7.

ULTRASONIC TESTING (UT)

7.1 Introduction
In this method, ultrasound (20,000Hz) is used to find the defect up to 5000mm. Non-
porous materials only can applicable for this process. We can apply this method for any material if the
velocity of the material is known.
We can say the depth of the defect, but can’t say the nature of the defect.
7.2 Procedure
ASME Section V article 4 (Weld Material) & 5 (Raw material)
7.3 Standards
ASME Section V article 23
7.4 Types of Sound

Subsonic <16 Hz Non-audible Frequency

Sonic 16 – 20000 Hz Audible Frequency with Sound
Ultrasonic or Supersonic > 20000 Hz Non-audible Frequency

• The sound energy is introduced & propagates through the materials in the form of waves.
• Whenever the sound waves meet another interface of different acoustic impedance part of
energy will be reflected back.
• The same occurs when it meets cracks, lamination or any other discontinuities.
• Sound generated above 20,000 Hz is called Ultrasound.
• The reflected wave signal is transformed into electrical signal by the transducer & is
displayed on a screen.
7.5 Principle
Acoustic Impedance mismatch
↓ ↓ ↓
Sound Resistance Difference
Acoustic Impedance and Energy Reflections

Another important parameter in ultrasonic testing is the acoustic impedance of the test
materials. When a sound beam impinges upon an interface between two materials, not all of the energy is
55
reflected, but a portion of it passes into the second material. This latter statement is true expect for an
interface between a solid or a liquid and a gas, such as air, at which interface virtually 100 percent
reflection occurs. The amount of energy passing into the second material depends on the acoustic
impedance Z and it is the product of the density of the material and velocity of sound in the material.
Z = ρ x v (gm/cm2.sec) x 106
Where, ρ - Density in gm/cm3 and
v - Velocity of the ultrasonic wave in cm/sec.
The percentage of the incident sound that is reflected at an interface depends on the mismatch in
impedance Z1/Z2 and the angle of incidence. Thus, the amount of energy reflected, when the angle of
incidence is 90o (normal), may be calculated as follows:
Reflected Energy (Re) = (Z2 – Z1)2 / (Z2 + Z1)2
To illustrate that conditions are favorable to finding most flaws with ultrasound, the following
calculation determines the reflected energy when the sound beam reflects at an interface between steel and
air.

Density Velocity Z
330 m/sec
Air 0.0013 gm/cm3 Z1=42.9 gm/cm2.sec
(3.3x104 cm/sec)
6000 m/sec
Steel 7.8 gm/cm3 Z2=4.68x106 gm/cm2.sec
(6x106 cm/sec)

Re = (4.68 x 106 – 42.9)2 / (4.68 x 106 + 42.9)2

= 1.009 ≈ 1
This means that at this interface, practically 100 percent of the sound energy is reflected.
Z1 = First material acoustic impedance
Z2 = Second material acoustic impedance
It is possible for a large quartz inclusion in aluminum to be practically of sound striking the
interface being reflected. It is evident that certain inclusion materials, in selected base materials, can easily
be overlooked or misinterpreted during ultrasonic inspection. Also note that at any water to steel or
aluminum interface, such as in immersed testing, approximately as percent of the sound impinging upon
the front or entry surface is reflected. Therefore, only 12 percent of the incident sound energy enters the
part to perform the interrogation.

56
7.6 Generation of ultrasonic sound energy

Sound is created when something vibrates.

Short pulse
( < 1 µs )

7.7 Ultrasonic Transducers

When electrical supply is given to the crystal, it will start to vibrate. Then sound will
produce due to that vibration. The frequency of this sound is more than 20KHz. So, this is called as
Ultrasonic sound. This effect is known as the Piezoelectric Effect.
Electrical Piezoelectrical crystal Ultrasonic wave
energy

7.8 Crystal Material

1. Quartz or Silicon oxide (SiO3)
2. Lithium sulphate (LiSo4)
3. Lead Zirconate (PbZrO3)
4. Lead Zirconate Titanate (PbZO3TO3)
5. Barium Titanate (BaTiO3)

7.9 Fundamentals of Wave

1. Wavelength (λ)

The distance covered by one complete cycle.

λ =ν/f

57
 v – Velocity
f - frequency
Shorter λ - Less penetration & Smaller flaws can be detected.
Larger λ - More penetration & larger flaws can be detected.
2. Amplitude
Maximum displacement of the wave from their equilibrium position.
3. Frequency (Hz)
Number of cycles per second.
Unit: HZ or CPS.
4. Velocity (m/s)
It is the rate at which the speed of sound energy is transmitted in a medium.

7.10 Propagation of Sound

Crystal Focus Angle of divergence

Accoustical axis
6
D0

N
Near zone Far zone

Dead Zone
Dead zone is the first zone which is occurs the starting stage of the sound & it is
minimized by the damping medium behind the crystal.
Near Zone
Beyond the dead zone, near zone occurs. In this region, the sound intensity is variable
owing to wave interference, therefore flaws lying in this zone may appear smaller or larger than their actual
size.

N = D2/4λ

D - Diameter of crystal
λ - Wavelength of sound
Far Zone
Beyond the near zone the far zone exists, in this region the beam divergence occurs,
resulting in delay in the sound intensity as the distance from the crystal increased.

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7.11 Damping medium
This is the part in the probe, which is used to reduce the damaging of the crystal. It will
absorb the unwanted noise waves. This is made up of epoxy tungsten.
7.12 Types of Waves
Though there are many different modes of wave propagation, the table summarizes the
four types of waves that are used in NDT.

Wave Type Particle Vibration

1. Longitudinal (Compression) Parallel to wave direction
2. Transverse (Shear) Perpendicular to wave direction
3. Surface (Rayleigh) Elliptical orbit - symmetrical mode
4. Plate (Lamb) Component perpendicular to surface

1. Longitudinal Waves
• This type of wave is produced by normal or T/R Probe.
• The direction of produced sound is parallel to the particle of motion.
• It propagates in solid, liquid & gases.
• Depth of penetration will be high.
2. Shear Waves
• This type of wave is produced by Angle Probe only.
• The direction of sound is perpendicular to particle of motion.
• Propagates only in solid and liquid.
• Depth of penetration is half of longitudinal waves.
3. Surface waves
• This is used to find the surface defects only (Up to 2mm).
4. Plate waves
• This wave is only for the small plates (Up to 6mm).
7.13 Types of Probes

1. Normal probe
2. T/R Prob
3. Angle Probe
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 Socket Delay / protecting face
Crystal Electrical matching
Damping Cable

Normal probe TR-Probe Angle probe

7.13.1 Normal Probe

• It is producing longitudinal wave
• It has single crystal (For both transmission and receiving)
• Used for monitor the raw material discontinuities only
• Dead zone will be high in normal probe
• All the echoes will come

7.13.2 T/R Probe

• It producing longitudinal wave
• It has two crystal (For transmission and receiving)
• Dead zone is very less
• Used to measure thickness of the job
• Used to monitor corrosion, erosion & pitting
• T-R Probe has better near surface resolution by increasing roof angles (5 to 12º)
• In this probe, there is no initial echo

7.13.3 Angle Probe

• It has single crystal (For both transmission and receiving)
• Based on angle it has three types of probe (45º,60ºand 70º)
• Used for welded jobs
• In this probe, there is no backwall echo
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 Backwall
Types of Probe Initial Echo Defect Echo
Echo
Normal Probe ✓ ✓ ✓
T/R Probe x ✓ ✓
Angle Probe ✓ ✓ x

7.14 Types of Mode

Normal probe - Single crystal - Single mode
T/R Probe - Double crystal - Dual mode
Angle probe - Single crystal - Single mode

7.15 Factors affecting the propagation of sound

General
Dependent on the density & Elastic properties of that materials & types of waves
transmitted.
Factors
• Test materials grain size.
• Attenuation (Loss of Energy)
• Acoustic impedance of the test material.
7.16 Total Attenuation Loss
Attenuation is defined as the loss in intensity of the ultrasonic beam.
Factors
• Scattering
• Absorption
7.17 Acoustic Impedance
Z is the resistance of a material to passage of ultra sound.
Z=ρxv
Where, ρ – Density, v - Velocity.
7.18 Decibel (Db)
Db is a logarithmic base unit to compare sound intensities.
Db = 20 log 11 H1/H2.
H1 = 100%
7.19 Couplant
It is used to reduce the air gap between the probe and the crystal to giving a proper
penetration of ultrasound to the material.
Example: Water, Oil, Grease, Polycell, Glycerin, etc.
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7.20 Types of Cable (2 Meters length)
1. Lemo cable (Lemo to mini lemo).
2. BNC (Bayonet Neill Concelman) or Twist type.
7.21 Snell’s Law

VL1 - Incident Beam

VL1’ - Reflected Beam
VL2 - Refracted Beam
VL2’ - Penetrated Beam
VL2’
7.22 Important Factors
SP - Sound Path in mm
SD - Surface Distance or Skip Distance in mm
D - Depth in mm
7.23 Probe Selection

Sl. No Low frequency High frequency

1 High Wave length
2 More beam spread
3 Better penetrant
4 Shorter near zone
5 Less attenuation
6 Less sensitivity
7 Longer dead zone
Shorter wave length
Less beam spread
Shorter penetrant
Longer near zone
More attenuation
Higher sensitivity
Shorter dead zone

7.24 Types of Testing

1. Pulse echo technique

2. Through transmission technique
3. Resonance technique

7.25 Ultrasonic flow Detectors (Pulse Echo Technique)

• Pulse generator (Ultra Sound).

• Receiver & its amplification.
• Display system.

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 Amplifier

Screen
IE Horizontal
BE sweep

Clock

Pulser
Probe

Workpiece

Depending on the display of information, pulse echo equipments divided into

1. A - Scan = Depth in X- axis & Amplitude in Y- axis

2. B - Scan = C.S view / Side view of material being tested
3. C - Scan = Plan view /Top view of being tested.

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 The interpretation of pulse-echo data is relatively straightforward for B-scan and C-scan
presentation. While internal echoes or loss of back reflection or both are interpreted as flaw indications.
Flaw depth is measured as the distance from the front reflection to a flaw echo, with the latter representing
the front surface of the flaw. The length of a flaw can be measured as a proportion of the scan length or can
be estimated visually in relation to total scan length or to the size of a known feature of the test piece. The
position of a flaw can be determined by measuring its position along the scan with respect to either a
predetermined reference point or a known feature of the test piece.
C-scan presentations are interpreted mainly by comparing the X and Y coordinates of any
flaw indication with the X and Y coordinates of either a predetermined reference point or a known feature
of the test piece. The size of a flaw is estimated as a percentage of the scanned area. If a known feature is
the size or position reference for the interpretation of either B-scan or C-Scan data. It is presume that this
feature produces an appropriate echo image on the display. In contrast to normal B-Scan and C-Scan
displays, A - Scan displays are sometimes quite complex. They may contain electronic noise, Spurious
echoes or extra echoes resulting from scattering or mode conversion of the transmitted or interrogating
pulse, all of which must be disregarded in order to focus attention on any flaw echoes that may be present.
Furthermore, flaw echoes may exhibit varying shapes and amplitudes.
Accurate interpretation of an A-Scan display depends on the ability of the operator to:

1. Recognize the type of flaw based on echo shape or echo intensity effects.
2. Determine flaw location by accurately measuring echo position on the time trace.
3. Estimating flaw size, mainly from echo amplitude with or without simultaneously
manipulating the search unit.
Assess the quality of the test piece by evaluating the A-Scan data in terms of appropriate specifications or
reference standards.
The shape of the echo and height of the echo is determining the nature of discontinuity is
present in the material under test. However, the shape and size of the echo depends on the orientation of
the discontinuity. Echo shape is primarily affected by the shape, orientation and sound-reflecting
characteristics of an interface. Metal/air interface produces sharp indication if the interfaces are relatively
smooth and essentially parallel to the front surface. If an interface is curved (such as surface of a large
pore) or rough (such as crack, seam or lamination) or if it is not ideally reflecting (such as surface of a
metallic inclusion or a slag inclusion), the interface will produce a broadened echo indication. If the
interface is smaller in area then the cross section of the ultrasonic beam or if ultrasonic waves are
transmitted through the interface, a back –surface echo will appear to the right of the flaw echo on the
oscilloscope screen.
However, if the flaw is large than the ultrasonic beam or if the back surface is not normal
to the direction to the wave travel, no back reflection will appear to the screen. Often, the amplitude of a
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broad indication will decrease with increasing depth, especially when the echo is from a crack, seam or
lamination rather than an inclusion. Sometimes, especially if the echo is from a spherical flaw or from an
interface that is not at right angles to the sound beam, the echo amplitude will increase with the depth.
Echo amplitude, which is a measure of the intensity of a reflected sound beam, is a direct
function of the area of the reflecting interface for flat parallel reflectors. If the interface is round or curved
or is not perpendicular to the sound beam, echo amplitude will be reduced. The effect of roughness, shape,
and orientation of the interface on echo amplitude must be understood because the factors introduce errors
in estimates of flaw size.
Spurious Indications from reflections or indications of sources other than discontinuities
are always a possibility. Reflections from edges and corners, extra reflections due to mode conversion, and
multiple reflections from a single interface often look like flaw indications, sometimes, these false or non-
relevant indications can be detected by correlation of the apparent flaw location with some physical feature
of the test piece. On other occasions, only the experience of the operator and thorough preliminary analysis
of portable flaw types and locations can separate non-relevant indications due to echoes from actual flaws.
As a rule, any indication that remains consistent in amplitude and appearance as the search unit is moved
back and forth on the surface of the test piece should be suspected of being a non-relevant indication if it
can be correlated with a known reflective or geometric boundary, Non-relevant indications are most likely
to occur in certain type of inspection- for example, in longitudinal wave inspection of complex shape test
piece, inspection of parts mixed longitudinal and shear waves may be present and various applications of
shear wave or surface wave technique. There are certain other type indications that may interfere with the
interpretation of A-scan data.
All electronic circuits generate a certain amount noise consisting of high-frequency
harmonics of the main signal frequency. Electronic noise is generally of low amplitude and troublesome
only when the main signal is also of low amplitude. In ultrasonic inspection, electronic noise can appear on
an A-scan display as a general background, or waviness (grass), in the main trace at all is more pronounced
at the higher gain setting. Many instruments are equipped with reject circuits that filter out grass, although
with some attendant loss of echo signal amplitude. When reject circuits are used, they should be adjusted
so that grass is reduced only enough not to be a hindrance. If too much rejection is used, small amplitude
echoes will be suppressed along with the grass, and there will be a loss in sensitivity of the inspection
technique and the linearity of the instrument will be affected.
A second type of interference occurs when coarse-grain materials are inspected.
Reflections from the grain boundaries of coarse grain materials can produce spurious indications
throughout the test depth. This type of interference is called hash, is most often encountered in coarse –
grain steels or non-ferrous metals. Sometimes hash can be suppressed by adjusting the frequency and pulse
length of the ultrasonic wave so that the sound beam is less sensitive to grain-boundary interfaces.

65
Normal Beam Inspection

Pulse-echo ultrasonic measurements can determine the location of a discontinuity in a part

or structure by accurately measuring the time required for a short ultrasonic pulse generated by a
transducer to travel through a thickness of material, reflect from the back or the surface of a discontinuity,
and be returned to the transducer. In most applications, this time interval is a few microseconds or less. The
two-way transit time measured is divided by two to account for the down-and-back travel path and
multiplied by the velocity of sound in the test material. The result is expressed in the well-known
relationship

d = (v x t) / 2 or v = 2d / t

Where, d - is the distance from the surface to the discontinuity in the test piece,

v - is the velocity of sound waves in the material, and

t - is the measured round-trip transit time.

Precision ultrasonic thickness gages usually operate at frequencies between 500 kHz and
100 MHz, by means of piezoelectric transducers that generate bursts of sound waves when excited by
electrical pulses. A wide variety of transducers with various acoustic characteristics have been developed
to meet the needs of industrial applications. Typically, lower frequencies are used to optimize penetration
when measuring thick, highly attenuating or highly scattering materials, while higher frequencies will be
recommended to optimize resolution in thinner, non-attenuating, non-scattering materials.

In thickness gauging, ultrasonic techniques permit quick and reliable measurement of

thickness without requiring access to both sides of a part. Accuracy's as high as ±1 micron or ±0.0001 inch
can be achieved in some applications. It is possible to measure most engineering materials ultrasonically,
including metals, plastic, ceramics, composites, epoxies, and glass as well as liquid levels and the thickness
of certain biological specimens. On-line or in-process measurement of extruded plastics or rolled metal
often is possible, as is measurements of single layers or coatings in multilayer materials. Modern handheld
gages are simple to use and very reliable.

Angle Beams 1

Angle Beam Transducers and wedges are typically used to introduce a refracted shear
wave into the test material. An angled sound path allows the sound beam to come in from the side, thereby
improving detect ability of flaws in and around welded areas.

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Angle Beams 2

Angle Beam Transducers and wedges are typically used to introduce a refracted shear
wave into the test material. The geometry of the sample below allows the sound beam to be reflected from
the back wall to improve detect ability of flaws in and around welded areas.

Angle beam techniques are used for testing welds, pipe or tubing, sheet and plate
material and specimen of irregular shape (such as weld) where straight beam are unable to contact all the
surface. Angle beam techniques are also useful in flaw location where there is a loss of back reflection, the
time base on the oscilloscope must be carefully calibrated because in angle beam testing no back-reflection
echo to provide a reference for depth estimate of the flaw. Usually an extended time base is used so that
flaws are located in one or two skip distances from the search unit. The above figure shows how the shear
wave from an angle beam transducer progress through a progress through a flat test piece- by reflecting
from the surface at points called nodes.
The linear distance between two successive nodes on the same surface is called the ‘skip
distance’ and is important in defining the path over which the transducer should be moved for reliable and
efficient scanning. The skip distance can easily be measured by using a separate receiving transducer to
detect the nodes or by using an angle beam test block or it can be calculated. Moving the search unit back
and forth between one –half skip distance and one- skip distance from an area of interest can be used not
only for the purpose of defining the location, depth, and size of a flaw but also for the general purpose of
initially detecting flaws. Sometimes search unit is swiveled in an arc for hitting the reflector in

67
perpendicular. If the flaw is a slag inclusion, swiveling the search unit on the same spot causes the echo
indication to vary randomly; some peak rise and other fall and the position of the signal shifts in either
direction of the time. If the flaw is a crack, swiveling the search unit in either direction away from the
direction of maximum echo amplitude cause the peak to fall rapidly, accompanied by a slight shift to the
right of the time trace.

7.26 Material Velocity

Materials Shear Velocity Longitudinal Velocity

Sl. No
Name (Angle Probe) (Normal & T/R Probe)
1 Aluminum 3130 6320
2 Brass 2120 4430
3 Cast iron 2200 5300
4 Perspex (Glass) 1430 2730
5 Mild Steel 3250 5920
6 Stainless Steel 3130 5740

7.27 Parts and Controls of Einstein-II TFT

16 17 18 19
14
15

13

12
3

11

2 1
0

9
1

5 6 7 8 20

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 1. POWER key: Einstein-II TFT can be switched ON and OFF using this key.
2. ZOOM key: By pressing this key A-Scan spreads over to full screen. Menu parameters
disappear from LCD and only A-Scan is displayed. By pressing any other key, A-Scan is
restored to normal size and menu parameters are displayed.
3. FREEZE key: By pressing this key A-Scan can freeze and defreeze. It is possible to freeze
the desired A-Scan and then Print it.
4. LOCK key: By pressing this key all function (keys) gets locked which prevents accidental
pressing of any key. To unlock, simultaneously press Step key (9) and LOCK key (4).
5. LCD Screen: It displays A-Scan Trace pattern and Menu Parameters.
6. Battery Status: When all the three parts empties, then the battery needs to be Indicator
recharged.
7. Gain Step: This location displays Gain Step value. This value can be changed by pressing
“dB STEP” (10) key. It follows 0.5, 1, 2, 6, 12- and 20-dB Step sequence.
8. Menu keys: By pressing these keys the Menu can be changed.
9. Hot key: When this key is pressed simultaneously with any other parameter key then the
change in value takes place in larger steps.
10. dB STEP key: Any Gain step out of 0.5, 1, 2, 6, 12 or 20 dB can be selected using this key.
11. GAIN UP/DN: Gain can be incremented/decremented using these keys in the step selected
by dB STEP key.
12. UP/DN key: Respective parameters can be incremented or decremented using these keys.
13. REJ LED: Rejection function activation is indicated by this LED. When Rejection value
is zero then LED is OFF. When rejection value is not zero then LED illuminates.
14. MON LED: It is visual indication of MONITOR getting triggered.
15. Parameter: Al functions (parameters) values are displayed in this area of LCD
16. RX Connector: A probe is connected to the Receiver of Einstein-II TFT through this
connector.
17. TX Connector: A probe is connected to the Transmitter f Einstein-II TFT through this
connector.
18. Charge Connector: Connect the charge here.
19. RS-232 Connector: Serial interface connector. For print-out on serial PC printer/computer
connect suitable cable on this connector.
20. Battery: Battery is fitted on this compartment
7.28 Operation detail
Einstein-II TFT is user friendly, menu driven Ultrasonic Flaw Detector. To access any
parameter, various menus are available. Details of all menus and parameters are as per below.

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MENU 1
First menu is Basic menu. In this menu, Basic functions of an Ultrasonic Flaw Detector
(UFD) like Range, Fine Range, Delay and Gain function are covered.
1. ZERO: It is to calibrate Artificial zero of the probe.
2. RANGE: The required test range can be set directly in terms of mm. The range available
for steel is from 10 mm to 5 meter in steps of 1 mm or 10 mm.
3. VELOCITY: The required velocity can be set directly in terms of m/s. The Velocity
adjustments range is 1000 m/s to 9000 m/s.
4. DELAY: Partial Range can be set using these keys. Exact shift/delay in mm is displayed
at the bottom.
5. GAIN STEP: Gain step value can be set by pressing GAIN STEP key, it follows dB in
step of 0.5, 1, 2, 6, 12 or 20 dB.
6. GAIN: Gain can be increased/decreased as per value of step by pressing GAIN UP/DN
keys. For setting of REF (Reference) gain refer DAC Setting.
Example: Einstein-II TFT is to be calibrated for 100 mm Test Range using Single crystal (Normal) probe.
• Set required range to 100mm using RANGE UP/DN keys.
• Couple the probe on 25mm thickness of V1 reference block and set first echo at 25mm
using ZERO UP/DN keys.
• Set 4th echo at 100 mm using VELOCITY UP/DN keys, if required.
• Repeat above two steps until both the echoes are at their respective positions.
• Amplitudes of the echoes can be varied using GAIN keys.
MENU 2
1. GATE 1: Gate can be change to PLOGIC, NLOGIC, DAC, DAC-6, DAC-14, triggers,
EXPANDS or OFF.
i. P-LOGIC: When PLOGIC is selected, the MONITOR is triggered if an echo is present
within the gate and its height crosses the set Threshold Level.
ii. N-LOGIC: When NLOGIC is selected, the MONITOR is triggered if there is no echo
within the gate or the height is lower than he Threshold Level.
ii. DAC: If DAC is made ON and DAC is selected then if any echo signal cross DAC
then monitor gates trigger.
iii. DAC-6: If DAC is made ON 6/14 and DAC-6 is selected then if any echo signal cross
DAC-6 dB curve then monitors gates trigger.
iv. DAC-14: If DAC is made ON 6/14 and DAC-14 is selected then if echo signal cross
DAC- 14 dB curve then monitor gates trigger.
v. EXPAND: When EXPAND is selected then the Scale expansion is activated and the
GATE width is expanded to Full-screen width for a magnified view.
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 2. START: Gate starting position can be set using START UP/DN keys. Using these keys
Gate start can be directly set in terms of mm.
3. END: Gate End position can be set using END UP/DN keys. Using these keys Gate end
can be directly set in terms of mm.
4. LEVEL: Gate Threshold Level can be directly set in terms of the percentage of the Full-
scale Height (FSH).
Example: The MONITOR to be triggered when any echo crosses the 50% FSH between 35mm and
80mm.
• In the Gate setting, select PLOGIC using GATE UP/DN keys.
• Set Gate START to 35mm using START UP/DN keys.
• Set Gate END to 80mm using END UP/DN keys.
• Set Gate LEVEL to 50% using LEVEL UP/DN keys.
MENU 3
1. GATE 2: Gate can be changed to PLOGIC, NLOGIC, or OFF.
2. PLOGIC: When PLOGIC is selected, the MONITOR is triggered if an echo is present
within the gate and its height crosses the set Threshold Level.
3. NLOGIC: When NLOGIC is selected, the MONITOR is triggered if there is no echo
within the gate or the height is lower than the Threshold Level.
4. START: Gate starting position can be set using START UP/DN keys. Using these keys,
Gate start can be directly set in terms of mm.
5. END: Gate End position can be set using END UP/DN keys. Using these keys, Gate end
can be directly set in terms of mm.
6. LEVEL: Gate Threshold Level can be directly set in terms of the percentage of the Full-
Scale Height (FSH).
MENU 4
1. MEMORY: Memory function can be selected A SCAN or SET-UP using MEMORY
UP/DN keys.
2. MEM NO: Desired memory location can be selected using MEM NO UP/DN keys.
When changing Memory no. If Data is stored and valid then asterisk (“*”) will be
displayed next to “MEM NO”.
3. ACTION: Required functions like SAVE, RECALL, SEND, PRINT or DELETE can be
selected using ACTION UP/DN keys.
4. ENTER: Using any of the ENTER UP/DN keys, the ACTION selected is performed.
Example: To SAVE current Calibration set-up in Memory no 3.
• Select SET-UP using Memory UP/DN keys.
• Set MEM NO to 3 using MEM NO UP/DN keys.
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 • Set ACTION to SAVE using ACTION UP/DN keys.
• Then press ENTER UP/DN key to store the current calibration set up at memory no. 3.
• Note: If data is already stored at this location, then the message will be displayed on LCD
screen as “OVER WRITE DATA” “YES - PRESS HOT KEY”, “NO – PRESS ANY
KEY”. So, press HOT KEY to overwrite data.
MENU 5
1. REJECT: For the rejection of unwanted signals. Using REJECT UP/DN keys Rejection
level can be set as per requirement. It can be set directly in terms of percentage of FSH.
Activation of this function is indicated by REJ LED (13).
2. SET REF: To set any A-scan pattern as a reference, achieve reference pattern, then set
SET REF ON, so reference pattern sets in background for easy comparison. A-scan
Pattern from Memory location can be recalled and set as a reference.
3. VIDEO: Echo signals can be selected to appear as line (ENVELOPE) or solid (FILLED)
using VIDEO UP/DN keys. In ENVELOP mode, echo signals appear same as in Analog
Ultrasonic Flaw Detector. In FILLED mode, echo signals look solid for better visibility.
4. MODE: Test Mode for the use of Single or Dual Crystal probes can be selected using
MODE UP/DN keys.
MENU 6
1. CLOCK: It is set to ON then date and time will be displayed at bottom of A-Scan.
2. COLOR: LCD Color combination can be selected using COLOR UP/DN keys.
3. HORN: Horn can be switched ON or OFF using HORN UP/DN keys. When HORN is
switched ON, then it gives out an audible alarm each time MONITOR is triggered.
4. BRIGHT: Brightness of LCD can be adjusted for better visibility using BRIGHT
UP/DN keys. Set Low brightness indoor application for the longer battery life.
MENU 7
1. DAC: DAC setting can be switched to DRAW, ON, ON 6/14 or OFF using DAC UP/DN
keys
i. DRAW mode, peak points of echo signals are selected. REF Gain When DAC DRAW
is selected and if gain is changed then that gain value it is stored as a Reference gain
ii. ON mode, the selected peak points are digitally connected to form a DAC curve
iii. ON 6/14 mode, -6dB DAC and –14dB DAC will be also displayed
iv. OFF mode, DAC curve will be not displayed on LCD
2. STRT G1: Start of the GATE 1 can be set using STRT G1 UP/DN keys. To select any
peak of the echo signal, move the gate on the echo signal and then press ENTER UP/DN
key. POINT value is automatically incremented to indicate next point (If GATE 1 is OFF
then turn to PLOGIC).
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 3. POINT: It indicates how many points are selected to draw DAC curve.
4. PRESS: Press ENTER UP/DN keys to accept the peak points selected by GATE1.
• Set Gain so that all four peaks are visible on the LCD screen above 5% FSH.
• Set DAC to DRAW using DAC UP/DN keys.
• Move cursor using STRT G1 UP/DN keys to cover the first echo. If GATE 1 is OFF
then switch to PLOGIC.
• Press ENTER UP/DN key to accept it and Point No. is incremented automatically.
• Repeat above two steps for second, third and fourth echo. Set DAC to ON using DAC
UP/DN key. Now DAC Curve will be displayed on LCD.
MENU 8
1. MEASURE: MEASURE setting can be switched to ON or OFF using MEASURE
UP/DN keys. In ON mode it will display thickness/distance of echo signal which is in-
side the gate. In OFF mode it will not display thickness/distance.
2. X-OFF: Set X-OFF value to same as Angle probe index point to Front face distance so
Surface Distance will be displayed on LCD will be distance from angle probe front face to
defect position.
3. ANGLE: Value to be set as per Angle of the probe. If angle value not zero and Measure is
set to ON then appropriate Surface and Depth of defect is calculated and display on LCD.
4. THICK: Thickness value should be set as per the thickness of the test piece, so as to
enable in calculation of depth/distance accounting for multiple skips.
Example: To measure Beam path, Surface and Depth distance when 45°. Probe is used.
• Go to GATE 1 menu and make Gate to PLOGIC/NLOGIC.
• Set Gate START and Gate END value in such a way so defect signal within the GATE.
• Set Gain or Threshold so height of the echo/defect beyond the GATE.
• Go to measure menu and set MEASURE to “ON”.
• Set angle value to 45 DEG. using angle UP/DN keys.
• Set appropriate THICK value so it can account multiple skips for DEPTH distance
calculation.
MENU 9
1. HUD: Head up Display is selected to ON then Thickness/Distance will be displayed in
big font at the top right of A-Scan area.
2. BEEP: Key press will be acknowledged by sound if BEEP is selected to ON. Otherwise it
will not give beep sound when it set to OFF.

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7.29 V1 Calibration
V1 Block (or) IIW V1 Block (Mild Steel)
IIW – International Institute of Welding

1. R - Range - 100 mm
2. A - Angle - 0º
3. M - Mode - Single (For Normal) or Dual (For T/R Probe)
4. T - Thickness - No Need (25 mm)
5. V - Velocity - 5920 m/s for Mild Steel
1. Penetration Check
By penetration check we can conclude that the probe can able to identify the given range
for any job.
2. Sensitivity Check
It can conclude that the probe can able to identify even smallest defect.
3. Resolution Check
By this check we are able to conclude that the probe is capable of identifying two or
more defects at the same location.

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7.30 V2 Calibration (IIW V2 Block)

1. R - Range - 125 mm
2. A - Angle - 45º or 60º or 70º
3. M - Mode - Single
4. T - Thickness - No Need (12.6 mm)
5. V - Velocity - 3250 m/s for Mild Steel
Aiming towards 25mm radius
Signals occurs at 25mm, 100mm, 175mm, 250mm, 325mm, 400mm.
Aiming towards 50mm radius
Signals occurs at 50mm, 125mm, 200mm, 275mm, 350mm, 425mm.

7.31 Distance Amplitude Correction Curve (DAC Curve)

DAC Block (Based on Job Thickness)

Block thickness Hole diameter Test Range

19mm 2.5 0 - 25mm

38mm 3.0 26 - 50mm

75mm 5.0 50 - 100mm

Example - 19 mm Block
Probe selection
Probe Angle (θ) = 90º - t (Job thickness)
Generally,
5 - 25mm = 70º
26 - 50mm = 60º
˃ 50mm = 45º

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SP - Sound Path
SP - t / cos θ
SD - Skip Distance or Surface Distance
SD - t x tan θ
19 mm Block
Hole Diameter - 2.4 mm
Length - 200 mm
Width - 80 mm
Thickness - 19 mm
Hole depth
D1 = 4.75 mm
D2 = 9.50 mm
D3 = 14.25 mm
D4 = T + 4.75 mm
D5 = T + 9.5 mm
D6 = T + 14.25 mm
T – Thickness of the DAC Block
By using those values, we need to draw a DAC Curve.

7.32 Plate Scanning

For Normal Probe and T/R Probe
Step 1: Measure the job thickness
Step 2: Machine Setup (Except RAMTV)
Step 3: V1 Calibration (Zero correction)
Step 4: Scanning the job

For Angle Probe

Step 1: Measure the job thickness
Step 2: Selection of Probe (θ = 90º - t)
Step 3: Machine Setup (Except RAMTV)
Step 4: V2 Calibration (Zero correction, X-OFF Value)
Step 5: HSP & FSP
HSP - Half Sound Path = t / cos θ
FSP - Full Sound Path = 2 x HSP
Step 6: Range (R) = 1.25 x FSP
Step 7: DAC Curve
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 Step 8: HSD & FSD
HSD - Half Skip Distance = t x tan θ
FSD - Full Skip Distance = 2 x HSD
Step 9: Scanning the job

7.33 Advantages
• It is sensitive to both surface and subsurface discontinuities.
• Minimal part preparation is required.
• It is nonhazardous to operators or nearby personnel.
• Portable - Inexpensive.
• Immediate result.
• Wide range of material thickness can be inspected.
7.34 Disadvantages
• High degree of skill required.
• Materials are rough, irregular in shape are difficult to inspect.
• Surface must be accessible to transmit ultra sound.
• Linear defect - undetected.
• Calibration needed.

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