2SK3568

TOSHIBA Field Effect Transistor Silicon N Channel MOS Type (π-MOSVI)

2SK3568
Switching Regulator Applications
Unit: mm

• Low drain-source ON resistance: RDS (ON) = 0.4Ω (typ.)

• High forward transfer admittance: |Yfs| = 8.5S (typ.)
• Low leakage current: IDSS = 100 μA (VDS = 500 V)
• Enhancement mode: Vth = 2.0~4.0 V (VDS = 10 V, ID = 1 mA)

Maximum Ratings (Ta = 25°C)

Characteristics Symbol Rating Unit

Drain-source voltage VDSS 500 V

Drain-gate voltage (RGS = 20 kΩ) VDGR 500 V
Gate-source voltage VGSS ±30 V
DC (Note 1) ID 12
Drain current Pulse (t = 1 ms) A
IDP 48
(Note 1)
1: Gate
Drain power dissipation (Tc = 25°C) PD 40 W 2: Drain
3: Source
Single pulse avalanche energy
EAS 364 mJ
(Note 2)
Avalanche current IAR 12 A
JEDEC ―
Repetitive avalanche energy (Note 3) EAR 4 mJ
JEITA SC-67
Channel temperature Tch 150 °C
TOSHIBA 2-10U1B
Storage temperature range Tstg -55~150 °C
Weight : 1.7 g (typ.)

Thermal Characteristics

Characteristics Symbol Max Unit

2
Thermal resistance, channel to case Rth (ch-c) 3.125 °C/W
Thermal resistance, channel to ambient Rth (ch-a) 62.5 °C/W

Note 1: Ensure that the channel temperature does not exceed 150℃.
Note 2: VDD = 90 V, Tch = 25°C(initial), L = 4.3 mH, IAR = 12 A, RG = 25 Ω 1

Note 3: Repetitive rating: pulse width limited by maximum channel temperature

This transistor is an electrostatic-sensitive device. Please handle with caution.

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Electrical Characteristics (Ta = 25°C)

Characteristics Symbol Test Condition Min Typ. Max Unit

Gate leakage current IGSS VGS = ±25 V, VDS = 0 V ⎯ ⎯ ±10 µA

Gate-source breakdown voltage V (BR) GSS IG = ±10 µA, VDS = 0 V ±30 ⎯ ⎯ V
Drain cut-off current IDSS VDS = 500 V, VGS = 0 V ⎯ ⎯ 100 µA
Drain-source breakdown voltage V (BR) DSS ID = 10 mA, VGS = 0 V 500 ⎯ ⎯ V
Gate threshold voltage Vth VDS = 10 V, ID = 1 mA 2.0 ⎯ 4.0 V
Drain-source ON resistance RDS (ON) VGS = 10 V, ID = 6 A ⎯ 0.4 0.52 Ω
Forward transfer admittance ⎪Yfs⎪ VDS = 10 V, ID = 6 A 3.5 8.5 ⎯ S
Input capacitance Ciss ⎯ 1500 ⎯
Reverse transfer capacitance Crss VDS = 25 V, VGS = 0 V, f = 1 MHz ⎯ 15 ⎯ pF

Output capacitance Coss ⎯ 180 ⎯

10 V ID = 6 A VOUT
Rise time tr VGS ⎯ 22 ⎯
0V
Turn-on time ton RL = ⎯ 50 ⎯
50 Ω
Switching time 33 Ω ns
Fall time tf ⎯ 36 ⎯
VDD ∼
− 200 V

Turn-off time toff Duty <

= 1%, tw = 10 µs ⎯ 170 ⎯

Total gate charge Qg ⎯ 42 ⎯

Gate-source charge Qgs VDD ∼
− 400 V, VGS = 10 V, ID = 12 A ⎯ 23 ⎯ nC

Gate-drain charge Qgd ⎯ 19 ⎯

Source-Drain Ratings and Characteristics (Ta = 25°C)

Characteristics Symbol Test Condition Min Typ. Max Unit

Continuous drain reverse current

IDR ⎯ ⎯ ⎯ 12 A
(Note 1)
Pulse drain reverse current (Note 1) IDRP ⎯ ⎯ ⎯ 48 A
Forward voltage (diode) VDSF IDR = 12 A, VGS = 0 V ⎯ ⎯ −1.7 V

Reverse recovery time trr IDR = 12 A, VGS = 0 V, ⎯ 1200 ⎯ ns

Reverse recovery charge Qrr dIDR/dt = 100 A/µs ⎯ 16 ⎯ µC

Marking

K3568 Part No. (or abbreviation code)

Lot No.

A line indicates
lead (Pb)-free package or
lead (Pb)-free finish.

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ID – VDS ID – VDS
12 24
5.2 8 COMMON SOURCE
5 10,15
10,15 6 Tc = 25°C
10 20 PULSE TEST

DRAIN CURRENT ID (A)

DRAIN CURRENT ID (A)

COMMON SOURCE 5.5

Tc = 25°C
8 PULSE TEST 16
5.2
4.75
6 12 5

4.75
4 4.5 8

4.5
2 4.25 4
VGS = 4 V
VGS = 4V
0 0
0 2 4 6 8 10 12 0 10 20 30 40 50 60

DRAIN-SOURCE VOLTAGE VDS (V) DRAIN-SOURCE VOLTAGE VDS (V)

ID – VGS VDS – VGS

24 12
VDS (V)
COMMON SOURCE
COMMON SOURCE
Tc = 25℃
20 VDS = 20 V 10
DRAIN CURRENT ID (A)

PULSE TEST
PULSE TEST
DRAIN-SOURCE VOLTAGE

16 8

ID = 12 A
12 6

8 4
100 Tc = −55°C 6

4 3
25 2

0 0
0 2 4 6 8 10 12 0 4 8 12 16 20 24

GATE-SOURCE VOLTAGE VGS (V) GATE-SOURCE VOLTAGE VGS (V)

⎪Yfs⎪ – ID RDS (ON) – ID

100 10
FORWARD TRANSFER ADMITTANCE

COMMON SOURCE
DRAIN-SOURCE ON RESISTANCE

Tc = 25°C
PULSE TEST
Tc = −55°C

10
RDS (ON) (mΩ)

25
⎪Yfs⎪ (S)

100
1
VGS = 10 V､15V

COMMON SOURCE
VDS = 20 V
PULSE TEST
0.1 0.1
0.1 1 10 100 0.1 1 10 100

DRAIN CURRENT ID (A) DRAIN CURRENT ID (A)

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RDS (ON) – Tc IDR – VDS

2.5 100
COMMON SOURCE COMMON SOURCE
DRAIN-SOURCE ON RESISTANCE

DRAIN REVERSE CURRENT IDR

PULSE TEST Tc = 25°C
2.0 PULSE TEST
RDS (ON) (m Ω)

10
6
ID = 12A

(A)
6
4
1
3
VGS = 10 V 10
2 5
3
1 VGS = 0, −1 V
0 0.1
−80 −40 0 40 80 120 160 0 −0.2 −0.4 −0.6 −0.8 −1.0 −1.2

CASE TEMPERATURE Tc (°C) DRAIN-SOURCE VOLTAGE VDS (V)

CAPACITANCE – VDS Vth – Tc

10000 5

Ciss
GATE THRESHOLD VOLTAGE

4
(pF)

1000
CAPACITANCE C

Coss 3
Vth (V)

100

2
Crss
COMMON SOURCE
10 COMMON SOURCE VDS = 10 V
VGS = 0 V 1
ID = 1 mA
f = 1 MHz
Tc = 25°C PULSE TEST
1 0
0.1 1 10 100 −80 −40 0 40 80 120 160

DRAIN-SOURCE VOLTAGE VDS (V) CASE TEMPERATURE Tc (°C)

DYNAMIC INPUT / OUTPUT

PD – Tc CHARACTERISTICS
50 500 20
VDS (V)

GATE-SOURCE VOLTAGE VGS (V)

DRAIN POWER DISSIPATION

40 400 16
VDS
VDD = 100 V
DRAIN-SOURCE VOLTAGE

30 300 12
PD (W)

400

20 200 8
200
COMMON SOURCE
VGS
10 ID = 12 A
100 4
Tc = 25°C
PULSE TEST
0 0 0
0 40 80 120 160 0 10 20 30 40 50 60

CASE TEMPERATURE Tc (°C) TOTAL GATE CHARGE Qg (nC)

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rth – tw
10

NORMALIZED TRANSIENT THERMAL

IMPEDANCE rth (t)/Rth (ch-c)
1 Duty=0.5

0.2

0.1
0.1
0.05
PDM
0.02
t
SINGLE PULSE
0.01 0.01
T

Duty = t/T
Rth (ch-c) = 3.125°C/W
0.001
10μ 100μ 1ｍ 10ｍ 100ｍ 1 10

PULSE WIDTH tw (s)

SAFE OPERATING AREA EAS – Tch

100 500
ID max (PULSED) *

100 µs *
400
AVALANCHE ENERGY

ID max (CONTINUOUS) *
DRAIN CURRENT ID (A)

10
EAS (mJ)

1 ms * 300

1 ms *
200
DC OPERATION
1 Tc = 25°C

100

0
25 50 75 100 125 150
※ SINGLE NONREPETITIVE PULSE
Tc=25℃ CHANNEL TEMPERATURE (INITIAL)
CURVES MUST BE DERATED Tch (°C)
LINEARLY WITH INCREASE IN
TEMPERATURE. VDSS max
0.01 BVDSS
1 10 100 1000 15 V
DRAIN-SOURCE VOLTAGE VDS (V) IAR
−15 V
VDD VDS

TEST CIRCUIT WAVE FORM

RG = 25 Ω 1 ⎛ B VDSS ⎞
Ε AS = ⋅ L ⋅ I2 ⋅ ⎜ ⎟
VDD = 90 V, L = 83mH 2 ⎜B − V ⎟
⎝ VDSS DD ⎠

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RESTRICTIONS ON PRODUCT USE 030619EAA

• The information contained herein is subject to change without notice.

• The information contained herein is presented only as a guide for the applications of our products. No
responsibility is assumed by TOSHIBA for any infringements of patents or other rights of the third parties which
may result from its use. No license is granted by implication or otherwise under any patent or patent rights of
TOSHIBA or others.
• TOSHIBA is continually working to improve the quality and reliability of its products. Nevertheless, semiconductor
devices in general can malfunction or fail due to their inherent electrical sensitivity and vulnerability to physical
stress. It is the responsibility of the buyer, when utilizing TOSHIBA products, to comply with the standards of
safety in making a safe design for the entire system, and to avoid situations in which a malfunction or failure of
such TOSHIBA products could cause loss of human life, bodily injury or damage to property.
In developing your designs, please ensure that TOSHIBA products are used within specified operating ranges as
set forth in the most recent TOSHIBA products specifications. Also, please keep in mind the precautions and
conditions set forth in the “Handling Guide for Semiconductor Devices,” or “TOSHIBA Semiconductor Reliability
Handbook” etc..
• The TOSHIBA products listed in this document are intended for usage in general electronics applications
(computer, personal equipment, office equipment, measuring equipment, industrial robotics, domestic appliances,
etc.). These TOSHIBA products are neither intended nor warranted for usage in equipment that requires
extraordinarily high quality and/or reliability or a malfunction or failure of which may cause loss of human life or
bodily injury (“Unintended Usage”). Unintended Usage include atomic energy control instruments, airplane or
spaceship instruments, transportation instruments, traffic signal instruments, combustion control instruments,
medical instruments, all types of safety devices, etc.. Unintended Usage of TOSHIBA products listed in this
document shall be made at the customer’s own risk.
• TOSHIBA products should not be embedded to the downstream products which are prohibited to be produced
and sold, under any law and regulations.

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