HYPERION Series

FT-IR Microscopes

F T-IR
Innovation with Integrity
FT-IR Microscopy
Application Example #1: A composite material of a
polyoxymethylen (POM) matrix (blue), PTFE particles
(green) and Aramide fibers (red) was analyzed to
visualize content distribution.
Application Example #2: NIR instead of MIR was used
to determine the concentration of a known compound.
The brighter, the higher the concentration.
Application Example #3: A transparent crystal
was chemically imaged to visualize OH-content.
High concentrations of OH are displayed in red.
Application & Support
The application possibilities of IR microscopy
are almost endless and range from analysis of
particles, coatings, microplastics, laminates,
composite materials, tissue samples, fibres,
paints, pigments, and pharmaceuticals to
even food safety.
Whether the identification of unknown
contaminants, determination of layer
thickness or the analysis API distribution in
drugs, the HYPERION stands out as the best
of its class.
Our goal is to make your application a
complete success. For this reason, Bruker
is mainly staffed by scientists and engineers
with practical experience and in-depth
knowledge.
Therefore, you can trust us at all times when
it comes to questions regarding the selection
of the best equipment or if you face difficult
analytical problems.
Bruker´s FT-IR devices ensure consistent
performance over many years. However, if
an unforeseen problem should occur, you
can count on a network of Bruker employees
ready to deal with these issues as quickly as
possible.
Application Example #4: An off-white particle was
found in a layer of resin. FT-IR imaging was used to
characterize the contaminant.
 Sample Visualization
Viewing devices
Contrast enhancement
The OPUS software provides numerous tools to
a
ideally analyze your sample visually. You can measure
distances and objects with a click of the mouse or add
annotations and zoom in to interesting areas.
All visual images are saved alongside the measured
infrared spectra and their specific sampling positions.
Binoculars are always available on the HYPERION,
providing a sample view with highest optical quality.
So even on samples with very low visual contrast, the
region of interest can be identified.
b
For maximum user convenience the CCD image of the
sample is not only shown within the OPUS software
but also on an optional screen that is integrated into
the microscope housing (HYPERION 2000/3000).

Confocal Design
The HYPERION’s design ensures brilliant visual
inspection while focusing on a perfect IR analysis.

Visual images of a geological sample. The infrared beam path is confocal and apertures
a) with crossed polarizers; b) bright field can be placed in conjugate image planes individually
before and after the sample in transmission as well as
reflection.
In addition to the manual, easily interchangeable
knife-edge and iris apertures also aperture wheels and
automated, software-controlled knife-edge apertures
are available.
Visual inspection
The first step of any microscopic analysis is visual
inspection of the investigated sample to locate specific
areas of interest. In some samples however, contrast
may be low and the visible image is blurry. For this, the
HYPERION packs diverse techniques to enhance the visual
quality of the sample in transmission or reflection.
To select the most appropriate visualization for a certain
sample, the HYPERION is equipped with a nosepiece
and a wide variety of objectives. Contrast irises (“Köhler”
apertures) are usually the first tool employed to enhance
sample observation.
Furthermore, rotatable polarizers are available in
transmission and reflection that enable the user to
distinguish samples exhibiting birefringence. For samples
that mostly scatter light, dark field illumination can be
applied. To utilize fluorescent labeling in samples, the
HYPERION can also be equipped with fluorescence
illumination capabilities. An autofocus function simplifies
the inspection of structured sample surfaces.

Optical beampath of HYPERION 1000/2000

Chemical Imaging
FPA Imaging and Single Point Spectroscopy
In FT-IR chemical images every pixel contains a
complete IR spectrum. To interpret this spectral data,
false color images can be rendered to emphasize
and characterize the sample’s properties like its
homogeneity or chemical composition.

Sample regions may be measured point by point by

sequential mapping or in one step by FPA imaging. The
HYPERION 3000 is able to do both and gives you the
power to acquire thousands of spectra per second via
its state-of-the-art focal plane array (FPA) detector.

Visual image of the USAF target 1951

with superimposed FT-IR image of
Group 9. Element 1 (width of 0.98 µm)
is fully resolved, while the lines in
Element 2 (0.87 µm) and 3 (0.78 µm)
can still be distinguished.

Identify the chemical composition of your sample:

Visual image of a painting containing an initially unknown oil
based paint (left) and the oil paint´s chemical composition
depicted as a false color image (right): white lead (dark blue),
animal glue (bright blue), calcium sulfate (red), epoxy resin
(yellow) and canvas surface (green).
The Power of FT-IR Imaging
Thousands of spectra are measured
simultaneously with a spatial resolution
only limited by diffraction of light. To
cover large sample regions IR images are
combined by automated sub sequential
acquisition using the motorized xy-stage.

Therefore, FPA imaging is applied where

smallest structures have to be resolved
and measurement time for large areas has
to be short.

Typical applications are:

Multilayer polymer laminates
Biological tissue
Coatings
Paintings (Art)
Study your sample with a new dimension of contrast: Pharmaceutical tablets
A microtome cut of cartilage tissue was analyzed by FT-IR
and the chemical image laid on top of the visual data with
Minerals
a transparent pixel plot, to correlate the chemical analysis Filtered particles (i.e. microplastics)
with the sample´s visual properties.
 OPUS Software
The HYPERION is controlled by OPUS, Bruker’s all-
in-one IR spectroscopy software. It includes the most
comprehensive collection of data acquisition, processing
and evaluation tools. With a few clicks the software
interface can be customized to address the needs of
routine as well as R&D laboratories.
All resultant spectra, visual images, IR images, RGB
and PCA plots, annotations and changes done to your
data are saved into one single file, improving data
security.
To simplify microscopic analysis with HYPERION, OPUS
is fitted with a smart software assistant. You are guided
through the measurement and always get optimal visual
and IR microscopic data out of your sample.
Analyze collected spectra by numerous univariate and
multivariate algorithms and extract the most relevant
data. Huge spectral libraries further improve data
analysis by comparing unknown compounds to its
database.
ATR-microscopic mapping
ATR microscopic mapping of a paint chip. The regions of
interest were selected by software and the sampling areas
exactly defined by the motorized knife-edge aperture.
Representative spectra for three layers (bottom) and visible
image are shown (top).
OPUS features a smart software assistant for IR microscopic
analysis and imaging that provides only those options, that matter
to the current measurement step. While providing a complete set of
functionality, operation of the HYPERION is easily learned.
Spectrometer Diagnostic
Only a constantly monitored spectrometer system can
guarantee the acquisition of reliable data. Therefore,
OPUS includes permanent online diagnostics, real-time
display of the instrument status, and integrated
automatic instrument tests (OQ, PQ).
OPUS FT-IR Microscopy and Imaging Features:
Correlate your visual and FT-IR data with
unprecedented clarity and accuracy with a wide
variety of 2D/3D views for 3D and 3D data
Put your data in the best possible light by using the
many display options of OPUS, such as RGB images,
3D cluster analysis, PCA analysis, artificial neural nets
(ANN), etc.
Directly select spectra per mouse click in 3D data files
Select spectra by similarity from 3D data files
Use smart filter options to get a quick data overview
Easily correlate 3D data with single-component spectra
Customize your interface to work as efficient as possible
Effortlessly browse our vast spectral libraries with our
powerful search tools
Validation
Bruker’s instruments and software offer
full compliance to the extensive regulations
pharmaceutical manufacturers or other regulated
industries face. Providing multiple user support,
electronic signature records and a high level of data
integrity and security, OPUS is a fully validated
software and fulfills all 21 CFR Part 11 requirements.
Sampling Flexibility
Depending on the measurement mode, FT-IR microscopy places specific requirements on the samples
examined.
For microscopic analysis in transmission, most samples must be optically thin and are typically cut in sections
about 5–15 μm thick. If samples are deposited on reflective substrates, they are measured in reflection. The
least expense are measurements in attenuated total reflection since here, samples that are neither reflective
nor transparent can be examined straightforward. For this reason, the quality and usability of the ATR objective
is crucial for most applications. Specialized objectives for large samples or thinnest coatings (even monolayers)
complete the equipment of a modern FT-IR research microscope.

Spectral Range ATR Objective

One of the many strengths of the HYPERION is the
adaptability to the analytical requirements. Equipped
with a wide variety of detectors, it can cover an very
broad spectral range, from the visible (VIS, up to
25,000 cm -1) to the far-infrared (FIR, down to 80 cm ‑1).
In addition to the manual, easily interchangeable
knife-edge and iris apertures also aperture wheels and
automated, software-controlled knife-edge apertures
are available. The HYPERION can be equipped with
up to two detectors in parallel, where the switching
between positions is controlled by the software.
The dedicated ATR lens (20x) for the HYPERION offers
optimum infrared light throughput with a clear sample
view. Once the sample positions have been defined
in the visual image, the ATR crystal is automatically
positioned and IR detection enabled. The internal
pressure sensor always ensures optimal contact
between sample and crystal during data acquisition
and allows to carefully select the pressure applied
during the measurement. If the motorized xy-stage
is combined with an automated z-drive, large sample
areas can be analyzed automatically by ATR mapping.
The ATR crystals (germanium or silicon) are available
in various tip sizes and permit the investigation of
dark materials. Incidentally, the ATR crystal acts as
a solid immersion lens, which increases the lateral
resolution by a factor equal to the refractive index
of the ATR crystal (germanium = 4) compared with
measurements made in transmission or reflection.

To investigate samples
at certain tempera-
tures from -196 –
600 °C, the Linkam
THM600 stage can be
used. This stage is also
controlled by OPUS
software.

Sample Stages
The HYPERION 1000 is equipped with a manual
xy stage; the HYPERION 2000 and 3000 include
a very precise and accurate motorized xy stage.
Interchangeable rotatable, temperature- (-196 to 600 °C)
and humidity controlled stages are optionally available. Schematic representation of the HYPERION ATR objective:
a) In viewing mode, the ATR crystal remains in the housing to
ensure optimum image quality.
b) In measuring mode, the internal pressure sensor provides
even contact between sample and crystal.
From left to right:
(A) ATR objective with integrated pressure sensor;
(B) Grazing angle objective for the measurement of thin coatings
on metallic surfaces;
(C) Macro accessory for the analysis of brittle or sticky samples.

Macro-accessory for ATR-Imaging

Grazing Angle Objective (GAO)
Bruker’s patented grazing angle objective enhances the
interaction between sample and infrared light. Grazing
angle incidence reflection is perfect for measuring
very thin coatings on metallic surfaces. During GAO
analysis the signal intensity is actually doubled,
since the IR beam passes the sample twice, and the
objective is designed to achieve maximum sensitivity.
The polarization of the incident light is always
maintained and thus makes information about the
orientation of the sample accessible (via p- and s-
polarized light).
If your samples are brittle or sticky (e.g. fibers or
pastes) Bruker has an ATR imaging accessory with
large field of view available that can handle the most
delicate of samples. It comes with a xy-stage and a
miniaturized sample holder to fixate deformed samples
and to analyze layer composition.
3.5x IR Objective for Reflection and Transmission
Biological tissue samples can be quite large and
the search for regions of interest as well as the
measurement may take a lot of time. For that very
reason Bruker developed the 3.5x IR objective to
analyze large samples as fast as possible. This
accessory simplifies the evaluation of extensive
datasets and therefore saves you a lot of time in the
long run. Depending on the HYPERIONs configuration
the 3.5x objective may be used for measurements in
reflection and transmission.

Schematic representation of the HYPERION GAO objective.

Left: 3.5x IR objective; right: Chemical image of carbohydrate
a) In viewing mode, two parallel plane mirrors displace the
contents of a wheat stalk (measurement time 20 minutes).
focal point to provide excellent image quality.
b) In measuring mode, the IR beam is first directed onto the
sample at a high angle, reflected there and then refocused onto
the exact same spot before passing back into the objective.
 High quality
video camera
Single element
MCT-detector

Integrated
HYPERION stands for supreme
LCD panel
sensitivity at the highest spatial

resolution in FT-IR microscopy and

Focal plane
High quality
array
motorized X,Y
detector chemical imaging.
sampling stage

Peak performance, flawless visual

inspection and precise infrared spectral

analysis of any sample - by design.

The HYPERION takes its name from the mythological
Titan of Light - and no other name could be more
appropriate for this exceptional FT-IR microscope.
With its modular design, the HYPERION can be
customized for the most challenging R&D applications. No
matter the research area, whether polymers,
pharmaceuticals, chemicals, electronics, forensics, art
conservation, or life sciences, the HYPERION leads to
definitive analytical success.
Featuring many contrast enhancement tools, a wide
variety of dedicated objectives, and chemical imaging,
the HYPERION helps you conduct an exact and efficient
micro analysis for even the most sensitive samples.
Spatial resolution is only limited by diffraction of light
State-of-the-art focal plane array (FPA) detector
technology allows to chemically assess even the
smallest microscopic structures
Superb sensitivity even at high lateral resolution
Precise attenuated total reflectance (ATR) objective with
internal pressure sensor
3.5x IR-lens objective for large field of view and
groundbreaking image quality
Dedicated grazing angle objective (GAO) with dual
pass design for the analysis of thin layers on metallic
surfaces
Automated FT-IR mapping possible in all measurement
modes
All-in-one spectroscopic software for data acquisition,
analysis and documentation

Bruker Optics is ISO 9001

and ISO 13485 certified.
Covered by one or more of the following patents: DE102004025448; DE19940981.
Additional patents pending. Laser class 1 product.

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