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Flash-Erasable Reprogrammable
CMOS PAL® Device
Features • Up to 16 input terms and eight outputs
• 7.5 ns com’l version
• Active pull-up on data input pins 5 ns tCO
• Low power version (16V8L) 5 ns tS
— 55 mA max. commercial (10, 15, 25 ns) 7.5 ns tPD
125-MHz state machine
— 65 mA max. industrial (10, 15, 25 ns)
• 10 ns military/industrial versions
— 65 mA military (15 and 25 ns) 7 ns tCO
• Standard version has low power 10 ns tS
10 ns tPD
— 90 mA max. commercial (10, 15, 25 ns) 62-MHz state machine
— 115 mA max. commercial (7 ns) • High reliability
— 130 mA max. military/industrial (10, 15, 25 ns) — Proven Flash technology
• CMOS Flash technology for electrical erasability and — 100% programming and functional testing
reprogrammability
• PCI-compliant Functional Description
• User-programmable macrocell The Cypress PALCE16V8 is a CMOS Flash Electrical
— Output polarity control Erasable second-generation programmable array logic
— Individually selectable for registered or combina- device. It is implemented with the familiar sum-of-product
torial operation (AND-OR) logic structure and the programmable macrocell.
10 9 8 7 6 5 4 3 2 1
PROGRAMMABLE
AND ARRAY
(64 x 32)
8 8 8 8 8 8 8 8
11 12 13 14 15 16 17 18 19 20
OE/I9 I/O0 I/O1 I/O2 I/O3 I/O4 I/O5 I/O6 I/O7 VCC
Top View
I/O7
VCC
CLK/I0 1 20 VCC
I2
I1
I1 2 19 I/O7
I2 3 18 I/O6 3 2 1 20 19
I3 4 17 I/O5 I3 4 18 I/O6
I4 5 16 I/O4 I4 5 17 I/O5
6 I5 6 16 I/O4
I5 15 I/O3 I6 7 15 I/O3
I6 7 14 I/O2 I7 8 14 I/O2
I7 8 13 I/O1 9 10111213
I8 9 12 I/O0
10 11
GND
GND
I8
OE/I9
I/O0
I/O1
OE/I9
Cypress Semiconductor Corporation • 3901 North First Street • San Jose, CA 95134 • 408-943-2600
Document #: 38-03025 Rev. *A Revised April 22, 2004
USE ULTRA37000™ FOR
ALL NEW DESIGNS PALCE16V8
Selection Guide
tPD ns tS ns tCO ns ICC mA
Generic Part Number Com’l/Ind Mil Com’l/Ind Mil Com’l/Ind Mil Com’l Mil/Ind
PALCE16V8-5 5 3 4 115
PALCE16V8-7 7.5 7 5 115
PALCE16V8-10 10 10 10 10 7 10 90 130
PALCE16V8-15 15 15 12 12 10 10 90 130
PALCE16V8-25 25 25 15 20 12 12 90 130
PALCE16V8L-15 15 15 12 12 10 12 55 65
PALCE16V8L-25 25 25 15 20 12 20 55 65
Shaded areas contain preliminary information.
Configuration Table
CG0 CG1 CL0x Cell Configuration Devices Emulated
0 1 0 Registered Output Registered Med PALs
0 1 1 Combinatorial I/O Registered Med PALs
1 0 0 Combinatorial Output Small PALs
1 0 1 Input Small PALs
1 1 1 Combinatorial I/O 16L8 only
CL0x
CG1
1 1
0 X
I/Ox
D Q 1 0
VCC
CLK Q
CL1x 1 0
1 1
0 X From
Adjacent
CG1 for pin 13 to 18 CL0x Pin
CG0 for pin 12 and 19
Capacitance[7]
Parameter Description Test Conditions Typ. Unit
CIN Input Capacitance VIN = 2.0V @ f = 1 MHz 5 pF
COUT Output Capacitance VOUT = 2.0V @ f = 1 MHz 5 pF
Endurance Characteristics[7]
Parameter Description Test Conditions Min. Max. Unit
N Minimum Reprogramming Cycles Normal Programming Conditions 100 Cycles
Notes:
1. TA is the “instant on” case temperature.
2. See the last page of this specification for Group A subgroup testing information.
3. These are absolute values with respect to device ground. All overshoots due to system or tester noise are included.
4. VIL (Min.) is equal to –3.0V for pulse durations less than 20 ns.
5. The leakage current is due to the internal pull-up resistor on all pins.
6. Not more than one output should be tested at a time. Duration of the short circuit should not be more than one second. VOUT = 0.5V has been chosen to avoid test problems
caused by tester ground degradation.
7. Tested initially and after any design or process changes that may affect these parameters.
5V
S1
R1
OUTPUT TEST POINT
R2 CL
Commercial Military
Specification S1 CL R1 R2 R1 R2 Measured Output Value
tPD, tCO Closed 50 pF 200Ω 390Ω 390Ω 750Ω 1.5V
tPZX, tEA Z · H: Open 1.5V
Z · L: Closed
tPXZ, tER H · Z: Open 5 pF H · Z: VOH – 0.5V
L · Z: Closed L · Z: VOL + 0.5V
INPUTS, I/O,
REGISTERED
FEEDBACK
t WH t WL
tS tH
CP
t CO tP
tPXZ, tER [10] tEA, tPZX [10]
REGISTERED
OUTPUTS
t PD tPXZ, tER [10] tEA, tPZX[10]
COMBINATORIAL
OUTPUTS
CLOCK
tPR MAX = 1 µs t WL
00 MC7
32
64 CL1=2048
128
96
CL0=2120 19
160 PTD=2128
192
224 -2135
2
256 MC6
288
320 CL1=2049
352 18
384 CL0=2121
416 PTD=2136
448
480 -2143
3
512 MC5
544
576 CL1=2050
640
608
CL0=2122 17
672 PTD=2144
704
736 -2151
4
768 MC4
800
832 CL1=2051
896
864
CL0=2123 16
928 PTD=2152
960
992 -2159
5
1024 MC3
1056
1088 CL1=2052
1152
1120
CL0=2124 15
1184 PTD=2160
1216
1248 -2167
6
1280 MC2
1312
1344 CL1=2053
1408
1376
CL0=2125 14
14721440 PTD=2168
1504 -2175
7
1536
1568
MC1
1600 CL1=2054
1664
1632
CL0=2126 13
17281696 PTD=2176
1760 -2183
8
1792
1824
MC0
1856 CL1=2055
1920
1888
CL0=2127 12
19841952 PTD=2184
2016 -2191
9
10 0 3 4 7 8 11 12 15 16 19 20 23 24 27 28 31 11
USER ELECTRONIC SIGNATURE ROW
2056 2064 2072 2080 2088 2096 2104 2112 2119
GLOBAL ARCH BITS
BYTE 0 BYTE 1 BYTE 2 BYTE 3 BYTE 4 BYTE 5 BYTE 6 BYTE 7
CG0=2192
CG1=2193
Package Diagrams
20-Lead (300-Mil) CerDIP D6
MIL-STD-1835 D-8 Config. A
51-80029-**
51-85000-*A
51-80049-**
51-85011-*A
Ultra37000 is a trademark of Cypress Semiconductor Corporation. PAL is a registered trademark of Advanced Micro Devices,
Inc. All products and company names mentioned in this document may be the trademarks of their respective holders.