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X-ray Diffraction
History of X-ray
In 1895 Anna Bertha Röntgen and Wilhelm Conrad Röntgen discovers x-
rays. In 1901 they received the first Nobel Prize in physics.
In 1914 Max Von Laue received the Nobel prize for physics, discovery of
the diffraction of x-ray by crystals "Diffraction pattern"
In 1915 W.H. Bragg and his son W.L. Braggand the diffraction of x-ray by
crystals received the Nobel prize for physics, analysis of crystal structure
using x-rays
Phase identification
Phase identification of the sample includes obtaining XRD patterns,
measuring d-spacings and integrated intensities (dI list), and comparing data
with known standards in JCPDS/ICCDD files (> 200,000 files). JCPDS (Joint
Committee on Power Diffraction Standards, 1969) was replaced by ICDD
(International Center for Diffraction Data) in 1978.
ICCD database contains dI list for thousands of crystalline phases. The
PDF contains more than 200,000 diffraction patterns, a modern computer
program can help you determine what phases are present in your sample by
quickly comparing your diffraction data to all of the patterns in the database,
and the PDF card for an entry contains a lot of useful information (including
literature references).
Sample preparation
Powder in size 0.1µm less than particle size (<40 µm). Peak broadening
less diffraction occurs. Smooth the surface after polishing, specimens should
be thermally annealed to eliminate any surface deformation induce during
polishing. An x-ray diffractometer has an x-ray tube, Gobel mirror, goniometer,
Soller slit, and detector.
Advantages
Powerful and rapid (<20 min) technique for identification of unknown
inorganic materials
In most cases, it provides an unambiguous mineral determination
Minimal sample preparation is required
XRD units are widely available
Data interpretation is relatively straightforward
Disadvantages
Homogeneous and single-phase material is the best for identification of
an unknown
Must have access to a standard reference file of inorganic compounds (d-
spacings, hkls)
Requires tenths of a gram of material which must be ground into a power
For mixed materials, the detection limit is (3% of the sample)
For unit cell determinations, indexing of patterns for non-isometric
crystal systems is complicated
Peak overlay may occur and worsens for high angel reflections