Final Project: EMA 3012

Zachary Groothouse
3152 south Horizon Pl.
zgroothouse@knights.ucf.edu
4/23/18
Introduction
Literature Review
Scanning electron microscopy is a widely used and indispensable method of classifying
materials. Scanning electron microscopes (SEM) are able to get a clear image at magnificent
magnifications far greater than the average light microscope. They use electrons in place of a
light source to form an image. This is done through the analysis of electrons after the specimen is
bombarded by electrons from the electron gun. The data collected from these electron is
processed and yields information about the specimen’s; topography, chemistry, and
crystallography. The SEM’s ability to unveil the surface of a specimen makes it particularly
useful.
Objectives of the work
The purpose of this lab was to acquisition imaging and data about the surface of objects
selected by the student. This lab was useful for the end of the semester project given to the
students for the class. The lab demonstrated how well the student is able to perform an SEM
analysis of objects on their own.
Project Review
For this lab 3 items were chosen for analysis. A U.S. quarter, a cellphone SIM card, and a
graphite pencil core. All three objects had imaging taken of them and then an EDS analysis was
performed. The structure of the samples was revealed and the chemistry was also shown. The
testing was taken at different areas on each object at different magnification.

Experiment
Instrumentation
 Pictured here is the JEOL JSM-6480 SEM (Scanning Electron Microscope), and a diagram of
the electron beam pass.
The beam of electrons is produced in the electron gun through the heating of a filament.
The electrons then travel down a vertical path through a series of lenses that help focus the beam
on a small area of the sample. After the electrons collide with the sample, an image is formed
when sensors detect backscattered electrons (BSE) and secondary electrons (SE). The BSE are
electrons from the incident beam that looped around the nucleus of an atom in the sample due to
the electro-magnetic force. The SE are electrons generated from the collision of incident electron
beam and the electron of the atoms in the outer shell. Both of these types of electrons are
captured by sensors, that generate a signal that can be sent to a tv to show a three-dimensional
display of the surface of the sample. Since the use of an electron beam is used a, a vacuum must
also be used so that the electrons do not collide with any gas molecules. Not only will oxidation
ruin your sample images it will also damage the filament.
Samples and sample preparation
The samples involved in this SEM analysis were chosen by the student for the end of the
semester project. the samples chosen were a graphite pencil core, a U.S. quarter, and a cellphone
SIM card. Considering the items were all metallic, extensive sample preparation was
unnecessary. The samples were simple cleaned and inserted into the SEM chamber for testing.
Experimental Procedure
The procedure for this lab was simple. The samples were loaded onto the plate and placed
in the chamber. The chamber was then depressurized to allow a vacuum to develop. After the
vacuum was reached, the beam was then turned on so that students may start imaging the
samples. The samples were all placed on one plate allowing students to acquisition their images
in one sitting. The students were allowed to control the SEM and were instructed to gain the best
possible image quality while controlling the user interface themselves. This allowed students to
demonstrate their competence with the SEM. After a suitable image was taken the file was then
saved for later analysis. Students were sure to demonstrate caution when using the SEM so as not
to damage the machine or their samples.

Results and discussion

Below are all of the images take with the SEM. Each sample has images at high
magnification and the respective EDS analysis. These images show whether the students are able
to control the SEM in a way that yields meaningful and clear images that can be used to make
assumptions about the surface of the sample. All of the images include a description that classify
what is being shown.
Pictured here is the graphite pencil core with an EDS analysis containing: 100 percent carbon.
Pictured here is the U.S. coin with an EDS analysis containing:21.2 percent nickel, 67.6 percent
copper and a considerable amount of carbon contamination.
 Pictured here is the SIM at various locations with an EDS analysis at each location. The first
second and third EDS analysis corresponds with the second, third and fourth images of the SIM
respectively

After looking at the images acquisitioned by the students, it is very clear they knew how
to operate the SEM and were able to take high quality images of their samples. These images are
useful in acquiring information about the surface of the samples, such as the topography and
crystallography. The SEM also has the ability to classify the elements within the sample through
the x-ray radiation that escapes after electron excitation on the sample. Each element has a
unique radiation signature that allows the classification of the sample.
Analysis of each of the samples reveals there was slight carbon contamination on the
sample, this could have been from improper sample preparation. The structures of each sample
came apparent. The pencil core was pure carbon, which can be expected since graphite is made
of carbon, the surface was interesting in the it was jagged and rough, this is probably due to the
fact that pencils have to rub on paper and leave a trail. The coin consisted mostly of nickel and
copper with carbon contamination. The surface was flat and smooth which is indicative of the
long production process U.S. currency goes through. The cellphone SIM card was perhaps the
most interesting sample. It is a heterogeneous mixture of several elements at different location.
On the bulk of the chip, the gold part, it is made of phosphorous and nickel, and also contained
carbon and oxygen. The metal border inside of the chip contained carbon oxygen and silicon.
The border of the outside of the chip looked like a plastic or composite, it contained carbon,
oxygen, aluminum, phosphorous, nickel, and gold. The structure of the card was smooth all
around.
Discussion of results
The results yielded meaningful information about the structure of the samples studied.
This further allows students to take advantage of several techniques when studying the structure
of materials which is a vital part to materials science. Overall the lab was successful in
demonstrating the application of concepts learned in the lecture in a laboratory environment
using proper equipment to classify materials.
Remarks on the lab and knowledge gained
This lab incorporated a majority of the knowledge and skills students acquired during the
course of this class. It was a test of the students proficiency in whether they were able to
complete a lab experiment and report on their own. It was helpful in showing students what
exactly they are capable of.

Acknowledgements
These labs would not have been possible without dr. Zhou and the MCF, as well as the
teaching assistants that conduct the labs. Dr. Zhou used money out of his own pockets to allow
us time to practice with these machines, so I would like to thank him.
References
“EMA 3012c EXPERIMENTAL TECHNIQUES IN MECHANICS AND MATERIALS Lecture five
Scanning Electron Microscopy (I)” 2018 DR. Dan Zhou power point slide.
“EMA 3012c EXPERIMENTAL TECHNIQUES IN MECHANICS AND MATERIALS Lecture six
Scanning Electron Microscopy (II)” 2018 DR. Dan Zhou power point slide.