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DISTINCTIVE CHARACTERISTICS
◆ Pin and function compatible with all 20-pin PAL® devices
◆ Electrically erasable CMOS technology provides reconfigurable logic and full testability
◆ High-speed CMOS technology
— 5-ns propagation delay for “-5” version
— 7.5-ns propagation delay for “-7” version
◆ Direct plug-in replacement for the PAL16R8 series
◆ Outputs programmable as registered or combinatorial in any combination
◆ Peripheral Component Interconnect (PCI) compliant
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◆ Programmable output polarity
◆ Programmable enable/disable control
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◆ Preloadable output registers for testability
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◆ Automatic register reset on power up
◆ Cost-effective 20-pin plastic DIP, PLCC, and SOIC packages
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◆ Extensive third-party software and programmer support
◆ Fully tested for 100% programming and functional yields and high reliability
◆
ES IC
5-ns version utilizes a split leadframe for improved performance
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GENERAL DESCRIPTION
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The PALCE16V8 is an advanced PAL device built with low-power, high-speed, electrically-
erasable CMOS technology. It is functionally compatible with all 20-pin GAL devices. The
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macrocells provide a universal device architecture. The PALCE16V8 will directly replace the
PAL16R8, with the exception of the PAL16C1.
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The PALCE16V8Z provides zero standby power and high speed. At 30-µA maximum standby
current, the PALCE16V8Z allows battery-powered operation for an extended period.
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The PALCE16V8 utilizes the familiar sum-of-products (AND/OR) architecture that allows users to
implement complex logic functions easily and efficiently. Multiple levels of combinatorial logic
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can always be reduced to sum-of-products form, taking advantage of the very wide input gates
available in PAL devices. The equations are programmed into the device through floating-gate
cells in the AND logic array that can be erased electrically.
The fixed OR array allows up to eight data product terms per output for logic functions. The
sum of these products feeds the output macrocell. Each macrocell can be programmed as
registered or combinatorial with an active-high or active-low output. The output configuration
is determined by two global bits and one local bit controlling four multiplexers in each
macrocell.
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MACRO MACRO MACRO MACRO MACRO MACRO MACRO MACRO
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MC0 MC1 MC2 MC3 MC4 MC5 MC6 MC7
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ES IC
OE/I9 I/O0 I/O1
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I/O2 I/O3 I/O4 I/O5 I/O6 I/O7
16493E-1
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FUNCTIONAL DESCRIPTION
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The PALCE16V8 is a universal PAL device. The PALCE16V8Z is the zero-power version of the
PALCE16V8. It has all the architectural features of the PALCE16V8. In addition, the PALCE16V8Z
has zero standby power and an unused product term disable feature for reduced power
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consumption. It has eight independently configurable macrocells (MC0-MC7). Each macrocell can
be configured as registered output, combinatorial output, combinatorial I/O or dedicated input.
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The programming matrix implements a programmable AND logic array, which drives a fixed OR
logic array. Buffers for device inputs have complementary outputs to provide user-
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programmable input signal polarity. Pins 1 and 11 serve either as array inputs or as clock (CLK)
and output enable (OE), respectively, for all flip-flops.
Unused input pins should be tied directly to VCC or GND. Product terms with all bits
unprogrammed (disconnected) assume the logical HIGH state, and product terms with both true
and complement of any input signal connected assume a logical LOW state.
The programmable functions on the PALCE16V8 are automatically configured from the user’s
design specification. The design specification is processed by development software to verify
the design and create a programming file (JEDEC). This file, once downloaded to a programmer,
configures the device according to the user’s desired function.
The user is given two design options with the PALCE16V8. First, it can be programmed as a
standard PAL device from the PAL16R8 series. The PAL programmer manufacturer will supply
device codes for the standard PAL device architectures to be used with the PALCE16V8.
The programmer will program the PALCE16V8 in the corresponding architecture. This allows
the user to use existing standard PAL device JEDEC files without making any changes to them.
To
Adjacent
11 Macrocell
11 OE 10
00
0X VCC
01
10
SL0X
SG1
11
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0X
I/OX
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D Q 10
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SL1X CLK Q
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10
11
0X From
ES IC
Adjacent
*SG1 SL0X
Pin
*In macrocells MC0 and MC7, SG1 is replaced by SG0 on the feedback multiplexer.
CONFIGURATION OPTIONS
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Each macrocell can be configured as one of the following: registered output, combinatorial
output, combinatorial I/O, or dedicated input. In the registered output configuration, the output
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buffer is enabled by the OE pin. In the combinatorial configuration, the buffer is either controlled
by a product term or always enabled. In the dedicated input configuration, it is always disabled.
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With the exception of MC0 and MC7, a macrocell configured as a dedicated input derives the
input signal from an adjacent I/O. MC0 derives its input from pin 11 (OE) and MC7 from pin 1
(CLK).
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The macrocell configurations are controlled by the configuration control word. It contains 2
global bits (SG0 and SG1) and 16 local bits (SL00 through SL07 and SL10 through SL17). SG0
determines whether registers will be allowed. SG1 determines whether the PALCE16V8 will
emulate a PAL16R8 family or a PAL10H8 family device. Within each macrocell, SL0x, in
conjunction with SG1, selects the configuration of the macrocell, and SL1x sets the output as
either active low or active high for the individual macrocell.
The configuration bits work by acting as control inputs for the multiplexers in the macrocell.
There are four multiplexers: a product term input, an enable select, an output select, and a
feedback select multiplexer. SG1 and SL0x are the control signals for all four multiplexers. In
MC0 and MC7, SG0 replaces SG1 on the feedback multiplexer. This accommodates CLK being
the adjacent pin for MC7 and OE the adjacent pin for MC0.
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exception of pins 15 and 16. Pins 15 and 16 do not use feedback in this mode. Because CLK
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and OE are not used in a non-registered device, pins 1 and 11 are available as input signals. Pin
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1 will use the feedback path of MC7, and pin 11 will use the feedback path of MC0.
Combinatorial I/O in a Non-Registered Device
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The control bit settings are SG0 = 1, SG1 = 1, and SL0x = 1. Only seven product terms are
available to the OR gate. The eighth product term is used to enable the output buffer. The signal
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at the I/O pin is fed back to the AND array via the feedback multiplexer. This allows the pin to
be used as an input.
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Because CLK and OE are not used in a non-registered device, pins 1 and 11 are available as
inputs. Pin 1 will use the feedback path of MC7, and pin 11 will use the feedback path of MC0.
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The control bit settings are SG0 = 0, SG1 = 1 and SL0x = 1. Only seven product terms are available
to the OR gate. The eighth product term is used as the output enable. The feedback signal is the
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The control bit settings are SG0 = 1, SG1 = 0 and SL0x = 1. The output buffer is disabled. Except
for MC0 and MC7, the feedback signal is an adjacent I/O. For MC0 and MC7, the feedback signals
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are pins 1 and 11. These configurations are summarized in Table 1 and illustrated in Figure 2.
Table 1. Macrocell Configuration
Cell Devices Cell Devices
SG0 SG1 SL0X Configuration Emulated SG0 SG1 SL0X Configuration Emulated
PAL10H8, 12H6,
PAL16R8, 16R6, Combinatorial
0 1 0 Registered Output 1 0 0 14H4, 16H2, 10L8,
16R4 Output
12L6, 14L4, 16L2
PAL12H6, 14H4,
Combinatorial
0 1 1 PAL16R6, 16R4 1 0 1 Input 16H2, 12L6, 14L4,
I/O
16L2
Combinatorial
1 1 1 PAL16L8
I/O
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D Q D Q
CLK Q CLK Q
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a. Registered active low b. Registered active high
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VCC VCC
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SE
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Note 1 Note 1
Notes:
1. Feedback is not available on pins 15 and 16 in the Adjacent I/O pin
combinatorial output mode.
Note 2
2. This configuration is not available on pins 15 and 16.
g. Dedicated input
16493E-2
Figure 2. Macrocell Configurations
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Security Bit
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A security bit is provided on the PALCE16V8 as a deterrent to unauthorized copying of the array
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configuration patterns. Once programmed, this bit defeats readback and verification of the
programmed pattern by a device programmer, securing proprietary designs from competitors.
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The bit can only be erased in conjunction with the array during an erase cycle.
Electronic Signature Word
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An electronic signature word is provided in the PALCE16V8 device. It consists of 64 bits of
programmable memory that can contain user-defined data. The signature data is always available
The PALCE16V8 can be programmed on standard logic programmers. It also may be erased to
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reset a previously configured device back to its unprogrammed state. Erasure is automatically
performed by the programming hardware. No special erase operation is required.
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a direct means of verifying performance of all AC and DC parameters. In addition, this verifies
complete programmability and functionality of the device to provide the highest programming
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Further hints on minimizing power consumption can be found in a separate document entitled,
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Minimizing Power Consumption with Zero-Power PLDs.
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CLK/I 0 1
11 20 V
11 10 CC
VCC 00
0X 01
10
SL0 7
0 SG1
11
0X
19 I/O7
D Q 10
7 Q
SL1 7
10
I1 2 11
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0X
SG0 SL0 7
S O
11
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11 10
VCC 00
0X 01
10
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SL0 6
8 SG1
11
0X
18 I/O6
D Q 10
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15 Q
SL16
10
D V
11
I2 3 0X
SG1 SL0 6
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11
11 10
VCC 00
0X 01
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10
SL0 5
16 SG1
11
0X
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17 I/O5
D Q 10
23 Q
SL1 5
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10
11
I3 4 0X
SG1 SL0 5
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11
11 10
VCC 00
0X 01
10
SL0 4
24 SG1
11
0X
16 I/O4
D Q 10
31 Q
SL1 4
10
11
I4 5 0X
SG1 SL0 4
0 3 4 7 8 11 12 15 16 19 20 23 24 27 28 31 CLK OE
16493E-2
11
11 10
VCC 00
0X 01
10
SL0 3
32 SG1
11
0X
15 I/O 3
D Q 10
39 Q
SL1 3
10
11
I5 6 0X
SG1 SL0 3
11
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11 10
VCC 00
0X 01
10
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SL0 2
40 SG1
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11
0X
14 I/O 2
D Q 10
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47 Q
SL1 2
10
11
I6 7 0X
SG1 SL0 2
ES IC
11
D EV
11 10
VCC 00
0X 01
10
SL0 1
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48 SG1
11
0X
13 I/O1
D Q 10
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55 Q
SL1 1
10
11
I7 8 0X
G
SG1 SL0 1
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11
11 10
VCC 00
0X 01
10
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SL0 0
56 SG1
11
0X
12 I/O 0
D Q 10
63 Q
SL1 0
10
11
I8 9 0X
SG0 SL00
11 OE/I 9
0 3 4 7 8 11 12 15 16 19 20 23 24 27 28 31
GND 10
16493E-6
(concluded)
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Stresses above those listed under Absolute Maximum Ratings
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may cause permanent device failure. Functionality at or above
these limits is not implied. Exposure to Absolute Maximum Rat-
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ings for extended periods may affect device reliability. Pro-
gramming conditions may differ.
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DC CHARACTERISTICS OVER COMMERCIAL OPERATING RANGES
ES IC
Parameter
D EV
Symbol Parameter Description Test Description Min Max Unit
VOH Output HIGH Voltage IOH = -3.2 mA, VIN = VIH or VIL, VCC = Min 2.4 V
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VOL Output LOW Voltage IOL = 24 mA, VIN = VIH or VIL, VCC = Min 0.5 V
IIL Input LOW Leakage Current VIN = 0 V, VCC = Max (Note 2) –100 µA
ISC Output Short-Circuit Current VOUT = 0.5 V, VCC = Max (Note 3) –30 –150 mA
Notes:
1. These are absolute values with respect to device ground, and all overshoots due to system or tester noise are included.
2. I/O pin leakage is the worst case of IIL and IOZL (or IIH and IOZH).
3. Not more than one output should be shorted at a time, and the duration of the short-circuit should not exceed one second.
VOUT = 0.5 V has been chosen to avoid test problems caused by tester ground degradation.
PALCE16V8H-5/7 (Com’l) 11
CAPACITANCE1
Parameter
Symbol Parameter Description Test Conditions Typ Unit
CIN Input Capacitance VIN = 2.0 V VCC = 5.0 V, TA = 25 °C, 5 pF
Note:
1. These parameters are not 100% tested, but are evaluated at initial characterization and at any time the design is modified where
capacitance may be affected.
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-5 -7
Parameter
2 2
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Symbol Parameter Description Min Max Min Max Unit
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tS Setup Time from Input or Feedback to Clock 3 5 ns
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tH Hold Time 0 0 ns
ES IC
tSKEWR Skew Between Registered Outputs (Note 3) 1 1 ns
tWL
tWH
Clock Width
LOW
HIGH D EV 3
3
4
4
ns
ns
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External Feedback 1/(tS+tCO) 142.8 100 MHz
Maximum Frequency
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Notes:
1. See “Switching Test Circuit” for test conditions.
2. Output delay minimums for tPD, tCO, tPZX, tPXZ, tEA, and tER are defined under best case conditions. Future process improvements
may alter these values; therefore, minimum values are recommended for simulation purposes only.
3. Skew testing takes into account pattern and switching direction differences between outputs that have equal loading.
4. These parameters are not 100% tested, but are calculated at initial characterization and at any time the design is modified where
frequency may be affected.
5. tCF is a calculated value and is not guaranteed. tCF can be found using the following equation:
tCF = 1/fMAX (internal feedback) – tS.
12 PALCE16V8H-5/7 (Com’l)
ABSOLUTE MAXIMUM RATINGS OPERATING RANGES
Storage Temperature . . . . . . . . . . . . . .-65°C to +150°C Commercial (C) Devices
Ambient Temperature Ambient Temperature (TA)
with Power Applied . . . . . . . . . . . . . .-55°C to +125°C Operating in Free Air . . . . . . . . . . . . . . . 0°C to +75°C
Supply Voltage Supply Voltage (VCC)
with Respect to Ground . . . . . . . . . . -0.5 V to + 7.0 V with Respect to Ground . . . . . . . . . +4.75 V to +5.25 V
DC Input Voltage . . . . . . . . . . . -0.5 V to VCC + 0.5 V Industrial (I) Devices
DC Output or I/O
Temperature (TA) Operating
Pin Voltage . . . . . . . . . . . . . . . . . -0.5 V to VCC + 0.5 V
in Free Air . . . . . . . . . . . . . . . . . . . . . . -40°C to +85°C
Static Discharge Voltage . . . . . . . . . . . . . . . . . 2001 V
Supply Voltage (VCC)
Latchup Current (TA = -40°C to +85°C). . . . . . . 100 mA with Respect to Ground . . . . . . . . . . . +4.5 V to +5.5 V
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Stresses above those listed under Absolute Maximum Ratings Operating ranges define those limits between which the func-
S O
may cause permanent device failure. Functionality at or above tionality of the device is guaranteed.
these limits is not implied. Exposure to Absolute Maximum Rat-
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ings for extended periods may affect device reliability. Pro-
gramming conditions may differ.
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DC CHARACTERISTICS OVER COMMERCIAL AND INDUSTRIAL OPERATING
ES IC
RANGES
D EV
Parameter
Symbol Parameter Description Test Description Min Max Unit
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VOH Output HIGH Voltage IOH = –3.2 mA, VIN = VIH or VIL, VCC = Min 2.4 V
VOL Output LOW Voltage IOL = 24 mA, VIN = VIH or VIL, VCC = Min 0.5 V
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IIH Input HIGH Leakage Current VIN = 5.25 V, VCC = Max (Note 2) 10 µA
IIL Input LOW Leakage Current VIN = 0 V, VCC = Max (Note 2) –100 µA
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ISC Output Short-Circuit Current VOUT = 0.5 V, VCC = Max (Note 3) –30 –150 mA
Notes:
1. These are absolute values with respect to device ground, and all overshoots due to system or tester noise are included.
2. I/O pin leakage is the worst case of IIL and IOZL (or IIH and IOZH).
3. Not more than one output should be shorted at a time, and the duration of the short-circuit should not exceed one second.
VOUT = 0.5 V has been chosen to avoid test problems caused by tester ground degradation.
Note:
1. These parameters are not 100% tested, but are evaluated at initial characterization and at any time the design is modified where
capacitance may be affected.
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-10
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Parameter
Symbol Parameter Description Min 2 Max Unit
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tPD Input or Feedback to Combinatorial Output 3 10 ns
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tS Setup Time from Input or Feedback to Clock 7.5 ns
tH Hold Time 0 ns
ES IC
tCO Clock to Output 3 7.5 ns
tWL
tWH
Clock Width
LOW
HIGH D EV 6
6
ns
ns
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External Feedback 1/(tS+tCO) 66.7 MHz
Maximum Frequency
fMAX Internal Feedback (fCNT) 1/(tS+tCF) (Note 4) 71.4 MHz
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(Note 3)
No Feedback 1/(tWH+tWL) 83.3 MHz
Notes:
1. See “Switching Test Circuit” for test conditions.
2. Output delay minimums for tPD, tCO, tPZX, tPXZ, tEA, and tER are defined under best case conditions. Future process improvements
may alter these values; therefore, minimum values are recommended for simulation purposes only.
3. These parameters are not 100% tested, but are calculated at initial characterization and at any time the design is modified where
frequency may be affected.
4. tCF is a calculated value and is not guaranteed. tCF can be found using the following equation:
tCF = 1/fMAX (internal feedback) – tS.
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Stresses above those listed under Absolute Maximum Ratings
S O
may cause permanent device failure. Functionality at or above
these limits is not implied. Exposure to Absolute Maximum Rat-
N F
ings for extended periods may affect device reliability. Pro-
gramming conditions may differ.
IG ES
DC CHARACTERISTICS OVER COMMERCIAL OPERATING RANGES
ES IC
Parameter
D EV
Symbol Parameter Description Test Description Min Max Unit
VOH Output HIGH Voltage IOH = -3.2 mA, VIN = VIH or VIL, VCC = Min 2.4 V
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VOL Output LOW Voltage IOL = 24 mA, VIN = VIH or VIL, VCC = Min 0.5 V
IIL Input LOW Leakage Current VIN = 0 V, VCC = Max (Note 2) –100 µA
ISC Output Short-Circuit Current VOUT = 0.5 V, VCC = Max (Note 3) –30 –150 mA
Notes:
1. These are absolute values with respect to device ground, and all overshoots due to system or tester noise are included.
2. I/O pin leakage is the worst case of IIL and IOZL (or IIH and IOZH).
3. Not more than one output should be shorted at a time, and the duration of the short-circuit should not exceed one second.
VOUT = 0.5 V has been chosen to avoid test problems caused by tester ground degradation.
PALCE16V8Q-10 (Com’l) 15
CAPACITANCE1
Parameter
Symbol Parameter Description Test Conditions Typ Unit
Note:
1. These parameters are not 100% tested, but are evaluated at initial characterization and at any time the design is modified where
capacitance may be affected.
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Parameter
Symbol Parameter Description Min 2 Max Unit
S O
tPD Input or Feedback to Combinatorial Output 3 10 ns
N F
tS Setup Time from Input or Feedback to Clock 7.5 ns
IG ES
tH Hold Time 0 ns
ES IC
tWL LOW 6 ns
Clock Width
tWH
Maximum Frequency
HIGH
D EV
External Feedback 1/(tS+tCO)
6
66.7
ns
MHz
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fMAX Internal Feedback (fCNT) 1/(tS+tCF) (Note 4) 71.4 MHz
(Note 3)
No Feedback 1/(tWH+tWL) 83.3 MHz
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Notes:
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16 PALCE16V8Q-10 (Com’l)
ABSOLUTE MAXIMUM RATINGS OPERATING RANGES
Storage Temperature . . . . . . . . . . . . . .-65°C to +150°C Commercial (C) Devices
Ambient Temperature Ambient Temperature (TA)
with Power Applied . . . . . . . . . . . . . .-55°C to +125°C Operating in Free Air . . . . . . . . . . . . . . . 0°C to +75°C
Supply Voltage Supply Voltage (VCC)
with Respect to Ground . . . . . . . . . . -0.5 V to + 7.0 V with Respect to Ground . . . . . . . . . +4.75 V to +5.25 V
DC Input Voltage . . . . . . . . . . . -0.5 V to VCC + 0.5 V Industrial (I) Devices
DC Output or I/O
Temperature (TA) Operating
Pin Voltage . . . . . . . . . . . . . . . . . -0.5 V to VCC + 0.5 V
in Free Air . . . . . . . . . . . . . . . . . . . . . . -40°C to +85°C
Static Discharge Voltage . . . . . . . . . . . . . . . . . 2001 V
Supply Voltage (VCC)
Latchup Current (TA = -40°C to +85°C). . . . . . . 100 mA with Respect to Ground . . . . . . . . . . . +4.5 V to +5.5 V
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Stresses above those listed under Absolute Maximum Ratings Operating ranges define those limits between which the func-
S O
may cause permanent device failure. Functionality at or above tionality of the device is guaranteed.
these limits is not implied. Exposure to Absolute Maximum Rat-
N F
ings for extended periods may affect device reliability. Pro-
gramming conditions may differ.
IG ES
DC CHARACTERISTICS OVER COMMERCIAL AND INDUSTRIAL OPERATING
ES IC
RANGES
D EV
Parameter
Symbol Parameter Description Test Description Min Max Unit
EW D
VOH Output HIGH Voltage IOH = –3.2 mA, VIN = VIH or VIL, VCC = Min 2.4 V
VOL Output LOW Voltage IOL = 24 mA, VIN = VIH or VIL, VCC = Min 0.5 V
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IIH Input HIGH Leakage Current VIN = 5.25 V, VCC = Max (Note 2) 10 µA
IIL Input LOW Leakage Current VIN = 0 V, VCC = Max (Note 2) –100 µA
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ISC Output Short-Circuit Current VOUT = 0.5 V, VCC = Max (Note 3) –30 –150 mA
H 90
Commercial Supply Current mA
Outputs Open (IOUT = 0 mA) Q 55
ICC (Dynamic)
VCC = Max, f = 15 MHz H 130
Industrial Supply Current mA
Q 65
Notes:
1. These are absolute values with respect to device ground, and all overshoots due to system or tester noise are included.
2. I/O pin leakage is the worst case of IIL and IOZL (or IIH and IOZH).
3. Not more than one output should be shorted at a time, and the duration of the short-circuit should not exceed one second.
VOUT = 0.5 V has been chosen to avoid test problems caused by tester ground degradation.
Note:
1. These parameters are not 100% tested, but are evaluated at initial characterization and at any time the design is modified where
capacitance may be affected.
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-15 -20 -25
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Parameter
Symbol Parameter Description Min Max Min Max Min Max Unit
N F
tPD Input or Feedback to Combinatorial Output 15 20 25 ns
IG ES
tS Setup Time from Input or Feedback to Clock 12 13 15 ns
tH Hold Time 0 0 0 ns
ES IC
tCO Clock to Output 10 11 12 ns
tWL
tWH
Clock Width
LOW
HIGH D EV 8
8
10
10
12
12
ns
ns
EW D
External Feedback 1/(tS+tCO) 45.5 41.6 37 MHz
Maximum
Internal Feedback 1/(tS+tCF)
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Notes:
1. See “Switching Test Circuit” for test conditions.
2. These parameters are not 100% tested, but are calculated at initial characterization and at any time the design is modified where
frequency may be affected.
3. tCF is a calculated value and is not guaranteed. tCF can be found using the following equation:
tCF = 1/fMAX (internal feedback) – tS.
R
may cause permanent device failure. Functionality at or above
these limits is not implied. Exposure to Absolute Maximum Rat-
S O
ings for extended periods may affect device reliability. Pro-
N F
gramming conditions may differ.
IG ES
DC CHARACTERISTICS OVER INDUSTRIAL OPERATING RANGES
ES IC
Parameter
Symbol Parameter Description Test Description Min Max Unit
D EV
IOH = 6 mA 3.84 V
VOH Output HIGH Voltage VIN = VIH or VIL, VCC = Min
IOH = 20 µA VCC – 0.1 V V
IOL = 24 mA 0.5 V
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VOL Output LOW Voltage VIN = VIH or VIL, VCC = Min IOL = 6 mA 0.33 V
N AL
IOL = 20 µA 0.1 V
Guaranteed Input Logical HIGH
VIH Input HIGH Voltage 2.0 V
Voltage for all Inputs (Notes 1 and 2)
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IIH Input HIGH Leakage Current VIN = 5.25 V, VCC = Max (Note 3) 10 µA
IIL Input LOW Leakage Current VIN = 0 V, VCC = Max (Note 3) –10 µA
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Notes:
1. These are absolute values with respect to device ground, and all overshoots due to system or tester noise are included.
2. Represents the worst case of HC and HCT standards, allowing compatibility with either.
3. I/O pin leakage is the worst case of IIL and IOZL (or IIH and IOZH).
4. Not more than one output should be shorted at a time, and the duration of the short-circuit should not exceed one second.
VOUT = 0.5 V has been chosen to avoid test problems caused by tester ground degradation.
PALCE16V8Z-12 (Ind) 19
CAPACITANCE1
Parameter
Symbol Parameter Description Test Conditions Typ Unit
CIN Input Capacitance VIN = 2.0 V VCC = 5.0 V, TA = 25 °C, 5 pF
Note:
1. These parameters are not 100% tested, but are evaluated at initial characterization and at any time the design is modified where
capacitance may be affected.
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Parameter
Symbol Parameter Description Min Max Unit
S O
tPD Input or Feedback to Combinatorial Output (Note 2) 12 ns
N F
tS Setup Time from Input or Feedback to Clock 8 ns
IG ES
tH Hold Time 0 ns
ES IC
tWL LOW 5 ns
Clock Width
tWH
Maximum Frequency
HIGH
D EV
External Feedback 1/(tS+tCO)
5
62.5
ns
MHz
EW D
fMAX Internal Feedback (fCNT) 1/(tS+tCF) 77 MHz
(Notes 3 and 4)
No Feedback 1/(tWH+tWL) 100 MHz
N AL
Notes:
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20 PALCE16V8Z-12 (Ind)
ABSOLUTE MAXIMUM RATINGS OPERATING RANGES
Storage Temperature . . . . . . . . . . . . . .-65°C to +150°C Industrial (I) Devices
Ambient Temperature Ambient Temperature (TA)
with Power Applied . . . . . . . . . . . . . .-55°C to +125°C Operating in Free Air . . . . . . . . . . . . . . -40°C to +85°C
Supply Voltage Supply Voltage (VCC)
with Respect to Ground . . . . . . . . . . -0.5 V to + 7.0 V with Respect to Ground . . . . . . . . . . . +4.5 V to +5.5 V
DC Input Voltage . . . . . . . . . . . -0.5 V to VCC + 0.5 V Operating ranges define those limits between which the func-
DC Output or I/O Pin Voltage . . . -0.5 V to VCC + 0.5 V tionality of the device is guaranteed.
R
may cause permanent device failure. Functionality at or above
these limits is not implied. Exposure to Absolute Maximum Rat-
S O
ings for extended periods may affect device reliability. Pro-
N F
gramming conditions may differ.
IG ES
DC CHARACTERISTICS OVER INDUSTRIAL OPERATING RANGES
ES IC
Parameter
Symbol Parameter Description Test Description Min Max Unit
D EV
IOH = 6 mA 3.84 V
VOH Output HIGH Voltage VIN = VIH or VIL, VCC = Min
IOH = 20 µA VCC – 0.1 V V
IOL = 24 mA 0.5 V
EW D
VOL Output LOW Voltage VIN = VIH or VIL, VCC = Min IOL = 6 mA 0.33 V
N AL
IOL = 20 µA 0.1 V
Guaranteed Input Logical HIGH
VIH Input HIGH Voltage 2.0 V
Voltage for all Inputs (Notes 1 and 2)
G
IIH Input HIGH Leakage Current VIN = 5.25 V, VCC = Max (Note 3) 10 µA
IIL Input LOW Leakage Current VIN = 0 V, VCC = Max (Note 3) –10 µA
U
Notes:
1. These are absolute values with respect to device ground, and all overshoots due to system or tester noise are included.
2. Represents the worst case of HC and HCT standards, allowing compatibility with either.
3. I/O pin leakage is the worst case of IIL and IOZL (or IIH and IOZH).
4. Not more than one output should be shorted at a time, and the duration of the short-circuit should not exceed one second.
VOUT = 0.5 V has been chosen to avoid test problems caused by tester ground degradation.
PALCE16V8Z-15 (Ind) 21
CAPACITANCE1
Parameter
Symbol Parameter Description Test Conditions Typ Unit
Note:
1. These parameters are not 100% tested, but are evaluated at initial characterization and at any time the design is modified where
capacitance may be affected.
R
Parameter
Symbol Parameter Description Min 2 Max Unit
S O
tPD Input or Feedback to Combinatorial Output 15 ns
N F
tS Setup Time from Input or Feedback to Clock 10 ns
IG ES
tH Hold Time 0 ns
ES IC
tWL LOW 8 ns
Clock Width
tWH
Maximum
HIGH
D EV
External Feedback 1/(tS+tCO)
8
50
ns
MHz
EW D
fMAX Frequency (Notes 3 Internal Feedback (fCNT) 1/(tS+tCF) 58.8 MHz
and 4)
No Feedback 1/(tWH+tWL) 62.5 MHz
N AL
Notes:
U
22 PALCE16V8Z-15 (Ind)
ABSOLUTE MAXIMUM RATINGS OPERATING RANGES
Storage Temperature . . . . . . . . . . . . . .-65°C to +150°C Commercial (C) Devices
Ambient Temperature Ambient Temperature (TA)
with Power Applied . . . . . . . . . . . . . .-55°C to +125°C Operating in Free Air . . . . . . . . . . . . . . . 0°C to +75°C
Supply Voltage Supply Voltage (VCC)
with Respect to Ground . . . . . . . . . . -0.5 V to + 7.0 V with Respect to Ground . . . . . . . . . +4.75 V to +5.25 V
DC Input Voltage . . . . . . . . . . . -0.5 V to VCC + 0.5 V Industrial (I) Devices
DC Output or I/O Pin Voltage . . . -0.5 V to VCC + 0.5 V
Temperature (TA) Operating
Static Discharge Voltage . . . . . . . . . . . . . . . . . 2001 V in Free Air . . . . . . . . . . . . . . . . . . . . . . -40°C to +85°C
Latchup Current (TA = -40°C to +85°C). . . . . . . 100 mA Supply Voltage (VCC)
Stresses above those listed under Absolute Maximum Ratings with Respect to Ground . . . . . . . . . . . +4.5 V to +5.5 V
R
may cause permanent device failure. Functionality at or above Operating ranges define those limits between which the func-
these limits is not implied. Exposure to Absolute Maximum Rat-
S O
tionality of the device is guaranteed.
ings for extended periods may affect device reliability. Pro-
N F
gramming conditions may differ.
IG ES
DC CHARACTERISTICS OVER COMMERCIAL AND INDUSTRIAL OPERATING
RANGES
ES IC
Parameter
D EV
Symbol Parameter Description Test Description Min Max Unit
IOH = 6 mA 3.84 V
VOH Output HIGH Voltage VIN = VIH or VIL, VCC = Min
IOH = 20 µA VCC – 0.1 V V
EW D
IOL = 24 mA 0.5 V
N AL
VOL Output LOW Voltage VIN = VIH or VIL, VCC = Min IOL = 6 mA 0.33 V
IOL = 20 µA 0.1 V
G
IIL Input LOW Leakage Current VIN = 0 V, VCC = Max (Note 3) –10 µA
VOUT = 5.25 V, VCC = Max
IOZH Off-State Output Leakage Current HIGH 10 µA
VIN = VIH or VIL (Note 3)
VOUT = 0 V, VCC = Max
IOZL Off-State Output Leakage Current LOW –10 µA
VIN = VIH or VIL (Note 3)
ISC Output Short-Circuit Current VOUT = 0.5 V, VCC = Max (Note 4) –30 –150 mA
Supply Current (Static) Outputs Open (IOUT = 0 mA) f = 0 MHz 15 µA
ICC
Supply Current (Dynamic) VCC = Max f = 25 MHz 90 mA
Notes:
1. These are absolute values with respect to device ground, and all overshoots due to system or tester noise are included.
2. Represents the worst case of HC and HCT standards, allowing compatibility with either.
3. I/O pin leakage is the worst case of IIL and IOZL (or IIH and IOZH).
4. Not more than one output should be shorted at a time, and the duration of the short-circuit should not exceed one second.
VOUT = 0.5 V has been chosen to avoid test problems caused by tester ground degradation.
Note:
1. These parameters are not 100% tested, but are evaluated at initial characterization and at any time the design is modified where
capacitance may be affected.
R
-25
S O
Parameter
Symbol Parameter Description Min 2 Max Unit
N F
tPD Input or Feedback to Combinatorial Output (Note 3) 25 ns
IG ES
tS Setup Time from Input or Feedback to Clock 20 ns
tH Hold Time 0 ns
ES IC
tCO Clock to Output 10 ns
tWL
tWH
Clock Width
LOW
HIGH D EV 8
8
ns
ns
EW D
External Feedback 1/(tS+tCO) 33.3 MHz
Maximum
fMAX Frequency (Notes 4 Internal Feedback (fCNT) 1/(tS+tCF) 50 MHz
N AL
and 5)
No Feedback 1/(tWH+tWL) 50 MHz
Notes:
1. See “Switching Test Circuit” for test conditions.
2. This parameter is tested in standby mode.
3. This parameter is tested in Standby Mode. When the device is not in Standby Mode, the tPD will typically be 2 ns faster.
4. These parameters are not 100% tested, but are calculated at initial characterization and at any time the design is modified where
frequency may be affected.
5. tCF is a calculated value and is not guaranteed. tCF can be found using the following equation:
tCF = 1/fMAX (internal feedback) – tS.
Input or VT
Feedback
Input or
Feedback VT tS tH
tPD
VT
Combinatorial Clock tCO
VT
Output
Registered
16493E-3 VT
Output
16493E-5
R
a. Combinatorial output b. Registered output
S O
N F
Input VT
tWH
IG ES
tER tEA
ES IC
tWL
16493E-6
D EV
16493E-4
c. Clock width d. Input to output disable/enable
EW D
VT
N AL
OE
tPXZ tPZX
VOH – 0.5V
G
Output VT
VOL + 0.5V
SE
16493E-7
e. OE to output disable/enable
U
Notes:
1. VT = 1.5 V
2. Input pulse amplitude 0 V to 3.0 V.
3. Input rise and fall times 2 ns to 5 ns typical.
Must be Will be
Steady Steady
May Will be
Change Changing
from H to L from H to L
May Will be
Change Changing
from L to H from L to H
R
Don’t Care, Changing,
S O
Any Change State
Permitted Unknown
N F
IG ES
Does Not Center
Apply Line is High-
Impedance
“Off” State
ES IC
KS000010-PAL
S1
G
SE
R1
U
R2 CL
16493E-8
Commercial
Specification S1 CL R1 R2 Measured Output Value
tPD, tCO Closed 1.5 V
Z → H: Open 50 pF 390 Ω
tEA 1.5 V
Z → L: Closed 200 Ω
H → Z: Open H → Z: VOH – 0.5 V
tER 5 pF H-5: 200 Ω
L → Z: Closed L → Z: VOL + 0.5 V
150
125 16V8H-5
R
S O
100
N F
IG ES
16V8H-7
ICC (mA)
75
ES IC
16V8H-10
16V8H-15/25
50
D VE 16V8Z-12/15
EW D
16V8Q-10/15/25
N AL
16V8Z-25
25
G
SE
0
U
0 10 20 30 40 50
ROBUSTNESS FEATURES
PALCE16V8X-X/5 devices have some unique features that make them extremely robust,
R
especially when operating in high-speed design environments. Pull-up resistors on inputs and
S O
I/O pins cause unconnected pins to default to a known state. Input clamping circuitry limits
N F
negative overshoot, eliminating the possibility of false clocking caused by subsequent ringing.
A special noise filter makes the programming circuitry completely insensitive to any positive
IG ES
overshoot that has a pulse width of less than about 100 ns for the /5 versions. Selected /4 devices
are also being retrofitted with these robustness features.
ES IC
INPUT/OUTPUT EQUIVALENT SCHEMATICS FOR PALCE16V8
D EV VCC VCC
EW D
> 50 kΩ
N AL
G
SE
ESD Programming
Protection Pins Only Programming Positive Programming
and Voltage Overshoot Circuitry
Clamping Detection Filter
U
Typical Input
VCC VCC
> 50 kΩ
Provides ESD
Protection and
Clamping
Preload Feedback
Circuitry Input
16493E-10
Typical Output
VCC
R
Typical Input
S O
N F
VCC
IG ES
ES IC
Provides ESD 16493E-11
Protection and
D VE Clamping
Preload Feedback Input
Circuitry Input Transition
EW D
Detection
Typical Output
N AL
POWER-UP RESET
G
The PALCE16V8 has been designed with the capability to reset during system power-up.
Following power-up, all flip-flops will be reset to LOW. The output state will be HIGH
SE
independent of the logic polarity. This feature provides extra flexibility to the designer and is
especially valuable in simplifying state machine initialization. A timing diagram and parameter
U
table are shown below. Due to the synchronous operation of the power-up reset and the wide
range of ways VCC can rise to its steady state, two conditions are required to ensure a valid
power-up reset. These conditions are:
◆ The VCC rise must be monotonic.
◆ Following reset, the clock input must not be driven from LOW to HIGH until all applicable input
and feedback setup times are met.
Parameter Symbol Parameter Descriptions Min Max Unit
Power
tPR
Registered
Output
tS
Clock
tWL 16493E-12
R
S O
Figure 3. Power-Up Reset Waveform
N F
TYPICAL THERMAL CHARACTERISTICS
IG ES
Measured at 25°C ambient. These parameters are not tested.
Typ
ES IC
Parameter
Symbol Parameter Description PDID PLCC Unit
θjc
θja
D EV
Thermal impedance, junction to case
71
22
64
°C/W
°C/W
EW D
age surface. Tests indicate this measurement reference point is directly below the die-attach area on the bottom center of the package.
Furthermore, θjc tests on packages are performed in a constant-temperature bath, keeping the package surface at a constant tem-
perature. Therefore, the measurements can only be used in a similar environment.
CLK/I0
I/O7
VCC
CLK/I0 1 20 VCC
I1
I2
I1 2 19 I/O7
3 2 1 20 19
I2 3 18 I/O6
I3 4 17 I/O5
I3 4 18 I/O6
I4 5 16 I/O4
I4 5 17 I/O5
I5 6 15 I/O3
I5 6 16 I/O4
I6 7 14 I/O2
R
I7 8 13 I/O1 I6 7 15 I/O3
S O
I8 9 12 I/O0 I7 8 14 I/O2
N F
GND 10 11 OE/I9
9 10 11 12 13
IG ES
16493E-9
GND
OE/I9
I/O1
I8
I/O0
Note:
ES IC
Pin 1 is marked for orientation. 16493E-10
PIN DESIGNATIONS
D VE
EW D
CLK = Clock
N AL
GND = Ground
I = Input
G
I/O = Input/Output
OE = Output Enable
SE
PAL CE 16 V 8 H -5 J C /5
FAMILY TYPE
PAL = Programmable Array Logic
TECHNOLOGY PROGRAMMING DESIGNATOR
CE = CMOS Electrically Erasable Blank = Initial Algorithm
NUMBER OF /4 = First Revision
ARRAY INPUTS
R
/5 = Second Revision
OUTPUT TYPE (Same Algorithm as /4)
S O
V = Versatile
N F
NUMBER OF OUTPUTS
POWER OPERATING CONDITIONS
IG ES
H = Half Power (90–125 mA ICC) C = Commercial (0°C to +75°C)
Q = Quarter Power (55 mA ICC) I = Industrial (-40°C to +85°C)
Z = Zero Power (15 µA ICC Standby)
ES IC
PACKAGE TYPE
SPEED P = 20-Pin Plastic DIP (PD 020)
-5 = 5 ns tPD
D EV
J = 20-Pin Plastic Leaded Chip
-7 = 7.5 ns tPD Carrier (PL 020)
-10 = 10 ns tPD S = 20-Pin Plastic Gull-Wing
-12 = 12 ns tPD
EW D
Small Outline Package (SO 020)
-15 = 15 ns tPD
-20 = 20 ns tPD
N AL
-25 = 25 ns tPD
G
PALCE16V8Q-10 JC /5
PALCE16V8Q-15 PC, JC
PALCE16V8Q-20 PI, JI /4
PALCE16V8Z-12
PI, JI
PALCE16V8Z-15