Nano-Materials technology

Part 4
Tools to Characterize Nanomaterials/4
Dr. Ghadeer Al-Malkawi

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5- Atomic Force Microscopy (AFM)
• AFM is a high-resolution imaging technique that can
resolve features as small as an atomic lattice in the real
space. It is also commonly referred to as scanning probe
microscope (SPM).

• It allows researchers to both observe as well as

manipulate molecular- and atomic-level features.

• Almost every material ranging from polymers to ceramics

to composites are being investigated using AFM.

• AFM involves measurement of surface atomic forces in

the range of a few nano-Newtons to image the surface
topography.

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Atomic Force Microscopy (AFM)

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 Atomic Force Microscopy (AFM)
• Gerd Binnig and Christoph Gerber invented the AFM in 1985
for which they were awarded the Nobel Prize.

• The AFM works on the principle of a cantilever, where a small

hook is attached to one end of the cantilever and the force
between the tip and sample is measured by tracking the
deflection of the cantilever as the hook is pressed against the
sample surface.

• Today, most of the tips are microfabricated from Si or Si3N4.

• In AFM, the force is not directly measured, but the deflection

of the micro-cantilever or the probe/tip is monitored.
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 Atomic Force Microscopy (AFM)

• The AFMs that came later are based on optical principles.

• In this technique, light is reflected from the surface of the

cantilever onto a position-sensitive detector.

• Thus, even a small deflection of the cantilever will cause a

tilt in the reflected light, changing the position of the
beam falling on the detector.

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Atomic Force Microscopy (AFM)

• In the AFM, an atomically sharp tip is scanned over a

surface with feedback mechanisms that enable the
piezoelectric scanners to maintain the tip at either:

1) a constant force (to obtain height information), or

2) at constant height (to obtain force information)
above the sample surface.

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Atomic Force Microscopy (AFM)

• The primary purpose of these instruments is to

quantitatively measure surface roughness with a
nominal 5 nm lateral and 0.01 nm vertical resolution
on all types of samples.

• Plotting of the local sample height as a function of

horizontal tip position can give three-dimensional
topographical maps of the surface.

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Comparison of AFM and other imaging
techniques
• AFM versus STM: It is interesting to compare AFM and its precursor,
scanning tunneling microscopy. In some cases, the resolution of STM
is better than AFM because of the exponential dependence of the
tunneling current on distance. Only conducting samples can be
studied by STM, while AFM can be applied to both conducting and
non-conducting samples.
• AFM versus SEM: Compared with the scanning electron microscope,
AFM provides extraordinary topographic contrast, direct height
measurements. Both these techniques measure surface topography.
However, both types of microscopes can also measure other surface
physical properties. SEM is preferred for measuring chemical
composition and AFM for measuring mechanical properties of
surfaces.
• AFM versus TEM: Compared with the transmission electron
microscope, three-dimensional AFM images are obtained without
expensive sample preparation and yield far more complete
information than the two-dimensional profiles available from cross-
sectioned samples. TEM is a useful tool for observing a subsurface
features while AFM is limited to the surface.
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 6- Nanoindentation
• Nanoindentation is a relatively new technique to obtain
mechanical properties of nanometric regions by studying the
stress–strain behaviour when a nano-indentor is impressed
against the specimen of interest.

• Usually scanning force microscope (SFM) tips are used both

to perform the indentation and to image the sample surface
after indentation.

• The depth of indentation is measured as a function of the

force (stress) applied.

• A diamond indenter with a small radius of curvature at its tip

is generally used.
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Nanoindentation
• This nanoindentation device can be mounted on the scanner head of the
AFM in place of the cantilever.

• The principle of nanoindentation is similar to other indentation hardness

testers, in which an indentor is forced into the material being tested,
forming an indent.

• The hardness is taken as the ratio of load and the area of contact between
the sample and the indenter.

• In nanoindentation, the contact area is measured by a depth-sensing

technique.
 Nanoindentation
• During the test, both
the load and the
displacement of the
indenter are recorded.

• The load–displacement
curve is used to
calculate the contact
area at maximum load.

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Thank you

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