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We have already defined the reliability as the probability of a unit performing its
purpose adequately for the period of time intended under the operating conditions
encountered. Consequently, reliability is somehow represented by appropriate
functions of a random variable.
In reliability evaluation, the random variable is frequently time more precisely the
transition time. During the operation period the random variable is failure time
(transition time from operation to failed state is generally called failure time or time to
failure) while during the maintenance period the random variable is repair time
(transition time from a failed state to operation is generally called repair time or time
to repair).
t : failure time
t
F (t ) Q(t ) Pt t f ( ) d : Failure Distribution Function
0
dF (t ) dR(t )
f (t ): Failure density function
dt dt
t
R(t ) 1 F (t ) 1 f ( ) d f ( ) d : Surviver Function (reliability)
0 t
2
Failure distribution function and the reliability satisfy the following conditions.
Mean value of failure time (Mean operating time) is known as Mean Time to Failure
(MTTF)
R()
MTTF t . f (t )dt t
dR(t )
dt t dR(t ) t R(t ) 0 R(t )dt R(t )dt
dt
0 0 R(0) u dv 0 0
f (t ) e t t 0 , 0
t
Q(t ) Pt t f ( ) d 1 e t , R(t ) 1 Q(t ) Pt t e t
0
1
MTTF R(t )dt e t dt
0 0
f(t)
Q(t1) : The probability of failure occuring before t1
R(t1) : The probability of failure occuring after t1 (the
probability of surviving at t1, reliability)
Q(t1)
R(t1)
t1 t
Figure 3.1 Failure density function, failure distribution function and survival function
On the other hand, repairable units are subjected to repairment function following their
failure. This process is characterized by a random variable, repair time and its
associated functions.
3
t : repair time
t
Fr (t ) Pt t f r ( ) d : Repair Distribution Function
0
dFr (t )
f r (t ) : Repair density function
dt
MeanTime To Repair : MTTR f r ( ) d
0
Mean time Between Failures (MTBF) is the sum of Mean time To Failure and Mean
Time to Repair.
If the number of components exposed to failure is one and Δt is a small time period,
then the product λ(t)*Δt represents the conditional probability of a unit to fail in the
period [ t , t+Δt ], given that the unit has not failed (surviving) at time t. On the other
hand the product f(t)*Δt is the probability of a unit to fail during the time period [ t ,
t+Δt ].
f (t ) 1 dQ(t ) 1 dR(t )
(t )
R(t ) R(t ) dt R(t ) dt
On the other hand the converse relation can similarly be derived as:
4
t R( t ) R( t )
dR( )
( ) d
R(0) 1
Ln R( ) Ln Ln Ln R(t )
R( ) R(t ) R(t )
0 R( 0 ) R( 0 )
t
( )d
R(t ) e 0
dR(t )
( )d
f (t ) (t ).e 0
dt
Similar expressions can also be derived from the following case study. Let’s consider a
case in which a fixed number of No of identical components are tested.
N0 Ns (t) Nf (t) , 0 t
N s (t) N (t)
R(t ) 1 Q(t) 1 f
N0 N0
dNf (t)
dt N 0 * f(t) f(t) f(t) 1 dR(t)
(t )
N s (t) N s (t) N s (t)/N 0 R(t) R(t) dt
f (0) f (0)
Initial hazard rate will be (0) f (0)
R(0) 1
f (t ) .e t
5
t t
Q(t ) f ( )d .e d 1 e t ; R(t ) 1 Q(t ) e
0 0
f (t ) .e t
(t )
R(t ) e
1
R(20) e 20 0.9608 (t ) Ln (0.9608) 0.002 failure / hour
20
In order to illustrate the procedure for evaluating the various reliability functions we
will give the following example where the data is deduced from experimental tests.
The behavior (number of failed units) of 1000 identical units are recorded and given in
the table below.
Example. Failure times of 1000 identical components are given in the first column of
the following table. Determine the reliability and the failure rate versus time.
1
Q(t)
0.8
0.6
0.4
R(t)
0.2
0
0 2 4 6 8 10 12 14 16 18 20
time [100 h]
0.14
f(t)
0.12
0.1
0.08
0.06
0.04
0.02
exponential fdf
0
0 2 4 6 8 10 12 14 16 18 20
7
All the previous mathematical evaluations are also valid for the repair rate.
The hazard rate curve of the example has a shape that is the characteristic of many
physical components. This shape is referred to as a bath-tub curve and can be divided
into three distinct regions.
(t)
A : De-bugging phase
II I B : Useful Life Period
C : Wearout phase
I Electronic components
II Mechanical Components
C
C
t
Figure 3.2 Hazard Rate as a function of age (Bath-tub characteristic)
The hazard rate during the de-bugging phase decreases as a function of time. Failures
in this region are called early failures and are generally due to the manufacturing
errors or improper design. The number of early failures can be decreased by
appropriate tests before taking the unit to the service (artificial ageing process).
The second region is the useful life period of the unit. The hazard rate is approximately
constant during this process. The failures are called chance failures. Such a constant
hazard rate can be represented by an exponential distribution.
The last r egion is the wear out or fatigue phase and is characterized by a rapidly
increasing hazard rate with time. Such a hazard rate can be approximated by a normal
distribution. However, generally Gamma and Weibull distributions are often preferred
to represent this region, since these distributions have some wave shaping parameters
8
Electronic components and mechanical components exhibit the two extreme cases.
Useful time period of mechanical components are much smaller than those of the
electronic components. It is illustrated in the figure as the second curve.
Most of the power system components exhibit a characteristic between the two
extreme cases. On the other hand, artificial ageing processes minimize the early
failures and appropriate maintenance policies (preventive maintenance) extend the life
of useful time period. Therefore we do generally prefer to conduct our studies for the
useful life period.
There are several probability density functions used to represent the failure rates. Here
are the most common ones.
(t - ) 2 t
1 f (t )
f(t) exp - ; R(t) 1 f( ) d ; (t ) ; MTTF R(t ) dt
2 2 2 0
R(t )
0
t
f(t) exp - t ; R(t) 1 f( ) d exp - t ; (t ) ; MTTF R(t ) dt
1
0 0
kt 2 t kt 2
f(t) kt exp -
2
; R(t) 1 f( ) d exp -
2
; ( t ) kt ; MTTF R(t ) dt
2k
0 0
t -1 t t t -1 1
f(t) exp - ; R(t) exp - ; (t) t ; MTTF 1
t t
F (t ) Q(t ) f ( ) d
0.15811 10
e d
0 0
t
0.15811 / 10
Q(t ) e * 2 d 1 e t / 10
0
MTTF t * f (t ) dt R(t ) dt e t / 10
dt e / 10
2 d ... 20 years
0 0 0 0
Example: Show that the following function is a failure density function. For such a
failure distribution function determine the following functions and the
probabilities:
f(t)
c 0 t (a b) , BI
c
f1 (t ) c (t a) (a b)t a , BII
b
f (t )
t f (t ) c c (t a) at (a b), BIII
a-b a a+b 2 b
0 t (a b) , BIV
a ab
c
f (t )dt
c
Q() b
c ( t a ) dt b
c ( t a ) dt 1 bc 1 or c 1 b
ab a
0 BI
1 1
f1(t ) b 2 (t a) BII
b
f (t ) 1 1
f 2 (t ) (t a) BIII
b b2
0 BIV
0 BI
t 2
1 a 1 a2 a
t
a b
t
f1( ) d 2 2 t 2
2b b b 2 2b b
BII
a) Q( t ) f ( ) d t
t 2 a b b2 a 2 2ab
1
2 f 2 (
) d
2 b 2
b 2 t
2b2
BIII
a
1 BIV
b) R(t ) 1 Q(t )
c) ( t ) f ( t ) R( t )
a ab
d) MTTF t. f (t ) dt t. f1(t ) dt t. f2 (t ) dt a
0 a b a
2
b b
e) VAR(t ) E(t 2 ) E 2 (t ) ... (t )
6 6
b b b b
f) Pa t a Qa Qa 0.75
2 2 2 2
The probability can also be expressed with respect to the state of the device at an
arbitrary time before the time of interest. The probability that a unit fails during the
time period [t1 t2] or the reliability of the unit for the same period can be expressed as
follows:
t2 t2 t1
Qt1 t 2 Pt1 t t 2 f (t ) dt f (t ) dt f (t ) dt Q(t 2 ) Q(t1 )
t1 0 0
t2
f (t )dt
Pt t 2 t t1 Pt1 t t 2 t 1 Q(t 2 ) Q(t1 )
Q(t 2 t t1 ) Pt t 2 t t1
Pt t1 R(t1 ) R(t1 ) R(t1 )
From where
t2
Q(t2 ) Q(t1 ) et1 e
Q(t2 t t1 ) 1 e(t2 t1 ) 1 et21 Q(t21 )
R(t1 ) et1
R(t2 t t1 ) et21 R(t21 )
These last equations state that the units exhibiting exponential failure density functions
are memory free units.
If data is available, the next important step is to determine the best failure distribution
function (optimal parameters) fitting the data.
The data collection procedure generally involves obtaining a sample of a much larger
family of data known as the population. It is therefore very important to infer
conclusions about certain parameters (generally mean value and variance) of the
population from a known data sample.
Population : μx, σx
Assume that n-element samples are randomly chosen from the population. Sample
mean,
1 n
x x i , is also a random variable.
n i 1
According to central limit theorem this random variable, x , follows the normal
distribution even if the population distribution is not normal. Mean value of the sample
means will be the mean value of the population.
M M 2
1
x
1
E ( x) Lim
M M
( x)
i 1
i x Lim
2
xM M
i 1
E ( x) 2 x2
1 n
̂ x x xi
n i 1
Although the arithmetic mean estimation is the most popular method, the geometric
mean is also used in some cases. For instance, it is sometimes used to calculate the
total mean from the mean values of subgroups of sample data. The geometric mean is
defined as
1/ n
n 1 n
̂ x x x i exp Ln x i
i 1 n i 1
The weighting mean is more accurate estimate of the total mean, in the case of
multiple data sources or subgroups, such as the data from different geographical
regions or different age groups:
M
1/ i
ˆ x x X iWi ; Wi M
i 1
1/
i 1
i
1 n n
s x2
n i 1
xi x xi2 x
2 1
n i 1
2
n 2
2x s
n 1 x
As the sample size increases, the correction factor approaches unity and its effect
diminishes. The (n-1) in the correction factor is known as the degrees of freedom. This
term means that one of the n-samples is dependent on the remaining (n-1) values.
The mean and standard deviation of the sample are the point estimates of the
population statistics. These estimates are obviously are different than the actual values.
It is desirable to have a confidence interval to cover the uncertainty of statistics. Such
an interval contains the parameter to be estimated with the probability that is called the
degree of confidence. The confidence interval is extremely useful for sensitivity
studies in system risk evaluation. It is left to the students.
Example : Annual failures during a 10-year period for a 2000 km cable is given as 36,
37, 44, 42, 44, 38, 39, 41, 38, 41. Determine the average and the variance of
the number of annual failures.
1 10
E( x) ( x) xi 40 failure / yýl
ˆ
10 i 1
1 10 2
xi 10 * 40 2 8
n 2
ˆ 2 ( x) s ( x)
n 1 9 i 1
1
f x ( x) , a x b ; x kV / mm
ba
Dielectric strength of 5 samples are measured to be 2.2, 1.4, 5.1, 3.5 and
2.5 kV/mm. Determine the parameters of uniform distribution
14
10
Eˆ ( x) ( x) xi 2.94 kV/mm
1
5 i 1
1 5 2
xi 5 * 2 ( x) 2.023
5
( x) s 2 ( x)
ˆ2
4 4 i 1
On the other hand mean value and the variance of uniform distribution is
ab 2 ( b a )2
( x ) , s (x)
2 12
From where
a b
E( x ) 294
.
2
a 0.48 ve b 54
.
(b a )2 2
( x ) 2.023
12
The parameter(s) of the density function fx(x) are estimated by applying maximum
likelihood method. Assume that the random variables x1, x2, x3,..,xn follow the same
discrete probability density function. The probability of x1, x2, x3,...,xn being equal to
x1, x2, x3,...xn , respectively or the probability of a random variable x equal to x1, x2,
x3,...xn in a successive n independent trials can be represented by the following
product.
This function is known to be likelihood function. The value of θ which maximizes the
likelihood function is used as the estimation of parameters. Optimal values of θ can be
evaluated by the solution of the following differential equation.
dL()
0
d
Since exponential density functions are more widely used in reliability evaluation Ln(θ
) is used instead of L(θ) and the conditions became,
d LnL()
0
d
15
n
L(1, 2 ,..., k )
i 1
f ( xi , 1, 2 ,..., k )
is solved for θ1,θ2,…. θn and they are used as the estimates of the parameters.
5
( x )2
L(, )
i 1
1
2
exp i 2 , x 0, , 0
2
5
1
Ln L(, ) 2
2
( xi )2 n. Ln 2
i 1
Ln L(, ) 1
5 5
2
( xi n. ) 0
1
5
xi 6.2
i 1 i 1
5
Ln L(, ) 1
5
3
i1
n
( xi )2 0
1
5
( xi )2 136
.
i 1
Best fitting curve can be determined for a given data. For a reasonable error the
number of minimum data records must be 30. In general, raw data is ungrouped and
unranked. It is more convenient to arrange the observations in increasing or decreasing
order of magnitude. However, this ungrouped data form is still far away from giving a
useful picture and is therefore it is more beneficial to group the data into classes each
of constant with.
Selection of class numbers and the interval width generally depends on the type of
distribution. Too few classes with a wide class interval hide the shape of the
distribution. On the other hand too many classes may cause some classes to include
little or no observations and again distorts the shape. According to Sturges, an
acceptable number of classes can be determined as,
16
( xmax xmin )
k 1 3.3 Log n , Group interval
k
Following the classification, the ratio of the group members to the number of all data
is assumed to be the probability of the random variable being equal to the group
center. These probabilities are sketched and the distribution is determined from this
sketch.
Example: The value of maximum wind speed in a specified region during the
previous 31 years were recorded as 76, 92, 80, 90, 64, 77, 97, 61, 69, 60,
77, 80, 61, 61, 58, 64, 55, 64, 61, 69, 58, 74, 74, 71, 59, 70, 81, 70, 65, 70,
59 km/h. determine the best fitting and the associated parameters of the
best fitting.
1 31 1 31 2
E( x) xi 69.9 km / hour , ( x) xi 31 * E 2 ( x) 114.29
2
31 i 1 30 i 1
Ranked form of data : 55, 58, 58, 59, 59, 60, 61, 61, 61, 61, 64, 64, 64, 65, 69,
69, 70, 70, 70, 71, 74, 74, 76, 77, 77, 80, 80, 81, 90, 92, 97
97 55
k 1 3.3 Log n 5.92 6 , Group Interval 78
6
The groups, number of data included in the group and the probabilities of the
group centers are illustrated in the following table.
0.05 f(x)
0.04 Pi
0.03
0.02
0.01
The sketch of mid-point probabilities shows that the data can be represented by
a shifted-exponential distribution.
f ( x ) . e( x a ) , xa
Curve fitting can also be achieved by using probability plotting. There are special
types of graph papers on which the distribution function of the hypothesized
distribution is plotted as a straight line. For our last example, we can construct a table
showing the cumulative distributions (probabilities of being equal or smaller than
certain numbers)
55 1 1/31
58 3 3/31
59 5 5/31
60 6 6/31
61 10 10/31
64 13 13/31
65 14 14/31
69 16 16/31
70 19 19/31
71 20 20/31
74 22 22/31
76 23 23/31
77 25 25/31
80 27 27/31
81 28 28/31
90 29 29/31
92 30 30/31
97 31 31/31
19
If these probabilities are plotted on a special exponential distribution paper with a non-
linear probability axis, we get the following figure.
0.98
0.97 F
0.96
0.94
F
0.90
0.80
0.60
0.40
0.20
60 70 80 90 100
At this point, the adequacy of the data and the fitted curve is measured by special tests.
Chi-square test or Kolmogorov-Smirnov Test can be used to give the measure of
adequacy.