:.

BRITISH STANDARD BS 1134-1:

1988

Assessment of surface
texture
Part 1: Methods and instrumentation

UDC 621.9.015:620. 179. I l8:001.4

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NO COPYING WTIEOUT BSI PEBDTISSION EXCEPT AS PEnlttrITtsD BY COPTBIGHT I"AW ffiffiwffM
BS 1134-1:1988

Comrnittees responsible for this

British Standard
The preparation of this British Standard was entrusted by the General
Mechanical Engineering Standards Committee (GME/-) to Technical
Committee GME/10, upon which the following bodies were represented:

Department of Trade and Industry (National Engineering Laboratory)

Department of Trade and Industry (National Physical Laboratory)
GAMBTCA (BEAMA Ltd.)
Gauge and Tool Makers'Association
Institution of Production Engineers '
Loughborough University of Technology
University of Warwick
Coopted member

This British Standard, having

been prepated under the
direction of the General
Mechanical Engineering
Standards Committee, was
published under the authority
ofthe Board ofBSI and comes
into effect on
29 Febrrrary 1988

oBsI r1-1999

BS 1134 fuist published

December 1950
First revision April 196 1 Amendrnents issued since publication
First published as BS I 134- I
August 1972
First revision February 1988

The following BSI leferences

relate to the work on this
standard:
Committee reference GME/10
Draft for comment 85174262DC

ISBN 0 580 16269 I

 BS 1134-1:1988

Contents
Page
Committees responsible Inside front cover
Foreword iii
Section 1. General
1 Scope I
2 Definitions 1

Section 2. Determination of surface roughness

3 Sampling lengths 12
4 Graphical determination of parameter values T2
5 Statements of surface roughness 16
Section 3. Instrumentation
6 Stylus-typemeasuringinstruments 17
7 Accuracy 20
Appendix A Parameter values zo
Appendix B Method divergence of instrument reading 24
Appendix C Factors affecting the statement of accuracy 25
Figure 1 Surface characteristics and terminology .t
Figure 2
- Traversed length 4
Figure 3
- ProfrIe departure 5
Figure 4
- Local peak of the profile 5
Figure 5
- Spacing of local peaks of the profrIe 6
Figure 6
- Local valley of the profile 6
-
Figure 7-Profilepeaks 7
Figure 8
Figure 9
- Profile valleys
Spacing of profrIe irregularities
7
8
Figure 10
- Profile section level 8
Figure 11
- Profile bearing length I
-
Figure 12 Arithmetical mean deviation of the profile (ft") 9
Figure 13
- Maximum height of the profilu (n 10
)
Figure 14
- Graphical determination of Eu values 13
Figure 15
- Graphical determination of R, values 13
Figure 16
- Graphical determination of S- values I4
Figure 17
- Graphical determination of S values 15
Figure 18
- Graphical determination of lo values 15
Figure 19
- Stylus acting midway between two skids t7
Figure 2O
- Profile instrument frequency response 19
-
Figure 21- Permissible deviations of the transmission coefficient 2l
Figure 22 Symbols for the direction of lay 22
Figure 23
- Centre arithmetical mean lines (A) and electrical
mean lines- @) 25
Table 1- Sampling lengths 12
Table 2 Static measuring force of the stylus T7
Table 3
- Evaluation lengths 18
Table 4
- Nominal sinusoidal frequency response characteristics for
a profile-instrument 19
Table 5 Upper and lower limits of transmission coeffrcients 20
Table 6
- Preferred nominal values for arithmetical mean deviation
- (R")
of the profile 23

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BS 1134-1:1988

Page
nominal values for ten point height of
Table 7
- Preferred
irregularities (8), and maximum height of the profrIe (E ) 23
nominal values for mean spacing of profile
Table 8
- Preferred
irregularities (S*), and mean spacing of local peaks of the profrle (,$ 24
Table 9 Comparison of .Ru values obtained by graphical and
- means
instrumental 24
Publications referred to Inside back cover

oBSI 11-1999
 BS 1134-1:1988

Foreword
This Part ofBS 1134 has beenprepared under the direction ofthe General
Mechanical Engineering Standards Committee and is a revision of
BS 1134-1:1972, which is withdrawn.
The definitions given in this Part of BS 1134 supersede those given in BS 6741-1
and BS 6741-2. BS 6741-1 and BS 674I-2 are accordingly withdrawn.
BS 1134 was first issued in 1950 and revised in 1961 and 1972. This revision
takes account of the 1982 edition of ISO 468 "Su.rface roughness
- Paratneters,
their ualu,es and general rules for specifying requ.iremenfs"published by the
International Organization for Standardization.
BS 1134- 1:1972 dealt with two parameters, R^antd R,, whereas this edition covers
the additional parameters R , S-, S and fo.
Additional parameters may be found in ISO 4287-L:1984 "Su,rface roughness
Surface and its parernet?rs" ar'd in ISO 4287-2:1984 -
Terminology
- Part 1:Terminology
"Su,rface rou,ghness Part 2: Mea,surement of su,rface roughness
paranxeters". - -
BS 1134-2 gives general information and guidance.
A British Standard does not purport to include all the necessary provisions of a
contract. Users of British Standards are responsible for their correct application.
Compliance with a British Standard does not of itself confer imrnunity
from legal obligations.

Summary of pages
This document comprises a front cover, an inside front cover, pages i to iv,
pages I to 26, an inside back cover and a back cover.
This standard has been updated (see copyright date) and may have had
amendments incoraorated. This will be indicated in the amendment table on the
inside front cover.

o BSI 11-1999 lll

 BS 1134-1:1988

Section 1. General

1 Scope
This Part of BS 1134 describes methods for the assessment of surface texture of machined, self-frnished and
other surfaces and describes the characteristics and parameters standardized for use in industry.
It embraces the following.
a) The terminology to be employed in statements relating to surface texture and measurement of surface
texture.
b) Preferred values for the grading of surface texture (see Appendix A).
c) Sampling lengths and cut-offvalues to be used in graphical procedures and instrument construction.
d) The graphical determination of the following parameters: -
1) .R., arithmetical mean deviation of the profile;
2) R", ten point height of irregularities;
3) E' maximum height of the profile;
4) S-, mean spacing of profile irregularities;
5) S, mean spacing of local peaks of the profile;
6) fo, profile bearing length ratio.
e) The determination of parameter values by instrumental means.
0 The essential instrument requirements to ensure repeatability of performance.
g) The information to be given in statements relating to surface texture requirements.
NOTE The titles ofthe publications refelred to in this standard are listed on the inside back covet.

2 Definitions
For the purposes of this Part of BS 1134 the following definitions apply.
2.1 Terms relating to the surface, profile and daturn
2.1.1
real surface
the surface limiting the body, separating it from surrounding space
2.1.2
real profile
the profrle that results from the intersection of the real surface by a plane conventionally defined with
respect to the geometrical surface (see Figure 1)

2.L.3
geometrical surface
the surface determined by the design, and defined by the drawing and/or other technical document,
neglecting errors ofform and surface roughness (see Figure 1)
2.1.4
geometrical profile
the profile that results from the intersection of the geometrical surface by a plane conventionally defined
with respect to this surface (see Figure 1)
2.L.5'
effective surface
the close representation of a real surface obtained by instrumental means (see Figure 1)

2.r.6
effective profile
the profile that results from the intersection of the effective sur{ace by a plane conventionally defined with
respect to the geometrical surface (see Figure 1)

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2.r.7
profile transforrnation
an action (operation) that results intentionally or unintentionally in the transformation of a profile at any
stage in the process of measurement, e.g. traversing with a stylus, filtering, recording
2.1.8
transforrned profile
a profile produced as a result of transformation
2.L.9
intentional profile transformation
a profile transformation that is made in order that measurements are performed in accordance with the
specified requirements for a given measurement
NOTE The following are examples of intentional profile transformations.
a) Ttansformation of the sur:face ptofile into an electric signal to make it possible to use electronic measuring instruments.
b) Transformation ofthe effective profile by defined filter means ofsuppressing those undulations of the real profile that are not
or are not fully to be included in the measured toughness parameters of the surface.
2.1.10
unintentional profile transformation
a profrle transformation arising from the imperfection of the measuring instrument or of its separate parts
and usually seen as distortions of the information about the profile
NOTE An example of an unintentional plofrle transformation is the distortion of the information about the profiIe when traversing
it with a stylus having a finite tip radius.
2.1.11
surface texture
those irregularities with regular or furegular spacing that tend to form a pattern or texture on the sugface
NOTE This texture may contain components of roughness (see 2.1.12) and waviness (see 2.1.13).
2.1.12
roughness
the irregularities in the surface texture that are inherent in the production process but excluding waviness
and errors ofform (see Figure 1)

o BsI 11-1999
 BS 1134-1:1988

Loy (direction of
dominsnt pattern)

Roughness
spocrn9

Kcy:
1. Geometrical surface
2. Effective surface
3. Geometrical profile
4. Effe6iw profile

Figure 1- Surface characteristies and terrninology

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BS 1134-1:1988

2.1.13
waviness
that component of surface texture upon which roughness is superimposed (see Figure 1)
NOTE Waviness may result foom such factors as machine or wotk deflections, vibrations, chatter, heat treatment or warping
strails.
2.1.14
lay
the direction of the predominant surface pattern, ordinarily determined by the production method used
(see Figure 1)
2.1.15
traversed length
the complete length of the pick-up movement along the surface being measured (se'b Figure 2)
2.1.L6
reference line
the line chosen by convention as a reference to serve for the quantitative evaluation ofthe roughness ofthe
effective profiIe (see Figure 2)
2.1.17
sampling length, I
the length of the reference line used for identifring the irregularities characterizing the surface roughness
(see Figure 2). The sampling length is measured in the general direction of the profile

Samptirq tengths 11=lr=13=lo=ft

Figure 2 Traversed length

-
2.1.18
evaluation length, I,
the length over which the profrle is assessed. It may contain one or more sampling lengths (see Figure 2)
2.1.19
profile departure, y
the distance between a profrle point and the reference line in the direction of measurement (see Figure 3)
2.1.20
mean line systern, system M
the calculation system used for the profi.le evaluation in which a mean line is taken as a reference line
2.1.21
least-squares mean line of the profile
a reference line having the form of the geometrical profile and dividing the profrIe so that, within the
sampling length, the sum of the squares of the profile departures from this line is the minimum

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 BS 1134-1:1988

2.1.22
centre arithrnetical rnean line of the profile
a reference line representing the form ofthe geometrical profile and parallel to the general dilection ofthe
profile throughout the sampling length, such that the sums of the areas contained between it and those
parts ofthe profile that lie on each side ofit are equal
NOTE The centre line (centte arithmetical mean line) is defined and used for graphical convenience. When the centre line has a
distinguishable periodicity and its general direction is therefore determinate, the "equal area" centre line is unique. When the profile
is in'egulat, the assessment ofthe general dilection becomes uncertain over a certain range. Within this range a family of"equal area"
centre lines can be drawn, one of which will be identical with the least-squares mean line.
2.t.23
electrical rnean line
in an electrical instrument, a reference line that is established by the circuits determining the meter
cut-off and which divides equally those parts of the transformed profile lying above and below it
2.1.24
local peak of the profile
a part of the profiIe between two adjacent minima of the profile (see Figure 4)

(l,

o
L
o-

Generql direction of the profite

NOTE Figure 3 represents a profile graph which, due to the difference in the vertical and horizontal magnifications, is a distorted
reptesentation of the real profile. For this reason, the profile departures should be measured in the same dilection as that used to
determine the real pr.ofiIe. On the real profile, the angles, , between the reference line and the general dilectiol of the profile within
the evaluation length are very small. Thus, the differ:ence between the plofile departures measured perpendicular to the r:eference
line and those measured perpendicular to the genetal dilection ofthe profile may be negligible. Hence, on the real surface, the p
departures should be considered perpendicular to the reference line.
Figure 3
- Profile departure

Locot peok of the prcfite

Figure 4 Local peak of the profile

-

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BS 1"134-1:1988

2.1.25
spacing of local peaks of the profile
the length of a mean line section between the two highest points of adjacent local peaks of the profile
projected on the mean line (see Figure 5)

lkon line

Figure 5 Spacing of local peaks of the profile

-
2.1.26
local valley of the profile
a part of the profile between two adjacent maxima of the profile (see Figure 6)

Figure 6 Local valley of the profile

-
2.1.27
local irregularity
a local peak and the adjacent local valley
2.L.28
profile peak
an outwardly directed (from material to surrounding medium) portion of the profrle connecting two
adjacent points of the intersection of the profile with the mean line (see Figure 7)

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 BS 1134-1:1988

-Line of profite

%'rll:1"
NOTE The outwardly dilected portion of the profile at the beginning or end of the sampling length should always be considered
as a profile peak'
Figu re 7 peaks
-profile
2.L.29
profile valley
an inwardly directed (from surrounding medium to material) portion of the profile connecting two adjacent
points of the intersection of the profrle with the mean line (see Figure 8)

Prof ile
valleys

-- - Line of prof ite

NOTE The inwarilly directed portion of the profiIe at the beginning or end of the sampling length should always be considered as
a valley.

Figure 8
- Profile valleys
2.1.30
profrle irregularity
a profrIe peak and the adjacent profile valley
2.1.3L
spacing of profile irregularities
the length of a mean line section containing a profrle peak and the adjacent profile valley (see Figure 9)

o BSI r1-1999
BS 1134-1:1988

Mean line

Figure 9 Spacing of profile irregularities

-
2.1.32
line of profile peaks
a line parallel to the mean line and passing through the highest point of the profile within the sampling
Iength (see Figure 7)
2.1.33
line of profile valleys
a line parallel to the mean line and passing through the lowest point within the sampling length
(see Figure 8)
2.1.84
profile section level, c
the distance between the line of profrle peaks and a line intersecting the profile, the latter being parallel to
the line of profile peaks (see Figure 10)
NOTE The proflle section level can be determined in micrpmetres or in petcent of 8r, the maximum height of the profile (see 2.2.2).

Line of profile peoks

Line intersecting
lhe profite
Meon line

Figure 10 Profile section level

-

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 BS 1134-1:L988

2.1.35
prolile bearing length, ryo

the sum of the section lengths obtained by cutting the profile peaks by a line parallel to the mean line
within the sampling length (see Figure 11)

Line intersecting
the profite
Meon line

flp=a+b+c+d+e
Figure 11 Profile bearing length
-
2.2 Terms associated with surface roughness parameters
2.2.L
arithrnetical rnean deviation of the profile, R,
the arithmetical average value of the departure of the profile above and below the mean line (centre or
electrical mean line) throughout the specified sampling length (see Figure 12). The arithmetical mean
deviation is given by the equations:
1
n"=T J-to lr{'lla'
or approximately:
R"*:Ii, tr,t

where
I is the sampling length;
y is the profile departure;
n is the number of profrle departures.
NOTE In practice, the values of R^ are determined within the evaluation length which includes several sampling lengths. The
sampling length is equal to the cut-off.

Figure 12 Arithxnetical mean deviation of the profile (.R")

-

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BS 1134-1:1988

qqs,
maximum height of the profile, R"
the distance between the line of prnflle peaks and the line of profile valleys within the sampling length
(see Figure 13)

profite

Meon tine

'pnofite

Figure l3 Maximum height of the profile (R")

-
2.2.3
ten point height of irregularities, .R,
the average distance between the five highest profrIe peaks and the five deepest profile valleys within the
sampling length, measured from a line parallel to the mean line and not crossing the profile (see Figure 15)
2.2.4
mean spacing of profile irregularities, S-
the mean value of the spacing of the profrle irregularities within the sampling length (see Figure 16)
2.2.5
rnean spacing of local peaks of the profile, S
the mean value of the local peak spacing of the profile within the sampling length (see Figure 17)
2.2.6
profile bearing length ratio, ln
the ratio of the profrle bearing length to the sampling length
2.3 Terms associated with instruments for the measurement of surface roughness by the profile
rnethod
2.3.L
profile recording instrument
an instrument recording the coordinates of the profrle of the surface texture
2.9.2
profile instrument
an instrument used for the measurement of surface roughness parameters
2.3.3
contact profile instrurnent, system M
a contact (stylus) instrument of consecutive profile transformation used for the measurement of surface
roughness parameters according to system M (the mean line system)
NOTE See ISO 3274:1975.
2.3.4
modified profile
the effective profile defined by the combination of a stylus and profile frIter, the filter being used for
selecting a part of the spectrum of the real profrIe to be taken into consideration in the measurement of
surface roughness parameters

10 o BSI 11-1999
 BS 1134-1:1988

2.5.5
profile instrurnent with predeterrnined evaluation length
an instrument in which the length used for measurement has a defined beginning and end
NOTE These instruments generally indicate and hold the teading ofthe measured parametel obtained at the end ofthe stated
measuring length.
2.3.6
profrle instrument with "running" evaluation length
a pro{ile instrument with running evaluation length giving a running average
2.3.7
static rneasuring force
the force which the stylus exerts along its axis on the examined surface without taking into account the
dynamic components that arise from the traversing of the surface by the stylus
2.3.8
rate of change of the static measuring force
the change of the static measuring force per unit displacement of the stylus along its axis
2.3.9 cut-off, ),s
the value of the wavelength ), numerically equal to the sampling length and conventionally taken as the
upper limit of transmission of the instrument
NOTE The given upper limit conventionally separates the nominally transmitted components of the effective profile spectrum fi.om
those that are nominally suppr.essed.
2.3.10
vertical magrrification of a profile record, V,
the ratio of the recorded horizontal displacement to the displacement of the stylus along the surface
2.3.r1
horizontal rnagnifrcation of a profile record, yh
the ratio ofthe recorded length ofthe recorder chart to that ofthe stylus displacement along the surface
2.3.t2
error of vertical rnagnification of a profile record
the percentage difference between the nominal and the actual values of the vertical magnification referred
to the nominal value
2.3.13
error of horizontal rnagrrification of a profile record
the percentage difference between the nominal and the actual values of the horizontal magnification
referred to the nominal value
2.5.L4
basie error of a profile instrument reading
the percentage difference between the instrument reading and the value of the surface roughness
parameter as defined by the stylus and cut-off (without skid) of the instrument
2.3.15
rnethod divergence of the instrurnent reading
for a given measured profrle, the percentage difference between the value of the surface roughness
parameter determined with respect to the electrical mean line of the defrned wave filter and a succession
of straight centre arithmetical mean lines each equal in length to the cut-off, both determinations being
referred to the same part and overall length of the same cross section (see Appendix B)

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BS 1134-1:1988

Sectiotr 2. Determination of surface roughness

3 Sampling lengths
Normally the appropriate sampling length of surface, which determines the corresponding cut-off to be
used (see 6.3), shall be selected from the range of sampling lengths given in Table 1.
In special cases which require the choice of values of sampling length other than those specified
in Table 1, sampling and evaluation lengths shall be stated on all records of the test.
Table 1- Sarnpling lengths
rnm
0.08 I

lo.ooa
o.25 10.0r
0.8 10.03
2.5 10.1
8.0 t0.3

4 Graphical determination of parameter values

4.1 Graphieal determination of fi" values
4.1.1 Observe the procedure in 4.1.2 to 4.1.8 when determining B. values from graphical recordings.
NOTE Ifthe surface is intentionally curved, the curvature will generally be neutralized, prior to recording, by some form of guiding
or frlter device.
4.1.2 Assume the surface is nominally flat, and that the record is produced in rectilinear coord.inates in
which a truly flat surface is represented by a straight line.
4.1.3 First determine the centre arithmetical mean line of the profile for each successive sampling length,
l, contained within the evaluation length of the record, as given in 4.1.4 to 4.1.6.
4.1.4 Draw a straight line A"B" through the lowest profile valley and parallel to the general course ofthe
record over the sampling length I [see Figure 14a)].
NOTE I The slope of the line A"B" can usually be determined by eye with sufficient accuracy.
NOTE 2 Where the texture has a distinguishable periodicity it is essential that the sampling length should be chosen to include a
whole number of wavelengths.
4.1.5 Determine the area, P, between the profrle and the line A"B" either by measuring equally-spaced
ordinates or by the use of a planimeter, through the chosen sampling length.
4.1.6 The height, .F1-, of the centre arithmetical mean line above A'B" (the line of profile valleys) is given
by the equation:
I)
--m
H -t-
l
where
P is the area between the profile and line of profile valleys (A"B");
I is the sampling length.
4.1.7 Draw the centre arithmetical mean line AB parallel to the line of profrIe valleys (A"B") at the height
11- above it [see Figure laa)].
4.1.8 Determine the areas h, 12, rs ... and s1, ss ... above and below the centre arithmetical mean line
[see Figure lab)]. The value of .Bu (in pm) is calculated from the equation:

_ El=., ,i*Zni=t ls,l .. rooo

^
fra---
" ,,

where
ri is the area (in mmz) of the lth profrle peak;
si is the area (in mmz) of the ith profile valley;
I is the sampling length (in mm);
V" is the vertical magnification of the profrle record.

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 BS 1134-1:1988

4.1.9 The required value of B. over the evaluation length is taken as the mean of the successive values of
the sampling length.

Hn

(a) (b)

Figure 14 Graphical deterrnination of Ru values

-
4.2 Graphical determination of -R, and E" values
For some purToses it is convenient to have an assessment of average peak-to-valley height of surface
irregularities. The -8, or "ten point height" method (see Figure 15) is an arbitrary way of avoiding the effect
of exceptional peaks and valleys in the fi.nal computation, and is used in determining average
peak-to-valley values. ft, values are generally from four to seven times the corresponding R^ values, the
ratio dependingupon the shape ofthe profile.

of profite peoks

of profile votteys

\ Yz Yr{, \, Yt Y, YB Ys Yn

Figure 15 Graphical deterrnination of .R, values

-
Measure the five highest peaks and five deepest valleys from an arbitrary base line A"B" drawn parallel to
the centre arithmetical mean line AB of the chosen sampling length l. R, (in pm) is then given by the
equation:

lYr + Ya +'..Ygl - lYz + Yt + "'Yrcl

f.- x 100O
5x Vu

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BS 1134-1:1988

where
Yr, Yz,. . . Yro is the distance (in mm) of peaks and valleys from the arbitrary base line A"B";
Vu is the vertical magnification of the profile record.
The value of B, (in pm) is calculated from the equation:

Y,.
R,,=
,vu-' x 1000

where
Yv is the maximum height (in mm) of the profrle record;
Vu is the vertical magnification of the profile record.
4.3 Graphical deterrnination of S- values
Draw the centre arithmetical mean line AB (see Figure 16) for the sampling length, l, and identify the
profrIe peaks, noting that the minimum height of the profrIe peaks to be taken into consideration is
specified as 10 % of ,R". The mean spacing of the profile irregularities S- (in trtm) is calculated from the
equation:

c= Smr +Sm2+....,...S.,
x 1000,
nxV6
where
S-u is the length (in mm) of dean line section containing the nth profile peak and the adjacent profile
valley;
,1, is the number of sections included in the determination;
Vh is the horizontal magnification of the profile record.

Figure 16 Graphical determination of S- values

-
4.4 Graphical deterrnination of S values
Draw the centre arithmetical mean line AB (see Figure 17) for the sampling length, l, and identify the local
peaks, noting that the minimum spacing of the local peaks that is to be taken into consideration is specified
as I o/o of the sampling length, while the minimum height of the local peaks that is to be taken into
consideration is specified as 10 o/o of R". The mean spacing of local peaks of the profrle, S, (in pm) is
calculated from the equation:

+s2 +-.......sr
-s-sr nxV6
x looo

o BSI 11-1999
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 BS 1134-1:1988

where
Sr - . . Su are the spacing of local peaks of the profile (in mm);
tL is the number of spacings included;
Vh is the horizontal magnification of the profile record.

Figure 17 Graphical determination of S values

-
4.5 Graphical determination of lo values
Determine the profile bearing length, 4o, which is the sum of the section lengths obtained by cutting the
profile peaks by a line (A'B" in Figure 18) parallel to the arithmetical mean line within the sample length,
l, att}ae profile section level, c, below the line of profile peaks. The profile bearing length, lo, is given by the
equation:
0o*a+b+c+d+e
where
a, b, c. . . are the section lengths.
The profile bearing length ratio, fo, expressed as a percentage, is given by the equation:

r?^
f-=--x100= a+b+c*d*e+....
-ll : x100

where
4o and I are in the same units.

Line of profite peoks

Figure 18 Graphical determination of lo values

-

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BS 1134-1:1988

5 Statements of surface roughness

S.l General
The following information is that which shall be given in statements relating to surface roughness.
5.2 Surface roughness values
For requirements specified by the maximum value (in pm) of the surface roughness parameter, none of the
measured values of the parameter of the whole surface being inspected shall exceed the value specified on
the drawings or in technical documents. In such cases, the suffix "max" shall be added to the parameter
symbol, as shown in the following example:
-R, max 12.5
5.3 Limiting values
When both lower and upper limit values need to be specifred, these shall be expressEd (in pm) as shown in
the following examples:
0.8 R,12.5
n"
R^o.4 R, 6.3
If a single value is stated it shall be the upper limit value and shall be expressed (in ttm) as shown in the
following examples:
R.0.9, R"L2.5
NOTE Variations in the value of the surface roughless palameter in most engineering sur{aces are found to approximate
sufficiently closely to the normal (Gaussian) distribution for the properties of the nolmal distribution to be applied. Thus, the lower
and upper limits of the toughness par:ameter values are the limits between which 68 o/o of all the measured values of the parameter
are expected to fall.
Fot requirements specified by the upper limit of the surface loughness parameter, the surface is considercd to be acceptable if not
more than 16 % of all the measured values of the parameter exceed the value specified on the drawings or in technical documents. In
cases where the lower limit is specified, the surface is considered to be acceptable ifnot more than 16 % ofall the measured values of
the roughness parameter can be exceeded by the specified value.
5.4 Cut off values
When the cut-offvalue is other than 0.8 mm the value shall be indicated in parentheses following the
sudace roughness value (in pm), as shown in the following example:
R"0.2 (2.5)
NOTE Apart fi'om indicating the cut-offto be used in assessment, the cut-offvalue denotes that dominant peak spacings gaeater
than the cut-off are not present on a surface.
5.5 Lay
Itis sometimes necessary to speci$ the direction of lay, in which case it shall be as defrned as in Figure 22
and expressed in accordance with the following example:
R" 0.8 C
NOTE C refers to the eymbol for lay which is cilcular (see Figure 22). Unless otherwise specified, the implication is that the surface
roughness should be measured acroes the direction ofthe lay.
5.6 Production process
When production of a surface is to be limited to the use of one particular process, the process shall be stated.

16 o BSI 11-1999
 BS 1134-1:1988

Section 3. Instrumentation

6 Stylus-type measuring instruments

6.1Stylus
6.1.1 Tip radiu.s of the stylus. The nominal value of the tip radius of the stylus shall be one of the following:
a)2+0.5pm;
b) 5 + 1pm;
c) 10 + 2.5 ptm.
See also Appendix C.
6.1.2 Stylus angle. The nominal value of the stylus angle shall be one of the following:
a) 1.57 radians (90o);
b) 1.05 radians (60").
6.1.3 Static nteaar,ring force. The static measuring force shall be sufficient to ensure continuous contact
between the stylus and the surface being measured and shall be not greater than that given in Table 2.
Table 2 Static measuring force of the stylus
-
No-inal tip Maximum static Maxirnum rate of
radius of stylus measuring force at mean change of
level of stylus measuring force
pm mN N/m
2+0.5 0.7 35
5+1 4.0 200
10 + 2.5 16.0 800

6.2 Skid
6.2.1 Shid dimensiort s.If a skid is employed, its radius in the direction of the traverse shall be not less
than 50 times the meter cut-off used.
If two simultaneously operative skids, as shown in Figure 19, are used, their radii shall be not less than
eight times the meter cut-off.
NOTE Although the use of the skid may, when applied under suitable conditions, introduce no error of any great practical
significance, external datum unite should be used in all serious metrological work such as, for example, calibration procedur.es, and
in the case of sur{aces of limited area or requiring the use of cut-off values of 2.5 mm or greater.

r---->

Figure 19 Stylus acting midway between two skids

-
6.2.2 Skid surface roughness. The surface roughness of the skid as determined by the ten point height of
irregularities, -8,, shall be not greater than 0.1 pm when measured in the direction of traverse.
6.2.3 Skid force. The force exerted by the skid on the surface to be measured shall be not greater than 0.5 N.
6.3 Traverse
In profile instruments with predetermined or running evaluation lengths, the length shall depend on the
meter cut-offvalue trs within the limits given in Table 3.

@ BSI 11-1999 t7
BS 1134-1:1988

Table 3 Evaluation lengths

-
Type of profile rmeter Cut-off Evaluation length
IB
Min. Max.
mm mm mm

0.08 0.4 I
0.25 L25 5
Predetermined evaluation length 0.8 2.4 8
2.5 5 15
8 16 40
Running evaluation length 0.25 2.5 16
0.8 5 16

6.4 Values of vertical and horizontal magnification

The values of vertical and horizontal magnification for profrIe recording instruments shall be selected from
the following series:
Vertical (V"): 100, 200, 500, 1 000, 2 000, 5 000, 10 000,20 000, 50 000, 100 000,200 000, 500 000,
1 000 000.
Horizontal (V): 10, 20,50,100, 200, 500, 1 000,2 000, 5 000, 10 000,20 000, 50 000.
6.5 Transrnission characteristics in the long wavelength
6.5.1 Rate of attenu.ation. The rate of attenuation shall be equivalent to that produced by two independent
C-R networks of equal time constant in series. This describes a system in which the maximum slope of the
transmission curve is 12 dB per octave and in which the phase shift at the 75 % cut-off trs is 60o.
The transmission coefficient of such a system shall be given by the equation:

output to indicating system 1

input to stvlus (1 - i o.szzl t,

As

where
j=J-1;
tr is the wavelength;
trB is the meter cut-off.
The effective cut-off wavelengths shall be taken at 75 o/o
transmission. These are deemed to be equivalent
to the sampling lengths in Table 1.
NOTE In a practical determination, the valueo of the transmission coefficients for the characteristics shown are measured relative
to the flat part of the transmission curwe (see Figure 20).
6.5.2 Cut-off ualues. The cut-off values (in mm) to be used in instrument construction shallbe selected from
the following series:
0.08, 0.25, 0.8, 2.5, 8.0.
NOTE I A cut-ofrof 0.8 mm is found adequate for moet of the finer surfaces.
NOTE 2 Nominal sinusoidal foequency response characteristics for a profrle instr"ument are shown by the ratios given in Table 4
(see also Figure 20).
The permitted deviations from the nominal values of the transmission coefficients shall be as given
in Table 5, and graphically presented in Figure 21, and these allow the cut-offto be assessed at
between 70 % and 8O o/o of maximum transmission.

18 oBSI 11-1999
 BS 1134-1:1988

E
c,
.9
vt
.9
e
vl
c.
30
o
L
F 2A

10

0
0.25 0.8 25 8.0
Wovelength in mm

Figure 20 Profrle instrument frequency response

-
Table 4
- Norninal sinusoidal
characteristics
frequency response
for a profile instrument
Wavelength Percentage transmission
Cut-off Cut-off Cut'off Cut-off
0.25 mrn 0.8 mm 2.5 mm 8.0 mm
mm %

0.025 99.7
0.05 98.7
0.08 96.7 *.,
0.10 94.9 99.5
o.25 75.0 96.8 *.,
0.5 42.9 88.5 98.7
q9i
0.8 75.0 96.7 99.7
1.0 15.8 65.8 94.9 99.5
2.5 2.9 23.5 75.0 96.8
5.0 0.75 7.r 42.9 88.5
8.0 .,(l 99 ti 75.0
10.0 1.8 15.8 65.8
25.O. to 23.5
50.0 0.75 7.L
80.0 to
NOTE Because of practical difficulties in measurement at the very short
wavelengths involved, the electrical transmission characteristic for 0.08 mm
cut-off, although nominally of the same form as for the longer cut-offvalues, has
not been tabulated.

oBSI 11-1999 19
 BS 1134-1:1988

7 Accuracy
7'l statement of basic error of caribration of ,R, instruments
The basic error of profile instrument read.ing (as defined
in 2.s.r4) given within the cut-off by an
instrument in optimum adjustment and use (see c.5), anJ
p"*""rrluge of the designated
P"arameter of an instrum"ot "*'pr""""d "" "
$liir'"tlt;j"HffilHf,1ffs ""ibration "p""i-"r, "o-prvirrg with-BS osoa,
o;* n

where
x is the fraction of the range indicated by the instrument:
p is a percentage offull range;
g is a percentage ofreading.
thus expressed does not include the effect of deviatio's
Xl""*;""*Tffitlfr'ff:."r'ffi;"jffrT':tlon in the transmission
7.2 Deviations of transmission coefficients
The permissible deviations of the amplitude transmission
coeffrcient (see Table b and Figure 2r) of aprofrle
instrument from the nominal transmission coefficient shall
be given by the equations:

1.03
upper limit
t + g.29 1\;,
l"
o'97
lower limit -
I + o.3e (lAs ),
where
tr is the wavelength;
trB is the meter cut-off.
Table 5 Upper and lower limits of transmission coeffieients
-
Wavelength, tr Transmiesion coefficient
Cut-off, ),s Lower limit
dB dB
0.1 96.6
0.2
- 0.30 I02.7 - 0.23
95.5 - 0.40 101.8 + 0.15
0.3 93.7
0.5
- 0.56 100.4 + 0.03
88.4 - 1.07 96.0 - 0.26
0.7
1.0
8L.4 - 1.78 90.2 - 0.90
69.8 - 3.13 79.8
1.5 51.7
- 1.96
2.0
- 5.74 62.3 - 4.L2
37.9 - 8.43 47.7 - 6.44
3.0 2I.5
5.0
- 13.5 28.5 - 10.9
10.0
9.0 - 20.9 12.5 - 18.1
2.4 3.4
NOTE An explanation olt
- 29.3
given at Appendix B, and factors affecting thie statement
"*iili,'"a ,t
of a""uo"y u""
Appendix C.

20
oBsI 1r-1999
 BS 1134-1:1988

-5

-10

-15

-n

Wovetength .r\
Meter cut-off r\B

Figure 21- Permissible deviations of the transmission coefficient

o BSI 11-1999 2l
BS 1134-1:1988

Symbol Interpretation

--
Parallel to the plane of projection of the
view in which the symbol is used
"ra
direc lion

direc tion

I Perpendicular to the plane of

projection of the view in which the
symbol is used
""rA
direction
Crossed in two slant directions relative

X to the plane ofprojection ofthe view in

which the symbol is used

Multi-directional
M

Approximately circular relative to the

centre of the surface to which the
c symbol is applied

Approximately radial relative to

the centre of the surface to which
R the symbol is applied

NOTE Should it be necessary to specifi' a dilection of lay not clearly defined by these symbols, this may be done by a suitable note
on the drawing.

Figure 22 Syrnbols for the direction of lay

-

.)g o BSI 11-1999

 BS 1134-L:1988

Appendix A Pararneter values

Values are normally determined as mean results from the measurement of several sampling lengths taken
consecutively along the profile. These may be determined graphically in accordance with clause 4 or by
direct reading instruments. The direction in which the measurement is made should in general be
approximately at right angles to the lay if the surface texture has a directional quality (see Figure 22).The
parameter values specified should be selected from the ranges of preferred values given in Table 6,
Table 7 and Table 8.
Table 6 Preferred norninal values for
- rnean deviation of the profrle
arithmetical (R")
pin
400 16 000
200 8 000
100 4 000
50 2 000
25 1 000
L2.5 500
6.3 250
J.Z t25
1.6 63
0.8 JZ
0.4 16
o.2 8
0.1 4
0.05 ,
0.025 1
0.0125 0.5

Table 7 Preferred nominal values for

- height of irregularities (fi"),
ten point
and maxirnum height of the profile (ft")
um [rrn pm uln
1 600 64 000 o.L t25
800 32 000 1.6 63
400 16 000 0.8 JZ
200 8 000 o.4 16
100 4 000 o.2 8
50 2 000 0.1 4
25 1 000 0.05 ,
t2.5 500 0.025 1

6.3 250

oBSI 1t-1999 23
BS 1134-1:1988

Table 8 Preferred norninal values for rnean

spacing -of profrle irregularities (S-), and
mean spacing of local peaks of the profile (,S)
mm lll mm tn
L2.5 0.500 0.2 0.008
6.3 0.250 0.1 0.004
J.Z 0.125 0.05 0.002
1.6 0.062 0.025 0.001
0.8 0.032 0.0125 0.0005
o.4 0.016 0.006 0.0003
NOTE The values given in Table 6, Table 7 and Table 8 are expressed as "prefer"red" in order to discotn'age unnecessary vatiation
ofthe values expressed on drawings. It should be realized that in some citcumstances, other values may be specified.

Appendix B Method divergenee of instrument reading

B.l General
When two methods of measurement which are both standardized give results which are nominally but not
precisely equal, the numerical difference is referred to as "method divergence".
Thus the two methods referred to in this standard for selecting the texture to be measured (by sampling
length and cut-ofr), although deemed to be acceptable equivalents of each other, treat the profile in different
ways that may lead to slightly different numerical evaluations.
8.2 Effective cut-off
Reference to Figure 20 will show that transition occurs gradually from the fully transmitting to the
substantially rejecting part of the standardized characteristic. From consideration of frlter theory,
experimental results and various practices, the effective cut-off has now become rated, by accepted
convention, at the wavelength for which there is 75 %o of I};.e full transmission of a pure sinusoidal
waveform, with a tolerance permitting a range from 70 % to 8O %. This means that for a sine wave having
a wavelength equal to the sampling length, an instrument calibrated in the usual way for a sine wave
occurring on the flat part of the characteristic would indicate an B. value equal to 75 % of the value
obtained from the profrIe graph by planimetry. For short wavelengths and most machined surfaces the
divergence is usually small, and this is generally the case for random profiles. It is usual to accept the
instrument reading as the operative basis for grading workpieces in the workshop, and to avoid extreme
divergences by use of a sufficient cut-off.
8.3 Range of method divergence
The typical and extremes of method divergence found by comparing metered R, values with the values
computed from the least squares mean line are shown in Table 9.
Table 9 Comparison of .R, values obtained by
-graphical and instrumental rneans
Type of Cut-off B" frorn least squares .R" from Method
surface mean line of graph instrument divergence
mm pm pm o/

Milled 2.5 0.80 0.86 +7

Milled 2.5 2.66 2.67 0
End-milled 2.5 0.90 0.81 -11
Turned 2.5 6.74 6.86 +2
Turned 2.5 0.83 0.81 _4,

Ground 0.8 0.71 0.66 -8

Ground 0.8 0.48 0.53 +9
Lapped 0.8 0.02 0.02 0
NOTE Mean method divergence for 2.5 mm cut-off: 0 %; standard deviation: 4 %.
Mean method divergence for 0.8 mm cut-off: I %; standard deviation: 7 %.
These mean method divergences and standard deviations were obtained from measurements
on 22 surfaces.

24 o BSI 11-1999
 BS 1134-1:1988

B.4 Electrical mean line

A further point concerns the shape of the self-determined electrical mean line found by the frlter. This is
generally not a straight line but an undulating one which weaves its way through the profile as shown
in Figure 23. The undulations account for the method divergence. Equations and computing tables for the
electrical mean line found by the standard filter are available from manufacturers, and these can serve as
a basis for determining precisely, by computation from digitized profile records, the errors of instruments
complying with this standard.
In practice, however, it is generally only in the case of precise instrument calibration that it is necessary
to take the details of filter behaviour fully into account.

Vt/Vn

6round V' / Vt'

Vertical magnification { Vy) = 50OO

Horizontal magnification (t/6) = 10O

Figure 23 Centre arithrnetical mean lines (A) and electrical mean lines (B)
-
Appendix C Factors affecting the statement of accuracy
C.l General
Many instruments are responsive to a single variable (e.g. length, angle, electric current) and have few
sources of error. These errors can be expressed simply, and it is a normal expectation that this should be
done.
Surface instruments are more complicated, for the quantity to be measured has generally to be derived
from a fluctuating signal representing the profile of a sample of the surface. Errors can arise from different
sources having quite different error laws, and the total error does not lend itself to expression in a simple
yet meaningful way.
C.2 Calibration
Workshop calibration is generally effected with the aid of instrument calibration specimens complyingwith
BS 6393. Ideally, in addition to being marked with substantially its full value, assuming negligible
instrument losses, each specimen should be accompanied by a statement of the reading that should be
obtained from it by an instrument having given stylus dimensions and for each mean transmission
characteristic. This is a refinement that has still to be treated in a formal way.
The overall amplification is left as an adjustment for the user to make by means of one or more
potentiometers which have to be set in conjunction with an instrument calibration specimen or with a
calibrated test specimen. The attainable accuracy therefore starts with the calibration specimen and the
user's skill in allowing for its characteristics and in securing with it the best overall adjustment of the
instrument. It is envisaged that the use of more than one test specimen will become normal practice.

oBSI 11-1999 25
BS 1134-1:1988

C.3 Instrurnent error

If the instrument is set up to give the correct reading for the calibration specimen allowing for all relevant
characteristics, the basic instrument error at this point in its range of operation will be that of the
specimen, often assumed to be zero. However, the working range of the instrument may be considerable,
extending vertically from around 0.025 ptm to several micrometres, and horizontally from around 2 pm to
several millimetres. Even if there is, after initial adjustment, no error in the calibrated region of the range,
there may be errors in other regions unless all parts of the instrument function perfectly. These errors
would be revealed by other precisely calibrated specimens. It is to the expression of the error throughout
the range, relative to the setting-up point, that 7.1 refers.
Instrument errors can arise from the condition of the stylus and datum device, various electronic sources,
and the errors inherent in the output behaviour and reading.
Assuming that the stylus is in good order, the radius of its tip may inlLuence the indication. Differences
between a 2 1tm and a 10 pm tip, while negligible for many surfaces, may be quite significant for others,
and especially for very fine ones. It does not follow that the blunter tip will always give the lower reading,
for on some surfaces (e.g. turned surfaces with sharp peaks) its own radius added to the radii of the peaks
may more than compensate for the losses in the valleys.
Instrument errors, apart from an error in overall amplification, may include errors due to electrical and
mechanical noise, to residual non-linearity, to ratio errors in range switching and, where applicable, to
errors in the transmission characteristic.
C.4 Noise
The effect of noise depends mainly on its proportion to the value of the signal. For most puryoses, the noise
can be taken as the reading given by a well-polished optical flat, free from scratches. When the proportion
of noise in the reading is small, say less than one-third, the noise can be neglected. When the two are equal
(as can happen with smooth surfaces) it can account for 70 o/o to 80 % of the reading. When it is twice as
great as the signal, it becomes dominant. The noise cannot be allowed for by simple subtraction, for i{the
two signals have values of e. and e", the nearest simple assessment of their combination will be given
by J @rr2 + nrz) . The actual value of the noise, for a given instrument, may valy over a wide range according
to the rigiaiiy of the set-up and the amount of vibration in the instrument and its environment.
C.5 Optimum adjustrnent
The reference in 7.1 to optimum adjustment and use may call for qualification. If an instrument were
required to give maximum accuracy over a small range of operation, its adjustment would naturally be
optimized for that range. On the other hand, if the instrument were required to perform as well as possible
over a wide range without readjustment, the adjustment would be optimized so as to minimize the residual
errors throughout the range.
The concept of optimum use will refer to environmental conditions, rigidity of workpiece mounting, and the
fact that readings near the top of the scale will generally be less subject to error than those near the bottom.
C.6 Staternent of accuracy
If it is accepted that a usefuI statement of accuracy should neither under-rate nor over-rate the capability
of an instrument, it becomes clear that no single figure can be expected to give fair information. On the
other hand, a specification attempting to cover all possible combinations would become impossibly complex
and again meaningless.

26 oBSI 11-1999
 BS 1134-1:1988

Publications referred to
BS 308, Engineering drawing practice.
BS 308-2, Recommendatiorts for dintensiotting and tolerancirtg of size.
BS 1134, Method for the assessntettt of su,rface textureD.
BS 1134-2, Generalinformatiort and guidance.
BS 6393, Specification, for calibratiott, of stylus irtstru.ntents.
ISO 468, Surface rou,ghness Parameters, their ualues and general ru,les for specifying requ.irentents.
-
ISO 3274, Instru,ntents for the rreasu,rement of su,rface roughness by the profile method Contact (stylu,s)
instruments of consecu,tive profile transformatiort Cotfiact profile meters, systent M. -
ISO 4287, Surface roughness Terntinology.
-
-
ISO 4287-1, Su,rface and, its parantetersr).
ISO 4287-2, Meaanement of surface roughness parantetersl).

1)
Referred to in the foreword only.

o BSI 11-1999
BS 1134-1:
1988
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-
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