astings Analysis • Microelectronics Packaging • Bonding Pads • Biomedical Devices/Implants • Solar cells

otovoltaics • Anti-corrosion coatings • Wear resistance • RoHS applications • Semiconductors • Contami

ngine wear debris • Food/beverage • Manufacturing • Pathology • Pharmaceuticals • Semiconductor • El
nts • Defect Analysis • Contaminant Identification • RoHS • WEEE • ELV Compliance • Solder Voids • X-ray
Migration • Environmental Analysis • Lead Contamination in Consumer Goods • Packaging • Soil Conta
aracterization for Recycling • MarineSediments • Ocean Sediments • Airborne Particles • Air Filters • Slur
µXRF • Soils • Stones • Gun Shot Residue • Material iden
e • Glass Chips • Paint Cross Sections • Metals/alloys
• Meteorites • Phase boundaries • Mineral identification • Mining test cores • Marine Sediments • Lake
k Structure • Individual Particles • Mining Exploration • Metals and Alloys • Glasses • Concrete • Cemen
s in Plastics • Inorganics • Semiconductors • Medicine • Biology • Bones • Tissue • Leaves • Plants • Phar
plants • Medical Wear Debris • Mineral Deposits • Stones • Particle Analysis • Wear Debris • Engine • Bra
s • Contaminant identification • Raw Material Composition • QC/QA • Wear and Failure Analysis • Quant
n Analysis • Automated Multi-Particle Analysis • Imaging for Particle Shape • Corrosion Analysis • Archeo
facts • Currency • Metals • Alloys • Gemstones • Paints • Inks • Pigments • Corrosion Products • Coastin
electronics Packaging • Bonding Pads • Biomedical Devices/Implants • Solar cells • Optical filters • Photo
ion coatings • Wear resistance • RoHS applications • Semiconductors • Contamination • Electronics • En
od/beverage • Manufacturing • Pathology • Pharmaceuticals • Semiconductor • Electronic Components
ntaminant Identification • RoHS • WEEE • ELV Compliance • Solder Voids • X-ray Imaging of PCBs • Ion M
ntal Analysis • Lead Contamination in Consumer Goods • Packaging • Soil Contamination • Material Cha
ycling • MarineSediments • Ocean Sediments • Airborne Particles • Air Filters • Slurry • Forensic Science
nt Cross Sections • Metals/alloys • Soils • Stones • Gun Shot Residue • Material identificaiton • Geologica
ase boundaries • Mineral identification • Mining test cores • Marine Sediments • Lake Sediment Cores •
ividual Particles • Mining Exploration • Metals and Alloys • Glasses • Concrete • Cement • Minerals • Add
rganics • Semiconductors • Medicine • Biology • Bones • Tissue • Leaves • Plants • Pharmaceuticals • Im
ar Debris • Mineral Deposits • Stones • Particle Analysis • Wear Debris • Engine • Brakes • Pharmaceutic
ntification • Raw Material Composition • QC/QA • Wear and Failure Analysis • Quantitative Composition
ted Multi-Particle Analysis • Imaging for Particle Shape • Corrosion Analysis •Archeology • Museums • A
etals • Alloys • Gemstones • Paints • Inks • Pigments • Corrosion Products • Coastings Analysis • Microel
• Bonding Pads • Biomedical Devices/Implants • Solar cells • Optical filters • Photovoltaics • Anti-corros
stance • RoHS applications • Semiconductors • Contamination • Electronics • Engine wear debris • Food
turing • Pathology • Pharmaceuticals • Semiconductor • Electronic Components • Defect Analysis • Cont
n • RoHS • WEEE • ELV Compliance • Solder Voids • X-ray Imaging of PCBs • Ion Migration • Environment

UNPARALLELED MICRO-XRF
ntamination in Consumer Goods • Packaging • Soil Contamination • Material Characterization for Recyc
nts • Ocean Sediments • Airborne Particles • Air Filters • Slurry • Forensic Science • Glass Chips • Paint C

PERFORMANCE
tals/alloys • Soils • Stones • Gun Shot Residue • Material identificaiton • Geological • Meteorites • Phase
l identification • Mining test cores • Marine Sediments • Lake Sediment Cores • Rock Structure • Individ
Exploration • Metals and Alloys • Glasses • Concrete • Cement • Minerals • Additives in Plastics • Inorga
s • Medicine • Biology • Bones • Tissue • Leaves • Plants • Pharmaceuticals • Implants • Medical Wear De
posits • Stones • Particle Analysis • Wear Debris • Engine • Brakes • Pharmaceuticals • Contaminant iden
terial Composition • QC/QA • Wear and Failure Analysis • Quantitative Composition Analysis • Automate
alysis • Imaging for Particle Shape • Corrosion Analysis •Archeology • Museums • Artifacts • Currency •
mstones • Paints • Inks • Pigments • Corrosion Products • Coastings Analysis • Microelectronics Packagin
medical Devices/Implants • Solar cells • Optical filters • Photovoltaics • Anti-corrosion coatings • Wear r
plications • Semiconductors • Contamination • Electronics • Engine wear debris • Food/beverage • Manu
• Pharmaceuticals • Semiconductor • Electronic Components • Defect Analysis • Contaminant Identific
EE • ELV Compliance • Solder Voids • X-ray Imaging of PCBs • Ion Migration • Environmental Analysis • L
Consumer Goods • Packaging • Soil Contamination • Material Characterization for Recycling • MarineSed
diments • Airborne Particles • Air Filters • Slurry • Forensic Science • Glass Chips • Paint Cross Sections •
s • Stones • Gun Shot Residue • Material identificaiton • Geological • Meteorites • Phase boundaries • M
n • Mining test cores • Marine Sediments • Lake Sediment Cores • Rock Structure • Individual Particles •
etals and Alloys • Glasses • Concrete • Cement • Minerals • Additives in Plastics • Inorganics • Semicond
 µXRF

The ATLAS™ Micro-XRF spectrometer (µXRF) ATLAS TECHNICAL SPECIFICATIONS

from IXRF Systems introduces a new world of
Sample Types Solids, Liquids, Particles, Powders
x-ray mapping and automation. The ATLAS™
boasts the largest chamber volume and SDD Sample Chamber Size 20x18x10in. (508x457x254mm)
detection area (150mm2) well as the smallest
spot size (10µ) available on the market. Measurement Media Air, Vacuum, He
Additionally, the Atlas™ is complimented by the
most comprehensive software suite including Excitation Source 12-50W, 0-60kV, 200 µA-1mA
multi-point analysis, unattended automation,
Excitation Parameters Aperture or Polycapillary Collimation
in-depth feature/image analysis, unprecedented Target Materials Rh (others available)
mapping and reporting features, and much Tube 50kV, 50W, 1mA (optional 2nd tube)
more. Models may be operated under air or Spot Size ≤5-1000μ
Filters Up to 8
vacuum as well as Helium flush for liquids and
light element analysis. Geometry Top-down Beam (Perpendicular)

Detector (s) SDD (Si-Pin upon request)

Resolution 130-145eV
Active Area 30-150mm2
PRODUCT FEATURES Motorized X,Y,Z (available)
Stage 25x25mm up to 320x320mm ranges available
1 Spot Size down to 5 microns with anti-halo 10kg+ load capacity
optic
Sample Travel Total 320x320x120mm
Mapping 250x200mm
2 SDD Detector Active Area up to 150mm 2
Map Scan Speed 1-3ms/pixel
Sample Speed up to 300mm/second
3 Larger Chamber Volume Sample View Three Sample Positioning and Analysis Cameras

4 50kv/50 watt tube Instrument Control

PC; Windows 7/8
Complete control of parameters, filters,
cameras, optical microscopes, sample
5 Multipoint/Multi-Area Automation & illumination and positioning, and
Mapping measurement media

Power 100-240 V, 50/60 Hz

6 Air, Vacuum, Helium for Solids, liquids, and
powders Certifications CE, RoHS, Radiation

Element Range Na-U

Dimensions 35x22x22in (890x560x560mm)

Quality and Safety CE certified RoHS, Radiation < 1 μSv/h

IXRF Systems, Inc. Telephone: 512.386.6100

10421 Old Manchaca Rd., Suite 620 Fax: 512.386.6105
Austin, TX 78748 Email: info@ixrfsystems.com