EEE1011- Automated Test Engineering Lab

Digital Assignement-2
Name: Kanav Bhasin
Register Number: 18BEE0068
Slot: L31+L32
Faculty: Prof. Karthikeyan A

Experiment-2
Title: Cluster test of a basic logic gate (NOT) using QE-49 trainer kit
Aim: To perform cluster test on a combinational or sequential circuit (NOT Gate) to check
the functionality of the complete circuit
Apparatus Used:
• 7404 IC (NOT Gate)
• QE 49 trainer kit
• PC with pre-installed QUEST Software
• Power cord
• Probes
• Connecting Wires
• Breadboard
Truth Table:
NOT Gate
Input Output
(A) (NOT A)
0 1
1 0

Description: Cluster test is to test functionality of a sequential or combinational circuit

created on the breadboard. For cluster check user can make use of 8 I/O Banks from A – H.
I/O bank z should not be used for functional checking. User can configure each bank either
as input or as output. The input pattern defined by user is driven to the BSD through TDI
and given out through O/P pins of BSD to the Input bank. User can connect these input
signals to the digital logic IC on breadboard. Output of the circuit is taken and connected to
the O/P bank. This o/p pattern is given as I/P to BS device and is taken out through TDO for
comparison with the expected Output. Cluster test does not requires pin mapping.
 • +5V is supplied to pin 14
• GND is connected to pin 7
• Input and Output are connected to pin 1 and 2
• Input is connected to A1 bank
• Output is connected to B2 bank
Results:

Connections of 7404 IC

Setting input output port on 7404 IC

Cluster test passed for the given 7404 IC

Graph
 Input Output as shown in the software

Faulty IC shows FAIL condition

Result: The cluster test was performed on 7404 IC (NOT Gate) and the IC was checked
successfully by blinking LEDs on the QE-49 kit. The output was verified with the truth table of
NOT Gate and the faulty ICs were removed.