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Abstract
Polycrystalline samples of the defect pyrochlore-type CsB%B%%O6 (B%= Nb, Ta; B%%=W, Mo) compounds were prepared by
solid-state reaction technique. The formation of the compounds was checked by X-ray diffraction (XRD) method. All the
compounds were found to have a cubic crystal structure at room temperature. Dielectric studies of the tungstate compounds,
CsNbWO6 and CsTaWO6 indicated a small dielectric anomaly at (183 9 2) and (328 92) K, respectively, whereas the molybdate
compounds, CsNbMoO6 and CsTaMoO6 did not exhibit such anomaly. The conductivity measurements indicated ionic transports
(tion ]0.80) in the high temperature region ( ]573 K). © 2002 Elsevier Science B.V. All rights reserved.
0921-5107/02/$ - see front matter © 2002 Elsevier Science B.V. All rights reserved.
PII: S 0 9 2 1 - 5 1 0 7 ( 0 1 ) 0 0 7 4 5 - 0
T. Kar, R.N.P. Choudhary / Materials Science and Engineering B90 (2002) 224–233 225
reported that the electrode material did not affect the patterns of all the compounds, which were quite differ-
dielectric and electrical conducting properties of the ent from those of the ingredient carbonate and
compounds. The dielectric parameters (m, tan l) were oxides, confirmed the formation of the new compounds.
calculated as function of frequency (103 – 106 Hz) and All the XRD peaks were indexed and the cell
temperature using GR1620 AP capacitance measuring parameters were determined in different crystal systems
assembly and HP 4342 A Q-meter along with labora- and unit cell configurations using a standard computer
tory-made three-terminal sample holder and heating program ‘PowdMult’ using the observed interplaner
arrangements. The ac conductivity was measured as spacings (d-values) of strong, medium and low
function of frequency (22k-1 MHz) and temperature by intensity peaks spread over wide 2q range. Finally, a
HP 4342 A Q-meter. The dc conductivity was measured unit cell of cubic crystal system was selected for which
as function of applied electric field (10– 110 V/cm) and
SDd = S(dobs − dcal) was found to be minimum. The
temperature using Keithley 617 programmable elec-
good agreement between the observed and calculated
trometer. As most of the members of the defect py-
d-values (Tables 1 and 2) shows the correctness
rochlore family with the general formula AB%B%%O6 have
of the selection of crystal system and unit cell parame-
a tendency to get contaminated by moisture [1], special
ter. The tungstate compounds have comparable cell
care was taken to avoid the problem. All the samples
were kept at 400 K for 12 h before each experiment. In parameters and the peak positions are not varied
order to prevent rehydration of the samples during much by the incorporation of Ta5 + ion in place of
experiments, silica gel was kept inside the sample holder. Nb5 + ion in the structure. Similar trend is also observed
The structural data presented here are of hydrated (i.e. in the case of molybdate compounds. However, cell
room temperature) phase of the compounds whereas the parameter decreases as Ta5 + replaces Nb5 + in both the
electrical data are of their anhydrous phase. tungstate and molybdate compounds. The cell parame-
ter of tungstate compounds obtained by us is slightly
( 0.8%) larger than the reported ones [18], indicating
3. Results and discussion
that the compounds are slightly hydrated at room
3.1. Structural study temperature [1]. No such comparison is possible for
molybdate compounds because of nonavailability of
The sharp and single diffraction peaks in the XRD data.
Fig. 1. Frequency dependence of dielectric parameters of the CsB%B%%O6 (B%=Nb, Ta; B%%=W, Mo) compounds at room temperature.
T. Kar, R.N.P. Choudhary / Materials Science and Engineering B90 (2002) 224–233 227
Fig. 2. (a) Temperature dependence of dielectric constant (m) of the CsB%WO6 (B%=Nb, Ta) compounds at different frequencies. (b) Temperature
dependence of dielectric constant (m) of the CsB%MoO6 (B%=Nb, Ta) compounds at different frequencies.
varies slowly. The variation of loss tangent, tanl is other members of this family behave in a similar man-
almost similar to that of m. In the case of tungstate ner [11– 17].
compounds, tanl remains almost constant, whereas it Fig. 2(a) shows the variation of m of CNW and CTW
decreases rapidly up to 105 Hz in the molybdate com- with temperature (100–600 K) at different frequencies
pounds, and becomes almost constant afterwards. The and have very small dielectric anomaly at (18392) and
Fig. 3. (a) Temperature dependence of tangent loss (tan l) of the CsB%WO6 (B%=Nb, Ta) compounds at different frequencies. (b) Temperature
dependence of tangent loss (tan l) of the CsB%MoO6 (B%=Nb, Ta) compounds at different frequencies.
T. Kar, R.N.P. Choudhary / Materials Science and Engineering B90 (2002) 224–233 229
Table 3
Comparison of some dielectric data of CsB%B%%O6 ceramics
B% B%% Frequency (Hz) m300 K tan l300 K Dielectric anomaly at T (K) m]500 K tan l]500
K
Fig. 4. Frequency dependence of specific impedance of the CsB%B%%O6 (B%=Nb, Ta; B%%=W, Mo) compounds at room temperature.
(32892) K, respectively. The value of dielectric con- much faster at 104 Hz than that of at 105 and 106 Hz in
stant of CNW is higher than that of its Ta counterpart both the compounds. Similar increasing trend at high-
(i.e. CTW). In case of CTW, m remains almost invariant temperatures (\400 K) is observed in the other mem-
with respect to temperature. However, at 104 Hz, an bers of the family already reported by us [11–17].
increasing trend is observed after 500 K in both the This type of behaviour may be due to the disordering
compounds. of the cation sublattices, which consists of shift of
Fig. 2(b) shows the variation of m of CNM and CTM cation from site to one of the interstices. Although the
with temperature (300– 600 K) at different frequencies. disordering of the lattice does not lead by itself to the
Unlike their isomorphous compounds, CNM and CTM appearance of carriers, it does facilitate substantially
do not have any dielectric anomaly in the studied their formation. The reason is that the disorder is
frequency and temperature range. The value of m starts accompanied by an increase of m and this weakens the
increasing with temperature and the rate of increase is coulomb interaction between the cation that departed
230 T. Kar, R.N.P. Choudhary / Materials Science and Engineering B90 (2002) 224–233
to another unit cell and the vacancy left behind. As a loss tangent (tan l) of tungstate and molybdate com-
result, with increasing temperature, a transition from a pounds, respectively. The molybdate compounds are
state of low m (ordered cation sublattice) into a state of highly lossy compared to their tungstate counterparts.
high m (disordered cation sublattice) can occur [20]. This trend in high temperature and low frequency
Fig. 3(a) and (b) show the temperature dependence of region can be explained from the increasing movement
Fig. 5. (a) Temperature dependence of measured ac conductivity [|m(
)] of the CsB%WO6 (B%=Nb, Ta) compounds at different frequencies. (b).
Temperature dependence of measured ac conductivity [|m(
)] of the CsB%MoO6 (B%=Nb, Ta) compounds at different frequencies.
T. Kar, R.N.P. Choudhary / Materials Science and Engineering B90 (2002) 224–233 231
Table 4
Comparison of some conductivity data [in (ohm cm)−1] of CsB%B%%O6 ceramics
Fig. 6. Applied electric field dependence of dc resistivity (zdc) of the CsB%B%%O6 (B%=Nb, Ta; B%%=W, Mo) compounds at room temperature.
of Cs1 + ions in the main skeleton of the structure of samples are not available in single crystal form, we
the compound at high temperature [21]. In Table 3, cannot separate the contributions of grain and grain
some dielectric data of all the four compounds at boundary in the obtained value of specific impedance.
different frequencies and temperatures have been The variation of measured ac conductivity, |m(
), of
compared. the tungstate and molybdate compounds at 105 and 106
Hz with inverse of absolute temperature (1/T) is shown
3.3. Ac and dc conducti6ity study in Fig. 5(a) and (b), respectively. As expected, the value
of |m(
) is greater than its dc counterpart (Table 4)
The variation of specific impedance of all the four because it has contribution from both the ac and dc
compounds with frequency (22k-1 MHz) at 300 K is conductivity.
shown in Fig. 4. The value of specific impedance con- Fig. 6 shows the variation of dc resistivity (zdc) of all
tains the contributions from both grains and grain the compounds with applied electric field (10–110 V
boundaries, which have entirely different dielectric and cm − 1) at 300 K. The resistivity decreases very slowly
resistive properties. It was observed that the value of with applied electric field that may be due to: (i)
specific impedance varies slowly up to 105 Hz, then formation of space charge, (ii) change in shape of
converges and approaches to a plateau. According to moisture in the pores of the compounds under the
Powers et al., this high frequency plateau is associated influence of applied electric field, (iii) contacts with
with the resistivity of the grain interior [22]. As the electrodes, etc. [23].
232 T. Kar, R.N.P. Choudhary / Materials Science and Engineering B90 (2002) 224–233
Fig. 7. Temperature dependence of dc conductivity [(|dc)TOTAL] of the CsB%B%%O6 (B%=Nb, Ta; B%%=W, Mo) compounds at constant electric field.
Fig. 7 gives the variation of total dc conductivity, ent constant temperatures, viz., 300, 400, 473, 573 and
(|dc)TOTAL, with inverse of absolute temperature (1/T) 673 K, respectively. The source voltage was kept con-
at a constant electric field. The conductivity increases stant at 10 V. In all the four compounds, it is found
with temperature and varies as shown in Fig. 7. The dc that ‘tion’ increases very slowly up to 473 K, beyond
activation energy, Ea, was calculated from the slope of that a rapid increasing trend is observed up to 573 K,
the graph (Fig. 7) using the Arrhenius formula: |= which remains almost constant up to 673 K (Table 4).
|o exp(−Ea/KBT), where KB =Boltzmann constant. Therefore, up to 473 K, the conduction mechanism is
The values of activation energy in the high-temperature mainly dominated by electrons/holes in all the com-
( \500 K) region are found to be 1.22, 1.23, 0.71 and pounds. Above 473 K, ionic contribution in the con-
0.79 eV for CNW, CTW, CNM and CTM, respectively. duction process increases. High values of tion (]0.80)
The nature of octahedral framework (e.g. size of the of all the compounds in the high-temperature region
bottlenecks) plays an important role in determining the suggests that they are good ionic conductors in this
activation energy of a compound. The value of activa- region. Large ionic conductivity of Cs1 + ion containing
tion energy generally depends on the width of the compounds in spite of large ionic radius of Cs1 + ion
may be due to high polarisability of the said ion [25].
channel through which conduction takes place, polaris-
ability of the ion taking part in conduction, etc. [18].
The total dc conductivity, (|dc)TOTAL, of a compound 4. Conclusions
is given by (|dc)TOTAL =|ion +|e, where |ion and |e are
the conductivities due to ion and electron/hole trans- It can be concluded that the CsB%B%%O6 (B% =Nb, Ta;
port respectively. The ionic and electronic transference B%% =W, Mo) compounds, members of defect py-
number (i.e. tion and te) are a measure of the extent of rochlore-type AB%B%%O6 family, have cubic crystal struc-
ionic and electronic contribution in total conduction ture at room temperature. Detailed studies of dielectric
mechanism. Now, tion and te are defined as: tion = |ion/ properties reveal that CsNbWO6 and CsTaWO6 have
(|dc)TOTAL = Iion/IT and te =|e/(|dc)TOTAL =Ie/IT, where very small dielectric anomaly at (1839 2) and (32892)
Iion, Ie, IT are the ionic, electronic and total current K, respectively, whereas their molybdate counterparts
respectively. At a fixed temperature, the instantaneous do not have any such anomaly in the studied frequency
value of current gives (|dc)TOTAL and final stabilised and temperature range. All the compounds behave as
value of it gives |e [24]. The variation of current ionic solids (tion ] 0.80) in high-temperature (]573 K)
through the samples with time was measured at differ- region.
T. Kar, R.N.P. Choudhary / Materials Science and Engineering B90 (2002) 224–233 233