Professional Documents
Culture Documents
British Standard
Assessment of surface
texture —
Part 1: Methods and instrumentation
Licensed Copy: Anthony Babb,
UDC 621.9.015:620.179.118:001.4
, August 03, 2001, Uncontrolled Copy,
BS 1134-1:1988
© BSI 11-1999
Licensed Copy: Anthony Babb,
Contents
Page
Committees responsible Inside front cover
Foreword iii
Section 1. General
1 Scope 1
2 Definitions 1
Section 2. Determination of surface roughness
3 Sampling lengths 12
4 Graphical determination of parameter values 12
5 Statements of surface roughness 16
Section 3. Instrumentation
6 Stylus-type measuring instruments 17
7 Accuracy 20
Appendix A Parameter values 23
Appendix B Method divergence of instrument reading 24
Appendix C Factors affecting the statement of accuracy 25
Figure 1 — Surface characteristics and terminology 3
Figure 2 — Traversed length 4
Figure 3 — Profile departure 5
Figure 4 — Local peak of the profile 5
Figure 5 — Spacing of local peaks of the profile 6
Figure 6 — Local valley of the profile 6
Figure 7 — Profile peaks 7
Figure 8 — Profile valleys 7
Figure 9 — Spacing of profile irregularities 8
Figure 10 — Profile section level 8
Figure 11 — Profile bearing length 9
Figure 12 — Arithmetical mean deviation of the profile (Ra) 9
Figure 13 — Maximum height of the profile (Ry) 10
Figure 14 — Graphical determination of Ra values 13
Figure 15 — Graphical determination of Rz values 13
Figure 16 — Graphical determination of Sm values 14
Figure 17 — Graphical determination of S values 15
Figure 18 — Graphical determination of tp values 15
Figure 19 — Stylus acting midway between two skids 17
Figure 20 — Profile instrument frequency response 19
Figure 21 — Permissible deviations of the transmission coefficient 21
Figure 22 — Symbols for the direction of lay 22
Figure 23 — Centre arithmetical mean lines (A) and electrical
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Page
Table 7 — Preferred nominal values for ten point height of
irregularities (Rz), and maximum height of the profile (Ry) 23
Table 8 — Preferred nominal values for mean spacing of profile
irregularities (Sm), and mean spacing of local peaks of the profile (S) 24
Table 9 — Comparison of Ra values obtained by graphical and
instrumental means 24
Publications referred to Inside back cover
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BS 1134-1:1988
Foreword
This Part of BS 1134 has been prepared under the direction of the General
Mechanical Engineering Standards Committee and is a revision of
BS 1134-1:1972, which is withdrawn.
The definitions given in this Part of BS 1134 supersede those given in BS 6741-1
and BS 6741-2. BS 6741-1 and BS 6741-2 are accordingly withdrawn.
BS 1134 was first issued in 1950 and revised in 1961 and 1972. This revision
takes account of the 1982 edition of ISO 468 “Surface roughness — Parameters,
their values and general rules for specifying requirements” published by the
International Organization for Standardization.
BS 1134-1:1972 dealt with two parameters, Ra and Rz, whereas this edition covers
the additional parameters Ry, Sm, S and tp.
Additional parameters may be found in ISO 4287-1:1984 “Surface roughness —
Terminology — Part 1: Surface and its parameters” and in ISO 4287-2:1984
“Surface roughness — Terminology — Part 2: Measurement of surface roughness
parameters”.
BS 1134-2 gives general information and guidance.
A British Standard does not purport to include all the necessary provisions of a
contract. Users of British Standards are responsible for their correct application.
Compliance with a British Standard does not of itself confer immunity
from legal obligations.
Licensed Copy: Anthony Babb,
Summary of pages
This document comprises a front cover, an inside front cover, pages i to iv,
pages 1 to 26, an inside back cover and a back cover.
This standard has been updated (see copyright date) and may have had
amendments incorporated. This will be indicated in the amendment table on the
inside front cover.
iv
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BS 1134-1:1988
Section 1. General
1 Scope
This Part of BS 1134 describes methods for the assessment of surface texture of machined, self-finished and
other surfaces and describes the characteristics and parameters standardized for use in industry.
It embraces the following.
a) The terminology to be employed in statements relating to surface texture and measurement of surface
texture.
b) Preferred values for the grading of surface texture (see Appendix A).
c) Sampling lengths and cut-off values to be used in graphical procedures and instrument construction.
d) The graphical determination of the following parameters:
1) Ra, arithmetical mean deviation of the profile;
2) Rz, ten point height of irregularities;
3) Ry, maximum height of the profile;
4) Sm, mean spacing of profile irregularities;
5) S, mean spacing of local peaks of the profile;
6) tp, profile bearing length ratio.
e) The determination of parameter values by instrumental means.
f) The essential instrument requirements to ensure repeatability of performance.
g) The information to be given in statements relating to surface texture requirements.
NOTE The titles of the publications referred to in this standard are listed on the inside back cover.
2 Definitions
For the purposes of this Part of BS 1134 the following definitions apply.
2.1 Terms relating to the surface, profile and datum
2.1.1
real surface
the surface limiting the body, separating it from surrounding space
2.1.2
real profile
the profile that results from the intersection of the real surface by a plane conventionally defined with
respect to the geometrical surface (see Figure 1)
2.1.3
geometrical surface
the surface determined by the design, and defined by the drawing and/or other technical document,
neglecting errors of form and surface roughness (see Figure 1)
2.1.4
geometrical profile
the profile that results from the intersection of the geometrical surface by a plane conventionally defined
with respect to this surface (see Figure 1)
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2.1.5
effective surface
the close representation of a real surface obtained by instrumental means (see Figure 1)
2.1.6
effective profile
the profile that results from the intersection of the effective surface by a plane conventionally defined with
respect to the geometrical surface (see Figure 1)
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2.1.7
profile transformation
an action (operation) that results intentionally or unintentionally in the transformation of a profile at any
stage in the process of measurement, e.g. traversing with a stylus, filtering, recording
2.1.8
transformed profile
a profile produced as a result of transformation
2.1.9
intentional profile transformation
a profile transformation that is made in order that measurements are performed in accordance with the
specified requirements for a given measurement
NOTE The following are examples of intentional profile transformations.
a) Transformation of the surface profile into an electric signal to make it possible to use electronic measuring instruments.
b) Transformation of the effective profile by defined filter means of suppressing those undulations of the real profile that are not
or are not fully to be included in the measured roughness parameters of the surface.
2.1.10
unintentional profile transformation
a profile transformation arising from the imperfection of the measuring instrument or of its separate parts
and usually seen as distortions of the information about the profile
NOTE An example of an unintentional profile transformation is the distortion of the information about the profile when traversing
it with a stylus having a finite tip radius.
2.1.11
surface texture
those irregularities with regular or irregular spacing that tend to form a pattern or texture on the surface
NOTE This texture may contain components of roughness (see 2.1.12) and waviness (see 2.1.13).
2.1.12
roughness
the irregularities in the surface texture that are inherent in the production process but excluding waviness
and errors of form (see Figure 1)
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2.1.13
waviness
that component of surface texture upon which roughness is superimposed (see Figure 1)
NOTE Waviness may result from such factors as machine or work deflections, vibrations, chatter, heat treatment or warping
strains.
2.1.14
lay
the direction of the predominant surface pattern, ordinarily determined by the production method used
(see Figure 1)
2.1.15
traversed length
the complete length of the pick-up movement along the surface being measured (see Figure 2)
2.1.16
reference line
the line chosen by convention as a reference to serve for the quantitative evaluation of the roughness of the
effective profile (see Figure 2)
2.1.17
sampling length, l
the length of the reference line used for identifying the irregularities characterizing the surface roughness
(see Figure 2). The sampling length is measured in the general direction of the profile
profile departure, y
the distance between a profile point and the reference line in the direction of measurement (see Figure 3)
2.1.20
mean line system, system M
the calculation system used for the profile evaluation in which a mean line is taken as a reference line
2.1.21
least-squares mean line of the profile
a reference line having the form of the geometrical profile and dividing the profile so that, within the
sampling length, the sum of the squares of the profile departures from this line is the minimum
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2.1.22
centre arithmetical mean line of the profile
a reference line representing the form of the geometrical profile and parallel to the general direction of the
profile throughout the sampling length, such that the sums of the areas contained between it and those
parts of the profile that lie on each side of it are equal
NOTE The centre line (centre arithmetical mean line) is defined and used for graphical convenience. When the centre line has a
distinguishable periodicity and its general direction is therefore determinate, the “equal area” centre line is unique. When the profile
is irregular, the assessment of the general direction becomes uncertain over a certain range. Within this range a family of “equal area”
centre lines can be drawn, one of which will be identical with the least-squares mean line.
2.1.23
electrical mean line
in an electrical instrument, a reference line that is established by the circuits determining the meter
cut-off and which divides equally those parts of the transformed profile lying above and below it
2.1.24
local peak of the profile
a part of the profile between two adjacent minima of the profile (see Figure 4)
NOTE Figure 3 represents a profile graph which, due to the difference in the vertical and horizontal magnifications, is a distorted
representation of the real profile. For this reason, the profile departures should be measured in the same direction as that used to
determine the real profile. On the real profile, the angles, µ, between the reference line and the general direction of the profile within
the evaluation length are very small. Thus, the difference between the profile departures measured perpendicular to the reference
line and those measured perpendicular to the general direction of the profile may be negligible. Hence, on the real surface, the profile
departures should be considered perpendicular to the reference line.
Figure 3 — Profile departure
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2.1.25
spacing of local peaks of the profile
the length of a mean line section between the two highest points of adjacent local peaks of the profile
projected on the mean line (see Figure 5)
2.1.26
local valley of the profile
a part of the profile between two adjacent maxima of the profile (see Figure 6)
2.1.27
local irregularity
a local peak and the adjacent local valley
2.1.28
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profile peak
an outwardly directed (from material to surrounding medium) portion of the profile connecting two
adjacent points of the intersection of the profile with the mean line (see Figure 7)
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NOTE The outwardly directed portion of the profile at the beginning or end of the sampling length should always be considered
as a profile peak.
Figure 7 — Profile peaks
2.1.29
profile valley
an inwardly directed (from surrounding medium to material) portion of the profile connecting two adjacent
points of the intersection of the profile with the mean line (see Figure 8)
NOTE The inwardly directed portion of the profile at the beginning or end of the sampling length should always be considered as
a valley.
Figure 8 — Profile valleys
2.1.30
profile irregularity
a profile peak and the adjacent profile valley
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2.1.31
spacing of profile irregularities
the length of a mean line section containing a profile peak and the adjacent profile valley (see Figure 9)
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2.1.32
line of profile peaks
a line parallel to the mean line and passing through the highest point of the profile within the sampling
length (see Figure 7)
2.1.33
line of profile valleys
a line parallel to the mean line and passing through the lowest point within the sampling length
(see Figure 8)
2.1.34
profile section level, c
the distance between the line of profile peaks and a line intersecting the profile, the latter being parallel to
the line of profile peaks (see Figure 10)
NOTE The profile section level can be determined in micrometres or in percent of Ry, the maximum height of the profile (see 2.2.2).
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2.1.35
profile bearing length, ½p
the sum of the section lengths obtained by cutting the profile peaks by a line parallel to the mean line
within the sampling length (see Figure 11)
or approximately:
where
l is the sampling length;
y is the profile departure;
n is the number of profile departures.
NOTE In practice, the values of Ra are determined within the evaluation length which includes several sampling lengths. The
sampling length is equal to the cut-off.
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2.2.2
maximum height of the profile, Ry
the distance between the line of profile peaks and the line of profile valleys within the sampling length
(see Figure 13)
2.2.3
ten point height of irregularities, Rz
the average distance between the five highest profile peaks and the five deepest profile valleys within the
sampling length, measured from a line parallel to the mean line and not crossing the profile (see Figure 15)
2.2.4
mean spacing of profile irregularities, Sm
the mean value of the spacing of the profile irregularities within the sampling length (see Figure 16)
2.2.5
mean spacing of local peaks of the profile, S
the mean value of the local peak spacing of the profile within the sampling length (see Figure 17)
2.2.6
profile bearing length ratio, tp
the ratio of the profile bearing length to the sampling length
2.3 Terms associated with instruments for the measurement of surface roughness by the profile
method
2.3.1
profile recording instrument
an instrument recording the coordinates of the profile of the surface texture
2.3.2
profile instrument
an instrument used for the measurement of surface roughness parameters
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2.3.3
contact profile instrument, system M
a contact (stylus) instrument of consecutive profile transformation used for the measurement of surface
roughness parameters according to system M (the mean line system)
NOTE See ISO 3274:1975.
2.3.4
modified profile
the effective profile defined by the combination of a stylus and profile filter, the filter being used for
selecting a part of the spectrum of the real profile to be taken into consideration in the measurement of
surface roughness parameters
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2.3.5
profile instrument with predetermined evaluation length
an instrument in which the length used for measurement has a defined beginning and end
NOTE These instruments generally indicate and hold the reading of the measured parameter obtained at the end of the stated
measuring length.
2.3.6
profile instrument with “running” evaluation length
a profile instrument with running evaluation length giving a running average
2.3.7
static measuring force
the force which the stylus exerts along its axis on the examined surface without taking into account the
dynamic components that arise from the traversing of the surface by the stylus
2.3.8
rate of change of the static measuring force
the change of the static measuring force per unit displacement of the stylus along its axis
2.3.9 cut-off, 2B
the value of the wavelength 2 numerically equal to the sampling length and conventionally taken as the
upper limit of transmission of the instrument
NOTE The given upper limit conventionally separates the nominally transmitted components of the effective profile spectrum from
those that are nominally suppressed.
2.3.10
vertical magnification of a profile record, Vv
the ratio of the recorded horizontal displacement to the displacement of the stylus along the surface
2.3.11
horizontal magnification of a profile record, Vh
the ratio of the recorded length of the recorder chart to that of the stylus displacement along the surface
2.3.12
error of vertical magnification of a profile record
the percentage difference between the nominal and the actual values of the vertical magnification referred
to the nominal value
2.3.13
error of horizontal magnification of a profile record
the percentage difference between the nominal and the actual values of the horizontal magnification
referred to the nominal value
2.3.14
basic error of a profile instrument reading
the percentage difference between the instrument reading and the value of the surface roughness
parameter as defined by the stylus and cut-off (without skid) of the instrument
2.3.15
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3 Sampling lengths
Normally the appropriate sampling length of surface, which determines the corresponding cut-off to be
used (see 6.3), shall be selected from the range of sampling lengths given in Table 1.
In special cases which require the choice of values of sampling length other than those specified
in Table 1, sampling and evaluation lengths shall be stated on all records of the test.
Table 1 — Sampling lengths
mm in
0.08 0.003
0.25 0.01
0.8 0.03
2.5 0.1
8.0 0.3
Hm = P
----
l
where
P is the area between the profile and line of profile valleys (A“B”);
l is the sampling length.
4.1.7 Draw the centre arithmetical mean line AB parallel to the line of profile valleys (A“B”) at the height
Hm above it [see Figure 14a)].
4.1.8 Determine the areas r1, r2, r3 ... and s1, s2 ... above and below the centre arithmetical mean line
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[see Figure 14b)]. The value of Ra (in 4m) is calculated from the equation:
where
ri is the area (in mm2) of the ith profile peak;
si is the area (in mm2) of the ith profile valley;
l is the sampling length (in mm);
Vv is the vertical magnification of the profile record.
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4.1.9 The required value of Ra over the evaluation length is taken as the mean of the successive values of
the sampling length.
Measure the five highest peaks and five deepest valleys from an arbitrary base line A“B” drawn parallel to
the centre arithmetical mean line AB of the chosen sampling length l. Rz (in 4m) is then given by the
equation:
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where
Y1, Y2, . . . Y10 is the distance (in mm) of peaks and valleys from the arbitrary base line A“B”;
Vv is the vertical magnification of the profile record.
The value of Ry (in 4m) is calculated from the equation:
where
Yy is the maximum height (in mm) of the profile record;
Vv is the vertical magnification of the profile record.
4.3 Graphical determination of Sm values
Draw the centre arithmetical mean line AB (see Figure 16) for the sampling length, l, and identify the
profile peaks, noting that the minimum height of the profile peaks to be taken into consideration is
specified as 10 % of Ry. The mean spacing of the profile irregularities Sm (in 4m) is calculated from the
equation:
where
Smn is the length (in mm) of mean line section containing the nth profile peak and the adjacent profile
valley;
n is the number of sections included in the determination;
Vh is the horizontal magnification of the profile record.
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where
S1 . . . Sn are the spacing of local peaks of the profile (in mm);
n is the number of spacings included;
Vh is the horizontal magnification of the profile record.
where
½ppp and l are in the same units.
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If a single value is stated it shall be the upper limit value and shall be expressed (in 4m) as shown in the
following examples:
Ra 0.8, Rz 12.5
NOTE Variations in the value of the surface roughness parameter in most engineering surfaces are found to approximate
sufficiently closely to the normal (Gaussian) distribution for the properties of the normal distribution to be applied. Thus, the lower
and upper limits of the roughness parameter values are the limits between which 68 % of all the measured values of the parameter
are expected to fall.
For requirements specified by the upper limit of the surface roughness parameter, the surface is considered to be acceptable if not
more than 16 % of all the measured values of the parameter exceed the value specified on the drawings or in technical documents. In
cases where the lower limit is specified, the surface is considered to be acceptable if not more than 16 % of all the measured values of
the roughness parameter can be exceeded by the specified value.
5.4 Cut-off values
When the cut-off value is other than 0.8 mm the value shall be indicated in parentheses following the
surface roughness value (in 4m), as shown in the following example:
Ra 0.2 (2.5)
NOTE Apart from indicating the cut-off to be used in assessment, the cut-off value denotes that dominant peak spacings greater
than the cut-off are not present on a surface.
5.5 Lay
It is sometimes necessary to specify the direction of lay, in which case it shall be as defined as in Figure 22
and expressed in accordance with the following example:
Ra 0.8 C
NOTE C refers to the symbol for lay which is circular (see Figure 22). Unless otherwise specified, the implication is that the surface
roughness should be measured across the direction of the lay.
5.6 Production process
When production of a surface is to be limited to the use of one particular process, the process shall be stated.
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Section 3. Instrumentation
4m mN N/m
2 ± 0.5 0.7 35
5±1 4.0 200
10 ± 2.5 16.0 800
6.2 Skid
6.2.1 Skid dimensions. If a skid is employed, its radius in the direction of the traverse shall be not less
than 50 times the meter cut-off used.
If two simultaneously operative skids, as shown in Figure 19, are used, their radii shall be not less than
eight times the meter cut-off.
NOTE Although the use of the skid may, when applied under suitable conditions, introduce no error of any great practical
significance, external datum units should be used in all serious metrological work such as, for example, calibration procedures, and
in the case of surfaces of limited area or requiring the use of cut-off values of 2.5 mm or greater.
6.2.2 Skid surface roughness. The surface roughness of the skid as determined by the ten point height of
irregularities, Rz, shall be not greater than 0.1 4m when measured in the direction of traverse.
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6.2.3 Skid force. The force exerted by the skid on the surface to be measured shall be not greater than 0.5 N.
6.3 Traverse
In profile instruments with predetermined or running evaluation lengths, the length shall depend on the
meter cut-off value 2B within the limits given in Table 3.
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mm mm mm
0.08 0.4 2
0.25 1.25 5
Predetermined evaluation length 0.8 2.4 8
2.5 5 15
8 16 40
Running evaluation length 0.25 2.5 16
0.8 5 16
where
j = Æ – 1;
2 is the wavelength;
2B is the meter cut-off.
The effective cut-off wavelengths shall be taken at 75 % transmission. These are deemed to be equivalent
to the sampling lengths in Table 1.
NOTE In a practical determination, the values of the transmission coefficients for the characteristics shown are measured relative
to the flat part of the transmission curve (see Figure 20).
6.5.2 Cut-off values. The cut-off values (in mm) to be used in instrument construction shall be selected from
the following series:
0.08, 0.25, 0.8, 2.5, 8.0.
NOTE 1 A cut-off of 0.8 mm is found adequate for most of the finer surfaces.
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NOTE 2 Nominal sinusoidal frequency response characteristics for a profile instrument are shown by the ratios given in Table 4
(see also Figure 20).
The permitted deviations from the nominal values of the transmission coefficients shall be as given
in Table 5, and graphically presented in Figure 21, and these allow the cut-off to be assessed at
between 70 % and 80 % of maximum transmission.
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0.025 99.7 — — —
0.05 98.7 — — —
0.08 96.7 99.7 — —
0.10 94.9 99.5 — —
0.25 75.0 96.8 99.7 —
0.5 42.9 88.5 98.7 —
0.8 22.7 75.0 96.7 99.7
1.0 15.8 65.8 94.9 99.5
2.5 2.9 23.5 75.0 96.8
5.0 0.75 7.1 42.9 88.5
8.0 — 2.9 22.7 75.0
10.0 — 1.8 15.8 65.8
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7 Accuracy
7.1 Statement of basic error of calibration of Ra instruments
The basic error of profile instrument reading (as defined in 2.3.14) given within the cut-off by an
instrument in optimum adjustment and use (see C.5), and expressed as a percentage of the designated
value of the surface roughness parameter of an instrument calibration specimen complying with BS 6393,
shall be determined from the formula:
p
--- + q
x
where
x is the fraction of the range indicated by the instrument;
p is a percentage of full range;
q is a percentage of reading.
NOTE The admissible basic error of calibration thus expressed does not include the effect of deviations in the transmission
characteristic which will be additional thereto.
7.2 Deviations of transmission coefficients
The permissible deviations of the amplitude transmission coefficient (see Table 5 and Figure 21) of a profile
instrument from the nominal transmission coefficient shall be given by the equations:
where
2 is the wavelength;
2B is the meter cut-off.
Table 5 — Upper and lower limits of transmission coefficients
Wavelength, 2 Transmission coefficient
% dB % dB
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Symbol Interpretation
Multi-directional
NOTE Should it be necessary to specify a direction of lay not clearly defined by these symbols, this may be done by a suitable note
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on the drawing.
Figure 22 — Symbols for the direction of lay
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Figure 23 — Centre arithmetical mean lines (A) and electrical mean lines (B)
BS 6393. Ideally, in addition to being marked with substantially its full value, assuming negligible
instrument losses, each specimen should be accompanied by a statement of the reading that should be
obtained from it by an instrument having given stylus dimensions and for each mean transmission
characteristic. This is a refinement that has still to be treated in a formal way.
The overall amplification is left as an adjustment for the user to make by means of one or more
potentiometers which have to be set in conjunction with an instrument calibration specimen or with a
calibrated test specimen. The attainable accuracy therefore starts with the calibration specimen and the
user’s skill in allowing for its characteristics and in securing with it the best overall adjustment of the
instrument. It is envisaged that the use of more than one test specimen will become normal practice.
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Publications referred to
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1988
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means – electronic, photocopying, recording or otherwise – without prior written
permission from BSI.
This does not preclude the free use, in the course of implementing the standard,
Licensed Copy: Anthony Babb,
of necessary details such as symbols, and size, type or grade designations. If these
details are to be used for any other purpose than implementation then the prior
written permission of BSI must be obtained.