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NABL Calibration Certificate for Micrometer

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0% found this document useful (0 votes)
322 views2 pages

NABL Calibration Certificate for Micrometer

Uploaded by

flowspare
Copyright
© © All Rights Reserved
We take content rights seriously. If you suspect this is your content, claim it here.
Available Formats
Download as PDF, TXT or read online on Scribd

NABL Accredited Calibration Services as ISO/IEC 77025:20L7

CALI BRATION CERTI F ICATE

SS/FF-20lDMN-03
Page 1 of 2
! Name and Address of Customer : M/s. Sarvashree
L-95, sth cross, 1st Main Kirloskar Colony,
1Sth Main Road, 3rd Stage, Basaveshwar Nagar,
Bengaluru, Karnataka - 560 079.

! Customer Reference
2.1 SRF No. : 1536 Dated . 22 June 2022
2.2 Cerlificate No. : 55/2211536-01 ULR No.: CC229122000002250F
2.3 Date of Calibration : 22 June 2022
2.4 Next Calibration Due : 21 June 2023

! Details of Device Under Calibration(DUCl.


3.1 Nomenclature : Digital Micrometer
3.2 Make : INSIZE Model :
3109-25A
3.3 Sl No : 19040590 lD No
: SS-MECH-DMN-012
3.4 No. of Pages :2 Range : 0 to 25 mm
3.5 Calibration Procedure No : SOP-DMN-O3 LC : 0.001 mm
3.6 DUC Condition : Satisfactory Location : Dimension lab
3.7 Calibration Done at : Dimension Lab, Sarvashree

4 Environmental Condition
Temperature 20t2 "C Humidity 40 to 60 % Rh

! Master lnstruments used for Calibration:

Traceable
Nomenclature Make / Model Sl. No. Validity
Certificate No.
Gauge Block Set (Grade 0) KCP / M4711 1 0675 2021t101010 08-10-2023

Optical Parallels Prism lndia / --- QSr/0535/22l03 15-03-2024

0 Other Details :
6.1. Kindly refers to Note(s) section mentioned over leaf.

Authorised

:::ru
(Galibration Engineer)
ffi
"Quality You Can Quantify"
NABL Accredited calibration services as per lso/lE
c 1,7025:2017

Certificate No. sst22t1536-01 U LR No. : CC229122000002250F Page 2 of 2

Name of the lnstrument : Digital Micrometer

Z Results : (All readings in mm )


Sl.No. Slip Gauge Readings UUC Readings Observed Deviation
1 0 0 000 0 000
2 5 5.000 0.000
3 10 10.000 0 000
4 15 14 999 -0 001
A
20 19 999 -0 001
6 25 24.999 -0.001

Flatness of Measuring Faces

Parallelism of Measuring Faces

I Uncertaintv Of Measurement Result :

Expanded Uncertainty of Micrometer (For k=2, 95.45 % C.L.) t 1.22 pm

! Reference :
9.1. Standard and Device Under Calibration readings are average of five repeated observations.
9.2. All the reported values have been reported in Sl units.

Au[horised By

l)^"*
t'tagarll m R
(Cali bration Engineer) (Lab ln-Charge)
*** End of Certificate ---

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