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® STP4NB80FP
N - CHANNEL 800V - 3Ω - 4A - TO-220/TO-220FP
PowerMESH MOSFET
TYPE V DSS R DS(on) ID
STP4NB80 800 V 3.3 Ω 4A
STP4NB80FP
www.DataSheet4U.com 800 V 3.3 Ω 4A
■ TYPICAL RDS(on) = 3 Ω
■ EXTREMELY HIGH dv/dt CAPABILITY
■ 100% AVALANCHE TESTED
■ VERY LOW INTRINSIC CAPACITANCES
■ GATE CHARGE MINIMIZED
3 3
2 2
DESCRIPTION 1 1
Using the latest high voltage MESH OVERLAY
process, STMicroelectronics has designed an
TO-220 TO-220FP
advanced family of power MOSFETs with
outstanding performances. The new patent
pending strip layout coupled with the Company’s
proprietary edge termination structure, gives the
lowest RDS(on) per area, exceptional avalanche
and dv/dt capabilities and unrivalled gate charge INTERNAL SCHEMATIC DIAGRAM
and switching characteristics.
APPLICATIONS
■ HIGH CURRENT, HIGH SPEED SWITCHING
■ SWITCH MODE POWER SUPPLIES (SMPS)
THERMAL DATA
TO-220 TO220-FP
o
R thj-case Thermal Resistance Junction-case Max 1.25 3.6 C/W
o
R thj-amb Thermal Resistance Junction-ambient Max 62.5 C/W
o
R thc-sink Thermal Resistance Case-sink Typ 0.5 C/W
o
Tl Maximum Lead Temperature For Soldering Purpose 300 C
AVALANCHE CHARACTERISTICS
Symbol
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Parameter Max Value Unit
I AR Avalanche Current, Repetitive or Not-Repetitive 4 A
(pulse width limited by T j max)
E AS Single Pulse Avalanche Energy 230 mJ
(starting T j = 25 o C, I D = I AR , V DD = 50 V)
ON (∗)
Symbol Parameter Test Conditions Min. Typ. Max. Unit
V GS(th) Gate Threshold Voltage V DS = VGS ID = 250 µA 3 4 5 V
R DS(on) Static Drain-source On V GS = 10V ID = 2 A 3 3.3 Ω
Resistance
ID(on) On State Drain Current V DS > I D(on) x R DS(on)max 4 A
V GS = 10 V
DYNAMIC
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STP4NB80/FP
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SWITCHING OFF
Symbol Parameter Test Conditions Min. Typ. Max. Unit
t r(Voff) Off-voltage Rise Time V DD = 640V ID = 4 A 12 17 ns
tf Fall Time R G = 4.7 Ω V GS = 10 V 9 13 ns
tc Cross-over Time 16 22 ns
Safe Operating Area for TO-220 Safe Operating Area for TO-220FP
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STP4NB80/FP
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STP4NB80/FP
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STP4NB80/FP
Fig. 1: Unclamped Inductive Load Test Circuit Fig. 2: Unclamped Inductive Waveform
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Fig. 3: Switching Times Test Circuits For Fig. 4: Gate Charge test Circuit
Resistive Load
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STP4NB80/FP
mm inch
DIM.
MIN. TYP. MAX. MIN. TYP. MAX.
A 4.40 4.60 0.173 0.181
C 1.23 1.32 0.048 0.052
D 2.40 2.72 0.094 0.107
E 0.49 0.70 0.019 0.027
www.DataSheet4U.com F 0.61 0.88 0.024 0.034
F1 1.14 1.70 0.044 0.067
F2 1.14 1.70 0.044 0.067
G 4.95 5.15 0.194 0.202
G1 2.40 2.70 0.094 0.106
H2 10.00 10.40 0.394 0.409
L2 16.40 0.645
L4 13.00 14.00 0.511 0.551
L5 2.65 2.95 0.104 0.116
L6 15.25 15.75 0.600 0.620
L7 6.20 6.60 0.244 0.260
L9 3.50 3.93 0.137 0.154
M 2.60 0.102
DIA. 3.75 3.85 0.147 0.151
P011CI
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STP4NB80/FP
mm inch
DIM.
MIN. TYP. MAX. MIN. TYP. MAX.
A 4.4 4.6 0.173 0.181
B 2.5 2.7 0.098 0.106
D 2.5 2.75 0.098 0.108
www.DataSheet4U.com E 0.45 0.7 0.017 0.027
F 0.75 1 0.030 0.039
F1 1.15 1.7 0.045 0.067
F2 1.15 1.7 0.045 0.067
G 4.95 5.2 0.195 0.204
G1 2.4 2.7 0.094 0.106
H 10 10.4 0.393 0.409
L2 16 0.630
L3 28.6 30.6 1.126 1.204
L4 9.8 10.6 0.385 0.417
L6 15.9 16.4 0.626 0.645
L7 9 9.3 0.354 0.366
Ø 3 3.2 0.118 0.126
E
A
D
B
L3
L6
L7
F1
¯
G1
G
H
F2
1 2 3
L2 L4
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STP4NB80/FP
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Information furnished is believed to be accurate and reliable. However, STMicroelectronics assumes no responsibility for the consequences
of use of such information nor for any infringement of patents or other rights of third parties which may result from its use. No license is
granted by implication or otherwise under any patent or patent rights of STMicroelectronics. Specification mentioned in this publication are
subject to change without notice. This publication supersedes and replaces all information previously supplied. STMicroelectronics products
are not authorized for use as critical components in life support devices or systems without express written approval of STMicroelectronics.
The ST logo is a trademark of STMicroelectronics
http://www.st.com
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