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X-Ray Diffraction
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K
Characteristic radiation →
White K
Intensity radiation
due to energy transitions
in the atom
Mo 0.71
Cu 1.54
Co 1.79
Fe 1.94
Cr 2.29
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NaCl
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Powdering Samples
• The samples are powdered to give a random
sampling of ALL atomic planes (crystal faces)
• Statistically accurate given samples are
powdered finely AND randomly oriented on
sample holder
– Intensities are a reflection of d-spacing abundance
• Problems arise with minerals that may
preferentially orient on sample holder
– Micas and clays have special preparation techniques
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Detector
X-Ray
Source
Powdered
sample
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background radiation
Bragg’s Law
nλ = 2dsinθ
• n = reflection order (1,2,3,4,etc…)
• λ = radiation wavelength (1.54 angstroms)
• d = spacing between planes of atoms
(angstroms)
• θ = angle of incidence (degrees)
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nλ = 2dsinθ
(1)(1.54) = 2dsin(15.5 degrees)
1.54 = 2d(0.267)
d = 2.88 angstroms
background radiation
d-spacing Intensity
2.88 100
2.18 46
1.81 31
1.94 25
2.10 20
1.75 15
2.33 10
2.01 10
1.66 5
1.71 5
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Mixture of 2 Minerals
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Applications of XRD
• Unknown mineral ID
• Solid solution ID (e.g. feldspars, olivine)
• Mixtures of minerals
• Clay analyses
• Zeolites
• Crystallographic applications
• Phase purity
• Determination of crystallite size
• Structure determination
• …and much more!
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C xc 25,66698 0,02518
C w 2,04715 0,05158
C A 1096,71644 25,03718
C sigma 1,02358
C FWHM 2,41034
C Height 427,44841
20 30 40 50 60
2Cu()
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