Professional Documents
Culture Documents
December 1992
Features
Pinout
CD4094BMS
TOP VIEW
16 VDD
STROBE 1
15 OUTPUT ENABLE
DATA 2
CLOCK
14 Q5
Q1
13 Q6
Maximum Input Current of 1A at 18V Over Full Package Temperature Range; 100nA at 18V and +25oC
Q2
12 Q7
Q3
11 Q8
Q4
10 QS
VSS
9 QS
Functional Diagram
Applications
Serial-to-Parallel Data Conversion
Remote Control Holding Register
DATA
CLOCK
STROBE
OUTPUT
ENABLE
15
SERIAL
OUTPUTS
10 QS
8-STAGE
SHIFT
REGISTER
QS
Description
CD4094BMS is a 8-stage serial shift register having a storage
latch associated with each stage for strobing data from the serial
input to parallel buffered 3-state outputs. The parallel outputs
may be connected directly to common bus lines. Data is shifted
on positive clock transitions. The data in each shift register stage
is transferred to the storage register when the STROBE input is
high. Data in the storage register appears at the outputs whenever the OUTPUT-ENABLE signal is high.
Two serial outputs are available for cascading a number of
CD4094BMS devices. Data is available at the QS serial output
terminal on positive clock edges to allow for high-speed operation in cascaded systems in which the clock rise time is fast. The
same serial information, available at the QS terminal on the next
negative clock edge, provides a means for cascading
CD4094BMS devices when the clock rise time is slow.
8-BIT
STORAGE
REGISTER
3-STATE
OUTPUTS
VDD = 16
VSS = 8
PARALLEL OUTPUTS Q1 - Q8
(TERMINALS 4, 5, 6, 7, 14, 13, 12, 11, RESPECTIVELY)
H4X
H1F
Ceramic Flatpack
H6W
CAUTION: These devices are sensitive to electrostatic discharge; follow proper IC Handling Procedures.
1-888-INTERSIL or 321-724-7143 | Copyright Intersil Corporation 1999
7-1083
File Number
3194
Specifications CD4094BMS
Absolute Maximum Ratings
Reliability Information
Thermal Resistance . . . . . . . . . . . . . . . .
ja
jc
Ceramic DIP and FRIT Package . . . . . 80oC/W
20oC/W
Flatpack Package . . . . . . . . . . . . . . . . 70oC/W
20oC/W
o
Maximum Package Power Dissipation (PD) at +125 C
For TA = -55oC to +100oC (Package Type D, F, K) . . . . . . 500mW
For TA = +100oC to +125oC (Package Type D, F, K) . . . . . Derate
Linearity at 12mW/oC to 200mW
Device Dissipation per Output Transistor . . . . . . . . . . . . . . . 100mW
For TA = Full Package Temperature Range (All Package Types)
Junction Temperature . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . +175oC
PARAMETER
Supply Current
SYMBOL
IDD
IIL
IIH
CONDITIONS (NOTE 1)
VDD = 20V, VIN = VDD or GND
LIMITS
GROUP A
SUBGROUPS
TEMPERATURE
MIN
MAX
UNITS
+25oC
10
+125 C
1000
-55oC
10
+25oC
-100
nA
+125oC
-1000
nA
VDD = 18V
-55oC
-100
nA
VDD = 20
+25oC
100
nA
+125oC
1000
nA
-55oC
100
nA
50
mV
VDD = 20
VDD = 18V
Output Voltage
VOL15
1, 2, 3
+25oC,
+125oC,
-55oC
Output Voltage
VOH15
1, 2, 3
IOL5
+25oC
0.53
mA
IOL10
+25oC
1.4
mA
IOL15
+25oC
3.5
mA
IOH5A
+25oC
-0.53
mA
IOH5B
+25oC
-1.8
mA
IOH10
+25oC
-1.4
mA
mA
IOH15
+25oC
-3.5
N Threshold Voltage
VNTH
+25oC
-2.8
-0.7
P Threshold Voltage
VPTH
+25oC
0.7
2.8
+25oC
+25oC
8A
+125oC
8B
-55oC
Functional
VIL
1, 2, 3
1.5
VIH
1, 2, 3
3.5
VIL
1, 2, 3
VIH
1, 2, 3
11
Tri-State Output
Leakage
IOZL
+25oC
-0.4
Tri-State Output
Leakage
IOZH
VDD = 20V
+125oC
-12
VDD = 18V
-55oC
-0.4
VDD = 20V
+25oC
0.4
+125oC
12
-55oC
0.4
VDD = 18V
NOTES: 1. All voltages referenced to device GND, 100% testing being
implemented.
2. Go/No Go test with limits applied to inputs.
7-1084
Specifications CD4094BMS
TABLE 2. AC ELECTRICAL PERFORMANCE CHARACTERISTICS
PARAMETER
SYMBOL
Propagation Delay
Clock to Serial Output QS
TPHL1
TPLH1
GROUP A
SUBGROUPS TEMPERATURE
CONDITIONS
VDD = 5V, VIN = VDD or GND
(Note 1, 2)
Propagation Delay
Clock to Serial Output
QS
TPHL2
TPLH2
Propagation Delay
Clock to Parallel Output
TPHL3
TPLH3
Propagation Delay
Strobe to Parallel Output
TPHL4
TPLH4
Propagation Delay
Output Enable to Parallel
Output
TPHZ
TPZH
Propagation Delay
Output Enable to Parallel
Output
TPLZ
TPZL
Transition Time
TTHL
TTLH
FCL
9
10, 11
9
10, 11
+25oC
+125oC,
-55oC
+25oC
+125oC,
-55oC
LIMITS
MIN
MAX
UNITS
600
ns
810
ns
460
ns
621
ns
+25oC
840
ns
10, 11
+125oC, -55oC
1134
ns
+25oC
580
ns
783
ns
10, 11
+125 C, -55 C
o
+25 C
280
ns
10, 11
+125oC, -55oC
378
ns
+25oC
200
ns
270
ns
200
ns
10, 11
9
10, 11
+125oC,
-55oC
+25oC
+125oC,
-55oC
270
ns
+25oC
1.25
MHz
10, 11
+125oC, -55oC
.93
MHz
MIN
MAX
UNITS
A
NOTES:
1. CL = 50pF, RL = 200K, Input TR, TF < 20ns.
2. -55oC and +125oC limits guaranteed, 100% testing being implemented.
3. CL = 50pF, RL = 1K, Input TR, TF < 20ns.
SYMBOL
IDD
CONDITIONS
NOTES
Output Voltage
VOL
1, 2
1, 2
1, 2
1, 2
TEMPERATURE
-55oC,
+25oC
+125oC
150
-55oC, +25oC
10
+125oC
300
10
+125oC
600
+25oC, +125oC,
50
mV
-55oC,
+25oC
-55oC
Output Voltage
VOL
1, 2
+25oC, +125oC,
-55oC
50
mV
Output Voltage
VOH
1, 2
+25oC, +125oC,
-55oC
4.95
Output Voltage
VOH
1, 2
+25oC, +125oC,
-55oC
9.95
IOL5
1, 2
+125oC
0.36
mA
-55oC
0.64
mA
IOL10
7-1085
1, 2
+125oC
0.9
mA
-55oC
1.6
mA
Specifications CD4094BMS
TABLE 3. ELECTRICAL PERFORMANCE CHARACTERISTICS (Continued)
LIMITS
PARAMETER
Output Current (Sink)
SYMBOL
IOL15
CONDITIONS
VDD = 15V, VOUT = 1.5V
NOTES
TEMPERATURE
MIN
MAX
UNITS
1, 2
+125oC
2.4
mA
IOH5A
1, 2
-55 C
4.2
mA
+125oC
-0.36
mA
-0.64
mA
-55
Output Current (Source)
IOH5B
IOH10
1, 2
1, 2
oC
+125oC
-1.1
mA
-55oC
-2.0
mA
+125oC
-0.9
mA
-2.6
mA
-2.4
mA
-55o
Output Current (Source)
IOH15
1, 2
+125oC
oC
mA
VIL
1, 2
+25oC, +125oC,
-55oC
VIH
1, 2
+25oC, +125oC,
-55oC
VDD = 10V
1, 2, 3
+25oC
250
ns
VDD = 15V
1, 2, 3
+25oC
190
ns
1, 2, 3
+25oC
220
ns
oC
150
ns
390
ns
1, 2, 3
+25 C
270
ns
VDD = 10V
1, 2, 3
+25
oC
290
ns
VDD = 15V
1, 2, 3
+25oC
200
ns
1, 2, 4
+25
oC
120
ns
90
ns
-55
Propagation Delay
Clock to Serial Output Qs
TPHL1
TPLH1
Propagation Delay
Clock to Serial Output Qs
TPHL2
TPLH2
VDD = 10V
VDD = 15V
1, 2, 3
+25
Propagation Delay
Clock to Parallel Output
TPHL3
TPLH3
VDD = 10V
1, 2, 3
+25oC
Propagation Delay
Strobe to Parallel Output
TPHL4
TPLH4
VDD = 15V
Propagation Delay
Output Enable to Parallel
Output
TPHZ
TPZH
VDD = 10V
VDD = 15V
1, 2, 4
+25oC
Propagation Delay
Output Enable to Parallel
Output
TPLZ
TPZL
VDD = 10V
1, 2, 4
+25oC
100
ns
VDD = 15V
1, 2, 4
+25oC
80
ns
Transition Time
TTLH
TTHL
VDD = 10V
1, 2, 3
+25oC
100
ns
1, 2, 3
+25
oC
80
ns
VDD = 10V
1, 2, 3
+25oC
2.5
MHz
VDD = 15V
1, 2, 3
+25oC
MHz
1, 2, 3
+25oC
125
ns
VDD = 10V
1, 2, 3
+25oC
55
ns
VDD = 15V
1, 2, 3
+25oC
35
ns
VDD = 5V
1, 2, 3, 5
+25oC
15
VDD = 10V
1, 2, 3, 5
+25oC
1, 2, 3, 5
+25oC
VDD = 5V
1, 2, 3
+25oC
200
ns
VDD = 10V
1, 2, 3
+25oC
100
ns
1, 2, 3
+25oC
83
ns
FCL
TS
TRCL
TFCL
VDD = 15V
VDD = 5V
VDD = 15V
Minimum Clock Pulse
Width
TW
VDD = 15V
7-1086
Specifications CD4094BMS
TABLE 3. ELECTRICAL PERFORMANCE CHARACTERISTICS (Continued)
LIMITS
PARAMETER
Minimum Strobe Pulse
Width
Input Capacitance
SYMBOL
TW
CONDITIONS
VDD = 5V
CIN
NOTES
TEMPERATURE
MIN
MAX
UNITS
1, 2, 3
+25oC
200
ns
VDD = 10V
1, 2, 3
+25 C
80
ns
VDD = 15V
1, 2, 3
+25oC
70
ns
oC
7.5
pF
Any Input
1, 2
+25
NOTES:
1. All voltages referenced to device GND.
2. The parameters listed on Table 3 are controlled via design or process and are not directly tested. These parameters are characterized
on initial design release and upon design changes which would affect these characteristics.
3. CL = 50pF, RL = 200K, Input TR, TF < 20ns.
4. CL = 50pF, RL = 1K, Input TR, TF < 20ns.
5. If more than one unit is cascaded, TRCL should be made less than or equal to the sumof the transition time and the fixed propagation
delay of the output of the driving stage for the estimated capacitive load.
SYMBOL
CONDITIONS
NOTES
TEMPERATURE
MIN
MAX
UNITS
IDD
1, 4
+25oC
25
1, 4
+25oC
-2.8
-0.2
1, 4
+25oC
1, 4
+25oC
0.2
2.8
1, 4
+25oC
+25oC
VOH >
VDD/2
VOL <
VDD/2
1, 2, 3, 4
+25oC
1.35 x
+25oC
Limit
ns
N Threshold Voltage
VNTH
N Threshold Voltage
Delta
VTN
P Threshold Voltage
VTP
P Threshold Voltage
Delta
VTP
Functional
TPHL
TPLH
VDD = 5V
SYMBOL
DELTA LIMIT
IDD
1.0A
IOL5
IOH5A
MIL-STD-883
METHOD
GROUP A SUBGROUPS
100% 5004
1, 7, 9
7-1087
Specifications CD4094BMS
TABLE 6. APPLICABLE SUBGROUPS
MIL-STD-883
METHOD
GROUP A SUBGROUPS
100% 5004
1, 7, 9
100% 5004
1, 7, 9
100% 5004
1, 7, 9, Deltas
100% 5004
1, 7, 9
100% 5004
1, 7, 9, Deltas
100% 5004
CONFORMANCE GROUP
PDA (Note 1)
Interim Test 3 (Post Burn-In)
PDA (Note 1)
Final Test
Group A
Group B
Sample 5005
Subgroup B-5
Sample 5005
Subgroup B-6
Sample 5005
1, 7, 9
Sample 5005
1, 2, 3, 8A, 8B, 9
Group D
Subgroups 1, 2, 3, 9, 10, 11
Subgroups 1, 2 3
CONFORMANCE GROUPS
Group E Subgroup 2
TEST
MIL-STD-883
METHOD
PRE-IRRAD
POST-IRRAD
PRE-IRRAD
POST-IRRAD
5005
1, 7, 9
Table 4
1, 9
Table 4
OPEN
GROUND
VDD
Static Burn-In 1
(Note 1)
4 - 7, 9 - 14
1 - 3, 8, 15
16
Static Burn-In 2
(Note 1)
4 - 7, 9 - 14
1 - 3, 15, 16
1, 15, 16
4 - 7, 9 - 14
1 - 3, 15, 16
Irradiation
(Note 2)
9V -0.5V
50kHz
25kHz
4 - 7, 9 - 14
NOTES:
1. Each pin except VDD and GND will have a series resistor of 10K 5%, VDD = 18V 0.5V
2. Each pin except VDD and GND will have a series resistor of 47K 5%; Group E, Subgroup 2, sample size is 4 dice/wafer, 0 failures, VDD
= 10V 0.5V
7-1088
CD4094BMS
SERIAL
IN
CL
p
SERIAL
OUT
*
D
2
CL
CL
D
CL
CL
D
CL
CL
10
n
QS
8
Q
CL
CL
p
p n
CLOCK
TR
*
CL
STAGES
3-7
CL
SERIAL
OUT
CL
STROBE
TR
TR
QS
TR
TR
TR
OUTPUT
ENABLE
TR
TR
LATCH
2
TR
LATCH
1
TR
LATCH
8
VDD
*
15
3-STATE
1
3STATE
2
3STATE
8
VDD
VSS
* ALL INPUTS
PROTECTED BY
CMOS PROTECTION
NETWORK
VSS
4
Q1
Q2
14 13 12
11
Q3 Q4 Q5 Q6 Q7
Q8
CL
PARALLEL OUTPUTS
SERIAL OUTPUTS
OUTPUT
ENABLE
STROBE
DATA
Q1
QN
QS*
QS
OC
OC
Q7
NC
OC
OC
NC
Q7
NC
NC
Q7
NC
QN-1
Q7
NC
QN-1
Q7
NC
NC
NC
NC
Q7
= Level Change
Logic 1 = High
X = Dont Care
Logic 0 = Low
NC = No Change
OC = Open Circuit
* At the positive clock edge information in the 7th shift register stage is transferred to the 8th register stage
and the QS output
7-1089
CD4094BMS
25
20
15
10V
10
5
5V
0
5
10
15
DRAIN-TO-SOURCE VOLTAGE (VDS) (V)
15.0
GATE-TO-SOURCE VOLTAGE (VGS) = 15V
12.5
10.0
10V
7.5
5.0
2.5
5V
0
10
15
0
-5
-10
-15
-10V
-20
-25
-15V
-30
-5
-10V
10V
15V
20
-15
400
-10
-15V
100
200
30
40
60
80
100
LOAD CAPACITANCE (CL) (pF)
300
AMBIENT TEMPERATURE (TA) = +25oC
250
SUPPLY VOLTAGE (VDD) = 5V
200
150
10V
100
15V
50
20
40
60
80
100
LOAD CAPACITANCE (CL) (pF)
7-1090
CD4094BMS
(Continued)
600
400
300
10V
200
15V
100
20
200
10V
100
15V
20
40
60
80
100
LOAD CAPACITANCE (CL) (pF)
300
AMBIENT TEMPERATURE (TA) = +25oC
tPHL
250
tPLH
400
40
60
80
100
LOAD CAPACITANCE (CL) (pF)
200
10V
5V
10V
15V
15V
150
100
50
20
150
100
10V
5V
50
0
0
20
40
60
80
100
LOAD CAPACITANCE (CL) (pF)
+25oC
15
200
40
60
80
100
LOAD CAPACITANCE (CL) (pF)
10
106
105
SUPPLY VOLTAGE (VDD) = 15V
104
10V
103
10V
5V
102
CL = 50pF
CL = 15pF
10
0
10
15
SUPPLY VOLTAGE (VDD) (V)
20
10
102
103
104
105
7-1091
CD4094BMS
CLOCK
DATA IN
STROBE
OUTPUT
ENABLE
INTERNAL Q1
3 - STATE
3
STATE
OUTPUT Q1
INTERNAL Q7
3 - STATE
3
STATE
OUTPUT Q7
SERIAL QS
OUTPUT
SERIAL QS
OUTPUT
DIGITALLY CONTROLLED
EQUIPMENT
(REQUIRES CONTINUOUS
DIGITAL CONTROL)
CD4094BMS
STROBE
CLOCK
DIGITALLY CONTROLLED
EQUIPMENT
QS
CD4094BMS
STROBE
DIGITALLY CONTROLLED
EQUIPMENT
QS
CLOCK
CONTROL
AND
SYNC
CIRCUITRY
DATA CLOCK
FROM REMOTE
CONTROL PANEL
7-1092
CD4094BMS
STROBE
CLOCK
CD4094BMS
Chip Dimensions and Pad Layout
METALLIZATION:
PASSIVATION:
AL.
All Intersil semiconductor products are manufactured, assembled and tested under ISO9000 quality systems certification.
Intersil products are sold by description only. Intersil Corporation reserves the right to make changes in circuit design and/or specifications at any time without
notice. Accordingly, the reader is cautioned to verify that data sheets are current before placing orders. Information furnished by Intersil is believed to be accurate
and reliable. However, no responsibility is assumed by Intersil or its subsidiaries for its use; nor for any infringements of patents or other rights of third parties which
may result from its use. No license is granted by implication or otherwise under any patent or patent rights of Intersil or its subsidiaries.
For information regarding Intersil Corporation and its products, see web site http://www.intersil.com
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Mercure Center
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1130 Brussels, Belgium
TEL: (32) 2.724.2111
FAX: (32) 2.724.22.05
1093
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Taiwan Limited
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