Idea of AFM Device

The Atomic Force Microscope (AFM) is a device used in nanotechnology,

biology, and physics to visualize objects at the atomic and molecular level.
This device creates high-resolution three-dimensional images of objects on
their surfaces.

Mechanism :

The AFM consists of the Cantilever arm in its probe probe from a sharp
header known as TIP is used to clear the sample surface. The arm is made of
silicon or silicon nitride at half of Qatar within a few nanometers. When the
header head of the sample is approaching the strength of the force and the
sample surface, this force will lead to a deviation in the arm based on the
power of hook and this is by the type of surface that is studied. The laser
beam is falling on the Cantilever arm and which rises and down with high
and low altitude and thus with the diversity of surface stirrings of high and
low, and the laser beam is reflected on the pregnant on the future and thus is
determined and the paint is determined The surface is impressed depending
on the laser beam motion
Some of these applications include:
Identifying atoms from samples
Evaluating force interactions between atoms
Studying the physical changing properties of atoms
Studying the structural and mechanical properties of protein complexes and assembly,
such as microtubules.
used to differentiate cancer cells and normal cells.
Evaluating and differentiating neighboring cells and their shape and cell wall rigidity.

Components and Description of the Device:

PROBE IS MADE OF A SHARP HEAD KNOWN AS TIP
Laser Beam Source
Detector