Professional Documents
Culture Documents
• Single-voltage Operation
– 5V Read
– 5V Reprogramming
• Fast Read Access Time – 55 ns
• Internal Program Control and Timer
• Sector Architecture
– One 16K Bytes Boot Block with Programming Lockout
– Two 8K Bytes Parameter Blocks
– Eight Main Memory Blocks (One 32K Bytes, Seven 64K Bytes) 4-megabit
• Fast Erase Cycle Time – 6 Seconds
• Byte-by-Byte Programming – 20 µs/Byte Typical (512K x 8)
• Hardware Data Protection
• DATA Polling for End of Program Detection
5-volt Only
• Low Power Dissipation
– 20 mA Active Current
Flash Memory
– 70 µA CMOS Standby Current
• Typical 10,000 Write Cycles
• Green (Pb/Halide-free) Packaging Option AT49F040A
1. Description
The AT49F040A is a 5-volt only in-system reprogrammable Flash memory. Its
4 megabits of memory is organized as 524,288 words by 8 bits. Manufactured with
Atmel’s advanced nonvolatile CMOS technology, the device offers access times to
55 ns with power dissipation of just 110 mW over the commercial temperature range.
When the device is deselected, the CMOS standby current is less than 70 µA. To
allow for simple in-system reprogrammability, the AT49F040A does not require high
input voltages for programming. Five-volt-only commands determine the read and
programming operation of the device. Reading data out of the device is similar to
reading from an EPROM; it has standard CE, OE, and WE inputs to avoid bus conten-
tion. Reprogramming the AT49F040A is performed by erasing a block of data and
then programming on a byte-by-byte basis. The byte programming time is a fast 20
µs. The end of a program cycle can be optionally detected by the DATA polling fea-
ture. Once the end of a byte program cycle has been detected, a new access for a
read or program can begin. The typical number of program and erase cycles is in
excess of 10,000 cycles.
The device is erased by executing the erase command sequence; the device inter-
nally controls the erase operations. There are two 8K byte parameter block sections,
eight main memory blocks, and one boot block.
The device has the capability to protect the data in the boot block; this feature is
enabled by a command sequence. The 16K-byte boot block section includes a repro-
gramming lock out feature to provide data integrity. The boot sector is designed to
contain user secure code, and when the feature is enabled, the boot sector is perma-
nently protected from being reprogrammed.
3359C–FLASH–3/05
2. Pin Configurations
VCC
A12
A15
A16
A18
A17
WE
4
3
2
1
32
31
30
A7 5 29 A14
A6 6 28 A13
A5 7 27 A8
A4 8 26 A9
A3 9 25 A11
A2 10 24 OE
A1 11 23 A10
A0 12 22 CE
I/O0 13 21 I/O7
14
15
16
17
18
19
20
I/O1
I/O2
GND
I/O3
I/O4
I/O5
I/O6
A11 1 32 OE
A9 2 31 A10
A8 3 30 CE
A13 4 29 I/O7
A14 5 28 I/O6
A17 6 27 I/O5
WE 7 26 I/O4
VCC 8 25 I/O3
A18 9 24 GND
A16 10 23 I/O2
A15 11 22 I/O1
A12 12 21 I/O0
A7 13 20 A0
A6 14 19 A1
A5 15 18 A2
A4 16 17 A3
2 AT49F040A
3359C–FLASH–3/05
AT49F040A
3. Block Diagram
AT49F040A
DATA INPUTS/OUTPUTS
I/O7 - I/O0
VCC
GND 8
OE INPUT/OUTPUT
WE CONTROL BUFFERS
CE LOGIC PROGRAM
RESET DATA LATCHES
Y DECODER Y-GATING
ADDRESS 7FFFF
MAIN MEMORY
INPUTS
X DECODER BLOCK 8
(64K BYTES) 70000
MAIN MEMORY 6FFFF
BLOCK 7
(64K BYTES) 60000
MAIN MEMORY 5FFFF
BLOCK 6
(64K BYTES) 50000
MAIN MEMORY 4FFFF
BLOCK 5
(64K BYTES) 40000
3FFFF
MAIN MEMORY
BLOCK 4
(64K BYTES) 30000
MAIN MEMORY 2FFFF
BLOCK 3
(64K BYTES) 20000
1FFFF
MAIN MEMORY
BLOCK 2
(64K BYTES) 10000
MAIN MEMORY 0FFFF
BLOCK 1
(32K BYTES) 08000
PARAMETER 07FFF
BLOCK 2
(8K BYTES) 06000
PARAMETER 05FFF
BLOCK 1
(8K BYTES) 04000
03FFF
BOOT BLOCK
(16K BYTES)
00000
4. Device Operation
4.1 Read
The AT49F040A is accessed like an EPROM. When CE and OE are low and WE is high, the
data stored at the memory location determined by the address pins is asserted on the outputs.
The outputs are put in the high impedance state whenever CE or OE is high. This dual-line con-
trol gives designers flexibility in preventing bus contention.
3
3359C–FLASH–3/05
4.2 Command Sequences
When the device is first powered on, it will be reset to the read or standby mode depending upon
the state of the control line inputs. In order to perform other device functions, a series of com-
mand sequences are entered into the device. The command sequences are shown in the
“Command Definition Table” on page 6. The command sequences are written by applying a low
pulse on the WE or CE input with CE or WE low (respectively) and OE high. The address is
latched on the falling edge of CE or WE (except for the sixth cycle of the Sector Erase com-
mand), whichever occurs last. The data is latched by the first rising edge of CE or WE. Standard
microprocessor write timings are used. The address locations used in the command sequences
are not affected by entering the command sequences.
4.3 Erasure
Before a byte can be reprogrammed, the main memory block or parameter block which contains
the byte must be erased. The erased state of the memory bits is a logical “1”. The entire device
can be erased at one time by using a 6-byte software code. The software chip erase code con-
sists of 6-byte load commands to specific address locations with a specific data pattern (please
refer to the Chip Erase Cycle Waveforms).
After the software chip erase has been initiated, the device will internally time the erase opera-
tion so that no external clocks are required. The maximum time needed to erase the whole chip
is tEC. If the boot block lockout feature has been enabled, the data in the boot sector will not be
erased.
5. Byte Programming
Once the memory array is erased, the device is programmed (to a logical “0”) on a byte-by-byte
basis. Please note that a data “0” cannot be programmed back to a “1”; only erase operations
can convert “0”s to “1”s. Programming is accomplished via the internal device command register
and is a 4 bus cycle operation (please refer to the “Command Definition Table” on page 6). The
device will automatically generate the required internal program pulses.
The program cycle has addresses latched on the falling edge of WE or CE, whichever occurs
last, and the data latched on the rising edge of WE or CE, whichever occurs first. Programming
is completed after the specified tBP cycle time. The DATA polling feature may also be used to
indicate the end of a program cycle.
4 AT49F040A
3359C–FLASH–3/05
AT49F040A
6. Boot Block Programming Lockout
The device has one designated block that has a programming lockout feature. This feature pre-
vents programming of data in the designated block once the feature has been enabled. The size
of the block is 16K bytes. This block, referred to as the boot block, can contain secure code that
is used to bring up the system. Enabling the lockout feature will allow the boot code to stay in the
device while data in the rest of the device is updated. This feature does not have to be activated;
the boot block’s usage as a write protected region is optional to the user. The address range of
the boot block is 00000 to 03FFF.
Once the feature is enabled, the data in the boot block can no longer be erased or programmed.
Data in the main memory block can still be changed through the regular programming method.
To activate the lockout feature, a series of six program commands to specific addresses with
specific data must be performed. Please refer to the “Command Definition Table” on page 6.
5
3359C–FLASH–3/05
7. Command Definition Table
1st Bus 2nd Bus 3rd Bus 4th Bus 5th Bus 6th Bus
Cycle Cycle Cycle Cycle Cycle Cycle
Command Bus
Sequence Cycles Addr Data Addr Data Addr Data Addr Data Addr Data Addr Data
Voltage on OE
with Respect to Ground ...................................-0.6V to +13.5V
6 AT49F040A
3359C–FLASH–3/05
AT49F040A
11. DC Characteristics
Symbol Parameter Condition Min Max Units
ILI Input Load Current VIN = 0V to VCC 10 µA
ILO Output Leakage Current VI/O = 0V to VCC 10 µA
ISB1 VCC Standby Current CMOS CE = VCC - 0.3V to VCC 70 µA
ISB2 VCC Standby Current TTL CE = 2.0V to VCC 1 mA
(1)
ICC VCC Active Current f = 5 MHz; IOUT = 0 mA 20 mA
VIL Input Low Voltage 0.8 V
VIH Input High Voltage 2.0 V
VOL Output Low Voltage IOL = 2.1 mA 0.45 V
VOH1 Output High Voltage IOH = -400 µA 2.4 V
VOH2 Output High Voltage CMOS IOH = -100 µA; VCC = 4.5V 4.2 V
Note: 1. In the erase mode, ICC is 90 mA.
7
3359C–FLASH–3/05
12. AC Read Characteristics
AT49F040A-55 AT49F040A-70
Symbol Parameter Min Max Min Max Units
tACC Address to Output Delay 55 70 ns
(1)
tCE CE to Output Delay 55 70 ns
tOE(2) OE to Output Delay 0 30 0 35 ns
tDF(3)(4) CE or OE to Output Float 0 25 0 25 ns
Output Hold from OE, CE or Address,
tOH 0 0 ns
whichever occurred first
CE
tCE
OE tOE
t DF
tACC tOH
HIGH Z OUTPUT
OUTPUT
VALID
Notes: 1. CE may be delayed up to tACC - tCE after the address transition without impact on tACC.
2. OE may be delayed up to tCE - tOE after the falling edge of CE without impact on tCE or by tACC - tOE after an address change
without impact on tACC.
3. tDF is specified from OE or CE whichever occurs first (CL = 5 pF).
4. This parameter is characterized and is not 100% tested.
8 AT49F040A
3359C–FLASH–3/05
AT49F040A
14. Input Test Waveform and Measurement Level
tR, tF < 5 ns
5.0V
1.8K
OUTPUT
PIN
30 pF
1.3K
9
3359C–FLASH–3/05
17. AC Byte Load Characteristics
Symbol Parameter Min Max Units
tAS, tOES Address, OE Set-up Time 0 ns
tAH Address Hold Time 25 ns
tCS Chip Select Set-up Time 0 ns
tCH Chip Select Hold Time 0 ns
tWP Write Pulse Width (WE or CE) 20 ns
tDS Data Set-up Time 20 ns
tDH, tOEH Data, OE Hold Time 0 ns
tWPH Write Pulse Width High 20 ns
18.1 WE Controlled
OE
tOES tOEH
ADDRESS
tAS tAH
CE tCH
tCS
WE
tWPH
tWP
tDS tDH
DATA IN
18.2 CE Controlled
OE
tOES tOEH
ADDRESS
tAS tAH
WE tCH
tCS
CE
tWPH
tWP
tDS tDH
DATA IN
10 AT49F040A
3359C–FLASH–3/05
AT49F040A
11
3359C–FLASH–3/05
22. Data Polling Characteristics(1)
Symbol Parameter Min Typ Max Units
tDH Data Hold Time 10 ns
tOEH OE Hold Time 10 ns
(2)
tOE OE to Output Delay ns
tWR Write Recovery Time 0 ns
Notes: 1. These parameters are characterized and not 100% tested.
2. See tOE spec in “AC Read Characteristics” .
CE
tOEH
OE
tDH tWR
tOE HIGH Z
I/O7
A0-A18 An An An An An
CE
tOEH tOEHP
OE
tDH tOE
HIGH Z
I/O6
tWR
Notes: 1. Toggling either OE or CE or both OE and CE will operate toggle bit. The tOEHP specification must be met by the toggling
input(s).
2. Beginning and ending state of I/O6 will vary.
3. Any address location may be used but the address should not vary.
12 AT49F040A
3359C–FLASH–3/05
AT49F040A
26. Software Product Identification 28. Boot Block Lockout Feature Enable
Entry(1) Algorithm(1)
LOAD DATA AA LOAD DATA AA
TO TO
ADDRESS 555 ADDRESS 555
LOAD DATA 55
TO
27. Software Product Identification ADDRESS AAA
PAUSE 1 second(2)
LOAD DATA 55 EXIT PRODUCT
TO IDENTIFICATION
ADDRESS AAA MODE(4)
EXIT PRODUCT
IDENTIFICATION
MODE(4)
13
3359C–FLASH–3/05
29. Ordering Information
29.1 Standard Package
tACC ICC (mA)
(ns) Active Standby Ordering Code Package Operation Range
AT49F040A-55JI 32J Industrial
55 25 0.1
AT49F040A-55TI 32T (-40° to 85°C)
AT49F040A-70JI 32J Industrial
70 25 0.1
AT49F040A-70TI 32T (-40° to 85°C)
Package Type
32J 32-lead, Plastic J-leaded Chip Carrier Package (PLCC)
32T 32-lead, Plastic Thin Small Outline Package (TSOP) (8 x 20 mm)
14 AT49F040A
3359C–FLASH–3/05
AT49F040A
30. Packaging Information
E1 E B1 E2
B
e
A2
D1
A1
D
A
0.51(0.020)MAX
45˚ MAX (3X) COMMON DIMENSIONS
(Unit of Measure = mm)
15
3359C–FLASH–3/05
30.2 32T – TSOP
PIN 1
0º ~ 8º
c
Pin 1 Identifier
D1 D
e b L1
COMMON DIMENSIONS
A1 (Unit of Measure = mm)
10/18/01
TITLE DRAWING NO. REV.
2325 Orchard Parkway
32T, 32-lead (8 x 20 mm Package) Plastic Thin Small Outline 32T B
R San Jose, CA 95131 Package, Type I (TSOP)
16 AT49F040A
3359C–FLASH–3/05
Atmel Corporation Atmel Operations
2325 Orchard Parkway Memory RF/Automotive
San Jose, CA 95131, USA 2325 Orchard Parkway Theresienstrasse 2
Tel: 1(408) 441-0311 San Jose, CA 95131, USA Postfach 3535
Fax: 1(408) 487-2600 Tel: 1(408) 441-0311 74025 Heilbronn, Germany
Fax: 1(408) 436-4314 Tel: (49) 71-31-67-0
Fax: (49) 71-31-67-2340
Regional Headquarters Microcontrollers
Europe 2325 Orchard Parkway 1150 East Cheyenne Mtn. Blvd.
Atmel Sarl San Jose, CA 95131, USA Colorado Springs, CO 80906, USA
Route des Arsenaux 41 Tel: 1(408) 441-0311 Tel: 1(719) 576-3300
Case Postale 80 Fax: 1(408) 436-4314 Fax: 1(719) 540-1759
CH-1705 Fribourg
Switzerland La Chantrerie Biometrics/Imaging/Hi-Rel MPU/
Tel: (41) 26-426-5555 BP 70602 High Speed Converters/RF Datacom
Fax: (41) 26-426-5500 44306 Nantes Cedex 3, France Avenue de Rochepleine
Tel: (33) 2-40-18-18-18 BP 123
Asia Fax: (33) 2-40-18-19-60 38521 Saint-Egreve Cedex, France
Room 1219 Tel: (33) 4-76-58-30-00
Chinachem Golden Plaza ASIC/ASSP/Smart Cards Fax: (33) 4-76-58-34-80
77 Mody Road Tsimshatsui Zone Industrielle
East Kowloon 13106 Rousset Cedex, France
Hong Kong Tel: (33) 4-42-53-60-00
Tel: (852) 2721-9778 Fax: (33) 4-42-53-60-01
Fax: (852) 2722-1369
1150 East Cheyenne Mtn. Blvd.
Japan Colorado Springs, CO 80906, USA
9F, Tonetsu Shinkawa Bldg. Tel: 1(719) 576-3300
1-24-8 Shinkawa Fax: 1(719) 540-1759
Chuo-ku, Tokyo 104-0033
Japan Scottish Enterprise Technology Park
Tel: (81) 3-3523-3551 Maxwell Building
Fax: (81) 3-3523-7581 East Kilbride G75 0QR, Scotland
Tel: (44) 1355-803-000
Fax: (44) 1355-242-743
Literature Requests
www.atmel.com/literature
Disclaimer: The information in this document is provided in connection with Atmel products. No license, express or implied, by estoppel or otherwise, to any
intellectual property right is granted by this document or in connection with the sale of Atmel products. EXCEPT AS SET FORTH IN ATMEL’S TERMS AND CONDI-
TIONS OF SALE LOCATED ON ATMEL’S WEB SITE, ATMEL ASSUMES NO LIABILITY WHATSOEVER AND DISCLAIMS ANY EXPRESS, IMPLIED OR STATUTORY
WARRANTY RELATING TO ITS PRODUCTS INCLUDING, BUT NOT LIMITED TO, THE IMPLIED WARRANTY OF MERCHANTABILITY, FITNESS FOR A PARTICULAR
PURPOSE, OR NON-INFRINGEMENT. IN NO EVENT SHALL ATMEL BE LIABLE FOR ANY DIRECT, INDIRECT, CONSEQUENTIAL, PUNITIVE, SPECIAL OR INCIDEN-
TAL DAMAGES (INCLUDING, WITHOUT LIMITATION, DAMAGES FOR LOSS OF PROFITS, BUSINESS INTERRUPTION, OR LOSS OF INFORMATION) ARISING OUT
OF THE USE OR INABILITY TO USE THIS DOCUMENT, EVEN IF ATMEL HAS BEEN ADVISED OF THE POSSIBILITY OF SUCH DAMAGES. Atmel makes no
representations or warranties with respect to the accuracy or completeness of the contents of this document and reserves the right to make changes to specifications
and product descriptions at any time without notice. Atmel does not make any commitment to update the information contained herein. Atmel’s products are not
intended, authorized, or warranted for use as components in applications intended to support or sustain life.
© Atmel Corporation 2005. All rights reserved. Atmel®, logo and combinations thereof, and others, are registered trademarks, and
Everywhere You AreSM and others are the trademarks of Atmel Corporation or its subsidiaries. Other terms and product names may be
trademarks of others.
3359C–FLASH–3/05 xM