Professional Documents
Culture Documents
Depletion layer
Two types of JFET
• n-channel JFET
• p-channel JFET
• If the channel is doped with a donor impurity, n-type
material is formed and the channel current will consist of
electrons.
• If the channel is doped with an acceptor impurity, p-type
material will be formed and the channel current will consist
of holes.
• n-channel devices have greater conductivity than p channel
types, since electrons have higher mobility than holes; thus
n-channel JFETs are approximately twice as efficient
conductors compared to their p-channel counterparts.
• Have three Terminal: Drain – D, Gate –G and Source – S
n-channel JFET
• Major structure is n-type materials(channels) between
embedded p-type material to form 2 p-n junction
• In the normal operation of a n-channel device, the drain(D)
is positive with respect to the source(S).
• Because the resistance of the channel depends on the gate-
to-source voltage(VGS), the drain current(ID) is controlled
by that voltage.
S
P-channel JFET
• Major structure is p-type material(channel) between
embedded n-type material to form 2 n-p junction
• Current flow from source(s) to drain
• Holes injected to source(s) through p-type channel and
flowed to drain
Basic Operation(n-channel)
• The figure below shows dc bias voltages applied to a n-channel
device.
n-channel p-channel
JFET characteristics
Drain characteristic curve(DCC): two basic case
I. 𝑉𝑔𝑠 = 0 𝑎𝑛𝑑 𝑉𝐷𝑆 increasing with some positive value
II. Vgs< 0, VDS at some positive value
I. Vgs= 0 and VDS increase with some positive value
ID increase for small value of VDS
For large value of VDS the depletion layer become wider, causing
the resistance of the channel increase and ceases the current
increase with VDS
• The gate-to-source voltage is zero ( Vgs =0V) and
produced by shorting the gate to the source, as shown in
figure (a) where both are grounded.
(a)
(b)The drain characteristic curve of a
(a) JFET with Vgs = 0 and variable VDS JFET for VGS = 0.
• As VDD is increased from 0V, ID will increase
proportionally. This is shown in figure (b) between points A
and B. In this area, the channel resistance is essentially
constant because the depletion region is not large enough to
have significant effect.
• Because VDD and ID are related by Ohm’s law, this region
called the ohmic region.
• At point B in the figure, the curve levels off and enters the
active region where ID becomes essentially constant.
• As VDD increases from point B to point C, the reverse-bias
voltage from gate to drain produces a depletion region large
enough to offset the increase in VDS, thus keeping ID
relatively constant.
Pinch-Off Voltage
• For Vgs = 0, the value of VDS at which ID ceases to increase
regardless of VDD increases is called the pinch-off voltage
(point B) and the current at this point is called maximum
drain current (IDSS)..
Breakdown
• As shown in figure(c), breakdown occurs at point C when ID
begins to increase very rapidly with any further increase
in VDS.
• Breakdown can result in irreversible damage to the device,
so JFETs are always operated below breakdown.
II. Vgs < 0, VDS at some positive value
ID