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4.1 PHOTODETECTORS
Photodetectors or Photosensors are sensors of light or other electromagnetic
energy. Photodetectors has a PN junction that converts light photons into current. The
absorbed photons make electron hole pair in the depletion region.
When an electron-hole pair is generated due to the incident radiation, the pair
separated at the junctions as a result of the existence of electric field. As a result, it
generates open circuit voltage or short circuit current. This is the principle applied in
the photodiodes to produce both voltage and current in an external circuit.
Incident radiation
Electrodes
D
L
Figure 4.1
The geometry of the slab of a photo conducting material is shown in figure 4.1.
Let L W and D be respectively the length, width and thickness of the conducting material.
It consists of two electrodes on opposite faces.
4.2 ENGINEERING PHYSICS - II
The incident radiation falls on the opposite surfaces of the materials. The
detectorate the terminal devices and are used as light dependent resistors. The commonly
used symbol for a photo conductive detector consists of a resistance symbol with incident
arrows representing the radiations, as shown in figure. The detectors are available in
the form of photodiodes and photo transistors.
Photodetector Bias Circuit
The photodetector (P) is connected in series with a voltage source and a load
resistor RL as shown in figure. When a light radiation is incident on the photodetector,
whose energy is greater than E g, the increase in conductivity of the detector takes
place. As a result, the flow of current in the circuit leads to an increase in potential
across the load resistor RL. The same can be measured using a high impedance Voltmeter.
A blocking capacitor C is introduced in the output line to remove any dc components
while measuring the current in the circuit, due to time variations of the incident light.
P
C
Bias voltage
Output
RL voltage
The Sensitivity and linearity of the detector depends on R L. One can obtain the
optium value of RL by a fractional change in the resistance of the photo detector when
it is under illumination. When the change in the fractional resistance is less than 5%.
The sensitivity shows a large value at R L = R D, where R D is the resistance of
the photodetector. On the other hand, if the change in the resistance is large,
i.e., RL << RD, which is required for output voltage measurements.
Let Io and I be the intensities of the incident and transmitted radiations, respectively,
on the semiconductors detector materials. Therefore, the average generations of charge
carries, i.e., electron-hole pairs per unit volume is
r g = /v
Where is the quantum efficiency of the absorption process and v is the frequency of
radiation (=c/).
OPTO ELECTRONIC DEVICES 4.3
Applications
i) Photoconductivity detectors in the form of single crystal or polycrystal
materials are prepared in the form of Schottky barriers, n-p homojunctions,
n-p hetrojunctions, n-p-n, or p-n-p transistors with gain greater than I.
ii) The television camera vidicon and electrophotography are the two applications
in the device form.
iii) It is used to detect a variety of light and particle as a light controlled switch.
iv) The silver halide coated on the photographic film is also based on
photoconductivity.
Conduction band
(ii)
Donor level
Eg (i)
Acceptor level
(iii)
Valence band
Figure 4.3
Figure shows the energy diagram of a semiconductor having both acceptor and
donor impurities. If photons of sufficient energies illuminate this specimen,
photogeneration takes place.
4.4 ENGINEERING PHYSICS - II
ii) A photon may excite a donorm electron into the conduction band.
The last two transitions are called impurity excitations. The density of states
in the conduction and valence bands is much greater than the density of impurity
states. So photoconductivity is due principally to intrinsic excitation.
The minimum energy of a photon required for intrinsic excitation is the forbidden-
gap energy of the semiconductor material. Hence the minimum frequency v c cause
photoconduction is given by
hvc = Eg
hc/c = E g
c = 1.24/Eg
100
Relative response %
75
Ge
50
Si
25
0
0.5 1.0 1.5 2.0
Wavelength (m)
Figure 4.4
OPTO ELECTRONIC DEVICES 4.5
Figure 4.4 shows spectral response versus wavelength curve for Ge and Si.
If the wavelength of the radiation exceeds c, then the energy of the photon is
less than Eg, such a photon cannot cause a valence electron to enter the conduction
band. Hence c is called the critical, or cut-off wavelength, or long wavelength threshold,
of the material. For Si, E g = 1.1ev and c = 1.13m whereas for Ge, E g = 0.72 ev and
c = 1.73 m at room temperature.
Clear plastic
–
P +
Light
N R
(a) (b)
Figure 4.5
A photo diode consists of a P-N junction embedded in a clear plastic capsule [see
Figure 4.5(a)]. The symbol of a photo diode is shown in Figure 4.5(b)].
Light is allowed to fall upon one surface across the junction. All the sides of the
plastic capsule, excepting the illuminated one, are either painted black or enclosed in a
metallic case.
4.6 ENGINEERING PHYSICS - II
I d = I0 1 e vc kT
Hence, the volt-ampere characteristic of photo diode is given by
I = Is I 0 1 e vc kT
2
2000 Lumen/m
Diode current (mA)
2
1500 Lumen/m
2
1000 Lumen/m
Dark current
Reverse Voltage V
Figure 4.6
OPTO ELECTRONIC DEVICES 4.7
q I
R = Responsibility of the photodiode = h v . Thus R = .
P
Here = quantum efficiency of the diode
number of electron hole pair generated
= number of incident photons
= I/q/P/h v
hv = energy of the incident photon
q = charge of electron
4.8 ENGINEERING PHYSICS - II
Ohmic contact
P I N
Detector
id CD RL output
voltage
(a) (b)
Figure 4.7: PIN photodiode with reverse bias and its equivalent circuit
Figure shows the photodiode with reverse bias and its equivalent circuit.
Analysing the above circuit, the bandwidth is inversely proprortional to rise time ‘tr’.
0.35 0.35
Thus f3dB =
tr 2.19 R L C D
Radiation n
JC +
p – VCE
JE
n
Figure 4.8
10 2
10 mW/cm
8.0
Io Collector current. mA
6.0
5.0
4.0
2.0
1.0
0
0 5.0 10 15 20 25
VCE, Collector - emitter voltage, V
Figure 4.9
OPTO ELECTRONIC DEVICES 4.11
Uses
ii) They are also used to compare the intensities of different light sources made
for infrared detection.
which determines the band gap of the alloy. Similarly in the 0.92 - 1.65 m wavelength
range, In 1–x, Gax Asy P1–y alloy is used where y = 2.2 x and 0 x 0.47. Here y
determines the band gap of the alloy. Further the direct band gap semiconductors formed
by group IV and VI such as Pb Te and Pb Sn Te have been developed to design lasers
for the middle infrared region.
4.12 ENGINEERING PHYSICS - II
hC hC
Eg = hv =
(or) = E g
1.24
(m) = E eV
g
h
Fermi level
+ +
+ + V.B
Figure 4.10: Radiative recombination of the injected minority carriers
with the majority carriers in a forward biased p-n junction.
4.14 ENGINEERING PHYSICS - II
In LED, every injected charge carrier takes part in a radiative recombination and
hence gives rise to an emitted photon. In reverse bias, no carrier injection takes place
and consequently no light is emitted.
The number of photons emitted is proportional to the carrier injection rate or the
total current flowing. The wavelength of the emission is given by
hC hC
Ec – E v Eg
Eg
Doping with B, Al, Sc and Be in Ga As P gives rise to yellow, blue, green and red
emission reflectively. Further GaP, InP and CdS are also LED materials.
Ga As 1.4 0.9
The above LEDs are used in the optical fiber communication as light sources.
These have lifetime more than 10 5 hours.
OPTO ELECTRONIC DEVICES 4.15
nr 1
nr r r
1
nr
CS Ip
t1/2 = ln ln 2
Ip IS
and the 10 - 90 present rise time is given by
CS
t10 – 90 = ln 9
Ip
where Cs is the space-charge capacitance and it will be very small (350 pF). Further
q
= and Ip is the current used to drive the LED and is the minority carrier life
2 kT
time. In the high current limit,
t1/2 = ln 2 and t10–90 = ln 9
Thus the rise time depends on minority carrier life time. If the carrier life is
reduced, the rise time is also decreased as well as the band width of LED is increased
which results in the decrease of power output. The power bandwidth product,
1 hC
P J
r q
The P is constant for a given current injection level. Suppose doping in the
active layer is increased, then it reduces the radiative life time which increases the
LED band width. If the band width is increased, then the power is decreased. Faster
response LEDs have small rise time and hence their radiative life time is reduced. The
band width is increased and the power is reduced. Otherwise, the faster LEDs generally
emit less power than slow response LEDs.
Hetero junction LED structures
There are high radiance surface emitting hetero junction LEDs and edge emitting
double hetero junction LEDs.
i) Surface emitting LED
Fiber
Epoxy
Metallization
Substrate
n - GaAs
N - Ga Al As wide bandgap
Confinement p - Ga As narrow bandgap
layers
P - Ga Al As wide band gap
SiO 2 SiO 2
Isolation Isolation
Metallization
heat sink
This dual confinement gives high efficiency and high radiance. The Ga As layer
is the active layer or recombination region and is in the form of circular region. This
area is typically 20 to 50 m in diameter. These have high drive currents. The surface
emitting LED has a. radiation pattern as in the lambertion source which is isotropic with
a 1200 half power beam width. It we view the pattern from any direction, it is equally
bright.
ii) Edge emitting LED
Metallization
Confinement
layers Stripe contact
Substrate
Metallization SiO 2 isolation
Heat sink layer
Active area
LED output
Al
Plastic
Electrical contacts
SiO2 p-n
junction encapsulation
p
Substrate
Electrical contacts
Figure 4.13: LED Structure
OPTO ELECTRONIC DEVICES 4.19
2
1 n2 n n 2
Then fractional transmission, F = 1 1 2 0.13
4 n1 n1 n 2
f b
g
e c
Figure 4.14
The seven segment display is the popular one used in calculator and other display
systems such as clocks, wrist-watches, measuring instruments, etc.
3. LEDs are rugged and can therefore withstand shocks and vibrations.
5. They are very fast in operation. They can be switched on and off in a time
less than 1 nanosecond.
6. LEDs are available such that they emit light in different colours like red, green,
yellow and amber.
1. These are not suited for large area display because of their high cost.
2. When we compare with liquid crystal display, LEDs consume more energy.
Colour and
Material Bandgap LED structure
wave length (nm)
General properties
1. Liquid crystals are very sensitive to environmental conditions like temperature,
mechanical stress and electric fields. Any change in these parameters will
change the optical properties of liquid crystals.
2. Cholestric phase can change the colour of radiation when the temperature is
changed. This fact is used to measure temperature of the children as well as
used in thermography to detect breast cancer.
3. Nematic phase is widely used for displays. This is based on change of plane
of polarisation during the application of electric field.
Another important liquid crystal is phenyl cyano biphenyl which has pnematic form
between 18°C to 35°C. The liquid crystal displays are of two types:
1. Dynamic scattering display
2. Twisted nematic field effect display.
Now - a - days the dynamic scattering display is not used because it has shorter
life time, high power consumption and its operating voltage is around 15 V. It has been
used upto 1975. Let us see the twisted nematic field effect display system:
4.22 ENGINEERING PHYSICS - II
The liquid crystal material is kept in between two glass plates which are coated
with transparent tin oxide and they can act as electrodes. The top glass plate is rotated
through 90°. Therefore the liquid crystal molecules are also twisted through 90° when
there is no applied electric field (Figure 4.15(a)).
Above the top glass plate we have polarizer and below the bottom glass plate we
have analyser in crossed positions. Under no field conditions when light passes through
the liquid crystal cell through the crossed polariser and analyser the cell appears bright
due to additional phase difference introduced by twisting.
Light Light
Polariser
Polariser
Twisted nematic
liquid crystal
molecules
Analyser Analyser
Bright Dark
(a) (b)
When we apply electric field, the liquid crystal molecules are all oriented parallel
to the field direction and there is no twisting of molecules (Figure 4.15(b)). So the cell
appears dark due to the crossed polariser and analyser. Normally we are using
transparent type display in which the digits are appearing as black coloured ones in
white back ground.
2. It requires relatively little power since it is not generating light. For example,
in the case of LED display of 1 cm2 display area, the power consumption is
about 1 watt. But for liquid crystal display of 1 cm 2 display area, the power
consumption is less than 1 microwatt.
OPTO ELECTRONIC DEVICES 4.23
3. Since liquid crystal display can be in the form of thin films, the liquid crystal
display device has very small thickness.
4. It is very cheap.
Disadvantages
3. It can be viewed only when there is some light. Otherwise it cannot be viewed.
Table 6.4 shows the comparison between the liquid crystal display and LED display.
Table: 4.4: Comparison between LCD and LED displays
S.N LCD LED display
2. Suitable for large area display Not suitable for large area display.
5. At present colour displays are not Any colour display can be made
available
SOLVED PROBLEMS
1. Calculate the wavelength of emission from Ga As whose bandgap is 1.44 eV.
1.24 1.24
E g (eV) 0.8 eV
( m) 1.55
3. If the quantum efficiency at 1.3 µm wavelength of light is 0.65 and the number
of photons incident at this wavelength is 5 × 105, what is the number of electron-
hole pairs generated?
IT
Multiplication factor = M
IP
q q
Now IP = R P0 = P0 P0
h hC
IT 10 A
M = 41
I P 0.243 A
6. A silica optical fiber has a core refractive index of 1.50 and a cladding refractive
index of 1.47. Determine, (a) the critical angle at the core cladding interface,
(b) the N.A. for the fiber and (c) the acceptance angle in air for the fiber.
n2 1.47
The critical angle, c = sin 1 sin 1 78.5
n1 1.50
The numerical aperture N.A. = n12 – n 22 1/ 2
1.50 2 – 1.47 2
1/ 2
0.30
The acceptance angle in air, max = sin–1 N.A. = 17.4°.
7. Calculate the total number of guided modes propagating in the multimode
step index fiber having diameter of 50µm and numerical aperture of 0.2 and
operating at a wavelength of 1 µm.
2 2
d N.A. 50 10 – 6 0.2
N 4.9 4.9 –6 490
1 10
Hence the fiber can support approximately 490 guided modes. In the case of graded
index fiber, the number of modes propagated inside the fiber = (Nstep/2) = 245 only.
8. Suppose a fiber has a diameter of 5µm and its core refractive index = 1.450
and cladding refractive index = 1.447. If the wavelength of propagation is
1 µm, how many modes can be propagated inside the fiber?
2 2
d N.A. 5 10 6 (1.450 2 – 1.447 2 )1/ 2
N = 4.9 × 4.9 1
1 10 6
Therefore there is a single mode propagation.
4.26 ENGINEERING PHYSICS - II
9. The relative refractive index difference for an optical fiber is 0.05. If the
entrance end of fiber is facing the air medium and refractive index of core is
1.46, estimate its numerical aperture.
N.A = n1 (2)1\2 = 1.46 (2 × 0.05)1/2 = 0.46.
10. Calculate the Vnumber and number of modes propagating through the fiber having
n1 = 1.53, n2 = 1.50 and 0 = 1µm.
V 2 (94.72) 2
Maximum number of modes propagating through the fiber 4486.
2 2
11. A step index fiber has a diameter of 200 µm and N.A = 0.3. Compute the
number of propagating modes at an operating wavelength of 850 nm.
V 2 2 2 2
Number of modes 2 a ( N.A) 2
2
The number of modes is doubled to account for the two possible polarisations.
Total number of modes = 24589 × 2 = 49178.
12. Find the cutoff wavelength of the step index multimode fiber having
core radius = 25 µm, refractive index of core = 1.48, V number = 25 and
= 0.01.
6
2 a n1 2 = 2 5 10 1.48 2 0.01 1.315µ m.
cutoff 25
V
13. In the design of single mode fiber, find the value of maximum value of core
radius the fiber having N.A. = 0.05 and the operating wavelength and the
operating wavelength = 1.3 µm.
We know that Vnumber of single mode fiber = 2.405
V 2.405 1.3
a mex 9.95 µm
2 ( N.A.) 2 0.05