03 0,95 Non Directional
No Overcurrent2 I>3 DT 2,00 Iref 0,03 s 0,95 Non Directional
No Overcurrent2 I>4 DT 2,00 Iref 0,03 s 0,95 Non Directional
.
Elements - Residual:
Active Name Tripping characteristic I Pick-up Time Reset Ratio Direction
Yes EF 1 IN>1 IEC S Inverse (TMS) 0,20 Iref 1,00 0,95 Non Directional
No EF 1 IN>2 DT 0,04 Iref 1,03 0,95 Non Directional
No EF 1 IN>3 DT 0,10 Iref 0,03 s 0,95 Non Directional
No EF 1 IN>4 DT 0,10 Iref 0,03 s 0,95 Non Directional
No EF 2 IN>1 IEC S Inverse (TMS) 0,04 Iref 1,00 0,95 Non Directional
No EF 2 IN>2 DT 0,04 Iref 1,03 0,95 Non Directional
No EF 2 IN>3 DT 0,10 Iref 0,03 s 0,95 Non Directional
No EF 2 IN>4 DT 0,10 Iref 0,03 s 0,95 Non Directional
. .
Test Module
Name: OMICRON Overcurrent Version: 3.00 SR 2
Test Start: Test End:
User Name: Manager:
Company:
Test Settings:
.
Fault Model:
Time reference: Fault inception
Load current: 0,00 A
Load angle: 0,00 °
Prefault time: 0,10 s
Abs. max time: 240,00 s
Post fault time: 0,50 s
Rel. max time: 100,00 %
Enable voltage output: No
Fault voltage LN (for all but two phase faults): 30,00 V
Fault voltage LL (for two phase faults): 51,96 V
Decaying DC active: No
Time constant: 0,05 s
CB char min time: 0,05 s
Thermal reset active: No
Thermal reset method: Manual
Thermal reset message: Please reset the Thermal Memory of the device under
test before continuing.
Binary Inputs:
Trigger Logic: And
Name Trigger State
Trip Side 1 X
Trip Side 2 X
Pickup 1
.
Pick-up / Drop-off Test:
Type Angle Resolution I Pick-up Reset Ratio
nom min max nom
A-N n/a 0,07 s 1,00 A 0,95 A 1,05 A 0,95
.
Pick-up / Drop-off Test Results:
Type Angle I Pick-up I Drop-off Reset Ratio Result
nom act act nom act Error
A-N n/a 1,00 A n/a n/a 0,95 n/a n/a Not tested
.
State:
0 out of 1 points tested.
0 points passed.
0 points failed.
.
Elements - Phase:
Active Name Tripping characteristic I Pick-up Time Reset Ratio Direction
No Overcurrent1 I>1 IEC S Inverse (TMS) 1,00 Iref 1,00 0,95 Non Directional
No Overcurrent1 I>2 DT 1,00 Iref 1,03 0,95 Non Directional
No Overcurrent1 I>3 DT 10,00 Iref 0,03 s 0,95 Non Directional
No Overcurrent1 I>4 DT 10,00 Iref 0,03 s 0,95 Non Directional
No Overcurrent2 I>1 IEC S Inverse (TMS) 1,00 Iref 1,00 0,95 Non Directional
No Overcurrent2 I>2 DT 1,00 Iref 1,03 0,95 Non Directional
No Overcurrent2 I>3 DT 10,00 Iref 0,03 s 0,95 Non Directional
No Overcurrent2 I>4 DT 10,00 Iref 0,03 s 0,95 Non Directional
.
Elements - Residual:
Active Name Tripping characteristic I Pick-up Time Reset Ratio Direction
Yes EF 1 IN>1 IEC S Inverse (TMS) 0,20 Iref 1,00 0,95 Non Directional
No EF 1 IN>2 DT 0,20 Iref 1,03 0,95 Non Directional
No EF 1 IN>3 DT 0,50 Iref 0,03 s 0,95 Non Directional
No EF 1 IN>4 DT 0,50 Iref 0,03 s 0,95 Non Directional
No EF 2 IN>1 IEC S Inverse (TMS) 0,20 Iref 1,00 0,95 Non Directional
No EF 2 IN>2 DT 0,20 Iref 1,03 0,95 Non Directional
No EF 2 IN>3 DT 0,50 Iref 0,03 s 0,95 Non Directional
No EF 2 IN>4 DT 0,50 Iref 0,03 s 0,95 Non Directional
. .
Test Module
Name: OMICRON Overcurrent Version: 3.00 SR 2
Test Start: Test End:
User Name: Manager:
Company:
Test Settings:
.
Fault Model:
Time reference: Fault inception
Load current: 0,00 A
Load angle: same as fault angle
Prefault time: 0,10 s
Abs. max time: 240,00 s
Post fault time: 0,50 s
Rel. max time: 100,00 %
Enable voltage output: No
Fault voltage LN (for all but two phase faults): 63,51 V
Fault voltage LL (for two phase faults): 110,00 V
Decaying DC active: No
Time constant: 0,05 s
CB char min time: 0,05 s
Thermal reset active: No
Thermal reset method: Manual
Thermal reset message: Please reset the Thermal Memory of the device under
test before continuing.
.
Shot Test:
Type Relative To Factor Magnitude Angle tnom tmin tmax
A-N EF 1 IN>1 0,940 0,19 A n/a No trip 169,5 s No trip
A-N EF 1 IN>1 1,060 0,21 A n/a 120,1 s 44,74 s No trip
A-N EF 1 IN>2 0,940 0,19 A n/a No trip 169,5 s No trip
A-N EF 1 IN>2 1,060 0,21 A n/a 120,1 s 44,74 s No trip
A-N EF 1 IN>3 0,940 0,47 A n/a 8,123 s 7,296 s 9,079 s
A-N EF 1 IN>3 1,060 0,53 A n/a 7,113 s 6,432 s 7,888 s
A-N EF 1 IN>4 0,940 0,47 A n/a 8,123 s 7,296 s 9,079 s
A-N EF 1 IN>4 1,060 0,53 A n/a 7,113 s 6,432 s 7,888 s
A-N EF 2 IN>1 0,940 0,19 A n/a No trip 169,5 s No trip
A-N EF 2 IN>1 1,060 0,21 A n/a 120,1 s 44,74 s No trip
A-N EF 2 IN>2 0,940 0,19 A n/a No trip 169,5 s No trip
A-N EF 2 IN>2 1,060 0,21 A n/a 120,1 s 44,74 s No trip
A-N EF 2 IN>3 0,940 0,47 A n/a 8,123 s 7,296 s 9,079 s
A-N EF 2 IN>3 1,060 0,53 A n/a 7,113 s 6,432 s 7,888 s
A-N EF 2 IN>4 0,940 0,47 A n/a 8,123 s 7,296 s 9,079 s
A-N EF 2 IN>4 1,060 0,53 A n/a 7,113 s 6,432 s 7,888 s
Binary Inputs:
Trigger Logic: Or
Name Trigger State
Trip Side 1 1
Trip Side 2 X
Pickup X
.
Shot Test Results:
Type Relative To Factor Magnitude Angle tnom tact Overload Result
A-N EF 1 IN>1 0,940 0,19 A n/a No trip Not tested
A-N EF 1 IN>1 1,060 0,21 A n/a 120,1 s Not tested
A-N EF 1 IN>2 0,940 0,19 A n/a No trip -1,000 s Skipped
A-N EF 1 IN>2 1,060 0,21 A n/a 120,1 s -1,000 s Skipped
A-N EF 1 IN>3 0,940 0,47 A n/a 8,123 s -1,000 s Skipped
A-N EF 1 IN>3 1,060 0,53 A n/a 7,113 s -1,000 s Skipped
A-N EF 1 IN>4 0,940 0,47 A n/a 8,123 s -1,000 s Skipped
A-N EF 1 IN>4 1,060 0,53 A n/a 7,113 s -1,000 s Skipped
A-N EF 2 IN>1 0,940 0,19 A n/a No trip -1,000 s Skipped
A-N EF 2 IN>1 1,060 0,21 A n/a 120,1 s -1,000 s Skipped
A-N EF 2 IN>2 0,940 0,19 A n/a No trip -1,000 s Skipped
A-N EF 2 IN>2 1,060 0,21 A n/a 120,1 s -1,000 s Skipped
A-N EF 2 IN>3 0,940 0,47 A n/a 8,123 s -1,000 s Skipped
A-N EF 2 IN>3 1,060 0,53 A n/a 7,113 s -1,000 s Skipped
A-N EF 2 IN>4 0,940 0,47 A n/a 8,123 s -1,000 s Skipped
A-N EF 2 IN>4 1,060 0,53 A n/a 7,113 s -1,000 s Skipped
.
State:
0 out of 16 points tested.
0 points passed.
0 points failed.
User Input:
Hardware Configuration
.
Test Equipment
Type Serial Number
CMC256plus ??????
. .
Hardware Check
Performed At Result Details
Not yet performed
. .
Test Module
Name: OMICRON Overcurrent Version: 3.00 SR 2
Test Start: Test End:
User Name: Manager:
Company:
Test Settings:
.
Fault Model:
Time reference: Fault inception
Load current: 0,00 A
Load angle: 0,00 °
Prefault time: 0,10 s
Abs. max time: 240,00 s
Post fault time: 0,50 s
Rel. max time: 100,00 %
Enable voltage output: No
Fault voltage LN (for all but two phase faults): 30,00 V
Fault voltage LL (for two phase faults): 51,96 V
Decaying DC active: No
Time constant: 0,05 s
CB char min time: 0,05 s
Thermal reset active: No
Thermal reset method: Manual
Thermal reset message: Please reset the Thermal Memory of the device under
test before continuing.
Binary Inputs:
Trigger Logic: And
Name Trigger State
Trip Side 1 X
Trip Side 2 X
Pickup 1
.
Pick-up / Drop-off Test:
Type Angle Resolution I Pick-up Reset Ratio
nom min max nom
A-N n/a 0,07 s 0,20 A 0,18 A 0,22 A 0,95
.
Pick-up / Drop-off Test Results:
Type Angle I Pick-up I Drop-off Reset Ratio Result
nom act act nom act Error
A-N n/a 0,20 A n/a n/a 0,95 n/a n/a Not tested
.
State:
0 out of 1 points tested.
0 points passed.
0 points failed.
.
Elements - Phase:
Active Name Tripping characteristic I Pick-up Time Reset Ratio Direction
No Overcurrent1 I>1 IEC S Inverse (TMS) 1,00 Iref 1,00 0,95 Non Directional
No Overcurrent1 I>2 DT 1,00 Iref 1,03 0,95 Non Directional
No Overcurrent1 I>3 DT 10,00 Iref 0,03 s 0,95 Non Directional
No Overcurrent1 I>4 DT 10,00 Iref 0,03 s 0,95 Non Directional
No Overcurrent2 I>1 IEC S Inverse (TMS) 1,00 Iref 1,00 0,95 Non Directional
No Overcurrent2 I>2 DT 1,00 Iref 1,03 0,95 Non Directional
No Overcurrent2 I>3 DT 10,00 Iref 0,03 s 0,95 Non Directional
No Overcurrent2 I>4 DT 10,00 Iref 0,03 s 0,95 Non Directional
.
Elements - Residual:
Active Name Tripping characteristic I Pick-up Time Reset Ratio Direction
No EF 1 IN>1 IEC S Inverse (TMS) 0,20 Iref 1,00 0,95 Non Directional
No EF 1 IN>2 DT 0,20 Iref 1,03 0,95 Non Directional
No EF 1 IN>3 DT 0,50 Iref 0,03 s 0,95 Non Directional
No EF 1 IN>4 DT 0,50 Iref 0,03 s 0,95 Non Directional
Yes EF 2 IN>1 IEC S Inverse (TMS) 0,20 Iref 1,00 0,95 Non Directional
No EF 2 IN>2 DT 0,20 Iref 1,03 0,95 Non Directional
No EF 2 IN>3 DT 0,50 Iref 0,03 s 0,95 Non Directional
No EF 2 IN>4 DT 0,50 Iref 0,03 s 0,95 Non Directional
. .
Test Module
Name: OMICRON Overcurrent Version: 3.00 SR 2
Test Start: Test End:
User Name: Manager:
Company:
Test Settings:
.
Fault Model:
Time reference: Fault inception
Load current: 0,00 A
Load angle: same as fault angle
Prefault time: 0,10 s
Abs. max time: 240,00 s
Post fault time: 0,50 s
Rel. max time: 100,00 %
Enable voltage output: No
Fault voltage LN (for all but two phase faults): 63,51 V
Fault voltage LL (for two phase faults): 110,00 V
Decaying DC active: No
Time constant: 0,05 s
CB char min time: 0,05 s
Thermal reset active: No
Thermal reset method: Manual
Thermal reset message: Please reset the Thermal Memory of the device under
test before continuing.
.
Shot Test:
Type Relative To Factor Magnitude Angle tnom tmin tmax
A-N EF 1 IN>1 0,940 0,19 A n/a No trip 169,5 s No trip
A-N EF 1 IN>1 1,060 0,21 A n/a 120,1 s 44,74 s No trip
A-N EF 1 IN>2 0,940 0,19 A n/a No trip 169,5 s No trip
A-N EF 1 IN>2 1,060 0,21 A n/a 120,1 s 44,74 s No trip
A-N EF 1 IN>3 0,940 0,47 A n/a 8,123 s 7,296 s 9,079 s
A-N EF 1 IN>3 1,060 0,53 A n/a 7,113 s 6,432 s 7,888 s
A-N EF 1 IN>4 0,940 0,47 A n/a 8,123 s 7,296 s 9,079 s
A-N EF 1 IN>4 1,060 0,53 A n/a 7,113 s 6,432 s 7,888 s
A-N EF 2 IN>1 0,940 0,19 A n/a No trip 169,5 s No trip
A-N EF 2 IN>1 1,060 0,21 A n/a 120,1 s 44,74 s No trip
A-N EF 2 IN>2 0,940 0,19 A n/a No trip 169,5 s No trip
A-N EF 2 IN>2 1,060 0,21 A n/a 120,1 s 44,74 s No trip
A-N EF 2 IN>3 0,940 0,47 A n/a 8,123 s 7,296 s 9,079 s
A-N EF 2 IN>3 1,060 0,53 A n/a 7,113 s 6,432 s 7,888 s
A-N EF 2 IN>4 0,940 0,47 A n/a 8,123 s 7,296 s 9,079 s
A-N EF 2 IN>4 1,060 0,53 A n/a 7,113 s 6,432 s 7,888 s
Binary Inputs:
Trigger Logic: Or
Name Trigger State
Trip Side 1 X
Trip Side 2 1
Pickup X
.
Shot Test Results:
Type Relative To Factor Magnitude Angle tnom tact Overload Result
A-N EF 1 IN>1 0,940 0,19 A n/a No trip -1,000 s Skipped
A-N EF 1 IN>1 1,060 0,21 A n/a 120,1 s -1,000 s Skipped
A-N EF 1 IN>2 0,940 0,19 A n/a No trip -1,000 s Skipped
A-N EF 1 IN>2 1,060 0,21 A n/a 120,1 s -1,000 s Skipped
A-N EF 1 IN>3 0,940 0,47 A n/a 8,123 s -1,000 s Skipped
A-N EF 1 IN>3 1,060 0,53 A n/a 7,113 s -1,000 s Skipped
A-N EF 1 IN>4 0,940 0,47 A n/a 8,123 s -1,000 s Skipped
A-N EF 1 IN>4 1,060 0,53 A n/a 7,113 s -1,000 s Skipped
A-N EF 2 IN>1 0,940 0,19 A n/a No trip Not tested
A-N EF 2 IN>1 1,060 0,21 A n/a 120,1 s Not tested
A-N EF 2 IN>2 0,940 0,19 A n/a No trip -1,000 s Skipped
A-N EF 2 IN>2 1,060 0,21 A n/a 120,1 s -1,000 s Skipped
A-N EF 2 IN>3 0,940 0,47 A n/a 8,123 s -1,000 s Skipped
A-N EF 2 IN>3 1,060 0,53 A n/a 7,113 s -1,000 s Skipped
A-N EF 2 IN>4 0,940 0,47 A n/a 8,123 s -1,000 s Skipped
A-N EF 2 IN>4 1,060 0,53 A n/a 7,113 s -1,000 s Skipped
.
State:
0 out of 16 points tested.
0 points passed.
0 points failed.
Hardware Configuration
.
Test Equipment
Type Serial Number
CMC256plus ??????
. .
Hardware Check
Performed At Result Details
Not yet performed
CB Trip Time Test Information
Instruction Text:
Please ensure all protection functions unblocked!
User Input:
CB Trip Time:
.
Test Settings
State Pre fault Fault Post fault
IA Side 1 0,000 A 2,000 A 0,000 A
0,00 ° 0,00 ° 0,00 °
50,000 Hz 50,000 Hz 50,000 Hz
IB Side 1 0,000 A 2,000 A 0,000 A
-120,00 ° -120,00 ° -120,00 °
50,000 Hz 50,000 Hz 50,000 Hz
IC Side 1 0,000 A 2,000 A 0,000 A
120,00 ° 120,00 ° 120,00 °
50,000 Hz 50,000 Hz 50,000 Hz
IA Side 2 0,000 A 0,000 A 0,000 A
0,00 ° 0,00 ° 0,00 °
50,000 Hz 50,000 Hz 50,000 Hz
IB Side 2 0,000 A 0,000 A 0,000 A
-120,00 ° -120,00 ° -120,00 °
50,000 Hz 50,000 Hz 50,000 Hz
IC Side 2 0,000 A 0,000 A 0,000 A
120,00 ° 120,00 ° 120,00 °
50,000 Hz 50,000 Hz 50,000 Hz
. .
Test Module
Name: OMICRON State Sequencer Version: 2.10 SR 1
Test Start: Test End:
User Name: Manager:
Company:
Test Results
.
Time Assessment
Name Ignore Start Stop Tnom Tdev- Tdev+ Tact Tdev Assess
before
Trip Time Fault Trip Side 1 CB52a Side50,00 ms 2,500 ms 2,500 ms o
CB aux. 0>1 1 1>0
Side 1
Trip Time Fault Trip Side 2 CB52a Side50,00 ms 2,500 ms 2,500 ms o
CB aux. 0>1 2 1>0
Side 2
Assess: + .. Passed x .. Failed o .. Not assessed
.
.
Test State:
No results available!