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Lecture 1 P2 Semiconductor
Lecture 1 P2 Semiconductor
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Subject E1
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Pn , Pp dereived expression
Low Level Injection
Δp, Δn derivation
Reverse saturation Current Density Js
Reverse Saturation Current IS
Diode Equation
How to Solve Diode Circuit
Using Circuitry
Using Load Lines
Diffusion Capacitance
VJ = VT ln ( ppn0
p0
)
VJ = VT ln ( nnn0
p0
)
⟹
nn0 = np0 exp( VTj )
V
To avoid confusion with the variables under a voltage bias in the later derivation, we use
pp0 , pn0 , nn0 , np0 to denote the carries under unbias and equilibrum condition
When forward biased, majority carrier concentrations ⇒ unchanged, while minority carrier
concentration ⇒Large increase
Graphical Illustration
When under a forward bias, p-region is added wtth more holes and n-region is added with
more electrons. These surplus holes and electrons come from supply voltage
The surplus e− in n region and surplus holes in p region significantly weaken electric field
right at the depletion region⇒Depletion region will be more narrow
This weakended electric field E will not be able to overcome the diffusion current.
Eventually, diffusion will take place as a result of concentration gradient
The surplus e− in n-region will be driven across junction and combine with holes in p-
region. Similarly for holes in p-region
The main concentration in p side is holes and n side is electron. After forward bias, they
are added more holes in p region and more electrons in n region ⇒ Minority carries in both
side will be very small compared to the majority carries. We called this Low Level
Injection
x − xn
pn (x) = Δp exp( ) + pn0
Lp
−x − xp
np (x) = Δn exp( ) + np0
Ln
Graphical Representation
VD
pp = pn0 exp( ) = pn (xn0 )
VT
where VD is the voltage applied to the pn junction
pn (xn0 ) = Δp + pn0
Then substitute into the above eq, we have
VD
Δp + pn0 = pn0 exp( )
VT
VD
⟹ Δp = pn0 (exp( ) − 1)
VT
Reverse saturation Current Density Js
⎧p (x) = Δp exp( x − xn ) + p
n n0
Lp
⎨
VD x − xn
pn (x) = pn0 (exp( ) − 1) exp( ) + pn0
VT Lp
since we have (recall diffusion current eq)
dpn (x)
Jp (x) = −qDp
dx
Thus, we have (just another derivative of above pn (x) )
Dp VD x − xn
Jp (x) = q pn0 (exp( ) − 1) exp( )
Lp VT Lp
At x = xn
Dp VD
Jp (x) = q pn0 (exp( ) − 1)
Lp VT
Similarly at x = xp
Dn VD
Jn (x) = q np0 (exp( ) − 1)
Ln VT
Therefore, total current density is the sum of diffusion current for holes and electrons
VD
J = Jn + Jp = Js (exp( ) − 1)
VT
where Js is
Dp Dn
Is = Js A = Aqn2i ( + )
Np Lp Nn Ln
Where Ln , Lp are respectively the diffusion lenght for electrons and holes and are defined as
Ln = Dn τn
Lp = Dp τp
Where τn , τp are the minority carries lifetime
1 Dp 1 Dn
Is = Js A = Aqn2i ( + )
NA τp ND τn
Remember that A is a cross sectional area and n is called the identity factor
Diode Equation
qVD VD
iD = IS [exp( ) − 1] = IS [exp( ) − 1]
nkT nVT
k is a Boltzman Constant = 1.38 x 10−23 J /K
T is absolute temperature in Kelvin
n is non-ideality factor (dimesionless)
VT = kT /q is thermal voltage ( 25mV at room teperature )
💡 Apply
2. KVL
vi = RiD + vD
iD = iS (evD /nvT − 1)
Graphical Illustration
2. Assume Diode is 1 state (ON or OFF). Use Diode equation to solve for iD and vD
3. Check inequality associated with that state. If iD and vD statisfy the inequality ⇒
State correct. If not, turn back to step 2 and continue with the other state
Note that
This way only work if we know all value of elements so we can work out the value for iD
and vD
Diffusion Capacitance
We have the charge eq is
VD
Q = Aqpn0 (exp( ) − 1)
VT
Then the Diffusion Capacitance is
dQ Aqpn0 VD
C= = exp( )
dV VT VT