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Thin Solid Films 345 (1999) 229±235

W- and F-doped VO2 ®lms studied by photoelectron spectrometry


W. Burkhardt, T. Christmann, B.K. Meyer, W. Niessner, D. Schalch, A. Scharmann*
I. Physikalisches Institut, Justus-Liebig-UniversitaÈt Giessen, Heinrich-Buff-Ring 16, D 35392Giessen, Germany
Received 27 April 1998; accepted 4 September 1998

Abstract
Thermochromic tungsten- and ¯uorine-doped vanadium dioxide ®lms, which are in discussion as intelligent window coatings, were
deposited by reactive sputtering. Results of optical measurements and photoelectron spectrometry (XPS, UPS) at low doping levels (#2.6%)
are presented, and together with structural properties they can be well correlated. By applying antire¯ective coatings the transmittance of
®lms in the visible spectral range may be enhanced to more than 60% with fairly good switching characteristics at room temperature in the
case of tungsten doping. q 1999 Published by Elsevier Science Ltd. All rights reserved.
Keywords: Optical coatings; Photoelectron spectrometry; Vanadium dioxide

1. Introduction dk band is split into an empty and a ®lled one. Goodenough's


description of the MIT in VO2 agrees qualitatively well with
Over the last decade thermochromic vanadium dioxide experiments. Though further theoretical work has been
has been discussed as an intelligent window coating by undertaken considering electron±electron correlation, elec-
which the solar energy transmission may be controlled tron±phonon interaction or a combination of both effects,
passively. Vanadium dioxide is a thermochromic compound the metal±insulator transition in vanadium dioxide is not
showing a reversible metal±semiconductor phase transition understood in detail up to now.
at a temperature Tt ˆ 341 K in single crystals. Above Tt it Since Granqvist [2] proposed thermochromic VO2 ®lms
has a tetragonal rutile (TiO2) structure and exhibits metallic as `intelligent' window coatings, many experimental efforts
properties, below Tt it is a narrow gap (0.7 eV) semiconduc- have been undertaken to deposit suitable ®lms, e.g. by reac-
tor with a monoclinic structure. Thin VO2 ®lms are poly- tive r.f., DC, and magnetron sputtering, reactive thermal and
crystalline and the phase transition is smeared out over a electron beam evaporation, CVD techniques, oxidation of
more or less broad temperature interval, the broadness of deposited metal ®lms, and sol-gel techniques. So far, all
which depends on the size of the crystallites. these investigations did not result in coatings which suf®-
The ®rst theoretical description of the switching charac- ciently accomplish the demands for economical application,
teristics of VO2 was given by Goodenough [1] in terms of e.g. high transmittance in the visible spectral range both
the so-called metal±insulator transition (MIT), applying below and above the phase transition, good switching char-
crystal ®eld and molecular orbital theory. In the rutile- acteristics in the near infrared, and a Tt near room tempera-
type high-temperature phase the V 41 ion with one 3d elec- ture.
tron is in the centre of an oxygen octahedron. The lattice In former experiments [3,4] we had applied photoelectron
structure is characterized by chains of equidistant vanadium spectrometry and electron energy loss spectrometry on
ions. The p * and dk bands resulting from the t2g levels of the undoped VO2 ®lms, in addition to optical, structural, and
VO2 octahedra overlap at the Fermi level, thus being respon- electrical measurements so far reported in literature, in order
sible for the metallic properties above Tt. In the semicon- to get a deeper understanding of the material. Concerning
ducting state V±V pairing and off-axis displacement occurs transmittance and switching characteristics the results were
along the vanadium chains resulting in a monoclinic struc- promising. If antire¯ection coatings (SiOxNy, refractive
ture. The V±O hybridization is changed, the V±V bonding is index n < 1:65) are used, the transmittance in the visible
stronger, and the p * band rises above the Fermi level. The is increased to $60%. But it is not possible to deposit
undoped ®lms with a transition temperature range lower
than about 320 K.
* Corresponding author. Tel.: 1 49-641-993-3110; fax: 1 49-641-993-
3139. It is well-known from literature [2,5±7] that doping of

0040-6090/99/$ - see front matter q 1999 Published by Elsevier Science Ltd. All rights reserved.
PII: S 0040-609 0(98)01406-0
230 W. Burkhardt et al. / Thin Solid Films 345 (1999) 229±235

VO2 ®lms with e.g. W, Mo, Nb, and also F results in transi-
tion temperature lowering, but simultaneously there is a
decrease of transmittance in the visible range especially at
the band edge. It was the aim of this work to investigate
tungsten- and ¯uorine-doped ®lms not only by optical and
electrical measurements as done by the authors above, but
also by photoelectron spectrometry, in order to correlate
density of states (DOS) changes especially in the VO2
valence band regime with results of the classical methods
(DOS in quotation marks means that we will neglect possi-
ble contributions of ®nal states to the low-energy photoelec-
tron intensities in the following).

2. Experimental

The ®lms were deposited by reactive r.f. sputtering from a


vanadium target in an argon/oxygen atmosphere. Previous
to ®lm deposition the sputter chamber was evacuated to
about 10 25 Pa using a turbomolecular pump together with
a liquid nitrogen trap. (110) silicon disks and quartz glasses
were used as substrates. Argon and oxygen had typical puri-
ties of 99.999%, the vanadium target had a purity of 99.98%
containing about 250 ppm, mainly Al, Nb, Si, and Ta as
impurities. For tungsten doping a varying number of
small, 99.95% pure tungsten rods were screwed asymmetri-
cally into the vanadium target in order to deposit ®lms with
different W concentrations within one run. Fluorine doping
Fig. 1. Optical transmittance of undoped and tungsten-doped VO2 ®lms.
was performed by adding ¯uoromethane at different partial
Deposition temperature of ®lms <800 K, thicknesses 120 nm (undoped,
pressures to the argon/oxygen sputter ambient. The ®lms 0.7% and 2.6% W) and 80 nm (1.8% W), respectively.
were deposited at substrate temperatures between <400
and <800 K. Typical sputter parameters were as follows:
the infrared become poorer with increased tungsten content
total sputter gas pressure 10 21 Pa, oxygen to argon ratio
(Fig. 1, 2.6% W). But in contrast to literature data (e.g. Ref.
0.16, r.f. power 300 W, deposition rate 2.5±4 nm/min.
[7]) the transmittance in the visible range does not change
Film thicknesses were typically 80 to 120 nm.
signi®cantly. This may be due to different deposition proce-
Photoelectron spectrometry was performed using VG
dures. The ¯uorine-doped ®lms exhibit a similar behaviour
Instruments equipment applying the Mg Ka line at 1253.6
to the tungsten-doped ones, as far as the ¯uorine doping
eV and the He I line at 21.21 eV for XPS and UPS, respec-
level is below about 1% (see below). One feature is worth
tively. The electron energy analyser was a CLAM- type
mentioning: ¯uorine-doped samples switch only above
hemispherical one. The mu metal analysis chamber was
wavelengths of about 1000 nm, whereas the tungsten-
equipped with an ion pump and a liquid nitrogen-cooled
doped samples switch already at lower wavelength, i.e.
sublimation pump, thus enabling a residual gas pressure of
they are more effective. This may be due to the fact that
less than 10 28 Pa.
¯uorine built into the ®lms was not possible at temperatures
above <600 K. It is well-known from doped and undoped
3. Results and discussion ®lms that low-temperature deposition results in smaller
sizes of VO2 crystallites and also in poorer switching char-
3.1. Optical properties acteristics (e.g. Ref. [3]).
Also presented in Fig. 1 are results of preliminary tests
We provide here a short summary of our studies on opti- with an antire¯ective coating of 60 nm silicon oxinitride
cal transmittance of deposited ®lms. In Fig. 1 some repre- (n < 1:65) sputtered onto a 80 nm tungsten-doped (1.8%)
sentative examples of transmittance measurements on ®lm. In the visible there is an enhancement of transmit-
undoped and tungsten-doped ®lms in the metallic and in tance to about 65%, one third due to the reduction of ®lm
the semiconducting phase are presented. The undoped and thickness and two thirds due to the antire¯ective coating.
the three tungsten-doped ®lms were deposited under the The maximum of transmittance is close to the maximum of
same conditions (deposition temperature <800 K, thickness the solar spectrum. Obviously the switching property of the
80±120 nm). It is observed that switching characteristics in coated ®lm has suffered from sputtering the second ®lm. It
W. Burkhardt et al. / Thin Solid Films 345 (1999) 229±235 231

not change signi®cantly. Therefore it may be assumed that


the effect of tungsten built-in on vanadium sites in the lattice
is another than the reduction of switching ef®ciency in
undoped ®lms due to smaller crystallite sizes (e.g. Ref. [3]).
Concerning ¯uorine doping, similar hysteresis loops are
observed at lower concentrations. At higher concentrations
the temperature interval of switching is broadened appreci-
ably, possibly due to the growth of smaller crystallites at the
reduced deposition temperatures (<600 K). From a practi-
cal point of view this means that the ¯uorine- doped ®lms
are not well-suited for window coating.

3.2. Photoelectron spectrometry

3.2.1. Tungsten-doped ®lms


Fig. 3a shows representative XPS spectra recorded from
undoped and doped VO2 ®lms in the V3p band range. The
tungsten concentrations in the ®lms were determined by
deconvolution of e.g. the spectra 2 to 4, and measuring
the W4f7/2 peak areas. Other tungsten-related peaks in the
spectra are too small and not well-suited for quantitative
evaluation. For calibration purposes some Rutherford back-
scattering (RBS) measurements were performed, especially
at 2.6% tungsten content in the ®lms where the W4f5/2 and
the W4f7/2 peaks can be well resolved by deconvolution.
There is considerable agreement with XPS sensitivity
factors for tungsten and vanadium [8].
Fig. 2. Hysteresis loops of optical switching recorded from undoped and The dependence of the phase transition temperature on
tungsten- and ¯uorine-doped ®lms. Undoped and tungsten-doped ®lms: the tungsten concentration is linear (Fig. 3b), in agreement
deposition temperature <800 K, thickness 120 nm; ¯uorine-doped ®lms:
deposition temperature <600 K, thickness 80 nm.
with literature data (e.g. Refs. [5,7]). The transition
temperature in the ®gure is taken from optical measure-
ments on the same samples. The transition temperature
is proposed that a softer technique should be applied for lowering is <20 K/1% W. From Fig. 3b it can be concluded
antire¯ective coating, e.g. a sol-gel technique, by which that with tungsten doping at a level of about 2%, the transi-
ion bombardment-induced damage and/or diffusion into tion temperature range (about 290 K) is suitable for window
the VO2 ®lm is avoided. The assumption of bombard- coating.
ment-induced damage in the ®lms is supported by the Films which were deposited at temperatures lower than
observation, that switching disappears upon Ar sputtering <800 K show a very similar concentration-dependent tran-
of ®lms for surface cleaning previous to photoelectron sition temperature shift. The tungsten built into the ®lms is
spectrometry. enhanced if the deposition temperature is lowered (Fig. 4).
We are sure that further improvement of the ®lm char- At a deposition temperature of <400 K the tungsten concen-
acteristics are possible if the VO2 ®lm thickness and in tration in the ®lms is about 20% higher than in ®lms sput-
particular the AR coating to ®lm thickness ratio is opti- tered at <800 K, presumably due to a temperature-
mized. dependent nucleation process in VO2:W ®lms. But the 400
In Fig. 2, transmittance hysteresis loops recorded at a K ®lms, both doped and undoped, have minor transmittance
®xed wavelength of 2000 nm are shown for some represen- and switching properties because of smaller crystallite sizes
tative ®lms. The hysteresis loop of the undoped ®lm is rela- [3].
tively steep but not as steep as experienced from VO2 single Fig. 5 shows XPS valence band spectra of representative
crystals. This is believed to be due to the polycrystalline VO2 ®lms containing different amounts of tungsten,
structure of ®lms. Note that if the notion `transition tempera- recorded below and above the transition temperature
ture' is used in the following, the centre of the hysteresis range. Energy shifts due to different tungsten concentrations
loop is denoted for convenience. As the concentration of are very small or even zero, and a de®nite tendency cannot
tungsten in the ®lms is enhanced (Fig. 2, 2.6%), the hyster- be stated, although each spectrum presented in the ®gure is
esis loops become more narrow, the hysteresis loop widths the result of 100 single scans. Note that the energy resolu-
are markedly decreased, and also the switching ef®ciency is tion of our analyser is about 0.1 eV. This is in the same order
decreased. But the temperature interval of switching does of magnitude as the observed small shifts upon successively
232 W. Burkhardt et al. / Thin Solid Films 345 (1999) 229±235

Fig. 4. XPS peak area of the W4f7/2 band versus deposition temperature of
®lms, measured at temperatures below (250 K) and above (370 K) the phase
transition; ®lm thicknesses 120 nm.

of homopolar V 41±V 41 bonding destabilizes the semicon-


ducting phase and lowers the metal±semiconductor transi-
tion temperature [9,10]. Both groups of authors have
described the doping effect of tungsten [9] and niobium
[10] in VO2 in terms of a local model in which coupled
pairs of ions have de®nite valences and form local paramag-
netic moments. Nevertheless, the phase transition is a
collective phenomenon, the doped VO2 is believed to
consist of weakly interacting magnetic regions in the case
Fig. 3. (a) XPS spectra in the V3p and W4f bands range at different
of tungsten doping [9].
tungsten concentrations recorded in the metallic phase; deposition tempera-
ture of ®lms <800 K, ®lm thicknesses 120 nm. (b) Phase transition It is of course uncertain whether this model is appropriate
temperature versus tungsten concentration in the ®lms. for the low doping levels in our polycrystalline ®lms
(#2.6%), where only very small or even zero energy shifts
in the `DOS'are observed (Fig. 5). In the investigations
enhanced concentrations in this energy range. Therefore we
do not like to overinterpret small energy shifts and peak
heights differences in terms of tungsten concentrations. At
least it can be stated from the photoelectron spectra that
tungsten doping at levels #2.6% does not result in addi-
tional lattice distortion as large as in the case of ¯uorine
doping (see below).
On the other hand, a marked energy shift of the V3d band
is evident in comparing the semiconducting and the metallic
phase. The enhanced `DOS' at the Fermi level is responsible
for the metallic properties of the ®lms above the transition
temperature. But there is nearly zero in¯uence of doping in
the vicinity of the Fermi level. Our corresponding UPS
results are very similar to the XPS results presented above.
From studies of the temperature-dependent magnetiza-
tion in tungsten-doped ®lms, Tang et al. [9] have concluded
that each tungsten ion in the VO2 lattice breaks up a V 41±
V 41 homopolar bond. For charge compensation, two W 3d Fig. 5. XPS spectra in the V3d and O2p bands range at different tungsten
electrons are transferred to a nearest neighbour vanadium concentrations below (250 K) and above (370 K) the phase transition;
ion, thus forming a V 31±W 61and a V 31±V 41pair. The loss deposition temperature of ®lms <800 K, ®lm thicknesses 120 nm.
W. Burkhardt et al. / Thin Solid Films 345 (1999) 229±235 233

the tetragonal metallic phase above Tt (see Fig. 2), respec-


tively. This may also be responsible for the narrow widths of
the hysteresis loops at larger tungsten concentrations (Fig.
2). We believe that the second XRD peak at 2Q ˆ 298
originates from the tetragonal metallic phase and the shifted
peak at 2Q ˆ 288¼27:58 is due to remaining monoclinic
regions in the ®lms, which are slightly distorted by tungsten
built-in. In fact it has been assumed from UPS data of
undoped ®lms that the phase transition and the lattice trans-
formation, respectively, in VO2 is incomplete in polycrys-
talline and even in single crystalline material [3,11].
Presumably, these remaining monoclinic regions are micro-
crystalline grains which exhibit a different or even no
switching behaviour. We do not believe that both phases
coexist in single grains. The model of weakly interacting
paramagnetic domains as discussed above would not allow
such a coexistence of phases in small well switching grains
in polycrystalline ®lms.

3.2.2. Fluorine-doped ®lms


In Fig. 6a, representative XPS spectra recorded from
doped VO2 ®lms in the F1s band range at different doping
levels are shown. The ¯uorine concentrations were again
determined by measuring the peak areas, which were
normalized with respect to the well measurable oxygen
concentrations in order to have consistent values. The
results presented in Fig. 6b are poorer than those achieved
with tungsten (Fig. 3b). It is evident from Fig. 3 that the XPS
Fig. 6. (a) XPS spectra from ¯uorine-doped VO2 ®lms in the F1s band
range at different F concentrations recorded in the semiconducting phase.
intensities are small at low concentrations, and the back-
Deposition temperature of ®lms <600 K, ®lm thicknesses 80 nm. (b) Phase ground noise is relatively large, though each spectrum
transition temperature versus ¯uorine concentration in the ®lms. represents the sum of 100 single scans. The F1s UPS
peaks are more or less asymmetric and consist of two
components if deconvoluted. It is unknown whether both
mentioned above [9,10], the doping levels considered are 5± correspondent ¯uorine sites in the lattice are active with
33% (W) and 2±5% (Nb). If the model holds even for poly- regard to the switching mechanism. RBS calibrations were
crystalline ®lms, the magnetic interaction should be limited not possible because of zero signal intensities at ¯uorine
to the single grains. It is not believed that the interaction can backscattering energies.
surmount grain boundaries because of its weakness. Then, a Furthermore, after a series of measurements we learned
broadening of the phase transition temperature interval may that there was a memory effect due to absorbed ¯uorine at
be expected due to varying crystallite size in a ®lm, which the preparation chamber walls. Obviously, there were
should not mixed-up with severe lattice distortions as uncontrolled temperature-induced desorptions of ¯uorine
observed, e.g., in ¯uorine-doped ®lms. during some deposition runs. Nevertheless, there is an
Energy shifts in photoelectron spectra may be larger at approximate linear relation between ¯uorine concentration
enhanced dopant concentrations, but we have not studied and optically determined phase transition temperature (Fig.
®lms with larger doping levels, since the decrease of the 6b). The straight line is calculated from measured values by
phase transition temperature at about 2% tungsten is suf®- linear regression. Extrapolation to zero ¯uorine content
cient for window coating. results in a corresponding temperature of about 340 K,
XRD records from our undoped polycrystalline ®lms which is in good agreement with the transition temperature
which exhibit only one sharp re¯ex at 2Q ù 288, of undoped VO2 ®lms. It is evident from Fig. 6b that switch-
FWHM ù 0.28 (for ®lms deposited at <800 K), were ing in the room temperature range is achieved at about 1%
reported in Ref. [3]. As the tungsten content of ®lms is ¯uorine in the ®lms. A ®gure like Fig. 4 for tungsten cannot
increased, this re¯ex becomes successively narrower and be given since ¯uorine is hardly built-in in the ®lms at
shifts to about 27.58 (at 2.6% W), and a second well sepa- deposition temperatures above <600 K. So all ¯uorine-
rated peak appears at 2Q ˆ 298. Since XRD was performed doped ®lms were sputtered at <600 K.
at room temperature, the ®lms containing 1.8% and 2.6% In Fig. 7, UPS spectra of ¯uorine-doped ®lms recorded at
tungsten are measured in the phase transition regime and in temperatures below and above the correspondent transition
234 W. Burkhardt et al. / Thin Solid Films 345 (1999) 229±235

tail versus the Fermi level. This correlates well with results
of our optical transmittance measurements. These ®lms
exhibit no optical switching in the studied temperature
range, they have metallic properties independent of
temperature.
In XRD records of our ¯uorine-doped ®lms, no typical
peaks are observed as in pure or in tungsten-doped ®lms if
the ¯uorine concentration is larger than 0.7%. This is again
consistent with the results of optical and photoelectron spec-
trometry. The microcrystalline structure of those ®lms is
poor, and therefore the optical switching characteristics
are poor, too, and the `DOS' distribution is smeared out.
Presumably, the difference of oxygen and ¯uorine ionic
radii prevents the built-in of ¯uorine on oxygen sites in
the VO2 lattice to a larger amount without severe deteriora-
tion of VO2 structure.
We have also deposited a number of tungsten- and ¯uor-
ine-codoped ®lms. With ¯uorine contents in excess of 0.7%,
the ®lms exhibit the same poor properties independent of
their tungsten contents.

4. Summary and conclusions

(1) From a practical point of view, tungsten-doped VO2


®lms exhibit promising characteristics with regard to optical
transmittance and switching properties. At a tungsten
doping level of about 2% the reversible phase transition
occurs in the room temperature regime, well-suited for
window coating. Application of antire¯ective coating
Fig. 7. UPS spectra recorded from ¯uorine-doped VO2 ®lms in the valence enhances the transmittance in the visible spectral range to
bands range at different F concentrations; deposition temperature of ®lms more than 60%. Fluorine-doped ®lms are not suited for
< 600 K, ®lm thicknesses 80 nm. (a) Metallic phase; (b) semiconducting window coating because of their poor switching behaviour
phase.
at room temperature due to the strong distortion of the VO2
host lattice. Concerning economical application, we are sure
that further improvements of the ®lm properties are possi-
temperature are presented. The variation of slopes with
ble, e.g. by improved primary nucleation on the substrates in
¯uorine content is more signi®cant than those observed at order to grow larger crystallites, by optimization of ®lm to
tungsten-doped ®lms (Fig. 5). Considering the vanadium antire¯ective coating thickness ratio, and by a more suitable
oxide O2p valence band, there is decrease of intensity at
deposition technique for the antire¯ective layer.
the lower-energy ¯ank and an increase at the higher energy
(2) Correlations between structural and optical properties
¯ank accompanied by a broadening, as the ¯uorine concen-
and the results of photoelectron spectrometry are evident:
tration is enhanced (arrows). The lower energy part of the
structural order and disorder, respectively, are re¯ected by
O2p peak of VO2 is assigned to p molecular orbitals [1].
transmittance spectra, phase transition temperature range,
The shoulder at energies of about 6 to 7 eV (attributed to s
and also by `DOS' variation. Concerning tungsten doping,
orbitals) is not in¯uenced as much. If we take the UPS the model of Tang et al. [9] seems appropriate. In polycrys-
intensities as an approximation of the `DOS' distribution, talline ®lms their concept of weakly interacting magnetic
we may interpret the development of slopes with enhanced
regions is limited to single microcrystals, and the size of
¯uorine doping as a reduction of the density of p states, a
microcrystals has strong in¯uence on the interaction.
more or less constant density of s states, and the appearance
of additional tail states at the high-energy ¯ank.
The V3d valence band is also broadened upon successive
¯uorine doping, the `DOS' seems to be enhanced in this References
region, and the overlap of V3d and O2p states increases
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