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OMICRON PTT

Differential Protection

ALSTOM MiCOM P642


Software Version: 06

Company: OMICRON electronics


GmbH

Test Person:

Test Date: 21-Aug-09

Report Status: Not Tested

Number of Test Modules: 27

Number of Test Modules Passed: 0

Number of Test Modules Failed: 0

. .
Test Object - Device Settings
. . .
Substation/Bay:
Substation: substation Substation address: substation address
Bay: bay Bay address: bay address
. . .
Device:
Name/description: P642?1?A1?0060P Manufacturer: ALSTOM
Device type: Transformer differential Device address: 1
Serial/model number: 123456A
Additional info 1: information
Additional info 2: MiCOM P642
Hardware Configuration
.
Test Equipment
Type Serial Number
CMC256plus ??????
. .
Hardware Check
Performed At Result Details
Not yet performed

Instructions
Instruction Text:
Please read the manual of the OMICRON PTT for the ALSTOM P642 first!

Please check the hardware configuration before the first


test!

Follow the test procedure and safety instructions for the relay to be tested before starting!

User Input:

Test State: Idle


Wiring Test Information
Instruction Text:
Please compare the current values of the wiring test and the values shown on the relay display!

User Input:

Test State: Idle

Wiring Test
. .
Test Module
Name: OMICRON Diff Configuration Version: 2.30
Test Start: Test End:
User Name: Manager:
Company:

Test Results for Fault Type A-B-C at Fault Location Side 1


. . .
ITest = 1,00 In State: Not tested Result: n/a
Phase Imeas_diff Imeas_bias
A 0,000 In 0,000 In
B 0,000 In 0,000 In
C 0,000 In 0,000 In
.

.
Test State:
No results available!

0 out of 1 points tested.


0 points passed. 0
points failed.

Initial Test
. .
Test Module
Name: OMICRON Diff Trip Time Version: 2.30
Characteristic
Test Start: Test End:
User Name: Manager:
Company:

Test Results for Fault Type A-B-C at Reference Side Side 1


Idiff Ibias Nominal TripActual Trip Dev (rel) Dev (abs) State Result
Time Time
2,00 In 1,33 In 0,0330 s N/T n/a n/a Not tested n/a
.
State:
0 out of 1 points tested. 0 points passed. 0
points failed.

General Assessment: No results


available!

Diff Configuration Test Information


Instruction Text:
Check whether the Differential protection blocks during through fault condition in the following configuration test.

Press the "Passed" button if no trip occurs after a considerable time to evaluate the configuration test.

Overcurrent and Earth Fault protection functions can interfere Diff tests. Block these functions if necessary.

User Input:

Test State: Idle

Diff Configuration Side 1 A-N


. .
Test Module
Name: OMICRON Diff Configuration Version: 2.30
Test Start: Test End:
User Name: Manager:
Company:

Test Results for Fault Type A-N at Fault Location Side 1


. . .
ITest = 1,00 In State: Not tested Result: n/a
Phase Imeas_diff Imeas_bias
A 0,000 In 0,000 In
B 0,000 In 0,000 In
C 0,000 In 0,000 In
.

.
Test State:
No results available!

0 out of 1 points tested.


0 points passed. 0
points failed.

Diff Configuration Side 1 A-B-C


. .
Test Module
Name: OMICRON Diff Configuration Version: 2.30
Test Start: Test End:
User Name: Manager:
Company:

Test Results for Fault Type A-B-C at Fault Location Side 1


. . .
ITest = 1,00 In State: Not tested Result: n/a
Phase Imeas_diff Imeas_bias
A 0,000 In 0,000 In
B 0,000 In 0,000 In
C 0,000 In 0,000 In
.

.
Test State:
No results available!

0 out of 1 points tested.


0 points passed. 0
points failed.

Diff Configuration Side 2 B-N


. .
Test Module
Name: OMICRON Diff Configuration Version: 2.30
Test Start: Test End:
User Name: Manager:
Company:

Test Results for Fault Type B-N at Fault Location Side 2


. . .
ITest = 1,00 In State: Not tested Result: n/a
Phase Imeas_diff Imeas_bias
A 0,000 In 0,000 In
B 0,000 In 0,000 In
C 0,000 In 0,000 In
.

.
Test State:
No results available!
0 out of 1 points tested.
0 points passed. 0
points failed.

Diff Configuration Side 2 A-B-C


. .
Test Module
Name: OMICRON Diff Configuration Version: 2.30
Test Start: Test End:
User Name: Manager:
Company:

Test Results for Fault Type A-B-C at Fault Location Side 2


. . .
ITest = 1,00 In State: Not tested Result: n/a
Phase Imeas_diff Imeas_bias
A 0,000 In 0,000 In
B 0,000 In 0,000 In
C 0,000 In 0,000 In
.

.
Test State:
No results available!

0 out of 1 points tested.


0 points passed. 0
points failed.

Test Results
Assessment Results
Name/ Exec. Ramp Condition Sig Nom. Act. Tol.- Tol.+ Dev. Assess Tact
Assess: + .. Passed x .. Failed o .. Not assessed

Assessment Statistics
Name Ramp Condition Sig Nom. Act.Av. min max Std. Dev. Assess
Assess: + .. Passed x .. Failed o .. Not assessed

Calculation Results
Name/ Exec. Calc. X Y Nom. Act. Tol.- Tol.+ Dev. Assess
Assess: + .. Passed x .. Failed o .. Not assessed

Calculation Statistics
Name Calc. X Y Nom. Act.Av. min max Std. Dev. Assess
Assess: + .. Passed x .. Failed o .. Not assessed
Test Results
Assessment Results
Name/ Exec. Ramp Condition Sig Nom. Act. Tol.- Tol.+ Dev. Assess Tact
Assess: + .. Passed x .. Failed o .. Not assessed

Assessment Statistics
Name Ramp Condition Sig Nom. Act.Av. min max Std. Dev. Assess
Assess: + .. Passed x .. Failed o .. Not assessed

Calculation Results
Name/ Exec. Calc. X Y Nom. Act. Tol.- Tol.+ Dev. Assess
Assess: + .. Passed x .. Failed o .. Not assessed

Calculation Statistics
Name Calc. X Y Nom. Act.Av. min max Std. Dev. Assess
Assess: + .. Passed x .. Failed o .. Not assessed

Diff Operating Characteristic C-N


. .
Test Module
Name: OMICRON Diff Operating Version: 2.30
Characteristic
Test Start: Test End:
User Name: Manager:
Company:

Test Results for Fault Location C-N at Reference Side Side 1


Ibias Idiff NominalIdiff Actual Dev (rel) Dev (abs) Check Test State Result
0,50 In 0,200 In n/a n/a n/a Not tested n/a
1,00 In 0,300 In n/a n/a n/a Not tested n/a
1,50 In 0,700 In n/a n/a n/a Not tested n/a
2,00 In 1,100 In n/a n/a n/a Not tested n/a
2,50 In 1,500 In n/a n/a n/a Not tested n/a
3,00 In 1,900 In n/a n/a n/a Not tested n/a
3,50 In 2,300 In n/a n/a n/a Not tested n/a
4,00 In 2,700 In n/a n/a n/a Not tested n/a

.
Test State:
No results available!

0 out of 8 points tested.


0 points passed. 0
points failed.
Diff Operating Characteristic A-B-C
. .
Test Module
Name: OMICRON Diff Operating Version: 2.30
Characteristic
Test Start: Test End:
User Name: Manager:
Company:

Test Results for Fault Location A-B-C at Reference Side Side 1


Ibias Idiff NominalIdiff Actual Dev (rel) Dev (abs) Check Test State Result
0,50 In 0,200 In n/a n/a n/a Not tested n/a
1,00 In 0,300 In n/a n/a n/a Not tested n/a
1,50 In 0,700 In n/a n/a n/a Not tested n/a
2,00 In 1,100 In n/a n/a n/a Not tested n/a
2,50 In 1,500 In n/a n/a n/a Not tested n/a
3,00 In 1,900 In n/a n/a n/a Not tested n/a
3,50 In 2,300 In n/a n/a n/a Not tested n/a
4,00 In 2,700 In n/a n/a n/a Not tested n/a

.
Test State:
No results available!

0 out of 8 points tested.


0 points passed. 0
points failed.

Diff Trip Time B-N


. .
Test Module
Name: OMICRON Diff Trip Time Version: 2.30
Characteristic
Test Start: Test End:
User Name: Manager:
Company:

Test Results for Fault Type B-N at Reference Side Side 1


Idiff Ibias Nominal TripActual Trip Dev (rel) Dev (abs) State Result
Time Time
2,00 In 1,00 In 0,0330 s N/T n/a n/a Not tested n/a
.
State:
0 out of 1 points tested. 0 points passed. 0
points failed.
General Assessment: No results
available!

Diff Trip Time A-B-C


. .
Test Module
Name: OMICRON Diff Trip Time Version: 2.30
Characteristic
Test Start: Test End:
User Name: Manager:
Company:

Test Results for Fault Type A-B-C at Reference Side Side 1


Idiff Ibias Nominal TripActual Trip Dev (rel) Dev (abs) State Result
Time Time
2,00 In 1,00 In 0,0330 s N/T n/a n/a Not tested n/a
.
State:
0 out of 1 points tested. 0 points passed. 0
points failed.

General Assessment: No results


available!

2nd Harmonic Restraint


. .
Test Module
Name: OMICRON Diff Harmonic Restraint Version: 2.30
Test Start: Test End:
User Name: Manager:
Company:

Test Results for Testphase A-B-C at Reference Side Side 1 for 2. Harmonic
Idiff Ixf/Idiff Ixf/Idiff Angle Dev (rel) Dev.(abs) Check Test State Result
Nominal Actual (Ixf,Idiff)
1,50 I/In 20,000 % n/a -120,0 ° n/a n/a Not tested n/a

.
State:
0 out of 1 points tested. 0 points passed. 0
points failed.

General Assessment: No results


available!
5th Harmonic Restraint
. .
Test Module
Name: OMICRON Diff Harmonic Restraint Version: 2.30
Test Start: Test End:
User Name: Manager:
Company:

Test Results for Testphase A-B-C at Reference Side Side 1 for 5. Harmonic
Idiff Ixf/Idiff Ixf/Idiff Angle Dev (rel) Dev.(abs) Check Test State Result
Nominal Actual (Ixf,Idiff)
1,50 I/In 35,000 % n/a -120,0 ° n/a n/a Not tested n/a

.
State:
0 out of 1 points tested. 0 points passed. 0
points failed.

General Assessment: No results


available!

Current Protection Test Information


Instruction Text:
Please unblock Overcurrent and Earth Fault protections.
The Differential protection may interfere with the following tests. Please block this function if necessary.

User Input:

Test State: Idle

Overcurrent Pickup and Dropout Side 1 A-B-C:


Test Object - Overcurrent Parameters
.
General - Values:
TimeTolAbs: 0,05 s VT connection: At protected object
TimeTolRel: 5,00 % CT starpoint connection: From protected object
CurrentTolAbs: 0,02 Iref
CurrentTolRel: 5,00 %
Directional: No

.
Elements - Phase:
Active Name Tripping characteristic I Pick-up Time Reset Ratio Direction
No Overcurrent1 I>1 IEC S Inverse (TMS) 1,00 Iref 1,00 0,95 Non Directional
No Overcurrent1 I>2 DT 1,00 Iref 1,03 0,95 Non Directional
No Overcurrent1 I>3 DT 10,00 Iref 0,03 s 0,95 Non Directional
No Overcurrent1 I>4 DT 10,00 Iref 0,03 s 0,95 Non Directional
No Overcurrent2 I>1 IEC S Inverse (TMS) 1,00 Iref 1,00 0,95 Non Directional
No Overcurrent2 I>2 DT 1,00 Iref 1,03 0,95 Non Directional
No Overcurrent2 I>3 DT 10,00 Iref 0,03 s 0,95 Non Directional
No Overcurrent2 I>4 DT 10,00 Iref 0,03 s 0,95 Non Directional
.
Elements - Residual:
Active Name Tripping characteristic I Pick-up Time Reset Ratio Direction
Yes EF 1 IN>1 IEC S Inverse (TMS) 0,20 Iref 1,00 0,95 Non Directional
No EF 1 IN>2 DT 0,20 Iref 1,03 0,95 Non Directional
No EF 1 IN>3 DT 0,50 Iref 0,03 s 0,95 Non Directional
No EF 1 IN>4 DT 0,50 Iref 0,03 s 0,95 Non Directional
No EF 2 IN>1 IEC S Inverse (TMS) 0,20 Iref 1,00 0,95 Non Directional
No EF 2 IN>2 DT 0,20 Iref 1,03 0,95 Non Directional
No EF 2 IN>3 DT 0,50 Iref 0,03 s 0,95 Non Directional
No EF 2 IN>4 DT 0,50 Iref 0,03 s 0,95 Non Directional

. .
Test Module
Name: OMICRON Overcurrent Version: 3.00 SR 2
Test Start: Test End:
User Name: Manager:
Company:

Test Settings:
.
Fault Model:
Time reference: Fault inception
Load current: 0,00 A
Load angle: 0,00 °
Prefault time: 0,10 s
Abs. max time: 240,00 s
Post fault time: 0,50 s
Rel. max time: 100,00 %
Enable voltage output: No
Fault voltage LN (for all but two phase faults): 30,00 V
Fault voltage LL (for two phase faults): 51,96 V
Decaying DC active: No
Time constant: 0,05 s
CB char min time: 0,05 s
Thermal reset active: No
Thermal reset method: Manual
Thermal reset message: Please reset the Thermal Memory of the device under
test before continuing.

Binary Inputs:
Trigger Logic: And
Name Trigger State
Trip Side 1 X
Trip Side 2 X
Pickup 1
.
Pick-up / Drop-off Test:
Type Angle Resolution I Pick-up Reset Ratio
nom min max nom
A-B-C n/a 0,07 s +∞A +∞A +∞A n/a
.
Pick-up / Drop-off Test Results:
Type Angle I Pick-up I Drop-off Reset Ratio Result
nom act act nom act Error
A-B-C n/a +∞A n/a n/a n/a n/a n/a Out of range
.
State:
0 out of 1 points tested.
0 points passed.
0 points failed.

General Assessment: No results available!

Overcurrent Trip Times Side 1 A-B-C:


Test Object - Overcurrent Parameters
.
General - Values:
TimeTolAbs: 0,05 s VT connection: At protected object
TimeTolRel: 5,00 % CT starpoint connection: To protected object
CurrentTolAbs: 0,02 Iref
CurrentTolRel: 5,00 %
Directional: No

.
Elements - Phase:
Active Name Tripping characteristic I Pick-up Time Reset Ratio Direction
No Overcurrent1 I>1 IEC S Inverse (TMS) 1,00 Iref 1,00 0,95 Non Directional
No Overcurrent1 I>2 DT 1,00 Iref 1,03 0,95 Non Directional
No Overcurrent1 I>3 DT 10,00 Iref 0,03 s 0,95 Non Directional
No Overcurrent1 I>4 DT 10,00 Iref 0,03 s 0,95 Non Directional
No Overcurrent2 I>1 IEC S Inverse (TMS) 1,00 Iref 1,00 0,95 Non Directional
No Overcurrent2 I>2 DT 1,00 Iref 1,03 0,95 Non Directional
No Overcurrent2 I>3 DT 10,00 Iref 0,03 s 0,95 Non Directional
No Overcurrent2 I>4 DT 10,00 Iref 0,03 s 0,95 Non Directional
.
Elements - Residual:
Active Name Tripping characteristic I Pick-up Time Reset Ratio Direction
Yes EF 1 IN>1 IEC S Inverse (TMS) 0,20 Iref 1,00 0,95 Non Directional
No EF 1 IN>2 DT 0,20 Iref 1,03 0,95 Non Directional
No EF 1 IN>3 DT 0,50 Iref 0,03 s 0,95 Non Directional
No EF 1 IN>4 DT 0,50 Iref 0,03 s 0,95 Non Directional
No EF 2 IN>1 IEC S Inverse (TMS) 0,20 Iref 1,00 0,95 Non Directional
No EF 2 IN>2 DT 0,20 Iref 1,03 0,95 Non Directional
No EF 2 IN>3 DT 0,50 Iref 0,03 s 0,95 Non Directional
No EF 2 IN>4 DT 0,50 Iref 0,03 s 0,95 Non Directional
. .
Test Module
Name: OMICRON Overcurrent Version: 3.00 SR 2
Test Start: Test End:
User Name: Manager:
Company:

Test Settings:
.
Fault Model:
Time reference: Fault inception
Load current: 0,00 In
Load angle: same as fault angle
Prefault time: 0,10 s
Abs. max time: 240,00 s
Post fault time: 0,50 s
Rel. max time: 100,00 %
Enable voltage output: No
Fault voltage LN (for all but two phase faults): 1,00 Vn
Fault voltage LL (for two phase faults): 1,73 Vn
Decaying DC active: No
Time constant: 0,05 s
CB char min time: 1,00 CB_trip_time
Thermal reset active: No
Thermal reset method: Manual
Thermal reset message: Please reset the Thermal Memory of the device under
test before continuing.
.
Shot Test:
Type Relative To Factor Magnitude Angle tnom tmin tmax
A-B-C Overcurrent1 I>1 0,940 0,94 In n/a No trip No trip No trip
A-B-C Overcurrent1 I>1 1,060 1,06 In n/a No trip No trip No trip
A-B-C Overcurrent1 I>2 0,940 0,94 In n/a No trip No trip No trip
A-B-C Overcurrent1 I>2 1,060 1,06 In n/a No trip No trip No trip
A-B-C Overcurrent1 I>3 0,940 9,40 In n/a No trip No trip No trip
A-B-C Overcurrent1 I>3 1,060 10,60 In n/a No trip No trip No trip
A-B-C Overcurrent1 I>4 0,940 9,40 In n/a No trip No trip No trip
A-B-C Overcurrent1 I>4 1,060 10,60 In n/a No trip No trip No trip
A-B-C Overcurrent2 I>1 0,940 0,94 In n/a No trip No trip No trip
A-B-C Overcurrent2 I>1 1,060 1,06 In n/a No trip No trip No trip
A-B-C Overcurrent2 I>2 0,940 0,94 In n/a No trip No trip No trip
A-B-C Overcurrent2 I>2 1,060 1,06 In n/a No trip No trip No trip
A-B-C Overcurrent2 I>3 0,940 9,40 In n/a No trip No trip No trip
A-B-C Overcurrent2 I>3 1,060 10,60 In n/a No trip No trip No trip
A-B-C Overcurrent2 I>4 0,940 9,40 In n/a No trip No trip No trip
A-B-C Overcurrent2 I>4 1,060 10,60 In n/a No trip No trip No trip

Binary Inputs:
Trigger Logic: Or
Name Trigger State
Trip Side 1 1
Trip Side 2 X
Pickup X
.
Shot Test Results:
Type Relative To Factor Magnitude Angle tnom tact Overload Result
A-B-C Overcurrent1 I>1 0,940 0,94 In n/a No trip -1,000 s Skipped
A-B-C Overcurrent1 I>1 1,060 1,06 In n/a No trip -1,000 s Skipped
A-B-C Overcurrent1 I>2 0,940 0,94 In n/a No trip -1,000 s Skipped
A-B-C Overcurrent1 I>2 1,060 1,06 In n/a No trip -1,000 s Skipped
A-B-C Overcurrent1 I>3 0,940 9,40 In n/a No trip -1,000 s Skipped
A-B-C Overcurrent1 I>3 1,060 10,60 In n/a No trip -1,000 s Skipped
A-B-C Overcurrent1 I>4 0,940 9,40 In n/a No trip -1,000 s Skipped
A-B-C Overcurrent1 I>4 1,060 10,60 In n/a No trip -1,000 s Skipped
A-B-C Overcurrent2 I>1 0,940 0,94 In n/a No trip -1,000 s Skipped
A-B-C Overcurrent2 I>1 1,060 1,06 In n/a No trip -1,000 s Skipped
A-B-C Overcurrent2 I>2 0,940 0,94 In n/a No trip -1,000 s Skipped
A-B-C Overcurrent2 I>2 1,060 1,06 In n/a No trip -1,000 s Skipped
A-B-C Overcurrent2 I>3 0,940 9,40 In n/a No trip -1,000 s Skipped
A-B-C Overcurrent2 I>3 1,060 10,60 In n/a No trip -1,000 s Skipped
A-B-C Overcurrent2 I>4 0,940 9,40 In n/a No trip -1,000 s Skipped
A-B-C Overcurrent2 I>4 1,060 10,60 In n/a No trip -1,000 s Skipped

.
State:
0 out of 16 points tested.
0 points passed.
0 points failed.

General Assessment: No results available!

Overcurrent Pickup and Dropout Side 2 A-B-C:


Test Object - Overcurrent Parameters
.
General - Values:
TimeTolAbs: 0,05 s VT connection: At protected object
TimeTolRel: 5,00 % CT starpoint connection: To protected object
CurrentTolAbs: 0,02 Iref
CurrentTolRel: 5,00 %
Directional: No
.
Elements - Phase:
Active Name Tripping characteristic I Pick-up Time Reset Ratio Direction
No Overcurrent1 I>1 IEC S Inverse (TMS) 1,00 Iref 1,00 0,95 Non Directional
No Overcurrent1 I>2 DT 1,00 Iref 1,03 0,95 Non Directional
No Overcurrent1 I>3 DT 10,00 Iref 0,03 s 0,95 Non Directional
No Overcurrent1 I>4 DT 10,00 Iref 0,03 s 0,95 Non Directional
No Overcurrent2 I>1 IEC S Inverse (TMS) 1,00 Iref 1,00 0,95 Non Directional
No Overcurrent2 I>2 DT 1,00 Iref 1,03 0,95 Non Directional
No Overcurrent2 I>3 DT 10,00 Iref 0,03 s 0,95 Non Directional
No Overcurrent2 I>4 DT 10,00 Iref 0,03 s 0,95 Non Directional
.
Elements - Residual:
Active Name Tripping characteristic I Pick-up Time Reset Ratio Direction
No EF 1 IN>1 IEC S Inverse (TMS) 0,20 Iref 1,00 0,95 Non Directional
No EF 1 IN>2 DT 0,20 Iref 1,03 0,95 Non Directional
No EF 1 IN>3 DT 0,50 Iref 0,03 s 0,95 Non Directional
No EF 1 IN>4 DT 0,50 Iref 0,03 s 0,95 Non Directional
Yes EF 2 IN>1 IEC S Inverse (TMS) 0,20 Iref 1,00 0,95 Non Directional
No EF 2 IN>2 DT 0,20 Iref 1,03 0,95 Non Directional
No EF 2 IN>3 DT 0,50 Iref 0,03 s 0,95 Non Directional
No EF 2 IN>4 DT 0,50 Iref 0,03 s 0,95 Non Directional

. .
Test Module
Name: OMICRON Overcurrent Version: 3.00 SR 2
Test Start: Test End:
User Name: Manager:
Company:

Test Settings:
.
Fault Model:
Time reference: Fault inception
Load current: 0,00 A
Load angle: 0,00 °
Prefault time: 0,10 s
Abs. max time: 240,00 s
Post fault time: 0,50 s
Rel. max time: 100,00 %
Enable voltage output: No
Fault voltage LN (for all but two phase faults): 30,00 V
Fault voltage LL (for two phase faults): 51,96 V
Decaying DC active: No
Time constant: 0,05 s
CB char min time: 0,05 s
Thermal reset active: No
Thermal reset method: Manual
Thermal reset message: Please reset the Thermal Memory of the device under
test before continuing.

Binary Inputs:
Trigger Logic: And
Name Trigger State
Trip Side 1 X
Trip Side 2 X
Pickup 1
.
Pick-up / Drop-off Test:
Type Angle Resolution I Pick-up Reset Ratio
nom min max nom
A-B-C n/a 0,07 s +∞A +∞A +∞A n/a
.
Pick-up / Drop-off Test Results:
Type Angle I Pick-up I Drop-off Reset Ratio Result
nom act act nom act Error
A-B-C n/a +∞A n/a n/a n/a n/a n/a Out of range
.
State:
0 out of 1 points tested.
0 points passed.
0 points failed.

General Assessment: No results available!

Overcurrent Trip Times Side 2 A-B-C:


Test Object - Overcurrent Parameters
.
General - Values:
TimeTolAbs: 0,05 s VT connection: At protected object
TimeTolRel: 5,00 % CT starpoint connection: To protected object
CurrentTolAbs: 0,02 Iref
CurrentTolRel: 5,00 %
Directional: No
.
Elements - Phase:
Active Name Tripping characteristic I Pick-up Time Reset Ratio Direction
No Overcurrent1 I>1 IEC S Inverse (TMS) 1,00 Iref 1,00 0,95 Non Directional
No Overcurrent1 I>2 DT 1,00 Iref 1,03 0,95 Non Directional
No Overcurrent1 I>3 DT 10,00 Iref 0,03 s 0,95 Non Directional
No Overcurrent1 I>4 DT 10,00 Iref 0,03 s 0,95 Non Directional
No Overcurrent2 I>1 IEC S Inverse (TMS) 1,00 Iref 1,00 0,95 Non Directional
No Overcurrent2 I>2 DT 1,00 Iref 1,03 0,95 Non Directional
No Overcurrent2 I>3 DT 10,00 Iref 0,03 s 0,95 Non Directional
No Overcurrent2 I>4 DT 10,00 Iref 0,03 s 0,95 Non Directional
.
Elements - Residual:
Active Name Tripping characteristic I Pick-up Time Reset Ratio Direction
No EF 1 IN>1 IEC S Inverse (TMS) 0,20 Iref 1,00 0,95 Non Directional
No EF 1 IN>2 DT 0,20 Iref 1,03 0,95 Non Directional
No EF 1 IN>3 DT 0,50 Iref 0,03 s 0,95 Non Directional
No EF 1 IN>4 DT 0,50 Iref 0,03 s 0,95 Non Directional
Yes EF 2 IN>1 IEC S Inverse (TMS) 0,20 Iref 1,00 0,95 Non Directional
No EF 2 IN>2 DT 0,20 Iref 1,03 0,95 Non Directional
No EF 2 IN>3 DT 0,50 Iref 0,03 s 0,95 Non Directional
No EF 2 IN>4 DT 0,50 Iref 0,03 s 0,95 Non Directional

. .
Test Module
Name: OMICRON Overcurrent Version: 3.00 SR 2
Test Start: Test End:
User Name: Manager:
Company:

Test Settings:
.
Fault Model:
Time reference: Fault inception
Load current: 0,00 In
Load angle: same as fault angle
Prefault time: 0,10 s
Abs. max time: 240,00 s
Post fault time: 0,50 s
Rel. max time: 100,00 %
Enable voltage output: No
Fault voltage LN (for all but two phase faults): 1,00 Vn
Fault voltage LL (for two phase faults): 1,73 Vn
Decaying DC active: No
Time constant: 0,05 s
CB char min time: 1,00 CB_trip_time
Thermal reset active: No
Thermal reset method: Manual
Thermal reset message: Please reset the Thermal Memory of the device under
test before continuing.
.
Shot Test:
Type Relative To Factor Magnitude Angle tnom tmin tmax
A-B-C Overcurrent1 I>1 0,940 0,94 In n/a No trip No trip No trip
A-B-C Overcurrent1 I>1 1,060 1,06 In n/a No trip No trip No trip
A-B-C Overcurrent1 I>2 0,940 0,94 In n/a No trip No trip No trip
A-B-C Overcurrent1 I>2 1,060 1,06 In n/a No trip No trip No trip
A-B-C Overcurrent1 I>3 0,940 9,40 In n/a No trip No trip No trip
A-B-C Overcurrent1 I>3 1,060 10,60 In n/a No trip No trip No trip
A-B-C Overcurrent1 I>4 0,940 9,40 In n/a No trip No trip No trip
A-B-C Overcurrent1 I>4 1,060 10,60 In n/a No trip No trip No trip
A-B-C Overcurrent2 I>1 0,940 0,94 In n/a No trip No trip No trip
A-B-C Overcurrent2 I>1 1,060 1,06 In n/a No trip No trip No trip
A-B-C Overcurrent2 I>2 0,940 0,94 In n/a No trip No trip No trip
A-B-C Overcurrent2 I>2 1,060 1,06 In n/a No trip No trip No trip
A-B-C Overcurrent2 I>3 0,940 9,40 In n/a No trip No trip No trip
A-B-C Overcurrent2 I>3 1,060 10,60 In n/a No trip No trip No trip
A-B-C Overcurrent2 I>4 0,940 9,40 In n/a No trip No trip No trip
A-B-C Overcurrent2 I>4 1,060 10,60 In n/a No trip No trip No trip

Binary Inputs:
Trigger Logic: Or
Name Trigger State
Trip Side 1 X
Trip Side 2 1
Pickup X
.
Shot Test Results:
Type Relative To Factor Magnitude Angle tnom tact Overload Result
A-B-C Overcurrent1 I>1 0,940 0,94 In n/a No trip -1,000 s Skipped
A-B-C Overcurrent1 I>1 1,060 1,06 In n/a No trip -1,000 s Skipped
A-B-C Overcurrent1 I>2 0,940 0,94 In n/a No trip -1,000 s Skipped
A-B-C Overcurrent1 I>2 1,060 1,06 In n/a No trip -1,000 s Skipped
A-B-C Overcurrent1 I>3 0,940 9,40 In n/a No trip -1,000 s Skipped
A-B-C Overcurrent1 I>3 1,060 10,60 In n/a No trip -1,000 s Skipped
A-B-C Overcurrent1 I>4 0,940 9,40 In n/a No trip -1,000 s Skipped
A-B-C Overcurrent1 I>4 1,060 10,60 In n/a No trip -1,000 s Skipped
A-B-C Overcurrent2 I>1 0,940 0,94 In n/a No trip -1,000 s Skipped
A-B-C Overcurrent2 I>1 1,060 1,06 In n/a No trip -1,000 s Skipped
A-B-C Overcurrent2 I>2 0,940 0,94 In n/a No trip -1,000 s Skipped
A-B-C Overcurrent2 I>2 1,060 1,06 In n/a No trip -1,000 s Skipped
A-B-C Overcurrent2 I>3 0,940 9,40 In n/a No trip -1,000 s Skipped
A-B-C Overcurrent2 I>3 1,060 10,60 In n/a No trip -1,000 s Skipped
A-B-C Overcurrent2 I>4 0,940 9,40 In n/a No trip -1,000 s Skipped
A-B-C Overcurrent2 I>4 1,060 10,60 In n/a No trip -1,000 s Skipped

.
State:
0 out of 16 points tested.
0 points passed.
0 points failed.

General Assessment: No results available!

Earth Fault Pickup and Dropout Side 1 A-N:


Test Object - Overcurrent Parameters
.
General - Values:
TimeTolAbs: 0,05 s VT connection: At protected object
TimeTolRel: 5,00 % CT starpoint connection: To protected object
CurrentTolAbs: 0,00 Iref
CurrentTolRel: 5,00 %
Directional: No

.
Elements - Phase:
Active Name Tripping characteristic I Pick-up Time Reset Ratio Direction
No Overcurrent1 I>1 IEC S Inverse (TMS) 0,20 Iref 1,00 0,95 Non Directional
No Overcurrent1 I>2 DT 0,20 Iref 1,03 0,95 Non Directional
No Overcurrent1 I>3 DT 2,00 Iref 0,03 s 0,95 Non Directional
No Overcurrent1 I>4 DT 2,00 Iref 0,03 s 0,95 Non Directional
No Overcurrent2 I>1 IEC S Inverse (TMS) 0,20 Iref 1,00 0,95 Non Directional
No Overcurrent2 I>2 DT 0,20 Iref 1,03 0,95 Non Directional
No Overcurrent2 I>3 DT 2,00 Iref 0,03 s 0,95 Non Directional
No Overcurrent2 I>4 DT 2,00 Iref 0,03 s 0,95 Non Directional
.
Elements - Residual:
Active Name Tripping characteristic I Pick-up Time Reset Ratio Direction
Yes EF 1 IN>1 IEC S Inverse (TMS) 0,20 Iref 1,00 0,95 Non Directional
No EF 1 IN>2 DT 0,04 Iref 1,03 0,95 Non Directional
No EF 1 IN>3 DT 0,10 Iref 0,03 s 0,95 Non Directional
No EF 1 IN>4 DT 0,10 Iref 0,03 s 0,95 Non Directional
No EF 2 IN>1 IEC S Inverse (TMS) 0,40 Iref 1,00 0,95 Non Directional
No EF 2 IN>2 DT 0,04 Iref 1,03 0,95 Non Directional
No EF 2 IN>3 DT 0,10 Iref 0,03 s 0,95 Non Directional
No EF 2 IN>4 DT 0,10 Iref 0,03 s 0,95 Non Directional

. .
Test Module
Name: OMICRON Overcurrent Version: 3.00 SR 2
Test Start: Test End:
User Name: Manager:
Company:

Test Settings:
.
Fault Model:
Time reference: Fault inception
Load current: 0,00 A
Load angle: 0,00 °
Prefault time: 0,10 s
Abs. max time: 240,00 s
Post fault time: 0,50 s
Rel. max time: 100,00 %
Enable voltage output: No
Fault voltage LN (for all but two phase faults): 30,00 V
Fault voltage LL (for two phase faults): 51,96 V
Decaying DC active: No
Time constant: 0,05 s
CB char min time: 0,05 s
Thermal reset active: No
Thermal reset method: Manual
Thermal reset message: Please reset the Thermal Memory of the device under
test before continuing.

Binary Inputs:
Trigger Logic: And
Name Trigger State
Trip Side 1 X
Trip Side 2 X
Pickup 1
.
Pick-up / Drop-off Test:
Type Angle Resolution I Pick-up Reset Ratio
nom min max nom
A-N n/a 0,07 s 1,00 A 0,95 A 1,05 A 0,95
.
Pick-up / Drop-off Test Results:
Type Angle I Pick-up I Drop-off Reset Ratio Result
nom act act nom act Error
A-N n/a 1,00 A n/a n/a 0,95 n/a n/a Not tested
.
State:
0 out of 1 points tested.
0 points passed.
0 points failed.

General Assessment: No results available!

Earth Fault Trip Times Side 1 A-N:


Test Object - Overcurrent Parameters
.
General - Values:
TimeTolAbs: 0,05 s VT connection: At protected object
TimeTolRel: 5,00 % CT starpoint connection: To protected object
CurrentTolAbs: 0,02 Iref
CurrentTolRel: 5,00 %
Directional: No

.
Elements - Phase:
Active Name Tripping characteristic I Pick-up Time Reset Ratio Direction
No Overcurrent1 I>1 IEC S Inverse (TMS) 1,00 Iref 1,00 0,95 Non Directional
No Overcurrent1 I>2 DT 1,00 Iref 1,03 0,95 Non Directional
No Overcurrent1 I>3 DT 10,00 Iref 0,03 s 0,95 Non Directional
No Overcurrent1 I>4 DT 10,00 Iref 0,03 s 0,95 Non Directional
No Overcurrent2 I>1 IEC S Inverse (TMS) 1,00 Iref 1,00 0,95 Non Directional
No Overcurrent2 I>2 DT 1,00 Iref 1,03 0,95 Non Directional
No Overcurrent2 I>3 DT 10,00 Iref 0,03 s 0,95 Non Directional
No Overcurrent2 I>4 DT 10,00 Iref 0,03 s 0,95 Non Directional
.
Elements - Residual:
Active Name Tripping characteristic I Pick-up Time Reset Ratio Direction
Yes EF 1 IN>1 IEC S Inverse (TMS) 0,20 Iref 1,00 0,95 Non Directional
No EF 1 IN>2 DT 0,20 Iref 1,03 0,95 Non Directional
No EF 1 IN>3 DT 0,50 Iref 0,03 s 0,95 Non Directional
No EF 1 IN>4 DT 0,50 Iref 0,03 s 0,95 Non Directional
No EF 2 IN>1 IEC S Inverse (TMS) 0,20 Iref 1,00 0,95 Non Directional
No EF 2 IN>2 DT 0,20 Iref 1,03 0,95 Non Directional
No EF 2 IN>3 DT 0,50 Iref 0,03 s 0,95 Non Directional
No EF 2 IN>4 DT 0,50 Iref 0,03 s 0,95 Non Directional

. .
Test Module
Name: OMICRON Overcurrent Version: 3.00 SR 2
Test Start: Test End:
User Name: Manager:
Company:

Test Settings:
.
Fault Model:
Time reference: Fault inception
Load current: 0,00 A
Load angle: same as fault angle
Prefault time: 0,10 s
Abs. max time: 240,00 s
Post fault time: 0,50 s
Rel. max time: 100,00 %
Enable voltage output: No
Fault voltage LN (for all but two phase faults): 63,51 V
Fault voltage LL (for two phase faults): 110,00 V
Decaying DC active: No
Time constant: 0,05 s
CB char min time: 0,05 s
Thermal reset active: No
Thermal reset method: Manual
Thermal reset message: Please reset the Thermal Memory of the device under
test before continuing.
.
Shot Test:
Type Relative To Factor Magnitude Angle tnom tmin tmax
A-N EF 1 IN>1 0,940 0,19 A n/a No trip 169,5 s No trip
A-N EF 1 IN>1 1,060 0,21 A n/a 120,1 s 44,74 s No trip
A-N EF 1 IN>2 0,940 0,19 A n/a No trip 169,5 s No trip
A-N EF 1 IN>2 1,060 0,21 A n/a 120,1 s 44,74 s No trip
A-N EF 1 IN>3 0,940 0,47 A n/a 8,123 s 7,296 s 9,079 s
A-N EF 1 IN>3 1,060 0,53 A n/a 7,113 s 6,432 s 7,888 s
A-N EF 1 IN>4 0,940 0,47 A n/a 8,123 s 7,296 s 9,079 s
A-N EF 1 IN>4 1,060 0,53 A n/a 7,113 s 6,432 s 7,888 s
A-N EF 2 IN>1 0,940 0,19 A n/a No trip 169,5 s No trip
A-N EF 2 IN>1 1,060 0,21 A n/a 120,1 s 44,74 s No trip
A-N EF 2 IN>2 0,940 0,19 A n/a No trip 169,5 s No trip
A-N EF 2 IN>2 1,060 0,21 A n/a 120,1 s 44,74 s No trip
A-N EF 2 IN>3 0,940 0,47 A n/a 8,123 s 7,296 s 9,079 s
A-N EF 2 IN>3 1,060 0,53 A n/a 7,113 s 6,432 s 7,888 s
A-N EF 2 IN>4 0,940 0,47 A n/a 8,123 s 7,296 s 9,079 s
A-N EF 2 IN>4 1,060 0,53 A n/a 7,113 s 6,432 s 7,888 s

Binary Inputs:
Trigger Logic: Or
Name Trigger State
Trip Side 1 1
Trip Side 2 X
Pickup X
.
Shot Test Results:
Type Relative To Factor Magnitude Angle tnom tact Overload Result
A-N EF 1 IN>1 0,940 0,19 A n/a No trip Not tested
A-N EF 1 IN>1 1,060 0,21 A n/a 120,1 s Not tested
A-N EF 1 IN>2 0,940 0,19 A n/a No trip -1,000 s Skipped
A-N EF 1 IN>2 1,060 0,21 A n/a 120,1 s -1,000 s Skipped
A-N EF 1 IN>3 0,940 0,47 A n/a 8,123 s -1,000 s Skipped
A-N EF 1 IN>3 1,060 0,53 A n/a 7,113 s -1,000 s Skipped
A-N EF 1 IN>4 0,940 0,47 A n/a 8,123 s -1,000 s Skipped
A-N EF 1 IN>4 1,060 0,53 A n/a 7,113 s -1,000 s Skipped
A-N EF 2 IN>1 0,940 0,19 A n/a No trip -1,000 s Skipped
A-N EF 2 IN>1 1,060 0,21 A n/a 120,1 s -1,000 s Skipped
A-N EF 2 IN>2 0,940 0,19 A n/a No trip -1,000 s Skipped
A-N EF 2 IN>2 1,060 0,21 A n/a 120,1 s -1,000 s Skipped
A-N EF 2 IN>3 0,940 0,47 A n/a 8,123 s -1,000 s Skipped
A-N EF 2 IN>3 1,060 0,53 A n/a 7,113 s -1,000 s Skipped
A-N EF 2 IN>4 0,940 0,47 A n/a 8,123 s -1,000 s Skipped
A-N EF 2 IN>4 1,060 0,53 A n/a 7,113 s -1,000 s Skipped

.
State:
0 out of 16 points tested.
0 points passed.
0 points failed.

General Assessment: No results available!


Earth Fault Pickup and Dropout Side 2 A-N:
Test Object - Overcurrent Parameters
.
General - Values:
TimeTolAbs: 0,05 s VT connection: At protected object
TimeTolRel: 5,00 % CT starpoint connection: To protected object
CurrentTolAbs: 0,00 Iref
CurrentTolRel: 5,00 %
Directional: No
.
Elements - Phase:
Active Name Tripping characteristic I Pick-up Time Reset Ratio Direction
No Overcurrent1 I>1 IEC S Inverse (TMS) 0,20 Iref 1,00 0,95 Non Directional
No Overcurrent1 I>2 DT 0,20 Iref 1,03 0,95 Non Directional
No Overcurrent1 I>3 DT 2,00 Iref 0,03 s 0,95 Non Directional
No Overcurrent1 I>4 DT 2,00 Iref 0,03 s 0,95 Non Directional
No Overcurrent2 I>1 IEC S Inverse (TMS) 0,20 Iref 1,00 0,95 Non Directional
No Overcurrent2 I>2 DT 0,20 Iref 1,03 0,95 Non Directional
No Overcurrent2 I>3 DT 2,00 Iref 0,03 s 0,95 Non Directional
No Overcurrent2 I>4 DT 2,00 Iref 0,03 s 0,95 Non Directional
.
Elements - Residual:
Active Name Tripping characteristic I Pick-up Time Reset Ratio Direction
No EF 1 IN>1 IEC S Inverse (TMS) 0,20 Iref 1,00 0,95 Non Directional
No EF 1 IN>2 DT 0,04 Iref 1,03 0,95 Non Directional
No EF 1 IN>3 DT 0,10 Iref 0,03 s 0,95 Non Directional
No EF 1 IN>4 DT 0,10 Iref 0,03 s 0,95 Non Directional
Yes EF 2 IN>1 IEC S Inverse (TMS) 0,40 Iref 1,00 0,95 Non Directional
No EF 2 IN>2 DT 0,04 Iref 1,03 0,95 Non Directional
No EF 2 IN>3 DT 0,10 Iref 0,03 s 0,95 Non Directional
No EF 2 IN>4 DT 0,10 Iref 0,03 s 0,95 Non Directional

. .
Test Module
Name: OMICRON Overcurrent Version: 3.00 SR 2
Test Start: Test End:
User Name: Manager:
Company:

Test Settings:
.
Fault Model:
Time reference: Fault inception
Load current: 0,00 A
Load angle: 0,00 °
Prefault time: 0,10 s
Abs. max time: 240,00 s
Post fault time: 0,50 s
Rel. max time: 100,00 %
Enable voltage output: No
Fault voltage LN (for all but two phase faults): 30,00 V
Fault voltage LL (for two phase faults): 51,96 V
Decaying DC active: No
Time constant: 0,05 s
CB char min time: 0,05 s
Thermal reset active: No
Thermal reset method: Manual
Thermal reset message: Please reset the Thermal Memory of the device under
test before continuing.

Binary Inputs:
Trigger Logic: And
Name Trigger State
Trip Side 1 X
Trip Side 2 X
Pickup 1
.
Pick-up / Drop-off Test:
Type Angle Resolution I Pick-up Reset Ratio
nom min max nom
A-N n/a 0,07 s 2,00 A 1,90 A 2,11 A 0,95
.
Pick-up / Drop-off Test Results:
Type Angle I Pick-up I Drop-off Reset Ratio Result
nom act act nom act Error
A-N n/a 2,00 A n/a n/a 0,95 n/a n/a Not tested
.
State:
0 out of 1 points tested.
0 points passed.
0 points failed.

General Assessment: No results available!

Earth Fault Trip Times Side 2 A-N:


Test Object - Overcurrent Parameters
.
General - Values:
TimeTolAbs: 0,05 s VT connection: At protected object
TimeTolRel: 5,00 % CT starpoint connection: To protected object
CurrentTolAbs: 0,02 Iref
CurrentTolRel: 5,00 %
Directional: No

.
Elements - Phase:
Active Name Tripping characteristic I Pick-up Time Reset Ratio Direction
No Overcurrent1 I>1 IEC S Inverse (TMS) 1,00 Iref 1,00 0,95 Non Directional
No Overcurrent1 I>2 DT 1,00 Iref 1,03 0,95 Non Directional
No Overcurrent1 I>3 DT 10,00 Iref 0,03 s 0,95 Non Directional
No Overcurrent1 I>4 DT 10,00 Iref 0,03 s 0,95 Non Directional
No Overcurrent2 I>1 IEC S Inverse (TMS) 1,00 Iref 1,00 0,95 Non Directional
No Overcurrent2 I>2 DT 1,00 Iref 1,03 0,95 Non Directional
No Overcurrent2 I>3 DT 10,00 Iref 0,03 s 0,95 Non Directional
No Overcurrent2 I>4 DT 10,00 Iref 0,03 s 0,95 Non Directional
.
Elements - Residual:
Active Name Tripping characteristic I Pick-up Time Reset Ratio Direction
No EF 1 IN>1 IEC S Inverse (TMS) 0,20 Iref 1,00 0,95 Non Directional
No EF 1 IN>2 DT 0,20 Iref 1,03 0,95 Non Directional
No EF 1 IN>3 DT 0,50 Iref 0,03 s 0,95 Non Directional
No EF 1 IN>4 DT 0,50 Iref 0,03 s 0,95 Non Directional
Yes EF 2 IN>1 IEC S Inverse (TMS) 0,20 Iref 1,00 0,95 Non Directional
No EF 2 IN>2 DT 0,20 Iref 1,03 0,95 Non Directional
No EF 2 IN>3 DT 0,50 Iref 0,03 s 0,95 Non Directional
No EF 2 IN>4 DT 0,50 Iref 0,03 s 0,95 Non Directional

. .
Test Module
Name: OMICRON Overcurrent Version: 3.00 SR 2
Test Start: Test End:
User Name: Manager:
Company:

Test Settings:
.
Fault Model:
Time reference: Fault inception
Load current: 0,00 A
Load angle: same as fault angle
Prefault time: 0,10 s
Abs. max time: 240,00 s
Post fault time: 0,50 s
Rel. max time: 100,00 %
Enable voltage output: No
Fault voltage LN (for all but two phase faults): 63,51 V
Fault voltage LL (for two phase faults): 110,00 V
Decaying DC active: No
Time constant: 0,05 s
CB char min time: 0,05 s
Thermal reset active: No
Thermal reset method: Manual
Thermal reset message: Please reset the Thermal Memory of the device under
test before continuing.
.
Shot Test:
Type Relative To Factor Magnitude Angle tnom tmin tmax
A-N EF 1 IN>1 0,940 0,19 A n/a No trip 169,5 s No trip
A-N EF 1 IN>1 1,060 0,21 A n/a 120,1 s 44,74 s No trip
A-N EF 1 IN>2 0,940 0,19 A n/a No trip 169,5 s No trip
A-N EF 1 IN>2 1,060 0,21 A n/a 120,1 s 44,74 s No trip
A-N EF 1 IN>3 0,940 0,47 A n/a 8,123 s 7,296 s 9,079 s
A-N EF 1 IN>3 1,060 0,53 A n/a 7,113 s 6,432 s 7,888 s
A-N EF 1 IN>4 0,940 0,47 A n/a 8,123 s 7,296 s 9,079 s
A-N EF 1 IN>4 1,060 0,53 A n/a 7,113 s 6,432 s 7,888 s
A-N EF 2 IN>1 0,940 0,19 A n/a No trip 169,5 s No trip
A-N EF 2 IN>1 1,060 0,21 A n/a 120,1 s 44,74 s No trip
A-N EF 2 IN>2 0,940 0,19 A n/a No trip 169,5 s No trip
A-N EF 2 IN>2 1,060 0,21 A n/a 120,1 s 44,74 s No trip
A-N EF 2 IN>3 0,940 0,47 A n/a 8,123 s 7,296 s 9,079 s
A-N EF 2 IN>3 1,060 0,53 A n/a 7,113 s 6,432 s 7,888 s
A-N EF 2 IN>4 0,940 0,47 A n/a 8,123 s 7,296 s 9,079 s
A-N EF 2 IN>4 1,060 0,53 A n/a 7,113 s 6,432 s 7,888 s

Binary Inputs:
Trigger Logic: Or
Name Trigger State
Trip Side 1 X
Trip Side 2 1
Pickup X
.
Shot Test Results:
Type Relative To Factor Magnitude Angle tnom tact Overload Result
A-N EF 1 IN>1 0,940 0,19 A n/a No trip -1,000 s Skipped
A-N EF 1 IN>1 1,060 0,21 A n/a 120,1 s -1,000 s Skipped
A-N EF 1 IN>2 0,940 0,19 A n/a No trip -1,000 s Skipped
A-N EF 1 IN>2 1,060 0,21 A n/a 120,1 s -1,000 s Skipped
A-N EF 1 IN>3 0,940 0,47 A n/a 8,123 s -1,000 s Skipped
A-N EF 1 IN>3 1,060 0,53 A n/a 7,113 s -1,000 s Skipped
A-N EF 1 IN>4 0,940 0,47 A n/a 8,123 s -1,000 s Skipped
A-N EF 1 IN>4 1,060 0,53 A n/a 7,113 s -1,000 s Skipped
A-N EF 2 IN>1 0,940 0,19 A n/a No trip Not tested
A-N EF 2 IN>1 1,060 0,21 A n/a 120,1 s Not tested
A-N EF 2 IN>2 0,940 0,19 A n/a No trip -1,000 s Skipped
A-N EF 2 IN>2 1,060 0,21 A n/a 120,1 s -1,000 s Skipped
A-N EF 2 IN>3 0,940 0,47 A n/a 8,123 s -1,000 s Skipped
A-N EF 2 IN>3 1,060 0,53 A n/a 7,113 s -1,000 s Skipped
A-N EF 2 IN>4 0,940 0,47 A n/a 8,123 s -1,000 s Skipped
A-N EF 2 IN>4 1,060 0,53 A n/a 7,113 s -1,000 s Skipped

.
State:
0 out of 16 points tested.
0 points passed.
0 points failed.

General Assessment: No results available!

Earth Fault Protection Information


Instruction Text:
Attention! Change the hardware connections as shown in the following diagram!

User Input:

Test State: Idle

Hardware Configuration
.
Test Equipment
Type Serial Number
CMC256plus ??????
. .
Hardware Check
Performed At Result Details
Not yet performed

Earth Fault Pickup and Dropout Side 1 A-N:


Test Object - Overcurrent Parameters
.
General - Values:
TimeTolAbs: 0,05 s VT connection: At protected object
TimeTolRel: 5,00 % CT starpoint connection: To protected object
CurrentTolAbs: 0,00 Iref
CurrentTolRel: 5,00 %
Directional: No

.
Elements - Phase:
Active Name Tripping characteristic I Pick-up Time Reset Ratio Direction
No Overcurrent1 I>1 IEC S Inverse (TMS) 0,20 Iref 1,00 0,95 Non Directional
No Overcurrent1 I>2 DT 0,20 Iref 1,03 0,95 Non Directional
No Overcurrent1 I>3 DT 2,00 Iref 0,03 s 0,95 Non Directional
No Overcurrent1 I>4 DT 2,00 Iref 0,03 s 0,95 Non Directional
No Overcurrent2 I>1 IEC S Inverse (TMS) 0,20 Iref 1,00 0,95 Non Directional
No Overcurrent2 I>2 DT 0,20 Iref 1,03 0,95 Non Directional
No Overcurrent2 I>3 DT 2,00 Iref 0,03 s 0,95 Non Directional
No Overcurrent2 I>4 DT 2,00 Iref 0,03 s 0,95 Non Directional
.
Elements - Residual:
Active Name Tripping characteristic I Pick-up Time Reset Ratio Direction
Yes EF 1 IN>1 IEC S Inverse (TMS) 0,20 Iref 1,00 0,95 Non Directional
No EF 1 IN>2 DT 0,04 Iref 1,03 0,95 Non Directional
No EF 1 IN>3 DT 0,10 Iref 0,03 s 0,95 Non Directional
No EF 1 IN>4 DT 0,10 Iref 0,03 s 0,95 Non Directional
No EF 2 IN>1 IEC S Inverse (TMS) 0,04 Iref 1,00 0,95 Non Directional
No EF 2 IN>2 DT 0,04 Iref 1,03 0,95 Non Directional
No EF 2 IN>3 DT 0,10 Iref 0,03 s 0,95 Non Directional
No EF 2 IN>4 DT 0,10 Iref 0,03 s 0,95 Non Directional

. .
Test Module
Name: OMICRON Overcurrent Version: 3.00 SR 2
Test Start: Test End:
User Name: Manager:
Company:

Test Settings:
.
Fault Model:
Time reference: Fault inception
Load current: 0,00 A
Load angle: 0,00 °
Prefault time: 0,10 s
Abs. max time: 240,00 s
Post fault time: 0,50 s
Rel. max time: 100,00 %
Enable voltage output: No
Fault voltage LN (for all but two phase faults): 30,00 V
Fault voltage LL (for two phase faults): 51,96 V
Decaying DC active: No
Time constant: 0,05 s
CB char min time: 0,05 s
Thermal reset active: No
Thermal reset method: Manual
Thermal reset message: Please reset the Thermal Memory of the device under
test before continuing.

Binary Inputs:
Trigger Logic: And
Name Trigger State
Trip Side 1 X
Trip Side 2 X
Pickup 1
.
Pick-up / Drop-off Test:
Type Angle Resolution I Pick-up Reset Ratio
nom min max nom
A-N n/a 0,07 s 1,00 A 0,95 A 1,05 A 0,95
.
Pick-up / Drop-off Test Results:
Type Angle I Pick-up I Drop-off Reset Ratio Result
nom act act nom act Error
A-N n/a 1,00 A n/a n/a 0,95 n/a n/a Not tested
.
State:
0 out of 1 points tested.
0 points passed.
0 points failed.

General Assessment: No results available!

Earth Fault Trip Times Side 1 A-N:


Test Object - Overcurrent Parameters
.
General - Values:
TimeTolAbs: 0,05 s VT connection: At protected object
TimeTolRel: 5,00 % CT starpoint connection: To protected object
CurrentTolAbs: 0,02 Iref
CurrentTolRel: 5,00 %
Directional: No

.
Elements - Phase:
Active Name Tripping characteristic I Pick-up Time Reset Ratio Direction
No Overcurrent1 I>1 IEC S Inverse (TMS) 1,00 Iref 1,00 0,95 Non Directional
No Overcurrent1 I>2 DT 1,00 Iref 1,03 0,95 Non Directional
No Overcurrent1 I>3 DT 10,00 Iref 0,03 s 0,95 Non Directional
No Overcurrent1 I>4 DT 10,00 Iref 0,03 s 0,95 Non Directional
No Overcurrent2 I>1 IEC S Inverse (TMS) 1,00 Iref 1,00 0,95 Non Directional
No Overcurrent2 I>2 DT 1,00 Iref 1,03 0,95 Non Directional
No Overcurrent2 I>3 DT 10,00 Iref 0,03 s 0,95 Non Directional
No Overcurrent2 I>4 DT 10,00 Iref 0,03 s 0,95 Non Directional
.
Elements - Residual:
Active Name Tripping characteristic I Pick-up Time Reset Ratio Direction
Yes EF 1 IN>1 IEC S Inverse (TMS) 0,20 Iref 1,00 0,95 Non Directional
No EF 1 IN>2 DT 0,20 Iref 1,03 0,95 Non Directional
No EF 1 IN>3 DT 0,50 Iref 0,03 s 0,95 Non Directional
No EF 1 IN>4 DT 0,50 Iref 0,03 s 0,95 Non Directional
No EF 2 IN>1 IEC S Inverse (TMS) 0,20 Iref 1,00 0,95 Non Directional
No EF 2 IN>2 DT 0,20 Iref 1,03 0,95 Non Directional
No EF 2 IN>3 DT 0,50 Iref 0,03 s 0,95 Non Directional
No EF 2 IN>4 DT 0,50 Iref 0,03 s 0,95 Non Directional

. .
Test Module
Name: OMICRON Overcurrent Version: 3.00 SR 2
Test Start: Test End:
User Name: Manager:
Company:

Test Settings:
.
Fault Model:
Time reference: Fault inception
Load current: 0,00 A
Load angle: same as fault angle
Prefault time: 0,10 s
Abs. max time: 240,00 s
Post fault time: 0,50 s
Rel. max time: 100,00 %
Enable voltage output: No
Fault voltage LN (for all but two phase faults): 63,51 V
Fault voltage LL (for two phase faults): 110,00 V
Decaying DC active: No
Time constant: 0,05 s
CB char min time: 0,05 s
Thermal reset active: No
Thermal reset method: Manual
Thermal reset message: Please reset the Thermal Memory of the device under
test before continuing.
.
Shot Test:
Type Relative To Factor Magnitude Angle tnom tmin tmax
A-N EF 1 IN>1 0,940 0,19 A n/a No trip 169,5 s No trip
A-N EF 1 IN>1 1,060 0,21 A n/a 120,1 s 44,74 s No trip
A-N EF 1 IN>2 0,940 0,19 A n/a No trip 169,5 s No trip
A-N EF 1 IN>2 1,060 0,21 A n/a 120,1 s 44,74 s No trip
A-N EF 1 IN>3 0,940 0,47 A n/a 8,123 s 7,296 s 9,079 s
A-N EF 1 IN>3 1,060 0,53 A n/a 7,113 s 6,432 s 7,888 s
A-N EF 1 IN>4 0,940 0,47 A n/a 8,123 s 7,296 s 9,079 s
A-N EF 1 IN>4 1,060 0,53 A n/a 7,113 s 6,432 s 7,888 s
A-N EF 2 IN>1 0,940 0,19 A n/a No trip 169,5 s No trip
A-N EF 2 IN>1 1,060 0,21 A n/a 120,1 s 44,74 s No trip
A-N EF 2 IN>2 0,940 0,19 A n/a No trip 169,5 s No trip
A-N EF 2 IN>2 1,060 0,21 A n/a 120,1 s 44,74 s No trip
A-N EF 2 IN>3 0,940 0,47 A n/a 8,123 s 7,296 s 9,079 s
A-N EF 2 IN>3 1,060 0,53 A n/a 7,113 s 6,432 s 7,888 s
A-N EF 2 IN>4 0,940 0,47 A n/a 8,123 s 7,296 s 9,079 s
A-N EF 2 IN>4 1,060 0,53 A n/a 7,113 s 6,432 s 7,888 s

Binary Inputs:
Trigger Logic: Or
Name Trigger State
Trip Side 1 1
Trip Side 2 X
Pickup X
.
Shot Test Results:
Type Relative To Factor Magnitude Angle tnom tact Overload Result
A-N EF 1 IN>1 0,940 0,19 A n/a No trip Not tested
A-N EF 1 IN>1 1,060 0,21 A n/a 120,1 s Not tested
A-N EF 1 IN>2 0,940 0,19 A n/a No trip -1,000 s Skipped
A-N EF 1 IN>2 1,060 0,21 A n/a 120,1 s -1,000 s Skipped
A-N EF 1 IN>3 0,940 0,47 A n/a 8,123 s -1,000 s Skipped
A-N EF 1 IN>3 1,060 0,53 A n/a 7,113 s -1,000 s Skipped
A-N EF 1 IN>4 0,940 0,47 A n/a 8,123 s -1,000 s Skipped
A-N EF 1 IN>4 1,060 0,53 A n/a 7,113 s -1,000 s Skipped
A-N EF 2 IN>1 0,940 0,19 A n/a No trip -1,000 s Skipped
A-N EF 2 IN>1 1,060 0,21 A n/a 120,1 s -1,000 s Skipped
A-N EF 2 IN>2 0,940 0,19 A n/a No trip -1,000 s Skipped
A-N EF 2 IN>2 1,060 0,21 A n/a 120,1 s -1,000 s Skipped
A-N EF 2 IN>3 0,940 0,47 A n/a 8,123 s -1,000 s Skipped
A-N EF 2 IN>3 1,060 0,53 A n/a 7,113 s -1,000 s Skipped
A-N EF 2 IN>4 0,940 0,47 A n/a 8,123 s -1,000 s Skipped
A-N EF 2 IN>4 1,060 0,53 A n/a 7,113 s -1,000 s Skipped

.
State:
0 out of 16 points tested.
0 points passed.
0 points failed.

General Assessment: No results available!

Earth Fault Protection Information


Instruction Text:
Attention! Change the hardware connections as shown in the following diagram!

User Input:

Test State: Idle

Hardware Configuration
.
Test Equipment
Type Serial Number
CMC256plus ??????
. .
Hardware Check
Performed At Result Details
Not yet performed

Earth Fault Pickup and Dropout Side 2 A-N:


Test Object - Overcurrent Parameters
.
General - Values:
TimeTolAbs: 0,05 s VT connection: At protected object
TimeTolRel: 5,00 % CT starpoint connection: To protected object
CurrentTolAbs: 0,00 Iref
CurrentTolRel: 5,00 %
Directional: No
.
Elements - Phase:
Active Name Tripping characteristic I Pick-up Time Reset Ratio Direction
No Overcurrent1 I>1 IEC S Inverse (TMS) 0,20 Iref 1,00 0,95 Non Directional
No Overcurrent1 I>2 DT 0,20 Iref 1,03 0,95 Non Directional
No Overcurrent1 I>3 DT 2,00 Iref 0,03 s 0,95 Non Directional
No Overcurrent1 I>4 DT 2,00 Iref 0,03 s 0,95 Non Directional
No Overcurrent2 I>1 IEC S Inverse (TMS) 0,20 Iref 1,00 0,95 Non Directional
No Overcurrent2 I>2 DT 0,20 Iref 1,03 0,95 Non Directional
No Overcurrent2 I>3 DT 2,00 Iref 0,03 s 0,95 Non Directional
No Overcurrent2 I>4 DT 2,00 Iref 0,03 s 0,95 Non Directional
.
Elements - Residual:
Active Name Tripping characteristic I Pick-up Time Reset Ratio Direction
No EF 1 IN>1 IEC S Inverse (TMS) 0,20 Iref 1,00 0,95 Non Directional
No EF 1 IN>2 DT 0,04 Iref 1,03 0,95 Non Directional
No EF 1 IN>3 DT 0,10 Iref 0,03 s 0,95 Non Directional
No EF 1 IN>4 DT 0,10 Iref 0,03 s 0,95 Non Directional
Yes EF 2 IN>1 IEC S Inverse (TMS) 0,04 Iref 1,00 0,95 Non Directional
No EF 2 IN>2 DT 0,04 Iref 1,03 0,95 Non Directional
No EF 2 IN>3 DT 0,10 Iref 0,03 s 0,95 Non Directional
No EF 2 IN>4 DT 0,10 Iref 0,03 s 0,95 Non Directional

. .
Test Module
Name: OMICRON Overcurrent Version: 3.00 SR 2
Test Start: Test End:
User Name: Manager:
Company:

Test Settings:
.
Fault Model:
Time reference: Fault inception
Load current: 0,00 A
Load angle: 0,00 °
Prefault time: 0,10 s
Abs. max time: 240,00 s
Post fault time: 0,50 s
Rel. max time: 100,00 %
Enable voltage output: No
Fault voltage LN (for all but two phase faults): 30,00 V
Fault voltage LL (for two phase faults): 51,96 V
Decaying DC active: No
Time constant: 0,05 s
CB char min time: 0,05 s
Thermal reset active: No
Thermal reset method: Manual
Thermal reset message: Please reset the Thermal Memory of the device under
test before continuing.

Binary Inputs:
Trigger Logic: And
Name Trigger State
Trip Side 1 X
Trip Side 2 X
Pickup 1
.
Pick-up / Drop-off Test:
Type Angle Resolution I Pick-up Reset Ratio
nom min max nom
A-N n/a 0,07 s 0,20 A 0,18 A 0,22 A 0,95
.
Pick-up / Drop-off Test Results:
Type Angle I Pick-up I Drop-off Reset Ratio Result
nom act act nom act Error
A-N n/a 0,20 A n/a n/a 0,95 n/a n/a Not tested
.
State:
0 out of 1 points tested.
0 points passed.
0 points failed.

General Assessment: No results available!

Earth Fault Trip Times Side 2 A-N:


Test Object - Overcurrent Parameters
.
General - Values:
TimeTolAbs: 0,05 s VT connection: At protected object
TimeTolRel: 5,00 % CT starpoint connection: To protected object
CurrentTolAbs: 0,02 Iref
CurrentTolRel: 5,00 %
Directional: No

.
Elements - Phase:
Active Name Tripping characteristic I Pick-up Time Reset Ratio Direction
No Overcurrent1 I>1 IEC S Inverse (TMS) 1,00 Iref 1,00 0,95 Non Directional
No Overcurrent1 I>2 DT 1,00 Iref 1,03 0,95 Non Directional
No Overcurrent1 I>3 DT 10,00 Iref 0,03 s 0,95 Non Directional
No Overcurrent1 I>4 DT 10,00 Iref 0,03 s 0,95 Non Directional
No Overcurrent2 I>1 IEC S Inverse (TMS) 1,00 Iref 1,00 0,95 Non Directional
No Overcurrent2 I>2 DT 1,00 Iref 1,03 0,95 Non Directional
No Overcurrent2 I>3 DT 10,00 Iref 0,03 s 0,95 Non Directional
No Overcurrent2 I>4 DT 10,00 Iref 0,03 s 0,95 Non Directional
.
Elements - Residual:
Active Name Tripping characteristic I Pick-up Time Reset Ratio Direction
No EF 1 IN>1 IEC S Inverse (TMS) 0,20 Iref 1,00 0,95 Non Directional
No EF 1 IN>2 DT 0,20 Iref 1,03 0,95 Non Directional
No EF 1 IN>3 DT 0,50 Iref 0,03 s 0,95 Non Directional
No EF 1 IN>4 DT 0,50 Iref 0,03 s 0,95 Non Directional
Yes EF 2 IN>1 IEC S Inverse (TMS) 0,20 Iref 1,00 0,95 Non Directional
No EF 2 IN>2 DT 0,20 Iref 1,03 0,95 Non Directional
No EF 2 IN>3 DT 0,50 Iref 0,03 s 0,95 Non Directional
No EF 2 IN>4 DT 0,50 Iref 0,03 s 0,95 Non Directional

. .
Test Module
Name: OMICRON Overcurrent Version: 3.00 SR 2
Test Start: Test End:
User Name: Manager:
Company:

Test Settings:
.
Fault Model:
Time reference: Fault inception
Load current: 0,00 A
Load angle: same as fault angle
Prefault time: 0,10 s
Abs. max time: 240,00 s
Post fault time: 0,50 s
Rel. max time: 100,00 %
Enable voltage output: No
Fault voltage LN (for all but two phase faults): 63,51 V
Fault voltage LL (for two phase faults): 110,00 V
Decaying DC active: No
Time constant: 0,05 s
CB char min time: 0,05 s
Thermal reset active: No
Thermal reset method: Manual
Thermal reset message: Please reset the Thermal Memory of the device under
test before continuing.
.
Shot Test:
Type Relative To Factor Magnitude Angle tnom tmin tmax
A-N EF 1 IN>1 0,940 0,19 A n/a No trip 169,5 s No trip
A-N EF 1 IN>1 1,060 0,21 A n/a 120,1 s 44,74 s No trip
A-N EF 1 IN>2 0,940 0,19 A n/a No trip 169,5 s No trip
A-N EF 1 IN>2 1,060 0,21 A n/a 120,1 s 44,74 s No trip
A-N EF 1 IN>3 0,940 0,47 A n/a 8,123 s 7,296 s 9,079 s
A-N EF 1 IN>3 1,060 0,53 A n/a 7,113 s 6,432 s 7,888 s
A-N EF 1 IN>4 0,940 0,47 A n/a 8,123 s 7,296 s 9,079 s
A-N EF 1 IN>4 1,060 0,53 A n/a 7,113 s 6,432 s 7,888 s
A-N EF 2 IN>1 0,940 0,19 A n/a No trip 169,5 s No trip
A-N EF 2 IN>1 1,060 0,21 A n/a 120,1 s 44,74 s No trip
A-N EF 2 IN>2 0,940 0,19 A n/a No trip 169,5 s No trip
A-N EF 2 IN>2 1,060 0,21 A n/a 120,1 s 44,74 s No trip
A-N EF 2 IN>3 0,940 0,47 A n/a 8,123 s 7,296 s 9,079 s
A-N EF 2 IN>3 1,060 0,53 A n/a 7,113 s 6,432 s 7,888 s
A-N EF 2 IN>4 0,940 0,47 A n/a 8,123 s 7,296 s 9,079 s
A-N EF 2 IN>4 1,060 0,53 A n/a 7,113 s 6,432 s 7,888 s

Binary Inputs:
Trigger Logic: Or
Name Trigger State
Trip Side 1 X
Trip Side 2 1
Pickup X
.
Shot Test Results:
Type Relative To Factor Magnitude Angle tnom tact Overload Result
A-N EF 1 IN>1 0,940 0,19 A n/a No trip -1,000 s Skipped
A-N EF 1 IN>1 1,060 0,21 A n/a 120,1 s -1,000 s Skipped
A-N EF 1 IN>2 0,940 0,19 A n/a No trip -1,000 s Skipped
A-N EF 1 IN>2 1,060 0,21 A n/a 120,1 s -1,000 s Skipped
A-N EF 1 IN>3 0,940 0,47 A n/a 8,123 s -1,000 s Skipped
A-N EF 1 IN>3 1,060 0,53 A n/a 7,113 s -1,000 s Skipped
A-N EF 1 IN>4 0,940 0,47 A n/a 8,123 s -1,000 s Skipped
A-N EF 1 IN>4 1,060 0,53 A n/a 7,113 s -1,000 s Skipped
A-N EF 2 IN>1 0,940 0,19 A n/a No trip Not tested
A-N EF 2 IN>1 1,060 0,21 A n/a 120,1 s Not tested
A-N EF 2 IN>2 0,940 0,19 A n/a No trip -1,000 s Skipped
A-N EF 2 IN>2 1,060 0,21 A n/a 120,1 s -1,000 s Skipped
A-N EF 2 IN>3 0,940 0,47 A n/a 8,123 s -1,000 s Skipped
A-N EF 2 IN>3 1,060 0,53 A n/a 7,113 s -1,000 s Skipped
A-N EF 2 IN>4 0,940 0,47 A n/a 8,123 s -1,000 s Skipped
A-N EF 2 IN>4 1,060 0,53 A n/a 7,113 s -1,000 s Skipped

.
State:
0 out of 16 points tested.
0 points passed.
0 points failed.

General Assessment: No results available!

Hardware Configuration
.
Test Equipment
Type Serial Number
CMC256plus ??????
. .
Hardware Check
Performed At Result Details
Not yet performed
CB Trip Time Test Information
Instruction Text:
Please ensure all protection functions unblocked!

Please wire the auxilary CB contacts to CMC's binary inputs 7 and 8.

Please make the circuit breaker trip possible.

User Input:

Test State: Idle

CB Trip Time:
.
Test Settings
State Pre fault Fault Post fault
IA Side 1 0,000 A 2,000 A 0,000 A
0,00 ° 0,00 ° 0,00 °
50,000 Hz 50,000 Hz 50,000 Hz
IB Side 1 0,000 A 2,000 A 0,000 A
-120,00 ° -120,00 ° -120,00 °
50,000 Hz 50,000 Hz 50,000 Hz
IC Side 1 0,000 A 2,000 A 0,000 A
120,00 ° 120,00 ° 120,00 °
50,000 Hz 50,000 Hz 50,000 Hz
IA Side 2 0,000 A 0,000 A 0,000 A
0,00 ° 0,00 ° 0,00 °
50,000 Hz 50,000 Hz 50,000 Hz
IB Side 2 0,000 A 0,000 A 0,000 A
-120,00 ° -120,00 ° -120,00 °
50,000 Hz 50,000 Hz 50,000 Hz
IC Side 2 0,000 A 0,000 A 0,000 A
120,00 ° 120,00 ° 120,00 °
50,000 Hz 50,000 Hz 50,000 Hz

. .
Test Module
Name: OMICRON State Sequencer Version: 2.10 SR 1
Test Start: Test End:
User Name: Manager:
Company:

Test Results
.
Time Assessment
Name Ignore Start Stop Tnom Tdev- Tdev+ Tact Tdev Assess
before
Trip Time Fault Trip Side 1 CB52a Side50,00 ms 2,500 ms 2,500 ms o
CB aux. 0>1 1 1>0
Side 1
Trip Time Fault Trip Side 2 CB52a Side50,00 ms 2,500 ms 2,500 ms o
CB aux. 0>1 2 1>0
Side 2
Assess: + .. Passed x .. Failed o .. Not assessed
.

.
Test State:
No results available!

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