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Anti-fuse:
An antifuse is the opposite of a regular fusean antifuse is normally an open circuit until you force a programming current through it (about 5 mA). In a polydiffusion antifuse the high current density causes a large power dissipation in a small area, which melts a thin insulating dielectric between polysilicon and diffusion electrodes and forms a thin (about 20 nm in diameter), permanent, and resistive silicon.
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Electrons trapped on the floating gate raise the threshold voltage of the n- channel EPROM transistor. Once programmed, an n- channel EPROM device remains off even with VDD applied to the top gate. An unprogrammed n- channel device will turn on as normal with a top-gate voltage of VDD. Exposure to an ultraviolet (UV) lamp will erase the EPROM cell. An absorbed light quantum gives an electron enough energy to jump from the floating gate. To erase a part we place it under a UV lamp (Xilinx specifies one hour within 1 inch of a 12,000 m Wcm 2 source for its EPLDs). Programming an EEPROM transistor is similar to programming an UV-erasable EPROM transistor, but the erase mechanism is different.
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FPGA Architecture
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4. 5.
pin assignment must be formulated early in the design process multiplexing is not encouraged
Simulation considerations 1. simulation should be performed at every level of the design hierarchy (such as pre-layout or post-layout) 2. simulation should run without any errors or warnings. Every simulator error and unknown signal state should be tracked, understood and fixed 3. simulation should include off-chip loading
4. 5. 6.
simulation should always start with an initialization routine each set of simulation or test vector should be self-contained be aware of maximum in test vector file specified by ASIC vendor. 4K is typical
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4. 5.
avoid excessive loading to minimize load-dependent delay do not rely on gates as delay element (use buffer)
6. 7. 8.
do not overdrive any one wire with multiple buffers avoid gating together clock and data or control signals(use global clock) do not leave tri-state buses floating when not in use
provide a means of reseting or initializing all nodes to a known states RAM signals should be accessible from the I/O so that standard RAM tests can be performed feedback loop should be latched break designs into hierarchy do not push technology to its limit
Design Reliability 1. minimize manufacturing defects (increase tolerance) 2. provide adequate supply pads and lines 3. minimize high current density 4. provide adequate current drive 5. avoid using a single large buffer (cascade buffer)
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