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Observation of Fracture Surfaces Part 2 PDF
Observation of Fracture Surfaces Part 2 PDF
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FRACTOGRAPHY IN SEM
EM Electrons used as source to get
an image through scattered/unscattered
transmitted electron OR emission of
se/ bse / X-ray / EBSP from
specimen
Advantages of SEM over OM
OM SEM
• Max. mag. 2000x 8,00,000x
• Resolution 5000Å 10Å
• Depth of field 0.2m 100 m
(at 1000x)
• Chemical analysis No Yes
• Crystal Structure No Yes
• Sample Prep. Easy Easy
Information from SEM
• Surface morphology
• Elemental micro-analysis
• Morpho-chemical analysis
• Fractography
Incident electron
Secondary electron
reabsorbed
Electron - Sample Interaction
Primary Electron
Backscattered Electron
X-rays
E2
e- X-ray
E1
X-rays
Property of Characteristic X-ray
E C1Z C2 2
e-
Characteristic X-rays are named as follows:
Microscopic:
Striations
Macroscopic:
Beach Marks
Fatigue Failures: Characteristics
Beachmarks
Beach Marks
Cleavage
Cracking
Ductile
Fracture
Intergranular Fracture
Grain boundary
cavitation at high
Hydrogen temperatures
emrittlement