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3. "n TEM! electrons are directly pointed toward the sample. The electrons that pass through the sample are the parts that are illuminated in the image. 4. TEM seeks to see what is inside or beyond the surface. 5. TEM shows the sample as a whole 6. TEM deli ers a two$dimensional picture. 7. TEM has up to a '( million magnification le el 8. The resolution of TEM is (.' angstroms 9. SEM images ha e a better depth of 9. TEM images ha e a less depth of field field 10. The sample in SEM is cut less 10. The sample in TEM is cut thinner thinner 11. SEM sample is *stained+ by an 11. SEM sample is not *stained+ element that captures the scattered electrons 12. "n SEM! the sample is prepared on 12. TEM re0uires the sample to be speciali,ed aluminium stubs and prepared in a TEM grid and placed in placed on the bottom of the chamber the middle of the speciali,ed chamber of the instrument. The image of the of the microscope. The image is sample is pro-ected onto the ./T or produced by the microscope ia tele ision$like screen. fluorescent screens.
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Amit Verm .