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Submitted by –Pinky
218|PAC|011
MSc (Applied Chemistry)
Scanning electron microscope
In SEM, the surface of the specimen is
scan by electron beam .
This was first designed by Max Knoll
(1935).
Working principle of SEM
SEM use electron beam for ilumination and
electromagnetic coils for directing the path of electron
beam .
When electron is focused on the specimen, it
produces secondary electron ,back scattered electron
and X-rays.
Seconday electrons are reflected due to the
interactions between atoms in specimens and electron
beam.
Back scattered electron gives information about the
distribution of different elements.
X-rays are emitted by the sample when the electron
beam removes electron from the inner shells of the
atoms .
These three rays are detected by specialized detectors.
The electron signals are converted into image which is
focused on the monitor
Construction of SEM
Advantages Disadvantages