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Observation of The Goos-Hänchen Shift in Graphene Via Weak Measurements
Observation of The Goos-Hänchen Shift in Graphene Via Weak Measurements
Goos–Hänchen effect enabled optical differential operation and image edge detection
Applied Physics Letters 116, 211103 (2020); https://doi.org/10.1063/5.0006483
Ultrasensitive and real-time detection of chemical reaction rate based on the photonic spin
Hall effect
APL Photonics 5, 016105 (2020); https://doi.org/10.1063/1.5131183
© 2017 Author(s).
APPLIED PHYSICS LETTERS 110, 031105 (2017)
The behavior of plane wave in reflection can be simply requirement of a very large weak value, the final output
predicted by geometrical optics. However, for the bounded intensity is still strong and measured data are stable. Our
beam of light, it may undergo extra shifts due to the occur- result suggests that this technique may become an alternative
rence of diffractive corrections. Such shifts are known as way to effectively and conveniently identify layers of few-
the Goos-H€anchen (GH)1 and the Imbert-Fedorov2,3 shifts layer graphene.
according to the directions parallel and perpendicular to the Consider a reflection system shown in Fig. 1. An incom-
plane of incidence, respectively. In recent years, the research ing beam is at the 45 linearly polarization state jAi. Under a
of the GH shift is still active although it was discovered more TIR condition, the reflected light consists of two beams, one
than 60 years ago. The corresponding studies reach not only is the horizontal (H) component jHi displaced by XH and the
to the investigation of the inherent physics behind this phe- other is the vertical (V) component jVi displaced by XV. We
nomenon4–8 but also to the behavior of the shift at various only concern about the difference between XV and XH as it is
reflecting surfaces.9–15 For example, in photonic crystals,16 the measured variable in our weak measurement scheme. To
the GH shift for self-collimated beams were experimental calculate the GH shift (XV – XH) for different graphene
observed.17 In the system with graphene, it is very interesting layers, the obtainment of the reflection coefficient in the
for the observation of beam shifts due to flexible optical prop- graphene-dielectric interface is important.
erties. The GH shift in reflection from a graphene-dielectric There are many models of reflection coefficients in gra-
interface is therefore extensively studied. The Fresnel reflec- phene. For example, in previous works the slab-based model
tion coefficients with the existence of graphene become dif- is used to calculate the beam shifts in multi-layer gra-
ferent,18,19 and the behavior of the GH shift is changed or phene.23,39 This model is deduced by taking the refractive
tunable.20,21 In particular, the GH shift on a substrate coated indexes of graphene into account in each independent
with graphene can be quantized in an external magnetic component. For monolayer graphene, based on the boundary
field;22 though in a common environment, a giant GH shift in conditions with related parameters, a nice model called
graphene was observed.23 For electron beams, there also exits Fresnel-based model is introduced by Merano to study the
the GH effect in reflection. The shift becomes giant in gra-
phene double-barrier structures,24 and an electron spin beam
splitter was realized by using this effect in graphene.25
In this letter, we investigate the GH shift in graphene
under a total internal reflection (TIR) condition. The GH
shift is still very small under this condition and difficult to be
directly observed. However, using an amplify technique
called weak measurements, such a difficulty can be over-
come. Weak measurement is an important and convenient
approach that has reached fruitful achievements for detecting
light beam shifts.26–32 This conception was first proposed in
the context of quantum mechanics and then has been exten-
sively studied.33–36 With the help of weak measurements, the
GH shift in TIR37 or in partial reflection38 was observed
recently. In our work, we find that the shift in graphene
amplified by a weak value scheme is sensitive to the gra-
phene layers. Because the GH effect occurs in the regime of
TIR (the reflected intensity is equal to incident intensity) and
FIG. 1. Schematic illustrating the GH shift in graphene under TIR. A 45
the success rate of the postselection is still large due to no linearly polarized beam labeled by jAi hits a glass-graphene-air interface. Its
components jHi and jVi experience different lateral small GH shifts. The
a) green arrows indicate the polarization direction.
Electronic mail: hailuluo@hnu.edu.cn
RA þ R0A expð2idkgz Þ
rA ¼ : (1)
1 þ RA R0A expð2idkgz Þ
1 @uA z 1 @jrA j
XA ¼ ; (2)
nk0 @hi zr nk0 jrA j @hi
hf j ¼ eið2a7DÞ eið2a7DÞ : (8) 1 z
Re½Aw ðDH DV Þ þ Im½Aw ðDH DV Þ : (11)
2 zr
For convenience, we represent the above states jii, jcm i, and
jf i on the Poincare sphere, as shown in Fig. 2(b). One can We have used a quantum mechanical description to ana-
see that the postselected state jf i is limited on the red dashed lyze the amplified GH shift in order to provide a good physi-
circle by adjusting HWP [from Eq. (8)]. For the preselected cal insight and simplify the analysis. However, the above
state jcm i, it exhibits a deviation from the red dashed circle theory will be invalid when the preselected and postselected
on the Poincare sphere in Fig. 2(b) [see Fig. 3(a) for the states are nearly orthogonal. Therefore, in order to obtain a
cases of different layers]. The reason for this deviation is more precise analysis for the weak measurement of GH
that jrH j 6¼ jrV j, and the difference between jrH j and jrV j effect, we next describe it by using standard wave optics.37
increases with increasing layers of graphene. We begin with the wave function of the beam after passing
With the preselected and postselected states discussed GLP1
above, the weak value in our weak measurements can be " #
2 2
obtained as x þ y
winc / exp iz k0 ðx^ þ y^Þ; (12)
2ðzr þ izÞ
^ mi 1
hf jGHjc Aw
¼ ðD H þ D V Þ þ ðDH DV Þ; (9)
hf jcm i 2 2 with the optical axis of GLP1 at 45 . When the beam reflects
from the glass-graphene-air interface, the function becomes4
where Aw ¼ hf jr^3 jcm i=hf jcm i, and r^3 is the Pauli matrix.
" #
The weak value from Eq. (9) is related to m, i.e., the layer of
ref x2 þ y2
graphene. Here, Aw in all cases is a complex number except w / exp iz k0
2ðzr þ izÞ
the one m ¼ 0, in which it is pure imaginary. Note that the
GH shift in TIR with graphene contains both spatial and the k0 x @ ln rH
x^ rH 1 i
angular components, and the imaginary part of Aw can natu- zr þ iz @hi
rally convert the relevant spatial shift into an angular one.
k0 x @ ln rV
Therefore, in order to obtain the centroid position of the þ y^ rV 1 i ; (13)
zr þ iz @hi
beam, the propagation effect in all cases should be consid-
ered.4,26 Containing Eq. (9), we obtain the amplified GH and we have ignored the terms responsible for the transverse
shift hxqua i as shift. Then QWP and HWP are introduced, and their actions
! ! are represented by Eq. (6). To obtain a state orthogonal to
^ mi
hf jGHjc z ^ mi
hf jGHjc the one in Eq. (7) as close as possible, HWP should be set as
Re þ Im : (10)
hf jcm i zr hf jcm i a ¼ ð3p þ uÞ=4, with u ¼ uH uV . This is the key step to
obtain the minimum output intensity, which will be intro-
In fact, the shift we measure in the experiment is a relative duced later. After considering the operation of GLP2, the
position of the beams on CCD for the postselected states final wave function follows that
with 6D. Thus, after the irrelative terms in Eq. (10) are " #
neglected, the amplified GH shift hxqua i is given by x 2
þ y 2
wfin / exp iz k0
2ðzr þ izÞ
p p
cos 6D ð# þ ieiu Þ þ sin 6D ði# þ eiu Þ ;
4 4
(14)
k0 x @ ln rV
0 x @ ln rH
where # ¼ rH 1 i zrkþiz @hi and ¼ r V 1 i zr þiz @hi .
Now the amplified shift (the beam centroid) can be straight-
ÐÐ ÐÐ
forwardly calculated by hxcla i¼ xjwfin j2 dxdy= jwfin j2 dxdy
as
h i
2 jrH j2 ðzq zr vÞ þ jrV j2 ðzr zr sÞ þ njrH jjrV j
;
2k0 zr jrH j2 þ jrV j2 þ jrH j2 ðv2 þ q2 Þ þ jrV j2 ðr2 þ s2 Þ 1
(15)
the HWP and the state jf i will project on the red dashed cir- is a non-interacting monolayer, for few-layer graphene, the
cle in Fig. 2(b). We adjust the HWP until the output intensity surface conductivity and the surface susceptibility values
on CCD becomes minimum. This indicates that the postse- increase linearly with layer number m (m 6 5).46 So we
lected state jf i is most closely orthogonal to the preselected obtain the parameters for multi-layer graphene as m 6.08
state jcm i. We simulate the minimum intensity for different 105 X and m 1.0 109 m. From Figs. 4(a) and 4(c),
graphene layers by I ¼ jwfin ðx; y; z; D ¼ 0Þj2 from Eq. (14). we see that the predictions from the Fresnel-based model
In Fig. 3(b), we see that only in the case of no graphene the and the slab-based model both consist of the experimental
minimum intensity exhibits a double-peak profile, which is a results. For a better comparison between the Fresnel-based
usual distribution of the minimum output intensity in weak model and the slab-based model, the discussion with various
measurements.34 This is because in that case the state jf i is experimental data is required.40,47,48
possible to be orthogonal to jc0 i. For other cases with the In our experiment, each sample we fabricate is uniform
existence of graphene, the tunable postselected state can not layer and the size of sample is 1 cm 1 cm. In practice, we
be orthogonal to the preselected state, and the nonorthogonal repeat the experiment of weak measurements several times
degree becomes larger when the layers of graphene increase, in different measuring places for each sample and the data
leading to a smaller weak value. As a result, the minimum are nearly the same. To confirm the corresponding layers of
intensity tends to a Gaussian form.45 The minimum intensity graphene film, we provide their Raman spectra in Fig. 4(d).
in the experimental observation is shown in Fig. 3(c). The layers of each sample deduced from our data coincide
After minimizing the output intensity by adjusting well with the results from Raman spectra.
HWP, we rotate the GLP2 first to (45 þ D) and then to The measurability of very small displacements is ulti-
(45 – D) to measure the final amplified shift. We measure mately limited by the quantum noise of the light, because
the shifts in no, one-layer, two-layer, and three-layer gra- enough photons need to be collected to resolve the position
phene. The theoretical amplified shift is precisely obtained of the field.26 Note that another interesting beam shift
from Eq. (15), and one can calculate the corresponding induced by the photonic spin Hall effect can also be used to
amplified factor by hxcla i=ðXH XV Þ. We plot the related identify graphene layers.39 In that case, the experimental
curves in Figs. 4(a) and 4(b) based on the slab-based model measurement was performed near Brewster angle. Therefore,
of reflection coefficients. We see that the amplified factors the experimental data are a little unstable due to a low reflec-
are not very large. But for a fixed angle D, the amplified shift tion intensity near Brewster angle. In the present case, how-
obviously decreases with increasing layers. ever, enough photons can be captured by the detector due to
As we have introduced above, there are another model the TIR. From the error bars in Fig. 4, we see that the data
of reflection coefficients (the Fresnel-based model) that can read from CCD are very stable. We recently noted that a sim-
be used to analyze the GH effect. In Fig. 4(c), we simulate ilar experimental setup can also be used to observe the angu-
the theoretical curves according to this model, together with lar and lateral GH shifts near the critical angle for TIR.49
the experimental data. For one-layer graphene at wavelength In conclusion, we have experimentally observed the GH
633 nm, we choose the surface conductivity and the surface shift in graphene via weak measurements. Theoretically, the
susceptibility values as 6.08 105 X and 1.0 109 m, variations of the initial shifts for no, one-layer, two-layer,
respectively.40 Assuming that an individual graphene sheet and three-layer graphene are tiny. However, employing a
24
weak value amplification scheme, the amplified GH shift Y. Song, H.-C. Wu, and Y. Guo, Appl. Phys. Lett. 100, 253116 (2012).
25
decreases with layer number of graphene. This technique Q. Zhang and K. S. Chan, Appl. Phys. Lett. 105, 212408 (2014).
26
O. Hosten and P. Kwiat, Science 319, 787 (2008).
may be utilized to identify layers of few-layer graphene with 27
P. B. Dixon, D. J. Starling, A. N. Jordan, and J. C. Howell, Phys. Rev.
the stable data of this system. Our research is important for Lett. 102, 173601 (2009).
28
the research of graphene in future and may offer the opportu- Y. Qin, Y. Li, H. He, and Q. Gong, Opt. Lett. 34, 2551 (2009).
29
Y. Gorodetski, K. Y. Bliokh, B. Stein, C. Genet, N. Shitrit, V.
nity to characterize the parameters of graphene with the help
Kleiner, E. Hasman, and T. W. Ebbesen, Phys. Rev. Lett. 109,
of weak measurements. 013901 (2012).
30
L.-J. Kong, X.-L. Wang, S.-M. Li, Y. Li, J. Chen, B. Gu, and H.-T. Wang,
This research was supported by the National Natural Appl. Phys. Lett. 100, 071109 (2012).
31
J. Ren, Y. Li, Y. Lin, Y. Qin, R. Wu, J. Yang, Y.-F. Xiao, H. Yang, and Q.
Science Foundation of China (Grant Nos. 11274106 and Gong, Appl. Phys. Lett. 101, 171103 (2012).
11474089). 32
X. Zhou, Z. Xiao, H. Luo, and S. Wen, Phys. Rev. A 85, 043809
(2012).
1 33
F. Goss and H. H€anchen, Ann. Phys. 436, 333 (1947). Y. Aharonov, D. Z. Albert, and L. Vaidman, Phys. Rev. Lett. 60, 1351
2
C. Imbert, Phys. Rev. D 5, 787 (1972). (1988).
3 34
F. I. Fedorov, J. Opt. 15, 014002 (2013) [Dokl. Akad. Nauk SSSR 105, I. M. Duck, P. M. Stevenson, and E. C. G. Sudarshan, Phys. Rev. D 40,
465 (1955) (in Russian)]. 2112 (1989).
4 35
A. Aiello and J. P. Woerdman, Opt. Lett. 33, 1437 (2008). A. G. Kofman, S. Ashhab, and F. Nori, Phys. Rep. 520, 43 (2012).
5 36
M. R. Dennis and J. B. G€ otte, New J. Phys. 14, 073013 (2012). J. Dressel, M. Malik, F. M. Miatto, A. N. Jordan, and R. W. Boyd, Rev.
6
F. T€oppel, M. Ornigotti, and A. Aiello, New J. Phys. 15, 113059 (2013). Mod. Phys. 86, 307 (2014).
7 37
K. Y. Bliokh and A. Aiello, J. Opt. 15, 014001 (2013). G. Jayaswal, G. Mistura, and M. Merano, Opt. Lett. 38, 1232 (2013).
8 38
M. Ornigotti, A. Aiello, and C. Conti, Opt. Lett. 40, 558 (2015). S. Goswami, S. Dhara, M. Pal, A. Nandi, P. K. Panigrahi, and N. Ghosh,
9
H. M. Lai and S. W. Chen, Opt. Lett. 27, 680 (2002). Opt. Express 24, 6041 (2016).
10 39
H. Gilles, S. Girard, and J. Hamel, Opt. Lett. 27, 1421 (2002). X. Zhou, X. Ling, H. Luo, and S. Wen, Appl. Phys. Lett. 101, 251602
11
D.-K. Qing and G. Chen, Opt. Lett. 29, 872 (2004). (2012).
12 40
X. Yin, L. Hesselink, Z. Liu, N. Fang, and X. Zhang, Appl. Phys. Lett. 85, M. Merano, Phys. Rev. A 93, 013832 (2016).
41
372 (2004). M. Merano, Opt. Lett. 41, 5780 (2016).
13 42
X. Yin and L. Hesselink, Appl. Phys. Lett. 89, 261108 (2006). G. Jayaswal, G. Mistura, and M. Merano, Opt. Lett. 39, 6257 (2014).
14 43
J. He, J. Yi, and S. He, Opt. Express 14, 3024 (2006). M. Bruna and S. Borini, Appl. Phys. Lett. 94, 031901 (2009).
15 44
M. Merano, A. Aiello, G. W.’t Hooft, M. P. van Exter, E. R. Eliel, and J. B. G€otte, W. L€offler, and M. R. Dennis, Phys. Rev. Lett. 112, 233901
J. P. Woerdman, Opt. Express 15, 15928 (2007). (2014).
16 45
X. Yu and S. Fan, Appl. Phys. Lett. 83, 3251 (2003). S. Chen, X. Zhou, C. Mi, H. Luo, and S. Wen, Phys. Rev. A 91, 062105
17
A. Matthewsa and Y. Kivshar, Appl. Phys. Lett. 93, 131901 (2008). (2015).
18 46
S. Grosche, M. Ornigotti, and A. Szameit, Opt. Express 23, 30195 (2015). H. Yan, X. Li, B. Chandra, G. Tulevski, Y. Wu, M. Freitag, W. Zhu, P.
19
N. Hermosa, J. Opt. 18, 025612 (2016). Avouris, and F. Xia, Nat. Nanotechnol. 7, 330 (2012).
20 47
J. C. Martinez and M. B. A. Jalil, Europhys. Lett. 96, 27008 (2011). P. Blake, E. W. Hill, A. H. Castro Neto, K. S. Novoselov, D. Jiang, R.
21
M. Cheng, P. Fu, X. Chen, X. Zeng, S. Feng, and R. Chen, J. Opt. Soc. Yang, T. J. Booth, and A. K. Geim, Appl. Phys. Lett. 91, 063124
Am. B 31, 2325 (2014). (2007).
22 48
W. J. M. Kort-Kamp, N. A. Sinitsyn, and D. A. R. Dalvit, Phys. Rev. B 93, V. G. Kravets, A. N. Grigorenko, R. R. Nair, P. Blake, S. Anissimova,
081410(R) (2016). K. S. Novoselov, and A. K. Geim, Phys. Rev. B 81, 155413 (2010).
23 49
X. Li, P. Wang, F. Xing, X.-D. Chen, Z.-B. Liu, and J.-G. Tian, Opt. Lett. O. J. S. Santana, S. A. Carvalho, S. De Leo, and L. E. E. De Araujo, Opt.
39, 5574 (2014). Lett. 41, 3884 (2016).