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  • Please Perform Full FA For SBL Violation: Sort Name IDSS - (ON) ::1.5 PCT 1 Good Unit/5 Reject Unit

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    Idham Sazali
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    Five NFET units were submitted for analysis due to a reported issue of an SBL violation during testing. Upon inspection and x-ray analysis, no physical defects were found in the packages or dies. All electrical parameters for the units, including gate leakage, drain leakage, and threshold voltage, were tested using curve tracing and found to be within specification limits for the part when compared to a known good unit. It was concluded that the submitted units were not verified to be electrical failures.

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    S230104-042

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    Five NFET units were submitted for analysis due to a reported issue of an SBL violation during testing. Upon inspection and x-ray analysis, no physical defects were found in the packages or dies. All electrical parameters for the units, including gate leakage, drain leakage, and threshold voltage, were tested using curve tracing and found to be within specification limits for the part when compared to a known good unit. It was concluded that the submitted units were not verified to be electrical failures.

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    © All Rights Reserved
    Download as PDF, TXT or read online from Scribd
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    3 views3 pages

    Please Perform Full FA For SBL Violation: Sort Name IDSS - (ON) ::1.5 PCT 1 Good Unit/5 Reject Unit

    Uploaded by

    Idham Sazali
    Five NFET units were submitted for analysis due to a reported issue of an SBL violation during testing. Upon inspection and x-ray analysis, no physical defects were found in the packages or dies. All electrical parameters for the units, including gate leakage, drain leakage, and threshold voltage, were tested using curve tracing and found to be within specification limits for the part when compared to a known good unit. It was concluded that the submitted units were not verified to be electrical failures.

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    © All Rights Reserved
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    of 3

    Report #: S230104-042

    QFN submitted five NTLUD4C26NTAG NFET UDFN6 30V 8.7A 21MOHM's for analysis. The problem statement read:
    "please perform full FA for SBL Violation : Sort Name = ; IDSS-(ON)::1.5 PCT 1 good unit/5 reject unit".

    onsemi inspected the units thoroughly under an optical microscope and package markings were captured. No
    problems were found during package inspection. X-ray analysis was conducted and no problems were found. Curve
    Trace testing per the device test specification document was conducted. The parameters tested on the curve tracer
    all passed for all units.

    In conclusion, the submitted units were not verified to be electrical failures.

    onsemi (M) Sdn. Bhd.Lot 122, Senawang Industrial Estate70450 Seremban, Negeri Sembilan, MalaysiaTel: +606-682 1870
    Product Analysis Laboratory
    Report #: S230104-042
    ONRMS Rel ID:

    Figure 1: (SN1) Optical image of topside package. No Figure 2: (SN1) Optical image of backside package. No
    damage or defects present. Similar observation for other damage or defects present. Similar observation for other
    units. units.

    Figure 3: (SN1) Xray image of unit, top view. No problems Figure 4: (SN1) Xray image of unit, side view. No
    found. Similar observation for other units. problems found. Similar observation for other units.

    Page 2 of 3
    Product Analysis Laboratory
    Report #: S230104-042
    ONRMS Rel ID:

    Test condition:
    ±IGSS < 100nA @ 12V
    IDSS < 1μA @ 30V
    0.6V < VTH < 1.1V @ 250μA

    Pass Delta/Shift Failed 48A

    INITIAL CURVE TRACE


    UNIT DIE# PARAMETERS
    +IGSS -IGSS IDSS VTH
    1 0.82nA 0.66nA 4.81nA 0.87V
    Good
    2 0.78nA 0.60nA 159.00nA 0.87V
    1 0.88nA 0.70nA 9.24nA 0.87V
    SN1
    2 0.79nA 0.66nA 4.92nA 0.87V
    1 0.78nA 0.67nA 14.10nA 0.88V
    SN2
    2 0.88nA 0.68nA 10.38nA 0.89V
    1 0.91nA 0.64nA 4.36nA 0.88V
    SN3
    2 0.89nA 0.67nA 26.45nA 0.90V
    1 0.92nA 0.68nA 6.65nA 0.92V
    SN4
    2 0.81nA 0.56nA 285.00nA 0.93V
    1 0.94nA 0.71nA 10.22nA 0.90V
    SN5
    2 0.83nA 0.28nA 3.67nA 0.91V

    Figure 5: Curve Trace results. All units were tested pass within specification limits for both dies compared with
    known Good unit.

    Page 3 of 3

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