Group 3

Name ID
Rafichha Yasmin 1806007

Beyond the Limits: Md. Nure Alam Dipu 1806028

Exploring the World Md. Tasfiq Rahman

Sajib Biswas Shuvo

1806116

1806131

of Atomic Force Sagira Zaman Eva 1806143

Microscopy Ishraq Bintul Islam

Md. Samiul Islam
1806145

1806151
Shadhin
Moytri Ghosal 1806167

Md. Meherab Hossain 1806182

What is AFM?

Source: Engineering Physics by Sanjiv

https://youtu.be/xnOqahYA6NU
Atomic
• Capillary forces
• Covalent forces
• Electrostatic forces

Force
• Common repulsive
interaction forces
• Van der Waals forces

Microscopy
STM
&
AFM

Source: Quick Biochemistry Basics [https://youtu.be/FQzUrbKTLVU]

STM vs. AFM

STM AFM
• Only conductive samples • Both conductive and non-
can be imaged conductive samples
• Atomic resolution • Sub-nanometer resolution
AFM CONFIGURATION
Cantilever: Made of
Feedback System: Si or Si3N4
Measures the
deviation of
cantilever from a set Tip: Fixed to open
point and adjusts the end of a cantilever,
sample’s position acts as the probe
accordingly

Position Sensitive Sample Stage:

Detector: When Provides a stable
cantilever deflects, and adjustable
it converts the platform for
deflection of the mounting and
laser beam into an positioning the
electrical signal. Laser: A laser beam sample
(segmented directed onto the
photodiodes or back of the cantilever
sensors) which is reflected off
the cantilever surface
AFM Real Setup

7
AFM Real Setup
Imaging Process

8
 Necessary Theories for AFM

Spring Theory Deflection Current
• While scanning the surface via
tip, the cantilever deflects
with the responsive force
between tip and sample.
• Using these deflections
collection, images can be
constructed to provide us with
intricate details .
Nature of Signal to
Noise Ratio
The lesser the noise, the
better. That's why a high
signal to noise ratio is
needed which can be
implemented via AFM..

Note: Spring constant range 10-3 to 100 N/m . Force range 0.1-100 nN.
9
 Modes of AFM

Contact Mode
AFM

Non-
Tapping
Contact
Mode
Mode AFM

Source: Youtube, Quick Biochemistry Basics

Contact
Mode
Non-
Contact
Mode
Tapping
Mode
 Optical Table

External Setup (Optical Table)

Heavy table top

• AFM is placed upon the
table top Pneumatic Vibration
• Reduce the external Isolation Systemn
vibration System
Pressure Control
Valve
Optical Table (Setup)
What is Resolution?

17
Resolution
of AFM
AFM in a
Nutshell
Clean and contamination
free sample collection
 Mounting the sample on
Clean and contamination a
free sample collection suitable substrate or
sample holder
 Mounting the sample on
Probe selection with
Clean and contamination a
sharp
free sample collection suitable substrate or
tip
sample holder
AFM Real Setup (through Images)
Probe Selection and Sampling Placement

23
 Mounting the sample on
Probe selection with
Clean and contamination a
sharp
free sample collection suitable substrate or
tip
sample holder

Bringing the probe closer

to the sample surface
Instrument setup while monitoring Adjust the parameters
feedback
signal
 AFM Real Setup
Adjusting parameter using LASER Monitor

25
 Mounting the sample on
Probe selection with
Clean and contamination a
sharp
free sample collection suitable substrate or
tip
sample holder

Bringing the probe closer

to the sample surface
Instrument setup while monitoring Adjust the parameters
feedback
signal

Determining scanning
parameters like scan size,
Imaging mode selection
scan rate etc according to
requirement
Initial Image

27
 Mounting the sample on
Probe selection with
Clean and contamination a
sharp
free sample collection suitable substrate or
tip
sample holder

Bringing the probe closer

to the sample surface
Instrument setup while monitoring Adjust the parameters
feedback
signal

Determining scanning
parameters like scan size,
Imaging mode selection Image acquisition
scan rate etc according to
requirement

Interpretation of
Data analysis required
properties
PROCESSED IMAGE

8 μm
29
Challenges of Previous Microscopes
Optical Microscope:
-Limited resolution
-Low magnification Then comes
ELECTRON
MICROSCOPE
Electron microscope

Highly Difficult
Expensive Maintenance
AFM
• High resolution
• No environmental
requirement
• Wide range of materials
• Real time Imaging
• Less expensive
AFM & Nanotechnology
• Atomic force microscopy (AFM) has become an essential tool
for nanotechnology research.
• Allows scientists to image and manipulate nanomaterials
with incredible precision.
• Used to create high-resolution images of nanomaterials,
providing insight into their structure and properties.
• Used to perform mechanical testing on nanomaterials,
measuring their strength, elasticity, and other important
properties.
 • High Speed Imaging
• Nanofabrication and Manipulation
• Miniaturizing AFM Devices in nanoscale
• Multi-Dimensional Imaging
Future • Biological and Medical Applications
Prospects of • Dynamic Imaging
AFM • Advancement in Resolution
• Single molecule study in biophysics and
biological field
• Integration with Other Techniques

35
Atom Manipulation Using AFM

Source: Y. Sugimoto, M. Abe and S. Morita, “Atom Manipulation Using Atomic Force
Microscopy at Room Temperature,” Imaging and Manipulation of Adsorbates Using
Dynamic Force Microscopy, AtMol Conf., Nottingham, UK, April 16–17, 2013
Source: O. Custance, R. Perez and S., “Atomic Force Microscopy as a Tool for
Atom Manipulation”, Nature Nanotechnology, vol. 4, Dec., pp. 805, 2009
Limitation
• Slower Imaging Speed
• Limited Penetration Depth
• Tip Effect
• Surface Damaging
• Problematic with Soft, Fragile and Biological Sample
• Problem with Measuring Steep Wall or Extremely Rough
Surface
THANK
YOU