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  • Project Sims

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    Naga Nithesh
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    This document contains summaries of issues that can occur during timing simulations and recommendations on how to address them. It discusses how testers only have access to scan inputs and outputs, so any functional pads need to be specified. It also explains how clock delays can cause pattern misalignment and recommends editing the test procedure file to account for the delays. The document then provides recommendations to avoid false paths by checking the SDC file, set the sequential depth correctly to avoid coverage issues, manually insert a MUX if an uncontrollable clock is detected, and add input constraints to prevent a clock signal from reaching both the clock and D input of a flop.

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    PROJECT SIMS

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    This document contains summaries of issues that can occur during timing simulations and recommendations on how to address them. It discusses how testers only have access to scan inputs and outputs, so any functional pads need to be specified. It also explains how clock delays can cause pattern misalignment and recommends editing the test procedure file to account for the delays. The document then provides recommendations to avoid false paths by checking the SDC file, set the sequential depth correctly to avoid coverage issues, manually insert a MUX if an uncontrollable clock is detected, and add input constraints to prevent a clock signal from reaching both the clock and D input of a flop.

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    © All Rights Reserved
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    23 views2 pages

    Project Sims

    Uploaded by

    Naga Nithesh
    This document contains summaries of issues that can occur during timing simulations and recommendations on how to address them. It discusses how testers only have access to scan inputs and outputs, so any functional pads need to be specified. It also explains how clock delays can cause pattern misalignment and recommends editing the test procedure file to account for the delays. The document then provides recommendations to avoid false paths by checking the SDC file, set the sequential depth correctly to avoid coverage issues, manually insert a MUX if an uncontrollable clock is detected, and add input constraints to prevent a clock signal from reaching both the clock and D input of a flop.

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    © All Rights Reserved
    Download as PDF, TXT or read online from Scribd
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    of 2

    No Timing Simulations:

    • Tester has access to only scan inputs and scan outputs…. Not functional
    pads. So if you did not mention functional pad with
    add_input_constraints -cz command…..while doing ATPG.. patterns
    would be generated by considering this functional pad as well. But at the
    tester testing, it gets failed because tester has no access to this func pad. So
    you have give that above command in advance.
    • Clock is defined at that top level generally. During parallel patterns, data
    is forced on SI pin.. In our test proc file, under time plate, 1 period = 20ns
    [ at 10ns---pos edge and at 20 ns neg edge]. But due to clock delay of 4ns
    the pos edge instead of coming at 10ns moved to 14ns and neg edge moved
    to 24ns.. So, we edited the test proc file, we brought that to some 4ns before
    for correct shifting and capture operations.

    DRCS:

    • Try to avoid false paths--- to do that Read SDC file and check for false
    paths and delete them and again run the design
    • Sequential depth ---- if Seq depth is not given correctly we may face
    coverage issues… so give the command analyse-→
    optimal_sequential_depth and set_pattern_cycle 4/5/6….required no.
    of non-scan flop cells count.
    • Uncontrollable clock---- manually insert the MUX and give the clock to
    one of the pins… so that clock would be propagated to all the flops which
    are gated earlier.
    • Clk signal goes to both clk and D input of the flop… because of this race
    conditions would come..so, prevent this by add_input_constraints C0
    SC_EN

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