Next Editor of the

Journal of Quality Technology

Dr. Fugee Tsung

T HE JQT Editor Search Committee is very happy

to introduce Dr. Fugee Tsung as the next editor
of the Journal of Quality Technology. He will serve as
editor-elect for 2015, and as the editor for 20162018.

Professor Tsung is the department head of Indus-

trial Engineering at the Hong Kong University of Sci-
ence and Technology and a current member of the
JQT Editorial Review Board, serving since 2009. He
is a fellow of ASQ and the IIE as well as an aca-
demician of the International Association for Qual-
ity. The JQT Editor Search Committee believes that
Dr. Tsung is one of the top scholars in industrial
statistics today.

Dr. Tsung is the author of over 100 refereed jour-

nal publications in the top industrial statistics jour-
nals such as JQT, Technometrics, and the IIE Trans-
actions. He won the Best Paper Award in both 2003
and 2009 for IIE Transactions. He has given keynote
and invited presentations across the globe at such
meetings as the 13th Annual Meeting of the Euro-
pean Network for Business and Industrial Statistics,
the Technometrics Invited Paper Presentation at the
2012 INFORMS Annual Conference, and the JQT
Invited Paper Presentation at the same INFORMS
conference. Fugee Tsung

Dr. Tsung has made many other contributions to

our profession. He has organized international confer-
ences and he has served as an associate editor or as a
member of the editorial review boards for such jour-
nals as Technometrics, IIE Transactions, and Quality
and Reliability Engineering International.
Dr. Tsung is no stranger to real-world applica-
tions. He is an ASQ Certified Six Sigma Black Belt,
and ASQ authorized Six Sigma Master Black Belt
Trainer. ASQ is delighted that Dr. Tsung has agreed
to lead its flagship technical journal. The society
knows that JQT is in the hands of a very capable
steward for the next several years.
Geoff Vining
Chair of JQT Editor Search Committee
Bradley Jones
Editor-in-Chief

Vol. 47, No. 1, January 2015 1 www.asq.org