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Available online 1 April 2011 The magnetic properties of low temperature MBE grown Ga0.90Mn0.10As1 − yPy films with 0 b y b 0.20 have
been studied as a function of the phosphorous content. The films are ferromagnetic for all phosphorous
Keywords: compositions. For y b 0.15 the conductivity type is metallic but above y N 0.15 it changes to impurity band
Ferromagnetism conduction (IBC). In the IBC regime the main magnetic properties are profoundly modified: the saturation
Semiconductor magnetization decreases from typically 50 emu/cm3 to 35 emu/cm3, the critical temperature drops sharply
Impurity band
from 130 K to 45 K and the uniaxial magnetic anisotropy spectroscopy is strongly reduced.
Ferromagnetic resonance
© 2011 Elsevier B.V. All rights reserved.
-1,0
2. Experimental results
-1,5
50 nm thick Ga1 − xMnxAs1 − yPy films have been grown by low -2,0
temperature molecular beam epitaxy (LTMBE) on (100) GaAs sub- -2,5
strates; the films have been annealed at 250 °C for 1 h, the optimal 0 50 100 150 200
Temperature (K)
conditions previously determined for obtaining the highest conductivity
Fig. 1. Resistivity versus temperature on a semi log scale for a series of LTMBE grown
⁎ Corresponding author. Ga1 − xMnxAs1 − yPy layers with different phosphorous contents (y) and a fixed Mn
E-mail address: jurgen.vonbardeleben@insp.jussieu.fr (H.J. von Bardeleben). content of x = 0.10.
0040-6090/$ – see front matter © 2011 Elsevier B.V. All rights reserved.
doi:10.1016/j.tsf.2011.03.075
M. Cubukcu et al. / Thin Solid Films 519 (2011) 8212–8214 8213
3,0
140 Metallic IBC
2,5
1,5
80
1,0
0,5 60
0,0 measured 40
fit
-0,5 x=0.10 y=0.18 20
-1,0 0
0,00 0,05 0,10 0,15 0,20 0,25 0 2 4 6 8 10 12 14 16 18 20
1/T (K-1) y (%)
Fig. 2. Resistivity (logarithmic scale) versus inverse of temperature. Fig. 4. Curie temperature as a function of phosphorous concentration.
hopping (VRH) model [5] which predicts a ρ(T) ~ exp(B/T1/4) variation, plane [001] easy axis. In the IBC regime k2⊥ decreases sharply to a
but follows an Arrhenius law ρ(T) ~ exp(ΔE/kBT) with an activation value of 20,000 erg/cm3 (Fig. 5).
energy of ΔE = 1.2 meV (Fig. 2). This variation of ρ(T) is characteristic
for the hopping conduction in an impurity band which is formed by the
MnGa acceptor dopants. 3. Discussion
A detailed report of the magnetic properties of these layers in the
metallic conduction regime has been given already before [6–8]. Here The phosphorous alloying of GaAs:Mn is expected to induce
we will concentrate on the change of these parameters when the different modifications of the lattice and electronic structure: a
conductivity regime changes from metallic to a thermally activated monotonous increase of the lattice parameter, an increase of the Mn
one. acceptor ionization energy and a change in the spin-orbit coupling
The saturation magnetization is changed in the IBC regime (Fig. 3). parameters; these variations are known from previous studies of
Whereas it is close to 50 emu/cm3 in the metallic regime, with a value GaAsP alloys[9]. Evidently it is the increased depth of the Mn acceptor
independent of the phosphorous concentration it drops to 35 emu/ level which induces the change in the conductivity regime. It
cm3 in the IBC regime. The critical temperature is equally modified in increases from 105 meV in GaAs to about 200 meV for y ≈ 0.15. As
this regime. It decreases abruptly from 130 K for y b 0.15, a value the conduction is thermally activated its temperature dependence
typical for annealed GaMnAs layers with a 10% Mn doping gives further insight in the conductivity process. Whereas in
concentration, to 45 K (Fig. 4). As the Mn concentration is kept structurally disordered materials variable range hopping (VRH) is
constant in this series it is clear that it is neither the alloy disorder dominant the Arrhenius type activation can be understood if hopping
associated with the phosphorous concentration nor a drastic change proceeds primarily between nearest cation sites which have a well
of the hole concentration but the conductivity regime which is at the defined distance. Such a process is in agreement with the Mn dopant
origin of the observed changes. Finally we have also analyzed the concentration of x = 0.10 which predicts for random distribution a
magnetic anisotropy of these layers. We had shown previously [7] low probability for isolated MnGa acceptors as compared to nearest
that in the metallic regime the uniaxial anisotropy constant k2⊥ is neighbor pairs MnGa–MnGa.
dominant and changes monotonously and linearly with the phos- Unfortunately, theoretical predictions of Tc, Msat and anisotropy
phorous concentration from −100,000 erg/cm3 for y = 0 to 0 for constants in the IBC regime are not yet available. It is the objective of
y = 0.06 and to 100,000 erg/cm3 for y = 0.10. The variation of k2⊥ can this work to encourage such modeling. Finally it is interesting to
be directly related to the uniaxial out-of-plane strain which varies compare our results with those obtained for Ga1 − xMnxAs1 − yPy thin
with the lattice constants modified by the phosphorous content. Thus films obtained by a different growth technique: direct (Mn and P) ion
for y b 0.06 the epitaxial layers on (100) GaAs are under compressive implantation in GaAs followed by pulsed laser annealing (IIPLA) [10].
strain whereas for y N 0.06 they are under tensile strain with an out-of
Metallic IBC
Saturation magnetization (emu/cm3)
50 50000
K2⊥ (erg/cm3)
40
0
30
-50000
20
10 -100000
0 2 4 6 8 10 12 14 16 18 20
0
0 2 4 6 8 10 12 14 16 18 20 y (%)
y (%)
Fig. 5. Uniaxial anisotropy constant k2⊥ at T = 4 K as a function of phosphorous
Fig. 3. Saturation magnetization as a function of phosphorous concentration. concentration.
8214 M. Cubukcu et al. / Thin Solid Films 519 (2011) 8212–8214