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incident beam
diffracted beam
crystal
film
Detection of Diffracted X-rays by
Photographic film
X-ray 1
X-ray 2 Constructive
interference
AB+BC = multiples of n ƛ X-ray 2 occurs only
when
n ƛ = AB + BC
AB=BC
n ƛ = 2AB
Sin θ =AB/d
AB=d sin θ
n ƛ =2d sin θ
ƛ = 2 d hkl sin θ hkl
Planes in Crystals-2 dimension
Powders:
0.1μm < particle size < 40 μm
Peak broadening less diffraction occurring
X-ray
Detector
Tube
θ2
Sample stage
Production
Diffraction
Detection
Interpretation
Detection of Diffracted X-rays by a
Diffractometer
Peak position
Peak width
Peak intensity
Important for
Particle or Can also be fit with Gaussian,
Lerentzian, Gaussian-Lerentzian etc.
grain size
Residual strain
Effect of Lattice Strain on Diffraction
Peak Position and Width
No Strain
Uniform Strain
(d1-do)/do
Peak moves, no shape changes
Shifts to lower angles
Non-uniform Strain
D1 =/constant
Exceeds d0 on top, smaller than d0 on the Peak broadens
bottom
Applications of XRD
A synchrotron is a
particle
acceleration
device which,
through the use of
bending magnets,
causes a charged
particle beam to
travel in a circular
pattern.
Advantages of using synchrotron radiation
Specimen displacement
Instrument misalignment