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Measurement Concepts
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SPECTRUM
ANALYZER
MEASUREMENTS
BY
DAN WELCH
Significant Contributions
by
MORRIS ENGELSON
MEASUREMENT CONCEPTS
FIRST EDITION, SECOND PRINTING
NOVEMBER 1969
062-1070-00
PRICE $1.00
INTRODUCTION 1
2 RF MODULATION SYSTEMS 9
6 CW SIGNAL MEASUREMENTS 47
7 AMPLITUDE-MODULATION MEASUREMENTS 65
9 SINGLE-SIDEBAND MEASUREMENTS 81
INDEX 103
(A)
1
M!'PL lTUOE
1
A~,pLl TUOE
f a-fm fa f o+fm
FREQUENCY r
Tlt~ E _ _~r~
(8) (C )
INTRODUCTION
CONCEPT OF
RF SPECTRUM TUNING
--
SI GNA L
WI DEBAND
I NTERMED I ATE-FREQUENCY
SPECTRUM
-- MIXER WI DEBAND
IF AMPL I F I ER
MIXER NARROWBAND
I F AMP L I F I ER
DETECTOR
V IDEO
AMPL I F I ER
-=-
RF MODULATION SYSTEMS
1. Amplitude modulation
2. Frequency modulation
3. Phase modulation
4. Pulse modulation (really a specialized form
of amplitude modulation).
CARR I ER FREQUENCY
,~'" "~-l
I I
r""'"
I
"OCM"
fO - f m fO fO+fm
1 ..
.-.1- - 2f
m
- --+-1_1
STANDARD AM REQUIRES AN RF SPECTRUM EQUAL TO TWICE THE I NFORMATION BAND;J I DTH
MODULATED
CARRI ER
'\\ )
UNMODULATED
CARR I ER
;JAVESHAPE OF
MODU LAT I NG VOLTAGE
l:
IU:;:A~D
LOWER SUPPRESSED
S I DEBAND CARR I ER
~,
- - -rl -----+1- - -
\ I
. fO - f m fa f O+fm
f0 ~ CARR I ER FREQUENCY
1 PER I 00 OF PULSED
Tp ~ ·-PRF~ RF CARRI ER
1 DURAT 1ON OF RF
Td ~!if ~ PULSE
PRF
TEKTRON I X
TYP E 191
F = IO-30MHz
AT 50mV
DOUBLE -
BALANCED
s.
TEKTRON I X TYPE
MIX ER OR
49 1 OR I L20
EQU I VA LENT
5m 5X
TEKTRON I X ATT ENUATOR
TYPE 114
PER I OD = 100"5 , 5m 5X
WI DTH = 1"5 , 1-3V
ATT ENUATOR
D I SPERS I ON = I MHz/O I V
RESOLUT I ON = '100kHz ICW)
BAND = A
RF CENTER FREQUENCY = SAME AS TYPE 191
1. 0 1. 0
0.8 0.8 0 .6
'-1 I~
0.6
~
"5
0 .6
J1L
"5 ~
"5
0. 4 I.-l
FREQUE NCY
0 .4 H AMPL I TUOE
~I
FREQUENCY
MOD ULAT I ON MODULAT I ON MODULAT I ON
0.2 0.2
-4 -3 -2 - I -4 -3 -2 -I
1. 0 1.0
2
e - x PULSE
0.8
0.6
~
0.8
0.6
n Ca) J .. • fo
-4 -3 -2 -I -4 -3 -2 - I
IIf=2MHz
...
~O
IIf=6MHz
n vt:
T
G
T
Fig. 2-8. Common RF spectra.
lS
FREQUENCY
MODULATED
CARRIER
FREQUENCY -----l~~
VERT I CAL
DEFLECT I ON
13dB
DYNAMI C
RANGE
I NPUT VO LTAGE
-I
I M-
.5 C6dB)-
rj - I
Jj11 I
r.t
....
I
I I
LINEAR
VERT ICAL
DEF LECTION
!!IIIJII!: ~ .,1 RIll
-
FREQUENCY •
.707 C3dB)
LI NEAR
VERT ICAL
DEFLECTION
FREQUENCY ~
- ------I..
CA) RESOLUTION IS 6f
LONG
r' I I Mt:
r
L I NEAR
VERT ICAL
DEF LECT I ON
FR EQUENCY -----J~~
POOR SK IRT
i
SELECTIVITY
LOGAR ITHMI C
VERT ICAL
DE FLECTION
FREQUENCY ~
• -
LOGARITHM IC
VERTICA L
DE FLECT ION
!!!Ii
- .. . I!!!!!Iii
' !!Sii
iii
!!!!:
THIRD ORDER
INTERMODULAT ION
PRODUCTS
.
~
~ 61~61 ~ 61~
21 1-12 II 12 212-1 1
FREQUENCY ~
RELATI VE
oI SP LAY
AMPL I TUDE
IIIIIII
(A) IDEAL DISPLAY FOR C'tI SIGNAL
ZERO SIGNAL WIDTH
FOR I DEAL I ZED ZERO
RESOLUTI ON BANDWIDTH
tiimJ.1111 ~~~~::;::"
I I +
I -IHI-AMPLITUDE LESS THAN
!iiii:7c
Ie) SWEEP TIME TOO FAST FOR RESOLUTION SETT ING
where
D dispersion
T sweeptime in seconds
B resolution bandwidth at the 3-dB down points
bw
where
bw the -3 dB bandwidth of the resolution
amplifier, expressed in Hz
the duration of the RF pulse, expressed in
seconds.
38
I
BANDWIDTH
(A)
I BW ~~
Td
BW ~ 1.
Td
(C) EXCESSIVE RESOLUTION BANDWIDTH FAILS TO (0) EXTREMELY WIDE RESOLUTION BANDW IDTH
RESOLVE LOBE NULL POINTS AND D I STORTS oI STORTS ENVE LOPE BEYOND USEFULNESS
ENVELOPE PRF ~ 1kH z TO 10kHz
PRF ~ 1kHz TO 10kHz
SPECTRUM ANALYZER
FUNCTIONAL CONSIDERATIONS
where
bw the -3 dB bandwidth of the resolution
amplifier
the RF pulse duration in seconds.
lOa I
80 0
60
I
10
40
N
:?i 30
2t ,.
~
,,
20
'"i=;
Jo f'
"
§
«
0)
15
10
I
1. 5
z
0
f-
z
0
40 0 .8
c:;
8
f- is
:3
g 6 0. 6 "'
V>
is! I ~
=>
50 a.
~ 0.4 "-
'"
~ 0.3
60
1 0 .2
1
1. 5 70 0 .1 5
r 0. 1
SENSI TI VI TY LOSS -- d8
CW SIGNAL MEASUREMENTS
CENTER FREQUENCY
A CW radio frequency display consists of a single
vertical response at the operating frequency. To
observe and measure a known frequency, the RF center
frequency of the local oscillator must be tuned to
the dial reading that gives a direct readout of the
incoming frequency with the variable IF center
frequency controls centered to midrange and the
signal positioned in the center of the graticule
scale. If the approximate frequency of the incoming
signal is known, the reading may be observed on the
appropriate dial scale.
111 111 111 1111 11 111 111 1111 1111111111 11 11111111111111 11 11111111 11 111 111 11 1111 111 11 11111 11 11 1111 111 11i ll l ll lll l ll ll llll llll lll l l l lll l llll ll i l lt l llll ll ll ill111 111 11 11 1111111 11111111 1
- dBm +d8m
127 120 110107 100 90 87 80 7067 60 50 47 40 3027 20 10 7 ~ O ~ 1013 20 30 33
-30d&n + 15dBm
FREQUENCY STABILITY
Closely allied to measuring the frequency of a CW
signal is the measurement of its frequency stability.
Short-term stability concerns fast frequency changes
such as those caused by power supply transients and
ripple, vibration or other factors associated with
the frequency source. Long-term stability concerns
the change in frequency as a function of time
generally caused by the effect of temperature on the
characteristics of some electrical or mechanical
components.
INCID ENTAL
FM
l R
al
~ .]I[.~~ t~ l'... l~ ~ ..
SPECTRAL PURITI
An ideal CW signal would not contain any undesirable
adjacent amplitude- or frequency-modulated sideband
frequencies. However, due to the presence of power
line frequency and its harmonics, mechanical and
acoustical vibration, transformer flux leakage,
ground currents, thermal, shot and llf noise from
oscillator semiconductors or other random sources,
the purity of the CW signal is decreased. The
magnitude of the noise generated by any of the above
sources is indicated by the sideband level of
modulation accompanying the carrier frequency.
54
LOW - FREQUENCY
REFERENCE AT fl
~
H
I
f 2 ± of BAND REJECT
..--- ATTENUATOR
BALANCED
f---- MIXER NO 1 f----- FILTER
AT fl
ATTENUATOR
,: ~~
f2 + f,
f 2 + t.f
f2 - f l
f2 - f , + t.f
h + f, + t.f
f 2 + t.f
~ ATTE NUATOR
TO SPECTRUM
ANALYZER AT f l
f,
f2
I ii 2
+t.
f
o I •
f
I NPUT TO MIXER 1
f r fl h+f,
"'-r-.t i2{2HrJrr'+t.f
fIHf
fl
o I I OUTPUT OF MI XER 1 •
f
INPUT TO MI XER 2
f
OSCILLATOR SQUEGGING
Presence of squegging in an oscillator may be
displayed conveniently on a spectrum analy zer by
displaying the oscillator frequency as it is varied
over its frequency range. The frequency spectrum
generated by the pulsing carrier resembles that of
an amplitude-modulated carrier containing sideband
components separated in frequency by the squegging
frequency and decreasing in amplitude away from the
carrier. Fig. 6-6 shows a display of the RF spectrum
of a CW variable-frequency oscillator which is
squegging.
HARMONIC FREQUENCIES
The presence of harmonic frequencies, Fig. 6-7, can
be easily detected by increasing the dispersion to
encompass the fundamental and as many harmonically
related frequencies as possible. The amplitude of
the harmonic frequ encies relative to that of the
fundamental may be measured by inserting either RF
or IF calibrated attenuation or a combination of
both until the amplitude of the fundamental equals
the amplitude reference level of the individual
measuring harmonically related frequencies. For example, with
ha rmonic s the amplitude of the fundamental frequency adjusted
to occupy the entire vertical display dynamic range
of the spectrum analyzer, it is possible to view
harmonic frequencies one hundredth (40 dB) the
amplitude of the carrier frequency by the relative
comparison method, using the front panel attenuators
available on microwave and RF spectrum analyzers.
[PULSE MODULATION
- -- - -- -- -- - -
RELl l VE
2ND HARMON I C
AMPL I TUr LEV EL
1-- --
J \. I
o SPECTRUM
ANALYZER
INPI!.L TEST
DEVICE
OUTPUT
DOUBLE THROW J
DOUBLE POLE SW ITCH
L - - - - - - -__~------O
RF SIGNA L
SOURCE
(CA LIBRATED)
RF S I GNAL
GENERATOR
AT f3
RF S IGNAL
GENERATOR
AT f1
f3 SPECTRUM
MI XER ANALYZER
UNDER v
TEST DES I RED
OUTPUT
FREQUENCY
AT f3
LOCA L
OSC I LLATOR
AT f2
RF SIGNAL
GENERATOR TUNED
TO THE OPERAT ING
FREQUENCY
t
-l3dB
I
'/1'\\
,/ \
\
-L-+-----------/~~6f~\
I \
I \
I \
VERT I CAL
D I SPLAY /
/
I ,
,,
// "
--.;// .......... -
FREQUE NCY
CAL I BRATED
RF SIGNAL
bhl SPECTRUM
GENERATOR l~ ANA LYZER
m
COAX I AL
CAV I TY
UNDER TE ST
Fig . 6-11 .
63
AMPLITUDE-MODULATION
MEASUREMENTS
dB OF
VOLTAGE OR RAT I O OF dB OF
CURRENT GA I N I NCREASE POWER GA I N
OR LOSS (TO 1.0) OR LOSS
0 1.0 0
1 1.1
2 1. 3 1
3 1.4
4 1. 6 2
5 1. 8
6 2. 0 3
7 2. 2
8 2. 5 4
9 2.8
10 3. 2 5
11 3. 6
12 4.0 6
13 4. 5
14 5.0 7
15 5.6
16 6.3 8
17 7. 1
18 8.0 9
19 9.0
20 10 10
21 11
22 13 11
23 14
24 16 12
25 18
26 20 13
27 22
28 25 14
29 28
30 32 15
31 36
32 40 16
33 45
34 50 17
35 56
36 63 18
37 71
38 79 19
39 89
40 100 20
42 130 21
44 160 22
46 200 23
48 250 24
50 320 25
52 400 26
54 500 27
56 630 28
58 790 29
60 1,000 30
~
564B
STORAGE
OSCI LLOSCOPE
TE LEMETRY
SUBCARRIER
SIGNAL S
FREQUENCY MODULAnON
MEASUREMENTS
FREQUENCY DEVIATION
When an RF carrier is frequency modulated by a
single sinusoidal voltage, theoretically an infinite
sidebands number of sidebands, spaced either side of the
carrier by multiples of the modulating frequency, are
generated" The amplitude of the RF carrier and each
72
+1.0
'\ I I I I
+0 . 8 f---' ~ CARR I ER AMPL ITUDE
r-
+0 . 6 I--
~\ ~,
'Z J,
~
SIDEBAND AMPll TUDE
I
+0 . , I
)I; J, J, J
6
J I-} - f -
/ V j -'~i.-2 8
- 0. 2
0
\
\
Y \.
'\ r ~
J f,.\..I\
~~ 6
"
y IX. , ~, f-s
-0. ,o 1 2
\. :/0 l'
3 4 5' 6
2
7 8 9 10 11 12
rr """
1
II'
... - ... • •
=- I
II ~ .
TEKTRONIX TYPE 491 SPECTRUM ANALYZER
---
II'
(C) CARR IER FREQUENCY AT FIRST NU LL -- (D) FIRST ORDER SIDEBANDS NULLED AS AMP LITUDE OF
MODU LATI ON INDEX OF 2.4 , SEE FIG. 8-4 MODULAT ION INDEX IS INCREASED -- MODU LATION
INDEX APPROXIMATELY 3. 8 -- REFER TO FIG. 8-1
Fig. 8-2 .
74
FIRST 2.404 8
SECOND 5.5201
THIRD 8.6537
FOURTH 11.791 5
F I FTH 14.9309
S I XTH 18 . 0711
SEV ENTH 2 1. 2 11 6
E IGHTH 24.3525
N I NTH 27.4935
TENTH 30 . 6346
w 1.0
0
:0
::
c.. 0.8
..J
'"'"
ffi 0.6
'"uu.''"" 0.4
cr:
w
~ 0.2
>-
:'wS
'"
ACTUAL LI N[AR I r
-- -T------ -- --
PERFECT L I NEAR I TY
m" ~
1m
DEVIATION LINEARITY
Deviation linearity is a measure of the
nonlinearity, existing in an FM transmitter or
signal generator, between the carrier frequency
deviation and the voltage amplitude of the
E modulating frequency causing the deviation. It
m
vs m is described graphically as the ratio of the
m
modulating frequency voltage divided by the
modulation index to the modulation index, as shown
in Fig. 8-5.
DL0\1 FREQUENCY
OSC I LLOSCOPE OR
DI GI TAL VOLTMETER
It
1
CARR IER
SUPPRESS ION
IN dB
II
11 I
--- +--
fe - f1 fe f e + f1
FREQUENCY •
SINGLE-SIDEBAND
MEASUREMENTS
CARRIER SUPPRESSION
Carrier suppression is a measure of the RF carrier
power amplitude relative to the RF peak-envelope-
power (PEP) rating of a single-sideband transmitter.
The most common method of measuring carrier
suppression is to apply a suitably attenuated l-kHz
modulated single-sideband RF signal to the input of
a spectrum analyzer (Fig. 9-1). The l-kHz modulating
frequency establishes a reference level which drives
the transmitter to its rated RF peak envelope power.
The carrier signal will be severely attenuated 1 kHz
away from the reference sideband. Since the amount
of carrier suppression may range between 40 to 60 dB
it will be necessary to use the vertical log display
mode of the spectrum analyzer.
SPECTRUM
ANAL YZER
... I
II I
SIDEBAND
f--
SUPPRESS I ON
IN 16 l+-
t
- .......,
tc - tl tc tc + tl
FREQUENCY _
SIDEBAND SUPPRESSION
Sideband suppression is a measurement of the ratio
of the amplitude of a desired sideband to its
counterpart in the opposite sideband, expressed in
dB (Fig. 9-2). This ratio may vary greatly across
the audio-signal spectrum. In filter-type single-
sideband transmitters, the sideband suppression is
a function of the filter selectivity (frequency
response). The amount of suppression is lowest for
low audio frequencies and increases rapidly with
audio frequency. For this reason sideband suppression
is usually specified and measured at specific audio
frequencies such as 400 Hz or 1 kHz. A complete
audio spectrum measurement is very seldom performed
since it would require measurements to be taken at
a sufficient number of frequencies across the audio
passband to plot a curve of sideband suppression
versus modulating frequency.
SUPPRESSED CARR I ER
FREQUENCY
fl f2
~
REFERENCE
S I GNALS
FREQU ENCY _ _
2- TONE
AUDIO (fm l + fm2)
FREQUENCY SPECTRUM
GENERATOR ANA LYZER
11• I :r
I I I I I I I I
RELAT I VE LEVEL f c = SUPPRESSE
OF 3RO ORDER CARR I ER
NTERMOOU LAT ION FREQUENCY
01 STORT ION
1 11- I I
I I r 6f
Of
' - - ---'
2fl - f2 2iz - fl
FREUUENCY ~
RF I NPUT
SSB SI GNAL ~ OSC I LLOSCOPE
MA I N FRAME
SINGLE -
S I DEBAND
TRANSM I TTER
fRF
MIXER OUTPUT AT
SPECTRUM- ANAL YZER RF CENTER FREQUENCY
{ IF
PULSED RF CARRIER
MEASUREMENTS
ANTENNA
'\[7
I. RADAR
ITRANSM I HER
I SPECTRUM
ANALYZER
DIRECTI~NAL lL-----t~~~~J------~1
CCUPLER ATTENUATOR
td 1 x 10- 6 seconds
td 1 microsecond
MAJOR LOBE - - - - . . . . . .
MAXIMA
/~ MINOR LOBE
I ~ MINIMA
fe f + I
CARRI ER e td
FREQUENCY
RF CARR I ER RF CARR I ER
ON OFF
RF PU LSE
- DURAT ION
t
d
= ...L
6f
f-- ,--
1
Fig. 10-4. Pulse period Ctp PRF) measurement.
92
1.0 1.0
O. B O. B 0.6
~ I-
0 .6
~
"S
0.6
J1L
"S ~
"S
0.4 W
FREQUENCY
0.4 h-l
AMPLI TUDE
k--I
FREQUENCY
MODULAT ION MODU LAT I ON MODU LAT I ON
0.2 0.2
-4 -3 -2 -I -4 -3 -2 -1 0
B
1. 0 1.0
2
e- x PULSE
o. B o. B 1 ..
0.6
~ 0.6
.f\c<
a) • fO
0. 4 ~
FREQUENCY
0.4 k...I
1. 0
MODU LAT ION "S
0.2 0.2
-4 -3 -2 -1 0 -4 -3 -2 - 1
C 0
6f=2MHz
-nO
t
~f=6t~Hz
vt:
G
T
H
fcarr ier
FREQUENCY _ _
I I
I I I
RF CARRIER ON ~I I.~ RF CARR IER OFF+j
I I I
I I I
I I I
I I I
I I I
CW CARRI ER
AMPLITUDE ~_-+_ _ -----'_ _
~ PULSED RF AMPLITUD E
-------,-
1
PULSED RF AMP LI TUDE
__ :l__
--T---- -
CW CARRIER AMP LI TUD E
SWEPT FREQUENCY
MEASUREMENTS
I NPUT SIGNAL
3 MHz TO 2MHz
~ STORAGE
OSC I LLOSCOPE
LASER
I L5/3L5
BEAM SPECTRUM
SPLITTER ANALYZER
MI RROR
PHOTOMU LT I PL I ER
FLUID VELOCITY
MEASUREMENTS
J I I I
(Al T IME DOMAIN D I SPLAY
I L
10
fREQUENCY I N kHz
FREQUENCY I N kHz
WA VEFORM ANALYSIS
mDEX
Amplitude modulation, 9-14, 36, Frequency sampling, 3
65-70 Frequency scale (defined), 24
Double sideband suppressed Frequency stability
carrier, 9, 12-13 measurements, 50-52
Single sideband suppressed Frequency sweeping, s ee Sweep
carrier, 9, 13-14 tuning
Pulse modulated carrier, 9, Frequency synthesizer
14-19, 37-39 (defined), 24
Amplitude modulation Harmonic conversion, s ee
measurements, 65-70 Spurious responses
Anomalous IF responses, Harmonic measurements, 56-57
s ee Spurious responses IF center frequency control,
Cavity resonator Q 43-44
measurements, 62-64 Incidental frequency
Carrier suppression modulation (defined), 24
measurements, 81 Incremental linearity
Center frequency (defined), 23 (defined), 25
Center frequency Intensifier control, 43
determination, 47-50 Intermediate frequency, see
Center frequency range Center frequency
(defined), 23 Intermediate frequency
Continuous wave (CW) signal, feed through , see Spurious
9, 36 responses
measurements of, 47-64 Intermodu1ation, s ee Spurious
Deviation measurements, 71-79 responses
Deviation ratio, 21 Intermodu1ation distortion
Dial scales, 41, 43-44 measurements, 82-86
Dispersion (defined), 23 Image response, s ee Spurious
as related to resolution, responses
34-36 Laser doppler shift, 99
Dispersion control, 44 Linear display (defined), 25
Dispersion linearity, Linearity (defined), 25
s ee Linearity Local oscillator radiation
Display flatness (defined), 23 (defined), 25
Doppler shift, 99 Logarithmic display (defined),
Drift (defined), 23 31
Dynamic range (defined), 24 Maximum input power (defined),
Fluid velocity measurements, 99 25
Frequency band (defined), 24 Minimum discernible signal,
Frequency conversion, 59-61 s ee Sensitivity
Frequency division Minimum usable dispersion
multiplex, 68-70 (defined), 25
Frequency modulation, 19-22, Mixer conversion, 59-61
36, 71-79 Modulation frequency
Frequency modulation measurements, 68-70
measurements, 71-79 Modulation index, 20, 74-76
deviation, 71-77 Multiplex measurements, 68-70
deviation linearity, 78-79 Mu1tipu1se, 22
104
Circuit Concepts
Power Supply Circuits
062-0888-01
Digital Concepts
062-1030-00
Measurement Concepts
Semiconductor Devices
062-1009-00
Engine Analysis
062-1074-00
Probe Measurements
062-1170-00