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Topic 9 & 10: Chip i/p and o/p circuits & design for testability
1) Explain on-chip clock generation & distribution.
2) Define what is latchup. Explain its causes & preveation.
3) Explain stuck at fault model.
4) Explain delay fault model.
5) Write a short note on AD_HOC TESTABLE design technique
6) Write a short note on BUILT-IN SELF TEST (BIST) technique.