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Analysis Procedure
Figure 2 SEM Photomicrographs of Fracture Surfaces
When failed components are received in the laboratory it is customary
Exhibiting (a) Dimpled Fracture, (b) Brittle Transgranular
to document their condition. The failed component is then cut and
Fracture, (c) Intergranular Fracture, and (d) Fatigue Striations
sectioned without damaging the surface so that it remains as-
received condition. The sample was mounted to the stub by carbon Conclusion
tape to maintain their conductivity without the use of gold coating.
Scanning electron microscope (SEM) is an important tool for
The mounted as-received samples with an appropriate size can be
microscopic examinations. Its usefulness in fractographic
placed on sample holder directly in the SEM vacuum chamber. This
examinations is due to its ability to provide a wide magnification
procedure is applicable for determination of elemental composition
range typically from approximately 10X to 100,000X with the
on deposit precipitated on the sample surface. Besides that, for
depth of field needed on an irregular fracture surface.
fractographic study, the sample usually cleaned by pickling acid to
remove any dirt and the brownish rust precipitated on the sample.
References
Morphological examination and compositional microanalysis is
carried out using SEM on both as-received and cleaned samples to De Carvalho, M. C., and de Deus, E. P. 2003. Fracture analysis of
detail inspection on failure region of the components. a flow control device used in the petrochemical industry.