43.

The time to failure on an electronic subassembly can be modeled by a Weibull

distribution whose location parameter is v= 0, 𝛼 = 1000 hours, and 𝛽 = 1/2.

Solution:
Let the time to failure denote 𝑋
Then 𝑋 is Weibull with cumulative distribution function
Parameters:
v= 0, 𝛼 = 1000 hours, and 𝛽 = 1/2

(a) What is the mean time to failure?

Weibull-distributed mean
1
𝜇 = 𝛼𝛤 (1 + )
𝛽

1
𝜇 = 1000𝛤 (1 + )
1
2

= 1000Γ(1 + 2)

= 1000Γ(3)

= 1000 ∗ 2!

= 2000 ℎ𝑜𝑢𝑟𝑠
(b) What fraction of these subassemblies will fail by 3000 hours?

(𝒙−𝒗)𝜷
[− ]
𝜶
𝑭(𝒙) = 𝟏 − 𝒆 , 𝒙 ≥ 𝒗

1
(3000−0) ⁄2
[− ]
1000
𝐹(3000) = 1 − 𝑒

= 1 − 𝑒 [−√3 ]

= 1 − 0.1978 = 0.8022