electron

microscope
Introduction

In an electron microscope, the electrons are

emitted from a source and accelerated using
electric fields before being focused onto the
sample. The electrons interact with the
sample, producing a variety of signals that
can be detected and analyzed to create an
image.
Introduction

Types of Electron Microscope

- TEM – Transmission Electron Microscope

- REM – Reflection Electron Microscope
- STEM – Scanning Transmission Electron
Microscope
-SEM
 Scanning
electron
microscope
Outline
Part 1: Introduction

Part 2: Construction

Part 3: Working

Part 4: Application
Introduction

it was Manfred von Ardenne who in 1937

invented a microscope with high resolution
by scanning a very small raster with a
demagnified and finely focused electron
beam. Ardenne applied scanning of the
electron beam in an attempt to surpass the
resolution of the transmission electron
microscope (TEM), as well as to mitigate
substantial problems with chromatic
aberration inherent to real imaging in the
TEM.
Introduction
Scanning electron microscopes were first
developed in the 1930s and 1940s, but it
wasn't until the 1960s that they became
widely used in scientific research.

A scanning electron microscope (SEM) is a

type of electron microscope that produces
images of a sample by scanning it with a
focused beam of electrons. The electrons
interact with the atoms in the sample,
producing signals that can be detected and
used to create an image of the surface.
 PART 2

Construction
 The SEM consists of an electron gun
that emits a beam of high-energy
electrons, which are focused by
electromagnetic lenses onto the
sample being studied. When the
electrons interact with the atoms in
the sample, they produce a variety of
signals that can be detected and used
to create an image of the sample
surface.
working
 The primary electron beam interacts
with the sample surface and generates
secondary electrons, backscattered
electrons, and other signals. These
signals are detected by a detector,
which converts them into a signal that
can be displayed on a computer screen
as an image. The image produced by
the SEM is highly detailed and can
reveal surface topography, texture,
and other features.
Facts
 The first images ever
produced by a scanning
electron microscope were
of a mosquito's mouthparts
and a spider's silk glands.
Electron microscopes can
see objects around 1,000
times smaller than the
smallest objects you can
examine with an optical
microscope.
Application
1. Forensic science: SEMs are used in forensic science to
analyze trace evidence such as fibers, hair, and gunshot
residue. They can provide information on the morphology
and composition of these materials, which can be used to
link suspects to crime scenes.
2. Archaeology: SEMs are used in archaeology to study
artifacts and fossils. They can provide information on the
surface structure and composition of these objects, which
can help archaeologists understand their origin,
composition, and history

Material science: SEMs are widely used in material science to

investigate the microstructure and properties of materials at
the nanoscale. They can be used to study the morphology,
texture, composition, and crystal structure of materials,
which are important factors that affect their properties and
behavior.

Semiconductor industry: SEMs are used to analyze and

characterize semiconductors, which are widely used in
electronic devices such as computers, smartphones, and
solar cells. They can help identify defects and impurities in
semiconductor materials, which affect their electrical
properties.

Thank you