Scanning Tunneling

Microscope(STM)

Atomic
Force
Microscope
(AFM)
Presented by: Zarah Khan
 Introduction.
• The STM is an electron microscope that
uses a single atom tip to attain atomic
resolution.
• The scanning tunneling microscope was
developed at IBM Zürich in 1981 by Gerd
Binning and Heinrich Rohrer who shared the
Nobel Prize for physics in 1986 because of this
Microscope.
• Scanning Tunneling Microscope (STM) is an
electron microscope that transmit 3D image of
electron cloud around nucleus.
• It allows the inspection of properties of a
conductive solid surface at an atomic size.
• Technique to determine the atomic structure
and electronic states of the surface.
• Surfaces can be viewed at atomic size up to
resolution of 0.1 A° by using STM.
 Working overview!
• An extremely fine conducting probe is held
about an atom’s diameter from the sample.

• Electrons tunnel between the surface and the tip,

producing an electrical signal.

• While it slowly scans across

the surface, the tip is raised
and lowered in order to keep the signal
constant and maintain the distance.

• This enables it to follow even the

smallest details of the surface it
is scanning.
Modes of Operation in STM
 Distance between tip and
specimen
𝟐𝒎∅
I(d) = constant (eV) (exp (-2 d)
ℏ
• Φ: the work function (energy barrier),
• e: the electron charge,
• m: the electron mass,
• h: the Planck’s constant,
• V: applied voltage,
• d: tip-sample distance

• This (approximate) equation shows that the tunneling current obeys

Ohm’s law, i.e. the current I is proportional to the voltage V.
• The current depends exponentially on the distance d
 PROCESSING A TRACE
• The trace (1) can be interpreted as a grid which can
be shown as a gray scale picture (2).
1 2 3 4

• The gray scale picture can be interpreted as a contour

map (3) which can then be averaged out to make
smooth (4) and finally colored (below).
3D Scanning Tunneling Microscope image of atoms.
Iron atoms on the surface of
Cu(111)
 ADVANTAGES!
• STM are helpful as they provide 3D profile of surface
which help researchers to determine surface properties
deeply.

• Understanding details at the molecular level.

• STM are versatile. They can be used for ultra high

vacuum, air, water, other liquids and gases.

• Lateral resolution of 0.1nm and 0.01nm depth

resolution.
 DISADVANTAGES!
• Very expensive and fragile instrument.

• Need specific training to operate efficiently.

• STM requires stable smooth surfaces,

excellent vibration control and sharp tips.
STM image for Single walled
nanotubes
STM topographic images of different regions of the graphene
flake . The image was obtained with Vbias = +1 V (sample
potential), I = 1 nA, and a scan area of 1 nm2.
A honeycomb structure is observed.
Stereographic plot of a large-scale (100 × 62 nm) STM
image of a single-layer graphene film on the silicon
dioxide surface. The STM scanning conditions
were Vbias = 1 V (sample potential) and I = 0.6 nA. The
0.8-nm scale of the vertical (Z) coordinate is greatly
enlarged to accentuate the surface features.
 INTRODUCTION
• The Scanning Tunneling Microscope (STM) was invented by
G. Binnig and H. Rohrer, for which they were awarded the
Nobel Prize in 1984

• A few years later, the first Atomic Force Microscope (AFM)

was developed by G. Binnig, Ch. Gerber, and C. Quate at
Stanford University by gluing a tiny shard of diamond onto
one end of a tiny strip of gold foil.

• Currently AFM is the most common form of scanning probe

microscopy.

• Developed in order to examine insulating surfaces.

 Atomic Force Microscopy
AFM works by scanning the probe over the
sample surface building up a map of the height
or topography of the surface as it goes along.
How does it works?
 Parts of AFM.
1. Laser – deflected off cantilever
2. Mirror –reflects laser beam to photo
detector
3. Photo detector –dual element
photodiode that measures differences in
light intensity and converts to voltage
4. Amplifier
5. Register
6. Sample
7. Probe –tip that scans sample made of
Si
8. Cantilever –moves as scanned over
sample and deflects laser beam
BEAM DEFLECTION METHOD.
 working!
• The AFM brings a probe in close proximity to
the surface
• The force is detected by the deflection of a
spring, usually a cantilever.
• Forces between the probe tip and the sample
are sensed to control the distance between the
tip and the sample.
 Modes of Operation

Three Major modes of

Operation
1. Contact mode
(static)
2. Non- Contact Mode
(dynamic)
3. Tapping Mode
(dynamic)
 Contact mode
• Tip of probe always touching the sample.
• Measures repulsion between tip and sample
• Force of tip against sample remains constant.
• High resolution images.
• Fast of all the topographic modes
• Because of repulsive forces tip and sample may
damage.
• Sensitive to sample nature.
• Not good for soft samples.
 Non-Contact Mode
• Tip does not touch the sample.
• Measures the attractive forces between the tip and
the sample.
• Van der Waals forces between tip and sample
detected
• Can’t use with samples in fluid.
• Doesn’t degrade or interfere with the sample.
• Better for soft samples.
• No contamination to sample.
 Tapping mode
• Tip vertically oscillates between contacting sample
surface and lifting of at frequency of 50,000 to
500,000 cycles/sec.
• Oscillation amplitude reduced as probe contacts
surface due to loss of energy caused by tip contacting
surface
• Advantages: overcomes problems associated with
friction, adhesion, electrostatic forces
• Higher resolution of sample with minimum sample
damage.
 limitations
• AFM can image a maximum height of 10-20
micrometers and maximum a scanning area of
150 × 150 micrometers.
• The scanning speed of AFM is also a
limitation.
• Highly dependent on the AFM probes.
• Tip or sample can be damaged.
 Applications.
• Materials Investigated: Thin and thick film coatings,
ceramics, composites, glasses, synthetic and biological
membranes, metals, polymers, and semiconductors.
• To study phenomena's: Abrasion, adhesion, cleaning,
corrosion, etching, friction, lubricating, plating, and
polishing.
• AFM can image surface of material in atomic
resolution and also measure force at the Nano-Newton
scale.
• Image non-conducting surfaces such as proteins and
DNA
• Study the dynamic behavior of living and fixed cells
 STM vs AFM
• AFM does not measure • STM images by calculating
the tunneling current the quantum tunneling
but only measures the between the probe and
small force between the sample.
surface and the tip • STM, the tip is kept at a
• AFM touches the short distance from the
surface gently touches surface.
the surface
• AFM resolution is better than the STM. This is why AFM is
widely used in nano-technology.
• STM is normally applicable to conductors whereas AFM is
applicable to both conductors and insulators.
• The AFM suits well with liquid and gas environments whereas
STM operates only in high vacuum.
AFM OF POLYIMIDE
 AFM ANALYSIS
• The surface morphology of PI and LRPI was
further investigated using AFM with resolution
of ~1 nm.
• a) Polyimide b) reduced Polyimide(rPI)