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Surface Finish Explain
Surface Finish Explain
X axis Z
axis Stylus method Form deviation profile
probe P-parameter =Mean line for roughness profile
=Waviness profile on old DIN & JIS
λs profile filter
λf profile filter
Traced profile • Stylus deformation Phase correct filter 50%
perpendicular • Noise transmission at cutoff
θ to real surface No phase shift / low
distortion
rtip
Waviness profile W
Roughness profile R (Filtered center line waviness profile)
R-parameter W-parameter
50%
0
λs λc Wavelength λ λf
Selection of λc & Stylus Tip rtip
Cutoff (Wavelength) λc
λc (mm) λc/λs rtip (μm)
0.08 30
2
0.25 2.5 100
0.8 2 (5 at RZ > 3μm)
2.5 8 300 5 or 2
Surface Texture Contour Measuring Instruments
8 25 10, 5 or 2
230
Sampling length and Evaluation length Mean line
ISO4287: ’97 Primary profile P
Top of profile
peak Roughness
profile R
Profile Mean line
peak
Profile valley
Sampling length Rr Bottom of Profile element width Xs
= Cutoff λc profile valley
Rr Rr Rr Rr
c ground
Material removal
Example
a U 0.008 − 2.5/Rz3max 12.3
e d b 3 = L“2RC”0.008 − 0.8/Ra75 0.2
・
U “2RC” 0.008 – 2.5/ R z3max 12.3
231
Surface Texture・Contour Measuring Instruments
Rp Rt Ra
Pp Maximum profile peak height Pt Total height of profile Pa Arithmetical mean deviation
Wp Wt (Pt = Rmax at JIS’82) Wa
The largest profile peak height Zp within a Sum of height of the largest profile peak height Arithmetic mean of the absolute ordinate
sampling length. Rp and the largest profile valley Rv within an values Z(x) within a sampling length.
evaluation length.
1 L
Rp, Pp, Wp = max (Z(x)) Rt, Pt, Wt = max (Rpi) + max (Rvi) Ra, Pa, Wa = Z (x) dx
L 0
Rp Rp5
Rp2
Zp1 Zp2 Zpi Ra
Rt
rr Rv2 Rv4
Sampling length L Sampling length L
Evaluation length Rn
Rv Rc Rq
Pv Maximum profile valley depth Pc Mean height of profile elements Pq Root mean square deviation
Wv Wc Wq
The largest profile valley depth Zp within a Mean value of the profile element heights Zt Root mean square value of the ordinate values
sampling length. within a sampling length. Z(x) within a sampling length.
1 m
Rc, Pc, Wc = Σ Zti Rq, Pq, Wq =
1 L
Z2 (x) dx
Rv, Pv, Wv = min (Z(x)) m l=1
L 0
Zti
Zt1 Zt2 Ztm
Zt3
Rq2
Rv
Sampling length L
Profile element:
Profile peak & the adjacent valley Sampling length L
・
Rz Rz jis Ten point height of roughness profile Ra75 Center line average
Pz Maximum height of profile (Rz at JIS’94) (Old Ra, AA, CLA)
Wz (Rz = Ry at ISO4287 ’84) Sum of mean value of largest peak to the fifth Arithmetic mean of the absolute ordinate value
largest peak and mean value of largest valley to Z(x) in a sampling length of roughness profile
Sum of height of the largest profile peak height
the fifth largest valley within a sampling length. with 2RC filter of 75% transmission.
Rp and the largest profile valley Rv within a
sampling length.
Rz jis= 1 Σ (Zpj + Zv j)
5
1 rn
Zp 1st
Zp2nd Zp3rd Zp4th
Rp Zp5th Ra75
Rz Rzjis
Rv
Zv5th Zv3rd Zv4th Zv2nd Zv1st
Sampling length L Sampling length L
Sampling length L
Different from Rz at old ISO, ANSI & JIS Annex of JIS only and confirm to JIS’94 Annex of JIS only
Different from Rz at JIS’82 Same as Ra at old ISO, ANSI & DIN
232
Spacing parameters Hybrid parameters Height characteristic average parameters
1 m R∆q 1 1 Rr 3
RSm, PSm, WSm = Σ Xsi 1 L d 2 Rsk = Z (x) dx
m i=1 P∆q = Z (x) dx Rq3 Rr 0
W∆q L 0 dx
Xs1 Xs2 Xs3 Xsi Xsm
dZ (x) / dx Rsk > 0
Rsk < 0
Sampling length L
Sampling length L
Probability density
Parameter from bearing ratio curve and profile height amplitude curve Rku
Pku Kurtosis of profile
Material ratio curve of the profile Profile height amplitude curve Wku
(Abbott Firestone curve)
Quotient of mean quartic of the ordinate values
Curve representing the material ratio of the Sample probability density function of ordinate Z(x) and 4th power of Pq, Rq, Wq respectively,
profile as a functional of level c. Z(x) within an evaluation length. within a sampling length.
1 1 Rr 4
Rku = Z (x) dx
Rq4 Rr 0
Mr(c) 1 Mr(c) i 0%
c
Rt Rku > 3
100%
0% 100% 0 Probability
Rku < 3
Rmr ・
Rmr(c) Rδc
Pmr(c) Material ratio of profile Pδc Profile section height difference Pmr Relative material ratio
Wmr(c) (Rmr(c) = ex- tp) Wδc Wmr
Ratio of the material length of the profile Vertical distance between two section levels of Material ratio determined at a profile section
elements Ml(c) at a given level c to the given material ratio. level Rδc, related to a reference c0.
evaluation length.
Rmr = Rmr (c 1)
100 m Rδc =c(Rmr1) -- c(Rmr2) : Rmr1<Rmr2
Rmr (c) = Σ MR(c)i (%) C1 = C0 -- Rδc, C0 = C (Rmr0)
rn i = 1 0 0
MR(c) MR(c)
c c (Rmr1) C0
Rδc Rδc
Rt
c (Rmr2) C1
100% or 100% or
Evaluation length Rn Rt (μm) Rt (μm)
0% Rmr1 Rmr2 100% 0% Rmr0 Rmr 100%
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Surface Texture・Contour Measuring Instruments
Expanded surface texture parameters and curves Confirm to ISO4287: ’96, ISO12085: ’96
& ISO13565-1: ’96 / -2: ’96 / -3: ’98
Traditional local parameters Parameters of surfaces having stratified functional properties ISO13565's
RmaxDIN Maximum peak to valley height Filtering process of ISO13565-1:’96 Measuring conditions of ISO13565-1
RzDIN Average peak to valley height Calculate mean line 1 from a primary profile Cutoff value λc Evaluation length Rn
with phase correct filter. 0.8 mm 4 mm
Zi is the maximum Peak to valley height of a
Mean line 1 2.5 mm 12.5 mm
sampling length Rr.
RmaxDIN is the maximum Zi of 5 adjoining 40% length secant of smallest gradient separate
the material ratio curve into core area & projected
sampling length Rr in an evaluation length Rn. Primary profile X areas.
RzDIN is arithmetic mean of 5 Zi. Calculate Rpk & Rvk with equivalent triangles of
Calculate profile 2 with cutting valley lower projected areas.
1 n than mean line 1.
RzDIN = Σ Zi Profile 2
n i=1 Peak area A1
0
Mean line 1 Equivalent triangle area A1
Z5 = RmaxDIN Rpk
Z2 Z3 Calculate mean line 3 from profile 2 with Equivalent straight line
Z1 Z4
phase correct filter. Valley area A2
Profile 2 Equivalent triangle
Rk area A2
Mean line 3
Rvk
Calculate roughness profile 4 by taking
Rr mean line 3 off from a primary profile. Rt (μm)
Rn = 5 ×Rr 0% Mr1 Mr2 100%
40%
Secant with
German old standard DIN4768/1: ’90 smallest gradient
Roughness profile 4
R3z Base roughness depth Height characterization using the linear material ratio curve ISO13565-2:’96
3Zi is the height of the 3rd height peak from Rk core roughness depth : Depth of the roughness core profile
the 3rd depth valley in a sampling length Rr. Rpk reduced peak height : Average height of protruding peaks above roughness core profile.
Rvk reduced valley depths : Average depth of valleys projecting through roughness core profile.
R3z is arithmetic mean of 3Zi’s of 5 sampling Mr1 material portion 1 : Level in %, determined for the intersection line which separates
lengths in an evaluation length Rn. the protruding peaks from the roughness core profile.
n Mr2 material portion 2 : Level in %, determined for the intersection line which separates
R3z = 1 Σ 3zi the deep valleys from the roughness core profile.
n i=1 Roughness Roughness core area
Peak area 0
profile 4
Rpk
3z3 3z4
3z1 3z2 3z5 Equivalent
straight line
Rk
Surface Texture Contour Measuring Instruments
Rr Rvk
Rn = 5 ×Rr
Valley area
Evaluation length Rn Rt (µm) 0% Mr1 Mr2 100%
・
Pc Peak density /cm: ASME B46.1: ’95 Height characterization using the material probability curve of ISO13565-3
PPI Peaks per inch: SAEJ911 Draw a material ratio curve on normal probability paper from the roughness profile 4
HSC High spot count (primary profile) of an evaluation length.
Separate the material probability curve to 2 area, upper plateau area and lower valley area.
Pc is the number of peaks counted when a Rpq(Ppq) parameter: slope of a linear regression performed through the plateau region.
profile intersects a lower boundary line –H and Rvq(Pvq) parameter: slope of a linear regression performed through the valley region.
an upper line +H per unit length 1 cm. Rmq(Pmq)parameter: relative material ratio at the plateau to valley intersection.
PPI shows Pc in 1 inch (25.4mm) unit length.
HSC shows the number of peaks when the UPL LPL UVL LVL
lower boundary level is equal to zero. 0.1% 1 10 30 50% 70 90 99 99.9%
2 µm
Roughness profile 4
1 µm Plateau region Rpq
count 1st count m
count 2nd
Rmq
H
0 µm
Rvq
-1 µm
Mean line -H
Reset -2 µm
Reset or
Reset Valley region -3s -2s s 0 -s 2s 3s
unit length (1cm or 1 inch) zero Evaluation length Rn
Material ratio Mr (%) on Standard probability scale
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Motif parameters of ISO12085: ’96
Hint of surface texture measurement
Motif Measuring condition
A portion of the primary profile between the Default A=0.5mm, B=2.5mm, Rn=16mm Roughness parameter conversion
highest points of two local peaks of the
profile, which are not necessarily adjacent. A (mm) B(mm) Rn(mm) λs(μm) The parameter ratio Ra/Rz (Rmax, Ry)=0.25 is
applicable only to triangle profile.
0.02 0.1 0.64 2.5 Actual profiles have different parameter ratios
Motif depths Hj & Hj+1 0.1 0.5 3.2 2.5 according to the form of profile.
Depth measured perpendicular to the 0.5 2.5 16 8
general direction of the primary profile. Rectangle: Ra/Rz=0.5
2.5 12.5 80 25
Motif length Ari or AWi Sinusoidal: Ra/Rz=0.32
Length measured parallel to the general
direction of the profile. Triangle: Ra/Rz=0.25
Indication of ISO1302: ’02
Lathed, Milled: Ra/Rz=0.16 to 0.26
local peak of profile local peak Roughness motif
of profile
limit
λs A Rn R parameter value Ground, Sand blasted: Ra/Rz=0.10 to 0.17
Hj
Hj + 1 Waviness motif
Honing, Lapped: Ra/Rz=0.05 to 0.12
limit
A B Rn W parameter value
ARi (AWi)
(default value need not to be indicated) Pulse (Duty ratio 5%): Ra/Rz=0.095
Roughness motif: Motif derived by using the ideal operator with limit value A.
Limit value A: Maximum length of roughness motif to separate waviness motif. Display aspect ratio & Stylus fall depth in valley
Upper envelope line of the primary profile (Waviness profile): Straight lines joining the
highest points of peaks of the primary profile, after conventional discrimination of peaks. Roughness profile usually displayed as much
AR: Mean spacing of roughness motifs: The arithmetical mean value of the lengths magnified height deviations than wavelength.
ARi of roughness motifs, within the evaluation length, i.e.
Displayed valley looks sharp but actually wide. Stylus
n can contact to bottom of valley.
AR = 1 Σ ARi (n: Total number of roughness motifs) Depth error ε with stylus unable to contact on triangle
n i=1 valley is; ε= rtip (1/cosθ – 1)
R: Mean depth of roughness motifs: The arithmetical mean value of the depths Hj of θ <15˚, or H/L=0.1-0.01 on machined surface.
roughness motifs, within the evaluation length, i.e. rtip = 2μm
m
R = 1 Σ Hj m = 2n High magnification ratio profile on display
m j=1
Rx: Maximum depth of roughness motifs: The maximum value of the depths Hj of ×2000
roughness motifs, within the evaluation length.
Primary profile Waviness profile
×20
Actual magnification
Wx
HW j HW j + 1
Roughness profile with 2RC filter λc 0.25mm
have big distortion according to phase shift.
Waviness motif
AWi
Rn
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Surface Texture・Contour Measuring Instruments
——— Peak-to-Valley Ry Ry
Maximum height Height (Rmax, Ry)
Maximum peak to ———
valley height ——— Rmax Rymax
R profile
Height Ten point height ——— (Rz) Rz Rz
parameter
Average peak to ———
valley height ——— ——— Ry5
Other peak height (Rp) Rp, Rpmax, Rp5,
parameters ——— Rp
Rm, Rc
0.25mm Rmax, Rz ≤ 0.8μm ——— not defined 0,1 < Rz, Ry ≤ 0,5μm
Rr & λc for
0.8mm 0.8 < Rmax, Rz ≤ 6.3μm ——— not defined 0,5 < Rz, Ry ≤ 10μm
peak height parameter
2.5mm 6.3 < Rmax, Rz ≤ 25μm ——— not defined 10 < Rz, Ry ≤ 50μm
Surface Texture Contour Measuring Instruments
0.25mm optional 0.0063 < Sm ≤ 0.05μm not defined 0,02 < Ra ≤ 0,1μm
Rr & λc for Ra on 0.02 < Sm ≤ 0.16μm 0,1 < Ra ≤ 2μm
0.8mm Ra ≤ 12.5μm not defined
non-periodic profile
2.5mm 12.5 < Ra ≤ 100μm 0.063 < Sm ≤ 0.5μm not defined 2 < Ra ≤ 10μm
3.2 125 3.2 N8
Indication of Ra 1.6 63 Ra 1.6 - 3.2 1.6 N7
in case of 1.5 < Ra < 3.1μm
Other parameters ——— (Peak count Pc) S, Δa, λa, λq S, Δa, λa, λq,
Lo, D
average value of all average value of all ———
Average sampling lengths sampling lengths not defined
Comparison rule of
measured value with 16% rule ——— ——— not defined 16% rule default
tolerance limits
Maximum rule ——— ——— not defined Max rule for parameter
with suffix "max"
236
BS1134 part 1-’88 DIN4768-’90 JIS B0601-’94 ASME B46.1-’95 ISO4287:’97 (JIS B0601:’01)
BS1134 part 2-'90 DIN4771-'77 JIS B0031-’94 ISO4288:’96 (JIS B0633:’01)
DIN4775-'82 ISO12085:’96 (JIS B0631:’00)
DIN4776-’90 ISO13565’s, (JIS B0671’s)
DIN4777-’90 ISO1302:’02
former U.K. former Germany former Japan U.S.A. EU, U.K. & Japan
Analog signal Digital data Digital data Digital data with λs filter Digital data with λs filter
without filtering without filtering without filtering
——— 0,5, 1,5, 5, 15 ——— ——— = 1 sampling length
& 50mm = Length of the measured feature
——— Pt ——— ——— Pt, Pz(=Pt)
2RC Phase correct Phase correct Phase correct (or 2RC) Phase correct
λB λc λc λc λc
Rr Rc Rr Cutoff length : R Rr
Re = 5 ×Rr
Re = 5 ×Rr 5 ×Rc Re = 5 ×Rr L = 5 ×R Calculate for each sampling length Rr
——— Rt Maximum height Ry Rt Maximum height Rz in 1 Rr
in 1 Rr or total height Rt in 1 Re
Maximum two point
Ry height Rmax ——— Rmax Rz max
0,1 < Rz ≤ 0,5μm 0,1 < Rz ≤ 0,5μm 0.1 < Rz, Ry ≤ 0.5μm 0.02 < Ra ≤ 0.1μm 0.1 < Rz ≤ 0.5μm
0,5 < Rz ≤ 10μm 0,5 < Rz ≤ 10μm 0.5 < Rz, Ry ≤ 10μm 0.1 < Ra ≤ 2μm 0.5 < Rz ≤ 10μm
10 < Rz ≤ 50μm 10 < Rz ≤ 50μm 10 < Rz, Ry ≤ 50μm 2 < Ra ≤ 10μm 10 < Rz ≤ 50μm
Ra Ra Ra Ra Ra
0,02 < Ra ≤ 0,1μm 0,02 < Ra ≤ 0,1μm 0.02 < Ra ≤ 0.1μm 0.02 < Ra ≤ 0.1μm 0.02 < Ra ≤ 0.1μm
0,1 < Ra ≤ 2μm 0,1 < Ra ≤ 2μm 0.1 < Ra ≤ 2μm 0.1 < Ra ≤ 2μm 0.1 < Ra ≤ 2μm
2 < Ra ≤ 10μm 2 < Ra ≤ 10μm 2 < Ra ≤ 10μm 2 < Ra ≤ 10μm 2 < Ra ≤ 10μm
Sm ——— Sm Sm RSm
tp ——— tp tp Rmr(c)
Htp, Δa, SAE Peak PPI, Rδc, Rmr, Rpk, Rvk, Rk, Mr1, Mr2,
S ——— S Peak density Pc Rpq, Rvq, Rmq
average value of all
——— ——— sampling lengths not defined average value of all sampling lengths
16% rule 16% rule for Ra, Rz ——— not defined 16% rule default
Max rule for parameter Max rule for
with suffix "max" Rmax ——— not defined Max rule for parameter with suffix "max"
237