Proceedings of 2005 lntemational Symposium on Electrical Insulating
Materials, June 5-9, 2005, Kiiakyushu. Japan
BEHAVIOR OF XLPE MEDlUM VOLTAGE CABLE UNDER SWITCHING IMPULSE
Mohamed Adel Abdallah
Alexandria University - Egypt
abdalla hma@hotmail.com
Abstract: An investigation was held to
characterize the behavior of high voltage XLPE
insulated cable models under unidirectional
switching impulses in dry and wet environment.
The models refer to 18/30 kV cables , have a
nominal electric field on the conductor of 4
kV/mm. Different stress tests were performed to
reproduce in laboratory possible service
conditions. Three types of environment were
considered: (1) dry conditions at room
temperature, (2) wet conditions in water-filled tank
at room temperature, (3) wet conditions in water
filled tank at 90" C water temperature. For each
environment condition, cable models were
submitted to 50 impulses of amplitude 4 p.u. in
respect to the nominal AC voltage. This stress
corresponds to a maximum etectric field of 16
kV/mm on the conductor. For each environment
the tests were repeated on 10 cable samples.
Switching impulse dielectric strength (SIDS) was
chosen as reference parameter for the analysis of
the insulation degradation after each stress test.
Results show good performances of XLPE
insulation under switching impulse in dry and wet
conditions.
1. introduction
XLPE insulated high voltage cables are widely
used in power distribution networks, showing very
good performances in electrical endurance [14].
XLPE is an excellent material for insulation of
medium and high voltage cables. While the
behavior of XLPE insulated cables under AC
voltage stress has been extensively investigated
[5-111, the behavior of the same cables submitted
to switching impulses is not so well known in spite
of the severity and the frequency of such stress.
Aim of this paper is to give a contribution for a
better understanding on the behavior of high
voltage XLPE cables under switching impulses in
dry and wet environment. Different stress test was
performed on cable models in order to reproduce
possible service conditions. The degradation of
the XLPE insulation system has been evaluated
by the switching impulse dielectric strength (SIDS)
measured after each stress test.
2. Description of cables models
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PI-18
The cable sample under test manufactured by El-
Swidy using the same materials and insulating
process of a high voltage XLPE insulated and
semi conductivescreened core. The dimensional
characteristics of cable model are: Conductor:
copper wire, diameter 8.3 mm, Inner screen: semi
conductive layer 0.7 mm thickness bonded to
insulation, Insulation: high voltage compound 8.0
mm thickness, Outer screen: semi conductive
layer 0.7 thickness bonded to insulation. Active
length: 5 m, Dielectric permittivity: 2.3 (cable
capacitance about 0.133pF/km).
3. Switching impulse dielectric strength test
Switching impulse dielectric strength (SIDS) was
held applying stepby-step, 5 switching impulses,
per step with the same peak value and then
increasing the step voltage of 4 kV up to the
breakdown. The voltage has a nonconventional
250/2500 ps shape obtained by the impulse
generator. During preliminary tests no significant
differences between positive and negative polarity
were found, so we decided to use only impulses
with positive polarity. The time laps between
successive impulses were selected to be not less
than 60 seconds. The peak value of the initial set
of waves was fixed at approximately 70% of the
expected breakdown voltage. A pilot sample was
used to determine the expected breakdown
voltage before each switching impulse dielectric
strength test. All tests were performed on samples
of 5 meters length, 3 meters of which are active
length metallic screened on the outer semi
conductive layer, leaving one meter length at both
ends without metallic screen. The samples, in
form of close ring and with the metallic screen
grounded, were- connected to the impulse
generator. The presence of the outer semi
conductive layer provides a satisfactory
distribution of electric field along the ends of the
sample on test, so that all breakdowns occurred in
active lengths and suitable terminals were
needed. Impulse dielectric strength tests as well
as the stress tests were performed at High
Voltage Laboratory of Alexandria University..
4. Stress tests
Five different stress tests were performed with the
aim to consider 5 different types of degradation of
 more than 30% and an increasing for samples
passed Test #3 in respect of no-stressed
samples. On the contrary. a decreasing is
registered for samples passed Test #2.
Table 3 shows again a decreasing of Eb with the
severity of the tests (Test #4 harsher than Test
#2).
Table 2 - Values of Eb and relevant to no-
stressed samples and samples passed Test #2
and #3 Eb [kV/mm]

EI, kV/mm

Tabte 3 - Values of Eb and relevant to no-

stressed samples and samples passed Test #2
and #4 E b [kV/mm]

Samples passed Test #2 I19

Samples passed Test #4 94

An opposite effect in respect to Table 3 is shown

in Table 4 where samples, which passed Test #3,
seem to be more stressed than samples passed
Test #5, as point out by Eb values. Opposite is the
behavior in respect to Table 3. Table 4 where
.samples, which passed Test #3, seem to be more
stressed than samples passed Test #5, as point
out by Eb values. Opposite is the behavior in
respect to Table 3,

Table 4 -Values of E, and relevant to no-stressed

samples and samples passed Test #3 and #5 Eb
[kVlmm]

E b kV/mm
1
130
Samples passed Test #3 83
Samdes bassed Test #5 100

5. Discussion of results

In Table 5 the Et, values relevant to samples

Eb kV/mm
submitted to the different types of test are
No stressed samp les 130 reported together with their variation Eb in
comparison with the results of no-stressed
Samples passed Test #1 141
samples. From the analysis of Eb figures it is
and immediately
submitted at switching possible to note: Test # 3 is the harshest test: a
reduction of 47 k V h m of Eb in respect.to no-
impulse 250/2500 ps
stressed samples is registered. Test #4 and l e s t
Samples passed Test # 1 129
and 24 hour later #5 seems to give close results. Test #2 gives
values lower than those relevant to no-stressed
submitted at switching
samples. Test #I gives no difference respect no
impulse 50/2500 CIS
stressed samples if SIDS is performed with a rest
time of 24 hours after Test #I. SIDS results
obtained immediately after Test #I shows an
increasing of E b in respect to no stressed samples
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pointing out a conditioning in the insulation
behavior.
Table 5 - Comparison among Et, dielectric
strength values of no-stressed samples and
samples passed different stress tests”
6. A comparison between lightning and
switching impulse dielectric strength
A comparison was held between no-stressed
samples submitted to different impulse wave
shapes: standard lightning impulse 1/50 ps and
unidirectional switching impulse 250/2500 ps.
Lightning impulse dielectric strength (LIDS) test
was performed with the same procedure of the
SIDS test described in paragraph 3.
The results of Table 6 show a lower value of Eb in
the case of lightning impulse: XLPE seems to be
more sensitive with the increasing of the front
steepness of the stressing voltage shape. It is
interesting to note the great difference of values
between LIDS and SIDS of no stressed samples.
Switching impulse gives rise to more uniformity on
the breakdown process in respect to lightning
impulse.
Table 6 - Values of Eb and relevant to no-
stressed samples under lightning and switching
impulses Et, [kV/mm]
1 Eb kV/mm
No stressed samples I 115
submitted to Lightning
im ulse 1/50 s
No stressed samples
submitted to Switching
im uIse250/2500 s
7. Conclusions
From the analysis of the findings it is possible to
conclude that:- it is confirmed the exceflent
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behavior of XLPE insulated cables in dry condition
under switching impulses. Model cables submitted
to 50 switching impulses of 4 p.u. amplitude in dry
condition has shown no degradation evidence;-
the behavior of XLPE insulation under switching
impulses is confirmed to be good also in heavy
wet environments. In fact the switching dielectric
strength, even in the most severe conditions,
never falls below 83 kV/mm (see Table 5). This
seems to confirm the good behavior of high
voltage XLPE insulated cables both to AC and
impulsive stresses;- XLPE insulated cabtes seem
to be sensitive to the front steepness of t h e
impulsive shape and they exhibit a dielectric
strength to lightning impulses lower than that to
the unidirectional switching impulses.
8. References
[I]L.Simoni, “Fundamentals of endurance of
electric insulated materials” , CLUEB, Bologna,
Italy, 2nd issue in Italian, 1994.
[2] G.C.Montanari, “A comparative investigation
of electro thermal endurance models for insulating
materials and system characterization” , IEEE
Electrical Insulation Magazine, Vol. 13, No.3,
pp. 13 -25.
[3] G.Mazzanti, G.C.Montanari, L.Simoni.
Insulation characterization in multi stress
conditions by accelerated life tests: an application
to XLPE and EPR for high voltage cables” , IEEE
Electrical Insulation Magazine, Vol.13, No.6,
pp.24-34, 1997.
[4] H.Sarma, E.Cometa, J.Densley, “Accelerated
ageing tests on polymeric cables using water-
filled tanks - A critical review” , IEEE Electrical
Insulation Magazine, Vol.18, No.2, pp.15-26,
2002.
[5] J.Densley, “Ageing mechanisms and
diagnostics for power cables - An overview” ,
IEEE Electrical Insulation Magazine, Vol. 17, No. 1,
pp.14-22, 2001.
161 S.Boggs, J.Xu, “Water treeing - Filled versus
unfilled cable insulation” , IEEE Electrical
Insulation Magazine, Vol.17, No.1, pp.23-29,
2001.
[fl C.Mayoux, “Degradation of insulating
materials under electrical stress” , IEEE
Transactions on Dielectrics and Electrical
Insulation, V01.7, N0.5. pp.590-601, 2000.
[a] S.S.Bamji, M.Kaufhold, A.T.Bulinski.
Electroluminescence technique to evaluate the
effect of impulse on high voltage cables” , IEEE
Transactions on Dielectrics and Electrical
Insulation, Vo1.5, No.2, pp.204-210, 1998.
191 R.Bartnikas, R.J. Densley, R.M.Eichhorn,
Accelerated ageing tests for polymer cables under
wet conditions” , IEEE Transactions on Power
Delivery, V01.6,pp.929-937, 1991.’
[IO] S.Boggs, J.Kuang, “High fields effects in , Author: Mohamed Adel Abdallah
solid dielectrics” , IEEE Electrical Insulation Address: Electrical Dept.
Magazine, V01.14, No.6, pp 5-12,1998. Faculty of Eng.
[II]S.A.Boggs. “Mechanism for degradation of Alexandria University
Alexandria - Egypt
TR-XLPE impulse strength during service aging’:
Email : abdallahma@hotmail.com
, IEEE Transactions on power delivery, Vo1.17,
N0.2, pp. 308-312,2002.

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