Helmut Fisher

Operator‘s Manual
FISCHERSCOPE® X-RAY XAN® 215

X-Ray Fluorescence Measuring Instruments, Optimized for fast

and non-destructive Analysis and Coating Thickness Measurement
of Gold and Silver Alloys
XAN® 222
XAN® 215
XAN® 220
FISCHERSCOPE® X-RAY XAN®
X-ray fluorescence (EDXRF) measuring instrument
For coating thickness measurements and materials analysis according to the energy dispersive X-ray fluo-
rescence method
Document order number: 952-598

Issue date: 2022-09-30
Manufacturer
Helmut Fischer GmbH Phone: +49 (0) 70 31 3 03 - 0
Institut für Elektronik und Messtechnik Fax: +49 (0) 70 31 3 03 - 710
Industriestraße 21 www.helmut-fischer.com
D-71069 Sindelfingen mail@helmut-fischer.com
On our home page www.helmut-fischer.com you will find the addresses of our sole agencies and subsidiary
companies around the globe.
Quality Assurance System of the Helmut Fischer GmbH Institut für Elektronik und Messtechnik
DIN EN ISO 9001:2015 Management system certified by Swiss Association for Quality and Man-
agement Systems (SQS)
DIN EN ISO/IEC 17025 Calibration lab accredited for certified mass per unit area standards
© 2022 by Helmut Fischer GmbH Institut für Elektronik und Messtechnik, Germany.
This document is protected by copyright. All rights reserved. This document may not be reproduced by any
means (print, photocopy, microfilm or any other method) in full or in part, or processed, multiplied or distrib-
uted to third parties by electronic means without the written consent of Helmut Fischer GmbH Institut für
Elektronik und Messtechnik.
Subject to correction and technical changes.
FISCHERSCOPE®, XAN® and WinFTM® are registered trade marks of the Helmut Fischer GmbH Institut für
Elektronik und Messtechnik in Germany and other countries.
Note: Designations not marked with ® or ™ may also be protected by law.
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Table of Contents
1 Safety Information. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 9
1.1 Read the Operator’s Manual Carefully Before Operating . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 9
1.2 Warning Notices Used . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 9
1.3 Intended Use . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 9
1.4 Limitation of Liability . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 10
1.5 Safety of the Electrical Equipment . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 10
1.6 X-Radiation Safety . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 10
1.7 Repeat Inspection . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 10
1.8 Safety Devices. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 10
1.9 Start-up . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 11
1.10 Operation . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 11
1.11 Maintenance and Repair . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 12
1.12 Disposal . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 12
1.13 Requirements for the Operating Personnel . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 12
1.14 Frequently Asked Questions Concerning X-Radiation Safety . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 14
2 Instrument Overview . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 15
2.1 Areas of Application. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 15
2.2 Standard-free Measurements . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 15
2.3 X-Ray Fluorescence . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 16
2.4 Functional Principle of the Instrument . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 17
3 Components . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 19
3.1 Cover of the Measurement Chamber . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 19
3.2 Manually Operable XY Stage (XAN 222) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 19
3.3 Aperture (Collimator) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 19
3.4 Shutter . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 19
3.5 Specimen Lighting . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 19
3.6 Key Switch for the X-Ray Energy . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 19
3.7 Control Panel . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 20
3.8 Focus Adjustment Knob on the Right Side of the Instrument . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 20
4 Set up. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 21
4.1 Set-up Location. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 21
4.2 Setting up the Instrument. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 22
4.3 Establishing Connections . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 23
4.4 Installing WinFTM software . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 24
4.5 Switching on the Instrument . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 25
4.6 Switching off the Instrument . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 25
4.7 Communication between Instrument and WinFTM . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 26
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5 Position Specimen . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 27
5.1 Flat Specimens . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 27
5.2 Cylindrical or Curved Specimens . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .27
5.3 Measurements on Inclines. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .28
5.4 Position of Jewelry Items. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .28
5.5 Positioning of Specimen. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 29
5.6 Procedure . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .29
6 Performing Measurements . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 31
7 User Interface of the WinFTM Software. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 33

7.1 WinFTM Main Window. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .33
7.2 Video Image . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 34
7.3 Zooming and Enlarging the Video Image . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .35
7.4 Changing the Color of the Crosshairs . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .35
7.5 Statistics Field . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .35
7.6 Measurement Value Field . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 36
7.7 Changing the Measurement Value Presentation. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .37
7.8 Status Bar . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 38
7.9 mq Value . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .39
7.10 Upper Limit of the mq Value . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .39
7.11 Possible reasons for mq values that are too high . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 39
7.12 Limited Operating Mode - Short menu . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .40
7.13 The Spectrum Window . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .41
7.14 Saving a Spectrum . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 42
7.15 Loading a spectrum . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .42
7.16 Deleting a spectrum . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .42
7.17 Printing a spectrum . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .43
7.18 Performing Measurements in the Spectrum Window . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 43
7.19 Determining the Elements of a Sample . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 43
7.20 Energy . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .44
7.21 Intensity . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .44
8 WinFTM File Structure . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 45

8.1 DefMA. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .46
8.2 Measurement Application . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 46
8.3 Product . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .46
8.4 Dual Function of a Product . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .47
9 Measurement Product Administration. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 49

9.1 Copying a Product . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .49
9.2 Creating a Product. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .50
9.3 Changing the Properties of a Product . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 51
9.4 Importing a Product . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .51
9.5 Deleting a Product . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .52
9.6 Assigning a new Measuring Application to a Product . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 52
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9.7 Modifying a Measuring Application. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 53

9.8 Copying a Measuring Application . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 53
9.9 Deleting a Measuring Application . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 53
9.10 Viewing the DefMA . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 53
9.11 Importing a DefMA . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 54
10 Handling of Measurement Readings and Statistical Evaluations . . . . . . . . . . . . . . . . . . . . . . . . . . . . 55

10.1 Block . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 55
10.2 Setting the Block Definition . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 55
10.3 Closing a Block . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 55
10.4 Labeling a Block . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 56
10.5 Deleting Measurement Readings or Blocks . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 57
10.6 Saving/not Saving Measurement Readings . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 58
10.7 Overwriting a Measurement Reading. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 58
10.8 Evaluating Individual Blocks (Block Result) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 59
10.9 Evaluating all Blocks . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 59
11 Setting Up the Print Form Using PDM . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 61

11.1 Statistical Evaluation and Documentation Using PDM . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 61
11.2 Editing Print Form Templates Using PDM. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 61
11.3 Inserting Variables for Print Form Templates . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 63
11.4 Variables Available for Block Evaluation . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 63
11.5 Variables Available for the Final Evaluation . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 65
11.6 Products with a Variable or Fixed Block Size . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 66
11.7 Special Features for SPC Charts . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 68
11.8 Printing the Print Form Using the Supplementary Software PDM. . . . . . . . . . . . . . . . . . . . . . . . . . 68
11.9 Measurement Uncertainty and Measuring Ranges . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 69
11.10 Meaning of the Measurement Uncertainty . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 69
11.11 Random Error . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 70
11.12 Systematic Error . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 71
11.13 Display of the Measurement Uncertainty . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 72
11.14 Task Programming . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 73
11.15 Starting a Task . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 73
11.16 Programming Tool . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 73
11.17 Getting Started with Task Programming. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 74
11.18 Syntax of Task Commands . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 74
11.19 List of Task Commands. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 75
11.20 Data Back-up . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 77
11.21 Mass per Unit Area and Geometric Coating Thickness. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 77
11.22 Correlation between Mass per Unit Area and Coating Thickness . . . . . . . . . . . . . . . . . . . . . . . . . . 79
11.23 Calibration Standards from Fischer . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 81
11.24 Setting the Density in the DefMA. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 81
11.25 Measurement Device Monitoring for the FISCHERSCOPE X-RAY . . . . . . . . . . . . . . . . . . . . . . . . . . . 82
11.26 Calibration of X-ray Fluorescence Measuring Instruments. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 82
11.27 Why Monitor Measurement Devices? . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 83
5
Table of Contents
11.28 Variation of Measurement Readings . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .84

11.29 Trueness of Measurement Readings. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .85
11.30 Random and Systematic Deviations . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 86
11.31 Trueness and Precision . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .87
11.32 Practical Monitoring of the Measurement Devices . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 88
11.33 When and how to Carry out Corrections? . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 90
11.34 Pre-run for Determining the Control Limits. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 90
11.35 Long-Term Monitoring . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 95
12 DefMA . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 97
12.1 The DefMA Modes . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .97
12.2 Creating a new DefMA . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 98
12.3 Entering Compensation Spectra. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .99
12.4 Display the Measurement Mode . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .100
13 Calibration, Normalization and Base Correction . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 101

13.1 Normalization . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .101
13.2 Base Correction (Substrate Material Correction) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .103
13.3 Calibration. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .104
14 Solution Analysis. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 111

14.1 Structure of the Measuring Cell . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .111
14.2 Filling the Measuring Cell . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .111
14.3 Positioning the Measuring Cell . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .113
14.4 Cleaning the Measuring Cell After Use . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .113
14.5 DefMA and Product for the Solution Analysis . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .114
14.6 Importing a Product . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .114
14.7 Importing a DefMA. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .115
14.8 Setting up a Product File for the Solution Analysis . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .116
14.9 Setting up a DefMA for the Solution Analysis by yourself. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .117
15 Measurement Data Export . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 119

15.1 Starting the Measurement Data Export . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .119
15.2 Export Settings. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .121
15.3 Setting up an Export Template . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .122
15.4 The syntax of the default template . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .124
16 Cleaning and Maintenance . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 127

16.1 Cleaning the Instrument. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .127
16.2 Never Clean Calibration Standards!. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .127
16.3 Cleaning the Air Filter . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .127
16.4 Preparing the Instrument for Transport . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .129
16.5 Troubleshooting . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .129
17 Description of the Characteristic Statistical Parameters . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 131

17.1 Block Result . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .131
17.2 Final Result – Fixed Block Definition . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .133
Table of Contents
17.3 Final Result – Variable Block Definition. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 137

17.4 Periodic Table of the Elements with X-Ray Properties. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 140
Training Protocol. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 171
Index . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 177
7
Table of Contents
1 Safety Information
1.1 Read the Operator’s Manual Carefully Before Operating

 Make sure to read this Operator’s Manual carefully before taking the instrument into operation.
 Keep the manual in a safe place, so that you will be able to consult it whenever necessary.
1.2 Warning Notices Used
ATTENTION Indicates a risk that can lead to damage or destruction of the product.

CAUTION Indicates a risk that can lead to light or moderate injuries or material damage.
WARNING Indicates a risk that can lead to death or serious injuries.
DANGER Indicates a risk that will lead immediately to death or serious injuries.
IONIZING RADIATION Danger of radiation. The device generates X-rays when you start a
measurement.
1.3 Intended Use

The FISCHERSCOPE X-RAY is used for coating thicknesses measurements and for materials analysis. The
measurement method conforms to DIN 50 987, ASTM B568 and EN ISO 3497.
The device is designed for operation under the following environmental conditions:
 For indoor operation
 For altitudes up to 2000 m (6600 ft) above sea level
 For operation in networks of overvoltage category II
 In environments with pollution degree 2
When used as intended, the FISCHERSCOPE® X-RAY is safe in its operation. When you use the instrument as
intended and observe the safety information, the instrument does not pose any risks.
Only accessories recommended and approved by Fischer may be connected to this instrument.
9
Safety Information
Modifications, repairs, maintenance and service work on the instrument and its accessories must be per-
formed by authorized Fischer service personnel only.
There is no other intended use. The risk for damage from unintended use lies solely with the user.
1.4 Limitation of Liability

The manufacturer accepts no liability for damage of any kind caused by measurement errors, reading errors
and unsafe estimates. The manufacturer accepts no liability and no responsibility for incorrect conclusions,
based on measurements with x-ray fluorescence.
Fischer accepts no liability at all and responsibility for subsequent damage caused by the use of incorrect
measurement readings.
1.5 Safety of the Electrical Equipment

The instrument is designed as a Protection Class I instrument according to EN 61140. The instrument con-
tains components under line voltage and under high voltage.
1.6 X-Radiation Safety

The design as a fully protected instrument and the functions of several integrated protective devices protects
the operating personnel and the surroundings fully from x-radiation.
Two devices that work independent of each other ensure that x-radiation can be generated only when the
measurement chamber is closed. For the safe operation of the instrument please also note the intended use;
ref. chap. 1.3. on page 9.
Observe the laws and regulations of the country where the FISCHERSCOPE X-RAY is operated. The responsi-
ble government authority must possibly be informed or consulted about the commissioning of the
FISCHERSCOPE X-RAY.
In addition, we would like to point out the following:
 Operate the instrument according to the instructions in this manual.
 Do not attempt any structural alterations on the instrument.
 Maintenance and service work on the instrument may be performed only by Fischer or by companies
authorized by Fischer for this purpose.
1.7 Repeat Inspection

Fischer recommends to check the instrument by an expert in intervals of no longer than five years. Observe
the laws and regulations of the country where the instrument is operated.
1.8 Safety Devices

The FISCHERSCOPE X-RAY is a fully protected instrument. A fully protected instrument has the following fea-
tures:
 A protective housing fully encloses the x-ray tube and the object to be examined.
 The instrument features two safety devices that are independent of each other. The x-ray tube can be
operated only when the protective housing is fully closed.
The aforementioned technical features are fulfilled by two micro switches that observe the opening condition
of the measuring chamber door. If the door is opened, the x-ray escape will be closed (shutter closed).
Safety Information
LED at the Start button at the Instrument

If the LED at the Start button lights, the escape of the x-ray tube is opened.
► Do not open the measuring chamber door, when the LED at the Start button lights.
If you open the measuring chamber door, when the LED at the Start button lights, the running measurement
will be terminated and the escape of the x-ray tube will be closed.
CONTROL LED at the Instrument

When closing the door, ensure that it is fully closed. The status is indicated by the CONTROL LED at the mea-
suring head. A permanently flashing LED indicates that the door is not closed properly, it will not be possible
to make measurements.
No Alterations to the Instrument!

Only specialized service personnel, as a rule the Service of Fischer, is authorized to carry out alterations to
the measuring instrument.
DANGER X-radiation and high voltage

Carrying out alterations to the instrument can lead to death or serious injuries and legal
consequences.
► Do not carry out any alterations to the instrument.
1.9 Start-up
CAUTION Risk of injury

The weight of the instrument is approx. 45 kg. Failure to move the instrument properly
may cause it to fall and injure persons.
► Use a device and a suitable lifting gear for installation or transport the instrument
with two persons.
► Keep transport distances short and pull or push the instrument if possible.
1.10 Operation

X-radiation (primary, scattered and fluorescence radiation) and high voltage occur in
the instrument. X-rays and high voltage can cause death or life-threatening injuries.
► Do not carry out any alterations to the instrument.
Switch off the instrument at least once a month. If you then switch the instrument on again, all components
are reinitialized. This ensures that your instrument works optimally and stably. If you leave the instrument
permanently on, then after approx. one month this message will appear: To ensure optimal performance and
stability, we recommend to restart the instrument regularly. Please turn off the instrument for 10 seconds and
restart it afterwards!
11
Safety Information
1.11 Maintenance and Repair

Repair, maintenance and service work on the instrument and its accessories must be performed by autho-
rized Fischer service personnel only.
With a service contract you get highest security and reliability. Therefore please contact your Fischer repre-
sentative.

X-radiation (primary, scattered and fluorescence radiation) and high voltage occur in
the instrument. X-rays and high voltage can cause death or life-threatening injuries.
► For servicing, secure the instrument so that radiation can not escape at any time.
► Repair and service work must be performed by authorized Fischer service
personnel only.
1.12 Disposal
WARNING Risk of poisoning
The beryllium window on the detector can break and release dust if handled improper-
ly. Beryllium is toxic if swallowed and very toxic if inhaled. Beryllium can cause skin and
eye irritation.
► Never damage the beryllium window.
Dispose of the instrument

The instrument does not belong in household waste and, thus, must always disposed
correctly.
► Dispose the instrument after use according to the applicable legal regulations.
► Contact your Fischer representative. Fischer will take over the return to the
disposal cycle.
1.13 Requirements for the Operating Personnel

Operators with Introductory Training
Operators with introductory training can work with the instrument efficiently and safely.
For this purpose, the instrument is prepared such that all settings for the measuring application are made by
trained specialists. Then, the software’s scope of functions is restricted such that only the functions required
for carrying out the measuring application remain accessible (Short menu). This provides operators with in-
troductory training with a clear workspace and the instrument is protected from interventions and changes
in the software.
Safety Information
Operators with introductory training should have the following knowledge:

 Fundamental knowledge about the use of Microsoft® Windows®
 Knowledge of the safety information described in this manual
 Operators with introductory training must be instructed in the proper use by a person that has the requi-
site qualifications.
Trained Specialists
Trained specialists can utilize the full bandwidth of the technical capabilities of the FISCHERSCOPE X-RAY.
In addition, trained specialists have the following knowledge:
 Knowledge of the physical principle of x-ray fluorescence and of the functional principle of the
FISCHERSCOPE X-RAY instrument
The aforementioned physics knowledge is important for defining the measuring application and for other
settings. Only the most important facts are explained in this Operators Manual. This does not replace detailed
training.
The practice-oriented seminars of Fischer are a worthwhile opportunity for obtaining the required knowl-
edge. Several times a year, user seminars that provide insights into the physical fundamentals of x-ray fluo-
rescence and prepare users for their work with the measuring instruments are conducted at various loca-
tions.
Seminar dates can be found on our website www.helmut-fischer.com.
13
Safety Information
1.14 Frequently Asked Questions Concerning X-Radiation Safety
Question Answer
Is there a risk that my health will No. The X-RAY instrument is a fully protected instrument. During no
be impaired by X-radiation due to phase of your work at the instrument is it possible for X-radiation to
my work on the X-RAY instru- escape from the measurement chamber. This is also true when the
ment? cover of the measuring head is opened. In such cases, the radiation
source will be switched off immediately through the security devices.
How can I check if the safety de- You can recognize its proper function via the red control LED on the
vice of the measuring head func- front side of the measuring head. Everything is OK as long as the
tions properly? CONTROL LED is not flashing.
Will the specimens that have been No. The fluorescence radiation of the specimen subsides fully al-
exposed to X-radiation them- ready a split-second after the primary X-radiation is switched off. You
selves turn into radiating material can touch the specimen after the measurement procedure without
due to the X-ray fluorescence ef- any problems.
fect after the primary radiation
has been switched off?
Will the primary X-radiation dam- No. The X-radiation has absolutely no lasting influence on the materi-
age or alter the material structure al; it fully retains its quality. The X-ray fluorescence method is a non-
of the specimen? destructive measurement method. Live animals or plants must not
be exposed to the X-radiation in the measurement chamber.
Is the safety or the accuracy of the No. Magnets influence neither the measurement results nor the
measurement results influenced safety. You can use magnets without problems.
by magnets on customer-supplied
fixtures in the measurement
chamber?
2 Instrument Overview
The FISCHERSCOPE® X-RAY is a high performance energy dispersive x-ray fluorescence (EDXRF) spectrome-
ter.
The WinFTM® (Fischer Thickness Management Software for Windows®) software controls the instrument
and handles the evaluation of the signals supplied by the instrument.
The measured values (coating thickness, material compositions, mass per unit area) are stored and dis-
played on the monitor. Using WinFTM, you can conveniently design the measurement results as a print form
for printout and export them to other applications.
WinFTM runs under Windows®. WinFTM version 6.50 or higher runs only on Windows 10. From version 6.50
on, the older Windows versions are no longer supported.
2.1 Areas of Application

The instrument is suited for the following measurement applications:
 Analysis of solid, powdery and compound materials and liquids
 Measurement of the composition and coating thicknesses of complex multi-layered systems
2.2 Standard-free Measurements

The instrument allows for standard-free measurements, that is measurements without calibration stan-
dards. Coating thicknesses and compositions can be determined in one measurement without the use of cal-
ibration standards. This is especially interesting when you develop new multi-layered systems, where appli-
cable calibration standards are not available.
15
Instrument Overview
2.3 X-Ray Fluorescence

The specimen is excited with the primary x-radiation. In the process electrons from the inner electron shells
are knocked. Electrons from outer electron shells fill the resultant voids emitting a fluorescence radiation
that is characteristic in its energy distribution for a particular material. This fluorescence radiation is evalu-
ated by the detector.
The generation of the x-ray fluorescence radiation is shown simplified in Fig. 2-1. One electron from the K
shell is knocked. The resultant void is filled by either an electron from the L shell or an electron from the M
shell. In the process the K and K radiation is generated, which is characteristic for the particular material.
X-ray fluorescence radiation

K
K
Primary X-radiation
Electron
Shell M L K
Figure 2-1: Generation of the x-ray fluorescence radiation
Instrument Overview
2.4 Functional Principle of the Instrument

The following figure shows the principle structure of the instrument:
X-ray tube
Anode
Cathode
Optics WinFTM
Shutter main window
Primary x-radiation
Video camera
Mirror
Spectrum
Detector
Aperture (Collimator)
X-ray fluorescence radiation
Coating layer
Base material
Figure 2-2: Functional principle of the instrument
Functional principle
1. The x-ray tube generates the primary x-radiation (primary radiation). The electrically heated cathode
emits electrons. Accelerated by the applied high voltage to very high speeds, the electrons bombard the
anode material. This generates the primary x-radiation.
2. The shutter serves as a safety device. It is opened during a measurement only. In case of a malfunction
or when opening the measurement chamber, it will be closed automatically. This ensures, that the user
is never exposed to x-radiation.
3. A light source (not shown in Fig. 2-2) illuminates the sample. A mirror and lens direct the image of the
measurement location to a color video camera. The mirror has a hole in its center for the primary radia-
tion to pass through.
17
Instrument Overview
4. The aperture (collimator) limits the cross-section of the primary beam in order to excite a measurement
spot of a defined size.
5. The primary x-radiation impacts the atoms on the sample surface (coating layer and base material) and
in the process knocks electrons from the inner electron shell. Electrons from outer electron shells fill the
resultant voids emitting a fluorescence radiation that is characteristic in its energy distribution for a par-
ticular material.
6. The energy dispersive detector measures the energy distribution of the fluorescence radiation. A multi-
stage electronics circuit processes the measurement signals.
7. The measured spectrum shows lines or peaks that are characteristic for the chemical elements in the
sample.
8. The WinFTM Software computes the thickness of the coating(s) and/or the analysis result. The video im-
age of the sample is shown in the WinFTM window. The precise position of the measurement location and
the measurement spot is possible due to the special design of the optical and the x-ray guidance sys-
tems.
3 Components
3.1 Cover of the Measurement Chamber

The cover of the measurement chamber is part of the safety devices of the instrument. It fully protects the
operator and the environment from x-rays.
The cover of the measurement chamber opens and closes in the vertical direction for easy and time-saving
placement or replacement of the specimen on the measuring stage in the measurement chamber.
► When closing the cover of the measurement chamber, ensure that the cover is fully closed.
A flashing CONTROL LED indicates that the cover is not fully closed and measurements cannot be made.
3.2 Manually Operable XY Stage (XAN 222)

The instrument XAN 222 is equipped with a manually operable XY stage for easy, fast and accurate position-
ing of the specimen. With this XY stage you can perform measurements at various locations on the specimen
without the need for opening the measurement chamber cover before each measurement.
3.3 Aperture (Collimator)

The aperture is used to limit the size of the primary x-ray beam to a defined diameter or cross-section.
The aperture is a borehole with defined geometries (rectangular or round) and sizes, through which part of
the primary x-ray beam passes. Thus, a fraction of the primary radiation is suppressed.
A reproducible, controlled and defined primary x-ray beam geometry is an important prerequisite for good
measurement accuracy.
3.4 Shutter
The shutter is used to keep the primary x-rays from entering the measurement chamber and the environ-
ment.
The shutter is part of the safety system. The shutter closes immediately, when you open the cover of the
measurement chamber or when a malfunction occurs. X-rays can then no longer reach the measurement
chamber and the environment.
3.5 Specimen Lighting

The specimen lighting ensures good visibility of the specimen in the video window. The lighting elements are
white LEDs that are located in the area of the aperture.
Use the slide control in the video window to adjust the intensity of the illumination.
3.6 Key Switch for the X-Ray Energy

With the key switch you turn the high voltage supply of the x-ray tube on and off. Without high voltage supply
to the x-ray tube, x-radiation cannot be generated. Consequently, measurements are not possible.
Measurements can only be performed when the key is inserted and turned to the right.
For your safety, you should turn off the x-radiation when you are finished using the instrument, then pull the
key and store it in a safe place. This prevents unauthorized use of the instrument and generation of x-radia-
tion.
19
Components
Control LED of the high voltage supply:

 The red control LED X-RAY ON on the control panel of the instrument lights when the high voltage is
reached its full level. This may take a few seconds after turning the key switch.
3.7 Control Panel

You can use the control panel to control certain functions of the instrument.
XRAY On Control
Power
Start Stop On / Off
Shutter Shutter
open closed
Figure 3-1: Control panel of the instrument
Table 3-2: Function of the control elements
Control element Function

Power ON / OFF Switches the instrument on and off. To switch off, press and hold for 5 seconds.
START Starts a single measurement.
STOP Stops a measurement.
Table 3-3: Function of the LEDs
LED Function
X-RAY ON Lights red when the X-radiation is ready.
CONTROL Flashes red when the safety system discovers an error or when the cover is not
fully closed, measurements are not possible.
No malfunction message of the safety system is present if the LED does not light.
LED at the START Lights when a measurement is in progress. The shutter is opened.
button
LED at the STOP button Lights when no measurement is in progress. The shutter is closed.
3.8 Focus Adjustment Knob on the Right Side of the Instrument

Use the focus adjustment knob to focus the video image. You adjust the knob while watching the video image.
4 Set up
4.1 Set-up Location
DANGER Explosion hazard

High voltage discharges inside the instrument can be dangerous in explosion hazard
zones.
► Do not place the instrument in explosion hazard zones.
The instrument is designed for the following conditions:
Operation temperature 10 °C – 40 °C / 50 °F – 104 °F

Storage temperature 0 °C – 50 °C / 32 °F – 122 °F
Relative humidity ≤ 95 %
 For indoor operation

 For operation at altitudes up to 2000 m above sea level
 In networks of overvoltage category II
 In environments with pollution degree 2
The instrument is designed as a lab unit. Due to its sturdy construction, it is also possible to run it in a pro-
duction hall.
ATTENTION Destruction hazard caused by improper environmental conditions

The instrument can be destroyed, if you place it in hot or corrosive environments.
► Place the instrument in rooms with a suitable operating/storage temperature only.
► Make sure that the air can circulate freely in the area of the fan.
 ► Do not expose the instrument to direct sunlight.

► Do not place the instrument in corrosive environments such as plating areas.
► Ensure sufficient accessibility for easy operation of the electrical disconnecting
device: i.e. that you can quickly pull out the mains plug in case of a fault.
The set-up location influences the product life and maintenance effort directly.
Corrosive environments cause corrosion on mechanical and electronic components. This can lead to the fol-
lowing problems:
 Rough-running or total breakdown of mechanical adjustment mechanisms
 Contact problems on plug connectors or total breakdown of electronic components
Salt acid steams or salt aerosols (salt spray test) in the ambient air cause defects on x-ray tubes, proportion-
al counters and silicon detectors in short intervals. Salt acid corrodes the Beryllium window of these compo-
nents. Thus, the components will be damaged rapidly.
If the instrument is located in a room, separated from the electroplating, make sure that the exit air of the
electroplating cannot reach the room via doors, windows or extraction of air systems.
21
Set up
Heavy ambient air pollution causes the ventilation ducts getting clogged. Thus, the maximum permissible
temperature of components can be exceeded. Additional damage can be caused by deposits of aggressive
dirt.
4.2 Setting up the Instrument
CAUTION Risk of injury

The weight of the instrument is approx. 45 kg. Failure to move the unit properly may
cause it to fall and injure persons.
► Use a device and a suitable lifting gear for installation or transport the instrument
with two persons.
► Keep transport distances short and pull or push the instrument if possible.
ATTENTION Disconnecting device in case of malfunctions

In case of malfunctions, the instrument must be disconnected from the power supply to
prevent further damage.
 ► Set up the instrument in such a way that you always have easy access to the power
cable to disconnect the instrument from the power supply in case of a malfunction
(disconnecting device).
1. Open all containers of the shipment and take out the components.
ATTENTION Destruction hazard

The instrument can be destroyed, if you connect the instrument to the line voltage,
 before all components of the measuring system are connected to one another.
► Do not yet connect the instrument and the PC to the line voltage.
2. Store the original shipping containers at a safe place.

If you need to transport the instrument, always use the original shipping containers. Failure to comply
will nullify any warranty claims.
3. Place the instrument, the PC with monitor, keyboard and mouse and the printer, if present, on a sturdy
table with the minimum dimensions of 150 x 90 cm (59 in x 35 in). Additional space is required for the test
samples and for other material.
Set up
4.3 Establishing Connections

Check the supply voltage before connecting the instrument to the voltage supply. The instrument is suitable
for a mains voltage AC 100 V – 240 V ±10 %, 50 – 60 Hz, 120 VA.
4
1 Diagnostic interface, for service
purposes only
I 1 2 Key switch for high voltage
0 3 USB interface, to PC
3 2 4 Main switch
5 Voltage supply for instrument
Figure 4-1: Connectors and switches at the left side of the instrument
Establish the following connections
ATTENTION Overvoltage and Interference Radiation

Overvoltage caused by lightning strikes or switching peaks as well as interference radiation
can lead to malfunctions or damage to the measuring instrument if the wiring is incorrect.
► Only connect the power cables of the instrument, the PC and the monitor to the mains
supply using the extension socket supplied. This extension socket ensures overvoltage
 and interference protection.

► Connect the extension socket supplied to a properly installed socket with safety contacts.
► Connect the USB cable of the instrument with a USB 2 socket on the back panel of the
PC. Do not use an USB 3 socket and do not use a socket on the front panel of the PC.
► Use only the supplied USB cable and do not use an USB extension cable.
1. USB: The USB cable has two different connectors: a quadratic one and a flat one. Connect the quadratic
connector to the instrument and the flat connector to a USB 2 socket at the back panel of the PC. If no free
USB 2 socket is available, connect the mouse or the keyboard to a USB 3 socket.
23
Set up
The following table helps to distinguish between USB 2 and USB 3 sockets. Please note that not all char-
acteristics need to apply, e.g. a USB 3 socket may also be black.
Characteristic USB 2 USB 3

Socket color black blue
Logo at the socket
SS
2. Connect the following components to the mains supply using the extension socket supplied. Use the sup-
plied power cables (10 A, 250 V, 3 x 0.75 mm2 ) to connect the instrument and monitor. Never use power
cables with insufficient specifications!
 PC
 Instrument
 Monitor
3. Connection between PC and monitor, depending on the equipment with display port or VGA cable
4. Mouse and keyboard
4.4 Installing WinFTM software

Normally the software is already pre-installed on the PC and you do not need to install anything.
If you want to install the WinFTM software, insert the disk into the drive, start the installation and follow the
instructions of the installation routine.
Set up
4.5 Switching on the Instrument

Before you begin
 The instrument was placed correctly.
 The shipping lock was removed.
 All connections were established.
 Make sure that the FISIM (Fischer Software Identification Module) is plugged into a USB port of the
computer.
 Make sure that the high voltage key switch is in the on-position. The key switch is located at the connec-
tion panel on the left side of the instrument.
To switch on the instrument and the PC

1. Switch on the power supply unit of the instrument by using the main switch on the left side of the
instrument.
2. Switch on the instrument by using the Power On/Off switch on the front side of the instrument.
3. Switch on the PC and the monitor.
Windows will be started.
4. To start WinFTM, double click the WinFTM icon .
WinFTM will be started. The WinFTM Start window appears.
5. In the WinFTM Start window click OK.
The software will be started and the communication between the instrument and the software will be
initialized. The product that had been selected prior to powering off will be called automatically.
What you can do next

You can now perform measurements.
ATTENTION Wrong Measurement Readings

The following activities must not be performed immediately after power up, but only af-

ter about half an hour of measuring time:
► Calibration/Normalization
► Monitoring measurement devices including corrective measures
4.6 Switching off the Instrument

If the instrument is not in use for a long time, switch it off.
Recommendation:
 If you use the instrument infrequently, e.g. once or twice a week, then switch off the instrument when you
have finished with your measurements.
 If you perform continuous measurements, e. g. over night, then let the instrument run continuously
including over night and weekends. The instrument powers down the high voltage automatically on inac-
tivity, so this also saves energy.
 Switch off the instrument at least once a month. If you then switch the instrument on again, all compo-
nents are reinitialized. This ensures that your instrument works optimally and stably. If you leave the
instrument permanently on, then after approx. one month this message will appear: To ensure optimal
25
Set up
performance and stability, we recommend to restart the instrument regularly. Please turn off the instrument
for 10 seconds and restart it afterwards!
To switch off the instrument and the PC

1. To terminate WinFTM select File > Exit.
2. To shut down the PC select Start > Shut down.
3. To switch off the instrument, press the Power On/Off switch on the front side of the instrument for
5 seconds.
4. Switch off the monitor and the printer, if present.
5. If you need to protect the instrument against unauthorized access, turn off the high voltage supply for the
x-ray tube by turning the key switch to the left. The key switch is located at the connection panel on the
left side of the instrument.
4.7 Communication between Instrument and WinFTM

Communication between instrument and WinFTM is necessary to obtain measurements with the instrument.
Determining the current communication condition

 If the communication is enabled, the measurement distance appears in the status bar.
 If the communication is disabled, XRAY Communication OFF appears in the status bar of the WinFTM win-
dow.
It is not possible to make measurements when the communication is disabled, that is, when WinFTM is in
demo mode.
To enable the communication

► In the WinFTM main window select General > Communication ON.
To disable the communication

► In the WinFTM main window select General > Communication OFF.
To reset the measuring head

You can reinitialize the measuring head, e.g. if you operate the instrument remotely.
1. In the WinFTM main window select General > Reset Meas. Head.
The window Reset Measuring Box? appears.
2. Click Yes.
The measuring head will be reinitialized.
5 Position Specimen
There are some basic rules for positioning specimens. For each measurement it must be ensured that the x-
ray fluorescence radiation can reach the detector without obstruction. Otherwise, the measurement result
may be falsified.
5.1 Flat Specimens

Positioning flat specimens is simple.
► Place the specimen flat on the table and position the desired measurement location.
5.2 Cylindrical or Curved Specimens

Bolts, rods or other cylindrical specimens must be positioned such that they are not shadowed or that the
curvature does not influence the measurement result.
► Position cylindrical specimens on the table in the manner shown in the following figure.
 
Figure 5-1: Positioning of the specimen for cylindrical or curved specimens
Regardless of the positioning, cylindrical or curved specimens must always have a minimum diameter or a
minimum curvature diameter. If the diameters are smaller than this minimum value, then a greater coating
thickness than the actual value will be displayed. This is caused by the effectively inclined radiation through
the coating at the measurement location, which causes a higher fluorescence intensity.
The following applies to simple measuring applications (e.g., single coating applications) and in one plane cy-
lindrical or curved objects):
 Specimen  4   Measurement Spot
This means that the diameter of the specimen must be at least four times as large as the diameter of the
measurement spot.
Correspondingly, the following applies to the curvature radius:
r Specimen  2   Measurement Spot
For multi-coating measuring applications that are curved in more than one direction (many curved and bent
contacts), this minimum value may be increased by a factor of up to 10 for top coatings, depending on the
measuring application. This factor may be even higher for interim coatings.
In addition, when making such measurements ensure that the position of the measurement spot corre-
sponds to the position in the video image in order to ensure accurate positioning and measurements. If you
have questions in this regard, please contact Fischer.
27
Position Specimen
Information about measurements on thin wires can be obtained from your authorized dealer or from Fischer.
Figure 5-2:
5.3 Measurements on Inclines

The primary x-radiation must strike the measurement location at a right angle. Otherwise measurement er-
rors will occur.
► Use aids (devices, modeling clay and the like), to orient the plane of the measurement location horizon-
tally.
5.4 Position of Jewelry Items

Sometimes jewelry items are not flat, are very small or have curved shapes. Although the instrument is very
tolerant with respect to positioning, the primary x-radiation must strike the measurement location at a right
angle. The following figures show some examples for good positioning.
Figure 5-3: Correct positioning of a ring, the measuring spot is fully covered
Figure 5-4: Correct positioning of a chain, the measuring spot is fully covered
Position Specimen
5.5 Positioning of Specimen
 Observe the rules for positioning different specimen in Chap. 5 on page 27.
5.6 Procedure
1. Open the door of the measurement chamber.

2. Position the specimen with the measurement location pointing
down. While observing the video image, orient the specimen to the
circular window on the measuring stage.
3. Close the door of the measurement chamber.
4. Focus the video image by using the focus adjustment knob located
at the left right side of the instrument.
At the bottom right of the video window you will see a number.
When this number reaches its maximum, the focus is set
optimally.
If the video image is too bright or too dark, change the brightness,
using the slide control at the bottom left in the video image.
If the crosshairs in the video image is not very visible, change the
color of the crosshairs by clicking (several times) the icon change
color (crosshair).

29
Position Specimen
6 Performing Measurements
To perform measurements you need a product file. This file contains all settings for a specific measuring ap-
plication.
When the instrument is delivered by Fischer, products that cover your measurement tasks are usually avail-
able. With these products files you can perform measurements immediately.
If you need new measurement tasks, you can request products files from Fischer. The product files are then
send to you by email or on a data carrier. Before you can use the new product files, you need to import and
then normalize or calibrate them.
For further information see the following chapters:
Importing a product: Chap. 9.4 on page 51

Performing a calibration: Chap. 13 on page 101
Before you start

1. The instrument is switched on (see Chap. 4.5 on page 25).
2. An appropriate product file is present.
Procedure
1. In the WinFTM main window

click Select.
2. Choose the product from the
list.
You can sort the list by name,
number, date etc.
3. Click OK.
4. Position the specimen, see Chap. 5.5 on page 29.
5. To start the measurement,
click Start.
The measurement will be performed.
31
Performing Measurements
7 User Interface of the WinFTM Software
7.1 WinFTM Main Window

The WinFTM main window appears, when you start WinFTM.
Title bar
Menu bar
(WinFTM main menu)
Tool bar
Product bar
Statistics field
Calibration status line
Measurement
value field
Video window
Status bar
Instruction field
Figure 7-1: WinFTM main window
Item Function
Title bar Shows the current folder.
Menu bar Contains all menus. Many of the functions available from the menu bar are also
available from the tool bar.
Tool bar The tool bar offers quick access to the most frequently used functions. You can adapt
the tool bar according to your needs.
33
User Interface of the WinFTM Software
Item Function
Product bar Here you can select a product by clicking the button Select. In the center the number
and name of the current product are displayed, here No. 60 Au/Pd/Ni/Cu.
Video window Here you can see the specimen, see Chap. 7.2 on page 34
Instruction field Here you can start a measurement. Hints and error messages are displayed in this
field (e.g. messages during calibration).
Statistics field Here the statistical results of the last block are displayed, see Chap. 7.5 on page 35.
Calibration status If the measurement application is calibrated, the name of the calibration standard
line set is displayed here. If the measurement application is not calibrated, the message
Calibration: Standard-free is displayed.
Measurement value The measurement readings are displayed here. The field displays either the last
field measurement reading or a list of all readings of the current product, see Chap. 7.6 on
page 36.
Status bar Here important information is displayed, e.g. measurement distance, XYZ coordi-
nates, and the mq-value of the last measurement.
7.2 Video Image

With the help of the video image you can position and focus the specimen exactly (see Chap. 5 on page 27). If
you don‘t see the video image, it is switched off.
To switch on the video image

► In the WinFTM main menu select Video > Video on.
Auto focus button1
Button for changing Measurement unit

the color of the cross-
hairs
Crosshairs
Z-axis slide control1
Brightness slide con- To scale presentation

trol of the measurement
spot
Figure 7-2: Video image, 1) only available at instruments equipped with motor-driven measuring stage
Item Function
Measurement unit Displays the measurement unit for the crosshairs and the measurement spot.
Crosshairs To scale presentation of the crosshairs.
To scale presentation Displays the form and size of the actual measurement spot. Aperture shape and
of the measurement size as well as the measurement distance are considered.
spot
Brightness slide con- Changes the brightness of the video image.
trol
Button for changing the Changes the color of the crosshairs in order to optimize the contrast between
color of the crosshairs specimen and crosshairs.
1 only available at instruments equipped with motor-driven measuring stage
7.3 Zooming and Enlarging the Video Image

You can enlarge and zoom the video image to have a better view of the specimen and the measurement spot
and for focusing the video image.
To zoom in the video image

► Select in the WinFTM main menu Video > Zoom > 200% or 300% or 400%.
To set the zoom factor of the video image to its standard value, select in the WinFTM main menu Video >
Zoom > 100%.
To enlarge the video image

► Select in the WinFTM main menu Video > Video LARGE. Repeat this step to set the size of the video image
to its standard value.
7.4 Changing the Color of the Crosshairs

To increase the contrast between specimen and crosshairs, you can change the color of the crosshairs. Each
click on the button (see Fig. 7-2 on page 34) changes the color of the crosshairs. You can choose between
three different colors: black, white and one user-defined color.
To define a crosshairs color

1. Select in the WinFTM main menu Video > Crosshair color.
The window Color appears.
2. Select a color or define a new one.
3. Click OK.
7.5 Statistics Field

The statistical results of the last block are displayed in this field (see Fig. 7-1 on page 33). A block is a test
series. The test series has a first and a last value. The last value marks the end of the block. An additional
measurement value belongs to the next test series.
The following features of a block are displayed in the statistics field: Number of the block, Mean value, Stan-
dard deviation, Coefficient of variation, Number of measurements, Order no. and Operator.
35
7.6 Measurement Value Field

This field either displays the last measurement value or a list of all measurement values acquired with the
current product.
You can choose between three different display modes:
 Large number presentation
 List presentation
 SPC chart presentation (Statistical Process Control Chart)
Large Number Presentation

In this display mode the current measurement value (or the last values, if several characteristics are mea-
sured) is displayed in large digits. In addition to the measurement value, the measurement uncertainty is dis-
played as well. The measurement uncertainty depends on the measurement conditions (measurement time,
measurement distance, measurement application).
If you have set up tolerance limits, the measurement value is displayed with colored background. If the mea-
surement value is within the tolerance limits, the measurement value is displayed on green background, oth-
erwise on red background.
List Presentation
The list of measurement values are presented in the order of the measurements. In addition to the measure-
ment values, the date and time, the name of the operator and the tolerance limits are displayed as well. The
name of the operator and the tolerance limits are displayed, if they were previously entered.
If you have set up tolerance limits, the measurement value is displayed with colored background. If the mea-
surement value is within the tolerance limits, the measurement value is displayed on green background, oth-
erwise on red background.
SPC Chart Presentation

In this display mode the SPC chart (Statistical Process Control chart) is displayed in the statistics field. The
measurement values are displayed in the list presentation in the measurement value field.
Within the statistical process control chart you can identify trends in automated measuring procedures with
large lot sizes. Thus, you can easily determine changes with regard to coating thickness and other process
parameters. Furthermore, the SPC chart presentation simplifies the monitoring of the measurement devices.
Figure 7-3: SPC chart presentation, the upper image shows the mean value over time,
the lower image shows the standard deviation over time
7.7 Changing the Measurement Value Presentation

To display or hide result channels
WinFTM BASIC/SUPER/PDM can process up to 24 result channels (coating thickness values or analytical pa-
rameters). WinFTM LIGHT can process up to four coating thickness values or up to five analytical parameters.
The result channels are defined within the DefMA.
You can display or hide the result channels defined within the DefMA according to your needs.
1. In the WinFTM main menu, click .
The window Modify product appears.
2. Select the tab Presentation.
3. In the area Display, check or uncheck the result channel to be displayed.
To change the display modes (Large numbers, Listing or SPC presentation)

3. In the area Presentation, select the display mode to Large numbers, Listing or SPC. SPC can only be
selected, if the Block definition is set to fix.
To change the display resolution

2. Select the tab Product.
3. In the field Display Resolution, select a resolution.
37
To enter tolerance limits

3. In the area Tolerance limits, check activated.
4. Within the area Tolerance limits, choose the result channels, for which tolerance limits shall be displayed.
5. In the columns LSL (Lower Specification Limit) and USL (Upper Specification Limit), enter the tolerance
values.
To enter the name of the operator

► In the WinFTM main menu, select Evaluation > Order No. / Operator….
7.8 Status Bar

The status bar is located at the bottom of the WinFTM window and displays the following:
Help text mq value
Operator‘s name XYZ coordinates1

Measurement distance
Display Explanation
Help text If you hover with the mouse pointer over a command button, additional help text
will be displayed here.
Measurement dis- Measurement distance between the specimen measurement spot and collimator
tance minus 15 mm, when the video image is focused.
XYZ coordinates1 Coordinates of the current position of the measurement stage.
mq value Quality factor of the last measurement value. The mq value is a measure for the
agreement of the measured spectrum with the theoretical spectrum, see
Chap 7.9 on page 39.
CAP The caps lock key of the computer keyboard was pressed.
NUM The number pad of the keyboard is activated.
1) only available at instruments equipped with motor-driven measuring stage
7.9 mq Value
The mq value (measurement quality value) is a quality factor of the measurement value. It is displayed in the
status bar.
The mq value is a measure for the agreement of the measured spectrum with the theoretical spectrum. The
mq value is an indication for the confidence level and the trueness of the measurement value. The smaller
the mq-value of a reading is, the more correct is the measurement result. The optimal value for mq is 0.
General recommendation:
mq = 0 – 5 The measurement is OK.

mq > 5 The measurement must be discarded.
7.10 Upper Limit of the mq Value

The factory default for the upper limit of the mq value is set to 5. You do have the option to change this upper
limit.
When the upper limit of the mq value is exceeded during a measurement, the measurement will be terminat-
ed and the error message ERROR: Spectrum not suitable! will be issued. The related measurement value will
not be added to the result list.
To change to upper limit of the mq value

2. Select the tab Application.
3. In the field mq_Max, enter the new value for the upper limit.
If a value of 0 is shown in the field mq_Max, WinFTM will automatically set the mq value to 5.
7.11 Possible reasons for mq values that are too high

The specimen is not correctly defined, e.g.:
 wrong measurement application or wrong DefMA
 the expected substrate material does not correspond to the actual composition
 interim coatings are not taken into account
Other reasons that may have influenced the measured spectrum in an unforeseeable manner are possible as
well, e.g.:
 Shading of the radiation on its path from the sample to the detector through protruding parts of the
specimen
 poor sample positioning
 complex geometry of the specimen, curvature on the specimen too strong
 measurement area too small
 out of focus
39
7.12 Limited Operating Mode - Short menu

You can adapt the menu functions of the WinFTM software to the needs of the operator and disable functions.
You can hide the functions, which are not needed. In this manner, sensitive data such as measuring time and
calibration parameters can be protected from overwriting, and the operator is presented with a simplified
menu. The full menu with full functionality is accessible only with a password.
To change the password for the full menu

To switch from the short menu to the full menu, you need a password. In the delivery state, the password is
empty, i.e. you do not enter a password when prompted and press Enter. To set a password, proceed as fol-
lows:
1. Select in the WinFTM main menu General > Password….
The window Change Password appears.
2. First enter your old password (in the delivery state you do not enter a password and press Enter) and
then enter the new password twice.
To disable menu functions

1. Select in the WinFTM main menu General > Define Short Menu….
The window Modify Menu appears.
2. Select the menu items that you want to disable. A menu item is disabled, if the related box is unchecked.
NOTE: In order to prevent the operator from activating the disabled menu functions, do not forget to dis-
able the menu function General > Define Short Menu….
3. Click OK.
To activate the short menu

► Select in the WinFTM main menu General > short Menu.
To activate the full menu

1. Select in the WinFTM main menu General > full Menu.
The window Input Password appears.
2. Enter the password for the full menu, see section To change the password for the full menu. Note that this
is case sensitive.
7.13 The Spectrum Window

X-ray fluorescence radiation is emitted from the irradiated sample. The detector receives this radiation, the
instrument amplifies it and presents it as a spectrum.
You can evaluate the measured spectrum in the spectrum window. With unknown samples you can analyse,
which components comprise the sample.
To open the spectrum window

► Select in the WinFTM main menu General > Spectrum.
The currently measured spectrum is presented in the spectrum window. The spectra display window re-
mains empty if a measurement has not yet been made after the program start. Each spectrum is composed
of the characteristic plots (peaks) of the elements that comprise the sample.
Cursor
Spectral lines
Figure 7-4: The spectrum window
The spectrum window shows the channels [Chan] at the X axis and the count rates [cps, counts per second]
at the Y axis. Each channel corresponds to an energy value.
The spectrum of the X-ray fluorescence radiation is displayed as a distribution curve of count rate contents
(in cps) of a certain number of channels.
At your instrument, this number is between:
 Channel # 0 (corresponding to an energy of 0 keV) and
 Channel # 1023 (corresponding to an energy of approx. 33 keV).
You can change the display of the X axis to show the energies directly.
To toggle the display of the X axis between energies and channels

► Select in the Spectrum window Scaling > X-Axis energy.
To display the spectrum as colored area or colored line

► In the Spectrum window click . With this button you can toggle between both representations.
41
To display the spectral lines of all elements of the current product

► Select in the Spectrum window View > Elements of Product.
7.14 Saving a Spectrum

You can use a saved spectrum to re-evaluate it with a different measurement application, without the need of
performing the measurement again.
To save a a single spectrum

You can save a single spectrum in the WinFTM main window or in the Spectrum window.
1. Depending on the window that is currently opened, do one of the following:
 The Spectrum window is opened: Select Spectrum > Save as….
 The WinFTM main window is opened: Select General > Save Spectrum….
The window Save as appears. A default file path is specified, which contains the current high voltage and
the current primary filter, if available. Using this file path makes it easy to retrieve the spectrum later.
2. Enter a file name and click Save.
3. The file will be saved with the extension *.spk or *.spe.
To save the spectrum after every measurement automatically

► In the WinFTM main window select Store Spectrum Automatically. If the automatic storing is activated, a
disk symbol appears on the Start button.
Repeat the step to deactivate the automatic storing.
7.15 Loading a spectrum

You can load a saved spectrum for evaluation purposes at any time. You can also load several spectra to
compare them.
1. In the Spectrum window click .
The window Open appears.
2. Select the spectrum and click Open.
If a spectrum is already displayed in the spectrum window, then the newly loaded spectrum will be displayed
in a different color.
7.16 Deleting a spectrum

With this function you can remove one spectrum or several spectra from the spectrum window. It does not
make a difference whether you have just generated the spectrum by a measurement or you have loaded a
saved spectrum.
This function doesn‘t delete a saved spectrum file, but removes it from the spectrum window only. You can
load a saved spectrum into the spectrum window again at any time.
► In the Spectrum window select Spectrum > Delete.
If you have loaded several spectra, only one spectrum is deleted with this step. You can delete every single
spectrum one after the other.
7.17 Printing a spectrum

You can print all spectra, displayed in the spectrum window together with the spectral lines of the clicked
elements.
► In the Spectrum window select Spectrum > Print.
Please note that the printout will not go directly onto paper but first into the printer buffer. The printout
will go onto paper when the printer buffer is full or when you close the Spectrum window and click the
printer icon in the WinFTM main window.
7.18 Performing Measurements in the Spectrum Window

Before you start
► Position the specimen (see Chap. 5.5 on page 29).
You can display and change the measurement parameters for this particular measurement. If you change
parameters, the change is valid for this particular measurement only. The parameters of the current product
are not influenced by your change. When you close the spectrum window, all changes will be discarded that
you have made here.
► To display or change the measurement parameters for this particular measurement, select in the Spec-
trum window View > Meas.-Parameter.
Procedure
1. To start a measurement, click .
The measurement runs until you terminate it.
2. To terminate a measurement, click
7.19 Determining the Elements of a Sample

Before you start
 With this function only solid samples and no coating systems can be analyzed.
 Perform a measurement (see Chap. 7.18 on page 43).
Procedure
1. Select in the Spectrum window View > Elements.
You can display the extended elements list. To do so, select in the Spectrum window
View > Full element list.
2. Click into the spectrum window, keep the mouse button pressed and move the cursor to a peak of the
spectrum.
A list of radiation components of one or more elements is displayed on the left next to the spectrum win-
dow.
3. Click in the elements list on one radiation component.
The energy lines associated with this element appear as colored lines in the spectrum window. You can
compare the peaks of the measured spectrum with the superimposed lines to identify the elements that
comprises the sample.
4. Repeat steps 2 to 3 to determine further elements of the sample.
5. If the specimen contains multiple elements, you can determine the composition of the specimen and au-
tomatically create a DefMA for analysis.
43
 To determine the composition of the specimen, click on in the toolbar. The composition of the
sample is then displayed in the window to the left of the spectrum.
 To automatically create a DefMA based on the calculated analysis values, click on the toolbar on .
You can change the colors of the spectra and the energy lines. To do so, select in the spectrum
window View > Color….
7.20 Energy
The energy distribution contained in the spectrum informs about the composition of the sample, because
each occurring element of the sample reflects the qualitative composition through its peak position (at the
horizontal position specified for this element).
The higher the X-ray fluorescence energy of an element, the further to the right the corresponding line will be
in the spectrum.
According to Moseley’s Law, the energy increases as the atomic number of the respective element increases,
i.e., the lines of the “heavier” elements (those with a higher atomic number) are further to the right in the
spectrum.
The energy is measured in keV = kilo electron volts. 1 eV is the energy that an electron gains as it moves
through a field with a potential difference of 1 V.
7.21 Intensity
The intensity of a radiation is the amount of radiation that strikes a certain unit of area in a specified time
period.
In X-ray spectroscopy, the intensity of the radiation is measured as the count rate in counts per second (cps).
Each peak in the spectrum corresponds to a relative maximum referenced to its surrounding. This maximum
correlates to the amount of radiating atoms of the corresponding element.
The higher the peak, the more atoms of the respective element are present in the sample, i.e., the higher the
concentration of the respective element in the sample.
Thus, the intensity of the spectral line is a measure for the quantitative composition of the sample.
Intensity: Dependency on the Coating Thickness

With coated samples, one generally sees the spectra of all coatings involved, their elements as well as the
spectrum of the substrate material where the coatings are deposited. The intensity of the spectral lines of the
coating material increases with an increase in the coating thickness, because the number of the atoms in the
coating increases, and thus the intensity of the radiation of all atoms. At the same time, the radiation of the
atoms of coatings located under the top coating (buried coatings) and of the substrate material decreases,
because their spectral lines are absorbed to a greater degree, and thus weakened, by the thicker top coating.
Intensity: Dependency on the Measurement Distance

The total intensity of the X-ray fluorescence radiation emitted by the specimen decreases with the distance D
of the detector from the sample with 1/D2, because the solid angle of radiation collected by the detector de-
creases with an increase in the distance as well, while the area of the radiation entry window of the detector
remains the same.
For the coating thickness of a sample to be computed correctly, the distance D is automatically taken into
account by the evaluation software.
8 WinFTM File Structure
To ensure correct measurements, a set of specific files needs to be set up. The process flow for setting up the
files needed for measurements, is the same on all FISCHERSCOPE X-RAY instruments:
DefMA DefMA: Definition of the measurement settings of the ap-

plication, creating or changing the DefMA re-
quires the software extension SUPER
Measurement
Application
Product
Measurement
Figure 8-1: Process flow for preparing measurements
The essential content of the files product, measurement application and DefMA and their relations among
each other is shown in the following figure:
Product
 Measurement results and their presentation
 Image of the specimen
 Measurement time and number of measurements
 Export masks, block protocol etc.
Measurement Application
 Calibration data (Calibration standard set)
 Measurement time during calibration
 Number of measurements during calibration
 Anode current, aperture
DefMA
 Measurement mode
 Type and order of the coatings
 Tube voltage
 Type and composition of the calibration standards
 Treatment of interfering spectra
 Special evaluation methods
Figure 8-2: Content of the files DefMA, measurement application and product
45
WinFTM File Structure
8.1 DefMA
The DefMA Definition of the Measurement Settings of the Application) is a file, in which the basic settings for
a measurement are saved, like:
 Tube voltage used
 Type and composition of the substrate material of the specimen and of the calibration standards
To create a DefMA you need the WinFTM extension SUPER. The usage of the SUPER software requires knowl-
edge about the physics of x-ray fluorescence and the functionality of the instrument.
If you don’t have the knowledge, do not use the SUPER software, but request a new measurement application
from Fischer instead. Fischer offers a professional service for the creation of customer’s DefMA.
8.2 Measurement Application

The measurement application is a file, which contains everything that is necessary for the trueness of a mea-
surement:
 Local copy of the DefMA
 Calibration data (Calibration standard set)
 Measurement time during calibration
 Number of measurements during calibration
 Anode current, aperture
8.3 Product
The product is a file, which serves for the data organization and the measurement control. Everything you
define and enter for solving a measurement task is saved in the product file:
 Measurement results and their presentation
 Image of the product
 Measurement time and number of measurements
 Export masks
8.4 Dual Function of a Product

A product consists of two parts that function independent of one another:
Product
Product part for the calibra-

Product part for the specimen
tion standard set1
The parts have the following function:

 The product part for the specimen is used to measure the specimens.
 The product part for the calibration standard set1 is used for the calibration or substitute calibration and
for the monitoring of the measurement devices.
The two different product parts are used to store, organize and evaluate the respective measurement data
separately.
To some degree, the WinFTM software permits differences in the composition between the specimen and the
calibration standards, both for the substrate material and for the coating(s). The different compositions are
defined in the respective DefMA of the two product parts and can be evaluated in any desired way using the
functions of block evaluation and final evaluation. In this manner, the measurement data that has been taken
at the actual specimen, using the product part for the specimen, will remain uninfluenced when the calibra-
tion standards are re-measured.
The dual function is also implemented in the DefMA and measurement application files. From the user’s point
of view mainly the dual function of the product file is important.
1. In this context a calibration standard set is a particular data set, which contains the characteristics of
the used calibration standards.
47
9 Measurement Product Administration
The instrument needs certain basic information to generate measurements. This information is contained in
the product file (hereinafter referred to as product), see also Chap. 8 on page 45. For this reason a product
that fits your specimen must be selected or created before performing a measurement.
9.1 Copying a Product

1. In the WinFTM main window select Product > Copy….
The window Product copy appears.
C D
E
2. In the A field change to the directory that contains the product you want to copy.
3. In the B field select the product you want to copy.
4. In the C field change to the directory where the new product is to be created.
If you want to create a new directory:
 In the D field click the icon to create a new directory.
 In the C field change to the newly created directory.
5. In the E field enter a name and number for the new product.
6. Click Copy (Field F).
7. To close the window click Cancel.
8. To measure with the new product, you must select the new product. To do so click .
49
Measurement Product Administration
9.2 Creating a Product
Before you start

A DefMA that fits your specimen is already available in WinFTM.
Procedure
1. In the WinFTM main window select Product > New… .
The window Select an application appears.
2. Shall the new product base on an existing measuring application or on a new one?
Existing measuring application:continue with Step 8.
New measuring application:continue with Step 3.
3. In the window Select an application click New.
The window Select a DefMA appears.
4. Select the DefMA and click OK.
The window Input of the application name appears.
5. Enter in the fields the Name and No. of the measuring application and click OK.
The window Input Calibr. Std. Set appears.
6. Do not enter anything in the window Input Calibr. Std. Set and click OK.
The window End of calibration. Accept? appears.
7. Click Yes. Continue with Step n
8. Select the measuring application and click OK.
The window Create new product appears.
 Enter in the fields the Name and No. of the product. Further options:
 To rename the folder, click .
 To create a new folder, click .
9. Click OK.
The new product is now created and active.

Using the new product, you can now perform measurements. If you have created a new measuring applica-
tion, you can now perform standard-free measurements or calibrate the product.
9.3 Changing the Properties of a Product

When creating a new product, many properties are automatically taken from the product that is active at the
beginning of a new product creation. You can change these properties at any time afterwards.
Procedure
1. In the WinFTM main window select Product > Modify… .
2. You can change many properties of the product, e.g.:
Tab in the Modify

Property
product window
Measurement time and number of single measurements per started measure- Product
ment
Unit of measurement and display resolution
Print forms: You can replace the automatically assigned print forms by
customer specific print forms.
Measurement time and number of single measurements for the calibration, see Application
Step 11 on page 107.
Fixed or variable block size Presentation
Measurement presentation
Elements that should be displayed or hidden in the measurement result
Tolerance limits
Product notes Product notes
9.4 Importing a Product

If you have received a product file by disk or email from Fischer, you need to import it. The product file name
has the extension *.sav, *.sv1 or *.sv3.
Procedure
1. If you have received the product file by email, save the file in a directory that does not belong to WinFTM,
e.g. C:\temp.
2. If you have received the product file by CD, insert the CD into the CD drive.
3. Optional, if you have installed the WinFTM extension PDM: You can create a new directory for the new
product as follows:
a In the WinFTM main menu, select Product > Select ...
The window Select Product appears.
b Click in the upper right .
4. In the WinFTM main window select Product > Copy to/from File… .
The window Copy from/to file appears.
5. Select the tab File >>> Product.
6. Click Select.
51
7. Select the product file and click Open.

The selected path appears in the field File.
8. Optional: In the New No. field, enter a number to be assigned to the new product.
9. Optional, if you have installed the WinFTM extension PDM: Select a folder where the new product will be
saved.
10. Click Start copy.
The file will be copied. After this the report The product was copied successfully appears.
11. Click OK.
12. To close the window, click cancel.

Before you can perform measurements using the new product, you need to normalize or calibrate the
product.
9.5 Deleting a Product

Procedure
1. In the WinFTM main window select Product > Delete… .
The window Delete product appears.
2. Select the product file you want to delete and click Delete.
If the message Current product cannot be deleted! appears, activate another product first (Product > Se-
lect). The currently active product cannot be deleted.
9.6 Assigning a new Measuring Application to a Product

You can assign a new measuring application to a product, if the new measuring application has the same
measurement mode as the existing measuring application.
Changes performed in the measuring application, are effective in all products assigned with this measuring
application.
Procedure
3. Click Other Application.
The window Modify application appears.
9.7 Modifying a Measuring Application

Procedure
1. In the WinFTM main window select Calibrate > Modify application… .
The window Modify application appears.
3. Change the properties of the measuring application and click OK.
9.8 Copying a Measuring Application

Procedure
1. In the WinFTM main window select Calibrate > Copy application… .
The window Copy application appears.
2. Select the measuring application, enter a name in the field Name and click Copy.
9.9 Deleting a Measuring Application

If you delete a measuring application that is assigned to a product, the assigned product will be deleted, too.
If several products are assigned to the measuring application, all assigned products will be deleted.
Procedure
1. In the WinFTM main window select Calibrate > Delete application… .
The window Delete application appears.
2. Select the measuring application you need to delete and click OK.
If the measuring application is assigned to one or several products, the following message appears for
each assigned product: Application is used in: <Folder Name>, Product No. <Product Number> <Product
Name> Delete this product?
To delete the product assigned to the measuring application, click Yes.
9.10 Viewing the DefMA

You can easily view the DefMA, e.g. to check, whether the DefMA is suitable for a new product.
For more information about DefMA, see Chap. 12 on page 97.
To open the DefMA window of the current product

3. Click DefMA (lokal).
The window Definition of measuring conditions… appears.
53
9.11 Importing a DefMA

If you have received a new DefMA file from Fischer, you need to import it. The file name has the extension
*.pb0. After this you create a new measurement application and a product based on the imported DefMA.
For more information about DefMA, see Chap. 12 on page 97.
Procedure
1. If you have received the DefMA file by email as a file attachment, save the file in a directory that does not
belong to WinFTM, e.g. C:\temp.
2. If you have received the DefMA file by CD, insert the CD into the CD drive.
3. In the WinFTM main window select Product > Copy to/from File….
4. Select the tab File >>> DefMA.
5. Click Select.
The window Select file appears.
6. Select the DefMA file and click Open.
The file will be copied. After this the report The DefMA was copied successfully appears.
8. Click OK.

You can now create a new product based on the imported DefMA.
10 Handling of Measurement Readings and
Statistical Evaluations
10.1 Block
A block is a test series that combines several readings that have been made under the same conditions or
that belong to the same order.
All single readings of a block are numbered consecutively and each block, in turn, has a consecutive number
as well.
Table 10-1: The various block definitions
Block definition WinFTM option Description

Variable block size variable Each new measurement reading is part of the block, until you
(default setting) close the block by clicking .
Fixed block size fix After n (n = block size) measurements the block will be closed
automatically. Meaningful setting for SPC charts. Once fixed
block size is set, you are not able to change to variable block
size. This is only possible, if you delete all measurement read-
ings of the product, see Chap. 10.5 on page 57.
Fixed block size, but autom. Block clos- After n (n = block size) measurements the block will be closed
with the option to ing, variable automatically. You do have the option to close the block before
close the block be- the block size is reached by clicking . Meaningful setting
fore the block size is e.g. if you measure n random samples regularly, but n sam-
reached. ples are not available from time to time.
10.2 Setting the Block Definition

To set the block definition (variable block size, fixed block size, autom. block closing, variable)
1. Click .
2. In the tab Presentation, area Block Definition choose the required option, see table 10-1.
If you have chosen fix or autom. Block closing, variable, enter the block size additionally.
10.3 Closing a Block

If you have set fix, then the block will be closed automatically after the bock size is reached and has no
function.
If you have set variable or autom. Block closing, variable, then you close a block as follows:
► To close a block, click .
The icon has been changed to grey. The next measurement reading is part of the next block and gets
the number 1.
55
Handling of Measurement Readings and Statistical Evaluations
10.4 Labeling a Block

You can label a block with the following fields:
 Order No.
 Lot No.
 Label 1
 Label 2
 Operator
All inserted values are linked to the block, that is, they are always valid for one block. Exception: The field
Operator is linked to the measurement reading. For every single measurement reading you can enter another
Operator.
The labels appear in the list presentation on the screen and can be exported in test protocols or during mea-
surement data export.
To label a block
1. In the WinFTM main window select Evaluation > Order No. / Operator….
The window Order No. / Operator appears.
2. Fill in the fields. All blocks will be labeled with your entered values from now on. In doing so, the values
are taken as long as you enter new values.
To prompt the user to input values before each new block

You can prompt the user to fill in the fields before each new block.
1. In the WinFTM main window select General > Setup "Order No./Operator…”.
The window Order No. / Operator appears.
2. Activate the option To be displayed for new group.
To change the labeling fields

You can change the labeling fields (Order No., Lot No., Label 1, Label 2, Operator) according to your needs.
1. In the WinFTM main window select General > Setup "Order No./Operator…".
The window Order No. / Operator appears, see above.
2. Click Setup.
The labeling fields are editable.
3. Change the labeling fields and click OK.
10.5 Deleting Measurement Readings or Blocks

To delete a single measurement reading
1. Highlight the measurement reading you want to delete.
2. In the WinFTM main window select Evaluation > Delete Reading.
When you delete a measurement reading, - - - - - - appears in its place in the list of measurement data
and the reading will no longer be included in the evaluation. You can undelete a deleted measurement
reading by selecting Evaluation > Undelete Reading.
If you delete the last measurement reading of the current product, it will be permanently deleted from the
measurement data memory and cannot be recovered.
To delete all measurement readings of the current product

► In the WinFTM main window select Evaluation > Delete All Meas. Data.
To delete individual blocks, already closed

1. In the WinFTM main window select Evaluation > Evaluate Single Block….
The window Block Result appears.
2. Select the block you want to delete.
3. Click Delete Block.
To permanently delete several blocks, already closed

1. In the WinFTM main window select Evaluation > Evaluate All Blocks….
The window EVALUATION appears.
2. In the area Group No. enter the blocks you want to delete.
3. Click Delete groups.
57
To delete individual measurement readings of blocks, already closed

2. Click Readings.
The window Readings appears.
3. In the list, highlight the reading, you want to delete.
4. Click delete reading.
When you delete a measurement reading, - - - - - - appears in its place in the list of measurement data and
the reading will no longer be included in the evaluation. You can undelete a deleted measurement reading by
clicking again delete reading.
If you delete the last measurement reading of the current product, it will be permanently deleted from the
measurement data memory and cannot be recovered.
To recover a deleted block

1. Highlight the line of the deleted block Block Nr. n. deleted.
2. In the WinFTM main menu select Evaluation > Undelete Reading.
10.6 Saving/not Saving Measurement Readings

Usually, WinFTM saves all readings automatically in blocks within product files. Sometimes it can be useful
not to save the measurement readings, for example, if during a test series you wish to measure samples that
are not part of the test series.
To set up whether or not measurement readings are to be saved

1. Click .
2. Activate/deactivate in the tab Presentation the option Readings not stored.
3. Click OK.
10.7 Overwriting a Measurement Reading

Sometimes it can be useful for certain reasons to measure a specimen again and to overwrite the old mea-
surement reading with the new one.
To overwrite a measurement reading

1. Select the list presentation. To do so proceed as follows:
a Click .
b In the tab Presentation, area Presentation choose the option Listing.
c Click OK.
2. In the list select the measurement reading, which is to be measured again and overwritten. This can also
be a deleted measurement reading.
3. Click .
The message WARNING: Reading no. n in block N remeasure? appears.
4. Click Yes.
If you click No, then the measurement reading appears at the end of the list.
10.8 Evaluating Individual Blocks (Block Result)

You can evaluate a single a block. You can evaluate the statistical data of the block (mean value, standard
deviation, coefficient of variation, range, max and min values) and see the labels of the block (Order No., Lot
No., Label 1, Label 2, Operator).
Procedure
2. You can now read the statistical data, move quickly between blocks or delete blocks.
10.9 Evaluating all Blocks

You can evaluate the statistical data of all blocks or specific blocks of the product.
Procedure
1. In the WinFTM main window select Evaluation > Evaluate All Blocks….
The window EVALUATION appears.
59
2. You can now display various evaluations, such as:

 the statistical data of all blocks of the product
 the statistical data of specific blocks of the product.
 SPC chart (if fixed block size is set only)
11 Setting Up the Print Form Using PDM
11.1 Statistical Evaluation and Documentation Using PDM

The optional supplementary software PDM (product data management) allows for a more convenient evalu-
ation of the measurement data than the basic version of WinFTM.
The simple block and final evaluation of the basic WinFTM software continues to be available. In addition,
product-related documentation is possible
To print a print form, so-called print form templates are available to the user, where - individually for each
print form template - the variables can be entered. These variables will be replaced by the content of the
actual value of the variable when printing the print form.
In the supplementary software PDM, the user assigns to the product a print form template for the block eval-
uation and a print form template for the final evaluation.
Menu command for calling the respective dialog window: Product > Modify product.
11.2 Editing Print Form Templates Using PDM

Starting the Print Form Template Editor
Select from two menu commands:
 Evaluation > Print Form > new or
 Evaluation > Print Form > modify
Functions
 Insert variable
 Enter any desired text
 Insert Bitmap graphics (e.g., company logo)
61
Setting Up the Print Form Using PDM
 Insert content of the Windows clipboard

 Format print form (font, font color and font attributes, graphics elements, tabs and indents, paragraph
formats)
The inserted text and the graphics remain stored in the print form template as well.
File Name of the Print Form

When saving the print form template, the user will give it any desired file name.
The file extension is added automatically corresponding to the type of print form:
Type of Print Form Template File Extension

Block Print Form Templates *.rp2
Final Print Form Templates *.rp1
Path for Saving the File

By default, the created print form template files will be stored in the sub-folder …\Report1.
Exiting the Print Form Template Editor

Use the command button Exit.
If changes have been made to the current print form template prior to exiting the editor, the user will be
prompted in a dialog window to confirm or discard these changes.
Example of a print form template for block evaluation:
11.3 Inserting Variables for Print Form Templates

How to insert variables into print form templates:
1. You will find a list of all variables that can be inserted into the print form template to the right of the edit-
ing field.
2. Double-click a variable in the list and it will be inserted into the print form template.
11.4 Variables Available for Block Evaluation
Regarding the numerals 1; 2; 3 … after certain variables

A measurement consists of one or more single readings (“channels”) that are identified by consecutive num-
bers (1,2,3).
With the software version WinFTM BASIC, a measurement may contain a maximum of 24 channels.
Example for a Dual coating measurement

Top coating thickness = 1 and intermediate coating thickness = 2
List of variables for block evaluation
@ANB Order number of the selected block or the information that has been entered into the first entry
field of the dialog window Order No./ Operator.
@ANR Number of the current product
@ART Name of the current product
@BDT Date of the selected block, i.e., the date, when the last measurement of the block was taken
@BM1 Lot number of the selected block or the information that has been entered into the second entry
field of the dialog window Order No./ Operator
@BNR Block number of the selected block
@BTM Time of the selected block. That is, the time when the last measurement of a block was taken.
@CK1 Critical process capability index Cpk
Prerequisites for computing and inserting the process capability indexes:
The control box with Cp and Cpk from the product tab Presentation (Product > Modify product) is
checked and the control box Specification limits is checked
@CP1 Process capability index Cp
Prerequisites for computing and inserting the process capability indexes:
The control box with Cp and Cpk from the product tab Presentation (Product > Modify product) is
checked and the control box Specification limits is checked
@DAT Current date for the print form
Default format: DD/MM/YYYY, e.g., 24.05.2021
@DF1 Density of the coating that has been entered into the current product. This applies only to coat-
ings with a fixed composition
@DIR Name of the directory (folder), where the current product is saved
@DM1 Unit of measurement (e.g., µm, mils or %) of the quantity to be measured
63
@FIS Inserts the header with the instrument name into the print form. If this variable is not used in the
print form template, it will automatically be placed at the beginning of the print form template,
when saving. The header will then appear at the beginning of the print form; i.e., the header can-
not be deactivated.
@MA1 Largest single reading in the block = Maximum
@MAB Name of the measurement application that the current product accesses
@MI1 Smallest single reading in the block = Minimum
@MNR Number of the measurement application that the current product accesses
@MW1 Mean value of the single readings of the block
@N<1 Number of readings in the block that fall below a preset lower specification limit (LSL)
@N>1 Number of readings in the block that exceed a preset upper specification limit (USL)
@NB1 Number of readings present in the block that contribute to the statistical block result
@NCAL Number of single readings that are taken on the calibration standard during the calibration of
the current measurement application (the current meas. application is that meas. application
that the current product accesses), see also @TCAL
@NTZ Text content of the notepad of the product. Enter/edit notes in the product: Product > Modify
product, Tab Notepad
@OG1 Upper specification limit USL (upper tolerance) for the presentation and computation of the up-
per limit violations in a block
@P<1 Percentage of single readings in a block that fall below the lower specification limit LSL
@P>1 Percentage of single readings in a block that exceed the upper specification limit USL
@PRF Operator of the selected block, or the information entered into the third entry field of the dialog
window Order No./ Operator
@RG1 Range, difference between the largest (maximum) and smallest (minimum) single reading of the
selected block
@SD1 Standard deviation of the single readings of the selected block. The standard deviation s is a
measure for the distribution of the single readings of the measurement series around their
common mean value. It equals the mean square deviation of the single readings from the mean
value and is computed according to the equation found in the appendix
@STF The text Calibration standard-free appears in the print form at that location where the variable
@STF has been inserted in the print form template.
Prerequisite: The current product accesses a measurement application that has been calibrated
standard-free, that is, no calibration standards have been entered into the calibration standard
set of this measurement application and used for the calibration.
If this variable is not used in the print form template, it will automatically be placed at the begin-
ning of the print form template. Then the text Calibration standard-free appears at the beginning.
@TCAL Measurement time (in seconds) for the single readings that are carried out during the calibra-
tion of the current measurement application on every calibration standard. The current measur-
ing application is that meas. application that accesses the current product, see also @NCAL
@TIM Current time at the time the print form is printed
Format: hh:mm:ss, e.g., 13:45:30
@TMS Measuring time in seconds currently set in the product

@UG1 Lower specification limit LSL (lower tolerance) for the presentation and computation of the vio-
lations of the lower limit in a block.
@VAL List of single readings measured in a block.
This list includes graphical elements with upper and lower limit as well as an “analog display”
showing upper and lower violations, when the specification limits are enabled in the product, as
well as the number of each single reading within the block.
@VB1 Confidence interval of the mean value of the selected block.
@VID Inserts the current video image into the print form. The image height in [mm] is stated in square
brackets, e.g., @VID[40]
@VIF Inserts a video image that has been saved in BMP format into the print form. The video image
must be located on the hard disc in the directory …WinFTM\Video. Image height and file name
are stated within square brackets, separated by a comma.
Example: @VIF[40,Fischer.bmp]
@VK1 Coefficient of variation of the single readings of the selected block. The coefficient of variation is
the standard deviation in percent based on the mean value and is computed according to the
equation found in the appendix
11.5 Variables Available for the Final Evaluation

To a large degree, the variables for the final evaluation are identical to those of the block evaluation.
The following variables differ in their meaning from those of the block evaluation or are available for print
form templates for the final evaluation in addition to those for the block evaluation:
@ANB Order number of the last block of the selected blocks or the information that has been entered
into the first entry field of the dialog window Order No./ Operator.
@BM1 Lot number of the last block of the selected blocks or the information that has been entered into
the second entry field of the dialog window Order No./ Operator.
@EDB Number of the last block of the selected blocks.
@EDT Date of the last block of the selected blocks.
@ETM Time of the last block of the selected blocks.
@HG1 Histogram of all single readings of the selected blocks in the current product, see also @WN1
@OE1 Upper control limit UCL(d) of the mean values of an SPC chart.
@OG1 Upper specification limit USL (upper tolerance) for the presentation and computation of the up-
per limit violations in the selected blocks of the current product.
@OR1 Upper control limit UCL(s) or UCL(R) of the standard deviation s or the range R of an SPC chart
@P<1 Percentage of single readings in the selected blocks of the current product that fall below the
lower specification limit LSL
@P>1 Percentage of single readings in the selected blocks of the current product that exceed the up-
per specification limit USL
@PRF Operator of the last block of the selected blocks or the information entered into the third entry
field of the dialog window Order No./ Operator
65
@RG1 Range = Difference between the largest (maximum) and smallest (minimum) single readings of
the selected blocks of the current product.
@SA1 Standard deviation s_a.
This standard deviation expresses the additional distribution of the mean values of fixed blocks
that cannot be explained by the standard deviation s of the single readings within the blocks.
Thus, it is an additional distribution that is based on causes different from the distribution of the
single readings. This characteristic statistical quantity is available only with fixed block sizes.
@SD1 Standard deviation s of the single readings of the selected blocks in the current product.
The standard deviation s is a measure for the distribution of the single readings of the measure-
ment series around their common mean value. It equals the mean square deviation of the single
readings from the mean value and is computed according to the equation found in the appendix
For fixed block sizes @SD1 is the standard deviation of the block mean values.
@SDT Date of the first block of the selected blocks in the current product. The date of the last measure-
ment of the block is used as the date for this block.
@SP1 Statistical process control chart (SPC chart) for the attribute 1 of the sample
@STB Number of the first block of the selected blocks in the current product.
@STM Time of the first block of the selected blocks in the current product. The time of the last mea-
surement of the block is used as the time for this block
@UE1 Lower control limit LCL(d) of the mean values of an SPC chart.
@UG1 Lower specification limit LSL (lower tolerance) for the presentation and computation of the vio-
lations of the lower limit in the selected block of the current product.
@VK1 Coefficient of variation of the single readings of the selected block. The coefficient of variation is
the standard deviation in percent based on the mean value and is computed according to the
equation found in the appendix.
For fixed block sizes, @VK1 is the coefficient of variation of the block mean values.
@WN1 Normal probability chart of the single readings of the selected blocks in the current product. See
also @HG1
@BDT, @BTM and @BNR:
 Are available for the block print form template
 Refer to the individual block
 Are not available for the final print form template
11.6 Products with a Variable or Fixed Block Size

Products with variable block size
Evaluation mode for products with variable block size:
For products with variable block size, all single readings of the current product, or the single readings of the
blocks to be evaluated selected from the block selection, are used to determine the final result.
Select block:
Menu command Evaluation > Block selection
Products with fixed block size

The following are used to determine the results of the final evaluation:
 Block mean values of the current product, or
 The block mean values of the blocks to be evaluated selected from the block selection
All variables and parameters that otherwise refer to single readings refer, in this case, to the mean values of
the individual blocks (except for histogram and normal probability chart, which continue to refer to single
readings).
This changes the meaning of the characteristic statistical quantities (see appendix “Statistical formulas of
measurement technology for the FISCHERSCOPE X-RAY” in the operator’s manual).
Example Final evaluation

28 measurements are stored in a product in three blocks.
For 28 measurements of a product, which have been measured using variable block size, the result for the
variable "@NB1" (number of measurements) in the final print form is 28, because all single readings of this
product have been used to determine the final result.
If, on the other hand, the measurements have been taken using fixed block size, the result for the variable
"@NB1" is 3, because the block mean values of the three blocks of this product have been used to determine
the final result.
Attributes of the sample/dependence on the measurement mode

The number of quantities to be measured (attributes) in a measurement application that can be computed,
displayed and evaluated depends on the measurement mode.
Example Triple coating measurement

Measured and displayed are:
 Thicknesses of the top coating and the two intermediate coatings, or
 for alloy coating measurements, the coating thickness and the composition.
To display the statistical quantities, such as mean value or standard deviation of these measurement quanti-
ties in the print form, different variables are required.
For example, if after double-clicking the variable “@MW1”, the command button [Measurement quantity 2] is
actuated in the dialog window “Measurement quantity selection”, the variable “@MW2” will appear in the
print form template.
Notes
 The variables must always be entered in upper case letters
 The character @ is part of the variable, i.e., it must be entered, must not be deleted and it must not be
followed by space
 Images that are located in the clipboard can be inserted in the print form template
Edit print form or print form template > Edit > Insert
 Images saved in the BMP format can be inserted in the print form template with the variable @VIF.
67
11.7 Special Features for SPC Charts

When the option box all is checked, the SPC charts of all quantities to be measured (attributes) will be insert-
ed in the print form template one after the other.
If one of the option boxes Measurement quantity 1, Measurement quantity 2 or Measurement quantity 3 is
checked, only the SPC chart of the respective measurement quantity will be inserted in the print form tem-
plate.
Option boxes Maximum number of groups in the graphics

Use these boxes to specify the maximum number of groups that will be presented in the SPC chart.
Option boxes Size

When the option box Standard is checked, the SPC chart will appear on the print form in the standard size.
If the option box user-defined is checked, the fields Height and Width can be filled in to influence the size of the
SPC chart to be printed.
Height and Width

Use these fields to enter the height, or the width, of the SPC chart to be printed.
The size specifications will appear in square brackets immediately following the variable after inserting the
variable in the print form template, e.g., @SP1[150,90]).
11.8 Printing the Print Form Using the Supplementary Software PDM
Print forms can be printed very easily when using the supplementary software PDM.
Select the print form using the menu commands OR the command buttons:
Icon for block evaluation Icon for final evaluation
Call using the menu command: Call using the menu command:
Evaluation > Print form block evalua- Evaluation > Print form final evalua-
tion tion
The final print form evaluates only those blocks that have been selected before for the final print form using
Evaluation > Block selection or the button Block selection.
Three options for printing the print form are available:

 Menu command File > Print, or
 Control command CTRL-P from the keyboard, or
 Clicking the button Printer
Before printing, the print form can still be edited (e.g., removing the video image: Click the image and press
the Del key) or text entered. These changes disappear once the print window is exited and Print form block
evaluation or Print form final evaluation is selected again.
11.9 Measurement Uncertainty and Measuring Ranges

The program is able to display for each measurement result a corresponding measurement uncertainty.
To estimate the Measuring range

1. In the WinFTM main menu select Calibrate > Estimate meas. Range.
The window Measuring Range appears.
2. Change the value for Required precision or meas. time, if necessary.

3. Click Calculate.
Definition Measuring range

Range, where the precision does not exceed a specified limit value. Precision: random measurement uncer-
tainty due to distribution of the spectral channel contents of the instrument.
11.10 Meaning of the Measurement Uncertainty

Measurement uncertainty refers to the unknown difference to the true value. Physical samples representing
the "true value" are called standards. Their characteristic values are called nominal values or engraved val-
ues. However, they are valid and can be used for calibrations only if their uncertainty is specified. This is a
measure for the difference to the true value and is, by nature, a probability statement. Its numeric value X
characterizes a range X + X. It depends on the probability of still being able to capture the true value when
using this value.
69
PTB [German Physical and Technical Institute] uses the term "Überdeckungswahrscheinlichkeit" [overlap-
ping probability], which is identical with the term "confidence interval" used in statistics literature.
Assuming a normal distribution probability density for the difference to the true value, one identifies its dis-
tribution parameter s with the standard measurement uncertainty u, and using multiples thereof, can specify
well-defined measurement uncertainties. The often recommended expansion factor k shall be 2, such that a
range X + 2*u contains the true value with a 95% probability.
For several reasons, k=1 is meaningful as well, because here the standard deviation reaches the random
portion (see below) of the measurement uncertainty for a large number of repeat measurements. However,
here the hit rate is only 68%.
Safety conscientious companies and people prefer to allow less than 1% probability for errors - and select
k=3. In the end, however, it does not matter in what unit the measurement error is specified; important is that
it is known.
To meet different requirements WinFTM allows for the input of k. The default value is set to k=2. If you need
to change k, contact your Fischer Service Representative.
11.11 Random Error

If a measurement is repeated N times, the single readings will deviate around a mean value. The cause for
this is the random distribution of the channel contents of the spectrum, whose law of formation (Poisson dis-
tribution) we know. This is a special case in measurement technology that allows us, or the program, respec-
tively, to make a prediction about the repeatability precision from only one single measurement, or one single
spectrum, respectively. The respective value will be displayed or can be exported (cf. Section 4). In reality,
there are, however, additional causes for random fluctuations that cannot be determined theoretically, such
as the influence of the gas amplification in connection with the software drift compensation, for example. In
some cases this may lead to the measured deviations (standard deviation) exceeding the theoretical progno-
ses. However, they typically correspond surprisingly well.
If a measurement application does not correspond to the reality of the measured sample, this not only leads
to an increased mq value but also to an increase in the deviations). In any case, the random portion of the
error can be determined using statistical means. The program computes the uncertainty of the mean value
from the repeatability deviations, where the numeric value depends on the setting of the confidence interval
k (see above).
WinFTM cannot describe the differences between reproducibility and repeatability (= precision) described in
the literature since they depend on the way the tests are carried out. Only if, for example, the individual mea-
surements always include a new positioning of the sample, and maybe even a new operator, will the devia-
tions of the measurements reflect these influences as well. In this case, the confidence interval of the mean
value characterizes the reproducibility concerning the investigated influencing factors. In any case, these
measurement errors are greater than the random measurement uncertainties due to the Poisson-distribut-
ed deviations of the spectral intensities owed to the X-ray fluorescence method.
Figure 11-1: Calibration standard set. Input of the nominal values of the standards. The uncertainties (errors)
must be entered as well. If the pre-set Zero is not changed then the program will automatically
use 1% of the nominal values for coating thicknesses and area masses, and 1 mass % for concen-
trations as the uncertainty, referenced to k=1 (68% confidence interval).
The example applies to the measurement application Au/AuCuCd/Ni/CuZnPb.
11.12 Systematic Error

While the random errors described above can be characterized using statistical means, the systematic por-
tion of the error can be characterized only by comparison with measurement results from standard samples.
The systematic error could be described precisely and also corrected if the nominal values of the used stan-
dard samples were precise and it were possible to measure them without a random portion of the error. Un-
fortunately, this is not the case. Both the uncertainty of the nominal value and the (random) measurement
uncertainty of the calibration measurement determine the calibration error. One must additionally take into
account that for measurement results that are distant from the standard values, the uncertainty of the cali-
bration (with WinFTM, this is the correction of the standard-free result value) increases according to experi-
ence. The uncertainty of the correction depends, of course, on the extent of the correction itself. Thanks to the
quality of the FP-supported evaluation program, the required corrections are typically small, such that this
fact rarely dominates the measurement error. It is significant that this error can now be specified and the
risk is, therefore, known.
One prerequisite for its computation is the specification of the uncertainties of the standards. This is done in
the calibration standard set, cf. figure below. For the confidence interval, the general provision according to
Section 1 applies here as well.
71
For program-technology reasons, the systematic portion of the error is available only via On-line-Export.
Figure 11-2: Setting of the error display for screen output and export in the
"Calibration standard set". Default setting: Systematic portion.
The systematic portion cannot be determined if no calibration has been carried out. It will be set to Zero by
the program.
11.13 Display of the Measurement Uncertainty

To be able to display all possible information, both the systematic and the random portion of the error can be
suppressed during the error output. The setting for the type of error to be output is carried out in the "Calibra-
tion standard set" ( ‘Calibration standard set.’, beginning on Page 80). The table below shows the effect of the
error type setting for single readings and mean values.
Table 11-3: Error types, cf. Fig. 2
Switch Measurement uncertainty Error specification for single Error specification for mean val-
display readings ues
Random portion Theoretic error estimate from the Confidence interval of the mean
measured spectrum value according to t-distribution
(student-V.), computed from the
standard deviation of the block.
Systematic portion Computed from the random error Uses the error value of the last
of the calibration measurement measurement of the block
and the uncertainties of the nomi-
nal values of the standards, ac-
cording to the input in the "Cali-
bration standard set"
Systematic + random portion Root of the squared sum of the Root of the squared sum of the
random and the systematic por- random and the systematic por-
tions tions
Table 11-4: Output of the measurement uncertainty of the single readings
Screen output Only for large number display

Output in block print form Not possible
Output in final print form Not possible
Export Output with every single reading, only with Online-Export
Table 11-5: Output of the measurement uncertainty of the mean values
Screen output Not possible

Output in block print form ONLY FOR THE RANDOM ERROR PORTION, regardless of the error type
setting
Output in final print form ONLY FOR THE RANDOM ERROR PORTION, regardless of the error type
setting
Export Output after each end of a block (block evaluation), with On-line-Export.
For Off-line (subsequently), only the random portion can be output.
Example for the export of single readings and block results

Online export to text file. Export template:
Single reading portion @NBR. @VA1 +/- @ER1@CRX@LFX@END

Block evaluation portion Evaluation Block No. @BLK @ANB @PRF
@LOT@CRX@LFX@MW1+/- @VB1 s=@S_1
(N=@NM1)@CRX@LFX@CRX@LFX@END
11.14 Task Programming

A Task is a sequence of predefined commands which can be used for programming WinFTM procedures.
11.15 Starting a Task

To start a task: Task > Task start
Use the F3 function key to interrupt the program run.
11.16 Programming Tool

The commands are similar (or in some cases equal to) the import commands. The list of commands rep-
resents a TXT file which can be edited by common programs. WinFTM supports this programming by a tool
which inserts the selected commands with a double-click in the command list of the task.
Selecting and opening a task

The menu command Task > Task Modify or Create opens the dialog window Open, in which you can select and
open tasks.
73
11.17 Getting Started with Task Programming

There are some predefined examples which are helpful for testing.
The user should start his task programming by a modification of these examples. Click Save as ... to create
new task files. The commands and examples are described below.
11.18 Syntax of Task Commands

 A command starts with a "|" - except from the first command.
 Characters following a ";" are ignored - up to the next "|". Hence, anything that follows a semicolon is a
comment.
 Commands, variables and arguments have to be separated by a TAB. Note that spaces are not ignored,
but interpreted. Example:
f12<TAB>Zn/Fe; loads the product "Zn/Fe"
f12<TAB><Space>Zn/Fe; loads the product "<Space>Zn/Fe"
 Each command returns a logic argument TRUE or FALSE. Normally, TRUE is for O.K. and FALSE is for
Error. Other meanings are possible, please see below.
11.19 List of Task Commands

All task commands are listed in the right part of the dialog window Create task. They are listed within func-
tional groups and are accessible within a hierarchic order. Click the knot symbol left of the functional group's
name. This will give you direct access to the single task commands. The following list is an excerpt of all
commands. Depending on the equipment of your device, further commands may be available. You will find all
commands in the programming tool, see Chap. 11.16 on page 73.
Measurement
f01 - Starts a single measurement

f40 N measuring time = N sec.
f41 - Ready for measuring? Returns TRUE (OK) or FALSE (Error)
f60 - Switches measurement of calibration standards ON
f61 - Switches measurement of calibration standards OFF
Product handling
f10 X Loads - from current directory - product no. X

f11 A,X Loads - from of directory A - product no. X
f12 B Loads - from current directory - product with designation B
f13 A,B Loads - from directory A - product with designation B
f15 N Loads Stabi Test product no. N
f16 B Loads Stabi Test product S
Block handling
f20 S Sets Order No. = S

f21 S Sets Lot No. = S
f22 S Sets Operator = S
f25 - Closes block
Evaluation
p01 Opens the PDM block evaluation

p02 Prints the PDM block evaluation
p05 Closes the PDM block evaluation
p06 Prints a simple block evaluation
p10 Deletes last block
p15 Deletes last measurement
p16 Deletes all measurements
p22 Prints current result
p23 Exports current result
75
p24 Exports all results of block No. n. If n=0, then the current block will be exported
f62 Online Export ON
f63 Online Export OFF
f82 Exports the spectrum from ROI1 to ROI2 to the PC
Labels and Loops

The term jump address has the same meaning like the term label.
A jump is an exit from the continuous program cycle due to a jump command. The program cycle is then
continued at a different place, that is, at the jump address. Only one jump address with the same name may
be entered in the Task.
A loop in the program cycle is created if the jump address points to a program step that is ahead of the jump
command more towards the beginning of the program.
p51 L Sets jump address L

p52 L GO TO L
p53 L If there was an error in the last command: GOTO jump address L
p61 V1 Sets Variable 1 = V1
p71 L V1 = V1-1, if V1 > 0 GOTO label L
Accessories
f42 S Creates a text box on the screen with Text = S, returns TRUE or FALSE, (Button [OK] or
[Cancel])
f50 - Starts a reference measurement
f64 N Sets a delay (pause) of N sec.
f90 Closes a window if it is not the main window. If no window can be closed then return code
= ERROR
f91 Resets X-RAY, new PC-Communication, new HV control etc.
p25 Saves the current spectrum
p98 Single step mode: Task is carried out with single steps by pressing F4
p99 Single step mode (p98) OFF
Specification Limit Commands (depending on the last readings)
p80 S,L Symbolizes a logical relationship according to the table below. In case of TRUE (the corre-
sponding relation is fulfilled) the task jumps to label L
S Meaning
„i“ represents the number of the measurement data column
> Ki For reading i (i=1,2,3) of the current set of readings applies: Reading > USL
< Ki For reading i (i=1,2,3) of the current set of readings applies: Reading < LSL
> KX For at least one (any) reading of the current set of readings applies: Reading > USL
< KX For at least one (any) reading of the current set of readings applies: Reading < LSL
?Ki The reading i (i=1,2,3) of the current set of readings is not measurable (exactly the reading
designated with the consecutive number i is meant)
?KX At least one reading of the current set of readings is not measurable (any reading of the
current set readings is meant)
Example Specification Limit Commands

The following example clarifies the terms used on the previous pages at “S”.
Task: The values of the current set of readings in the three-line table shown below are sought.
The current set of readings shall be the numeric set printed in italics, it is the set of readings of the last pre-
vious measurement. In our example, it is the number set in the third line (with “n = 3”).
The placeholder i (i=1,2,3) is the counter for the place number in the line from left to right of the measured
element within the current measurement data set.
Attention: The placeholder i does not stand for the consecutive number of the measurement data set within
the test series (Note: correctly, this would be the designation n).
i=1 i=2 i=3
n = 1 Cr = 0.70 µm Ni = 4.09 µm Cu = 6.17 µm
n = 2 Cr = 0.73 µm Ni = 4.12 µm Cu = 6.27 µm
n = 3 Cr = 0.78 µm Ni = 4.21 µm Cu = 6.20 µm
Solution: The values below from the third line (where n=3) were sought:
Reading 1 is the reading for Cr, i.e., 0.78 µm
Reading 2 is the reading for Ni, i.e., 4.21 µm
Reading 3 is the reading for Cu, i.e., 6.20 µm
11.20 Data Back-up

Protect your data - back them up!
Save the complete installation regularly with a backup program like Acronis.
You can also copy the complete folder C:\FischerProg to a separate data medium (network drive, external
hard disk).
Thus, you are able to restore the data in case of a disk crash or accidental erasure of important files.
11.21 Mass per Unit Area and Geometric Coating Thickness

The natural unit of measurement for X-ray fluorescence is mass per unit area.
Definition "Mass per unit area": Mass per area
77
The number of atoms or the mass per unit area can be determined from the fluorescence spectrum. Howev-
er, this area-related mass AM (e.g., in g per m² or mg per cm2) is not the typically preferred unit of measure-
ment in coating technology - rather, the coating thickness Th (e.g., in µm or mils) is normally used for the
designation of the coating process or for the specification of the coated product and is usually requested in
the supplier’s document.
Thus, the mass per unit area needs to be converted into the coating thickness.
The correlation between mass per unit area AM and the geometric coating thickness th is:
AM
(1) th =
ρ
where ρ designates an effective density (in g/cm³) that represents the mass of the coating element per unit
volume.
In combination with a thickness measurement per cross cut, i.e., at a known coating thickness th, the density
ρ of the coating can be computed from it using equation (1). Other coating thickness measurement methods
for determining the geometric coating thickness may be used as well.
It is then possible to adjust the two methods through proper selection of the density such that they provide
the same measurement result for the geometric coating thickness.
However, a prerequisite is that the density does not fluctuate significantly during the coating process. This
would lead to deviating coating thickness readings when using the X-ray fluorescence method.
Physical background
An XRF coating thickness test instrument evaluates the intensities of the radiation of the coating and sub-
strate materials. The intensity of the characteristic radiation of the coating material is determined from the
number of atoms within the excited sample volume.
The intensity of this radiation is higher as more atoms of the sample volume are excited by the primary radi-
ation and emit their radiation to the detector.
However, the following applies to the radiation of the substrate material:
The higher the intensity of the characteristic radiation of the substrate material, the lower is the coating
thickness.
Reason: The absorption of the substrate material radiation penetrating the coating is lower through a “thin-
ner” coating.
The same applies to multiple coatings and coatings comprised of several elements.
Figure 11-6: Functional principle of X-ray fluorescence

Primary X-radiation (symbolized by black arrows) excites the sample volume to be analyzed into
emitting fluorescence radiation. Each occurring element emits a characteristic energy (symbol-
ized by red or green arrows) that are registered separately by the detector.
The following assumption is made for the quantitative computation of these effects in the defined test area
(sample volume) under the surface to be measured (measurement spot):
The excited atoms are distributed homogeneously across the entire volume, i.e., the specific density  of the
material is constant in the entire volume that is to be measured.
Essentially, the measurement of the x-ray fluorescence is an indirect count of the excited atoms under a sur-
face with a precisely defined size, the so-called “measurement spot”.
11.22 Correlation between Mass per Unit Area and Coating Thickness
If a coating is comprised of several elements, the instrument initially measures the mass per unit area of
each individual element.
Then the respective masses per unit area of all elements are added taking into account their weight propor-
tions, and a mean value is computed.
The division of the mean value of the mass per unit area through the weighted mean density provides the
sought coating thickness th:
AMmean
(2) th =
ρmean
AMmean Mean value of the mass per unit areas of all elements
1 1 1 1
ρmean Mean specific density = + + + ...
ρmean ρ1 c1 ρ2 c2 ρ3 c3
1, 2, ... Continuous number of the elements in the analyzed coating
c Element concentration
th Coating thickness
79
The computation assumes a homogeneous composition of the sample. When preparing the sample, ensure
that a representative density is stated. The analysis may provide a wrong result if samples are not homoge-
nous and only a small portion of the sample is used for the analysis.
Important: The thickness measurement using X-ray fluorescence assumes a well-defined and constant den-
sity ρ .
The two schematic drawings in the figure below show that the X-ray fluorescence method is actually blind to
the (geometric) thickness.
Two coatings with the same geometric thickness are presented here (prerequisite: same material, i.e., coat-
ing element).
The presentation of process 1 shows the atoms of the coating being stacked “loosely”. However, this cannot
be measured as the spectrum does not show a measurable line. The reason may be that an additional “ma-
trix element” is present in the coating.
The presentation of process 2 shows that the atoms are significantly closer to one another.
Correspondingly, the density is greater than the one shown in Figure 1. The XRF method can provide the cor-
rect (geometric) coating thickness if the measurement application that is used in process 1 uses a lower den-
sity for converting the mass per unit area into coating thickness according to equation 1 than the one of pro-
cess 2. Otherwise, the measurement result would not correspond to that of a method that measures the geo-
metric thickness directly.
I
Figure 11-7: Illustration of the density issue: Although the linear expansion of the two coatings is the same, the
density (and with it the mass per unit area) of process 1 (left) is significantly lower than that of
process 2 (right).
In practical applications, this issue often becomes apparent and is the cause of deviating results between
supplier and customer. This is most often the case if the coating contains elements other than the main ele-
ment and the instrument or measurement application does not or can not measure these elements. In such
cases, the density must be lower than the one that was to be used if only the main element was present.
Examples
 Precious metal coatings, e.g., gold: Here, instead of the density of pure gold of 19.3 g/cm³ found in tables,
a density of, for example, 17.5 g/cm³ as stated by the manufacturer of the gold bath or as agreed upon
between the parties is used.
The reason for this is that the bath contains elements or compounds (e.g., cyanide) that are included in
the coating but not visible in the X-ray fluorescence spectrum. However, the used density should be pro-
vided in the supply documents and should be part of the specifications; after all, it determines or not the
products meet the supply specifications.
 Hard material coating, e.g., TiN or TiC: Here, C or N is incorporated in the coating but remains invisible in
the fluorescence spectrum. The (effective) density can be determined according to the method of com-
parison with a cross cut as mentioned above.
All stored density values within the measurement application of WinFTM are values taken from tables
(source: Periodic Table of Elements, Heräus GmbH/Hanau, Reference 5C 3.81\N Ko). However, they can be
changed by the user.
11.23 Calibration Standards from Fischer

The density information of all calibration standards are computed according to the values of the Heräus ta-
ble, and are stated accordingly on the certificates. Thus, the coating information of the calibration standards
have been determined according to the mass per unit area method.
No data have been obtained using the cross-cut method. By default, WinFTM uses the density values of the
Heräus table.
The calibration lab of Fischer has been accredited by the Deutsche Akkreditierungsrat [German Accrediting
Council] for the measurement unit “mass per area unit”.
11.24 Setting the Density in the DefMA

You can manually set the density of an element in the DefMA. Please observe the notes of the previous sub-
chapters.
Figure 11-8: Dialog window “DefMA”. The current density setting for each element is shown in the left window.
To open the dialog window “DefMA”

Calibrate > DefMA new > Thickness mode opens the window DefMA in the thickness mode.
The thickness mode is the most frequent mode selection.
If you wish to work in a different mode, select the respective mode command to operate the window DefMA in
the desired mode.
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Figure 11-9: Dialog window “Definition of elements“. The density of the current element can be entered or ed-
ited in the entry box “g/cmˆ3”.
To open the window Definition of elements

1. Open the window DefMA.
2. Click New Layer to open the window Definition of elements.
11.25 Measurement Device Monitoring for the FISCHERSCOPE X-RAY

According to quality management guidelines, all measuring instruments are subject to measurement device
monitoring. Fischer, as a manufacturer of measurement instruments, accounts for this and sees to it that
customers who require advice and support are able to properly use their measurement instruments. The us-
ers of our instruments are companies all of whom are essentially certified according to the DIN EN ISO 9000
QS Standards. They are required to perform quality management and thus also plan, carry out and document
measurement device monitoring. We will offer some pointers below. These recommendations can then be
adopted either in part or in full into the quality management manual in the form of process or test instruc-
tions. Of course, they apply analogously to instruments of other manufacturers.
11.26 Calibration of X-ray Fluorescence Measuring Instruments

With X-ray fluorescence measuring instruments (DIN 50987, ISO 3497), the displayed readings are calculated
from the spectrum of the fluorescence radiation. Measurement applications define the structures and fea-
tures of the samples to be measured (order and composition of the coatings and of the substrate material,
quantities to be measured), provide the spectra evaluation and set the instrument to the intended measure-
ment parameters, e.g., to the operating voltage of the X-ray tube.
Calibrating
In the context of this recommendation, calibrating in the spirit of the instrument technology refers to an ”ad-
justment”. In the instrument technology, re-measuring the calibration standards in order to verify that the
readings obtained with the measurement application are still correct is referred to as ”calibration”. Still, for
practical and historical reasons and for the necessary agreement with the Standards DIN 50987 and ISO
3497 (Coating Thickness Measurement Using X-ray Fluorescence) we will continue to use these once select-
ed designations, especially since these designations are also used in the software of the instruments.
Each measurement application is calibrated with calibration standards that should in their structures be as
close as possible to the sample but may, however, differ from the samples in their coating thickness and to a
limited degree in the composition of the coatings and of the substrate material. The calibration standards
must exhibit known coating thicknesses, and for the analysis, known compositions (nominal values).
To this end, the supplier of the calibration standards measures them against higher-value master standards
with secured nominal values.
A certificate confirms the traceability, describes the method how the nominal values have been determined
and may also indicate the test conditions, the nominal values and their measurement uncertainties.
Through the calibration, the nominal values of the standards are transferred to the measurement applica-
tion. Thereafter, the measured coating thicknesses and concentrations are correct, as long as the calibration
standards are labeled correctly. After each calibration, the calibration is checked by re-measuring the stan-
dards to ensure that all entries have been correct and that the calibration indeed leads to correct results.
These check measurements should be documented in the same manner as all other test measurements.
Trueness
The instrument will then measure the coating thicknesses of other specimens that correspond in coating
structure and substrate material to the measurement application correctly as well. The trueness of mea-
surements is a quality that is particularly important because supply contracts for coated products often re-
quire the observance of specification limits. Wrong or incorrect measurements can then lead to unwarranted
acceptance or rejection. The trueness aids in avoiding non-conforming measurement results both within the
production and between supplier and customer. A measurement must be based on calibration standards and
be traceable. Only then is it correct. If calibration standards do not exist or are not available for certain mea-
surement applications, then reference samples that have been measured using a calibrated measurement
application or have been measured standard-free shall assume their roll.
Strictly speaking, a correct measurement is secure only for such samples that correspond to the calibration
standards in their coating structure and composition. WinFTM allows for certain differences between the
structure of the sample and that of the standard, e.g., differences in the substrate material. Although these
differences are physically taken into account correctly, for formal reasons they require documentation.
11.27 Why Monitor Measurement Devices?

Stability
In the course of time, each coating thickness measuring instrument changes due to wear and drift. Long-
term, this also changes the measurement applications and calibrations, and thus, the measurement read-
ings. The resistance of an instrument to long-term changes is called stability. Each user is interested in a
high stability of his instrument.
To determine the long-term behavior of the instrument and its measurement applications, the user checks in
regular intervals and if required, takes corrective action. These measures are essential for measurement de-
vice monitoring. Measurement device monitoring secures the trueness of the measurements permanently.
As long as a measurement application does not change or if it is always corrected on time, the calibration
and thus the measurement readings of the measurement application will remain correct. However, a mea-
surement application can also produce wrong readings due to erroneous operation, e.g., changing the mea-
surement parameters, wrong or improper calibration or faulty measurement conditions. This too can be rec-
ognized and remedied by measurement device monitoring.
The user has the duty to check and monitor each individual measurement application in the instrument, not
only the instrument as a whole. The instrument manufacturer cannot satisfy this task. He may provide a cal-
ibration service but cannot continuously pay attention to the trueness of the measurements. The basic re-
quirements of measurement device monitoring are that they are carried out regularly and that they are doc-
umented. Thus, measurement device monitoring is a task of the user who should delegate this task to a
trustworthy person with sufficient expertise.
The calibration standards are also measurement devices and therefore subject to monitoring. However, they
change very slowly, generally through wear and tear during use, more rarely through structural changes,
e.g., diffusion or corrosion. In contrast to the instrument, the user will not be able to carry out the measure-
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ment device monitoring for the calibration standards. We recommend to treat the standards gently, to store
them according to instructions and to have them tested or re-certified regularly, e.g., once a year. Certified
calibration standard sets or so-called application kits are available for most of the typical measurement ap-
plications. They are necessary to verify the trueness of the measured values in cases of dispute and to mini-
mize product liability risks.
11.28 Variation of Measurement Readings

Repeatability Conditions
The displayed value of any measuring instrument will not be exactly the same when repeating a measure-
ment, instead it will vary, even under otherwise equal measurement conditions (repeatability conditions), due
to random influences of the instrument. If repeated measurements do not exhibit variations, either the reso-
lution (decimal places) is too low such that the variations are not visible or the instrument is defective and
shows the same value at all times. The resulting deviations are considered random because it cannot be pre-
dicted whether the next measurement is bigger or smaller than the result of the test series up to that mo-
ment.
The standard deviation of a test series under repeatability conditions is the general measure for the varia-
tions of the readings. It can be calculated in the known manner from the single readings. The measurement
result (mean value and standard deviation) of a test series is to a certain degree random as well and exhibits
an unavoidable measurement uncertainty. This can be seen in that repeating a test series will lead to a (often
only slightly)
√ different measurement result. However, the variations of the mean values are smaller (by a fac-
tor of 1/ 2 , where n is the number of the single readings of the test series) than the variations of the single
readings.
Measurement Uncertainty u
The measurement uncertainty u of the mean values is derived from the standard deviation s and the number
n of the individual readings included in the test series:
(4) u = c(n)s
where c(n) is a factor that is dependent on the number of single readings and the so-called confidence level
1-. For n = 5, 10, 20, 30 and 50 (and a confidence level of 95%) the resultant factors are:
c(5) = 1.24 ---- c(10) = 0.71 ---- c(20) = 0.48 ---- c(30) = 0.37 ---- c(50) = 0.28.
Confidence Interval
The measurement uncertainty forms the confidence interval when deducted as difference from and added as
sum to the mean value (plus/minus). It is an interval around the mean value of the test series that contains
with a 95% probability the true (overall) result that one was to obtain if one were to measure infinite times. In
measurement technology, the results are always displayed graphically in the same manner by drawing the
mean value as a circle or point and the confidence interval as an ”error bar” from this point (”bar-bell”). The
confidence interval becomes narrower as the number of single readings that form the mean value increases
and the better the repeatability precision of the instrument, or respectively, the smaller the standard devia-
tion of the single readings is (see above equation for the measurement uncertainty u and the factors c(n)).
Variations
The variations of an X-ray fluorescence instrument depend on the measurement parameters measurement
time, distance between the detector and the specimen, intensity of the primary beam and other characteris-
tics of the instrument as well as on the physics of the X-ray fluorescence with regard to the measurement
application. It is interesting that with the X-ray fluorescence method, the variations of the readings can be
calculated theoretically from the spectrum of a single reading such that a measure for the variation can be
specified with one single reading. The standard deviation is used to evaluate the repeatability precision of the
instrument with regard to the measurement application, the feature to be measured and the setting param-
eters of the instrument. The better the repeatability precision of the instrument, the less the measurement
results will be ”falsified” by the instrument. Thus, a good repeatability precision is considered an important
quality feature of an instrument and is of particular importance when evaluating the suitability of a measure-
ment device.
Guaranteed Error
The calibration standards are subject to a ”measurement uncertainty” as well because their nominal values
are obtained through measuring. For this reason, the nominal values of the standards also include an error,
the guaranteed error (e.g., 5% of the nominal value) that includes the mean value, and its interval should in-
clude the true value.
11.29 Trueness of Measurement Readings
Accuracy
Trueness Precision
Congruence between the Congruence between the

true value and the mean single readings under pre-
value of the measurement cicely defined measur-
readings, archieved cons- ment conditions
tantly under practical
measurement conditions.
Repeatability Reproducibility
The repeatability precision of an instrument must not be confused with the trueness of a reading. The true-
ness of a measurement result is determined by comparing the mean value B of a test series of a sample, for
example a calibration standard or a reference sample, with its known value A that has been recognized as
being correct, the nominal value. The trueness is represented by the difference B – A between the mean val-
ue and the nominal value. The measurement result is correct if the difference B – A is near Zero.
Please note that we expressly speak of the trueness as a property of the measurement readings. However,
many believe the trueness to be a property of the instrument! Unprofessionally, this is expressed in the ques-
tion for the ”accuracy of the instrument”. However, the trueness is obviously very dependent on the settings
(e.g., the calibration) and the monitoring of the instrument. These in turn depend on the competency and de-
pendability of the user. For this reason, the instrument manufacturer is not able to guarantee the trueness of
the values measured with this instrument or even apply a sticker to the instrument stating the trueness.
Each measurement result is as correct or wrong as allowed by the user. Thus, the trueness cannot be a cri-
terion for the quality of an instrument, at best it can be an indication of the stability (trueness during long-
term operation of the instrument without necessary interim corrective measures).
In measurement technology, the term ”accuracy” is essentially meaningless and of little relevance. In con-
trast to it, the terms trueness and precision that are unambiguous (contrary to the term accuracy) are pre-
ferred. On the international scene of standardization, the situation is similar: the term accuracy can be ex-
plained only qualitatively; it is split into the terms trueness and precision. The term precision in turn is divid-
85
ed into repeatability (repeatability precision = precision under repeatable conditions) and reproducibility
(comparative precision = precision under comparable conditions).
11.30 Random and Systematic Deviations

Is a single reading that has been measured on a calibration standard and that deviates significantly from its
nominal value, such that B – A is much bigger or smaller than zero, correct or rather incorrect? It obviously
has error, as long as the calibration standard is not labeled incorrectly, that is, A being wrong. The question
then remains: is the deviation of B – A from zero a random or a systematic (i.e., not a random) one?
For an expert, it is not enough to base the answer to this question on one single reading.
To differentiate between random and systematic deviations, one needs to make many (>10) measurements
under repeatability conditions on a calibration standard and then compare the nominal value with the mean
value. The first prerequisite for the comparison is: the measurement application applies to this calibration
standard. This is very important and is often disregarded in practical situations! The comparison is particu-
larly inadmissible if the expected substrate material of the measurement application deviates significantly
from the substrate material of the calibration standard: In such a case, the user need not be surprised by the
deviation.
Statistics teaches: Only when a mean value of a test series of at least 7 single readings misses the nominal
value of a calibration standard by more than one standard deviation can one assert that the deviation is a
systematic one. Expressed better and more precisely: The deviation is systematic when the nominal value of
a calibration standard is outside the confidence interval of the mean value of a test series.
Systematic measurement deviations from the nominal value always have a particular algebraic sign: they
are either always positive or always negative. A systematic deviation must be made to disappear through
suitable corrective measures in order to measure correctly. These measures will be treated in greater detail
beneath.
We speak of a random deviation of a measurement result from the nominal value when the nominal value is
within the confidence interval around the mean value. Thus, a random deviation should not be considered an
”error”; quite to the contrary, it is actually natural because it is caused by the variations of the instrument and
can, therefore, be explained. The mean value is correct despite a random deviation from the nominal value. In
other words: The difference between the nominal value and the mean value cannot be resolved with the ex-
isting precision of the instrument.
Re-measure (check) a calibration

The following applies to a check measurement (test) of the calibration: The mean value of a test series on a
calibration standard may at times be smaller and at times bigger than the nominal value of the standard
when repeating the test series, however, it must remain (in 95% of all cases) within the confidence interval.
Such a registered random deviation does not need to be, or actually cannot be, corrected. The user can in-
crease the repeatability precision of the instrument (e.g., through longer measurement times or more mea-
surements in a test series). He can then hope that the random deviations become very small and the system-
atic deviations become more apparent.
If two parties obtain different measurement results on the same specimen and even at the same position, the
comparison of the difference of the measurement result with regard to their confidence interval (such as be-
tween the nominal value and the measurement result on a calibration standard) also becomes helpful in de-
tecting a systematic measurement deviation. Only when the confidence interval of one of the two measure-
ment results does not overlap the confidence interval of the other measurement result can one speak of a
(systematic) difference. Otherwise one must assume that in truth the mean values differ randomly. A random
difference may be explained by the lacking precision of the instruments involved and does not need to cause
a dispute. In such cases, one can no longer speak of different measurement results. However, if one wishes
to prove that the difference is systematic, then the precision of the involved instruments must be increased
(e.g., by increasing the measurement time or by decreasing the measurement distance or by increasing the
number of measurements) and in this manner the confidence interval made narrower. If this establishes a
systematic deviation, it must be researched which of the two results is correct and which one is not or even
if both are false. How to do this will be shown in the next section.
11.31 Trueness and Precision

Trueness
Trueness is a property of measurement readings, namely to possess larger or smaller systematic deviations
from the correct values.
As a rule, a systematic deviation is discovered when an instrument has changed. It is a result of inadequate
measurement device monitoring if false readings are measured over longer periods. However, the calibra-
tion of the instrument may also have been wrong from the outset (e.g., through erroneous entries of nominal
values during the calibration or when using a wrongly labeled calibration standard). Or the calibration stan-
dard in its composition does not fit the properties of the instrument setup. A wrong calibration can be cor-
rected by re-measuring with one or more standards and possibly through normalization or re-calibration.
Errors caused by faulty calibration standards or software influences would become apparent only through
comparative measurements between different calibration standard sets. Both types of deviations are sys-
tematic. Systematic measurement deviations lead to situations that different users (e.g., supplier and cus-
tomer) measure different results at the same specimen.
Precision
In contrast to trueness, precision is an instrument property. It can be easily characterized, e.g., by repeated
measurements on a sample (whose true value must not even be known) at one and the same location under
repeatability conditions. The mean value produces the requested measurement reading and the standard de-
viation of the test series is a measure for the instrument’s precision. If the measurement application has
been calibrated correctly, then the mean value of the test series is also correct and corresponds to the true
value (which is the mean value that results from infinitely repeated measurements) within the confidence
interval.
However, if one knows the correct measurement result of a sample at a marked location and measures it
with a different instrument and by a different user, the measurement result is typically different. This can be
observed, for example, with round robin tests on the same sample with a marked reference area, even if
each instrument is correctly calibrated and checked. The reasons are the random deviations of each single
reading, and thus of each mean value of a test series, the random deviations at each calibration, and also the
fact that each calibration standard is labeled with a nominal value that through its measurement is also af-
flicted with an unavoidable deviation from the true value (expressed by the uncertainty of the standard). The
sum of these deviations is expressed in the comparative precision of the measurement method. The repeat-
ability precision characterizes the random deviations of the results that are obtained at one instrument by
one person with one and the same sample at the same measurement location at repeated measurements,
i.e., under repeatability conditions. Comparative precision describes the random deviations between different
instruments, calibrated with different calibration standards, at repeated measurements performed by differ-
ent persons at the same sample using the same measurement locations (measurements under comparable
conditions).
Theoretically, there should be trust between the supplier and customer. However, the reality is: ”Trusting is
good, inspecting is better!”. One of the most important prerequisites for the inspections is correct measure-
ment readings. However, different readings between supplier and customer should generally not be taken as
a cause to continuously doubt the measurement results or measurement methods of the other party or to
demand arbitration measurements with different methods that are to verify that one’s own measurement is
correct. First one should investigate whether the measurement results have been obtained at the same mea-
surement spots and the same specimens. To answer this question, supplier and customer should exchange
and measure the same samples with marked measurement spots. If the results are still different, the in-
87
volved instruments should be calibrated using certified calibration standards. This determines which instru-
ment measures correctly and which instrument requires corrective measures. If the differences remain and
the problem cannot be resolved, only a well-founded consultation through experts of the instrument manu-
facturer may help in the end.
Each user who monitors the measurement devices as described herein, can verify the trueness of his own
measurements at any time. He can also trust his measurement results and will not be troubled by unwar-
ranted complaints. In practical situations, the systematic deviations, which almost always arise from inade-
quate or infrequent monitoring of the measurement devices, occur more significantly and more frequently
and above all are of a greater magnitude than the random deviations between the instruments of different
parties. Typically, the random deviations are hardly noticed and if they are noticed, they are accepted due to
their insignificance. Thus, random deviations as opposed to systematic ones can usually be neglected as the
reason for measurement reading differences. It is not without reason that the X-ray fluorescence method is
considered the most accurate measurement method for coating thicknesses due to its high comparative pre-
cision. Because the most common and grave deviations are of a systematic nature, they must be found and
corrected. This is the task of measurement device monitoring.
11.32 Practical Monitoring of the Measurement Devices

How to test?
A measurement application that is calibrated and checked using calibration standards and if necessary cor-
rected and documented, is considered secure. Measurements with a secure measurement application pro-
vide correct measurement readings. This condition should essentially continue for a long period, however, as
mentioned above, the measurement application can change, because inevitably sooner or later the instru-
ment changes. Users must, therefore, check and if necessary correct each measurement application regu-
larly and as often as is economically feasible.
For the Fischerscope XRAY with the WinFTM Software, each product file contains in addition to the measure-
ment application for the sample a parallel measurement application for the calibration standards (with an
identical calibration but with a potentially different substrate material). The parallel measurement applica-
tion can be used to measure the calibration standards. Thus, the problem mentioned does not exist: a sub-
strate material correction when re-measuring is unnecessary and the test is, therefore, simpler.
We recommend performing the checks using reference samples or calibration standards. They are well suit-
ed for long-term monitoring because one can assume that the samples do not change over a long period as
opposed to the measurement application and thus one can easily recognize changes of the measurement
application. A reference sample is a coated storage sample from the production that corresponds in its
structure (order and composition of the coatings and substrate material) to the measurement application to
be checked, and that exhibits a marked measurement spot (reference area) and that is positively identifiable.
Within the reference area, the reference sample should exhibit essentially no coating thickness differences,
referenced to the mean value. Checks with reference samples offer the advantage that the reference sam-
ples are less expensive, that they can always be replaced by new samples, that the standards are spared and
that the check may therefore be carried out more easily. Reference samples can also be used to compare the
measurement results of two parties (e.g., supplier and customer) when calibration standards are not avail-
able at one of the parties and one tries to avoid shipping of relatively expensive calibration standards.
Reference samples
Reference samples are considered derivative or secondary calibration standards. There are no alternatives
to reference samples if no primary standards are used or use of an annual calibration service is made. When
checking the standards, a potentially existing difference between the substrate materials of the sample and
the substrate material of the calibration standard must be taken into account: prior to the check measure-
ment, the measurement application must be set to the base material of the calibration standard set, and after
the check it must be reset to the substrate material of the sample. Otherwise, the standard or the sample
would not be measured correctly. This is not necessary with a reference sample because its substrate mate-
rial is identical to that of the measurement application. A prominent example would be the check measure-
ment of the measurement application Sn/CuSn6 with Sn/Ni or Sn/Cu standards. Here, a measurement with-
out taking into account the fact that the calibration standard does not contain Sn in the substrate material
would result in a reading with a value that is up to 2-3 µm too low.
The check measurement is carried out by making an equal number of measurements (e.g., 5) under repeat-
ability conditions within the reference area of one and the same sample at regular intervals. Each of these
test series is called a group. The same measurement time and the same base setting of the measurement
application to be checked are used as during the regular measurements. Each group provides as its result
one mean value and a measure for the variation, e.g., the standard deviation. For each feature, these mea-
surement results are entered into a test protocol or even better into a quality control chart (SPC chart). Doc-
umentation of the measurement results is extremely important because only the documentation provides
the proof whether measurement readings are correct using the current calibration and whether the instru-
ment is okay. Measurement device monitoring is unthinkable without documentation and would not deserve
its name.
Time intervals
The time intervals of the check measurements are determined by the respective measurement application.
We recommend verifying simple measurement applications (e.g., Zn/Fe, Au/Ni, Sn/Cu etc.) once a week.
However, the user should verify more complex measurement applications (e.g., Cr/Ni/Cu/Zn) every other day
or even once a day. The measurement application is to be re-verified after every correction. The intervals
may be increased if the repeated verification never or only rarely shows a significant deviation from the nom-
inal value.
These recommended intervals indicate that annual checks with standards by a calibration service of the
manufacturer cannot replace measurement device monitoring. If the manufacturer performs a calibration
service, for example, because no calibration standards are available, the user only has the option to monitor
the measurement device using reference standards. Thus, establishing reference samples is an obligatory
consequence of using a calibration service, because continued access to standards by the user is not possi-
ble.
To determine the actual situation of the measurement application at the beginning of the control chart, the
characteristics of the reference sample or of the calibration standard, respectively, are determined with the
secured measurement application in the form of a larger random sampling (n > 50) without break. This is
called a pre-run. The reason for measuring the random sample in an as short as possible period is that the
instrument should remain stable during this time such that systematic changes of the instrument can be ne-
glected during this time span. The result of the pre-run is the mean value of all group mean values (nominal
value) and the mean value of the standard deviation from the single readings within the groups. The limits for
the mean value and for the standard deviation that are not to be violated by the random deviations are calcu-
lated from the nominal value in relation to the mean standard deviation and the number of single readings
per group. These limits are called statistical control limits. With subsequent measurements, upper and lower
violations of these control limits are therefore caused by systematic changes to the measurement applica-
tion.
Thus, the control limits characterize when subsequent measurement results are random or ”natural” (mean
value and/or standard deviation fall within the limits) or when they deviate systematically or ”unnaturally”
from the nominal values determined during the pre-run (measurement results are outside the limits) and in
doing so indicate a change in the measurement application that must be corrected. With subsequent regular
checks of the measurement application, using upper or lower violations of the control limits, it is then very
easy to discover on time deviations of the measurement application from the nominal values and to make
control corrections.
89
11.33 When and how to Carry out Corrections?

We recommend the correction of a measurement application as soon as the mean value or the standard de-
viation of a group violates the control limits that have been determined by the pre-run. As corrective mea-
sures we recommend:
 a normalization (measurement of the spectra of the pure elements and of the substrate material) of the
measurement application
With a Fischerscope XRAY with WinFTM software, the spectra of the ”pure elements” are not measured anew
during the normalization but instead are accepted from the spectra library that contains their spectra when
the switch ”Measure elements” of the DefMA is disabled. In this manner, the measurement application is not
changed during normalization, and therefore not corrected, except for a potential substrate material correc-
tion. For such measurement applications, normalization cannot provide any new information.
The measurement application should be checked once more after every corrective measure. If the limits are
still violated, we recommend a re-calibration of the measurement application. Due to its high stability, cor-
rections of the measurement applications of a Fischerscope XRAY are typically required only after several
weeks or months.
Note: All measurements for monitoring of the measurement devices as well as all potential corrections
should only be performed once the instrument has been measuring for a sufficient length of time, that is, it
has generated ”radiation”. 15 – 30 min of operating time are sufficient for this purpose. Thus, measurement
device monitoring is not recommended directly after power-up of the instrument, even though regular mea-
surements can be made.
11.34 Pre-run for Determining the Control Limits

The control limits can be calculated using the ”calculator” functions in the control chart of WinFTM. Beyond
that a spreadsheet that contains the equations beneath for the calculation of the control limits can be used
for the pre-run.
Pre-run
The pre-run consist of a minimum of m = 10 groups each with n = 5 single readings, i.e., a total of 50 mea-
surements. The measurement application and the identity designations must be documented.
The single readings for the pre-run should be carried out successively using the setting parameters (mea-
surement time, measurement distance, collimator, etc.) typically used for the measurement application and
should be concluded within a short period for the instrument to remain stable during this time. Systematic
changes during this period are then negligible. After each group (not after each measurement!), the refer-
ence sample should be taken from the instrument and re-positioned in order to simulate as good as possible
the subsequent procedure during the check measurement. With instruments featuring a variable setting of
the measurement distance, such as the Fischerscope XRAY, the measurement distance must be retained
during the pre-run and the subsequent check measurement because the standard deviation correlates to the
measurement distance. This distance can be noted and viewed in the ”notepad” of the product that is used for
measurement device monitoring.
Overall mean value x̄total

At first, the mean values x̄i of the m groups 1 to 10 are used to calculate the overall mean value x̄total :
1
(2) x̄total = x̄i = x̄est
m
This overall mean value forms the estimated value x̄est for the mean value of the quality control chart.
Standard deviations si
The standard deviations si of groups 1 to 10 are used to build the arithmetic mean value sI :
1
(3) sI = si
m
The index i runs across the number m of the groups.
The estimated value sI serves as the ”current” standard deviation of the individual readings. The variations
between the group mean values due to drift, interference or changes in the position of the reference samples
during the pre-run are taken into account by calculating the standard deviation of the mean values sII from
the group mean values x̄i of the m groups 1 to 10:
Standard deviation of the mean values sII

(4a) (x̄i − x̄total )2
sII =
m−1
sII takes into account the ”extraordinary” influences (potentially present during the pre-run) on the varia-
tions of the group mean values that may come into existence due to sample re-positioning for a new group or
by changing the measurement location or the operator – as will also occur during subsequent measure-
ments in the control chart.
Estimated value of the standard deviation σ̂

Now, the standard deviations sI and sII are used to form the estimated value of the standard deviation σ̂ of
the population::

(4b) σ̂ = s2I + s2II
The two limit values U CL(x) (upper control limit for the mean value x̄ ) and LCL(x) (lower control limit for
the mean value x̄ ) are the product of the nominal value x̄est and the standard deviation s with:
x̄est + 3s
(5a) U CL(x) = √
n
and
x̄est − 3s
(5b) LCL(x) = √
n
n is the group size. It has been taken into account that for every control limit an acceptance probability of
99.5% applies, i.e., an upper and lower violation of the control limits occurs randomly only at a total of 1% of
all cases.
An upper control limit U CL(s) applies also for the standard deviation that is calculated from the estimated
standard deviation s as follows:
(6) U CL(s) = BAO · s = 2.09 · s
The limiting factor BAO is a value that corresponds to the size of the random sample n, in this case for n = 5,
BAO = 2.09 .
BAO = 2.09 is arithmetically determined as follows:

1 − C(n)2
(7a) BAO =1+3
C(n)
91
with
(7b) 0, 25057315 0, 20580811 0, 202729377

C(n) = 1 − − −
n n2 n3
The limit values calculated in this manner are accepted into the quality control chart and serve the purpose
of deciding whether the measurement application must be corrected or not. Violation of the upper or of the
lower control limit means that a control correction of the measurement application is required. The WinFTM
software of the Fischerscope XRAY facilitates the set-up of products using quality control charts specifically
for monitoring the measurement devices and to calculate the control limits automatically from the pre-run.
Example of a pre-run
10 groups, each with 5 measurement readings, have been measured under repeatability conditions using a
nickel-plated and copper-plated reference sample (substrate material iron). For this purpose, the number of
single readings per group (in the ”Figure”) is set to a fixed number (here n=5) in the product ”Ni/Cu/Fe refer-
ence sample 10-245”.
We recommend entering the measurement data of the above pre-run in a quality control chart (SPC chart) for
each feature (here for the nickel and the copper thicknesses). The purpose of the pre-run is to calculate the
control limits. They are graphically drawn into the control chart as lines and correspond to the limit values
that lead to a correction if they are violated during subsequent measurements. The final protocol of the pre-
run generated with the WinFTM-PDM software at the actual reference sample Ni/Cu/Fe 10-245 shows be-
neath the group numbers (designated with "nbl"), the group results (mean values Ni. and Cu. per group, stan-
dard deviation s per group), the final result, the control limits as well as the control charts for the nickel coat-
ing and for the copper coating:
Helmut Fischer GmbH Office West
Danziger Straße 10 50374 Erftstadt
Tel.: 02235 41447 Fax: 02235 922990
Fischerscope® XRAY Final protocol

___________________________________________________
Product: Ni/Cu/Fe reference specimen 10-245
Folder: ISO9000
Meas. application: Ni/Cu/Fe
Meas. mode: Dual coating (dd_)
Order: Pre-run
Operation.: 5 x 10 measurements
Final evaluation fromGroup No. 1 measured 12:22:09
to Group No. 10 measured 12:39:55

nbl= 1 Ni.= 7.54 µm Cu.= 7.79 µm
s = 0.085 µm s = 0.098 µm
nbl= 2 Ni.= 7.45 µm Cu.= 7.70 µm
s = 0.053 µm s = 0.155 µm
nbl= 3 Ni.= 7.36 µm Cu.= 7.68 µm
s = 0.123 µm s = 0.097 µm
nbl= 4 Ni.= 7.43 µm Cu.= 7.57 µm
s = 0.078 µm s = 0.174 µm
nbl= 5 Ni.= 7.45 µm Cu.= 7.54 µm
s = 0.155 µm s = 0.093 µm
nbl= 6 Ni.= 7.39 µm Cu.= 7.61 µm
s = 0.171 µm s = 0.148 µm
nbl= 7 Ni.= 7.46 µm Cu.= 7.69 µm
s = 0.111 µm s = 0.160 µm
nbl= 8 Ni.= 7.35 µm Cu.= 7.66 µm
s = 0.103 µm s = 0.135 µm
nbl= 9 Ni.= 7.49 µm Cu.= 7.72 µm
s = 0.215 µm s = 0.168 µm
nbl= 10 Ni.= 7.56 µm Cu.= 7.84 µm
s = 0.158 µm s = 0.101 µm
Mean value x.. 7.449 µm 7.681 µm

Standard deviation sI 0.125 µm 0.133 µm
Confidence mean value 0.051 µm 0.066 µm
Range R(x.) 0.321 µm 0.327 µm
Lower control limit (x) 7.26 µm 7.46 µm
Upper control limit (x) 7.64 µm 7.90 µm
Upper control limit (s) 0.300 µm 0.338 µm
Number of groups 10 10
Measurement time 20 s
93
All printed values are available in the print form of WinFTM PDM as variables (including the control charts).
They can re-calculate the printed control limits by using the original values (mean value x. and standard de-
viations s) and the equations specified in the previous section. Please note that the pre-run has been conclud-
ed within a short period (here: 17 minutes) in order to ensure the stability of the instrument during the pre-
run.
The protocol shows the video image of the reference sample that the camera of the Fischerscope XRAY has
recorded. The measurement area is identified by an orange-colored ring, the measurement spots where the
instrument made individual measurements during the pre-run are identified by yellow crosses. Even though
the reference area is small compared to the dimensions of the sample, the distribution of the coatings within
the reference area can be non-uniform. Because during the check measurement any measurement spot may
be selected within the reference area, a potential inhomogeneity of the coating thicknesses must already be
taken into account during the pre-run.
If the lower and upper limits are too far apart in reference to the confidence interval, then the reference sam-
ple is not suitable due to a non-uniform coating thickness within the reference area or because the sample
cannot be positioned and measured in a reproducible fashion. It is then recommended to use a different
specimen as a reference sample.
11.35 Long-Term Monitoring

After the pre-run, the user is to make at regular intervals new measurements at the reference sample, or the
calibration standard, respectively, that were used for the pre-run. For practical purposes, the time intervals
should be specified according to the difficulty of the measurement application (see above). Each new group
provides a point for x. (spoken as x_bar) in the control chart and a point for s (thus, the respective quality
control charts are also called x_bar / s-charts). As has already been shown above, the control limits can also
be calculated automatically by the WinFTM software even without knowledge of the equations. One control
chart each is required for each reference sample and for each feature. This, however, is already being taken
into account by the software.
Upper and lower violations of the control limits suggest to correct the measurement application by taking the
corrective measures recommended by us. Then a second group is measured in order to evaluate the success
of the corrective measures. If the values continue to be outside the control limits, a new calibration may pro-
vide help (however, with the disadvantages and limitations that were mentioned above).
A stability test should be performed if frequent corrections become necessary because there is suspicion
that the stability of the instrument is not ensured and maintenance or repair including replacement of com-
ponents may be necessary. In such cases, the user should entrust his problem and help to the support and
service personnel of Fischer.
95
12 DefMA
If you have activated the SUPER software, you can create a DefMA by yourself.
The usage of the SUPER software requires deep knowledge of the physics of x-ray fluorescence and the func-
tionality of the instrument.
Alternatively, you can request a new measurement application from Fischer. Fischer offers a professional
service for the creation of customer’s Def.MA.
12.1 The DefMA Modes

When you create a new DefMA, you can choose between different modes. The mode determines the mea-
surement method and the presentation of the measurement readings.
Table 12-1: DefMA Modes
Mode Application
Material analysis For the analysis of bulk material (massive specimens).
Analysis with bal- For the analysis of bulk material (massive specimens), if the specimen cannot be de-
ance fined completely by 100 percent.
Typical applications: recycling, RoHS, soil specimens, biological specimens
Thickness mode For coating thickness measurements. The measurement results for the coating
thickness are displayed in the typical units of length such as µm. The analysis results
are shown in percent units.
The density values of the elements are taken from internal tables. You do have the
option to change these values.
Mass per unit area For coating thickness measurements. The overall area mass is displayed as well as
(relative) the percentage portion of the individual elements.
Mass per unit area For coating thickness measurements. The overall area mass is displayed as well as
(absolute) the individual area masses of the respective elements.
Solution analysis You fill the measuring cell with the solution to be analyzed, see Chap. 14.2 on
Page 111.
ROI-Mode ROI = Region of interest
Only a defined portion of the measures spectra is evaluated. You define one or more
regions (ROI) of energy channels. The portion of the spectra that is located in the de-
fined region is evaluated only.
Counting rates are issued, the fundamental parameter method is not used.
Used for special applications, where the fundamental parameter method is not appli-
cable.
Component mode For the analysis of specimens, which are not only composed of pure elements, but
also contain chemical compounds (e. g. oxides). WinFTM offers a list of components,
which can be used like elements.
The result display shows the measurement readings of the complete components,
not only the elements the components are composed of.
97
DefMA
Mode Application
Component mode For the analysis of bulk material (massive specimens), if the specimen cannot be de-
with balance fined completely by 100 percent and the specimen is not only composed of pure ele-
ments, but also contain chemical compounds (e. g. oxides).
The result display shows the measurement readings of the complete components,
not only the elements the components are composed of.
Typical applications: recycling, RoHS, soil specimens, biological specimens
12.2 Creating a new DefMA

The creation of a new DefMA in the thickness mode (see Table 12-1 on page 97) is described here. If you cre-
ate a new DefMA in another mode, the steps may differ.
Before you start

The WinFTM extension SUPER is activated.
Procedure
1. In the WinFTM main menu select Calibrate > DefMA new… > <Mode, see
see Table 12-1 on page 97>.
2. In the field Label enter an explicit name for the new DefMA file.
3. In the field located right above select the high voltage and the primary filter (if present). The high voltage
and the primary filter has to fit your measurement task.
Enter the layer composition of your specimen as follows

Start with the top layer, continue with all other layers and end with the base material (substrate material) as
the last layer.
1. Click New Layer.
The window Definition of Elements New Layer appears.
2. In the area Thickness select an option.
3. In the area Composition select an option.
4. Click Periodic system.
The window Periodic system appears.
5. In the window Periodic system click the element that the layer is composed of.
The element, the percentage and the density are displayed in the lower area of the window Definition of
Elements New Layer.
In case of a complex layer (mixture of materials or alloy) enter more elements and their percentages.
6. Click Elem.+ to transfer the values to the display field.
The values of the entered layer appear in the large display field.
7. Repeat steps 5 to 6 for each element of the current layer.
8. Click OK to finish the value entry for the current layer and to save the data.
The window Definition of Elements New Layer disappears. The values of the layer appear in the large dis-
play field of the window Definition of measuring conditions….
9. Repeat steps 1 to 8 for each layer of the coating system until all layers are entered.
DefMA
Enter the base material (substrate material) like another layer with the following options:
a In the area Thickness check the option The thickness of the layer is fixed (known).
b Check the option Massive (Sat.)
10. Click OK to close the window Definition of measuring conditions….

 You can enter compensation spectra, see Chap. 12.3 on page 99.
 You can create a new product based on the created DefMA.
12.3 Entering Compensation Spectra

By entering compensation spectra you can increase the accuracy of the measurement.
Before you start

 The WinFTM extension SUPER is activated.
 The DefMA is created, see Chap. 12.2 on page 98.
Procedure
1. In the WinFTM main menu select Calibrate > DefMA modify….
The window DefMA modify appears.
3. In the window Definition of measuring conditions… click Compens.Spectra.
The window Spectrum Background appears.
4. You can select one or more of the following options:
 Compensation Elements
In the area Compensation Elements you can enter up to four elements. The entered compensation el-
ements are filtered out of the spectrum. If the relevant element area not shown in the list field, check
full Element list.
Example tin on glass: The glass contains Strontium (Sr) in variable concentration. If you enter Sr as
compensation element, the spectral lines caused by Sr are filtered out. The variable amount of Sr
does not influence the measurement reading.
 Compensation Spectrum
If a suitable compensation spectrum is available, you can activate the option yes in the in the area
Compensation Spectrum and enter a name for the spectrum, e. g. glass or plastics. At a later moment
during the calibration you will be prompted to position the compensation spectrum. The name en-
tered here will then be displayed.
Example tin on glass: The glass causes a scattering spectrum (also referred to as background spec-
trum or base spectrum). If a sample is available that is comparable with the specimen and has no tin
coating, you can enter here glass. At a later moment during the calibration you will be prompted to
position the glass sample. WinFTM measures then the compensation spectrum and takes it into ac-
count when evaluating the spectrum.
 Base Spectrum
If a suitable base spectrum is available, you can activate the option yes in the in the area Compensa-
tion Spectrum and enter a name for the spectrum, e. g. glass or plastics. At a later moment during the
99
DefMA
calibration you will be prompted to position the base spectrum. The name entered here will then be
displayed.
 Background correction
If the theoretical characteristics (measured or calculated) of the compensation spectrum differs
from the actual characteristics, you can reach a correction by using this option. You can choose from
three options: no correction, with supporting points and by polynomial.
5. To close the window Spectrum Background click OK.
6. To close the window Definition of measuring conditions… click OK.

You can create a new product based on the created DefMA, see Chap. 9.2 on page 50.
12.4 Display the Measurement Mode

In the window DefMA there is a field that displays the measurement mode.
Depending on the used DefMA mode (see Table 12-1 on page 97), this field has the name Mode, Analysis
Mode, Thickness Mode, Mass per unit area (relative/absolute), Components‘s Mode or Solution Analysis. The
meaning of the individual symbols is:
c Measurement of the concentration

d Measurement of the coating thickness
g Measurement of the area mass
Capital letters at the beginning of a series of symbols indicate the beginning of the substrate material (base
material).
Example: dCcc
d The coating thickness of the top layer (consisting of one element) is being measured and
Ccc the concentrations of the substrate material, which contains three elements, are being analyzed.

13 Calibration, Normalization and Base Correction
13.1 Normalization
Purpose of the Normalization
A normalization is required in the following situations:
 The technical properties of the instrument's measuring head were modified, e.g., aperture, anode cur-
rent, primary filter, high voltage, ROI, changes in the base material (when base material unknown is
defined), measuring distance.
 During a reference measurement, a deviation was encountered that is greater than two to three times the
standard deviation s. A reference measurement is a measurement on a reference sample with known
properties to check the normalization/calibration of a product.
 A product was imported.
The normalization adapts a measuring application to the current technical properties of the instrument's
measuring head.
During the normalization, the spectra that are defined in the Definition of the Measuring Application (DefMA)
as pure elements and as base material are re-established.
The following data are stored in the software during the normalization:
 The zero point for the coating thickness measurement
 The influence of the base material on the measurement of the coatings
A normalization always refers to a specific measuring application. This means that every measuring applica-
tion must be normalized separately.
Before you start

 The instrument must be at operating temperature before performing the normalization. To get the best
results, start a measurement for 20 minutes by performing the following steps.
 In the course of normalization, you may be asked to perform various measurements. Then note that the
parts are carefully placed and focused.
Procedure
1. Select the product you want to normalize, e.g. the product you just imported. In the WinFTM main menu,
select Product > Select....
The window Select Product appears. Select the product file and click OK.
2. To start the normalization, select Calibrate > Normalize....
The following procedure depends on the measuring application:
Simple measuring application Zn/Fe
 For a simple measuring application, such as
Zn/Fe, everything is calculated automati-
cally, you do not need to do anything else.
Then the window End of normalization. Ac-
cept? will appear.
Click Yes.
101
Calibration, Normalization and Base Correction
 For more complex measuring applications,

e.g. if the base material is an alloy, WinFTM
prompts you to perform different measure-
ments one after the other.
Base material of cal. std. set
 If you are prompted to measure the Base
material of cal. std. set in a standard-free
measuring application (measuring applica-
tion without calibration)
- see picture on the right -, then skip the
step by selecting Measure > Skip in the
menu.
Base material of cal. std. set
Product's base material

 If you are prompted to measure the Prod-
uct's base material, it is mandatory to mea-
sure it, otherwise measurement errors may
occur.
Measure an uncoated part here.
Product's base material
Pure elements
 If you are prompted to measure pure ele-
ments, then use the supplied pure element
plate, see picture on the right. Pure element
calibration standards from Fischer ("Dom-
ino") are also available for certain elements.
 If a pure element is not available, then load
it from the calculated spectra library. To do
so, select Measure > Element from library.

Scatter spectrum (scatt)

 If scatt is displayed, then a scatter spectrum
for light elements (plastic, aluminium or liq-
uids) is defined in the measurement task.
No measurement is required here.
 Load the scatter spectrum by selecting
Tools > Load Spectrum and Evaluate... in the
menu.
 If the scatter spectrum does not load, then
scatt
contact your Fischer representative.
3. When the normalization is finished, then the window End of normalization. Accept? will appear.
4. Click Yes.
The normalization is finished.

 You can now measure with the product standard-free (without calibration).
 If suitable calibration standards are available, then you can calibrate, see Operator’s Manual, chapter
Calibration.
13.2 Base Correction (Substrate Material Correction)
Purpose of the Base Correction

A base correction (also referred to as substrate material correction) is only possible, if the base is an alloy.
A base correction is required whenever the base composition changes from one specimen to the next.
Table 13-1: Explanation of the term base
Au/Ni/(CuSn6)
The Au coating and the Ni coating on bronze shall
be measured.
Measurement mode: d d -
Dual coating
The base is CuSn6
103
Performing a Base Correction

A base correction affects only the current measurement application. All other measurement applications re-
main unaffected.
Before you start

 The instrument must be at operating temperature before performing the base correction.
 Perform the base correction at the same workplace as you will perform the measurements. If you set up
the instrument at another place, perform the base correction at the new place again.
Procedure
1. To start the base correction, select Calibrate > Base correction.
The window Element: Measure product‘s base material appears.
2. Position the base material, then click OK.
13.3 Calibration
Purpose of the Calibration
A calibration is required in the following situations:
 A new measuring application has been set up.
 A product was imported.
 If during a reference measurement (a measurement on a reference sample with known properties) a
deviation was encountered that is greater than two to three times the standard deviation s.
The calibration sets the difference between nominal value and actual value to zero.
 Actual value refers to the reading displayed by the instrument.
 The nominal value is the value engraved on the calibration standard (engraved value).
Calibrating enables secured measurements: If the nominal values of the used standards can be traced to rec-
ognized material measures or reference materials, then the measurement is secured through the calibration.
Depending on the measuring application, it may be difficult to evaluate the result of a calibration in individual
cases. If you have any questions, please contact Fischer via the website www.helmut-fischer.com.
Fischer can carry out a calibration service for you. In this case, you will receive a corresponding sheet with
calculations and implications for evaluating the calibration.

Performing the Calibration

The following is required for a calibration:
Calibration standards Coating thickness and material composition of a calibration standard

are known and have been determined using a very accurate measuring
method.
Base material (substrate materi- Specimen with the coating(s) to be measured.
al) Required only if the base material is not a pure element.
Base material of the calibration Required only if the base material is not a pure element.
standard set (same as in the
definition of the measurement
application, DefMA)
Pure element calibration stan- Required only if the option Measure elements has been enabled in the
dard(s) definition of the measuring application (DefMA), i.e., the spectra library
is not used to compute the pure elements.
Materials to measure the spectra Required only in special cases.
background
Fischer can supply the following calibration standards:
Calibration standard set Consists of a calibration standard set with several calibration standards
(Cal-NS) of a specific coating/base material combination.
Individual calibration standard Individual calibration standard of a certain coating/base material com-
(Cal-N) bination
Calibration foil Calibration foil consisting of a free carrying layer of a certain element.
(Cal-F) Universally usable on many different base materials.
Customer-specific standards
Occasionally, a calibration standard may also be referred to as a calibration normal.


Before you start
 The instrument must be at operating temperature before performing the calibration.
 Perform the calibration at the same workplace as you will perform the measurements. If you set up the
instrument at another place, perform the calibration at the new place again.
105
Procedure
1. In the WinFTM main window select Calibrate > Calibration Standard Set….
An empty window will appear, if

the measuring application has
not yet been calibrated.
If the measuring application has
already been calibrated, check
the values in the window. If the
values are plausible, click OK and
skip the steps 2 to 7
2. Enter a name for the calibration
standard set in the field Label
(e.g., Cr/Ni/Cu Ser. No. 13917).
3. Click Input/Overwrite.
The window Standard No. 1 ap-

pears.
4. Enter the name of the standard
(e. g., AAMGW).
5. Enter the values of the calibration
standard. Click the field three
times in order to enter a value.
The fields have the following meaning:

 Value Nominal value of the calibration standard (in the example coating
thickness d1 (Zn) in μm coating thickness d2 (Ni) in μm, Cu concentra-
tion in %)
 u +/- If an uncertainty for the reference value is stated on the certificate for
the calibration standard, enter this value here. If you do not enter a
value, then the following values will be used: for coating thicknesses,
1% of the coating thickness; for concentrations, 1% absolute.
 Type With multi-coating systems, it may be the case that existing interim
coatings act as base material of a calibration standard or that coat-
ings are not present. This setting is made here.
6. Once you have entered all values of a calibration standard, click OK.

7. To enter additional calibration standards, repeat steps 3 to 6 for every calibration standard. Before you
enter an additional calibration standard, make sure that no line is selected in the window Input Calibr. Std.
Set. Otherwise the values of the selected standard will be changed.
8. Once you have entered all values of a calibration standard, click OK in the window Input Calibr. Std. Set.
The calibration standard set is now entered and stored.
9. To check how many measurements will be performed for each cali-
bration standard, click Info.
The window Modify product ap-

pears.
10. Click the tab Application.
11. Check the following values:

 T_cal (sec): Time for each individual measurement on the calibration standard
 N_cal: Number of individual measurements on each calibration standard
Typically, the default setting applies but you do have the option of changing the values.
The following applies to the measuring time T_cal:
 The longer the measurement, the better the repeatability precision. Do not select a measuring time
that is too short; 30 or 60 seconds is a typical value.
The following rules apply to the number of individual measurements N_cal:
 Pure elements, base materials or scatter spectra need to be measured only once.
 Calibration standards must be measured several times on each standard, at least three times but
typically five times. Perform the measurements at different locations on the calibration standard.
12. To start the calibration, select Calibrate > Calibrate….
WinFTM will prompt you to position the calibration standards in suc-
cession and to measure them.
Example: The calibration standard Cr/Ni/Cu with a coating thickness
of 2.58 μm shall be measured now.
NOTE: To read the full name of the calibration standard, click in the
row and use the arrow keys to scroll back and forth.
107
Depending on the measuring application, different prompts will appear that have the following meaning:
 Scatt A scatter spectrum shall be measured. As a rule, it is already saved in
the software and can be opened automatically from the menu
General > Load Spectrum and Evaluate…. Measure a scatter spectrum
(e.g., plastic) if the spectrum does not exist.
 Element: Ni The pure element Ni from the pure element board shall be measured.
 Base material Cal. Std. Set The base material of the calibration standard set shall be measured.
(Analysis) Example: If you calibrate using the calibration standard set
Ni/Cu alloy, Cu is the base material of the calibration standard set.
 Base material specimen The base material of the real part shall be measured. An uncoated re-
(Analysis) al part must be used for this purpose.
 Base (specimen) The base material of the real part shall be measured. An uncoated re-
al part must be used for this purpose.
 Ni-Zn/Fe 5.0 15.0 0.0 A calibration standard made of NiZn/Fe with a coating thickness of
5 µm and a Ni content of 15 % shall be measured.
13. Position the standard, close the measuring chamber, adjust the focus and click Start.
The instrument will perform the measurement.
After the measurement, you will be prompted either to measure a new standard or to measure the same
standard one more time. If you measure the same standard again, move it slightly to measure it at a dif-
ferent location.

After the last measurement, the

window Input of the calibration
standard set will appear.
1 2 3 1 2 3
14. Ensure that the following conditions are met:

 The values in columns (3) Corr. (corrected values) are consistent with the values in columns (1) Set
(nominal values).
 The values in columns (2) Theor. (standard-free values) deviate from the values in columns
(1) Set (nominal values) by no more than 20 %.
 The values in columns (2) Theor. (standard-free values) should fit logically, i.e., a higher value in col-
umn (2) Theor. (standard-free values) belongs to a higher value in column (1) Set (nominal value).
15. if the conditions are not met, check your settings and repeat the calibration beginning with step 12
16. When the conditions are met, click OK.
The calibration for this measuring application will be activated.
17. To verify the calibration, select Product > Measure Cal. Standards.
The name of the calibration stan-
dard set will appear in the field
Product name with a red back-
ground.
18. Measure the calibration standards as prompted. Measure each standard several times.
19. Verify that the nominal value of the standard is within the range x (mean value) ±2 s (standard deviation
of the re-measurement).
The following table shows some examples:
Nominal value x measured s measured min. value max. value Evaluation
Cr 1.5 μm 1.51 μm 0.03 μm 1.45 μm 1.57 μm OK
Cr 0.77 μm 0.75 μm 0.02 μm 0.68 μm 0.79 μm Not OK
109
The calibration was successful if all re-measurements are within the respective ranges and you are able to
use the measuring application.
If a standard is outside the range, check to see of this measurement range is relevant for your measuring
application. If the measurement range is not relevant for your measuring application, you can still use the
measuring application.
If several re-measurements are outside the range, check the data and potential error sources. Then perform
a new calibration.
For special measuring applications, other conditions may apply for a successful calibration. However, these
will be stated separately.

14 Solution Analysis
For the solution analysis you need a measuring cell. You fill the measuring cell with the solution to be ana-
lyzed, position the measuring cell and perform the measurement.
The measuring cells are available with different reference plates. When selecting the measuring cell, note
that the characteristic x-ray lines of the sample to be measured may not be too close to the x-ray lines of the
reference plate material. Otherwise, problems may arise during the evaluation of the spectrum.
Table 14-1: Accessories for the solution analysis
Order No. Name

603-216 Accessory set for solution analysis Molybdenum: 2 measuring cells (red) with Molybdenum
reference plate, 1 roll of foil
601-564 1 roll of foil
603-215 Measuring cell (red) with clamping ring, with Molybdenum reference plate
603-213 Measuring cell (green) with clamping ring, with Nickel reference plate
603-214 Measuring cell (grey) with clamping ring, with Zirconium reference plate
14.1 Structure of the Measuring Cell
1 Bottom part of measuring cell

2 Edge of cup
3 Cup
4 Reference plate
5 Clamping ring
6 Drip groove
Figure 14-2: Structure of a measuring cell for the solution analysis
14.2 Filling the Measuring Cell
WARNING Corrosive Liquids

The solution to be analyzed can be corrosive and can cause chemical burns.
► Avoid contact of the solution with skin or eyes.
► After skin or eye contact immediately rinse with plenty of water and consult a
physician.
111
Solution Analysis
Before you start

You need the following items to fill a measuring cell:
 Bottom part of measuring cell
 Clamping ring
 Foil
 A pair of scissors
 Sample (liquid)
 Pipette
Procedure
1. Place the measuring cell with the cup side point-

ing upwards in the work area.
2. Fill the cup with the sample. Fill with the maxi-
mum possible amount of liquid, i.e., the surface
of the liquid should be slightly convex.
3. Cut out a piece of the foil. The foil should be cut

such that it has an approximate square shape
and can cover the measuring cell well.
4. Place the foil on the measuring cell.
5. Place the clamping ring over the foil-covered

measuring cell and press it down carefully until
the foil is taught. Avoid:
 Tearing the foil
 Air bubbles
Overflowing liquid is caught in the drip groove.

Solution Analysis
14.3 Positioning the Measuring Cell

Before you start
Before you position the measuring cell you need to fill it, see Chap. 14.2 on Page 111.
Procedure
1. Place the measuring cell into the measuring chamber. Depending on the instrument type, the cup open-
ing must face upwards or downwards:
 Instrument with measuring direction from top to bottom: Cup opening must face upwards.
 Instrument with measuring direction from bottom to top: Cup opening must face downwards.
To make the focusing easier, position the measuring cell such that the measurement beam does not
point to the center, but to the edge curvature of the measuring cell, see the following figure:
2. Adjust the focus of the instrument.

3. Shift the measuring cell carefully such that the measurement beam points to the center of the measuring
cell. Do not readjust the focus. The video image shows the metal reference plate out of focus. This is cor-
rect. To measure correctly, the focus must always be set to the surface of the foil.

14.4 Cleaning the Measuring Cell After Use
WARNING Corrosive Liquids

The solution to be analyzed can be corrosive and can cause chemical burns.
► Avoid contact of the solution with skin or eyes.
► After skin or eye contact immediately rinse with plenty of water and consult a
physician.
Before you start

To clean a measuring cell after use you need water and a paper towel or cleaning rag.
Procedure
1. Place the measuring cell with the cup opening

pointing down on the work area.
113
Solution Analysis
2. Press the clamping ring down to separate the

clamping ring, foil and bottom part. Grab the
clamping ring with the fingers of both hands
such that a uniform pressure is applied to the en-
tire circumference of the ring.
3. Empty the measuring cell.

4. Dispose of the foil and the chemicals. Observe the relevant waste disposal guidelines.
5. Rinse the measuring cell and the clamping ring thoroughly with water.
6. Dry the parts with a paper towel or a clean rag.
14.5 DefMA and Product for the Solution Analysis

Usually you obtain either a product file or a DefMA file for the solution analysis from Fischer.
If you obtain a product file from Fischer, you need to import the product file (see Chap. 14.6 on Page 114). The
product file contains all relevant settings.
If you obtain a DefMA file from Fischer, you need to import the DefMA file (see Chap. 14.7 on Page 115) and
then you need to set up a new product file based on this DefMA file (see Chap. 14.8 on Page 116).
If you have installed the SUPER software, you can create a DefMA for the solution analysis by yourself.
14.6 Importing a Product

If you have received a product file by disk or email from Fischer, you need to import it. The product file name
has the extension *.sav, *.sv1 or *.sv3.
Procedure
1. If you have received the product file by email, save the file in a directory that does not belong to WinFTM,
e.g. C:\temp.
2. If you have received the product file by CD, insert the CD into the CD drive.
3. Optional, if you have installed the WinFTM extension PDM: You can create a new directory for the new
product as follows:
a In the WinFTM main menu, select Product > Select ...
The window Select Product appears.
b Click in the upper right .
4. In the WinFTM main window select Product > Copy to/from File… .
5. Select the tab File >>> Product.
6. Click Select.

Solution Analysis
7. Select the product file and click Open.

8. Optional: In the New No. field, enter a number to be assigned to the new product.
9. Optional, if you have installed the WinFTM extension PDM: Select a folder where the new product will be
saved.
The file will be copied. After this the report The product was copied successfully appears.
11. Click OK.

Before you can perform measurements using the new product, you need to normalize or calibrate the
product.
14.7 Importing a DefMA

If you have received a new Def.MA file from Fischer, you need to import it. The file name has the extension
*.pb0. After this you create a new measurement application and a product based on the imported Def.MA.
Procedure
1. If you have received the Def.MA file by email as a file attachment, save the file in a directory that does not
belong to WinFTM, e.g. C:\temp.
2. If you have received the Def.MA file by CD, insert the CD into the CD drive.
3. In the WinFTM main window select Product > Copy to/from File….
4. Select the tab File >>> Def.MA.
5. Click Select.
The window Select file appears.
6. Select the Def.MA file and click Open.
The file will be copied. After this the report The Def.MA was copied successfully appears.
8. Click OK.
9. To close the window, click Cancel.

You can now create a new product based on the imported Def.MA.
115
Solution Analysis
14.8 Setting up a Product File for the Solution Analysis
Before you start

Before you can set up a product for the solution analysis, a DefMA file for your solution analysis must be
present on the computer.
Procedure
1. In the WinFTM main menu select Product > New….
The window Select an application appears.
2. Click New.
The window Select a DefMA appears.
The window Input of the application name appears.
4. Enter in the field Name an identifier for the new measurement application and click OK.
If your instrument is equipped with changeable apertures (collimators), the window Select collim. + meas.
dist. appears. Select the standard collimator No. 2 and click OK.
The window Input Calibr. Std. Set appears.
5. Do not enter anything in this window and click OK.
6. If your are prompted to measure scatt, do not perform a measurement, but perform the following steps
instead:
a In the WinFTM main menu select Tools > Load Spectrum and Evaluate….
b If the window Open appears, select the file scatt and click Open.
The window End of calibration. Accept? appears.
7. Click Yes.
The window Create new product appears.
8. Enter a name, directory and number for the new product and click OK.
9. To check the measurement time and the number of measurements click Info.
10. Click the tab Product.
11. Check the values for the measurement time and the number of measurements. Change the values, if nec-
essary.
The longer the measurement time, the better the repeatability precision. Do not select a measuring time
that is too short; 30 or 60 seconds is a typical value.
12. Click OK.
The new product file is set up and the related measurement application is normalized.

You can now perform standard free measurements.
You can also calibrate your measurement application. Use a sample of your electrolyte solution, which was
externally analyzed. Do not make up a solution for calibration.

Solution Analysis
14.9 Setting up a DefMA for the Solution Analysis by yourself

If you have installed the SUPER software, you can create a DefMA for the solution analysis by yourself.
Structure of a DefMA for the Solution Analysis

The typical structure of a DefMA for the solution analysis is as follows:
 Coating 1: Elements in the sample
 Spectral background: Typically, the background spectrum is named with a brief designation such as scatt
or similar. The spectrum background is included with the shipment as a file.
Other typical brief designations of the background spectrum for a Fischer DefMA may be streu or wasser-
dummy, for example.
The DefMA window for the Solution Analysis

There is a special DefMA window that is particularly suited for setting up DefMAs for the solution analysis.
The range of functions of this window is reduced to the specific functions needed for solution analysis. The
window is only accessible, if the SUPER software is installed.
► To open the window, select in the WinFTM main menu Calibrate > DefMA new… > Solution analysis.
The DefMA dialog for the solution analysis differs from the standard DefMA window in the following features:
 Only the layer with the sample material (the solution to be analyzed) must be entered. Only a maximum
of one layer can be entered.
 Oxygen must not be entered in the DefMA. Oxygen is automatically taken into account when calculating
the results of the analysis. The DefMA display window does not explicitly display the symbol O.
 Background spectra and compensation spectra are entered in the same manner as with the typical
DefMA definition.
 The material of the reference plate of the measuring cell for the solution analysis is defined using the list
field at the lower left of the window. The default setting is Mo.
 The DefMA display window does not explicitly display the material of the reference plate.
 You cannot switch to the calibration standard set of the product and cannot modify it.
 A maximum of 22 elements can be written into the analysis task (excluding the material of the reference
plate and oxygen).
NOTE: You can set up more complex DefMAs for solution analyses using the standard DefMA window. How-
ever, doing so requires more background knowledge and greater diligence.
117
Solution Analysis

15 Measurement Data Export
You can export the measured values, their XYZ coordinates, statistical evaluations and other data to other
applications like spreadsheets, statistical evaluation tools or process control systems.
All settings for the measurement data export are assigned to one product. For each product, you can define
different settings for the data export.
Basically there are two modes for exporting measurement data: online export and export on demand.
Table 15-1: The two modes for exporting measurement data
Export mode Explanation

Online Export The measurement data (single readings, block statistics and header) is exported
continuously when measurement data is acquired by the instrument.
Export on demand The measurement data (single readings, block statistics and header) will be export-
ed, when you start the export by using the evaluation dialog, after the measure-
ments are performed.
15.1 Starting the Measurement Data Export

A simple data export in the Export on demand mode is described here to explain the basics of data export.
Before you start

For the data export you need an export template that defines, which data will be exported and their format.
For a quick start you can use the simple export template, which comes with the WinFTM installation. But you
do have the option to setup your own export template according to your needs, see Chap. 15.3 on page 122.
Procedure
1. To define the export settings, select in the WinFTM main menu Evaluation > Export > Export Setup….
The window Exporting Data appears.
119
Measurement Data Export
2. In the window Exporting data select the following options:
a Do not check Online-Export ON.

b Press the button Select…, which is located besides the fields Template: and No. Select the export tem-
plate, e. g. default.
c Click overwrite file.
d Press the button Select…, which is located besides the fields Destination file:. Enter a path and a file
name e. g. #002.exp.
e Click OK.
3. To start the data export, select in the WinFTM main menu Evaluation > Evaluate All Blocks….
The window Evaluation appears.
4. In the window Evaluation select the blocks, whose data shall be exported and click Export.
The data will be exported.
5. Click OK.

You can open the file with a spreadsheet tool and check, whether the data has been exported correctly.

15.2 Export Settings

Each product has its own data export settings, i. e., the export settings in this dialog window apply only to the
current Product.
► To open the window Exporting Data, select in the WinFTM main menu Evaluation > Export > Export Setup….
Table 15-2: Explanation of the controls of the Exporting data window
Control Explanation
Online-Export ON The measurement data is exported continuously when measurement data is ac-
quired by the instrument.
 The reading is exported directly after a measurement is made.
 The block statistics are exported upon block closure.
 With product selection, the header is exported.
Template and No. The name and the number of the export template are displayed if an export tem-
plate is assigned to the current Product.
► To assign an export template, click Select….
Deletes the assignment of an export template to the product.
Export destination
append to file Data is successively written to a file.
Complete file-hand- WinFTM waits until the handshake file NET_EXPT.END is deleted. This control box
shake (NET_EXPT.END) should be enabled only, if the technology of the target computer is capable of han-
dling it.
overwrite file The export file contains only the last exported values, i. e. the old data will be over-
written.
Destination file Displays the destination file, if already assigned.
► To assign a destination file for the data export, click Select….
Filename variable By clicking the list box you can select a rule, how the file name of the exported data
will be created.
send to serial port Data is sent directly to the RS232 interface.
The parameters of the RS232 interface and of the WinFTM software of the receiv-
ing instrument must be the same. Otherwise the receiving instrument will not be
able to read the data exported via the RS232 interface.
► To set the parameters of the RS232 interface select
Evaluation > Export > Define export interface….
to OLE-Automation WinFTM can be remote controlled via OLE and can transfer data via OLE. A Visual-
Basic (Version 6) program example is included on the WinFTM installation CD in the
directory Service\OLE_Import_Sample_VisualBasic_6.0\AutomationDemo. This sam-
ple program can be used as a template for the customers own remote control soft-
ware.
121
Control Explanation
to Excel The data will be directly sent to an Excel file.
A new Excel workbook (Workbook 1) opens with the first exported value. Even if Ex-
cel is already opened, a new workbook will open with the first exported value. In
the field Startposition Column Row enter the cell, where the table shall start, e.g. C4.
@TAB must be inserted in the export template as column separators. In addition, a
period (.) and not a comma (,) must be selected as the decimal character. Depend-
ing on the country setting, Excel might still display the comma (,) as the decimal
separator character. At the end, the Excel workbook (Workbook 1) must be saved.
► Do not close Excel as long as WinFTM is still open.
to OPC-DA1..3 For the connection of the PC to a programmable logic control via Profibus, Profinet
to TCP-IP For the connection of the PC via TCP/IP
15.3 Setting up an Export Template

The format in which measurement data and other data is written to a file during data export is specified in an
export template. With the export template you control, which data is exported and the layout, into which the
data is exported.
An export template can be assigned to one or several products. For each product you can set up a specific
export template.
Procedure
Do one of the following:
 To create a new export template select Evaluation > Export > new template.
The window New export template appears.
In the field Name enter a name for the new export template and click OK.
 To modify an existing export template select Evaluation > Export > modify template.
The window Select export template appears.
Select the template you want to change and click OK.

The window Definition of Export Template appears.
The three sub-windows on the left define the different sections of data to be exported: single readings, block
statistics and header info. With the check boxes in the area Export Mode you can activate or deactivate the
sections.
In the figure above only Single reading is checked, that is, only the section for single readings is exported, the
code in the other sub-windows will be ignored.
Table 15-3: The meaning of the sub-windows for Online Export and Export on demand
Input field Online Export Export on demand

Template for A single reading is exported after every mea- All single readings of the selected blocks are
single read- surement, if the Single reading export mode exported, if the Single reading export mode is
ings is enabled. enabled.
Template for Block statistics are exported, when a block is Block statistics of the selected blocks are ex-
block statis- closed (automatically or manually) and if the ported, if the Block statistics export mode is
tics Block statistics export mode is enabled. enabled.
Header ex- The header is exported, when a product is The header of the current Product is export-
port mask retrieved and if the Header export mode is ed, if the Header export mode is enabled.
enabled.
The sub-window on the right shows all variables with a short explanation.
123
To add a variable to your template

1. Set the cursor to the position in your template, where the variable shall be inserted.
2. Highlight the variable in the window at the right.
3. Click .
15.4 The syntax of the default template

To explain the general principle for setting up an export template and the effect of the variables, the syntax of
the default export template is described in this section.
The default export template consists of three parts:
 Template for single readings
 Template for block statistics
 Template for block statistics
General rules for export templates:
 An export template can have any chosen length.
 An export template must be defined in one row. Carriage returns and line feeds must be entered by using
the variables @CRX and @LFX, not by pressing the enter key.
Template for single readings

Syntax:
@NBR@TAB@PRF@TAB@VA1@TAB@VA2@TAB@VA3@TAB … @VA20@CRX@LFX@END
In the window Definition of Export Template the template must be written in one line to
 avoid unwanted carriage returns and line feeds.
Table 15-4: Explanation of the elements

Variable Explanation
@NBR Contains the number of the reading
@TAB A tabulator will be inserted.
@PRF Contains the name of the operator
@VA Contains the value of the reading, must always be supplemented with the number of the
respective reading, e. g. @VA1
@CRX A carriage return will be inserted.
@LFX A line feed will be inserted.
@END Ends the template

Template for block statistics

Syntax:
Block #@TAB@BLK@TAB@ANB@TAB@LOT@TAB@BM1@TAB@BM2@CRX@LFX
x = @TAB@TAB@MW1@TAB@MW2@TAB@MW3 … MW20@CRX@LFX
s = @TAB@TAB@S_1@TAB@S_2@TAB@S_3 … S_20@LFX@LFX@END
For more clarity the syntax is shown here in three lines. In the window Definition of Ex-
 port Template the template must be written in one line to avoid unwanted carriage re-
turns and line feeds.
Block # The text Block # will be displayed.
@BLK Contains the number of the block
@ANB Contains the value of the field Order No.
@LOT Contains the value of the field Lot No.
@BM1 Contains the value of the field Label 1.
@BM2 Contains the value of the field Label 2.
x= The text x = will be displayed.
@MW Contains the mean value, must always be supplemented with the number of the respective
reading, e. g. @MW1
s= The text s = will be displayed.
@S_ Contains the standard deviation, must always be supplemented with the number of the re-
spective reading, e. g. @S_1
125
Header export mask

Syntax:
@CAL@TAB#@TAB@PRN@CRX@LFX@LFX
#@TABOperator@TAB@EL1 @DM1@TAB@EL2 @DM2@TAB@EL3 @DM3 …
@EL20 @DM20@LFX@LFX@END
For more clarity the syntax is shown here in three lines. In the window Definition of Ex-
 port Template the template must be written in one line to avoid unwanted carriage re-
turns and line feeds.
@CAL Contains the product name.
# The character # will be displayed.
@PRN Contains the product number.
Operator The text Operator will be inserted.
@EL Contains the name of the result channel (element, coating thickness, ppm etc.), must al-
ways be supplemented with the number of the respective channel, e. g. @EL1
@DM Contains the unit of the result channel (mils, nm, % etc.), must always be supplemented
with the number of the respective channel, e. g. @DM1

16 Cleaning and Maintenance
With a service contract you get highest security and reliability. Therefore please contact your Fischer repre-
sentative.
16.1 Cleaning the Instrument
DANGER Line voltage

Contact to line voltage can lead to death or serious injuries.
► Disconnect the instrument from the line voltage, before you start to clean the
instrument.

The instrument can be destroyed, if you clean the instrument improperly or with ag-
gressive cleaning agents or if the instrument is exposed to fluids.
► Do not pour liquid over the instrument. Do not immerse the instrument in liquids.

► Use only gentle cleaning agents. Never use alcohol or similarly aggressive
substances.
► Use a soft brush to clean the measuring chamber. Never use a vacuum cleaner to
clean the measuring chamber.
► Clean the instrument with a damp cloth gently. For stubborn dirt use a small
amount of dishwashing detergent.
16.2 Never Clean Calibration Standards!
ATTENTION Measurement errors

The calibration standards are very sensitive to abrasion. The coating thickness of cali-
 bration standards can be changed, if the standards are cleaned. This can lead to mea-
surement errors.
► Never clean calibration standards.
16.3 Cleaning the Air Filter

The air filter of the cooling fan must be cleaned or replaced from time to time. Clean the air filter or remove
it when it is plugged up by dust or when the cooling fan noise gets louder.
DANGER Line voltage

Contact to line voltage can lead to death or serious injuries.
► Disconnect the instrument from the line voltage, before you start cleaning the air
filter.
127
Cleaning and Maintenance
To clean the air filter
Rotary knob
Cover caps of the

bolts
Figure 16-1: Side and rear view of the instrument
1. Remove the cap of the rotary knob.

2. Using a M10 nut wrench, loosen the nut of the rotary knob. Do not remove the nut completely.
3. Remove the rotary knob from the instrument.
4. Remove both cover caps of the bolts.
5. Behind the cover caps you will find the two bolts that attach the side cover
6. Loosen both bolts using a 4 mm Allen wrench. Make sure that the bolts do not fall into the instrument.
7. Push the side cover forward in the direction of the arrow in Fig. 16-1.
8. Remove the side cover and lay it down as shown in Fig. 16-2
9. Using a M7 nut wrench, loosen the nuts that hold the frame of the filter foam pad, see Fig. Fig. 16-3. Do
not remove the nuts completely.
M7
Figure 16-2: Side cover with filter foam pad
10. Slide the filter foam pad to the right as shown in the direction of the arrow in Fig. 16-2.
11. Depending on the degree of dirt, blow out the pad with compressed air or clean it with a mild liquid deter-
gent.
If the filter foam pad can no longer be used, replace it.

Dry the cleaned filter foam pad at ambient temperature. Put the filter foam pad back into place only as
soon it is completely dry.
12. Mount the side cover in reverse order.
16.4 Preparing the Instrument for Transport

Transporting the instrument without mounted shipping lock and in containers other
than the original shipping container can destroy the instrument and will invalidate any
 warranty claims.
► Before transporting the instrument, re-install the shipping lock.
► Transport the instrument in the original shipping container. If you no longer have
access to the original shipping container, rent a container from Fischer.
Procedure
1. Switch off the instrument, disconnect and remove all electrical connections.
2. Open the cover of the measurement chamber and re-install the shipping lock made of foam.
3. Remove the key for turning on the x-ray energy and place it in the case with the accessories.
4. Store the instrument in its original shipping container. If you no longer have access to the original ship-
ping container, rent a container from Fischer.
16.5 Troubleshooting
Error Possible cause Solution

No display on the monitor The computer is not turned on. Turn the computer on.
The monitor is not turned on. Turn the monitor on.
Specimen not visible in the The specimen lighting is too bright Change the brightness using the
video image or too dark. slide control at the bottom left in the
video image.
The specimen is not positioned Position the specimen properly (see
properly. Chap. 5 on page 27).
The communication between instru- Enable the communication between
ment and WinFTM is disabled. instrument and WinFTM (see
Chap. 4.7 on page 26).
Software crash Switch off the WinFTM software, PC
and the instrument and then on
again.
Instrument does not turn on The instrument is not connected to Turn the instrument off and plug it
when switching on the main line power. into a line socket.
switch
Printer prints garbage Wrong printer driver installed Install the correct printer driver.
129
Error Possible cause Solution

No printout The printer is switched off. Switch on the printer.
The printer is not properly connect- Check the connection between print-
ed to the computer. er and computer.
CONTROL LED flashes The cover of the measurement Close the cover of the measurement
chamber is not fully closed. chamber completely.
Wrong measurement data The selected product file does not fit Select or set up appropriate product
the specimen. file for the specimen.
Bad calibration Perform calibration correctly (see
Chap. 13 on page 101).
Instead of a measurement The communication between instru- Enable the communication between
reading, the window Open ment and WinFTM is disabled. instrument and WinFTM (see
appears after a measurement Chap. 4.7 on page 26).
has been started
Communication between in- The instrument is not correctly con- Check and correct the connection
strument and WinFTM cannot nected to the computer. between instrument and computer
be established (see Chap. 4.3 on page 23), switch
the instrument off and on.
A menu or menu option does The short menu is turned on. Turn on the long menu by selecting
not appear in the menu bar General > full menu (requires pass-
word).
Menu options to edit DefMA The WinFTM extension SUPER is not If you already have the WinFTM ex-
files are grayed out and can- active. tension SUPER, shut down WinFTM,
not be selected plug the SUPER FISIM dongle and
start WinFTM again.
If you not yet own the WinFTM exten-
sion SUPER, contact your Fischer
representative.

17 Description of the Characteristic Statistical
Parameters
17.1 Block Result
Parameter Description Equation

Mean value x Mean value of the single readings, called
arithmetic mean value x . The arithmetic
mean value is the summation of all single
readings x i of a measurement series n
1
(block/group), divided by the number of x = n---  xi
measurements n. i =1
xi : Single readings
n: Number of measurements per block
Confidence inter- Each measurement device produces ran- q is calculated according to the equation
val q dom measurement errors. With a certain below assuming a normal distribution for a
probability (confidence level), the true val- confidence level of 95 %:
ue  of the measured parameter lies in an
s
interval (double-sided confidence interval) q = t f ;1 – 0025 -------
around the measured mean value x of a n
measurement series (block/group). The
borders of this interval are at a distance q t: Quantile of the Student’s t-distribu-
from the true value  . tion (Student’s factor), can be ob-
tained from tables in common publi-
x–qx+q
cations [1]
s: Standard deviation
n: Number of the measurements per
block
Standard The standard deviation is a measure of the
n
deviation s dispersion of the single readings of a mea- 1 - 2
surement series about the mean value. s = -----------   x – xi 
n–1
i=1
x: Mean value of the block

xi : Single readings
n: Number of measurements per block
131
Description of the Characteristic Statistical Parameters

Coefficient of Ratio of the standard deviation to the mean
variation V [%] value
s
V = -- 100
x
For sufficiently large samples it can be
said:
V = 
---

: Standard deviation
: Mean value
Range R Difference between the maximum and the
minimum values of the block R = x max – x min
x max : Highest reading of the block

x min : Lowest reading of the block
Range Rp [%] Range relating to the mean value
R
R p = --- 100
x
R: Range in percent
n (< LSL) Number of measurements that are below Specification limits (USL, LSL) can be en-
the lower specification limit tered in the menu Evaluation > Final evalua-
tion…, tab SPC, button Parameter.
n (> USL) Number of measurements that are above
the upper specification limit
[1] Graf, Henning, Stange und Wilrich: Formeln der angewandten mathematischen Statistik (Equations in
Applied Mathematical Statistics); Springer Verlag (Springer Publishing Company)

17.2 Final Result – Fixed Block Definition

Automatic block creation (Block definition fix) is enabled for the application.

Mean value x Mean value of the block mean values. x is
n Bl
the summation of all block mean values x i 1
of a measurement series, divided by the x = -------  x i
n Bl i = 1
number of blocks n Bl
xi : Block mean values
n Bl : Number of blocks
Confidence Each measurement device produces ran- q is calculated according to the equation
interval q dom measurement errors. With a certain below assuming a normal distribution for a
s
interval (double-sided confidence interval) q = t f ;1 – 0025 ------------
around the measured mean value x of a n Bl
borders of this interval are at a distance q
from the true value  . t: Quantile of the Student’s t-distribu-
tion (Student’s factor), can be ob-
x–qx+q tained from tables in common publi-
cations [1]
s: Standard deviation of the block
mean values
n Bl
1
----------------
2
s =   x – xi 
n Bl – 1
i=1
n Bl : Numbers of blocks
x: Mean value of the block mean val-
ues
xi : Block mean values
Mean standard The mean standard deviation is a measure
n Bl
deviation s of the dispersion of the individual block 1
standard deviations of a measurement se- s = -------  si
n Bl
ries about their common mean value x . i =1
si : Standard deviations of the blocks

133

Coefficient of Standard deviation referring to the mean
s
V = -- 100
xx
s : Mean standard deviation

ues
Mean rangesR Mean range of the block ranges
n Bl
1
R = -------  R i
n Bl i =1
sR i : Ranges of the blocks

Mean range Mean range referring to the mean value
R
sR p [%] R p = --- 100
xx
R: Mean range of the block ranges
ues
LSL Lower specification limit Specification limits (USL, LSL) can be en-
tered in the menu Evaluation > Final evalua-
USL Upper specification limit tion…, tab SPC, button Parameter.


Cp Process capability index
Computed and displayed only if
specification limits are enabled
USL – LSL-
C p = --------------------------
6̂
USL: Upper specification limit

LSL: Lower specification limit
̂ : Estimated value for the mean stan-
dard deviation s
n Bl
1
̂ = -------  s i2
n Bl
i =1
si: Standard deviations of the blocks
Cpk Process capability index C pk = Min  C pu ,C po 
Computed and displayed only if
specification limits are enabled
x – LSL
C pu = ------------------
-
3̂
USL – x-
C po = -------------------
3̂
USL: Upper specification limit

LSL: Lower specification limit
̂ : Estimated value for the mean stan-
dard deviation s
n Bl
1
̂ = -------  s i2
n Bl
i =1
si: Standard deviations of the blocks
135

Blocks (< LSL) Number of block mean values that are be-
low the lower specification limit LSL
Blocks (< LSL) Number of block mean values that are be-
[%] low the lower specification limit LSL in
percent Displayed only if specification limits are
Blocks (> USL) Number of block mean values that are enabled
above the upper specification limit USL
Blocks (> USL) Number of block mean values that are
[%] above the upper specification limit USL in
percent

17.3 Final Result – Variable Block Definition

Manual block creation (Block definition variable) is enabled for the application.

Mean value x Arithmetic mean value of the single read-
ings
n
1
x = n---  xi
i =1
xi : Single readings of the selected

blocks
n: Number of measurements of the se-
lected blocks
Confidence inter- Each measurement device produces ran- q is calculated according to the equation
val q dom measurement errors. With a certain below assuming a normal distribution for a
s
interval (double-sided confidence interval) q = t f ;1 – 0025 -------
around the measured mean value x of a n
borders of this interval are at a distance q t: Quantile of the Student’s t-distribu-
from the true value  . tion (Student’s factor), can be ob-
x–qx+q tained from tables in common publi-
cations [1]
n: Number of measurements of the se-
lected blocks
Standard The standard deviation is a measure of the
n
deviation s dispersion of the single readings of a mea- 1 - 2
surement series about the mean value. s = -----------   x – xi 
n–1
i=1
x: Mean value of the single readings of

the selected blocks
xi : Single readings of the selected
blocks
n: Number of measurements
137

Coefficient of Standard deviation relating to the mean
s
V = -- 100
x
the selected blocks
Range R Difference between the highest and the
lowest reading of the selected blocks R = x max – x min
x max : Highest reading of the selected

blocks
x min : Lowest reading of the selected
blocks
Range Rp [%] Range relating to the mean value
R
R p = --- 100
x
R: Range
the selected blocks
LSL Lower Specification Limit Specification limits (USL, LSL) can be en-
tered in the menu
USL Upper Specification Limit Evaluation > Final evaluation…, tab SPC,
button Parameter.


̂ Estimated standard deviation of the popu-
lations ̂ = s I2 + s II
2
sI: Arithmetic mean value of the stan-

dard deviation of the blocks
sII: Standard deviation of the mean val-
ues
sI Arithmetic mean value of the standard de-
viations of the blocks
1 m
s I = ----  s i
m i =1
m: Number of blocks
si: Standard deviation of the block i
sII Standard deviation of the mean values
1 - m 2
s II = ------------   xi – x 
m–1
i=1
m: Number of blocks
xi : Mean value of the block i
ues
n (> USL) Number of measurements that are above
the upper specification limit USL
n (> USL) [%] Number of measurements that are above
the upper specification limit USL in per-
cent Displayed only if specification limits are
enabled
n (< UGW) Number of measurements that are below
the lower specification limit LSL
n (> UGW) [%] Number of measurements that are below
the lower specification limit LSL in percent
139
140
17.4
1 1.01 Periodic table of the Elements X-Ray Properties 2 4.00
Hydrogen Helium
H He
3 6.94 4 9,01 Atomic Number 79 197,0 Atomic weight 5 10.81 6 12.01 7 14.01 8 15.99 9 18.99 10 20.18
Lithium Berylium Gold Name ( IUPAC ) GAS LIQUID SOLID Boron Carbon Nitrogen Oxygen Fluorine Neon
Li Be Au B C N O F Ne
0,05 0,11 K-alpha 68,79 9,71 L-alpha 0,19 0,28 0,39 0,52 0,68 0,85
K-beta 77,97 11,44 L-beta
M-alpha 2,12 13,38 L-gamma
11 22.99 12 24.31 13 26.98 14 28,09 15 30,97 16 32,07 17 35,45 18 39,95
Sodium Magnesium Aluminium Silicon Phosphorus Sulfur Chlorine Argon
Na Mg Al Si P S Cl Ar
1,04 1,25 1,49 1,74 2,02 2,31 2,62 2,96
1,55 1,84 2,14 2,46 2,82 3,19
19 39,10 20 40,08 21 44,96 22 47,88 23 50,94 24 52,00 25 54,94 26 55,85 27 58,93 28 58,69 29 63,55 30 65,39 31 69,72 32 72,61 33 74,92 34 78,96 35 79,90 36 79,90
Potassium Calcium Scandium Titanium Vanadium Chromium Manganese Iron Cobalt Nickel Copper Zinc Gallium Germanium Arsenic Selenium Bromine Krypton
K Ca Sc Ti V Cr Mn Fe Co Ni Cu Zn Ga Ge As Se Br Kr
3,31 3,69 4,09 4,51 4,95 5,41 5,90 6,40 6,93 7,48 8,05 8,64 1,01 9,25 1,10 9,89 1,19 10,54 1,28 11,22 1,38 11,92 1,48 12,65 1,59
3,59 4,01 4,46 4,93 5,43 5,95 6,49 7,06 7,65 8,26 8,90 9,57 1,03 10,26 1,12 10,98 1,21 11,73 1,32 12,50 1,52 13,29 1,53 14,11 1,64
37 85,47 38 87,62 39 88,91 40 91,22 41 92,91 42 95,94 43 97,91 44 101,1 45 102,9 46 106,4 47 107,9 48 112,4 49 114,8 50 118,7 51 121,8 52 127,6 53 126,9 54 131,3
Rubidium Strontium Yttrium Zirconium Niobium Molybdenum Technetium Ruthenium Rhodium Palladium Silver Cadmium Indium Tin Antimony Tellurium Iodine Xenon
Rb Sr Y Zr Nb Mo Tc Ru Rh Pd Ag Cd In Sn Sb Te I Xe
13,39 1,69 14,16 1,81 14,96 1,92 15,77 2,04 16,61 2,17 17,48 2,29 18,41 2,42 19,28 2,56 20,21 2,70 21,18 2,84 22,16 2,98 23,17 3,13 24,21 3,29 25,27 3,44 26,36 3,61 27,47 3,77 28,61 3,94 29,80 4,11
14,96 1,75 15,83 1,87 16,74 2,00 17,67 2,12 18,62 2,26 19,61 2,40 20,59 2,54 21,66 2,68 22,72 2,83 23,82 2,99 24,94 3,15 26,09 3,32 27,27 3,49 28,48 3,66 29,72 3,84 30,99 4,03 32,29 4,22 33,64 4,42
2,30 2,46 2,62 2,79 2,96 3,14 3,33 3,52 3,72 3,92 4,13 4,35 4,57 4,80 5,04
55 132,9 56 137,3 72 178,5 73 181,0 74 183,9 75 186,2 76 190,2 77 192,2 78 195,1 79 197,0 80 200,6 81 204,4 82 207,2 83 209,0 84 209,0 85 210,0 86 222,0
Periodic Table of the Elements with X-Ray Properties
Caesium Barium Hafnium Tantalum Tungsten Rhenium Osmium Iridium Platinum Gold Mercury Thallium Lead Bismuth Polonium Astatine Radon
Cs Ba 57-71 Hf Ta W Re Os Ir Pt Au Hg Tl Pb Bi Po At Rn
30,97 4,29 32,19 4,47 Lanthanides 55,76 7,90 57,52 8,15 59,31 8,40 61,13 8,65 62,99 8,91 64,89 9,19 66,82 9,44 68,79 9,71 70,82 9,99 72,86 10,27 74,96 10,55 77,10 10,84 79,30 11,13 81,53 11,42 83,80 11,72
34,98 4,62 36,38 4,83 63,21 9,02 65,21 9,34 67,23 9,67 69,30 10,01 71,40 10,35 73,54 10,71 75,74 11,07 77,97 11,44 80,26 11,82 82,56 12,21 84,92 12,61 87,34 13,02 89,81 13,44 92,32 13,87 94,88 14,32
5,28 5,53 1,65 10,51 1,71 10,89 1,78 11,28 1,84 11,68 1,91 12,09 1,98 12,51 2,05 12,94 2,12 13,38 2,20 13,83 2,27 14,29 2,35 14,76 2,42 15,24 15,74 16,25 16,77
87 223,0 88 226,0 89 227,0 90 232,0 91 231,0 92 238,0 93 237,1 94 244,1 95 243,1 96 247,1 97 247,1 98 251,1 99 252,1 100 257,1 101 258,1 102 259,1 103 260,1 104 261,1
Francium Radium Acitinium Thorium Protactinium Uranium Neptunium Plutonium Americium Curium Berkelium Californium Einsteinium Fermium Mendelevium Nobelium Lawrencium Rutherford.
Fr Ra Ac Th Pa U Np Pu Am Cm Bk Cf Es Fm Md No Lr Rf
86,12 12,03 88,49 12,34 90,89 12,65 93,33 12,97 95,85 13,29 98,43 13,61 101,0 13,95 103,7 14,28 106,4 14,62 109,1 14,96 111,9 15,31 114,7 15,66 117,7 16,02 120,6 16,38
97,48 14,77 100,1 15,23 102,9 15,71 105,6 16,20 108,4 16,70 111,3 17,22 114,9 17,74 117,2 18,28 120,2 18,83 123,2 19,39 126,4 19,97 129,5 20,56 132,8 21,17 136,1 21,79
17,30 17,85 18,41 3,0 18,98 3,08 19,56 3,17 20,16 3,26 20,78 3,35 21,42 22,07
57 138,9 58 140,1 59 140,9 60 144,2 61 144,9 62 150,4 63 152,0 64 157,3 65 158,9 66 162,5 67 164,9 68 167,3 69 168,9 70 173,0 71 175,0
Lanthanum Cerium Praseodym. Neodymium Promethium Samarium Europium Gadolinium Terbium Dysprosium Holmium Erbium Thulium Ytterbium Lutetium
57-71 La Ce Pr Nd Pm Sm Eu Gd Tb Dy Ho Er Tm Yb Lu
Lanthanides 33,44 4,65 34,72 4,84 36,02 5,03 37,36 5,23 38,65 5,43 40,12 5,64 41,53 5,85 42,98 6,06 44,47 6,28 45,99 6,50 47,53 6,72 49,10 6,95 50,73 7,18 52,36 7,41 54,06 7,65
37,80 5,04 39,26 5,26 40,75 5,49 42,27 5,72 43,95 5,96 45,40 6,21 47,03 6,46 48,72 6,71 50,39 6,98 52,18 7,25 53,93 7,53 55,69 7,81 57,58 8,10 59,35 8,40 61,28 8,71
0,83 5,79 0,88 6,05 0,93 6,32 0,98 6,60 6,89 1,08 7,18 1,13 7,48 1,19 7,79 1,24 8,10 1,29 8,42 1,35 8,75 1,41 9,09 1,46 9,42 1,52 9,78 1,58 10,14
FISCHERSCOPE® X-RAY
Data Sheet
Cost-effective entry-level X-Ray Fluorescence Measuring Instrument for

fast and non-destructive Analysis and Coating Thickness Measurement of
Gold and Silver Alloys
Main Features
The FISCHERSCOPE X-RAY XAN 215 is the cost-effective entry-level X-ray fluo-
rescence measuring instrument for non-destructive analysis of jewelry, coins
and precious metals.
It is particularly suited for the analysis of precious metals and their alloys in
composition and coating thickness. Up to 24 elements can be determined simul-
taneously.
Typical fields of application are the analysis of:
 Jewelry, precious metals and dental alloys
 Yellow and white gold
 Platinum and silver
 Rhodium
 Alloys and coatings
 Multi layer coatings
Outstanding accuracy and long-term stability are characteristics of all
FISCHERSCOPE X-RAY systems. The necessity of recalibration is dramatically
reduced, saving time and effort.
The modern silicon PIN detector achieves high accuracy and good detection
sensitivity.
The fundamental parameter method by Fischer allows for the analysis of solid
and liquid specimens as well as coating systems without calibration.
Design
The XAN 215 is designed as a user-friendly bench-top instrument.
Specimen positioning is quick and easy. The X-ray source and semiconductor
detector assembly is located in the instrument‘s lower chamber, so that the
measuring direction is from underneath the sample, which is supported by a
transparent window.
The integrated video-microscope with zoom and crosshairs simplifies sample
placement and allows precise measuring spot adjustment.
The entire operation and evaluation of measurements as well as the clear pre-
sentation of measurement data is performed on a PC, using the powerful and
user-friendly WinFTM® software.
The FISCHERSCOPE X-RAY XAN 215 fulfills DIN ISO 3497 and ASTM B 568. It is a
fully protected instrument with type approval according to German radiation
protection law.
142
General Specification
Intended use Energy dispersive X-ray measuring instrument (EDXRF) to analyze precious
metals and their alloys in composition and coating thickness.
Repeatability ≤ 1 ‰ for gold, measurement time 60 sec
Design Bench top unit with upwards opening hood
Measurement direction Bottom up
X-Ray Source
X-ray tube Tungsten tube, thermally stabilized
High voltage Three steps: 30 kV, 40 kV, 50 kV, max. anode current: 1 mA
Aperture (Collimator) Ø 1 mm (39 mils), optional Ø 2 mm (79 mils)
Measurement spot size Ø 1.2 mm (47 mils) with aperture Ø 1 mm (39 mils) and flat lying sample
(measurement distance 0 mm)
X-Ray Detection
X-ray detector Silicon PIN detector with peltier cooling
Element range Sulfur S (16) to Uranium U (92) – up to 24 elements simultaneously
Resolution (fwhm for Mn-Kα) ≤ 180 eV
Measuring distance 0 … 25 mm (0 … 1 in)
Distance compensation with patented DCM method for simplified measure-
ments at varying distances. For particular applications or for higher demands
on accuracy an additional calibration might be necessary.
Sample Alignment
Sample positioning Manually
Video microscope High-resolution CCD color camera for optical monitoring of the measurement
location along the primary beam axis, Crosshairs with a calibrated scale (ruler)
and spot-indicator, Adjustable LED illumination, Laser pointer (class 1) to sup-
port accurate specimen placement
Zoom factor Digital 1x, 2x, 3x, 4x
Sample Stage
Design Fixed sample support
Usable sample placement
area 310 x 320 mm (12.2 x 12.6 in)
Max. sample weight 13 kg (29 lb)
Max. sample height 90 mm (3.5 in)
143
Electrical Data
Power supply AC 100 – 240 V ±10 % / 50 – 60 Hz max. 120 VA, without evaluation PC
Protection class IP40
Dimensions
External dimensions Width x depth x height [mm]: 403 x 588 x 365 mm, [in]: 15.9 x 23.1 x 14.4
Weight Approx. 45 kg (99 lb)
Environmental Conditions
Operating temperature 10 °C – 40 °C (50 °F – 104 °F)
Storage/Transport
temperature 0 °C – 50 °C (32 °F – 122 °F)
Admissible air humidity ≤ 95 %, non-condensing
Evaluation Unit
Computer Windows®-PC
Software Standard: Fischer WinFTM® BASIC including PDM®
Optional: Fischer WinFTM® SUPER
Standards
CE approval EN 61010, EN 61326
X-Ray standards DIN ISO 3497 and ASTM B 568
Approval Fully protected instrument with type approval according to German radiation
protection law.
Order
FISCHERSCOPE X-RAY XAN 215 605-083
605-692, contains all calibrated measurement applications necessary for the
analysis of jewelry, coins and precious metals
Special XDV product modification and XDV technical consultation on request
2022-09-30
952-097
FISCHERSCOPE®, XAN®, WinFTM®, PDM® are registered trademarks of Helmut Fischer GmbH Institut für Elektronik und Messtechnik,
Sindelfingen - Germany. Windows® is a registered trademark of Microsoft Corporation in the United States and other countries.
www.helmut-fischer.com
Data Sheet

X-Ray Fluorescence Measuring Instruments for fast and non-destructive
Analysis and Coating Thickness Measurement of Gold and Silver Alloys
XAN® 222
XAN® 220
FISCHERSCOPE® X-RAY XAN® 220/222
Main Features
The FISCHERSCOPE X-RAY XAN 220 and XAN 222 are optimized X-ray fluores-
cence measuring instruments for non-destructive analysis of jewelry, coins and
precious metals.
They are particularly suited for the analysis of precious metals and their alloys
in composition and coating thickness. Up to 24 elements can be determined si-
multaneously.
Typical fields of application are the analysis of:
 Jewelry, precious metals and dental alloys
 Yellow and white gold
 Platinum and silver
 Rhodium
 Alloys and coatings
 Multi layer coatings
Outstanding accuracy and long-term stability are characteristics of all
FISCHERSCOPE X-RAY systems. The necessity of recalibration is dramatically
reduced, saving time and effort.
The modern silicon PIN detector achieves high accuracy and good detection
sensitivity.
The fundamental parameter method by Fischer allows for the analysis of solid
and liquid specimens as well as coating systems without calibration.
Design
The XAN 220 and XAN 222 are designed as user-friendly bench-top instruments.
They differ in the support stage and the housing size:
 XAN 220: Fixed sample support
 XAN 222: Manually operable XY stage for accurate positioning of small parts
and larger measuring chamber
For quick and easy sample positioning, the X-ray source and semiconductor de-
tector assembly is located in the instrument‘s lower chamber. The measuring
direction is from underneath the sample, which is supported by a transparent
window.
The integrated video-microscope with zoom and crosshairs simplifies sample
placement and allows precise measuring spot adjustment.
The entire operation and evaluation of measurements as well as the clear pre-
sentation of measurement data is performed on a PC, using the powerful and
user-friendly WinFTM® software.
The FISCHERSCOPE X-RAY XAN 220 and XAN 222 fulfill DIN ISO 3497 and
ASTM B 568. The XAN 220 is a fully protected instrument with type approval
according to German radiation protection law.
146
General Specification
Intended use Energy dispersive X-ray measuring instrument (EDXRF) to analyze precious
metals and their alloys in composition and coating thickness.
Design Bench top unit with upwards opening hood
Measurement direction Bottom up
X-Ray Source
X-ray tube Micro-focus tungsten tube with beryllium window
High voltage Three steps: 30 kV, 40 kV, 50 kV; max. anode current: 1 mA
Aperture (Collimator) Ø 1 mm (39 mils), optional Ø 2 mm (79 mils) or Ø 0.6 mm (23.6 mils)
Measurement spot size Ø 1.2 mm (47 mils) with aperture Ø 1 mm (39 mils) and flat lying sample (mea-
surement distance 0 mm)
X-Ray Detection
X-ray detector Silicon Drift Detector (SDD), peltier-cooled
Element range Sulfur S (16) to Uranium U (92) – up to 24 elements simultaneously
Resolution (fwhm for Mn-Kα) ≤ 135 eV
Measuring distance 0 … 25 mm (0 … 1 in), Distance compensation with patented DCM method for
simplified measurements at varying distances. For particular applications or for
higher demands on accuracy an additional calibration might be necessary.
Repeatability ≤ 0.5 ‰ for gold, measurement time 60 sec
Sample Alignment
Sample positioning Manually
Video microscope High-resolution CCD color camera for optical monitoring of the measurement
location along the primary beam axis, crosshairs with a calibrated scale (ruler)
and spot-indicator, adjustable LED illumination
Zoom factor Digital 1x, 2x, 3x, 4x
Sample Stage XAN 220 XAN 222

Design Fixed sample support Manually operable XY stage
Usable sample placement
area 310 x 320 mm (12.2 x 12.6 in)
Max. sample weight 13 kg (29 lb) 2 kg (4.4 lb)
Max. sample height 90 mm (3.5 in) 174 mm (6.8 in)
Electrical Data
Power supply AC 100 – 240 V ±10 % / 50 – 60 Hz max. 120 VA, without evaluation PC
Protection class IP40
147
FISCHERSCOPE® X-RAY XAN® 220/222
Dimensions XAN 220 XAN 222
External dimensions
Width x depth x height 403 x 588 x 365 mm 403 x 588 x 444 mm
(16 x 23.2 x 14.4 in) (16 x 23.2 x 17.5 in)
Weight ca. 45 kg (99 lb)
Environmental Conditions
Operating temperature 10 °C – 40 °C / 50 °F – 104 °F
Storage/Transport temperature 0 °C – 50 °C / 32 °F – 122 °F
Relative humidity ≤ 95 %, non-condensing
Evaluation Unit
Computer Windows® PC
Software Standard: Fischer WinFTM® BASIC including PDM®
Optional: Fischer WinFTM® SUPER
Standards XAN 220 XAN 222

CE approval EN 61010, EN 61326
X-Ray standards DIN ISO 3497, ASTM B 568
Approval Fully protected instrument with type Individual acceptance inspection as a
approval according to German radia- fully protected instrument according to
tion protection law German radiation protection law
Order
FISCHERSCOPE X-RAY XAN 220 Please inquire
FISCHERSCOPE X-RAY XAN 222 Please inquire
Option Gold-Setup 605-692, contains all calibrated measurement applications necessary for the
analysis of jewelry, coins and precious metals
Special XAN product modification and technical consultation on request
952-091 2022-09-30
FISCHERSCOPE®, WinFTM®, XAN® and PDM® are registered trademarks of Helmut Fischer GmbH Institut für Elektronik und Messtechnik, Sindelfin-
gen- Germany. Windows® is a registered trademark of Microsoft Corporation in the United States and other countries.
Feature Overview
WINFTM®
Software for FISCHERSCOPE® X-RAY Fluorescence Measuring Instruments
Contents
1 Overview . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 151
1.1 WinFTM Versions: BASIC and LIGHT . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .151
1.2 WinFTM Extensions: PDM and SUPER. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .151
1.3 FISIM . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .151
2 Features of WinFTM BASIC and LIGHT . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 153

2.1 Integrated Technology . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .153
2.2 Measurements Independent of the Substrate Material . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .153
2.3 Coating Thickness Measurement . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .153
2.4 Material Analysis . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .153
2.5 Direct Analysis in the Spectrum . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .154
2.6 Automated Material Identification (Class of Materials) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .154
2.7 Measurement Methods. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .155
2.8 Optical Functions . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .155
2.9 Further Features of WinFTM . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .156
2.10 Measurement Data Management . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .158
2.11 Displaying, Documenting and Backing up Measurement Results and Parameters. . . . . . . . . . .159
2.12 Presentation of Readings. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .160
2.13 Calibrating and Monitoring of the Measuring Equipment . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .161
2.14 Display and Evaluation of Spectra . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .162
2.15 Control the XY(Z) Measuring Stage . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .162
3 WinFTM PDM: Expanded Product Data Administration and Result Documentation . . . . . . . . . . . . 165
3.1 Comparative Overview with/without WinFTM PDM . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .166
4 WinFTM SUPER: For the Experienced X-RAY User. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 169

1 Overview
1.1 WinFTM Versions: BASIC and LIGHT

WinFTM is available in two versions: BASIC and LIGHT. The versions differ in the number of measurable ele-
ments, see the following table:
Parameter WinFTM BASIC WinFTM LIGHT

Coating thickness 24 elements 4 elements
Material analysis of massive parts 24 elements 5 elements
Material analysis of solutions 22 elements 2 elements
1.2 WinFTM Extensions: PDM and SUPER

For both WinFTM versions BASIC and LIGHT the extensions PDM (Product Data Management) and SUPER are
available. The features the extensions are described in the following table:
WinFTM extension Features

PDM Expanded product data administration and result documentation
SUPER Additional features for defining the following parameters: Measurement mode,
tube voltage used, type and order of the coatings, type and composition of the
substrate material of the specimen and of the calibration standards, treatment of
interfering spectra, special evaluation methods, etc.
1.3 FISIM
The different versions and extensions of WinFTM are activated by different FISIMs (Fischer Software Identifi-
cation Module). A FISIM is a dongle, which is plugged into the computer’s USB socket, before WinFTM is start-
ed. Look at the data sheet of your instrument to find out, which WinFTM version and extension is running on
your system by default. If you need to extend the features of your WinFTM software, contact Fischer.
151
Overview

2 Features of WinFTM BASIC and LIGHT
The following section describes the features of the software versions BASIC and LIGHT. If there are restric-
tions in the LIGHT version, they are indicated in the text.
2.1 Integrated Technology

 Coating thickness measurement and material analysis can be performed in one run.
 Both operate standard-free as well.
2.2 Measurements Independent of the Substrate Material

 During the measurement the substrate material is analyzed automatically. Thus, measurements on dif-
ferent substrate materials can be performed without normalization in many cases. This makes work
much easier and saves time.
The reliability of the measurement result is increased, because the coating thickness is measured cor-
rectly, even with hidden changes of the substrate material.
Even materials underneath the top coating can be analyzed without removing the top coating.
 Function for taking into account the spectral background. The user can define the spectral background in
the DefMA. This function increases the accuracy of the analysis as long as a suitable underground spec-
trum is available.
2.3 Coating Thickness Measurement

With the BASIC version max. 24 individual parameters of a specimen can be measured (thickness, composi-
tion, element).
Examples:
 A component is to be measured, that has 24 layers each consisting of one element.
 A component is to be measured, that has one coating, which consists of a mixture of 24 elements.
With the LIGHT version max. 4 or 5 individual parameters of a specimen can be measured (thickness: 4 ele-
ments, composition: 5 elements).
Examples:
 A component is to be measured that has 4 layers each consisting of one element.
 A component is to be measured that has one coating, which consists of a mixture of 5 elements.
Even individual elements, which may occur several times in different coatings of the coating system, can be
measured.
2.4 Material Analysis

 Quantitative material analysis of complex layers. Individual layers may consist of several elements. The
total number of measured quantities amounts up to 24 with WinFTM BASIC and 4 with WinFTM LIGHT.
 Quantitative analysis of solid, powder or paste materials as well as solutions for up to 24 elements. The
range of analysable elements depends on the detector (see Technical Data Sheet).
 Even buried layers can be analysed.
153
Features of WinFTM BASIC and LIGHT
 Analysis with balance: It is not required to completely define the composition of the specimen by 100 per-
cent. The analysis is performed by matching the peak areas, without the need for the sum of concentra-
tions amounting to 100 percent. Applicable for recycling, analysis of trace elements in plastics, soil
specimens, biological specimens and non-homogeneous composites.
2.5 Direct Analysis in the Spectrum

 Solid specimens with unknown compositions can be easily analyzed in the spectrum mode of WinFTM.
Instead of defining the composition via DefMA, only the relevant elements need to be highlighted. A cali-
bration is not necessary. Specimens can consist of a maximum of 24 elements with WinFTM BASIC or 5
elements with WinFTM LIGHT.
 Matrix effects and cross-excitation are taken into account.
 The residual is displayed. The residual is the spread between the calculated sum spectrum and the mea-
sured spectrum. You receive references to a potentially wrong selection of the elements to be measured.
The direct analysis is not feasible for the analysis of light elements, solutions or coating systems.
2.6 Automated Material Identification (Class of Materials)

You can easily sort specimens with different compositions and/or coating thicknesses in different classes of
materials. You don’t need to perform reference measurements for each composition or coating thickness.
Each class of materials covers a range of composition and/or coating thickness.
Example: You need to sort the following specimens:
 5 – 8 µm Zn/Fe
 10 – 20 µm Zn/Fe
 5 – 12 µm NiZn/Fe
In WinFTM you define three classes of materials, perform one measurement and WinFTM displays, what
class of materials the specimen belongs to.
Additionally, you can assign a product to each class of materials. The exact composition is measured. This
has the following advantages:
 The right product containing the appropriate parameters and calibration is loaded automatically.
 Measurement errors, caused by wrong product selection, are avoided.

2.7 Measurement Methods

 Measurement by x-ray emission
 Measurement by x-ray absorption
 Measurement by simultaneous x-ray emission and x-ray absorption (Ratio Method)
 Mathematical deconvolution
 Measurement by Fundamental Parameter Method
The measurement methods comply with the following standards:
Standard Titel and Edition

ASTM B568 Standard Test Method for Measurement of Coating Thickness by X-Ray
Spectrometry, 98 (2004)
DIN EN ISO 3497 Metallic Coatings – Measurement of Coating Thickness – X-ray Spectro-
metric Methods, 12 (2001)
2.8 Optical Functions
Function Description
Video image of the specimen The specimen is shown in the video window inside the WinFTM main win-
dow.
Scaled crosshairs Scaled crosshairs are electronically inserted into the video image. They
show the real size and position of the measurement spot on the surface of
the specimen. The color of the crosshairs is selectable.
Auto-focus (on models with The detector unit moves up and down automatically. The auto-focus func-
motor-driven z-axis) tion allows a significantly more precise setting of the measurement dis-
tance than subjective manual focusing. Thus, the reproducibility of the
measurement result is increased.
Measurement of the distance Focusing the video image provides the correct measuring distance. Win-
between the test spot and the FTM takes into account these distance values, when computing the coating
detector / DCM method thickness measurement data, using the DCM Method (Distance Controlled
Measurement).
This allows for automated testing of complex surface geometries and mea-
surements in recesses.
Displaying programmed You can display programmed points in the video image.
points in the video image (on
models with motor-driven XY-
stage)
Software-based video zoom You can zoom the video image in steps of 100, 200, 300 and 400 percent.
function Additionally, you can display the video image in full screen mode.
Saving video images together You can edit the video image with a graphic program of your choice e.g. for
with the measured values adding comments or dimensions. When you save the video image, it will be
assigned to your measured values. Additional text notes will be stored,
linked to the video image.
155
Recognition of vertical or hor- The instrument can recognize strip structures on specimens and readjust
izontal strips (on models with the XY position along this structure. Thus, you can make sure that on spec-
motor-driven XY-stage) imens with geometric tolerances, the measurement is always performed
at the correct position.
Image/Pattern Recognition The instrument can recognize a predefined structure and readjust the XY
(on models with motor-driven position of the XY-stage along this structure automatically. Thus, you can
XY-stage and WinFTM exten- compensate deviations in positioning during measurements on more spec-
sion SUPER activated) imen (e. g. for routine tests in production).
2.9 Further Features of WinFTM
Standard Windows® user in- Users with basic knowledge of Windows® will very quickly be familiar with
terface the program’s user interface.
Product functions You can set up, select, delete, edit and copy products. Additionally, you can
search for products, using different search criteria.
Definition of the spectral In the DefMA (Definition of the Measurement Settings of the Application)
background the spectral background can be defined. This function increases the accu-
racy of the analysis as long as a suitable underground spectrum is avail-
able.
Multiple Excitation For each application, the excitation parameters “high voltage” and “prima-
ry filter” are set to produce the best possible results. For some applica-
tions, however, it may be necessary to work with different excitations in
order to measure all parameters optimally. You can use multiple exci-
tations within a single measurement, so that all parameters are measured
under the best possible conditions; the collected results are then present-
ed in one combined evaluation.
Application example: Determination of the thickness of a NiP coating with
simultaneous determination of the Phosphorus concentration
Control field and joystick on In addition to the operation via the Software WinFTM you can control pro-
the measuring head (joystick gram and instrument functions with the control field and the joystick on
on models with motor-driven the measuring head.
XY-stage only)
Automatic searching and se- You can search for products by name (designation) using a bar-code read-
lecting of products (option) er. An optional bar-code keyboard (order no. 602-296) with a bar-code
reader pen (order no. 602-292) is available.
Short menu The supervisor can reduce the menu functions available for the operator.
In this manner, sensitive data such as measuring time and calibration pa-
rameters can be protected from overwriting, and the operator is present-
ed with a simplified menu. The long menu with full functionality is accessi-
ble only with a password.

Quick selection of products You can select products and tasks quickly by using command buttons (on
and tasks the monitor), which can be edited.
Additionally, you can allocate products or tasks to the keys of the control
field on the measuring head.
mq value (measurement The mq value is a measure for the quality of a measurement result. It is
quality) displayed for every measurement and allows for a plausibility check of the
result. The mq value can be displayed or printed for every individual result.
A warning appears in case of a limit violation.
Calculating the random mea- The measurement uncertainty, which is based on natural count statistics,
surement uncertainty u of a is an important quantity in measurement technology.
measured quantity The measurement uncertainty u of the current single reading can be dis-
played.
The anticipated measurement uncertainty can be calculated individually
for each measured quantity.
A measured quantity can be varied in a wide range.
The calculated result for u is presented graphically as a chart: either as
theoretically anticipated standard deviation (SD) or as relative standard
deviation (RSD). This allows for an estimation of the measurement range.
If several measurement quantities are to be measured independent of one
another, the calculation will require specifications for the size of the other
variables that will not have the measurement uncertainty calculated. For
example, when determining the measurement uncertainty of a buried
coating (for example Ni in Au/Ni/Cu), the thickness of the top coating(s)
must be known.
The final result chart can be printed.
Traceability of the measurement result is possible by calculating the ran-
dom and systematic portions of the measurement uncertainty.
Random and systematic portion can be presented separately (both the sin-
gle readings and the mean values).
Uncertainties of the calibration standards can be entered.
The display of the measurement uncertainty(ies) can be shown or hidden.
Convenient copying of DefMA Copying of DefMA files is supported by a convenient data administration
tool.
Two overview windows (source directory and target directory) allow for a
convenient and clear control of the copy procedure. A DefMA file can be
opened and checked prior to copying.
Available DefMA files can be taken from one folder.
The Search/Sort function is helpful in finding the desired DefMA file.
Easily viewable DefMA notepad contents support searching.
157
Programmed measurement You can simply program routinely repeating measurement sequences and
sequences (Tasks) execute them automatically.
Even very complex measurement sequences can be simplified.
Dialogs for operators can be shown on the screen (e.g. information about
positioning of the specimen).
The sequence of a Task is started with the click of a soft key (icon) on the
monitor or with the push of a button on the control panel of the instrument.
Can be used even by semiskilled laborers.
Remote control You can operate WinFTM by remote control via your company network.
Network operation Beside the operator at the measuring station one or several other employ-
ees with linked computers can monitor the readings or can do evaluations.
On each of the client computers, WinFTM has to be installed in the same
version (e.g. BASIC or BASIC+PDM) like on the host computer.
International units of mea- You can display the readings in international units of measurement (μm /
surement mils …) and define special individual units of measurement.
Multitasking Many software functions can be operated simultaneously to the measure-
ment e.g. toggling the SPC channel, scrolling the list scroll field, perform-
ing an evaluation, changing the current product, working on the video
menu, help functions.
However, some other menu areas are locked during the measurement
(e.g. product selection, XY programming, calibration …).
Operating manual and con- The operating manual explains all essential facts of the program in a clear
text-sensitive online help manner.
The context-sensitive online help offers fast, direct access to easily under-
standable operational information.
Language selection You can select different languages for the menus and dialogues of the
WinFTM software. Available languages: English, German, French, Italian,
Spanish, Turkish, Polish, Czech, Swedish, Finnish, Portuguese. Selected
Asian languages on request.
2.10 Measurement Data Management
Block function A block is a concluded series of measurements. Measurement data is
stored and evaluated as blocks, including the date and time of the mea-
surement, a notepad, the continuous number of the block as well as block-
related data. The content of additional data fields such as order number,
batch number, and operator name can be defined freely.

Tagging and commenting Blocks can be tagged with event marks and can receive comments. For
blocks example, in the course of a process that is to be controlled, you can tag
certain events by adding event marks and adding comments to the related
block.
Deleting measurement data Measurement data and blocks can be deleted, overwritten and undeleted.
and blocks
2.11 Displaying, Documenting and Backing up Measurement Results and Parameters
Displaying the measurement You can display the measurement results in list form, as SPC chart or as a
results large number display (with optional display of the measurement uncer-
tainty). The resolution (Number of decimal places) can be set.
BASIC: Up to 24 result chan- You can control the representation for each channel individually.
nels,
LIGHT: Up to 3 result chan-
nels
Editing the video image and You can edit the video image with a graphic program of your choice e.g. for
storing it together with the adding comments, dimensions and explanatory text. The edited video im-
product age is stored together with the product.
Print functions With black and white printers, color values are printed in grayscale auto-
matically. For larger page widths, the printer is switched automatically to
landscape format and reduction of the type size.
SPC presentation of the The SPC chart can directly be displayed on the monitor as x-bar/s chart or
measurement results x-bar/r chart. For automated measurement sequences with large batch
sizes, you can easily recognize long-term changes of the coating thickness
and of other process parameters through the presentation of a trend line.
This enables, among other things, the testing of the measurement device
capability.
Specification limits: Graphi- BASIC: You can define specification limits for each of max. 24 result chan-
cal distinction (in color) for nels.
exceeding or falling short LIGHT: You can define specification limits for each of max. 3 result chan-
nels.
Single readings and statisti- Display and printout of single readings as well as statistical evaluation of
cal evaluation the measurement data in the form of block results or final results.
Displaying statistical evalua- Histograms, probability charts, statistical process control charts (SPC), Cp
tions and Cpk values can be displayed and printed.
Print forms for the block and You can print the block and final evaluation with editable print form head-
final evaluation er, measurement data, statistical results, histogram, probability chart, etc.
Exporting data You can export measurement results via the USB interface or via your
company network. You can define the format via export templates.
159
Two- and three-dimensional You can display the coating thickness distribution in two- or three-dimen-
display of the coating thick- sional charts.
ness distribution (on models
with motor-driven XY-stage)
Storing and displaying of ad- You can store and display the following additional information: date and
ditional information time of the last change to a product, the last measurement, normalization
or calibration of the current product, the last reference measurement, the
time of operation etc.
Storing XY(Z)-coordinates, The XY(Z)-coordinates, video images and spectra are stored together with
video images and spectra the measurement data for future use and documentation.
(XY(Z) coordinates on models
with motor-driven XY-stage)
Copying products including You can copy products including related measurement data e.g. for data
measurement data backup.
Automatic, time-controlled You can select folders, which will be backed up automatically. Thus, you
backup can back up your measurement applications, products including measure-
ment data, spectra etc. automatically.
2.12 Presentation of Readings

You can control, how the measurement readings are presented.
Display mode Description

Thickness mode The measurement result shows:
 Coating thickness readings in the common length dimensions
e.g. in mils
 Analysis results in percent
The densities are taken from internal tables, but you do have the option of
changing the values.
Absolute area mass mode The measurement result shows:
 Total area mass
 Individual area masses of the respective elements, e.g., in g/m² or g/l.
No densities needed.
Relative area mass mode The measurement result shows:
 Total area mass
 Relative area masses of the respective elements in %.
No densities needed.
Component mode Used for the analysis of specimens, which are not only composed of pure
elements, but also contain chemical compounds (components).
Main application fields: Oxides, metallic alloys, …

2.13 Calibrating and Monitoring of the Measuring Equipment
Calibration of new or existing The obtained calibration data are stored.
products
Standard-free calibration You can calibrate without calibration standards by means of the funda-
mental parameter method.
Standard-based calibration You can correct the standard-free calibration by calibrating with calibra-
with the use of up to 64 stan- tion standards. Thus, the accuracy of the analysis and thickness measure-
dards ments is improved.
Matrix-specific calibration standards and pure element calibration stan-
dards are available. Up to 64 calibration standards can be used for each
measurement application.
Calibration standard set Input and storing of nominal values of the used calibration standards is
performed in the Calibration standard set in the measurement application
of the product. After the calibration has been performed, the Calibration
standard set contains, in addition to the nominal values, the calculated ac-
tual values including the correction. You can use this data to create a doc-
ument for monitoring the measuring equipment.
Calculating and saving mea- Measurement parameters like measuring time, calibration time, correc-
surement parameters and tion data, data of the last normalization and calibration, etc. can be calcu-
calibration results lated and saved.
Library of pure element The library of pure element spectra makes measurement of pure ele-
spectra ments unnecessary when performing a calibration. This is important in
cases, where pure elements are not available.
Spectra library During the installation of the instrument the spectra of 12 or 14 elements
(depending on the detector type) are measured and saved in the spectra
library. Using these spectra all further spectra are calculated by the in-
strument.
You can control whether the elements are measured or the spectra of the
spectra library are used during calibration.
Reference measurement The Reference measurement checks and adjusts the drift of the instru-
ment. It is also used for monitoring the measuring equipment.
Stability test of the tube and The instrument performs automatic long-term self tests to check the pri-
of the detector mary radiation, the resolution and gain of the spectrometer (detector and
electronics).
Automatic reduction of the x- After several minutes of instrument idle the x-ray tube current is reduced
ray tube current automatically. Thus, the service life of the tube is increased and energy is
saved.
Drift compensation A shift of the peak position in the spectrum is compensated by the soft-
ware. This avoids wrong results especially when there are critical peak
overlaps.
161
2.14 Display and Evaluation of Spectra
Clear display of the sum For the evaluation of measured spectra you can overlay the spectrum
spectra with colored element lines of up to 24 elements in different colours.
spectra You can compare spectra in order to identify materials, e.g., for material
sorting.
You can compare the spectrum of an unknown material with the refer-
ence spectra of known materials, which are stored in a spectra library.
The number of stored spectra in the library can be increased or reduced.
Saving spectra You can save measured spectra for subsequent re-use (e.g., for subse-
quent evaluation when the measurement application changes). The spec-
tra can be stored manually or automatically.
Loading of spectra into the You can load spectra into the background of the spectra window to com-
background pare measured and stored spectra.
Zooming spectra ranges You can zoom into an area of the spectra window by using the right mouse
button.
2.15 Control the XY(Z) Measuring Stage

If your instrument is equipped with a motor-driven XY(Z) stage you can use the following functions to control
the measuring stage:
Moving the XY(Z) stage You can control the move of the XY(Z) stage accurately by clicking the
mouse button in the video image.
Joystick function of the The right mouse button offers additional joystick functionality in the video
mouse field.
Travel to absolute or relative You can enter absolute or relative coordinates to travel the stage. The zero
coordinates point of an operation can be specified individually.
Laser light pointer The red laser point points to the subsequent measurement position in the
retracted condition and thus significantly simplifies a quick sample posi-
tioning
Point & Shoot You can travel to the desired position by clicking the left mouse button.
Point & Measure You can travel to the desired position and perform a measurement at this
position by clicking the middle mouse button.
Point & Save You can travel to the desired position and save the related coordinates by
clicking the right mouse button.
Joystick at measuring head You can easily control the XY(Z) stage with the joystick at the measuring
head.
In addition, you can control the XY(Z) stage with the mouse.

Measurement point overview The measurement point overview windows offer you a full overview of all
programmed points of the current measurement coordinates and of the
entire travel range.
Programming individual coor- You can program arbitrary individual coordinates, on which measurements
dinates will be performed.
Programming lines You can define a start point and an end point of a line and a number interim
points. On these points measurements will be performed.
Programming arrays You can define two corner coordinates of an array and the number of
points within the array (columns and rows). Furthermore you can define
the sequence, in which the points will be travelled. On these points, mea-
surements will be performed.
Programming patterns You can define a freely programmable geometric pattern of measurement
points. You can replicate this pattern as often as you want. Thus, you can
travel the same points on different specimens or on different parts of the
same specimen.
Programming offset In addition to the measuring points (line, array or pattern) you can define
one or two reference points. Thus, you can change specimens and make
sure the measurements are performed at the same coordinates, while the
specimen is not located at the same position.
163

3 WinFTM PDM: Expanded Product Data
Administration and Result Documentation
PDM (Product Data Management) is a supplementary software module to WinFTM BASIC or LIGHT. The PDM
software features the following functions:
Setting up new products  A measurement application may be linked to any number of products
linked to an existing (1:n assignment). Thus, each edit of a measurement application affects
measurement application all products that are linked to it.
 With PDM, each product (a file that contains, among other things, the
measurement results) is saved in a freely selectable folder. You can
copy your products into different folders and sort them according to
supplier, customer and part number.
 The operator only needs the product designation for the test order, and
not necessarily knowledge of the measurement application.
 PDM saves measurement data product-related and not measurement
application related.
Convenient administration of  You can set up new measurement applications based on an existing
measurement applications definition file (DefMA).
 You can edit, copy and delete measurement applications. With PDM,
these procedures affect all products that are linked to a measurement
application. When copying a product, the measurement application is
not duplicated, instead it is retained.
 You can normalize and calibrate measurement applications. These pro-
cedures affect all products that are linked to a measurement applica-
tion.
Result documentation  You can assign individual print form templates to each product for
block and final evaluation.
 You can evaluate the measurement readings of several or even all
products of a measurement application simultaneously in one tem-
plate.
 You can freely set up, copy and edit product-related print forms (print
form templates).
 A portion of the print form template may include special dummies
(variables) for measurement results and field contents. These dum-
mies take the place of user-entered data.
 You can present your measurement results in a clear manner with
graphical effects. Additionally, various information elements can be
integrated like the image of the specimen, your company logo etc.
 You can create and insert statistical characteristics.
 You can save the print form in data files for future use or for documen-
tation purposes.
165
WinFTM PDM: Expanded Product Data Administration and Result Documentation
Free block selection (Search  Enables final evaluation and the subsequent export of selected mea-
function with filter) surement data blocks. The filter criteria applied may concern, for
example, date and time, block number, order no., batch no., operator
name.
 You can combine arbitrary blocks to a final evaluation and export the
data of arbitrary blocks.
Overview image (on models You can create an overview image of the specimen automatically.
with motor-driven XY-stage) If you have programmed measurement points, they are displayed in the
overview image.
You can simply navigate and measure using the overview image (see Point
& Measure on page 162).
XY-Scan mode (on models You can travel the XY-stage while a measurement is running. Thus, you can
with motor-driven XY-stage) measure the mean value over a defined area of the specimen.
3.1 Comparative Overview with/without WinFTM PDM

WinFTM PDM (Product Data Management) as a supplemental software is suitable for both WinFTM BASIC and
for WinFTM LIGHT. In both cases, the functional scope of WinFTM PDM is identical.
The following table presents an overview of the available functions with and without PDM.
Function without PDM with PDM

Assignment Measurement application : 1:1 1:n
Product Each measurement A measurement application
application is assigned to on- can be assigned to several
ly one product. products simultaneously.
Product management Measurement application re- Product-related
lated
When copying a product the measure- … duplicated only as a local … is retained.
ment application is … measurement application1
Setting up folders or directories for prod- No Yes
uct management
Normalization and calibration affects all No Yes
products linked to the measurement ap-
plication
Setting up and storing product-related
print forms
Block print form Yes Yes
Final print form No Yes
Free block selection (with search func- No Yes
tion) with versatile filter

Function without PDM with PDM

Evaluations using simple print forms: Yes Yes
readings of all blocks are being evaluated,
no block selection, no customer-specific
print form templates
Overview image (on models with motor- No Yes
driven XY-stage)
XY-Scan mode (on models with motor- No Yes
driven XY-stage)
1. Local measurement application: The measurement application is assigned to one product only. After
copying, the copied measurement application has no relation or link to its origin. Thus, edits have only a
local effect on the assigned product.
167

4 WinFTM SUPER: For the Experienced X-RAY User
For both WinFTM versions BASIC and LIGHT the extension SUPER is available. With WinFTM SUPER you can
change the following parameters:
 Tube voltage used
 Type and composition of the substrate material of the specimen and of the calibration standards
These parameters are stored in the DefMA file (Definition of the Measurement Settings of the Application).
In addition, the SUPER software features the following functions:
Convenient entering of ele- Convenient entering of elements, e.g., in the DefMA using the window Peri-
ments odic System.
Pool of DefMA files You can establish a pool of DefMA files. Several users can access to this
pool.
Image/Pattern Recognition The instrument can recognize a predefined structure and readjust the XY
(on models with motor-driv- position of the XY-stage along this structure automatically. Thus, you can
en XY-stage and WinFTM ex- compensate deviations in positioning during measurements on more
tension SUPER activated) specimen (e. g. for routine tests in production).
169
HELMUT FISCHER GMBH INSTITUT FÜR ELEKTRONIK UND MESSTECHNIK
Industriestraße 21 Tel: +49 (0) 70 31 / 3 03 – 0
71069 Sindelfingen, Germany Fax: +49 (0) 70 31 / 3 03 – 710
Training Protocol
Installation and Training of an X-ray fluorescence measuring instrument
FISCHERSCOPE® X-RAY with WinFTM® software
Instrument model: WinFTM®-Version:

Serial number: Instructor:
Customer, Address Manufacturer

HELMUT FISCHER GmbH
Institut für Elektronik und Messtechnik
Industriestraße 21
71069 Sindelfingen
Participants
Name Name Name
Name Name Name
Name Name Name
Topics
No Topic ✔
1 Installation and connection of the instrument 

2 Radiation safety instructions 
3 Safe handling of motor-driven XY-stage 
4 Theoretical basic instructions for the measuring principle 
5 Explanation of the main components 
6 Switching the instrument on and off 
7 Control elements and displays of the instrument 
8 Screen structure 
9 Operation of the instrument Sample positioning 
Focusing with Z axis 
Focusing with optics (Md) 
Z axis safety function 
XY-stage 
Safety device 
Coating Thickness Material Analysis Nanoindentation Material Testing
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No Topic ✔
10 Measurements Selecting product 

Starting measurements 
Closing a block 
11 Evaluation of measurement series Printing protocol 
Block evaluation 
Final evaluation of several blocks 
Deleting single readings and blocks 
Re-measure 
Subsequent correction of entries 
12 Structure of the WinFTM® software Product 
Application with calibration standard set 
DefMA 
13 Product Creation via Copy or New 
Directory structure 
Product settings via Info 
Programming XY-stage 
14 Video image Control elements 
Travel measurement location 
Video settings 
Creating overview image (XY-stage) 
Product video 
Printing 
15 Settings Definition Order No./Operator 
Assigning the function keys 
Customizing the tool bar 
Creating individual protocols 
Data export 
Short menu 
16 Data backup Copying product to/from file 
Complete installation via file explorer 
Automatic backup to a network 
17 Monitoring of the instrument (Calibration Long-term stability 
Stability 
Corrections:
Reference Measurement 
Calibration 
Normalization 
ID: F0116 Version: 2022-07-19 Tech Doc
Base Correction 
Density correction 
Documentation 
18 Creating an application via copy 
19 Measuring and evaluating the spectrum 
20 Deleting products etc. 
The training included all items of the aforementioned list.
Date Signature of Supplier Signature of Customer

Index
A a product 50
Curved specimens 27
Administration, Product 49 Cylindrical specimens 27
Analysis with balance 97
Aperture 19
D
Areas of application 15
ASTM B568 9 Data export 119
Autom. Block closing, variable 55 DefMA 45, 46
Creating of 98
B Importing 54
Modes 97
Background correction 100 Viewing 53
Base correction 103 Deleting
Base spectrum 99 Measuring application 53
BASIC 151 Product 52
Block 55, 158 Determining the elements of a sample 43
Definitions 55 Diagnostic interface 23
Evaluation 68 DIN 50 987 9
Block size Disable the communication 26
Fixed 55 Dispose
variable 55 of the instrument 12
Bolts 27 Dongle 151
Dual Function of a Product 47
C
Calibration 104 E
Changing EN 61140 10
Measuring application 53 EN ISO 3497 9
Product 51 Enable the communication 26
Characteristic statistical parameters 131 Energy 44
Class of Materials 154 Environmental conditions 21
Cleaning 127 Establishing connections 23
Calibration standards 127 Evaluations
Instrument 127 statistical 55
Measuring cell 113 Event marks 159
Collimator 19 Export template 122
Communication
between instrument and WinFTM 26
F
disable 26
enable 26 FAQ x-radiation safety 14
Compensation spectra 99 File Structure of WinFTM 45
Component mode 97 Final evaluation 68
with balance 97 FISIM 25, 151
Component mode with balance 98 Fixed block size 55
Components 19 Flat Specimens 27
Connections 23 Fluorescence, x-ray 16
Copying Focus Adjustment Knob 20
Measuring application 53 Fully protected instrument 10
Product 49 Functional principle of the instrument 17
Cover of the Measurement Chamber 19
Creating
a DefMA 98
177
Index
H Deleting 53
Measuring cell 111
Handling of measurement readings 55 Cleaning of 113
Humidity, relative 21 Message
ERROR Helium Difference...ERROR Helium
I Difference... 31
Importing mq value 39
DefMA 54
Product 51, 114 N
Inclines, measurements on 28 Normalization 101
Instrument
disposal 12
O
Instrument, functional priciple of 17
Intended use 9 Operating personnel, requirements 12
Intensity 44 Operation temperature 21
Operators with introductory training 12
K Overwriting a measurement reading 58
Key switch 19, 23
P
L PDM 151, 165
Supplementary software 61
Large number presentation 36 Performing Measurements 31
Liability limitation 10 Periodic table of the elements 140
LIGHT 151 Position Specimen 27
Lightning, specimen 19 Preparing
Limitation of liability 10 Instrument for transport 129
Limited operating mode 40 Measurements, process flow 45
List presentation 36 Primary x-radiation 16
Location for set-up 21 Print Form Template Editor 61
Process flow for preparing measurements 45
M Product 45, 46
Main switch 23 Administration 49
Main window WinFTM 33 Assigning a new measuring application 52
Maintenance 127 Changing 51
Repair 10 Copying 49
Manual measurements 31 Creating 50
Mass per unit area 77, 97 Deleting 52
Material analysis 97 Importing 51, 114
Measurement
Application 45, 46 R
Chamber cover 19 Ratio method 155
Data export 119 Reference measurement 101
On inclines 28 Relative humidity 21
Uncertainty 36 Repair and maintenance 10
Value field 36 Repeat inspection 10
Measurement reading Requirements for the operating personnel 12
Saving 58 Residual 154
Measurement readings Rods 27
Handling of 55 ROI-mode 97
Measuring application
Assigning Product 52
S
Changing 53
Copying 53 Safety 9, 10

Index
devices 10 User interface 33

Saving measurement reading 58 WinFTM Software 15, 24, 33, 151
Secured measurements 104
Set-up location 21 X
Short menu 40
X-radiation safety 10
Software WinFTM 15, 24, 33, 151
FAQ 14
Solution analysis 97, 111
X-ray fluorescence radiation 16
SPC chart presentation 36
Specimen
-Lighting 19
Position of 27
Spectrum window 41
Statistical
Evaluations 55
Statistical parameter 131
Statistics field 35
Status bar 38
Storage temperature 21
Substrate material correction 103
SUPER 151
Supplementary software PDM 61
Switching off the instrument 25
Switching on the instrument 25
T
Temperature 21
Thickness mode 97
Trained specialists 13
Transporting the instrument 129
Troubleshooting 129
U
Uncertainty of the measurement 36
Unpacking the measuring system 22
USB
cable 23
USB interface 23
User interface of the WinFTM software 33
V
Variable block size 55
Video
Image 34
Viewing
DefMA 53
Voltage supply 23
W
Warning notices 9
WinFTM
File structure 45
Main window 33
179
Index

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Operator‘s Manual

FISCHERSCOPE® X-RAY XAN® 215

X-Ray Fluorescence Measuring Instruments, Optimized for fast

Document order number: 952-598

7 User Interface of the WinFTM Software. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 33

8 WinFTM File Structure . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 45

9 Measurement Product Administration. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 49

9.7 Modifying a Measuring Application. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 53

10 Handling of Measurement Readings and Statistical Evaluations . . . . . . . . . . . . . . . . . . . . . . . . . . . . 55

11 Setting Up the Print Form Using PDM . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 61

11.28 Variation of Measurement Readings . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .84

13 Calibration, Normalization and Base Correction . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 101

14 Solution Analysis. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 111

15 Measurement Data Export . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 119

16 Cleaning and Maintenance . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 127

17 Description of the Characteristic Statistical Parameters . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 131

17.3 Final Result – Variable Block Definition. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 137

Training Protocol. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 171

1.1 Read the Operator’s Manual Carefully Before Operating

1.2 Warning Notices Used

WARNING Indicates a risk that can lead to death or serious injuries.

1.3 Intended Use

1.4 Limitation of Liability

1.5 Safety of the Electrical Equipment

1.6 X-Radiation Safety

1.7 Repeat Inspection

1.8 Safety Devices

LED at the Start button at the Instrument

CONTROL LED at the Instrument

No Alterations to the Instrument!

DANGER X-radiation and high voltage

CAUTION Risk of injury

DANGER X-radiation and high voltage

1.11 Maintenance and Repair

DANGER X-radiation and high voltage

WARNING Risk of poisoning

Dispose of the instrument

1.13 Requirements for the Operating Personnel

Operators with introductory training should have the following knowledge:

1.14 Frequently Asked Questions Concerning X-Radiation Safety

2.1 Areas of Application

2.2 Standard-free Measurements

2.3 X-Ray Fluorescence

X-ray fluorescence radiation

Figure 2-1: Generation of the x-ray fluorescence radiation

2.4 Functional Principle of the Instrument

X-ray fluorescence radiation

Figure 2-2: Functional principle of the instrument

3.1 Cover of the Measurement Chamber

3.2 Manually Operable XY Stage (XAN 222)

3.3 Aperture (Collimator)

3.5 Specimen Lighting

3.6 Key Switch for the X-Ray Energy

Control LED of the high voltage supply:

3.7 Control Panel

Figure 3-1: Control panel of the instrument

Table 3-2: Function of the control elements

Control element Function

Table 3-3: Function of the LEDs

3.8 Focus Adjustment Knob on the Right Side of the Instrument

4.1 Set-up Location

DANGER Explosion hazard

The instrument is designed for the following conditions:

Operation temperature 10 °C – 40 °C / 50 °F – 104 °F